CN112199242A - Auxiliary test board and hardware test system - Google Patents
Auxiliary test board and hardware test system Download PDFInfo
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- CN112199242A CN112199242A CN202010889095.2A CN202010889095A CN112199242A CN 112199242 A CN112199242 A CN 112199242A CN 202010889095 A CN202010889095 A CN 202010889095A CN 112199242 A CN112199242 A CN 112199242A
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- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
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Abstract
The invention provides an auxiliary test board and a hardware test system, belongs to the field of hardware test, and solves the problem that the existing hardware test process is complex. The MCU in the control module is respectively connected with an alternating current power supply, an oscilloscope, a relay and the operation module, and the MCU module controls the output of the alternating current power supply to the direct current power supply, receives an instruction signal sent by the operation module and sends a control signal to the oscilloscope and the relay; the operation module is used for responding to the operation of a user, triggering a control event of the oscilloscope and outputting the control event to the MCU of the control module; and the MCU block receives the delay instruction and delays the power-on/power-off of the power supply required by the test environment. The invention can integrate the operations of AC power-on/power-off, DC power-on/power-off, delayed power-on and the like into a whole, and substantially reduces the test complexity so as to realize the completion by single operation.
Description
Technical Field
The invention relates to the field of hardware testing, in particular to an auxiliary testing board and a hardware testing system.
Background
With the expansion of the application field of program development, various hardware components are derived immediately, and in order to ensure the smooth completion of the whole development application program, the performance test of each hardware is indispensable, and the board card hardware test is taken as an example below.
Generally, board card hardware tests include Power Sequence tests, Power Leakage tests, monotonicity tests, GPIO tests and the like, and for complex board cards such as server mainboards and the like, the tests can be completed by more manpower and for a long time; taking the Power Sequence test as an example, at least two manpower are needed, one person is responsible for fixing the oscilloscope probe at a test point, and the other person is responsible for actions such as Power-on, Power-off, oscilloscope signal name change, image storage and the like.
In the existing hardware auxiliary test technology, only part of the technology adopts ways of improving the probe, adding a clamp or designing a test platform and the like to fix the oscilloscope probe, and the test complexity is not substantially reduced.
Disclosure of Invention
The invention aims to provide an auxiliary test board capable of accelerating board card test efficiency and a board card with a hardware auxiliary test function, so that operations such as AC power-on/power-off, DC power-on/power-off, delayed power-on and the like are integrated, test complexity is substantially reduced, and single-person operation is realized.
In a first aspect, the invention provides an auxiliary test board, which comprises a control module and an operation module, wherein an MCU in the control module is respectively connected with an alternating current power supply, an oscilloscope, a relay and the operation module, and the MCU controls the output of the alternating current power supply to the direct current power supply, receives an instruction signal sent by the operation module and sends a control signal to the oscilloscope and the relay; the operation module is used for responding to the operation of a user, triggering a control event of the oscilloscope and outputting the control event to the MCU of the control module; and the MCU block receives the delay instruction and delays the power-on/power-off of the power supply required by the test environment.
Furthermore, the auxiliary test board further comprises a power module, the power module is connected with the board to be tested through a jack, and the MCU block controls the on-off of a circuit between the jack and the board to be tested.
Furthermore, the MCU block is connected with an alternating current power supply, the relay is connected between the jack and the alternating current power supply in series, and the on-off of the relay is controlled through the MCU block.
Furthermore, the MCU block controls the delayed on-off of the direct current power supply between the jack and the tested board card through the relay; and the MCU block controls the delayed on-off of the alternating current power supply between the jack and the tested board card through the relay.
Further, the operation module comprises an AC ON/OFF key and a DC ON/OFF key, wherein the AC ON/OFF key is used for controlling the ON-OFF of the relay so as to control the AC power-ON/power-OFF of the tested board card inserted in the jack; and the DC ON/OFF key is used for controlling the DC power-ON/power-OFF of the tested board card.
Furthermore, the operation module also comprises a Last key, a next key and a Mark key, wherein the Last key and the next key are used for controlling the oscilloscope to adjust the actions of signal name, oscillogram name, waveform setting and the like forwards or backwards according to the set sequence; the Mark keys are used for marking abnormal waveforms in the test process, and the oscilloscope is controlled to store marked pictures in another Mark folder.
Furthermore, the operation module further comprises a knob-shaped potentiometer, and the knob-shaped potentiometer is connected with the MCU block and is used for controlling the delay of the MCU block on/off DC power and AC power.
Further, an ADC conversion module is arranged in the MCU block to switch between the ac power supply and the dc power supply.
Further, the MCU block converts the SPI signal into an RMII signal through a chip W5200, and outputs the RMII signal according with an RJ45 protocol of network connection.
In a second aspect, the present invention further provides a hardware testing system, including a switch, an oscilloscope, a user end, a tested board and the auxiliary testing board according to any one of claims 1 to 9, wherein the oscilloscope, the user end, the tested board and the auxiliary testing board are respectively connected to the switch via a network, and a computer program capable of running on the MCU is stored in the MCU in the auxiliary testing board.
The auxiliary test board and the hardware test system provided by the invention can simultaneously carry out key control on the oscilloscope, switch an alternating current power supply or a direct current power supply required in the test process and carry out power-on/power-off delay on the power supply required by the test environment under the control of the MCU, can finish the whole process of hardware test under the operation of the same person, and comprises the control and marking of the imaging waveform of the oscilloscope, thereby greatly simplifying the test process, solving the problem of more complicated hardware test in essence, reducing the unnecessary waste of manpower and improving the test efficiency.
Accordingly, the auxiliary test board and the hardware test system provided by the embodiment of the invention also have the technical effects.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a detailed design framework of an auxiliary test board according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of an auxiliary test board according to an embodiment of the present invention;
FIG. 3 is a flow chart of hardware testing according to an embodiment of the present invention;
fig. 4 is an operation flow of the hardware testing system according to the embodiment of the present invention.
Detailed Description
To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The terms "comprising" and "having," and any variations thereof, as referred to in embodiments of the present invention, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements but may alternatively include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Example 1
This embodiment provides an auxiliary test board, and will be described with reference to fig. 1-4.
An auxiliary test board comprises a control module and an operation module, wherein an MCU in the control module is respectively connected with an alternating current power supply, an oscilloscope, a relay and the operation module, and the MCU controls the output of the alternating current power supply to the direct current power supply, receives an instruction signal sent by the operation module and sends a control signal to the oscilloscope and the relay; the operation module is used for responding to the operation of a user, triggering a control event of the oscilloscope and outputting the control event to the MCU of the control module; and the MCU block receives the delay instruction and delays the power-on/power-off of the power supply required by the test environment.
As can be known by combining the attached drawings 1 and 2, the relay is connected between the jack and the alternating current power supply in series, and meanwhile, the MCU is connected with the relay, so that the MCU controls the on-off of the relay, namely the power-on and power-off of the MCU are controlled.
Specifically, the operation module is provided with an AC ON/OFF key and a DC ON/OFF key, the AC ON/OFF key is used for controlling the ON-OFF of the relay, and further controlling the AC power-ON/OFF of the board card to be tested inserted into the jack, namely, the AC ON/OFF key is triggered to send a power-ON/OFF password to the MCU block, and the MCU receives the instruction and then controls the ON-OFF of the relay; the DC ON/OFF key is used for controlling the DC power-ON/power-OFF of the tested board card, namely, the DC ON/OFF key is triggered to send a power-ON/power-OFF password to the MCU block, and the MCU receives the instruction and then controls the ON-OFF of the relay.
On the auxiliary test board of the embodiment, the MCU block can also control the delayed on-off of the direct current power supply between the jack and the board card to be tested through the relay; the MCU block can also control the delayed on-off of an alternating current power supply between the jack and the tested board card through the relay. Aiming at the time delay design of the scheme, the operation module is provided with a knob-shaped potentiometer, the knob-shaped potentiometer is connected with the MCU block, the knob-shaped potentiometer is rotated to send a time delay instruction to the MCU block, and the MCU receives the time delay instruction and then controls the delay of DC power on/off and the delay of AC power on/off.
In addition, the operation module also comprises a Last key, a next key and a Mark key, wherein the Last key and the next key are used for controlling the oscilloscope to adjust the actions of signal name, oscillogram name, waveform setting and the like forwards or backwards according to the set sequence; the Mark keys are used for marking abnormal waveforms in the test process, and the oscilloscope is controlled to store marked pictures in another Mark folder.
Specifically, a Last key is triggered, the Last key sends a sequence forward instruction to the MCU, and the MCU sends a control instruction to the oscilloscope after receiving the instruction, so as to control the oscilloscope to perform the actions of sequentially adjusting a signal name, a oscillogram name, waveform setting and the like forward; triggering a next key, sending a backward command to the MCU by the next key, sending a control command to the oscilloscope by the MCU after receiving the command, and controlling the oscilloscope to perform actions such as sequentially adjusting a signal name, a waveform chart name, waveform setting and the like backwards; triggering the Mark key, sending a marking instruction to the MCU by the Mark key, sending a control instruction to the oscilloscope after receiving the instruction by the MCU, marking the abnormal waveform in the test process, and controlling the oscilloscope to store the marked image under another Mark folder.
It should be noted that, in the auxiliary test board provided in this embodiment, the MCU block is provided with an ADC conversion module for switching between the ac power supply and the dc power supply, so as to provide voltage environments required by different hardware tests.
It should be further noted that the MCU block converts the SPI signal into the RMII signal through the chip W5200, and outputs the RJ45 protocol conforming to the network connection, that is, the MCU may be connected to the switch through the network crystal connector, thereby implementing the network interconnection.
In summary, the auxiliary test board comprises a power module, a control module and an operation module; the power supply module converts 220V alternating current into 5V/3V3/1V8 level to assist chips such as an MCU (microprogrammed control Unit) in the test board to work, the 220V alternating current supplies power to the jacks, the middle part of the power supply module plays a role in controlling the switch through the relay, and specifically, a control signal of the relay comes from a GPIO (general purpose input/output) of the MCU; secondly, the control module uses MCU as the core, because the auxiliary test board needs less GPIO, so this chip selects STM32F051C8T6TR, and it only has 32 GPIO, and the chip is little, and the low price can satisfy the demand. In order to enable the MCU to be networked, a hardware TCP/IP protocol stack chip W5200 is needed, an SPI signal simulated by the GPIO of the MCU is converted and connected with RJ45 after passing through the W5200 to realize communication with other equipment, and specifically, the SPI communication only needs 4 pins SCLK, nSCS, MOSI and MISO; in addition, the operation module comprises 5 keys and a knob-type potentiometer, and the functions of the keys are explained as follows: through network, Last and next keys are used for controlling the oscilloscope to adjust the signal name, the oscillogram name, the waveform setting and other actions forwards or backwards according to the set sequence; the Mark key is used for marking abnormal waveforms in the test process, and the oscilloscope is controlled to store marked pictures in another Mark folder so as to facilitate subsequent tracing; the DC ON/OFF key is used for controlling the DC power-ON/power-OFF of the board card; and the AC ON/OFF key is used for making the relay ON/OFF so as to control the AC power-ON/power-OFF of the tested board card inserted in the jack. Knob type potentiometer function: for a test scene that two hands need to hold the oscilloscope probes respectively, a potentiometer is added for carrying out power-ON or power-OFF operation, AC ON/OFF or DC ON/OFF can be controlled by the potentiometer to be pressed down and then power-ON/power-OFF is delayed, and enough time is reserved for the two hands to fix the oscilloscope probes. The button selects WH148-1, and has small volume and low price. And after the MCU is connected to the MCU for ADC conversion, the power-ON/power-OFF time is delayed after the AC ON/OFF or the DC ON/OFF is pressed.
The auxiliary test board provided by the embodiment can simultaneously carry out key control on the oscilloscope, switch the alternating current power supply or the direct current power supply required by the test process and delay the power-on/power-off of the power supply required by the test environment under the control of the MCU, can finish the whole process of hardware test under the operation of the same person, comprises the control and marking of the imaging waveform of the oscilloscope, greatly simplifies the test process, solves the problem of more complex hardware test in nature, reduces unnecessary waste of manpower, and improves the test efficiency. After the auxiliary test board is interconnected with the tested board, the oscilloscope and the user computer through a network, the complexity of hardware test can be greatly reduced, and the use of manpower is reduced. The auxiliary test board of the embodiment can be applied to hardware testing to control delayed remote power-on and power-off of a tested board, and a specific operation method is shown in fig. 3. In addition, the auxiliary test board of this embodiment matches corresponding oscilloscope control script, can control a plurality of actions such as oscilloscope deposit picture, signal name change, greatly reduced hardware test complexity reduces the work of at least two manpower and only needs can accomplish alone, reaches the time delay and starts power-on, remote communication function.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Example 2
The hardware testing system provided by the embodiment of the invention, as shown in fig. 4, includes an exchanger, an oscilloscope, a user terminal, a tested board and an auxiliary testing board of the embodiment 1, wherein the oscilloscope, the user terminal, the tested board and the auxiliary testing board are respectively in network connection with the exchanger, and a computer program capable of running on an MCU is stored in the MCU in the auxiliary testing board.
The auxiliary test board, the tested board, the oscilloscope and the user side are interconnected through the switch in a network manner, and the network interconnection is realized through buses respectively, wherein the buses can be ISA buses, PCI buses or EISA buses and the like. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one double-headed arrow is shown in FIG. 4, but that does not indicate only one bus or one type of bus.
Specifically, the hardware test system can be applied to hardware test work in the server industry, and is also applicable to industries such as PC, industrial personal computer and storage.
In summary, the hardware testing system according to the embodiment of the present invention is summarized as follows:
the auxiliary test board, the tested board, the oscilloscope and the computer of the user are connected to the same switch through network cables, so that the four devices can communicate with each other, the waveform grabbing action of the oscilloscope can be controlled through the control module of the auxiliary test board, or the communication with the BMC of the tested board is realized through the control module of the auxiliary test board, so as to control the DC power-on/power-off action of the tested board, and the user can also directly read waveform parameters stored in the oscilloscope and adjust the test method in real time; in addition, the auxiliary test board can also provide a 220V power supply jack for the tested board so as to realize the action of power-on/power-off of the AC of the tested board; in addition, for the test board to be tested of non-mainboard type, generally no DC power is needed, so that the DC power-on/power-off function is not needed.
The apparatus provided by the embodiment of the present invention may be specific hardware on the device, or software or firmware installed on the device, etc. The device provided by the embodiment of the present invention has the same implementation principle and technical effect as the method embodiments, and for the sake of brief description, reference may be made to the corresponding contents in the method embodiments without reference to the device embodiments. It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the foregoing systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the embodiments provided in the present invention, it should be understood that the disclosed apparatus may be implemented in other manners. The apparatus embodiments described above are merely illustrative and, for example, the flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
For another example, the division of the unit is only one division of logical functions, and there may be other divisions in actual implementation, and for another example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some communication interfaces, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments provided by the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus once an item is defined in one figure, it need not be further defined and explained in subsequent figures, and moreover, the terms "first", "second", "third", etc. are used merely to distinguish one description from another and are not to be construed as indicating or implying relative importance.
Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present invention, which are used for illustrating the technical solutions of the present invention and not for limiting the same, and the protection scope of the present invention is not limited thereto, although the present invention is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope of the present disclosure; and the modifications, changes or substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention. Are intended to be covered by the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. An auxiliary test board is characterized by comprising a control module and an operation module, wherein an MCU in the control module is respectively connected with an alternating current power supply, an oscilloscope, a relay and the operation module, and the MCU controls the output of the alternating current power supply to the direct current power supply, receives an instruction signal sent by the operation module and sends a control signal to the oscilloscope and the relay; the operation module is used for responding to the operation of a user, triggering a control event of the oscilloscope and outputting the control event to the MCU of the control module; and the MCU block receives the delay instruction and delays the power-on/power-off of the power supply required by the test environment.
2. The auxiliary test board as claimed in claim 1, wherein said auxiliary test board further comprises a power module, said power module is connected to the board under test through a jack, and said MCU controls the on/off of the circuit between said jack and the board under test.
3. The auxiliary test board as claimed in claim 2, wherein said MCU block is connected to an AC power source, said relay is connected in series between said jack and said AC power source, and the on/off of said relay is controlled by said MCU block.
4. The auxiliary test board as claimed in claim 3, wherein said MCU block controls the delayed on/off of the DC power between said jack and the board card under test through said relay; and the MCU block controls the delayed on-off of the alternating current power supply between the jack and the tested board card through the relay.
5. The auxiliary test board as claimed in claim 1, wherein said operation module comprises an AC ON/OFF button and a DC ON/OFF button, said AC ON/OFF button is used to control the ON/OFF of a relay, thereby controlling the AC power ON/OFF of the board card to be tested inserted into said insertion hole; and the DC ON/OFF key is used for controlling the DC power-ON/power-OFF of the tested board card.
6. The auxiliary test board as claimed in claim 5, wherein said operation module further comprises a Last button, a next button and a Mark button, said Last button and said next button are used to control the oscilloscope to adjust the signal name, waveform chart name, waveform setting and the like forward or backward according to the set sequence; the Mark keys are used for marking abnormal waveforms in the test process, and the oscilloscope is controlled to store marked pictures in another Mark folder.
7. The auxiliary test board as claimed in claim 5 or 6, wherein said operation module further comprises a knob-shaped potentiometer connected to said MCU block for controlling delay of said MCU block for DC power-on/off and AC power-on/off.
8. The auxiliary test board as claimed in claim 5, wherein an ADC conversion module is disposed in the MCU module for switching between an AC power supply and a DC power supply.
9. The auxiliary test board of claim 1 wherein said MCU block converts SPI signals to RMII signals through a chip W5200, the output conforming to the network connected RJ45 protocol.
10. A hardware test system, comprising a switch, an oscilloscope, a user end, a tested board and the auxiliary test board of any one of claims 1 to 9, wherein the oscilloscope, the user end, the tested board and the auxiliary test board are respectively connected with the switch through a network, and a computer program capable of running on the MCU is stored in the MCU in the auxiliary test board.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116453582A (en) * | 2023-06-14 | 2023-07-18 | 合肥康芯威存储技术有限公司 | Signal testing system and method for memory |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105372619A (en) * | 2014-08-06 | 2016-03-02 | 国家电网公司 | Safe chip power-down testing equipment |
| CN206209081U (en) * | 2016-09-27 | 2017-05-31 | 北京动力源科技股份有限公司 | A kind of Auto-Test System of power module |
| CN109684146A (en) * | 2018-12-28 | 2019-04-26 | 北京旷视科技有限公司 | Upper and lower electric test method, device, system and processing equipment |
-
2020
- 2020-08-28 CN CN202010889095.2A patent/CN112199242A/en not_active Withdrawn
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105372619A (en) * | 2014-08-06 | 2016-03-02 | 国家电网公司 | Safe chip power-down testing equipment |
| CN206209081U (en) * | 2016-09-27 | 2017-05-31 | 北京动力源科技股份有限公司 | A kind of Auto-Test System of power module |
| CN109684146A (en) * | 2018-12-28 | 2019-04-26 | 北京旷视科技有限公司 | Upper and lower electric test method, device, system and processing equipment |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116453582A (en) * | 2023-06-14 | 2023-07-18 | 合肥康芯威存储技术有限公司 | Signal testing system and method for memory |
| CN116453582B (en) * | 2023-06-14 | 2023-09-22 | 合肥康芯威存储技术有限公司 | Signal testing system and method for memory |
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