CN112240972A - Aging test fixture - Google Patents
Aging test fixture Download PDFInfo
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- CN112240972A CN112240972A CN202011011215.5A CN202011011215A CN112240972A CN 112240972 A CN112240972 A CN 112240972A CN 202011011215 A CN202011011215 A CN 202011011215A CN 112240972 A CN112240972 A CN 112240972A
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- 238000012360 testing method Methods 0.000 title claims abstract description 51
- 230000032683 aging Effects 0.000 title claims abstract description 40
- 230000005489 elastic deformation Effects 0.000 claims abstract description 6
- 239000007788 liquid Substances 0.000 claims description 100
- 238000000034 method Methods 0.000 claims description 9
- 239000000110 cooling liquid Substances 0.000 claims description 4
- 230000017525 heat dissipation Effects 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 230000035882 stress Effects 0.000 description 3
- 238000013021 overheating Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 239000012809 cooling fluid Substances 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Lasers (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to an aging test fixture, which comprises: the electrode assembly comprises a base, a first electrode assembly, a second electrode assembly and an elastic piece; the first electrode assembly is arranged on the base and used for positioning and bearing the laser diode to be tested; the second electrode assembly can move towards the direction close to or far away from the first electrode assembly, and the second electrode assembly presses and holds the laser diode; the pressing and holding assembly can be in separable abutting joint with the second electrode assembly, and the pressing and holding assembly can drive the second electrode assembly to move towards the direction close to the first electrode assembly, so that the second electrode assembly presses the laser diode on the first electrode assembly and the laser diode forms an aging test loop; the elastic piece is elastically abutted between the second electrode assembly and the base, the elastic piece is used for providing elastic force for the second electrode assembly to move towards the direction away from the first electrode assembly, and the elastic piece is also used for adjusting the pressing force of the second electrode assembly on the laser diode through the elastic deformation of the elastic piece.
Description
Technical Field
The invention relates to the technical field of semiconductor lasers, in particular to an aging test fixture.
Background
After the laser diode is manufactured, in order to ensure that the laser diode can work normally and durably, an aging test is required to be carried out, the existing test fixture generally adopts a power-on mode that a probe is pressed down to supply power to the positive electrode and the negative electrode of the laser diode to be tested, and because the pressing and holding force exerted on the laser diode by the probe is inconvenient to adjust, the laser diode is easy to cause uneven stress to generate pulse current, and the problem that the laser diode is easy to cause load overheating is solved.
Disclosure of Invention
Based on the aging test fixture, the stress uniformity of the laser diode to be tested in the aging test process can be improved.
A burn-in test fixture, comprising:
a base;
the first electrode assembly is arranged on the base and is used for connecting one of a positive pole and a negative pole of an external power supply and positioning and bearing the laser diode to be tested;
a second electrode assembly located above the first electrode assembly, the second electrode assembly being movable toward or away from the first electrode assembly, the second electrode assembly being adapted to be connected to the other of the positive electrode and the negative electrode of the external power supply and adapted to press the laser diode;
the pressing component is detachably abutted with the second electrode component and can drive the second electrode component to move towards the direction close to the first electrode component, so that the second electrode component presses the laser diode on the first electrode component and the laser diode forms an aging test loop; and
the elastic piece is elastically abutted between the second electrode assembly and the base, the elastic piece is used for providing elastic force for the second electrode assembly to move towards the direction away from the first electrode assembly, and the elastic piece is also used for adjusting the pressing force of the second electrode assembly on the laser diode through the elastic deformation of the elastic piece.
In one embodiment, a first liquid inlet and a first liquid outlet are disposed on the laser diode, a second liquid inlet and a second liquid outlet are disposed at positions corresponding to the first liquid inlet and the first liquid outlet on the first electrode assembly, respectively, the second liquid inlet is communicated with the first liquid inlet, the second liquid outlet is communicated with the first liquid outlet, a third liquid inlet and a third liquid outlet are disposed at positions corresponding to the second liquid inlet and the second liquid outlet on the base, respectively, the third liquid inlet is communicated with the second liquid inlet, the third liquid outlet is communicated with the second liquid outlet, a fourth liquid inlet and a fourth liquid outlet are further disposed on the base, the fourth liquid inlet is communicated with the third liquid inlet, the fourth liquid outlet is communicated with the third liquid outlet, and cooling liquid can enter the base from the fourth liquid inlet and then sequentially pass through the third liquid inlet, the third liquid outlet and the fourth liquid outlet, The second liquid inlet, the first liquid outlet, the second liquid outlet, the third liquid inlet and the fourth liquid outlet flow out to the outside of the base, so that the heat dissipation of the laser diode in the aging test process is realized.
In one embodiment, the pressing component comprises a guide part, a support part and a pressing part, wherein one end of the guide part is connected with the base; the support piece is arranged at one end of the guide piece far away from the base, the second electrode assembly is sleeved on the guide piece in a sliding mode and is positioned between the first electrode assembly and the support piece, and the elastic piece is sleeved on the guide piece; the pressing and holding piece is screwed and arranged on the supporting piece in a penetrating mode, the pressing and holding piece can abut against the second electrode assembly, the pressing and holding piece is rotated to drive the pressing and holding piece to move along the axial direction of the pressing and holding piece, the pressing and holding piece abuts against and drives the second electrode assembly to be close to the first electrode assembly along the axial direction of the guide piece, and therefore the second electrode assembly presses the laser diode on the first electrode assembly and the laser diode forms an aging test loop.
In one embodiment, the guide members and the elastic members are provided in plurality, the guide members are arranged at intervals relative to the base, and the elastic members are respectively in one-to-one correspondence with the guide members.
In one embodiment, the pressing and holding assembly further comprises a handle for facilitating an external force for an operator to drive the pressing and holding piece to rotate, and the handle is arranged at one end of the pressing and holding piece.
In one embodiment, the first electrode assembly includes a first electrode and a positioning member, the first electrode is disposed on the base, the first electrode is used for connecting to one of a positive electrode and a negative electrode of the external power source and is used for carrying the laser diode, the positioning member is disposed on the first electrode, and the positioning member is used for positioning and placing the laser diode on the first electrode.
In one embodiment, the positioning element has a limiting groove, the laser diode can be limited in the limiting groove, so that the positioning element can position the laser diode relative to the first electrode, and the second electrode assembly can extend into the limiting groove and press the laser diode.
In one embodiment, the first electrode assembly further comprises at least one of:
a first insulating pad disposed between the first electrode and the base; and
a first terminal for connecting the first electrode to one of a positive electrode and a negative electrode of the external power source.
In one embodiment, the second electrode assembly includes an electrode holder and a second electrode, the electrode holder is disposed above the first electrode assembly, the electrode holder is capable of moving toward or away from the direction of the first electrode assembly, the second electrode is disposed on a side of the electrode holder facing the first electrode assembly, the second electrode is used for connecting the other of the anode and the cathode of the external power supply and is used for pressing the laser diode, the pressing component is detachably abutted to the electrode holder, and the pressing component is used for driving the second electrode to move toward the direction of the first electrode assembly through the electrode holder.
In one embodiment, the second electrode assembly further comprises:
the second insulating pad is arranged on one side, away from the second electrode, of the electrode seat, and the pressing and holding assembly can be in separable abutting joint with the second insulating pad; and
a second terminal for connecting the second electrode and the other of the positive and negative electrodes of the external power source.
The aging test fixture provided by the application, during operation, a laser diode to be tested is positioned and placed on the first electrode assembly in advance, then the second electrode assembly is driven by the pressing assembly to move towards the direction close to the first electrode assembly, so that the second electrode assembly presses the laser diode on the first electrode assembly and the laser diode forms an aging test loop, and further the aging test of the laser diode is realized The laser diode after the aging test can be taken out from the first electrode assembly by an operator after being loosened, so that the aging test fixture provided by the application can quickly clamp and loosen the laser diode, and the aging test efficiency of the laser diode can be effectively improved; in addition, in the application, the elastic piece can also adjust the pressing force of the second electrode assembly on the laser diode through the elastic deformation of the elastic piece, so that the laser diode can be ensured to be uniformly stressed in the aging test process, and the problems that the laser diode generates pulse current due to the nonuniform pressure in the aging test process and the load is overheated are avoided.
Drawings
FIG. 1 is a schematic structural diagram of a burn-in test fixture in an embodiment;
FIG. 2 is an exploded view of the weathering test fixture of FIG. 1;
fig. 3 is a partial exploded view of the weathering test fixture of fig. 1.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
As shown in fig. 1 and 2, the burn-in test fixture 10 of an embodiment includes a base 100, a first electrode assembly 200, a second electrode assembly 300, a pressing assembly 400 and an elastic member 500, wherein the first electrode assembly 200 is disposed on the base 100, and the first electrode assembly 200 is used for connecting to one of a positive electrode and a negative electrode of an external power supply and positioning and carrying a laser diode 20 to be tested; the second electrode assembly 300 is positioned above the first electrode assembly 200, the second electrode assembly 300 can move towards a direction close to or far away from the first electrode assembly 200, the second electrode assembly 300 is used for connecting the other of the positive pole and the negative pole of the external power supply and is used for pressing and holding the laser diode 20; the pressing and holding assembly 400 is detachably abutted with the second electrode assembly 300, and the pressing and holding assembly 400 is used for driving the second electrode assembly 300 to move towards the direction close to the first electrode assembly 200, so that the second electrode assembly 300 presses the laser diode 20 on the first electrode assembly 200 and the laser diode 20 forms a aging test loop; the elastic member 500 elastically abuts between the second electrode assembly 300 and the base 100, the elastic member 500 is used for providing an elastic force for the second electrode assembly 300 to move in a direction away from the first electrode assembly 200, and the elastic member 500 is further used for adjusting the pressing force of the second electrode assembly 300 on the laser diode 20 through the elastic deformation of the elastic member 500.
In the aging test fixture 10 provided by the present application, during operation, a laser diode 20 to be tested is positioned and placed on the first electrode assembly 200 in advance, and then the second electrode assembly 300 is driven by the pressing assembly 400 to move towards the direction close to the first electrode assembly 200, so that the second electrode assembly 300 presses the laser diode 20 against the first electrode assembly 200 and the laser diode 20 forms an aging test loop, thereby implementing the aging test of the laser diode 20, in the present application, because the elastic member 500 is arranged between the second electrode assembly 300 and the base 100, the elastic member 500 can provide an elastic force for the second electrode assembly 300 to move towards the direction away from the first electrode assembly 200, after the aging test of the laser diode 20 is completed, an operator only needs to separate the pressing assembly 400 from the second electrode assembly 300, and the second electrode assembly 300 will automatically move towards the direction away from the first electrode assembly 200 under the action of the elastic member 500, at this time, the pressing force of the second electrode assembly 300 acting on the laser diode 20 can be released to release the laser diode 20, and an operator can take out the laser diode 20 subjected to the aging test from the first electrode assembly 200, so that the aging test fixture 10 provided by the application can rapidly clamp and release the laser diode 20, and the aging test efficiency of the laser diode 20 can be effectively improved; in addition, in the present application, the elastic member 500 can also adjust the pressing force of the second electrode assembly 300 on the laser diode 20 through its own elastic deformation, so that it can be ensured that the stress of the laser diode 20 can be kept uniform in the aging test process, and the problems of pulse current generated by the uneven pressure of the laser diode 20 in the aging test process and overheating of the load can be avoided.
As shown in fig. 3, in an embodiment, a first liquid inlet 21 and a first liquid outlet 22 are disposed on the laser diode 20, a second liquid inlet 201 and a second liquid outlet 202 are disposed at positions corresponding to the first liquid inlet 21 and the first liquid outlet 22 on the first electrode assembly 200, respectively, the second liquid inlet 201 is communicated with the first liquid inlet 21, the second liquid outlet 202 is communicated with the first liquid outlet 22, a third liquid inlet and a third liquid outlet are disposed at positions corresponding to the second liquid inlet 201 and the second liquid outlet 202 on the base 100, respectively, the third liquid inlet is communicated with the second liquid inlet 201, the third liquid outlet is communicated with the second liquid outlet 202, a fourth liquid inlet 110 and a fourth liquid outlet 120 are further disposed on the base 100, the fourth liquid inlet 110 is communicated with the third liquid inlet, the fourth liquid outlet 120 is communicated with the third liquid outlet, the cooling liquid can enter the base 100 from the fourth liquid inlet 110 and then sequentially pass through the third liquid inlet, The second liquid inlet 201, the first liquid inlet 21, the first liquid outlet 22, the second liquid outlet 202, the third liquid inlet and the fourth liquid outlet 120 flow out of the base 100, so as to realize heat dissipation of the laser diode 20 in the aging test process, and further effectively improve the safety and reliability of the laser diode 20 in the aging test process. In an embodiment, the cooling fluid may be, but is not limited to, cooling water.
As shown in fig. 1, in an embodiment, the aging test fixture 10 further includes an inlet connector 130 and an outlet connector 140, the inlet connector 130 is disposed at the fourth inlet 110 of the base 100, and the outlet connector 140 is disposed at the fourth outlet 120 of the base 100.
As shown in fig. 1 and 2, in one embodiment, the pressing assembly 400 includes a guiding element 410, a supporting element 420 and a pressing element 430, wherein one end of the guiding element 410 is connected to the base 100; the supporter 420 is disposed at one end of the guide 410 away from the base 100, the second electrode assembly 300 is slidably sleeved on the guide 410 and located between the first electrode assembly 200 and the supporter 420, and the elastic member 500 is sleeved on the guide 410; the pressing member 430 is screwed and inserted into the supporting member 420, and the pressing member 430 can abut against the second electrode assembly 300, and the pressing member 430 is rotated to drive the pressing member 430 to move along the axial direction thereof, so that the pressing member 430 abuts against and drives the second electrode assembly 300 to approach the first electrode assembly 200 along the axial direction of the guiding member 410, and further the second electrode assembly 300 presses the laser diode 20 on the first electrode assembly 200, and the laser diode 20 forms an aging test loop. With the arrangement, an operator only needs to unscrew or screw the pressing piece 430 before and after the aging test of the laser diode 20 to realize the pressing and loosening of the laser diode 20, so that the aging test efficiency of the laser diode 20 is greatly improved; meanwhile, the guide 410 can also guide the movement of the second electrode assembly 300 relative to the first electrode assembly 200, so as to ensure that the second electrode assembly 300 is close to or far away from the first electrode assembly 200 along a predetermined direction (axial direction of the guide 410), thereby ensuring that the second electrode assembly 300 can accurately press and hold the laser diode 20.
In one embodiment, one end of the guiding element 410 is screwed to the base 100, and further, one end of the guiding element 410 away from the base 100 is screwed to the supporting element 420. In an embodiment, the guiding elements 410 and the elastic elements 500 are provided in plural numbers, the guiding elements 410 are arranged at intervals relative to the base 100, and the elastic elements 500 are respectively in one-to-one correspondence with the guiding elements 410. In this embodiment, two guiding members 410 and two elastic members 500 are provided, the two guiding members 410 are arranged at intervals relative to the base 100, and the two elastic members 500 correspond to the two guiding members 410 one by one; it is understood that in other embodiments, the number of the guiding elements 410 and the elastic elements 500 may be one or more than three, and the specific arrangement may be chosen according to practical situations.
In one embodiment, the pressing and holding assembly 400 further includes a handle 440 for facilitating an external force for an operator to drive the pressing and holding member 430 to rotate, the handle 440 is disposed at one end of the pressing and holding member 430, and specifically, the handle 440 is screwed with one end of the pressing and holding member 430.
As shown in fig. 1 and fig. 2, in an embodiment, the first electrode assembly 200 includes a first electrode 210 and a positioning member 220, the first electrode 210 is disposed on the base 100, the first electrode 210 is used for connecting to one of a positive electrode and a negative electrode of an external power source and is used for carrying the laser diode 20, the positioning member 220 is disposed on the first electrode 210, and the positioning member 220 is used for positioning the laser diode 20 on the first electrode 210. In an embodiment, the positioning element 220 has a position-limiting groove, and the laser diode 20 can be limited in the position-limiting groove 222, so that the positioning element 220 can position the laser diode 20 relative to the first electrode 210, and specifically, the second electrode assembly 300 can extend into the position-limiting groove 222 and press the laser diode 20.
In one embodiment, the first electrode assembly 200 further includes a first insulating pad 230, and the first insulating pad 230 is disposed between the first electrode 210 and the base 100 to electrically isolate the first electrode 210 from the base 100, so as to prevent an operator from being electrically shocked when the operator accidentally touches the conductive base 100 during operation, thereby improving the safety of the aging test fixture 10.
In one embodiment, the first electrode assembly 200 further includes a first terminal 240, the first terminal 240 for connecting the first electrode 210 and one of a positive electrode and a negative electrode of an external power source.
In one embodiment, the first electrode assembly 200 further includes a threaded fastener 250, and the threaded fastener 250 sequentially penetrates through the positioning member 220, the first electrode 210, the first insulating pad 230 and the base 100, so that the positioning member 220, the first electrode 210, the first insulating pad 230 and the base 100 are fixedly connected.
As shown in fig. 3, in the present embodiment, the positions of the positioning element 220, the first electrode 210 and the first insulating pad 230 corresponding to the first liquid inlet 21 and the first liquid outlet 22 are respectively provided with a second liquid inlet 201 and a second liquid outlet 202.
As shown in fig. 1, in an embodiment, the first electrode assembly 200 further includes a sealing member 260, and the sealing member 260 is disposed between the abutting surfaces of any two adjacent of the positioning member 220, the first electrode 210, the first insulating pad 230 and the base 100, so as to prevent the leakage of the cooling liquid between the abutting surfaces of any two adjacent of the positioning member 220, the first electrode 210, the first insulating pad 230 and the base 100. In one embodiment, the seal 260 may be, but is not limited to being, an O-ring seal.
In an embodiment, the second electrode assembly 300 includes an electrode holder 310 and a second electrode 320, the electrode holder 310 is disposed above the first electrode assembly 200, the electrode holder 310 is capable of moving toward or away from the first electrode assembly 200, the second electrode 320 is disposed on a side of the electrode holder 310 facing the first electrode assembly 200, the second electrode 320 is used for connecting to the other of the positive electrode and the negative electrode of the external power source and is used for pressing the laser diode 20, the pressing assembly 400 is detachably abutted to the electrode holder 310, and the pressing assembly 400 is used for driving the second electrode 320 to move toward the direction close to the first electrode assembly 200 through the electrode holder 310, so that the second electrode 320 presses the laser diode 20 on the first electrode assembly 200 and the laser diode 20 forms an aging test loop. Specifically, the second electrode 320 can extend into the limiting groove 222 and press the laser diode 20.
In this embodiment, the electrode holder 310 is slidably sleeved on the guide 410. Further, in the present embodiment, the second electrode assembly 300 includes a bearing sleeve 330, the bearing sleeve 330 is disposed through the electrode holder 310, two ends of the bearing sleeve 330 extend out of the electrode holder 310, and the electrode holder 310 is slidably sleeved on the guide 410 through the bearing sleeve 330 to reduce the friction between the electrode holder 310 and the guide 410. Further, the second electrode assembly 300 further includes two fixing snap rings 340, the two fixing snap rings 340 are respectively disposed at two ends of the bearing housing 330, and the two fixing snap rings 340 respectively abut against two sides of the electrode holder 310, so that the bearing housing 330 is fixedly connected to the electrode holder 310.
In an embodiment, the second electrode assembly 300 further includes a second insulating pad 350, the second insulating pad 350 is disposed on a side of the electrode holder 310 facing away from the second electrode 320, and the pressing assembly 400 is detachably abutted to the second insulating pad 350, and specifically, the pressing member 430 is detachably abutted to the second insulating pad 350.
In one embodiment, the second electrode assembly 300 further includes a second terminal 360, the second terminal 360 for connecting the second electrode 320 and the other of the positive and negative electrodes of the external power source.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above examples only express preferred embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A fixture for burn-in testing, comprising:
a base;
the first electrode assembly is arranged on the base and is used for connecting one of a positive pole and a negative pole of an external power supply and positioning and bearing the laser diode to be tested;
a second electrode assembly located above the first electrode assembly, the second electrode assembly being movable toward or away from the first electrode assembly, the second electrode assembly being adapted to be connected to the other of the positive electrode and the negative electrode of the external power supply and adapted to press the laser diode;
the pressing component is detachably abutted with the second electrode component and can drive the second electrode component to move towards the direction close to the first electrode component, so that the second electrode component presses the laser diode on the first electrode component and the laser diode forms an aging test loop; and
the elastic piece is elastically abutted between the second electrode assembly and the base, the elastic piece is used for providing elastic force for the second electrode assembly to move towards the direction away from the first electrode assembly, and the elastic piece is also used for adjusting the pressing force of the second electrode assembly on the laser diode through the elastic deformation of the elastic piece.
2. The fixture of claim 1, wherein the laser diode has a first liquid inlet and a first liquid outlet, the first electrode assembly has a second liquid inlet and a second liquid outlet at positions corresponding to the first liquid inlet and the first liquid outlet, respectively, the second liquid inlet is communicated with the first liquid inlet, the second liquid outlet is communicated with the first liquid outlet, the base has a third liquid inlet and a third liquid outlet at positions corresponding to the second liquid inlet and the second liquid outlet, respectively, the third liquid inlet is communicated with the second liquid inlet, the third liquid outlet is communicated with the second liquid outlet, the base has a fourth liquid inlet and a fourth liquid outlet, the fourth liquid inlet is communicated with the third liquid inlet, and the fourth liquid outlet is communicated with the third liquid outlet, the cooling liquid can enter from the fourth liquid inlet and sequentially passes through the third liquid inlet, the second liquid inlet, the first liquid outlet, the second liquid outlet and the third liquid inlet after the base is inside, and flows out of the base through the fourth liquid outlet, so that the heat dissipation of the laser diode in the aging test process is realized.
3. The weathering test fixture of claim 1 wherein the press holding assembly includes a guide, a support and a press holding member, one end of the guide being connected to the base; the support piece is arranged at one end of the guide piece far away from the base, the second electrode assembly is sleeved on the guide piece in a sliding mode and is positioned between the first electrode assembly and the support piece, and the elastic piece is sleeved on the guide piece; the pressing and holding piece is screwed and arranged on the supporting piece in a penetrating mode, the pressing and holding piece can abut against the second electrode assembly, the pressing and holding piece is rotated to drive the pressing and holding piece to move along the axial direction of the pressing and holding piece, the pressing and holding piece abuts against and drives the second electrode assembly to be close to the first electrode assembly along the axial direction of the guide piece, and therefore the second electrode assembly presses the laser diode on the first electrode assembly and the laser diode forms an aging test loop.
4. The fixture according to claim 3, wherein a plurality of guides and a plurality of elastic members are provided, the plurality of guides are arranged at intervals with respect to the base, and the plurality of elastic members correspond to the plurality of guides one-to-one, respectively.
5. The weathering test fixture of claim 4 wherein the press holding assembly further includes a handle for facilitating an external force applied by an operator to the press holding member to drive the press holding member to rotate, the handle being disposed at one end of the press holding member.
6. The fixture according to claim 1, wherein the first electrode assembly comprises a first electrode and a positioning member, the first electrode is disposed on the base, the first electrode is used for connecting to one of a positive electrode and a negative electrode of the external power supply and is used for carrying the laser diode, the positioning member is disposed on the first electrode, and the positioning member is used for positioning and placing the laser diode on the first electrode.
7. The fixture according to claim 6, wherein the positioning member has a positioning groove, the laser diode can be positioned in the positioning groove to position the laser diode relative to the first electrode, and the second electrode assembly can extend into the positioning groove and press the laser diode.
8. The weathering test fixture of claim 6 wherein the first electrode assembly further includes at least one of:
a first insulating pad disposed between the first electrode and the base; and
a first terminal for connecting the first electrode to one of a positive electrode and a negative electrode of the external power source.
9. The fixture according to claim 1, wherein the second electrode assembly includes an electrode holder and a second electrode, the electrode holder is disposed above the first electrode assembly, the electrode holder is capable of moving toward or away from the first electrode assembly, the second electrode is disposed on a side of the electrode holder facing the first electrode assembly, the second electrode is used for connecting to the other of the positive electrode and the negative electrode of the external power source and is used for pressing the laser diode, the pressing assembly is detachably abutted to the electrode holder, and the pressing assembly is used for driving the second electrode to move toward the direction close to the first electrode assembly through the electrode holder.
10. The weathering test fixture of claim 9 wherein the second electrode assembly further includes:
the second insulating pad is arranged on one side, away from the second electrode, of the electrode seat, and the pressing and holding assembly can be in separable abutting joint with the second insulating pad; and
a second terminal for connecting the second electrode and the other of the positive and negative electrodes of the external power source.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011011215.5A CN112240972B (en) | 2020-09-23 | 2020-09-23 | Aging test fixture |
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|---|---|---|---|
| CN202011011215.5A CN112240972B (en) | 2020-09-23 | 2020-09-23 | Aging test fixture |
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| CN112240972A true CN112240972A (en) | 2021-01-19 |
| CN112240972B CN112240972B (en) | 2024-04-19 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113314942A (en) * | 2021-05-25 | 2021-08-27 | 天津凯普林光电科技有限公司 | Power-on device of laser component |
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| CN103514893A (en) * | 2012-06-18 | 2014-01-15 | 新科实业有限公司 | Semiconductor light source bar cooling system and cooling method in aging tests |
| CN104166020A (en) * | 2014-08-26 | 2014-11-26 | 中国科学院半导体研究所 | Laser diode aging testing clamp |
| CN109283452A (en) * | 2018-10-19 | 2019-01-29 | 义乌臻格科技有限公司 | A kind of laser diode chip electro optic properties detection method and detection device |
| CN210514381U (en) * | 2019-07-11 | 2020-05-12 | 惠州鼎智科技有限公司 | Circuit board burning test fixture |
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| CN113314942A (en) * | 2021-05-25 | 2021-08-27 | 天津凯普林光电科技有限公司 | Power-on device of laser component |
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