CN112488578A - Refining device stability rate calculation method and system - Google Patents
Refining device stability rate calculation method and system Download PDFInfo
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Abstract
The invention relates to a refining device stability rate calculation method and a refining device stability rate calculation system, which are characterized by comprising the following steps of: 1) configuring monitoring points according to the process card information, namely configuring process parameters needing to be monitored in a production management system of a factory according to the process requirements of each device, creating corresponding monitoring points, and determining process constraint conditions and monitoring frequency information; 2) tracking the dynamic change of the parameter value of each monitoring point in real time, obtaining the monitoring deviation value of each monitoring point according to a set threshold value and the collected real-time value of the monitoring point number, and storing the obtained deviation record; 3) and obtaining the duration time of each deviation and the total deviation time according to the deviation records, and further calculating the stability of each device for reflecting the running stability of the device. The method can be widely applied to the field of stability rate calculation of refining devices.
Description
Technical Field
The invention relates to a method and a system for calculating the stability rate of an refining device, and belongs to the field of production management of refining enterprises.
Background
The device stability rate assessment is one of important contents in the process management business of the refinery enterprise, and the process card is a technical standard for guiding workers to operate the device and judging the running state of the device. The process indexes on the process card represent the range of process constraint conditions within which the device can run stably under different conditions, so that the method for judging whether the device runs stably in a period of time is to count the number of indexes of the device running beyond the process constraint conditions in the period of time.
Namely, the execution condition of the process card is examined and measured by the stability rate of the device, and the examination method is to analyze and judge the deviation condition of the index by comparing various index data in the running process of the device with the process constraint conditions on the process card, thereby quantitatively examining the production running, the product quality and the personnel operation level. However, in the existing device stability rate assessment, a manual dosage mode is mostly adopted, so that the calculation efficiency of the device stability rate assessment is low, and the accuracy of the deviation time is difficult to guarantee.
Disclosure of Invention
In view of the above problems, the present invention provides a method and a system for calculating the stationary rate of a refining device, which are used for calculating the stationary rate of the refining device.
In order to achieve the purpose, the invention adopts the following technical scheme:
the invention provides a method for calculating the stability rate of an refining device, which comprises the following steps: 1) configuring monitoring points according to the process card information, namely configuring process parameters needing to be monitored in a production management system of a factory according to the process requirements of each device, creating corresponding monitoring points, and determining process constraint conditions and monitoring frequency information; 2) tracking the dynamic change of the parameter value of each monitoring point in real time, obtaining the monitoring deviation value of each monitoring point according to a set threshold value and the collected real-time value of the monitoring point number, and storing the obtained deviation record; 3) and obtaining the duration time of each deviation and the total deviation time according to the deviation records, and further calculating the stability of each device for reflecting the running stability of the device.
Further, in step 2), the deviation record includes a monitoring point where the deviation occurs, a deviation starting time, a deviation starting value, a deviation ending time, a deviation ending value, a duration, an upper limit value, and a lower limit value.
Further, in the step 3), the method for calculating the stationary rate of each device includes the following steps: 3.1) according to the deviation record and the monitoring frequency, tracing the historical value in the time period of the monitoring frequency forward, thereby finding the real time of the deviation occurrence and ending of each monitoring point of each device and further determining the deviation duration time of each monitoring point of each device; 3.2) summarizing the accumulated time of the deviation sent by all the monitoring points of each device to obtain the total deviation time; 3.3) calculating the stability rate of each device according to the duration of each deviation of each device obtained in the step 3.1) and the total deviation time obtained in the step 3.2).
Further, in the step 3.3), the formula for calculating the stationary rate is as follows:
the device stability rate is (1-the sum of the process index overproof accumulated time and/total process index participated in the assessment accumulated time) multiplied by 100%.
Further, before the step 3), a deviation eliminating process is further included, specifically, the method includes the following steps:
firstly, submitting a deviation rejection application according to actual needs;
and secondly, examining and approving the submitted rejection deviation application according to an examination and approval standard, if the examination and approval is passed, rejecting the process index during the calculation of the stability rate, and otherwise, calculating the stability rate according to the actual deviation record.
In a second aspect of the invention, a refinery apparatus stability calculation system is provided, comprising: a monitoring point configuration module, configured to perform monitoring point configuration according to the process card information, that is, configure the process parameters to be monitored for the process requirement of each device in the production management system of the factory, create corresponding monitoring points, and determine the process constraint conditions and the monitoring frequency information; the deviation record acquisition module is used for tracking the dynamic change of the parameter values of each monitoring point in real time, acquiring the monitoring deviation value of each monitoring point according to a set threshold value and the acquired real-time values of the monitoring point number, and storing the monitoring deviation value to obtain a deviation record; and the stability rate calculation module is used for obtaining the duration time of each deviation and the total deviation time according to the deviation records, further calculating the stability rate of each device and reflecting the running stability of the device.
Further, the deviation record stored in the deviation record obtaining module includes a monitoring point where the deviation occurs, a deviation starting time, a deviation starting value, a deviation ending time, a deviation ending value, a duration, an upper limit value, and a lower limit value.
Further, the stationary rate calculating module includes: the process index overproof accumulated time calculation module is used for tracing the historical value in the monitoring frequency time period forward according to the deviation record and the monitoring frequency so as to find the real time of the occurrence and the end of the deviation of each monitoring point of each device and further determine the time of the deviation duration of each monitoring point of each device; the total process index deviation accumulated time is used for summarizing the accumulated time of the deviation sent by all the monitoring points of each device to obtain the total deviation time; and the calculating module is used for calculating and obtaining the stability rate of each device according to the obtained duration time of each deviation of each device and the total deviation time.
Further, in the calculating module, the formula for calculating the stationary rate is as follows:
the device stability rate is (1-the sum of the process index overproof accumulated time and/total process index participated in the assessment accumulated time) multiplied by 100%.
Further, the system further comprises a reject deviation module, comprising: the rejecting deviation application module is used for submitting a rejecting deviation application according to actual needs; and the rejection deviation approving module is used for approving the submitted rejection deviation application according to an approval standard, if the approval is passed, the process index is rejected from the deviation record and then sent to the stability rate calculating module, and if the approval is not passed, the actual deviation record is sent to the stability rate calculating module for stability rate calculation.
Due to the adoption of the technical scheme, the invention has the following advantages: 1. according to the invention, each monitoring point is monitored, each process index can be monitored in real time, the stability rate is automatically calculated according to real-time monitoring data, and the stability rate calculation efficiency is improved. 2. The method is provided with a deviation eliminating process, the deviation is eliminated according to actual needs, and the stability rate calculation result is corrected according to the data after the deviation elimination, so that the accuracy of the stability rate assessment of the refining device is ensured. 3. According to the method, the real time of each deviation occurrence is traced according to the deviation record and the monitoring frequency, and the stability rate of the device is calculated and obtained based on the real time, so that the stability rate calculation result of the device is more accurate. Therefore, the method can be widely applied to the field of calculating the stability rate of the refining device.
Drawings
FIG. 1 is a flow chart of a method for calculating the stationary rate of the present invention.
Detailed Description
The invention is described in detail below with reference to the figures and examples.
As shown in FIG. 1, the invention provides a refining device stability rate calculation method, which comprises the following steps:
1) and (3) carrying out monitoring point configuration according to the process card information, namely configuring process parameters needing to be monitored in a production management system of a factory according to the process requirement of each device, creating corresponding monitoring points, and determining information such as process constraint conditions, monitoring frequency and the like.
2) And tracking the dynamic change of the parameter value of each monitoring point in real time, obtaining the monitoring deviation value of each monitoring point according to a set threshold value and the collected real-time value of the monitoring point number, and storing to obtain a deviation record. The deviation record comprises a monitoring point where the deviation occurs, deviation starting time, a deviation starting value, deviation ending time, a deviation ending value, duration, an upper limit value, a lower limit value and the like.
3) And obtaining the duration time of each deviation and the total deviation time according to the deviation records, and further calculating the stability of each device for reflecting the running stability of the device.
Specifically, the method comprises the following steps:
3.1) according to the deviation record and the monitoring frequency, tracing the historical value in the time period of the monitoring frequency forward, thereby finding the real time of the deviation occurrence and ending of each monitoring point of each device and further determining the deviation duration time of each monitoring point of each device;
3.2) summarizing the accumulated time of all monitoring points of all devices when the deviation occurs to obtain the total time of the deviation;
3.3) obtaining the stability rate of each device according to the duration of each deviation of each device obtained in the step 3.1) and the total deviation time obtained in the step 3.2).
The calculation formula is as follows:
the device stability rate is (1-the sum of the process index overproof accumulated time and/total process index participated in the assessment accumulated time) × 100%
In the step 3), before the stability rate of the device is calculated, deviation records belonging to normal conditions, such as deviation caused by equipment debugging, instrument faults and the like, can be removed according to actual needs. The method comprises the following steps: firstly, submitting a deviation rejection application according to actual needs; and then, the approver approves the submitted rejection deviation application according to the approval standard, if the approval is passed, the process index is rejected during the calculation of the stability rate, otherwise, the stability rate is calculated according to the actual deviation record. The approval standard is that the deviation is not caused by human operation but caused by other non-human factors such as equipment abnormity and the like.
In the step 3), the stability rate record indicates the stability rate corresponding to each shift of each device, and includes the device name, the shift time, and the stability rate.
The invention also provides a refining device stability rate calculation system, which comprises: a monitoring point configuration module, configured to perform monitoring point configuration according to the process card information, that is, configure the process parameters to be monitored for the process requirement of each device in the production management system of the factory, create corresponding monitoring points, and determine the process constraint conditions and the monitoring frequency information; the deviation record acquisition module is used for tracking the dynamic change of the parameter values of each monitoring point in real time, acquiring the monitoring deviation value of each monitoring point according to a set threshold value and the acquired real-time values of the monitoring point number, and storing the monitoring deviation value to obtain a deviation record; and the stability rate calculation module is used for obtaining the duration time of each deviation and the total deviation time according to the deviation records, further calculating the stability rate of each device and reflecting the running stability of the device.
Further, the deviation record stored in the deviation record obtaining module includes a monitoring point where the deviation occurs, a deviation starting time, a deviation starting value, a deviation ending time, a deviation ending value, a duration, an upper limit value and a lower limit value.
Further, the stationary rate calculation module includes: the process index overproof accumulated time calculation module is used for tracing the historical value in the monitoring frequency time period forward according to the deviation record and the monitoring frequency so as to find the real time of the occurrence and the end of the deviation of each monitoring point of each device and further determine the time of the deviation duration of each monitoring point of each device; the total process index deviation accumulated time is used for summarizing the accumulated time of the deviation sent by all the monitoring points of each device to obtain the total deviation time; and the calculating module is used for calculating and obtaining the stability rate of each device according to the obtained duration time of each deviation of each device and the total deviation time.
Further, in the calculation module, the stability ratio calculation formula is as follows:
the device stability rate is (1-the sum of the process index overproof accumulated time and/total process index participated in the assessment accumulated time) multiplied by 100%.
Further, the system also includes a reject deviation module comprising: the rejecting deviation application module is used for submitting a rejecting deviation application according to actual needs; and the rejection deviation approving module is used for approving the submitted rejection deviation application according to an approval standard, if the approval is passed, the process index is rejected from the deviation record and then sent to the stability rate calculating module, and if the approval is not passed, the actual deviation record is sent to the stability rate calculating module for stability rate calculation.
The above embodiments are only used for illustrating the present invention, and the structure, connection mode, manufacturing process, etc. of the components may be changed, and all equivalent changes and modifications performed on the basis of the technical solution of the present invention should not be excluded from the protection scope of the present invention.
Claims (10)
1. A refining device stability rate calculation method is characterized by comprising the following steps:
1) configuring monitoring points according to the process card information, namely configuring process parameters needing to be monitored in a production management system of a factory according to the process requirements of each device, creating corresponding monitoring points, and determining process constraint conditions and monitoring frequency information;
2) tracking the dynamic change of the parameter value of each monitoring point in real time, obtaining the monitoring deviation value of each monitoring point according to a set threshold value and the collected real-time value of the monitoring point number, and storing the obtained deviation record;
3) and obtaining the duration time of each deviation and the total deviation time according to the deviation records, and further calculating the stability of each device for reflecting the running stability of the device.
2. The refining apparatus stationarity calculating method of claim 1, wherein: in the step 2), the deviation record includes a monitoring point where the deviation occurs, deviation starting time, a deviation starting value, deviation ending time, a deviation ending value, duration, an upper limit value and a lower limit value.
3. The refining apparatus stationarity calculating method of claim 1, wherein: in the step 3), the method for calculating the stationary rate of each device includes the following steps:
3.1) according to the deviation record and the monitoring frequency, tracing the historical value in the time period of the monitoring frequency forward, thereby finding the real time of the deviation occurrence and ending of each monitoring point of each device and further determining the deviation duration time of each monitoring point of each device;
3.2) summarizing the accumulated time of the deviation sent by all the monitoring points of each device to obtain the total deviation time;
3.3) calculating the stability rate of each device according to the duration of each deviation of each device obtained in the step 3.1) and the total deviation time obtained in the step 3.2).
4. The refining apparatus stationarity calculating method of claim 1, wherein: in the step 3.3), the calculation formula of the stability rate is as follows:
the device stability rate is (1-the sum of the process index overproof accumulated time and/total process index participated in the assessment accumulated time) multiplied by 100%.
5. The refining apparatus stationarity calculating method of claim 1, wherein: before the step 3), a deviation eliminating process is further included, and specifically, the method comprises the following steps:
firstly, submitting a deviation rejection application according to actual needs;
and secondly, examining and approving the submitted rejection deviation application according to an examination and approval standard, if the examination and approval is passed, rejecting the process index during the calculation of the stability rate, and otherwise, calculating the stability rate according to the actual deviation record.
6. An refinery unit trim calculation system adapted for use with the method of any one of claims 1 to 5, comprising:
a monitoring point configuration module, configured to perform monitoring point configuration according to the process card information, that is, configure the process parameters to be monitored for the process requirement of each device in the production management system of the factory, create corresponding monitoring points, and determine the process constraint conditions and the monitoring frequency information;
the deviation record acquisition module is used for tracking the dynamic change of the parameter values of each monitoring point in real time, acquiring the monitoring deviation value of each monitoring point according to a set threshold value and the acquired real-time values of the monitoring point number, and storing the monitoring deviation value to obtain a deviation record;
and the stability rate calculation module is used for obtaining the duration time of each deviation and the total deviation time according to the deviation records, further calculating the stability rate of each device and reflecting the running stability of the device.
7. An refinery unit stationarity calculating system of claim 6, wherein: the deviation record stored in the deviation record acquisition module comprises a monitoring point where the deviation occurs, deviation starting time, a deviation starting value, deviation ending time, a deviation ending value, duration, an upper limit value and a lower limit value.
8. An refinery unit stationarity calculating system of claim 6, wherein: the stationary rate calculation module includes:
the process index overproof accumulated time calculation module is used for tracing the historical value in the monitoring frequency time period forward according to the deviation record and the monitoring frequency so as to find the real time of the occurrence and the end of the deviation of each monitoring point of each device and further determine the time of the deviation duration of each monitoring point of each device;
the total process index deviation accumulated time is used for summarizing the accumulated time of the deviation sent by all the monitoring points of each device to obtain the total deviation time;
and the calculating module is used for calculating and obtaining the stability rate of each device according to the obtained duration time of each deviation of each device and the total deviation time.
9. A refinery unit stationarity calculating system of claim 8, wherein: in the calculation module, the stability rate calculation formula is as follows:
the device stability rate is (1-the sum of the process index overproof accumulated time and/total process index participated in the assessment accumulated time) multiplied by 100%.
10. An refinery unit stationarity calculating system of claim 6, wherein: the system also includes a reject bias module comprising:
the rejecting deviation application module is used for submitting a rejecting deviation application according to actual needs;
and the rejection deviation approving module is used for approving the submitted rejection deviation application according to an approval standard, if the approval is passed, the process index is rejected from the deviation record and then sent to the stability rate calculating module, and if the approval is not passed, the actual deviation record is sent to the stability rate calculating module for stability rate calculation.
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