CN112284540A - 一种短波紫外色散剪切干涉高成像光谱装置 - Google Patents
一种短波紫外色散剪切干涉高成像光谱装置 Download PDFInfo
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Abstract
本发明公开了一种短波紫外色散剪切干涉高成像光谱装置,由准直物镜、滤光片、分束镜、第一反射光栅、第一物镜、带光阑的反射镜、第二物镜、第二反射光栅、成像物镜和面阵相机构成;第一物镜与第二物镜构成共焦***,通过与带光阑的反射镜配合,能够有效抑制第一反射光栅、第二反射光栅某些无效衍射级次的杂散光,保证同一视场角入射光束只产生两束横向剪切的相干光束,从而避免重构拉曼光谱出现伪峰。
Description
技术领域
本发明属于光学成像领域,具体涉及一种短波紫外色散剪切干涉高成像光谱装置,用于激发和获取远距离目标的拉曼光谱图像信息。
背景技术
拉曼高光谱成像技术是近年来发展起来的新型拉曼光谱测试技术,能够获取探测目标场景中各个点的拉曼光谱信息,进而重构拉曼光谱三维数据立方体,在生物医学、半导体材料测试、农产品检测等领域具有重要应用价值。
短波紫外激光作为激发光源具有拉曼散射激发效率高、荧光干扰小、共振增强等优点,尤其是近年来随着半导体泵浦全固态激光器功率不断增加,为短波紫外拉曼高光谱成像提供了有效光源。采用色散剪切干涉成像光谱技术能够实现高分辨率拉曼光谱探测,但是随着波长的减小,干涉结构中的光栅无效衍射级次增加,有效级次附近的无效衍射级次会导致出现多束横向剪切相干光束,导致重构拉曼光谱出现伪峰。
发明内容
本发明的目的在于提供一种短波紫外色散剪切干涉高成像光谱装置,用以获取对目标的拉曼散射信号进行高光谱成像,***采用共光路结构,将传统共光路干涉机构的两个反射镜换为反射光栅,能够极大的提高光谱分辨率,满足拉曼光谱分析需求,此外在干涉***中加入成像物镜与光阑,能够有效抑制无效衍射级次影响,提高拉曼光谱探测准确性。
实现本发明目的的技术解决方案为:一种短波紫外色散剪切干涉高成像光谱装置,其特征在于:包括沿光路设置的准直物镜、滤光片、分束镜、第一反射光栅、第一物镜、带光阑的反射镜、第二物镜、第二反射光栅、成像物镜和面阵相机;其中带光阑的反射镜的几何中心位于第一物镜的焦面位置,同时也是第二物镜的焦面;面阵相机的光敏面位于成像物镜的后焦面位置。第一物镜与第二物镜的规格相同。第一反射光栅与第二反射光栅的规格相同。第一反射光栅基底所在平面与分束镜所在平面的夹角与第二反射光栅基底所在平面与分束镜所在平面的夹角相同。带光阑的反射镜由光阑和反射镜构成,通过控制光阑尺寸可以调节带光阑的分束镜的通光宽度。
与现有技术相比,本发明有以下优点:
(1)光谱分辨率高,满足短波紫外拉曼光谱分析需求;
(2)能够有效抑制光栅产生的无效级次杂散光对复原拉曼光谱的影响。
附图说明
图1为本发明一种短波紫外色散剪切干涉高成像光谱装置。
具体实施方式
下面结合附图对本发明作进一步详细描述。
如图1所示,本发明一种短波紫外色散剪切干涉高成像光谱装置,包括准直物镜1、滤光片2、分束镜3、第一反射光栅4、第一物镜5、带光阑的反射镜6、第二物镜7、第二反射光栅8、成像物镜9和面阵相机10;其中带光阑的反射镜6的几何中心位于第一物镜5的焦面位置,同时也是第二物镜7的焦面;面阵相机10的光敏面位于成像物镜9的后焦面位置。所有光学元件相对于基底同轴等高,即相对于光学平台或仪器底座同轴等高。第一物镜5与第二物镜7的规格相同。第一反射光栅4与第二反射光栅8的规格相同。第一反射光栅4基底所在平面与分束镜3所在平面的夹角与第二反射光栅8基底所在平面与分束镜3所在平面的夹角相同。带光阑的反射镜6由光阑和反射镜构成,通过控制光阑尺寸可以调节带光阑的分束镜6的通光宽度。
本发明的工作原理:
待测目标发出的拉曼散射光谱首先经过准直物镜1形成不同视场角的平行光束,经过滤光片2滤除瑞利散射后,进入分束镜3,形成两路相干光束;一束光沿顺时针方向依次经过第一反射光栅4、第一物镜5、带光阑的反射镜6、第二物镜7、第二反射光栅8后,再次经过分束镜3,反射光束经过成像物镜9后,汇聚成像在面阵相机10的靶面上;第二束光沿逆时针方向依次经过第二反射光栅8、第二物镜7、带光阑的反射镜6、第一物镜5、第一反射光栅4后,再次经过分束镜3,投射光束经过成像物镜9后,汇聚成像在面阵相机10的靶面上;两束相干光经过相同光路后,引入随波长变换的横向剪切量,在面阵相机10靶面上形成带干涉条纹的目标二维图像。
本发明的一种短波紫外色散剪切干涉高成像光谱装置,在干涉***中加入光栅,光谱分辨率高,满足短波紫外拉曼光谱分析需求。内置物镜与视场光阑,能够有效抑制光栅产生的无效级次杂散光对复原拉曼光谱的影响。
Claims (6)
1.一种短波紫外色散剪切干涉高成像光谱装置,其特征在于:包括准直物镜(1)、滤光片(2)、分束镜(3)、第一反射光栅(4)、第一物镜(5)、带光阑的反射镜(6)、第二物镜(7)、第二反射光栅(8)、成像物镜(9)和面阵相机(10);其中带光阑的反射镜(6)的几何中心位于第一物镜(5)的焦面位置;面阵相机(10)的光敏面位于成像物镜(9)的后焦面位置。
2.根据权利要求1所述的一种短波紫外色散剪切干涉高成像光谱装置,其特征在于:第一物镜(5)与第二物镜(7)的规格相同。
3.根据权利要求1所述的一种短波紫外色散剪切干涉高成像光谱装置,其特征在于:第一反射光栅(4)与第二反射光栅(8)的规格相同。
4.根据权利要求1所述的一种短波紫外色散剪切干涉高成像光谱装置,其特征在于:第一反射光栅(4)基底所在平面与分束镜(3)所在平面的夹角与第二反射光栅(8)基底所在平面与分束镜(3)所在平面的夹角相同。
5.根据权利要求1所述的一种短波紫外色散剪切干涉高成像光谱装置,其特征在于:带光阑的反射镜(6)由光阑和反射镜构成,通过控制光阑尺寸可以调节带光阑的分束镜(6)的通光宽度。
6.根据权利要求1所述的一种短波紫外色散剪切干涉高成像光谱装置,其特征在于:带光阑的反射镜(6)的几何中心也是第二物镜(7)的焦面位置。
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US5329353A (en) * | 1991-02-07 | 1994-07-12 | Research Development Corp. Of Japan | High sensitive multi-wavelength spectral analyzer |
CN102759402A (zh) * | 2012-07-23 | 2012-10-31 | 北京理工大学 | 一种旋转式傅里叶变换干涉成像光谱仪 |
CN103033265A (zh) * | 2012-12-21 | 2013-04-10 | 南京理工大学 | 空间外差干涉超光谱成像装置及方法 |
CN103063304A (zh) * | 2012-12-21 | 2013-04-24 | 南京理工大学 | 色散剪切像面干涉超光谱成像装置及方法 |
CN213336488U (zh) * | 2020-11-18 | 2021-06-01 | 江苏师范大学 | 一种短波紫外色散剪切干涉高成像光谱装置 |
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Publication number | Priority date | Publication date | Assignee | Title |
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US5329353A (en) * | 1991-02-07 | 1994-07-12 | Research Development Corp. Of Japan | High sensitive multi-wavelength spectral analyzer |
CN102759402A (zh) * | 2012-07-23 | 2012-10-31 | 北京理工大学 | 一种旋转式傅里叶变换干涉成像光谱仪 |
CN103033265A (zh) * | 2012-12-21 | 2013-04-10 | 南京理工大学 | 空间外差干涉超光谱成像装置及方法 |
CN103063304A (zh) * | 2012-12-21 | 2013-04-24 | 南京理工大学 | 色散剪切像面干涉超光谱成像装置及方法 |
CN213336488U (zh) * | 2020-11-18 | 2021-06-01 | 江苏师范大学 | 一种短波紫外色散剪切干涉高成像光谱装置 |
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