CN112564833B - Novel passive intermodulation test system and method for W-band waveguide structure - Google Patents

Novel passive intermodulation test system and method for W-band waveguide structure Download PDF

Info

Publication number
CN112564833B
CN112564833B CN202011332739.4A CN202011332739A CN112564833B CN 112564833 B CN112564833 B CN 112564833B CN 202011332739 A CN202011332739 A CN 202011332739A CN 112564833 B CN112564833 B CN 112564833B
Authority
CN
China
Prior art keywords
signal
intermodulation
passive
test
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN202011332739.4A
Other languages
Chinese (zh)
Other versions
CN112564833A (en
Inventor
高源慈
李洋洋
李佳龙
马余祥
杨宏
吕致恒
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anfang Gaoke Electromagnetic Safety Technology Beijing Co ltd
University of Electronic Science and Technology of China
Original Assignee
Anfang Gaoke Electromagnetic Safety Technology Beijing Co ltd
University of Electronic Science and Technology of China
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anfang Gaoke Electromagnetic Safety Technology Beijing Co ltd, University of Electronic Science and Technology of China filed Critical Anfang Gaoke Electromagnetic Safety Technology Beijing Co ltd
Priority to CN202011332739.4A priority Critical patent/CN112564833B/en
Publication of CN112564833A publication Critical patent/CN112564833A/en
Application granted granted Critical
Publication of CN112564833B publication Critical patent/CN112564833B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/30Monitoring; Testing of propagation channels
    • H04B17/309Measuring or estimating channel quality parameters
    • H04B17/318Received signal strength
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/20Frequency-selective devices, e.g. filters
    • H01P1/213Frequency-selective devices, e.g. filters combining or separating two or more different frequencies
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/30Monitoring; Testing of propagation channels
    • H04B17/309Measuring or estimating channel quality parameters
    • H04B17/318Received signal strength
    • H04B17/327Received signal code power [RSCP]
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/30Monitoring; Testing of propagation channels
    • H04B17/309Measuring or estimating channel quality parameters
    • H04B17/345Interference values

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Amplifiers (AREA)

Abstract

The invention discloses a novel passive intermodulation test system and a method of a W-band waveguide structure, wherein the passive intermodulation test system comprises a first signal source, a second signal source, a local vibration source, a combiner, a frequency multiplier, a power amplifier, a passive waveguide device to be tested, a mixer and a spectrum analyzer; and then the mixer generates an intermediate frequency interference signal according to the received local oscillation signal generated by the local oscillation source and the intermodulation interference signal of the passive waveguide device to be tested, and transmits the intermediate frequency interference signal to the spectrum analyzer to analyze the phase information, the amplitude information and the like of the intermediate frequency interference signal, so that the intermodulation test of the passive waveguide device can be completed. The invention fills the blank of intermodulation characteristic test of millimeter-wave band passive waveguide devices; the structure is simplified, the volume is reduced, and the practicability is enhanced.

Description

Novel passive intermodulation test system and method for W-band waveguide structure
Technical Field
The invention relates to the technical field of passive intermodulation testing, in particular to a novel passive intermodulation testing system and method of a W-band waveguide structure.
Background
In a wireless communication system, when carrier signals of multiple frequencies pass through some passive devices, signal energy is transferred to other frequencies due to the nonlinearity of the devices, and intermodulation products with different amplitudes are generated. If these signals fall into the receiving frequency band of the system or the receiving frequency bands of other systems, interference in the same system or different systems can be generated, so that the signal-to-noise ratio of the system is reduced, the system performance is seriously deteriorated, and the capacity and quality of the communication system are seriously affected.
In the field of communication satellites, in recent years, with the development of satellites towards higher component integration, higher transmitting power and higher receiving sensitivity, great difficulty is added to the design of satellite systems, and passive intermodulation indexes become a necessary index in the design of satellite payloads. The current technical development trend makes people have to research the generation of passive intermodulation mechanistically so as to purposely put forward effective measures for inhibiting PIM and reduce the development cost of the system.
The PIM problem is not obvious, as domestic research on passive intermodulation problems is relatively late. In the early development of microwave devices, passive intermodulation performance of the devices is improved by absorbing foreign research results. At present, the passive intermodulation reflection and radiation measurement of UHF, L, S, C and Ku wave bands can be realized, the high-low temperature passive intermodulation test of a filter, a multiplexer and an antenna feed source can be carried out, but a blank exists in a passive intermodulation test system of a W wave band waveguide structure.
Disclosure of Invention
The invention aims to provide a novel passive intermodulation test system and a method of a W-band waveguide structure, aiming at solving the problems that the structure of the conventional passive intermodulation test equipment is complex and the passive intermodulation test system of the W-band waveguide structure is blank.
The invention is realized by the following technical scheme:
a passive intermodulation test system of a novel W-waveband waveguide structure comprises a first signal source, a second signal source, a local vibration source, a combiner, a frequency multiplier, a power amplifier, a passive waveguide device to be tested, a mixer and a spectrum analyzer, wherein the output end of the first signal source is connected with the first input end of the combiner, and the output end of the second signal source is connected with the second input end of the combiner; the output end of the combiner is connected with the input end of the frequency multiplier; the output end of the frequency multiplier is connected with the input end of the power amplifier; the output end of the power amplifier is connected with the input end of the passive waveguide device to be tested; the output end of the passive waveguide device to be tested is connected with the second input end of the frequency mixer; the output end of the local vibration source is connected with the first input end of the frequency mixer; the output end of the mixer is connected with the input end of the spectrum analyzer;
the first signal source and the second signal source are respectively used for generating a first initial radio frequency signal and a second initial radio frequency signal and outputting the first initial radio frequency signal and the second initial radio frequency signal to the combiner;
the combiner is used for combining the first initial radio frequency signal and the second initial radio frequency signal to generate an initial test signal and outputting the initial test signal to the frequency multiplier.
The frequency multiplier is used for multiplying the frequency of the initial test signal to a W wave band, generating an intermodulation test signal and outputting the intermodulation test signal to the power amplifier;
the power amplifier is used for adjusting the power and the level of the intermodulation test signal to enable the intermodulation test signal to meet the test requirement and outputting the intermodulation test signal to the passive waveguide device to be tested;
the passive waveguide device to be tested generates mutual mixing when the intermodulation test signal passes through by utilizing the nonlinear effect of the passive waveguide device to be tested, generates a passive intermodulation Product (PIM), and outputs the intermodulation interference signal to the mixer;
the local vibration source is used for providing a local vibration signal so as to be mixed with the intermodulation interference signal to generate the intermediate frequency interference signal, and the intermediate frequency interference signal is output to the spectrum analyzer;
the mixer is used for receiving the local oscillator signal and the intermodulation interference signal, generating the intermediate frequency interference signal and transmitting the intermediate frequency interference signal to the spectrum analyzer;
the spectrum analyzer is used for receiving the intermediate frequency interference signal, analyzing phase information and amplitude information of the intermediate frequency interference signal, calculating a test result and completing a passive intermodulation test;
the first signal source and the second signal source correspondingly generate a first initial radio frequency signal and a second initial radio frequency signal, and input the first initial radio frequency signal and the second initial radio frequency signal to the combiner, and the first initial radio frequency signal and the second initial radio frequency signal are combined by the combiner to generate an initial test signal and output the initial test signal to the frequency multiplier; receiving the initial test signal through a frequency multiplier, multiplying the frequency of the initial test signal to a W wave band, generating an intermodulation test signal, and outputting the intermodulation test signal to a power amplifier; adjusting the power and the level of the intermodulation test signal through a power amplifier to enable the intermodulation test signal to meet the test requirement, and outputting the intermodulation test signal to a passive waveguide device to be tested; the passive waveguide device to be tested utilizes the nonlinear characteristic thereof to enable the intermodulation test signals to be mutually mixed when passing through, a passive intermodulation product PIM is generated, and an intermodulation interference signal is output to the mixer; the mixer generates an intermediate frequency interference signal according to the received local oscillation signal generated by the local oscillation source and the intermodulation interference signal, and transmits the intermediate frequency interference signal to the spectrum analyzer for signal analysis, processing and analysis calculation to obtain a test result and complete the intermodulation test of the passive waveguide device;
before the passive intermodulation test system is connected to a passive waveguide device to be tested, the intermodulation test signal adjusted by the power amplifier is directly input to the second input end of the mixer, and the residual intermodulation of the whole passive intermodulation test system is measured.
The working principle is as follows: the passive intermodulation test system for the W-band waveguide structure still has a blank problem, and according to the test requirement of passive intermodulation, the intermodulation test signal power fed in the input end of the passive waveguide device to be tested needs to reach 2 × 20W (43 dBm). In the existing intermodulation test system, two power amplifiers are generally adopted, a first signal source and a second signal source are connected with the corresponding power amplifiers at the back, the amplification processing is carried out at the front end of the intermodulation test system, and the subsequent processing such as combining, filtering and the like is carried out, so that the total power reaches 400W; the power amplifier meeting the requirements is large in size, high power consumption also puts high requirements on a power supply device of the equipment, the power amplifier is inconvenient to carry to each construction site to test passive devices, and the portability is poor. Secondly, the heat productivity of the dual power amplifier is also large, which brings adverse effect to the heat dissipation of the device.
Therefore, the embodiment of the invention provides a novel passive intermodulation test system with a W-band waveguide structure, fills the blank of intermodulation characteristic test of millimeter-band passive waveguide devices, and simplifies the structure of passive intermodulation test equipment. The passive intermodulation test system comprises a first signal source, a second signal source, a local vibration source, a combiner, a frequency multiplier, a power amplifier, a passive waveguide device to be tested, a frequency mixer and a spectrum analyzer, wherein two independent signal sources are arranged as signal generating devices to generate two paths of initial radio frequency signals; setting a combiner to combine the two paths of initial radio frequency signals to generate an initial test signal; setting a frequency multiplier to receive the initial test signal and carry out frequency multiplication on the initial test signal to a W wave band to generate an intermodulation test signal; setting a power amplifier to adjust the power and the level of the intermodulation test signal to meet the test requirement, and outputting the intermodulation test signal to a passive waveguide device to be tested; setting a passive waveguide device to be tested, mutually mixing intermodulation test signals when the intermodulation test signals pass through by utilizing the nonlinear characteristic of the passive waveguide device to generate a passive intermodulation Product (PIM), and outputting intermodulation interference signals; setting a local oscillation source to generate a local oscillation signal, and inputting the local oscillation signal to a frequency mixer; setting a mixer to receive the local oscillation signal and the intermodulation interference signal, generating an intermediate frequency interference signal and transmitting the intermediate frequency interference signal to the spectrum analyzer; and setting a spectrum analyzer to receive and analyze the intermediate frequency interference signal to obtain phase information and amplitude information, and performing data processing and analysis calculation on the phase information and the amplitude information to obtain a test result, so that the passive intermodulation test of the W-band passive waveguide device can be completed.
The invention designs and adds a frequency multiplier, combines two paths of initial low-frequency signals and then multiplies the frequency to a W wave band, and utilizes a power amplifier of the W wave band to realize the adjustment of the power and the level of the signals so as to meet the power and the level required by the test. Compared with other passive intermodulation test equipment, the structure is greatly simplified, the size is reduced, the power consumption is reduced, the portability is improved, and the practicability is enhanced.
The device to be measured is a dual-port passive waveguide device working in a millimeter wave frequency band, and has very important and wide application in millimeter wave industrial design, so that the significance of measuring the passive intermodulation characteristic of the device to be measured is great.
The input end of the isolator is connected with the output end of the frequency multiplier, and the output end of the isolator is connected with the input end of the power amplifier;
the isolator is used for suppressing electromagnetic interference of the whole passive intermodulation test system and ensuring normal transmission of signals.
Meanwhile, a filter and an attenuator can be added between the frequency multiplier and the passive waveguide device to be tested, and a better passive intermodulation scheme is realized through mutual matching between the frequency multiplier and the passive waveguide device to be tested.
Further, the frequency multiplier is a W-band octave multiplier, and is configured to frequency-multiply the initial test signal to a W-band, generate an intermodulation test signal, and output the intermodulation test signal to the isolator. In the invention, a W-band octave multiplier is used for multiplying the frequency of the combined signal to a W band.
Furthermore, the first signal source and the second signal source both adopt independent desktop signal sources.
Further, the passive waveguide device to be tested is a dual-port passive waveguide device.
Further, the passive waveguide device to be tested is a dual-port passive waveguide device working in a millimeter wave frequency band.
Further, the intermodulation test signal power fed in from the input end of the passive waveguide device to be tested needs to reach 2 × 20W (43 dBm).
Furthermore, the spectrum analyzer analyzes the intermediate frequency interference signal received from the mixer to obtain phase information and amplitude information, and performs data processing and analysis calculation on the phase information and the amplitude information to obtain a test result, so that the passive intermodulation test of the W-band passive waveguide device can be completed.
On the other hand, the invention also provides a novel passive intermodulation test method of the W-band waveguide structure, which is applied to the novel passive intermodulation test system of the W-band waveguide structure; the method comprises the following steps:
the first signal source and the second signal source are used as signal generating devices, and a first initial radio frequency signal and a second initial radio frequency signal are correspondingly generated and input to the combiner; combining the first initial radio frequency signal and the second initial radio frequency signal through a combiner to generate an initial test signal;
the frequency multiplier receives the initial test signal, multiplies the frequency of the initial test signal to a W wave band, generates an intermodulation test signal and outputs the intermodulation test signal to a power amplifier; adjusting the power and the level of the intermodulation test signal through a power amplifier to enable the intermodulation test signal to meet the test requirement, and outputting the intermodulation test signal to a passive waveguide device to be tested;
the passive waveguide device to be tested enables the intermodulation test signals to be subjected to mutual frequency mixing when passing through by utilizing the nonlinear characteristic of the passive waveguide device to be tested, generates a passive intermodulation Product (PIM), and outputs intermodulation interference signals to a frequency mixer; setting a local oscillation source to generate a local oscillation signal, and inputting the local oscillation signal to a frequency mixer;
the mixer generates an intermediate frequency interference signal according to the received local oscillator signal and the intermodulation interference signal, and transmits the intermediate frequency interference signal to a spectrum analyzer for signal analysis, processing and analysis calculation to obtain a test result, thereby completing the intermodulation test of the passive waveguide device;
further comprising: before the passive intermodulation test system is connected to a passive waveguide device to be tested, the intermodulation test signal adjusted by the power amplifier is directly input to the second input end of the mixer, and the residual intermodulation of the whole passive intermodulation test system is measured.
Further, the frequency multiplier is a W-band octave multiplier.
Compared with the prior art, the invention has the following advantages and beneficial effects:
1. the frequency multiplier is added, two paths of initial low-frequency signals are combined and then frequency-multiplied to a W wave band, so that the intermodulation characteristic test of a millimeter wave band passive waveguide device is realized while the structure of a test system is simplified; the power and level of the signal are adjusted by using a W-band power amplifier, so that the power and level required by the test are met. Compared with other passive intermodulation test equipment, the structure is greatly simplified, the size is reduced, the power consumption is reduced, the portability is improved, and the practicability is enhanced.
2. The device to be measured is a dual-port passive waveguide device working in a millimeter wave frequency band, and has very important and wide application in millimeter wave industrial design, so that the significance of measuring the passive intermodulation characteristic of the device to be measured is great.
3. The invention fills the blank of the intermodulation characteristic test of the millimeter wave band passive waveguide device and simplifies the structure of the passive intermodulation test equipment.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention. In the drawings:
fig. 1 is a schematic structural diagram of a passive intermodulation test system with a novel W-band waveguide structure according to the present invention.
Fig. 2 is a schematic diagram of a connection mode between the passive waveguide device to be tested and other parts according to the present invention.
Reference numbers and corresponding part names:
101-a first signal source, 102-a second signal source, 103-a local vibration source, 104-a combiner, 105-a frequency multiplier, 106-an isolator, 107-a power amplifier, 108-a passive waveguide device to be tested, 109-a mixer and 110-a spectrum analyzer.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, it will be apparent to one of ordinary skill in the art that: it is not necessary to employ these specific details to practice the present invention. In other instances, well-known structures, circuits, materials, or methods have not been described in detail so as not to obscure the present invention.
Throughout the specification, reference to "one embodiment," "an embodiment," "one example," or "an example" means: the particular features, structures, or characteristics described in connection with the embodiment or example are included in at least one embodiment of the invention. Thus, the appearances of the phrases "one embodiment," "an embodiment," "one example" or "an example" in various places throughout this specification are not necessarily all referring to the same embodiment or example. Furthermore, the particular features, structures, or characteristics may be combined in any suitable combination and/or sub-combination in one or more embodiments or examples. Further, those of ordinary skill in the art will appreciate that the illustrations provided herein are for illustrative purposes and are not necessarily drawn to scale. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
In the description of the present invention, it is to be understood that the terms "front", "rear", "left", "right", "upper", "lower", "vertical", "horizontal", "high", "low", "inner", "outer", etc. indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and therefore, are not to be construed as limiting the scope of the present invention.
Example 1
As shown in fig. 1 and fig. 2, the passive intermodulation test system of the novel W-band waveguide structure of the present invention includes a first signal source 101, a second signal source 102, a local vibration source 103, a combiner 104, a frequency multiplier 105, a power amplifier 107, a passive waveguide device to be tested 108, a mixer 109, and a spectrum analyzer 110, wherein an output end of the first signal source 101 is connected to a first input end of the combiner 104, and an output end of the second signal source 102 is connected to a second input end of the combiner 104; the output end of the combiner 104 is connected with the input end of the frequency multiplier 105; the output end of the frequency multiplier 105 is connected with the input end of the power amplifier 107; the output end of the power amplifier 107 is connected with the input end of the passive waveguide device 108 to be tested; the output end of the passive waveguide device to be tested 108 is connected with the second input end of the mixer 109; the output end of the local vibration source 103 is connected with the first input end of the mixer 109; the output of the mixer 109 is connected to the input of the spectrum analyzer 110;
the first signal source 101 and the second signal source 102 correspondingly generate a first initial radio frequency signal and a second initial radio frequency signal, and input the first initial radio frequency signal and the second initial radio frequency signal to the combiner 104, and the first initial radio frequency signal and the second initial radio frequency signal are combined by the combiner 104 to generate an initial test signal and output the initial test signal to the frequency multiplier 105; receiving the initial test signal by a frequency multiplier 105, multiplying the initial test signal to a W band, generating an intermodulation test signal, and outputting the intermodulation test signal to a power amplifier 107; adjusting the power and level of the intermodulation test signal through a power amplifier 107 to meet the test requirement, and outputting the intermodulation test signal to a passive waveguide device 108 to be tested; the passive waveguide device 108 to be tested utilizes the nonlinear characteristic thereof to enable the intermodulation test signals to be mutually mixed when passing through, so as to generate a passive intermodulation product PIM, and output an intermodulation interference signal to the mixer 109; the mixer 109 generates an intermediate frequency interference signal according to the received local oscillation signal generated by the local oscillation source 103 and the intermodulation interference signal, and transmits the intermediate frequency interference signal to the spectrum analyzer 110 for signal analysis, processing and analysis calculation to obtain a test result;
before the passive waveguide device 108 to be tested is connected, the output end of the power amplifier 107 may also be directly connected to the second input end of the mixer 109, so as to test the residual intermodulation of the whole passive intermodulation test system, so that the error analysis of the measurement result is more accurate.
In this embodiment, the frequency multiplier 105 is a W-band octave multiplier, and is configured to multiply the frequency of the initial test signal to a W-band, generate an intermodulation test signal, and output the intermodulation test signal to the isolator 106. In the invention, a W-band octave multiplier is used for multiplying the frequency of the combined signal to a W band.
In this embodiment, the first signal source 101 and the second signal source 102 both use independent desktop signal sources.
In this embodiment, the passive waveguide device 108 to be tested is a dual-port passive waveguide device.
In this embodiment, the passive waveguide device 108 to be tested is a dual-port passive waveguide device operating in a millimeter wave W band.
In this embodiment, the intermodulation test signal power fed into the input end of the passive waveguide device 108 to be tested needs to reach 2 × 20W (43 dBm).
In this embodiment, the spectrum analyzer 110 analyzes the intermediate frequency interference signal received from the mixer 109 to obtain phase information and amplitude information, and performs data processing and analysis calculation on the phase information and amplitude information to obtain a test result, so as to complete the passive intermodulation test of the W-band passive waveguide device.
In the system, a waveguide connection structure is mainly adopted between the frequency multiplier 105 and the mixer 109, and as shown in fig. 1, the frequency multiplier 105 and the power amplifier 107, the power amplifier 107 and the passive waveguide device to be tested 108, and the passive waveguide device to be tested 108 and the mixer 109 in a dashed line frame are all connected by a waveguide structure. Because the surface of the metal waveguide is easily oxidized in natural environment, the surface of the metal waveguide is covered with a compound medium layer containing oxide, and the detection sensitivity of the system is reduced. Therefore, the system adopts the improved aluminum alloy material waveguide and carries out silver plating treatment on the surface of the waveguide, so that the passive intermodulation influence generated on the contact surface of the waveguide flange can be effectively reduced, and the PIM performance of the test system is improved. Specifically, a connection manner of the passive waveguide device to be tested and other parts is taken as an example, as shown in fig. 2. In the embodiment, the waveguide flange adopts BJ900 (China-national standard), EIA (International Standard name) is WR-10, the working frequency range is 73.8GHz-112GHz, and the W waveband can be completely covered.
When in implementation: firstly, before the system is accessed to a passive waveguide device to be tested, an intermodulation test signal adjusted by a power amplifier 107 is directly input to a second input end of the mixer 109, and the residual intermodulation of the whole passive intermodulation test system is measured;
secondly, the passive waveguide device 108 to be tested is accessed into the system, the intermodulation test signals are mutually mixed when passing through by utilizing the nonlinear characteristics of the passive waveguide device 108, a passive intermodulation product PIM is generated, and an intermodulation interference signal is output to the mixer 109; setting a local oscillation source 103 to generate a local oscillation signal, and inputting the local oscillation signal to a frequency mixer 109; the mixer 109 generates an intermediate frequency interference signal according to the received local oscillator signal and the intermodulation interference signal, and transmits the intermediate frequency interference signal to the spectrum analyzer 110 for signal analysis, processing and analysis calculation to obtain a test result, so that the passive intermodulation test of the W-band passive waveguide device can be completed.
The working principle is as follows: the passive intermodulation test system for the W-band waveguide structure still has a blank problem, and according to the test requirement of passive intermodulation, the intermodulation test signal power fed in the input end of the passive waveguide device to be tested needs to reach 2 × 20W (43 dBm). In the existing intermodulation test system, two power amplifiers are generally adopted, a first signal source and a second signal source are connected with the corresponding power amplifiers at the back, the amplification processing is carried out at the front end of the intermodulation test system, and the subsequent processing such as combining, filtering and the like is carried out, so that the total power reaches 400W; the power amplifier meeting the requirements is large in size, high power consumption also puts high requirements on a power supply device of the equipment, the power amplifier is inconvenient to carry to each construction site to test passive devices, and the portability is poor. Secondly, the heat productivity of the dual power amplifier is also large, which brings adverse effect to the heat dissipation of the device.
Therefore, the embodiment of the invention provides a novel passive intermodulation test system with a W-band waveguide structure, fills the blank of intermodulation characteristic test of millimeter-band passive waveguide devices, and simplifies the structure of passive intermodulation test equipment. The passive intermodulation test system comprises a first signal source, a second signal source, a local vibration source, a combiner, a frequency multiplier, a power amplifier, a passive waveguide device to be tested, a frequency mixer and a spectrum analyzer, wherein two independent signal sources are arranged as signal generating devices to generate two paths of initial radio frequency signals; setting a combiner to combine the two paths of initial radio frequency signals to generate an initial test signal; setting a frequency multiplier to receive the initial test signal and carry out frequency multiplication on the initial test signal to a W wave band to generate an intermodulation test signal; setting a power amplifier to adjust the power and the level of the intermodulation test signal to meet the test requirement, and outputting the intermodulation test signal to a passive waveguide device to be tested; setting a passive waveguide device to be tested, mutually mixing intermodulation test signals when the intermodulation test signals pass through by utilizing the nonlinear characteristic of the passive waveguide device to generate a passive intermodulation Product (PIM), and outputting intermodulation interference signals; setting a local oscillation source to generate a local oscillation signal, and inputting the local oscillation signal to a frequency mixer; setting a mixer to receive the local oscillation signal and the intermodulation interference signal, generating an intermediate frequency interference signal and transmitting the intermediate frequency interference signal to the spectrum analyzer; and setting a spectrum analyzer to receive and analyze the intermediate frequency interference signal to obtain phase information and amplitude information, and performing data processing and analysis calculation on the phase information and the amplitude information to obtain a test result, so that the passive intermodulation test of the W-band passive waveguide device can be completed.
Based on the novel W-band passive intermodulation test system provided by the embodiment of the invention, the frequency multiplier is added, two paths of initial low-frequency signals are combined and then frequency-multiplied to the W band, and the power and the level of the signals are adjusted by using the power amplifier of the W band, so that the power and the level required by the test are met. Compared with other passive intermodulation test equipment, the structure is greatly simplified, the size is reduced, the power consumption is reduced, the portability is improved, and the practicability is enhanced.
Based on the novel W-band passive intermodulation test system provided by the embodiment of the invention, the device to be tested is a dual-port passive waveguide device working in a millimeter wave frequency band, and the device to be tested has important significance for measuring passive intermodulation characteristics because the device to be tested has very important and wide application in millimeter wave industrial design.
The system has the innovation that the frequency multiplier is introduced to enable the frequency of the test signal to reach the W wave band, so that the intermodulation characteristic test of the millimeter wave band passive waveguide device is realized while the structure of the test system is simplified.
Example 2
As shown in fig. 1 and fig. 2, this embodiment is different from embodiment 1 in that the present embodiment further includes an isolator 106, an input end of the isolator 106 is connected to an output end of the frequency multiplier 105, and an output end of the isolator 106 is connected to an input end of the power amplifier 107;
the isolator 106 is used for suppressing electromagnetic interference of the whole passive intermodulation test system and ensuring normal transmission of signals.
Meanwhile, a filter and an attenuator can be added between the frequency multiplier 105 and the passive waveguide device 108 to be tested, and a better passive intermodulation scheme can be realized through mutual matching between the frequency multiplier 105 and the passive waveguide device.
As shown in fig. 1, the frequency multiplier 105 and the isolator 106, the isolator 106 and the power amplifier 107, the power amplifier 107 and the passive waveguide device to be tested 108, and the passive waveguide device to be tested 108 and the mixer 109 are all connected by using a waveguide structure.
When in implementation: in the passive intermodulation test system with the novel W-band waveguide structure provided by the embodiment of the invention, when the passive intermodulation test is carried out, the initial frequency f is generated by setting the relevant parameters of the first signal source 101 and the second signal source 1021Radio frequency signal F1And an initial frequency f2Radio frequency signal F2And transmitted to the combiner 103 to generate the initial test signal T1(ii) a By setting the frequency multiplication factor of the frequency multiplier 105, the frequency NT can be generated1Intermodulation test signal T2And transmitted to the isolator 106 and the power amplifier 107; by setting the amplification of the power amplifier 107, T can be adjusted2To the power and level required for testing (typically 2 × 20W, i.e. 43dBm), and transmitting the adjusted signal to the passive waveguide device 108 to be tested; intermodulation test signal T2When the signal passes through the passive waveguide device 108 to be tested, the signals are subjected to mutual frequency mixing under the influence of the nonlinear characteristics of the passive waveguide device 108 to be tested, so that the energy of the signals is partially transferred to other frequencies, and therefore, passive intermodulation products with different amplitudes are generatedObject (PIM) and outputs intermodulation interference signal T3(ii) a Setting parameters of the local oscillation source 103 to generate a local oscillation signal LO, and inputting the local oscillation signal LO to the mixer 109; the parameters of the mixer 109 are set to receive the local oscillator signal LO and the intermodulation interference signal T3And generates an intermediate frequency interference signal M1(ii) a Setting parameters of the spectrum analyzer 110, receiving the IF interference signal M output by the mixer 1091And analyzing to obtain an intermediate frequency interference signal M1The intermodulation characteristic measurement of the W-band passive waveguide device can be completed by carrying out data processing, analysis and calculation on the phase information and the amplitude information and analyzing a test result.
The measurement results of the present system are mainly read from the spectrum analyzer 110. To analyze and obtain the intermodulation characteristic of the passive waveguide device to be tested, at least the output power and F of the system need to be read1And F2The operating frequency, the frequency and level of the passive intermodulation product, etc., attention should be paid to the influence of the residual intermodulation of the system itself. The measurement results can be expressed in absolute terms in dBm or in relative terms in dBc with reference to the single-path signal carrier power. dBm and dbmc are mutually convertible, for example, the power of the input test signal in the system is 43dBm, and if the measured passive intermodulation value is-120 dBm, the system can be converted to-163 dBm.
In the system provided in the embodiment of the present invention, the frequency multiplier 104 is used to multiply the frequency of the combined initial radio frequency signal to the W-band, and only one power amplifier 107 is used to adjust the power and level of the radio frequency signal. The method not only successfully realizes the measurement of the passive intermodulation characteristic of the millimeter-wave band passive waveguide device, but also fills the gap of the current research; and the volume of the passive intermodulation test equipment is reduced, so that the total power consumption of the system is smaller, and the cruising ability of the system is favorably improved. Therefore, the portability of the passive test equipment applying the system is improved, and the equipment is convenient for passive intermodulation test of passive devices on each construction site. And the structural complexity of the system is low, so that the manufacturing cost of the passive intermodulation test equipment can be reduced.
Specifically, the spectrum analyzer 110 can display the waveform of the signal, and can also display the waveform of the signalAnd (5) carrying out analysis calculation. The spectrum analyzer 110 receives the intermediate frequency interference signal M1Then, the intermodulation test signal T with the passive waveguide device 108 not passing through the test2Intermediate frequency reference signal M mixed with local oscillator signal LO2And (6) comparing. The spectrum analyzer 110 may read M1And M2The phase information and the amplitude information are compared and vector operation is performed to analyze the actual intermodulation characteristic of the passive waveguide device 108 to be tested.
Example 3
As shown in fig. 1 and fig. 2, the present embodiment is different from embodiment 1 in that the present embodiment provides a novel passive intermodulation test method for a W-band waveguide structure, and the method is applied to the novel passive intermodulation test system for a W-band waveguide structure described in embodiment 1; the method comprises the following steps:
the first signal source 101 and the second signal source 102 are used as signal generating devices, and correspondingly generate a first initial radio frequency signal and a second initial radio frequency signal, and input the first initial radio frequency signal and the second initial radio frequency signal to the combiner 104; the first initial radio frequency signal and the second initial radio frequency signal are combined by the combiner 104 to generate an initial test signal;
the frequency multiplier 105 receives the initial test signal and multiplies the frequency of the initial test signal to a W wave band, generates an intermodulation test signal and outputs the intermodulation test signal to the power amplifier 107; adjusting the power and level of the intermodulation test signal through a power amplifier 107 to meet the test requirement, and outputting the intermodulation test signal to a passive waveguide device 108 to be tested;
when the power amplifier 107 directly inputs the adjusted intermodulation test signal to the second input terminal of the mixer 109, the purpose is to measure the residual intermodulation of the whole passive intermodulation test system, so as to perform error analysis on the measurement result;
the passive waveguide device 108 to be tested utilizes the nonlinear characteristic thereof to enable the intermodulation test signals to be mutually mixed when passing through, so as to generate a passive intermodulation product PIM, and output an intermodulation interference signal to the mixer 109; setting a local oscillation source 103 to generate a local oscillation signal, and inputting the local oscillation signal to a frequency mixer 109;
the mixer 109 generates an intermediate frequency interference signal according to the received local oscillator signal and the intermodulation interference signal, and transmits the intermediate frequency interference signal to the spectrum analyzer 110 for signal analysis, processing and analysis calculation to obtain a test result;
in this embodiment, the frequency multiplier 105 is a W-band octave multiplier.
The method has the innovation that the frequency multiplier is introduced to enable the frequency of the test signal to reach the W wave band, so that the intermodulation characteristic test of the millimeter wave band passive waveguide device is realized while the structure of the test system is simplified.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. The above-described system and system embodiments are merely illustrative, wherein the elements described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (8)

1. A novel passive intermodulation test system of a W-waveband waveguide structure is characterized by comprising a first signal source, a second signal source, a local vibration source, a combiner, a frequency multiplier, a power amplifier, a passive waveguide device to be tested, a mixer and a spectrum analyzer, wherein the output end of the first signal source is connected with the first input end of the combiner, and the output end of the second signal source is connected with the second input end of the combiner; the output end of the combiner is connected with the input end of the frequency multiplier; the output end of the frequency multiplier is connected with the input end of the power amplifier; the output end of the power amplifier is connected with the input end of the passive waveguide device to be tested; the output end of the passive waveguide device to be tested is connected with the second input end of the frequency mixer; the output end of the local vibration source is connected with the first input end of the frequency mixer; the output end of the mixer is connected with the input end of the spectrum analyzer;
the first signal source and the second signal source correspondingly generate a first initial radio frequency signal and a second initial radio frequency signal, and input the first initial radio frequency signal and the second initial radio frequency signal to the combiner, and the first initial radio frequency signal and the second initial radio frequency signal are combined by the combiner to generate an initial test signal and output the initial test signal to the frequency multiplier; receiving the initial test signal through a frequency multiplier, multiplying the frequency of the initial test signal to a W wave band, generating an intermodulation test signal, and outputting the intermodulation test signal to a power amplifier; adjusting the power and the level of the intermodulation test signal through a power amplifier to enable the intermodulation test signal to meet the test requirement, and outputting the intermodulation test signal to a passive waveguide device to be tested; the passive waveguide device to be tested utilizes the nonlinear characteristic thereof to enable the intermodulation test signals to be mutually mixed when passing through, a passive intermodulation product PIM is generated, and an intermodulation interference signal is output to the mixer; the mixer generates an intermediate frequency interference signal according to the received local oscillation signal generated by the local oscillation source and the intermodulation interference signal, and transmits the intermediate frequency interference signal to the spectrum analyzer for signal analysis, processing and analysis calculation to obtain a test result;
before the passive intermodulation test system is accessed to a passive waveguide device to be tested, directly inputting an intermodulation test signal adjusted by a power amplifier to the second input end of the mixer, and measuring the residual intermodulation of the whole passive intermodulation test system;
the frequency multiplier and the power amplifier, the power amplifier and the passive waveguide device to be tested are connected by adopting waveguide structures;
the input end of the isolator is connected with the output end of the frequency multiplier, and the output end of the isolator is connected with the input end of the power amplifier;
the isolator is used for inhibiting electromagnetic interference of the whole passive intermodulation test system and ensuring normal transmission of signals;
the frequency multiplier is a W-band octave multiplier and is used for multiplying the frequency of the initial test signal to a W band, generating an intermodulation test signal and outputting the intermodulation test signal to the isolator.
2. The passive intermodulation test system of a new W-band waveguide structure of claim 1, wherein the first and second signal sources are stand-alone desktop signal sources.
3. The passive intermodulation test system of a novel W-band waveguide structure of claim 1, wherein the passive waveguide device under test is a dual port passive waveguide device.
4. The passive intermodulation test system of a novel W-band waveguide structure of claim 3, wherein the passive waveguide device under test is a dual-port passive waveguide device operating in the millimeter wave band.
5. The passive intermodulation test system of a novel W-band waveguide structure of claim 3, wherein the intermodulation test signal power fed into the input of the passive waveguide device under test reaches 2 x 20W (43 dBm).
6. The passive intermodulation test system of the novel W-band waveguide structure of claim 1, wherein the spectrum analyzer analyzes the if interference signal received from the mixer to obtain phase information and amplitude information, and performs data processing and analysis calculation on the phase information and amplitude information to obtain a test result, so as to complete the passive intermodulation test of the W-band passive waveguide device.
7. A novel passive intermodulation test method of a W-band waveguide structure is characterized in that the method is applied to a novel passive intermodulation test system of a W-band waveguide structure according to any one of claims 1 to 6; the method comprises the following steps:
the first signal source and the second signal source are used as signal generating devices, and a first initial radio frequency signal and a second initial radio frequency signal are correspondingly generated and input to the combiner; combining the first initial radio frequency signal and the second initial radio frequency signal through a combiner to generate an initial test signal;
the frequency multiplier receives the initial test signal, multiplies the frequency of the initial test signal to a W wave band, generates an intermodulation test signal and outputs the intermodulation test signal to a power amplifier; adjusting the power and the level of the intermodulation test signal through a power amplifier to enable the intermodulation test signal to meet the test requirement, and outputting the intermodulation test signal to a passive waveguide device to be tested;
the passive waveguide device to be tested enables the intermodulation test signals to be subjected to mutual frequency mixing when passing through by utilizing the nonlinear characteristic of the passive waveguide device to be tested, generates a passive intermodulation Product (PIM), and outputs intermodulation interference signals to a frequency mixer; setting a local oscillation source to generate a local oscillation signal, and inputting the local oscillation signal to a frequency mixer;
the mixer generates an intermediate frequency interference signal according to the received local oscillator signal and the intermodulation interference signal, and transmits the intermediate frequency interference signal to a spectrum analyzer for signal analysis, processing and analysis calculation to obtain a test result, thereby completing the intermodulation test of the passive waveguide device;
further comprising: before the passive intermodulation test system is connected to a passive waveguide device to be tested, the intermodulation test signal adjusted by the power amplifier is directly input to the second input end of the mixer, and the residual intermodulation of the whole passive intermodulation test system is measured.
8. The passive intermodulation test method of a novel W-band waveguide structure of claim 7, wherein the frequency multiplier is a W-band octamultiplier.
CN202011332739.4A 2020-11-24 2020-11-24 Novel passive intermodulation test system and method for W-band waveguide structure Expired - Fee Related CN112564833B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202011332739.4A CN112564833B (en) 2020-11-24 2020-11-24 Novel passive intermodulation test system and method for W-band waveguide structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202011332739.4A CN112564833B (en) 2020-11-24 2020-11-24 Novel passive intermodulation test system and method for W-band waveguide structure

Publications (2)

Publication Number Publication Date
CN112564833A CN112564833A (en) 2021-03-26
CN112564833B true CN112564833B (en) 2022-02-22

Family

ID=75043503

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202011332739.4A Expired - Fee Related CN112564833B (en) 2020-11-24 2020-11-24 Novel passive intermodulation test system and method for W-band waveguide structure

Country Status (1)

Country Link
CN (1) CN112564833B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113489559B (en) * 2021-07-07 2022-06-10 北京邮电大学 Passive intermodulation prediction method for coaxial connector under different communication frequency bands
CN114050871B (en) * 2021-11-11 2023-12-05 北京天地一格科技有限公司 W-band signal testing method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102790331A (en) * 2012-07-31 2012-11-21 武汉虹信通信技术有限责任公司 DIN adapter connector standard element used for passive inter-modulation test
CN103001712A (en) * 2012-11-20 2013-03-27 武汉虹信通信技术有限责任公司 Multi-frequency-band multi-signal second-order inter-modulation testing system
CN105099586A (en) * 2015-09-11 2015-11-25 中国电子科技集团公司第四十一研究所 Passive isolator intermodulation test device based on chamber filtering and method
EP3094020A1 (en) * 2015-05-13 2016-11-16 Airbus DS GmbH Method for determining payload parameters of a device under test
CN111064496A (en) * 2019-12-31 2020-04-24 苏州信而泰信息技术有限公司 Passive intermodulation test system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6526345B1 (en) * 2016-02-05 2019-06-05 シュピナー ゲゼルシャフト ミット ベシュレンクテル ハフツングSPINNER GmbH Filter structure for PIM measurement

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102790331A (en) * 2012-07-31 2012-11-21 武汉虹信通信技术有限责任公司 DIN adapter connector standard element used for passive inter-modulation test
CN103001712A (en) * 2012-11-20 2013-03-27 武汉虹信通信技术有限责任公司 Multi-frequency-band multi-signal second-order inter-modulation testing system
EP3094020A1 (en) * 2015-05-13 2016-11-16 Airbus DS GmbH Method for determining payload parameters of a device under test
CN105099586A (en) * 2015-09-11 2015-11-25 中国电子科技集团公司第四十一研究所 Passive isolator intermodulation test device based on chamber filtering and method
CN111064496A (en) * 2019-12-31 2020-04-24 苏州信而泰信息技术有限公司 Passive intermodulation test system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
毫米波功率放大器与二倍频器的设计;唐文;《中国优秀硕士学位论文全文库》;20110415;正文第四章 *

Also Published As

Publication number Publication date
CN112564833A (en) 2021-03-26

Similar Documents

Publication Publication Date Title
Khalid et al. Wideband THz communication channel measurements for 5G indoor wireless networks
CN112564833B (en) Novel passive intermodulation test system and method for W-band waveguide structure
US7672640B2 (en) Multichannel absorberless near field measurement system
US8502546B2 (en) Multichannel absorberless near field measurement system
CN110601773B (en) Radiation stray test method and device and test system
CN111880013B (en) Terahertz mixer frequency conversion loss testing method and system for eliminating radio frequency source influence
CN104459652B (en) A kind of 3mm band noises coefficient single-side belt spreads measurement apparatus and method in high precision
CN108802503B (en) Multi-channel frequency conversion data compensation system and method for solar radio observation system
EP4024718A1 (en) Communication device, and radio-frequency interference elimination method and apparatus
Zhu et al. System-on-chip upgrade of millimeter-wave imaging diagnostics for fusion plasma
CN113612553B (en) Receiver radio frequency link nonlinear effect multi-parameter test platform
CN210246765U (en) Detection system suitable for microwave shielding effectiveness
CN113472387A (en) W-waveband space field amplitude-phase test system
CN108199790A (en) The waveguide test system and test method of a kind of passive intermodulation of metal net performance
CN108896965B (en) 200GHz frequency band signal receiving and transmitting measurement system
Fuse et al. High-dynamic-range measurement of millimeter-wave amplifier using 140-GHz fundamental mixer
CN108650031B (en) Microwave component weak passive intermodulation test system and method based on cancellation technology
CN111965440A (en) Terahertz receiver noise test system
Wang et al. E-band transceiver monolithic microwave integrated circuit in a waveguide package for millimeter-wave radio channel emulation applications
Gao et al. Single-port measurement scheme: An alternative approach to system calibration for 5G massive MIMO base station conformance testing
CN117538627B (en) Port impedance consistency measurement equipment and method
Aryanfar et al. Measurements corner-validation of wireless channel models using a scaled mm-wave measurement system
CN221151373U (en) Device for realizing interference detection function based on dynamic switching unit
JP2003057274A (en) Method and apparatus for measuring side-band ratio of superconducting mixer, using comb generator
US10837998B1 (en) Miniature nonlinear transmission line (NLTL)-based frequency-scalable ultra-wideband spectrum analyzer

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20220222