CN111637960B - Vibration measuring system for eliminating vibration influence of base point of laser vibration meter - Google Patents
Vibration measuring system for eliminating vibration influence of base point of laser vibration meter Download PDFInfo
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- CN111637960B CN111637960B CN202010339199.6A CN202010339199A CN111637960B CN 111637960 B CN111637960 B CN 111637960B CN 202010339199 A CN202010339199 A CN 202010339199A CN 111637960 B CN111637960 B CN 111637960B
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- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
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Abstract
The invention discloses a vibration measuring system for eliminating vibration influence of a base point of a laser vibration meter, which comprises 2 laser vibration meters, a symmetrical reflection box, a signal amplifier, a data acquisition unit and a processor, wherein the symmetrical reflection box consists of 6 reflectors and a rigid reflection plate. The invention can provide a more accurate measuring mode for vibration measurement, can eliminate the influence of the vibration of the base point of the laser vibration meter by the forward and backward tracking of the two laser vibration meters and corresponding optical elements at the same position on the same target point, obtains the absolute vibration signal of the measured object, and overcomes the defect that the traditional direct measuring mode of the laser vibration meter can not eliminate the influence of the vibration of the laser vibration meter caused by the field vibration.
Description
Technical Field
The invention belongs to the technical field of laser vibration measurement, and particularly relates to a vibration measurement system for eliminating the vibration influence of a base point of a laser vibration meter.
Background
Vibration and noise often bring a lot of troubles to people's life, and in machinery industry or building industry, too big vibration can even bring the potential safety hazard, so the measurement and analysis of vibration are very important to the research of object vibration. In a traditional contact measurement mode, a plurality of sensors are arranged on a measured object, and vibration signals of the measured object are collected and analyzed through close contact between the sensors and the measured object. However, the contact measurement method has some defects, such as high installation requirement, the sensor must be firmly fixed on the measured object, sometimes the position to be measured is difficult to install, and the range of the contact sensor measurement method often has a limit requirement; especially, under special conditions such as high temperature, high pressure and strong magnetic field, the fixed sensor built by electric signals can not be used basically.
The laser vibration meter is based on the laser interference principle, is a non-contact measuring method, and can be applied to the special working conditions that other vibration measuring modes cannot measure. The laser vibration meter has the characteristics of high frequency and phase response, high precision and high measuring speed. However, the laser vibrometer is arranged in a field, the vibration of an object is described by the relative motion between the object to be measured on the measurement field and the laser vibrometer, and when a certain field vibrates at a base point where the laser vibrometer is arranged, the laser vibrometer itself will vibrate, so that the measurement result is not accurate enough. In order to eliminate such errors, some researchers collect and analyze the vibration signals of the laser vibrometers by arranging acceleration sensors on the laser vibrometers so as to eliminate the measurement errors caused by the self-vibration. However, because the principle of measuring by the laser vibration meter is different from that of the sensor for measuring the acceleration or the speed of the vibration of the laser vibration meter, the difference necessarily has a certain difference in response characteristics, and the difference cannot ensure that the influence of the base point can be eliminated by simply adding or subtracting the measurement signal.
Disclosure of Invention
The invention aims to solve the problems in the prior art, provides an oscillation measuring system for eliminating the influence of base point oscillation of a laser oscillation meter, overcomes the defects of limited measuring range and high arrangement requirement of the traditional contact type measuring mode, and overcomes the defect that the laser oscillation meter cannot eliminate the measuring error caused by the oscillation of the laser oscillation meter due to the field oscillation.
In order to achieve the purpose, the invention adopts the technical scheme that:
a vibration measuring system for eliminating vibration influence of a base point of a laser vibration meter comprises a triangular support frame, the laser vibration meter, a symmetrical light reflecting box, a signal amplifier, a data acquisition unit and a processor, wherein the laser vibration meter is arranged on the triangular support frame and used for detecting a vibration signal of a measured object; the symmetrical light reflecting boxes are arranged at the positions of points to be measured of the measured object; the laser vibration meter comprises a first laser vibration meter and a second laser vibration meter, and a laser beam emitted by the first laser vibration meter returns to the first laser vibration meter after being reflected by the front surface of the rigid reflecting plate in the symmetrical reflecting box for detecting a forward vibration signal of a measured object; the laser beam emitted by the second laser vibration meter returns to the second laser vibration meter after being reflected by the back surface of the rigid reflecting plate in the symmetrical reflecting box, and is used for detecting a reverse vibration signal of the object to be measured; the first laser vibration meter and the second laser vibration meter are respectively connected with a signal amplifier, the signal amplifier is connected with the processor through a data acquisition unit, and the processor obtains an absolute vibration signal of a measured object according to a forward vibration signal and a reverse vibration signal which are respectively measured by the first laser vibration meter and the second laser vibration meter.
Specifically, the symmetrical reflection box comprises a rigid reflection plate, a first reflection mirror group and a second reflection mirror group; the first reflector group is used for guiding laser beams emitted by the first laser vibration meter to the front surface of the rigid reflector; the second reflector group is used for guiding the laser beam emitted by the second laser vibration meter to the back of the rigid reflector; the positions of the laser spots on the front surface and the back surface of the rigid reflecting plate coincide, and the light path structure can ensure that the first laser vibration meter and the second laser vibration meter can measure a forward vibration signal and a reverse vibration signal of the same position of a measured object, so that an absolute vibration signal of a point position to be measured of the measured object is obtained.
Preferably, the first mirror group comprises a first mirror and a second mirror; the second reflector group comprises a third reflector, a fourth reflector, a fifth reflector and a sixth reflector; the reflectors are all plane reflectors;
furthermore, the first reflector group and the second reflector group are both provided with adjustable reflector bases for adjusting the positions of the first reflector group and the second reflector group; by adjusting the positions of the 6 reflectors, the reflected light beams on the front surface and the back surface of the rigid reflector are reflected to respectively return to the first laser vibration meter and the second laser vibration meter, and the optical distances of the reflected light beams are equal.
Specifically, the triangular support frame is a tripod with adjustable supporting legs, and the height of the three supporting legs of the triangular support frame can be adjusted through adjusting, so that the levelness of the laser vibration meter can be adjusted.
In particular, the processor is a computer.
Compared with the prior art, the invention has the beneficial effects that: (1) aiming at the problems of high sensor arrangement requirement and limited measuring range of the traditional acceleration sensor vibration measurement mode, the vibration condition of a measured object can be measured quickly and accurately by adopting the laser vibrometer to carry out non-contact measurement; (2) aiming at the defect that the laser vibration meter cannot eliminate measurement errors caused by the vibration of the laser vibration meter caused by field vibration, a symmetrical reflection box is arranged on a measured point, the positive and negative vibration of a measured object is synchronously measured, and finally, an absolute vibration signal of the measured object can be obtained through the processing of a processor; (3) the invention can obtain the absolute vibration of the measured object by simply processing the synchronous vibration signal of the same type of laser vibration meter signals by arranging the symmetrical reflection boxes on the surface of the measured object, and compared with the existing method for mounting the sensor on the laser vibration meter, the method has the advantages of simple and effective signal processing and obvious advantages.
Drawings
FIG. 1 is a schematic diagram of the overall structure of a vibration measuring system for eliminating the influence of vibration of a base point of a laser vibration meter according to the present invention;
FIG. 2 is a schematic diagram of an internal optical path structure of a symmetrical light-reflecting box according to an embodiment of the present invention;
in the figure, 1, a first laser vibrometer; 2. a second laser vibrometer; 3. a symmetric light reflecting box; 4. a data acquisition unit; 5. a signal amplifier; 6. a processor; 7. an object to be measured; 8. a rigid reflector; 9. a first reflector; 10. a second reflector; 11. a third reflector; 12. a fourth mirror; 13. a fifth mirror; 14. and a sixth mirror.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present patent, it is to be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of describing the present patent and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present patent.
As shown in fig. 1 and 2, the embodiment provides a vibration measurement system for eliminating the influence of base point vibration of a laser vibration meter, which includes a triangular support frame, a laser vibration meter, a symmetric reflection box 3, a signal amplifier 5, a data acquisition unit 4 and a processor 6, wherein the laser vibration meter is mounted on the triangular support frame and is used for detecting a vibration signal of a measured object 7; the symmetrical light reflecting box 3 is arranged at the position of a to-be-measured point of a to-be-measured object 7; the laser vibration meter comprises a first laser vibration meter 1 and a second laser vibration meter 2, and a laser beam emitted by the first laser vibration meter 1 returns to the first laser vibration meter 1 after being reflected by the front surface of a rigid reflecting plate 8 in a symmetrical reflecting box 3 and is used for detecting a forward vibration signal of a measured object 7; the laser beam emitted by the second laser vibration meter 2 returns to the second laser vibration meter 2 after being reflected by the back surface of the rigid reflecting plate 8 in the symmetrical reflecting box 3, and is used for detecting a reverse vibration signal of the object to be measured 7; the first laser vibration meter 1 and the second laser vibration meter 2 are respectively connected with a signal amplifier 5, the signal amplifier 5 is connected with a processor 6 through a data acquisition unit 4, and the processor 6 obtains an absolute vibration signal of a measured object 7 according to a forward vibration signal and a reverse vibration signal which are respectively measured by the first laser vibration meter 1 and the second laser vibration meter 2.
Specifically, the symmetrical reflection box 3 comprises a rigid reflection plate 8, a first reflection mirror group and a second reflection mirror group; the first reflector group is used for guiding laser beams emitted by the first laser vibration meter 1 to the front surface of the rigid reflector 8; the second reflector group is used for guiding the laser beam emitted by the second laser vibration meter 2 to the back of the rigid reflector 8; the positions of the laser spots on the front surface and the back surface of the rigid reflecting plate 8 are superposed, and the light path structure can ensure that the first laser vibration meter 1 and the second laser vibration meter 2 can measure a forward vibration signal and a reverse vibration signal of the same position of the measured object 7, so that an absolute vibration signal of the point position to be measured of the measured object 7 is obtained.
Preferably, said first set of mirrors comprises a first mirror 9 and a second mirror 10; the second reflector group comprises a third reflector 11, a fourth reflector 12, a fifth reflector 13 and a sixth reflector 14; the reflectors are all plane reflectors;
furthermore, the first reflector group and the second reflector group are both provided with adjustable reflector bases for adjusting the positions of the first reflector group and the second reflector group; by adjusting the positions of the 6 reflectors, reflected light beams on the front surface and the back surface of the rigid reflector 8 are reflected to respectively return to the first laser vibration meter 1 and the second laser vibration meter 2, so that the optical distances are equal, and the synchronization of vibration signals measured by the first laser vibration meter 1 and the second laser vibration meter 2 is ensured; the reflection optical distances of the first laser vibration meter 1 and the second laser vibration meter 2 satisfy the following formula:
La1+La2=Lb1+Lb2+Lb3+Lb4
in the formula, La1Is the optical path between the first mirror 9 and the second mirror 10, La2The optical path from the second reflector 10 to the front surface of the rigid reflector 8; l isb1Is the optical path between the third mirror 11 and the fourth mirror 12, Lb2Is the optical path between the fourth mirror 12 and the fifth mirror 13, Lb3Is the optical path length, L, between the fifth mirror 13 and the sixth mirror 14b4The optical path between the sixth mirror 14 and the back of the rigid light reflecting plate 8.
Specifically, the triangular support frame is a tripod with adjustable supporting legs, and the height of the three supporting legs of the triangular support frame can be adjusted through adjusting, so that the levelness of the laser vibration meter can be adjusted.
In particular, in this embodiment, the natural frequency of the rigid light reflecting plate 8 is much higher than the natural frequency of the object to be measured 7, so that the vibration signal can be easily measured.
The working principle of the vibration measurement system of the embodiment is as follows: during vibration measurement, the two triangular support frames are respectively leveled and placed, the first laser vibration meter 1 and the second laser vibration meter 2 are respectively installed on the two triangular support frames, laser beams generated by the two vibration meters are ensured to be emitted in the horizontal direction, the laser beams generated by the first laser vibration meter 1 are reflected by the first reflecting mirror 9 and the second reflecting mirror 10 in sequence, reach the front side of the rigid reflecting plate 8 and are reflected back into the first laser vibration meter 1 by the original light path; the laser beam generated by the second laser vibration meter 2 is reflected by a third reflector 11, a fourth reflector 12, a fifth reflector 13 and a sixth reflector 14 in sequence, reaches the back of the rigid reflector 8, and is reflected back to the second laser vibration meter 2 by the original light path; synchronous vibration signal of 8 tow sides of rigid reflection board that first laser vibrometer 1 and second laser vibrometer 2 record is through signal amplifier 5 after enlargies, has data collection station 4 to send treater 6 to handle, finally obtains the absolute vibration signal of testee 7 through following formula, the formula is as follows:
x=(xa-xb)/2
where x is the absolute vibration signal of the object 7 to be measured, xaFor the vibration signal, x, measured by the first laser vibrometer 1bIs the vibration signal measured by the second laser vibrometer 2.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. A vibration measuring system for eliminating vibration influence of a base point of a laser vibration meter is characterized by comprising a triangular support frame, the laser vibration meter, a symmetrical light reflecting box, a signal amplifier, a data acquisition unit and a processor, wherein the laser vibration meter is arranged on the triangular support frame and used for detecting a vibration signal of a measured object; the symmetrical light reflecting boxes are arranged at the positions of points to be measured of the measured object; the laser vibration meter comprises a first laser vibration meter and a second laser vibration meter, and a laser beam emitted by the first laser vibration meter returns to the first laser vibration meter after being reflected by the front surface of the rigid reflecting plate in the symmetrical reflecting box for detecting a forward vibration signal of a measured object; the laser beam emitted by the second laser vibration meter returns to the second laser vibration meter after being reflected by the back surface of the rigid reflecting plate in the symmetrical reflecting box, and is used for detecting a reverse vibration signal of the object to be measured; the positions of the laser spots on the front surface and the back surface of the rigid reflecting plate are superposed, and the reflected light beams on the front surface and the back surface of the rigid reflecting plate respectively return to the first laser vibration meter and the second laser vibration meter after being reflected, so that the optical distances are equal; the first laser vibration meter and the second laser vibration meter are respectively connected with a signal amplifier, the signal amplifier is connected with the processor through a data acquisition unit, and the processor obtains an absolute vibration signal of a measured object according to a forward vibration signal and a reverse vibration signal which are respectively measured by the first laser vibration meter and the second laser vibration meter.
2. The vibration measuring system of claim 1 wherein the symmetric reflector box comprises a rigid reflector plate, a first set of reflectors, and a second set of reflectors; the first reflector group is used for guiding laser beams emitted by the first laser vibration meter to the front surface of the rigid reflector; and the second reflector group is used for guiding the laser beam emitted by the second laser vibration meter to the back surface of the rigid reflector.
3. The vibration measuring system of claim 2 wherein the first set of mirrors comprises a first mirror and a second mirror; the second reflecting mirror group comprises a third reflecting mirror, a fourth reflecting mirror, a fifth reflecting mirror and a sixth reflecting mirror.
4. The vibration measuring system of claim 3, wherein the first and second reflecting mirror sets are each provided with an adjustable mirror mount for adjusting the position of the first and second reflecting mirror sets.
5. A vibration measuring system according to claim 1 wherein the tripod is a tripod with adjustable support feet.
6. The vibration measurement system of claim 1 wherein the processor is a computer.
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Patent Citations (7)
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KR20050073227A (en) * | 2004-01-09 | 2005-07-13 | 학교법인조선대학교 | Laser vibration visual system |
CN107250723A (en) * | 2015-01-13 | 2017-10-13 | Dscg史罗轩公司 | Multi beam scope measurement process |
CN104698489A (en) * | 2015-02-01 | 2015-06-10 | 山东科技大学 | Dangerous rock recognition method |
CN105675115A (en) * | 2016-01-18 | 2016-06-15 | 佛山科学技术学院 | Laser Doppler online vibration testing system and method |
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