CN113009242B

CN113009242B - Device and method for measuring surface potential distribution and attenuation of array fluxgate

Info

Publication number: CN113009242B
Application number: CN202110212399.XA
Authority: CN
Inventors: 张嘉伟; 刘朝辉; 王力; 汝艳
Original assignee: Xian University of Technology
Current assignee: Xian University of Technology
Priority date: 2021-02-25
Filing date: 2021-02-25
Publication date: 2022-10-04
Anticipated expiration: 2041-02-25
Also published as: CN113009242A

Abstract

The utility model provides a measuring device of array fluxgate surface potential distribution and decay includes the magnetism shielding bucket, places the magnetism shielding structure that just is connected with the magnetism shielding bucket in the magnetism shielding bucket, and the both ends of magnetism shielding bucket are equipped with the bung, are equipped with draught hole and wire hole on the bung, and the magnetism shielding structure includes triaxial array fluxgate, copper, earth connection, and the copper is placed in the magnetism shielding bucket, places the test sample on the copper, places triaxial array fluxgate on the test sample. A method for measuring surface potential distribution and attenuation of an array fluxgate comprises the following steps: opening a barrel cover, placing a test sample subjected to surface discharge treatment on a copper plate, then placing a triaxial array fluxgate on the test sample, and closing the barrel cover to measure the potential distribution of the surface of the test sample; and finally, the measurement result can be transmitted to a computer through a data transmission line for subsequent analysis. The invention has the advantages of high measurement precision, simple structure, strong anti-interference capability, simple operation and the like.

Description

Device and method for measuring surface potential distribution and attenuation of array fluxgate

Technical Field

The invention belongs to the field of surface characteristic testing of insulating materials, and particularly relates to a device and a method for measuring surface potential distribution and attenuation of an array type fluxgate.

Background

With the continuous improvement of the voltage grade of the power system in China, the high-voltage direct-current transmission is the most economical energy transmission mode for realizing high-voltage, long-distance and large-capacity transmission, and becomes the trend of the development of power grids in China. Research shows that when a direct current electric field is applied to an insulating material, the electric charge accumulation phenomenon occurs on the surface of the material and cannot be dissipated for a long time, which influences the surface electric field distribution, so that the insulating material generates surface flashover at a lower voltage, and the application of a high-voltage direct current insulating part is greatly limited. The surface potential of the sample represents the ability of the material to bind electrons, a surface electrical property of the material. Therefore, the surface potential characterization technology has important significance in the fields of energy and material science, biomedical engineering, physical and chemical research, micro-electro-mechanical systems, micro-fluidic systems and the like, and is a leading-edge measurement technology related to multidisciplinary cross development.

The currently common surface potential measuring methods mainly comprise a dust graph method, an electrostatic probe method, an optical measurement method based on Pockels effect and the like. Among them, the dust map method is easy to distinguish the surface charge distribution, but cannot realize the online measurement of the surface charge. The electrostatic probe method is simple to operate, low in cost and easy to carry out, but has the defect of low resolution. The optical measurement method based on the Pockels effect has the advantage of high measurement accuracy, but also has the advantage of complex operation and is only suitable for thin film materials.

Therefore, a device and a method for measuring the surface potential distribution and attenuation of the array fluxgate, which are simple to operate, high in measurement accuracy and strong in anti-interference capability, are needed.

Disclosure of Invention

In order to overcome the defects of the prior art, the invention aims to provide a device and a method for measuring the distribution and attenuation of the surface potential of the array fluxgate, which not only can accurately and effectively measure the surface potential of a material, but also have the advantages of high measurement precision, simple structure, strong anti-interference capability, simple operation and the like.

In order to achieve the purpose, the invention adopts the technical scheme that:

the utility model provides a measuring device of array fluxgate surface potential distribution and decay, includes the magnetism shielding bucket, the magnetism shielding structure that is connected with the magnetism shielding bucket, and the both ends of magnetism shielding bucket are equipped with the bung, are equipped with scavenge hole and wire hole on the bung respectively, magnetism shielding structure includes triaxial array fluxgate, copper, earth connection, the copper is placed in the magnetism shielding bucket, the one end and the copper of earth connection link to each other, and the other end passes the wire hole, place test sample on the copper, place triaxial array fluxgate on the test sample.

Furthermore, the triaxial array fluxgate comprises a triaxial fluxgate probe, the triaxial fluxgate probe is fixedly installed on the PCB, the data transmission line is led out through a multi-core connector at one end of the PCB and penetrates through the wire outlet hole to be connected with an external computer, and mounting holes are reserved around the PCB for fixedly installing the triaxial array fluxgate.

Further, the triaxial array fluxgate is formed by 9 triaxial fluxgate probes in total, three rows and three columns.

The measurement method for the surface potential distribution and the attenuation of the array fluxgate uses the measurement device for the surface potential distribution and the attenuation of the array fluxgate, and comprises the following steps:

step 1: opening the barrel cover, placing the test sample subjected to surface discharge treatment on the copper plate, and placing the charged side of the surface of the test sample downwards;

step 2: placing the triaxial array fluxgate on a test sample, and then closing the bucket covers at two ends of the magnetic shielding bucket to measure the potential distribution on the surface of the test sample;

and step 3: the measurement result can be transmitted to a computer through a data transmission line for subsequent analysis.

The invention has the beneficial effects that:

according to the invention, the magnetic shielding barrel is adopted to place all the components in the magnetic shielding barrel for testing, so that the influence of an external magnetic field on a measurement result can be shielded, and the test result is more accurate.

The invention provides a method for measuring the distribution and attenuation of surface potential of an array fluxgate, which can accurately and effectively realize the measurement of the surface potential of a sample material. The invention has the advantages of high measurement precision, simple structure, strong anti-interference capability, simple operation and the like.

Drawings

Fig. 1 is an external structural view of a magnetic shield bucket;

FIG. 2 is a schematic view of the internal measurement structure of the magnetic shielding barrel;

FIG. 3 is an enlarged top view of the tri-axial fluxgate probe;

fig. 4 is a structural view of a triaxial array fluxgate;

FIG. 5 is a line graph showing the results of measurement of the surface of a test sample in the absence and presence of discharge.

In the drawings: the device comprises a magnetic shielding barrel 1, a magnetic shielding structure 2, a ventilation hole 3, a barrel cover 4, a wire outlet 5, a three-axis array fluxgate 6, a test sample 7, a copper plate 8, a data transmission line 9, a ground wire 10, a three-axis fluxgate probe 11 and a PCB 12.

Detailed description of the preferred embodiments

The embodiment of the invention provides a method for measuring surface potential distribution and attenuation of an array type fluxgate, and for facilitating the reader to understand the invention, the invention will be more fully described with reference to the accompanying drawings.

As shown in fig. 1, the device for measuring the distribution and attenuation of the surface potential of the array type fluxgate comprises a magnetic shielding barrel 1 and a magnetic shielding structure 2 connected with the magnetic shielding barrel 1, wherein two ends of the magnetic shielding barrel 1 are provided with barrel covers 4, all measuring elements are arranged in the magnetic shielding barrel 1, and the barrel covers 4 can be opened and closed for taking and placing samples; the barrel cover 4 is respectively provided with a ventilation hole 3 and a wire outlet hole 5, and the ventilation hole 3 is used for enabling airflow to flow inside and outside the magnetic shielding barrel 1; all the test elements are tested in the magnetic shielding barrel 1, so that the influence of an external magnetic field on a measurement result can be shielded, and the test result is more accurate.

As shown in fig. 2, the magnetic shielding structure 2 includes a triaxial array fluxgate 6, a copper plate 8, and a ground wire 10, the copper plate 8 is placed in the magnetic shielding barrel 1, one end of the ground wire 10 is connected to the copper plate 8, the other end passes through the wire outlet 5, a test sample 7 is placed on the copper plate 8, the triaxial array fluxgate 6 is placed on the test sample 7, and the size of the test sample 7 is larger than the size of the triaxial fluxgate probe 11 and smaller than the size of the copper plate 8.

As shown in fig. 3, the overhead view of the triaxial fluxgate probe is enlarged. The triaxial fluxgate probe 11 is placed in the magnetic shielding barrel 1 to measure the electric potential in the triaxial directions of X, Y and Z. The X channel is in the thickness direction of the material, the Y channel is in the direction of the left barrel wall and the right barrel wall, and the Z channel is in the direction of the airflow hole. The surface of the sample after discharge is charged, the movement of the charge can generate current and further generate a magnetic field, and the potential of the sample material is represented by measuring the magnetic field.

As shown in fig. 4, the triaxial array fluxgate 6 is formed by a triaxial fluxgate probe 11, the triaxial fluxgate probe 11 is fixedly installed on a PCB 12, a data transmission line 9 is led out through a multi-core connector at one end of the PCB 12 and passes through a wire outlet 5 to be connected with an external computer, and mounting holes are reserved around the PCB 12 for fixedly installing the triaxial array fluxgate 6.

The triaxial array fluxgate 6 is formed by 9 triaxial fluxgate probes 11 in total of three rows and three columns.

A method for measuring surface potential distribution and attenuation of an array fluxgate specifically comprises the following steps:

step 1: opening the barrel cover 4, placing the test sample 7 subjected to surface discharge treatment on the copper plate 8, and placing the surface-charged side of the test sample 7 downwards;

step 2: placing the triaxial array fluxgate 6 on a test sample 7, and then closing the bucket covers 4 at two ends of the magnetic shielding bucket 1 to measure the electric potential distribution on the surface of the test sample 7;

and step 3: the measurement results can be transmitted to a computer for subsequent analysis through a data transmission line 9.

FIG. 5 is a graph showing the results of measurement when the surface of the test sample is discharged or not. The invention carries out two groups of experiments, and respectively carries out surface potential measurement on a sample with a non-discharged surface and a sample with a discharged surface, thereby obtaining two groups of data. It is evident from fig. 5 that a signal with increasing intensity of the magnetic field over time is measured when the sample surface is charged. When the surface of the sample is not charged, the measured magnetic field variation trend is-0.26-1.09 nT, and basically has no variation; and when the surface of the sample was charged, the measured magnetic field variation tendency was 6.45 to 101.07nT.

The embodiments described above only express specific embodiments of the present invention, and the description is specific and detailed, but not to be understood as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims

1. The utility model provides a measuring device of array fluxgate surface potential distribution and decay, its characterized in that, includes magnetic shield bucket (1), magnetic shield structure (2) that are connected with magnetic shield bucket (1), and the both ends of magnetic shield bucket (1) are equipped with bung (4), are equipped with draught hole (3) and wire hole (5) on bung (4) respectively, magnetic shield structure (2) are including triaxial array fluxgate (6), copper (8), earth connection (10), place in magnetic shield bucket (1) copper (8), the one end of earth connection (10) links to each other with copper (8), and the other end passes wire hole (5), place test sample (7) on copper (8), place triaxial array fluxgate (6) on test sample (7).

2. The device for measuring the surface potential distribution and the attenuation of the array fluxgate according to claim 1, wherein the tri-axial array fluxgate (6) is composed of a tri-axial fluxgate probe (11), the tri-axial fluxgate probe (11) is fixedly installed on a PCB (12), the data transmission line (9) is led out through a multi-core connector at one end of the PCB (12) and passes through the wire outlet hole (5) to be connected with an external computer, and the PCB (12) is provided with mounting holes at the periphery thereof for fixedly installing the array fluxgate (6).

3. The device for measuring the surface potential distribution and the attenuation of the arrayed fluxgate of claim 2, wherein the tri-axial arrayed fluxgate (6) is constituted by three rows and three columns for a total of 9 tri-axial fluxgate probes (11).

4. The method for measuring the distribution and attenuation of the surface potential of the array fluxgate, which uses the apparatus for measuring the distribution and attenuation of the surface potential of the array fluxgate of any one of claims 1 to 3, comprises the following steps:

step 1: opening the barrel cover (4), placing the test sample (7) subjected to surface discharge treatment on the copper plate (8), and placing the surface-charged side of the test sample (7) downwards;

and 2, step: the method comprises the following steps of placing a triaxial array fluxgate (6) on a test sample (7), and then closing barrel covers (4) at two ends of a magnetic shielding barrel (1) to measure the potential distribution of the surface of the test sample (7);

and step 3: the measurement result can be transmitted to a computer through a data transmission line (9) for subsequent analysis.