CN111812061A - Refractive index measuring method and system - Google Patents

Refractive index measuring method and system Download PDF

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CN111812061A
CN111812061A CN202010603294.2A CN202010603294A CN111812061A CN 111812061 A CN111812061 A CN 111812061A CN 202010603294 A CN202010603294 A CN 202010603294A CN 111812061 A CN111812061 A CN 111812061A
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light
refractive index
selection
prism
phase
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张怡龙
张宇超
王海霞
陈朋
梁荣华
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Zhejiang University of Technology ZJUT
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    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length

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Abstract

A method of refractive index measurement comprising the steps of: 1) collecting images of the total reflection beam at different phase angles; 2) collecting light beam signals in different polarization states; 3) and (4) calculating light intensity information and calculating data of the coordinates of the centroid of the light spot. A refractive index measurement system, the highly stable laser light source SLD being a light source generator; the 840nm single-mode optical fiber is used for transmitting optical signals; the achromatic collimating lens collimates the incident beam; the right-angle prism and the solution flow channel are used for placing a sample to be detected; the front selection/rear selection polarizer realizes the selection of the polarization state of light; the half wave plate set adjusts the phase of the light; the CCD module is responsible for collecting light spot information; the computer is used for realizing the light intensity and mass center coordinate analysis of the light intensity signal and comparing different solutions to obtain the change of the refractive index. The invention utilizes simple light path structure and ordinary optical prism without coating film to carry out measurement, and proves the feasibility by measuring the refractive index of NaCl solution.

Description

Refractive index measuring method and system
Technical Field
The invention belongs to the field of optical measurement, and particularly relates to a method and a system for measuring a solution refractive index.
Background
The method has important significance for measuring the refractive index of a certain substance in various fields. In the production and research sector, it is often necessary to determine the refractive index of an object, since the measurement of the refractive index is easier to implement than the measurement of other parameters of a liquid. For example, the method has wide application in the fields of environmental protection and monitoring, aerospace, basic research, chemical analysis, biomedicine, food industry and the like. The Refractive Index (RI) is a physical quantity that characterizes the optical properties of a medium, reflecting material internal information.
Therefore, refractive index measurement is one of the most important problems in geometric optics. Other physical and chemical parameters of matter can be obtained indirectly by means of the refractive index. Unknown liquids, organic compounds can be identified, the purity of liquids, gases, organic compounds can be measured, the composition of mixtures can be determined, and the like. The physical quantity is a very precise physical constant, and the value of the refractive index changes significantly even if a small amount of impurities is present in the sample. It has become a hotspot to study more miniaturized and more robust optical sensors that can accurately and reliably measure the refractive index of liquids. Many refractive index sensors have good performance, high measurement accuracy and refractive index measurement range, but certain limitations are necessarily existed.
In 2004, weak measurements were first proposed by Aharonov et al. In 2008, the optical Spin Hall Effect (SHEL) which leads to spin splitting of the refracted beam in the prism was first observed by Hosten and kwat, and the experiment amplifies the weak measurement signal by appropriate pre-and post-selection. Today, weak measurements are widely used to estimate small parameters such as super-surface, beam deflection, phase shift and nano-film thickness. The research shows that the refractive index measuring method based on weak measurement has sensitive smell to factors such as temperature, humidity, pressure, wavelength and the like, and has measurement accuracy far higher than that of a common measuring method. The method has important application points in the field of precision measurement, and can be more conveniently applied to different fields.
Disclosure of Invention
In order to overcome the defects of high measurement cost, low measurement resolution, poor environmental adaptability and complex optical path structure of the traditional refractive index measurement method, the invention provides a refractive index measurement method and a system based on total internal reflection and weak measurement.
In order to achieve the purpose, the invention adopts the technical scheme that:
a method of refractive index measurement comprising the steps of:
1) acquiring images of different phase angles by the full reflected light beam in a weak measurement model;
2) collecting signals of light beams in different polarization states, wherein the process is as follows:
linearly polarized light is obtained through selection and filtering of a first polarizer P1, the prism rotating table is adjusted to adjust the incidence angle, so that the linearly polarized light is incident to the right-angle prism R1 at an angle larger than the critical angle, the linearly polarized light is totally reflected through the solution in the flow channel, and the light intensity and the phase of the reflected light beam are changed;
in the prismatic structure, the refractive index is n1The prism material and the refractive index are n2Because of the additional light beam phase passing through the prism, a pair of half wave plates with fast axes almost parallel are arranged at the emergent end of the prism and used for adjusting the phase;
finally, selecting the light after passing through another second polaroid P2 almost perpendicular to the first polaroid, and collecting image signals by the area array CCD;
3) and (4) calculating light intensity information and calculating data of the coordinates of the centroid of the light spot.
In the step 1), the phase angle is determined by monitoring a LabVIEW program, and light spot information of a LabVIEW front panel and a background program is calculated. The embodiment is to control the adjusting frames GCM-0912M and GCM-1101M to adjust the wave plate H2 to obtain the measured optimal working interval.
In the step 2), the value of the polarization state of the light beam is an absolute angle realized by GCC-402112 light splitting, and the values are respectively 0 degree, 15 degrees, 30 degrees, 45 degrees, 60 degrees, 75 degrees and 90 degrees; then acquiring light beam sampling data in the mode of adjusting the phase; tests were performed using 0%, 1%, 2%, 3%, 4% and 5% sodium chloride solutions, the SHEL phenomenon was compared and the measurement resolution thereof was calculated.
In the step 3), the light intensity calculation needs to traverse the image pixel points, calculate the average value of the gray values, compare the relative intensities, and calculate the measurement resolution of the system by using a series of NaCl solutions.
In the step 3), the change of the light spot centroid is based on the SHEL and is expressed as the spin splitting of the light spot, the obtained image data is subjected to pixel traversal, the gray scale of each pixel point is used as the index weight of the pixel point, coordinates of X and Y are obtained comprehensively to represent the coordinates of the light spot centroid, and the value represents the degree of the SHEL phenomenon and is used as a basis for judging the solution refractive index.
A refractive index measuring system comprises a highly stable laser source SLD, a 840nm single-mode optical fiber, an achromatic collimating lens, a right-angle prism, a solution flow channel, a front-selection/rear-selection polarizer, a quarter wave plate group, a CCD module and a computer, wherein the highly stable laser source SLD is a light source generator; the 840nm single-mode optical fiber is used for transmitting optical signals; the achromatic collimating lens collimates the incident beam; the right-angle prism and the solution flow channel are used for placing a sample to be detected; the front selection/rear selection polarizer realizes the selection of the polarization state of light; the quarter-wave plate set adjusts the phase of the light; the CCD module is responsible for collecting light spot information; the computer is used for realizing the light intensity and mass center coordinate analysis of the light intensity signal and comparing different solutions to obtain the change of the refractive index.
Further, the highly stable laser light source SLD is a light source generator, which provides a light source signal, the light source is a VSLS-840-B high-power broadband light source of VENUS corporation, the bandwidth is 50nm, the light wavelength is 840nm, the light power can be adjusted, the light is output through a single-mode fiber SMF, and what constitutes a collimating structure with the single-mode fiber SMF is an F220PC-850 collimating head of Thorlabs, and the parameters are: f is 11.22mm, and NA is 0.25.
Still further, the right-angle prism and the solution flow channel are carriers of the solution sample, wherein the right-angle prism is a high-density medium, the refractive index n is 1.75, the size of the reflection interface is 30x20mm, the size of the flow channel is 28x20x5mm, and the solution flow channel and the interface are seamlessly combined by using ultraviolet glue; the solution in the flow channel is injected by using a rubber tube and a needle cylinder and is directly contacted with the surface of the prism; incident light is incident at the interface at an angle greater than the critical angle and is reflected by the solution.
The front/rear selection polaroid is used for carrying out proper polarization selection on the light beam and controlling the polarization direction and the light intensity; LPVIS050-MP2 fixed linear polarizer model Thorlabs and lens diameter
Figure BDA0002559909570000041
The wavelength of the action is lambda 550-1500nm, the front selection/rear selection polaroids are respectively used as a polarizer and a rear selection polarizer, the front selection polaroid is placed at the incident position of the prism, the rear selection polaroid is placed at the receiving end of the CCD, and the polarization axes of the front selection polaroid and the rear selection polaroid are almost in an orthogonal state.
The quarter wave plate set is used for adjusting the phase of the light beam, and the wave plate adopts 10RP04-30 of Newport, wherein the diameter of the wave plate
Figure BDA0002559909570000051
λ is 850nm, the fast axes of the two wave plates are parallel, the wave plates H1 and H2 are used for adjusting the phase of the light beam, eliminating the light beam to obtain an additional phase at the position of the prism, the adjusting frame used by H2 is GCM-1101M with large constant photoelectricity, the adjustable precision is 0.01 °, and the fast axis direction and the roll angle of the wave plate H2 are adjusted to control the phase of the light beam so as to meet the weak measurement condition.
The CCD is used for collecting signals of reflected light beams and recording image information of light spots. The model is ASI174MM-COOL of Shawang photoelectricity, the collection resolution is 1936x1216, the influence of temperature on refractive index measurement is avoided by a self-contained radiator, reflected light passing through a post-selection polaroid is finally collected by a CCD, and data obtained by the CCD is a bitmap of 8 bits.
The invention has the beneficial effects that: analysis and measurement of the solution refractive index is accomplished using total internal reflection and weak measurement optics and image processing. The common-path light path structure simplifies the system, reduces the environmental noise and ensures a good signal-to-noise ratio. And the cost and the manufacturing cost of the system are reduced by using the ordinary optical prism without coating.
Drawings
FIG. 1 is a diagram of an optical bench system.
Fig. 2 is a flowchart of an image processing procedure.
Detailed description of the preferred embodiments
The invention is further described below with reference to the accompanying drawings.
Referring to fig. 1 and 2, a refractive index measurement system includes a highly stable laser source SLD, a 840nm single mode fiber, an achromatic collimating lens, a right angle prism, a solution channel, a front/rear selective polarizer, a quarter wave plate set, a CCD module, and a computer, where the highly stable laser source SLD (10) is a light source generator VSLS-840-B of VENUS, and emits a light source; a 840nm single-mode fiber (20) receives a light source signal and transmits the light source signal into a collimating lens (30); f220PC-850 collimation head (30) of Thorlabs collimates the light beam; the right-angle prism and the solution flow channel (50) are used as a carrier of the solution sample; LPVIS050-MP2 fixed linear polarizers (40, 80) of Thorlabs are used to adjust the polarization direction; 10RP04-30 wave plate 1(60) and wave plate 2(70) of Newport adjust optical path and phase; the CCD (90) acquisition part is an ASI174MM-COOL of Shawang photoelectricity and is used for acquiring images; the computer (100) processes the image to obtain light intensity and centroid coordinate results. And all the devices are built on an optical control platform.
Referring to fig. 1, the test method is described, firstly, a 840nm wide spectrum laser source SLD (10) emits a light beam with power of 4.2mW, the connecting end outputs non-collimated light by SMF-28 single mode light (20), and the light beam is collimated by a collimating lens L1 (30). The laser light source (10) and the collimation head (30) have the collimation effect on the light source, and the light beam quality is improved.
Linearly polarized light is obtained by selecting and filtering through a first polarizer P1(40) (the extinction ratio is more than 100000:1), and the prism rotating table is adjusted to adjust the incidence angle so that the linearly polarized light enters a right-angle prism R1(50) at an angle more than the critical angle. The linearly polarized light is subjected to total reflection through the solution in the flow channel (50), and the light intensity and the phase of the reflected light beam are changed in the step.
In the prism structure (50), the refractive index is n1The prism material and the refractive index are n2Is contacted directly with the test solution. The prism (50) has an exit end positioned to receive the additional beam phase passing through the prismA pair of quarter-wave plates H1(60), H2(70) whose fast axes are almost parallel are provided for adjusting the phase. Eliminating the additional phase obtained by the beam when it passes through the prism (50), the phase correction of the wave plate 2(70) is also a key condition for achieving weak measurements.
Finally, the light is selected after passing through another second polaroid P2(80) almost perpendicular to the first polaroid (40), the emergent light is collected by an area array CCD (90) to form an image signal, and an experimental result obtained by processing of a PC (100) comprises a light intensity signal and a light spot centroid coordinate.
Further, a description will be given of a refractive index measurement method of an embodiment in which position and angle adjustment and optimization are performed for each optical element on an optical bench. Mainly comprises light path collimation, light phase modulation and polarization state optimization.
The phase modulation of the light in this embodiment is dependent on waveplate sets H1(60) and H2 (70). Adjusting the fast-slow axis direction and the roll angle of H2(70) through a rotating stage GCM-1101M and a wave plate frame GCM-0912M; the light beam passes through the thickness adjustment optical path of the wave plates (60, 70), and the phase angle of the light beam is influenced in the direction of the fast and slow axes; the LabVIEW control interface comprises an image display window and a two-dimensional coordinate graph of the centroid of the light spot, and is used for determining the interval of the optimal working phase of the system; after the interval is determined, the rotating table GCM-1101M completes fine sampling operation on the phase every other rotation angle of 0.02 degrees, the phase angle with the most intense facula splitting is determined, the size of the slope of the centroid coordinate curve of the facula is taken as a standard, and the phase angle corresponding to the position with the maximum slope is taken as a sensitive working point of refractive index measurement.
The embodiments are directed to polarizers P1(40) and P2(80) for polarization state optimization. The system adopts a large constant photoelectric GCC-402112 polarization splitting prism to obtain the absolute polarization direction of the linear polarization of a P1 polaroid, takes values of different polarization directions (0 degrees, 15 degrees, 30 degrees, 45 degrees, 60 degrees, 75 degrees and 90 degrees), samples and tests in the implementation mode of phase modulation to obtain a proper working point, obtains a better weak measurement effect according to experimental data, performs tests by using 0%, 1%, 2%, 3%, 4% and 5% sodium chloride solutions, compares the SHEL phenomenon and calculates the measurement resolution. The result shows that when the polarization state of the system is in the 45 degree action interval, the better SHEL phenomenon is obtained.
The embodiment measures the intensity of optical signals of light reflected by solutions with different refractive indexes, drives a CCD to collect images, shoots 800 pieces of image data by each medium, traverses pixel points of the images to obtain gray values and mean values, compares relative intensities, and calculates the measurement resolution of a system by using a series of NaCl solutions.
The change in the centroid of the light spot in an embodiment is based on the SHEL, which manifests as spin-splitting of the light spot. Fig. 2 is a flow chart of a data processing procedure, in which a computer (100) performs pixel traversal on acquired image data, the gray scale of each pixel serves as an index weight of the pixel, coordinates of X and Y representing a centroid coordinate of a light spot are obtained by synthesis, and the average of a plurality of images serves as a final coordinate. The value represents the degree of the SHEL phenomenon, and is used as a basis for judging the refractive index of the solution, so that the change slope of the formed spot centroid curve is in a positive relation with the absolute value of the slope.
The solution refractive index weak measurement method designed by the invention completes analysis and measurement of the solution refractive index by utilizing total internal reflection and weak measurement optical technology and image processing. The common-path light path structure simplifies the system, reduces the environmental noise and ensures a good signal-to-noise ratio. And the cost and the manufacturing cost of the system are reduced by using the ordinary optical prism without a film, and the applicability of the system is verified by using a series of sodium chloride solutions.
The working flow of the embodiment is as follows:
(1) the laser light source (10) starts a power supply and sets light intensity;
(2) the light beams pass through a series of optical components and are sequentially processed by single-mode optical fiber (20) collimating lens (30), front-selection polarization plate (40), right-angle prism (50), wave plate H1(60), wave plate H2(70) and rear-selection polarizer (80) for debugging and the like;
(3) setting CCD (90) parameters, driving the CCD (90) to collect images, and receiving the images by a computer (100);
(4) and (3) obtaining the measurement results of the solutions with different concentrations by utilizing the light intensity result and the light spot centroid coordinate result of matlab calculation data, and realizing the measurement of different refractive indexes.
The above embodiments are preferred embodiments of the present invention, but the present invention is not limited to the above embodiments, and any other modifications, substitutions, combinations, and alterations without departing from the spirit and principle of the present invention should be considered as equivalent substitutions within the scope of the present invention.

Claims (10)

1. A method of refractive index measurement, the method comprising the steps of:
1) collecting images of the total reflection beam at different phase angles;
2) collecting signals of light beams in different polarization states, wherein the process is as follows:
linearly polarized light is obtained through selection and filtering of a first polarizer P1, the prism rotating table is adjusted to adjust the incidence angle, so that the linearly polarized light is incident to the right-angle prism R1 at an angle larger than the critical angle, the linearly polarized light is totally reflected through the solution in the flow channel, and the light intensity and the phase of the reflected light beam are changed;
in the prismatic structure, the refractive index is n1The prism material and the refractive index are n2Because of the additional light beam phase passing through the prism, a pair of half wave plates with fast axes almost parallel are arranged at the emergent end of the prism and used for adjusting the phase;
finally, selecting the light after passing through another second polaroid P2 almost perpendicular to the first polaroid, and collecting image signals by the area array CCD;
3) and (4) calculating light intensity information and calculating data of the coordinates of the centroid of the light spot.
2. The method as claimed in claim 1, wherein in step 1), the phase angle is determined by monitoring LabVIEW program, and calculating LabVIEW front panel and background program spot information. The embodiment is to control the adjusting frames GCM-0912M and GCM-1101M to adjust the wave plate H2 to obtain the measured optimal working interval.
3. A method as claimed in claim 1 or 2, wherein in step 2), the polarization state of the light beam is an absolute angle of the GCC-402112 realized by light splitting, and the values are 0 °, 15 °, 30 °, 45 °, 60 °, 75 °, and 90 °, respectively; then acquiring light beam sampling data in the mode of adjusting the phase; tests were performed using 0%, 1%, 2%, 3%, 4% and 5% sodium chloride solutions, the SHEL phenomenon was compared and the measurement resolution thereof was calculated.
4. A method as claimed in claim 1 or 2, wherein in step 3), the intensity calculation requires traversing image pixels, averaging gray values, and comparing relative intensities, while calculating the measurement resolution of the system using a series of NaCl solutions.
5. The refractive index measurement method according to claim 1 or 2, wherein in step 3), the change of the spot centroid is based on the SHEL and is expressed as spin splitting of the spot, the gray scale of each pixel is taken as the index weight of the pixel by performing pixel traversal on the acquired image data, and the coordinates of X and Y representing the spot centroid coordinate are obtained by integration, and the value represents the degree of the SHEL phenomenon and is used as the basis for judging the refractive index size of the solution.
6. A refractive index measurement system is characterized by comprising a highly stable laser source SLD, a 840nm single-mode fiber, an achromatic collimating lens, a right-angle prism, a solution flow channel, a front-selection/rear-selection polarizer, a half wave plate group, a CCD module and a computer, wherein the highly stable laser source SLD is a light source generator; the 840nm single-mode optical fiber is used for transmitting optical signals; the achromatic collimating lens collimates the incident beam; the right-angle prism and the solution flow channel are used for placing a sample to be detected; the front selection/rear selection polarizer realizes the selection of the polarization state of light; the half wave plate set adjusts the phase of the light; the CCD module is responsible for collecting light spot information; the computer is used for realizing the light intensity and mass center coordinate analysis of the light intensity signal and comparing different solutions to obtain the change of the refractive index.
7. The refractive index measurement system of claim 6, wherein the highly stable laser light source SLD is a light source generator providing a light source signal, the light source is VSLS-840-B high power broadband light source of VENUS corporation, 50nm bandwidth, 840nm wavelength, adjustable light power, output through single mode fiber SMF, and forms a collimating structure with it is F220PC-850 collimating head of Thorlabs, parameters are: f is 11.22mm, and NA is 0.25.
8. The refractive index measurement system of claim 6 or 7, wherein the right-angle prism and the solution channel are carriers of the solution sample, wherein the right-angle prism is a high-density medium, the refractive index n is 1.75, the size of the reflecting interface is 30x20mm, the size of the channel is 28x20x5mm, and the solution channel and the interface are seamlessly bonded by using ultraviolet glue; the solution in the flow channel is injected by using a rubber tube and a needle cylinder and is directly contacted with the surface of the prism; incident light is incident at the interface at an angle greater than the critical angle and is reflected by the solution.
9. A refractive index measurement system as claimed in claim 6 or 7 wherein the pre/post selective polariser is arranged to provide appropriate polarisation selection of the beam, control the direction of polarisation and intensity of light; LPVIS050-MP2 fixed linear polarizer model Thorlabs and lens diameter
Figure FDA0002559909560000031
The wavelength of the action is lambda 550-1500nm, the front selection/rear selection polaroids are respectively used as a polarizer and a rear selection polarizer, the front selection polaroid is placed at the incident position of the prism, the rear selection polaroid is placed at the receiving end of the CCD, and the polarization axes of the front selection polaroid and the rear selection polaroid are almost in an orthogonal state.
10. A refractive index measurement system as claimed in claim 6 or 7 wherein the half waveplate set is used to adjust the phase of the light beam and the waveplate is of Newport 10RP04-30 wherein
Figure FDA0002559909560000032
λ is 850nm, the fast axes of the two half-wave plates are parallel, the half-wave plates H1 and H2 are used for adjusting the phase of the light beam, eliminating the light beam to obtain an additional phase at the position of the prism, an adjusting frame used by H2 is GCM-1101M with large constant photoelectricity, the adjustable precision is 0.01 °, and the fast axis direction and the transverse rocking angle of H2 are adjusted to control the phase of the light beam so as to meet the weak measurement condition;
the CCD is used for collecting signals of reflected light beams and recording image information of light spots. The model is ASI174MM-COOL of Shawang photoelectricity, the collection resolution is 1936x1216, the influence of temperature on refractive index measurement is avoided by a self-contained radiator, reflected light passing through a post-selection polaroid is finally collected by a CCD, and data obtained by the CCD is a bitmap of 8 bits.
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