CN111665457A - GIS bus contact defect experiment simulation device and method - Google Patents

GIS bus contact defect experiment simulation device and method Download PDF

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Publication number
CN111665457A
CN111665457A CN202010480391.7A CN202010480391A CN111665457A CN 111665457 A CN111665457 A CN 111665457A CN 202010480391 A CN202010480391 A CN 202010480391A CN 111665457 A CN111665457 A CN 111665457A
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China
Prior art keywords
contact
gis
plum blossom
temperature
simulation device
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CN202010480391.7A
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Chinese (zh)
Inventor
高凯
曹培
李莉华
徐鹏
吴天逸
金立军
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State Grid Shanghai Electric Power Co Ltd
East China Power Test and Research Institute Co Ltd
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State Grid Shanghai Electric Power Co Ltd
East China Power Test and Research Institute Co Ltd
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Application filed by State Grid Shanghai Electric Power Co Ltd, East China Power Test and Research Institute Co Ltd filed Critical State Grid Shanghai Electric Power Co Ltd
Priority to CN202010480391.7A priority Critical patent/CN111665457A/en
Publication of CN111665457A publication Critical patent/CN111665457A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/56Testing of electric apparatus
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00Measuring or testing not otherwise provided for
    • G01D21/02Measuring two or more variables by means not covered by a single other subclass

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention relates to a GIS bus contact defect experiment simulation device and a method, the device comprises a GIS simulator, a temperature measuring element, a data acquisition instrument, a temperature and humidity instrument, an ammeter, a voltage regulator and an alternating current power supply, wherein the voltage regulator, the ammeter and the GIS simulator are connected in series to form a loop, the voltage regulator is connected with the alternating current power supply, the temperature measuring element is arranged on a movable contact arm, an adjustable plum blossom contact and a shell and is connected with the data acquisition instrument, the adjustable plum blossom contact is a plum blossom contact with variable quantity of fastening springs, a resistor disc or an insulating sheet can be inserted between a plurality of contact fingers of the adjustable plum blossom contact and the movable contact arm, an infrared thermal imager measures the temperature distribution of the shell of the GIS simulator, and the temperature and humidity instrument measures the temperature and humidity of the. Compared with the prior art, the invention has the advantages of convenient adjustment, simple structure, wide application range and the like.

Description

GIS bus contact defect experiment simulation device and method
Technical Field
The invention relates to the technical field of high-voltage electrical equipment tests, in particular to a GIS bus contact defect experiment simulation device and method.
Background
Gas insulated metal enclosed Switchgear (GIS) is an important device of a power system, adopts Gas insulation, and has the characteristics of small volume, easy maintenance and the like. The bus is one of key parts of the GIS and is high-voltage and high-current power transmission equipment. The GIS bus consists of a conductive rod, a shell, an insulating support piece and insulating gas, wherein contact seats are inserted into two ends of the conductive rod and fixed on an insulating basin through bolts. Because of the joule heat loss of the conductor and the induced eddy current loss in the shell, the GIS bus in operation is in a heating state, the contact temperature of the bus is the same as or similar to the conductor temperature of the conducting rod under normal conditions, and with the increasing operation age of GIS equipment, poor contact phenomena caused by contact defects, such as bolt looseness, contact spring looseness, insufficient insertion depth of the conducting rod, rough surface of the conductor and the like, can occur, the contact resistance between the contact and the conducting rod can be increased, the contact temperature of the bus can be rapidly increased due to the contraction effect of current, the temperature rise of the contact can cause material creep deformation and connection looseness, the contact resistance can be further increased, the contact temperature can be continuously increased, thereby forming vicious circle, the temperature rise not only limits the maximum current carrying capacity of the bus, but also can influence the performance of the insulating material and decompose the insulating gas, solid insulation is deteriorated, the service life of the bus is shortened, and even contact fusion welding can occur, so that serious short-circuit fault is caused, and equipment is shut down and even explosion is caused. In order to prevent and discover the contact defect of the conductive loop as soon as possible, the existing solution mainly measures the loop resistance inside the GIS equipment and compares the loop resistance with an allowable value to judge the contact problem between conductors inside the GIS, but the loop resistance of the GIS equipment needs to be measured to cut off power of the GIS equipment, so that the power supply reliability is reduced.
The prior art also provides some solutions, and chinese patent CN201910526870.5 provides a GIS internal and external temperature rise monitoring test device, which includes a GIS simulator, the GIS simulator includes a cylindrical housing, a conductive rod is axially penetrated through the housing, the conductive rod includes a movable contact and a fixed contact, a shield is sleeved at the connection of the movable contact and the fixed contact, the GIS simulator also includes a large current generator, the large current generator is electrically connected with the conductive rod, a transparent observation window is arranged on the side wall of the housing, a first infrared thermometer is fixed outside the observation window, and the first infrared thermometer is arranged right opposite to the conductive rod; the side walls of the conducting rod, the moving contact and the static contact are all provided with thermosensitive sensors, and the thermosensitive sensors are electrically connected with a demodulator positioned outside the GIS simulator; the GIS simulator is also connected with a pressure container, and a differential pressure gauge is connected between the pressure container and the GIS simulator; the infrared temperature measuring device further comprises a second infrared temperature measuring instrument, and the second infrared temperature measuring instrument is arranged right opposite to the shell. This patent can monitor the real test data of GIS internal temperature, the outside temperature of casing simultaneously to the inside and outside temperature curve relation of GIS is reachd in the fitting.
However, the patent has the following problems:
the simulation device of this patent does not conform to the actual contact structure of a GIS. The contact between the moving contact and the static contact of this patent adopts the threaded form, and the moving contact tip is equipped with the external screw thread, and the static contact tip is equipped with the blind hole of in-band screw thread, changes contact resistance's size through the degree of depth of adjustment moving contact tip screw in static contact blind hole. The actual GIS conductor basically adopts a contact mode of a spring contact finger, and the change of the pressing force of the contact finger on the conductor is the main cause of the change of the contact resistance. Therefore, the patent cannot simulate the increase of contact resistance due to the decrease of contact fastening force and the metal aging, cannot simulate the real operation condition of the GIS, and is difficult to realize the simulation of contact defects such as insufficient contact pressure, partial contact failure of the contact fingers, and the material conductivity deterioration of the contact area. In addition, the patent adopts a large current generator to provide current, so that the model is large in size, convenient and poor in usability.
Disclosure of Invention
The invention aims to overcome the defects in the prior art and provide a GIS bus contact defect experimental simulation device and method, which are simple in structure and wide in application range.
The purpose of the invention can be realized by the following technical scheme:
the utility model provides a GIS generating line contact defect experiment analogue means, includes GIS simulator, temperature measuring element, data acquisition appearance, ampere meter, voltage regulator and alternating current power supply, the GIS simulator include the shell and fix inside and the movable contact arm that connects gradually of shell, adjustable plum blossom contact and stationary contact arm, voltage regulator, ampere meter and GIS simulator establish ties in proper order and constitute the return circuit, the voltage regulator be connected with alternating current power supply, temperature measuring element install on movable contact arm, adjustable plum blossom contact and shell and be connected with data acquisition appearance, adjustable plum blossom contact including touch finger, fixed plate and detachable fastening spring, touch finger fixes on the fixed plate, fastening spring hoop touches the finger outside at the root, adjustable plum blossom contact is the changeable plum blossom contact of quantity of fastening spring, because the electric current through the GIS simulator is by the voltage regulator control of being connected with alternating current power supply, the current is small, in order to increase the heating power of the GIS simulator and approach the fault level when the GIS simulator is in real overheating defect, resistance sheets are connected in series between a plurality of contact fingers and the movable contact arms of the adjustable plum blossom contact, the contact resistance increase caused by metal aging is simulated, insulation sheets are arranged between the other contact fingers and the movable contact arms, the current on a single contact finger is increased, and the resistance sheets can also be connected in series between all the contact fingers and the movable contact arms.
Furthermore, a safety switch for protecting the circuit is connected in series between the voltage regulator and the alternating current power supply.
Furthermore, the number of the fastening springs is 1-4, and the number of the contact fingers is 4-8.
Furthermore, the resistance card adopts an iron-chromium-aluminum resistance wire which can generate heat through flow.
Furthermore, the data acquisition instrument adopts JK808, and the voltage regulator adopts a TDGC-6 voltage regulator.
A simulation method adopting the GIS bus contact defect experiment simulation device specifically comprises the following steps:
the contact fastening force reduction of the contact fingers and the movable contact arms caused by the aging of the tulip contact is simulated by reducing the number of fastening springs, the number of the contact fingers in contact with the movable contact arms is controlled by serially connecting resistance sheets between part of the contact fingers and the movable contact arms, and insulating sheets are arranged between the rest of the contact fingers and the movable contact arms, so that the increase of the contact resistance caused by the aging of metal is simulated, meanwhile, the through flow on a single contact finger is increased, the heating power is increased, and the overheating defect is simulated; the method comprises the steps that an ultrasonic signal detector is adopted to detect sound information of the GIS simulator, a temperature and humidity sensor is adopted to detect environment temperature information around the GIS simulator, a temperature measuring element is used for collecting temperature information of measuring points on a movable contact arm, an adjustable plum blossom contact and a shell, a data collector is used for collecting temperature information of the measuring points, and a thermal infrared imager is adopted to detect shell temperature distribution information of the GIS simulator;
the environment temperature and humidity of the GIS simulator are controlled by changing the ventilation and heat dissipation conditions of the region where the GIS simulator is located, and a more comprehensive simulation result is obtained.
Furthermore, the ultrasonic signal detector adopts PDS-T, and the temperature and humidity sensor adopts Si 7021.
Compared with the prior art, the invention has the following beneficial effects:
(1) the invention connects a voltage regulator with an alternating current power supply, sequentially connects the voltage regulator, a current meter and a GIS simulator in series to form a loop, wherein a shell, a movable contact arm and an adjustable plum blossom contact of the GIS simulator are provided with temperature measuring elements for collecting temperature information of key measuring points, the adjustable plum blossom contact is a plum blossom contact with variable quantity of fastening springs, the reduction of the contact fastening force of a contact finger and the movable contact arm caused by the aging of the plum blossom contact spring is simulated by reducing the quantity of the fastening springs, the increase of contact resistance caused by the contact aging is simulated by connecting resistors in series between part of the contact finger and the movable contact arm, the non-contact of the simulated contact is realized by inserting an insulating sheet between the part of the contact finger and the movable contact arm, the through-flow distribution on each contact finger is changed at the same time, the heating power of a conducting contact is increased, the fault level when the fault is close to the real overheating defect, various overheating defects are simulated, the environment temperature and humidity of the GIS model are controlled by changing the ventilation and heat dissipation conditions of the region where the GIS model is located, a more comprehensive simulation result is obtained, the operation is simple and convenient, and the application range is wide;
(2) the safety switch for protecting the circuit is connected in series between the voltage regulator and the alternating current power supply, so that the safety is good, the alternating current power supply is easy to obtain, the current in the loop is small, the ammeter can be directly connected into the loop, and the safety protection circuit is simple in structure, simple and convenient to operate, low in cost and wide in application range.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic structural diagram of an adjustable tulip contact;
FIG. 3 is a schematic structural diagram of an adjustable tulip contact in a defect experiment;
the reference numbers in the figures illustrate:
1. the device comprises a movable contact arm, 2 a static contact arm, 3 a fastening spring, 4 a contact finger, 5 a resistance card, 6 an insulation sheet, 7 a fixed plate and 8 a temperature measuring element.
Detailed Description
The invention is described in detail below with reference to the figures and specific embodiments. The present embodiment is implemented on the premise of the technical solution of the present invention, and a detailed implementation manner and a specific operation process are given, but the scope of the present invention is not limited to the following embodiments.
Example 1
A GIS bus contact defect experiment simulation device, as shown in figure 1, comprises a GIS simulator, a temperature measuring element 8, a data acquisition instrument, an ammeter, a voltage regulator and an alternating current power supply, wherein the voltage regulator, the ammeter and the GIS simulator are sequentially connected in series to form a loop, the voltage regulator is connected with the alternating current power supply through a safety switch, the data acquisition instrument adopts JK808, the voltage regulator adopts a TDGC-6 voltage regulator, and the alternating current power supply adopts a 220V power supply.
As shown in fig. 2, the GIS simulator comprises a housing, an insulator inside the housing, a movable contact arm 1, an adjustable tulip contact and a fixed contact arm 2, wherein the movable contact arm 1, the adjustable tulip contact and the fixed contact arm 2 are sequentially connected, the movable contact arm 1 and the fixed contact arm 2 are fixed inside the housing through the insulator, the adjustable plum blossom contact comprises 6 contact fingers 4, 2 fixed plates 7 and 4 detachable fastening springs 3, wherein the 6 contact fingers 4 are fixed on the 2 fixed plates 7, the fastening springs 3 are hooped at the outer sides of the 6 contact fingers 4, as shown in fig. 3, the temperature measuring element 8 is arranged on the movable contact arm 1, the adjustable tulip contact and the shell and is connected with the data acquisition instrument, the adjustable plum blossom contact is a plum blossom contact with variable quantity of fastening springs 3, a resistance card 5 is connected in series between a plurality of contact fingers 4 of the adjustable plum blossom contact and the movable contact arm 1, the resistance card 5 adopts an iron-chromium-aluminum resistance wire, and insulation sheets 6 are arranged between the rest contact fingers 4 and the movable contact arm 1.
Example 2
A method for simulating a defect experiment of a GIS single-branch bus corresponding to embodiment 1 includes:
the contact fastening force of the contact fingers 4 and the movable contact arm 1 is reduced due to ageing of the tulip contact through reduction of the number of the fastening springs 3, the number of the contact fingers 4 in contact with the movable contact arm 1 is controlled by serially connecting resistance sheets 5 between part of the contact fingers 4 and the movable contact arm 1, and insulating sheets 6 are arranged between the rest of the contact fingers 4 and the movable contact arm 1, so that the increase of contact resistance caused by metal ageing is simulated, meanwhile, through flow on a single contact finger 4 is increased, the resistance value of each resistance sheet 5 is 1 omega, the heating power is increased, the overheating defect is simulated, the environment temperature and humidity of the GIS simulator are controlled by changing the ventilation and heat dissipation conditions of the region where the GIS simulator is located, the overheating defect is simulated for many times, and a more comprehensive simulation result is obtained.
The acoustic information of the GIS simulator is detected by an ultrasonic signal detector, the ambient temperature information around the GIS simulator is detected by a temperature and humidity sensor, the temperature measuring element 8 collects the temperature information of measuring points of the movable contact arm 1, the plum blossom contact and the shell and collects the temperature information through a data collector, the thermal infrared imager is over against the GIS simulator and measures the temperature distribution information of the shell, the ultrasonic signal detector adopts PDS-T, and the temperature and humidity sensor adopts Si 7021.
Embodiment 1 and embodiment 2 provide a GIS generating line contact defect experiment simulation device and method, connect the voltage regulator with the 220V voltage that is easy to obtain, connect the voltage regulator, ammeter and GIS simulator in series in proper order, form the return circuit, the GIS simulator adopts the variable adjustable plum blossom contact of quantity of the fastening spring 3, connect the resistance card 5 in series between a plurality of contact fingers 4 and the movable contact arm 1 of the adjustable plum blossom contact, there are insulating pieces 6 between other contact fingers 4 and the movable contact arm, can simulate the contact fastening force decline of the movable contact arm 1 and contact finger 4 caused by aging, the contact resistance increase caused by metal aging, increase the through-flow on the single contact finger 4 at the same time, the fault level when approaching the real overheat defect, simple in construction, with low costs, the coverage is wide.
The foregoing detailed description of the preferred embodiments of the invention has been presented. It should be understood that numerous modifications and variations could be devised by those skilled in the art in light of the present teachings without departing from the inventive concepts. Therefore, the technical solutions available to those skilled in the art through logic analysis, reasoning and limited experiments based on the prior art according to the concept of the present invention should be within the scope of protection defined by the claims.

Claims (10)

1. A GIS bus contact defect experiment simulation device comprises a GIS simulator, wherein the GIS simulator comprises a shell, a movable contact arm (1), an adjustable plum blossom contact and a static contact arm (2) which are fixed inside the shell and connected in sequence, and is characterized by further comprising a temperature measuring element (8), a humiture instrument, a data acquisition instrument, an ammeter, a voltage regulator and an alternating current power supply, wherein the voltage regulator, the ammeter and the GIS simulator are sequentially connected in series to form a loop, the voltage regulator is connected with the alternating current power supply, the temperature measuring element (8) is arranged on the movable contact arm (1), the adjustable plum blossom contact and the shell, the temperature measuring element (8) and the humiture instrument are connected with the data acquisition instrument, the adjustable plum blossom contact is a plum blossom contact with variable quantity of a fastening spring (3), and a gasket or direct contact is inserted between a contact finger (4) of the adjustable plum blossom contact and the movable contact arm (1), the gasket is a resistor disc (5) or an insulation sheet (6).
2. The GIS bus contact defect experimental simulation device of claim 1, wherein a safety switch is connected in series between the voltage regulator and the alternating current power supply.
3. The GIS bus contact defect experimental simulation device of claim 1, wherein the number of the fastening springs (3) is 1-4.
4. The GIS bus contact defect experimental simulation device of claim 1, wherein the number of the contact fingers (4) is 4-8.
5. The GIS bus contact defect experimental simulation device of claim 1, wherein the resistance card (5) adopts an iron-chromium-aluminum resistance wire for through-flow heating.
6. The GIS bus contact defect experimental simulation device of claim 1, characterized in that the insulation sheet (6) is made of high temperature resistant material.
7. The GIS bus contact defect experimental simulation device of claim 1, wherein the voltage regulator employs TDGC-6.
8. The GIS bus contact defect experimental simulation device of claim 1, wherein the data acquisition instrument employs JK 808.
9. The simulation method of the GIS bus contact defect experiment simulation device according to claim 1 comprises the following steps:
the reduction of the contact fastening force of the contact fingers (4) and the movable contact arm (1) caused by the aging of the plum blossom contact is simulated by reducing the number of the fastening springs (3), the number of the contact fingers (4) contacted with the movable contact arm (1) is controlled by serially connecting resistor discs (5) between part of the contact fingers (4) and the movable contact arm (1), insulating discs (6) are arranged between the rest of the contact fingers (4) and the movable contact arm (1), so that the increase of the contact resistance caused by the aging of metal is simulated, meanwhile, the through flow on a single contact finger (4) is increased, the heating power is increased, the overheating defect is simulated, an ultrasonic signal detector is adopted to detect the sound information of the GIS simulator, a temperature and humidity sensor is used to detect the ambient temperature information around the GIS simulator, and a temperature measuring element (8) is used to collect the temperature information of the movable contact arm (1), the adjustable plum blossom contact and the measuring point on the shell and is collected, and detecting the shell temperature distribution information of the GIS simulator by adopting a thermal infrared imager.
10. The GIS single-branch busbar defect experimental simulation method of claim 9, wherein the overheating defect is simulated multiple times at different ambient temperatures.
CN202010480391.7A 2020-05-30 2020-05-30 GIS bus contact defect experiment simulation device and method Pending CN111665457A (en)

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CN202010480391.7A CN111665457A (en) 2020-05-30 2020-05-30 GIS bus contact defect experiment simulation device and method

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Application Number Priority Date Filing Date Title
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CN111665457A true CN111665457A (en) 2020-09-15

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118150999A (en) * 2024-05-10 2024-06-07 国网辽宁省电力有限公司电力科学研究院 System and method for testing true type of burning-out short circuit of conductor contact of switching equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118150999A (en) * 2024-05-10 2024-06-07 国网辽宁省电力有限公司电力科学研究院 System and method for testing true type of burning-out short circuit of conductor contact of switching equipment

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