CN111284139A - Consumable chip repairing method and consumable chip - Google Patents
Consumable chip repairing method and consumable chip Download PDFInfo
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- CN111284139A CN111284139A CN202010046254.2A CN202010046254A CN111284139A CN 111284139 A CN111284139 A CN 111284139A CN 202010046254 A CN202010046254 A CN 202010046254A CN 111284139 A CN111284139 A CN 111284139A
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- simulation
- analog
- consumable chip
- characteristic information
- memory
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/17—Ink jet characterised by ink handling
- B41J2/175—Ink supply systems ; Circuit parts therefor
- B41J2/17503—Ink cartridges
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G21/00—Arrangements not provided for by groups G03G13/00 - G03G19/00, e.g. cleaning, elimination of residual charge
- G03G21/16—Mechanical means for facilitating the maintenance of the apparatus, e.g. modular arrangements
- G03G21/18—Mechanical means for facilitating the maintenance of the apparatus, e.g. modular arrangements using a processing cartridge, whereby the process cartridge comprises at least two image processing means in a single unit
- G03G21/1875—Mechanical means for facilitating the maintenance of the apparatus, e.g. modular arrangements using a processing cartridge, whereby the process cartridge comprises at least two image processing means in a single unit provided with identifying means or means for storing process- or use parameters, e.g. lifetime of the cartridge
- G03G21/1878—Electronically readable memory
Abstract
The application provides a consumable chip repairing method and a consumable chip, wherein simulation parameter data prestored in the consumable chip are collected, wherein the simulation parameter data indicate first simulation characteristic information of a simulation device in the consumable chip; obtaining the first simulation characteristic information according to the simulation parameter data; and then configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip, so that when the old consumable chip is recycled, the matching reliability of the analog characteristic of the chip is improved, and the recycling efficiency of the consumable chip is improved.
Description
Technical Field
The application relates to a printing technology, in particular to a consumable chip repairing method and a consumable chip.
Background
The printing system has replaceable components that provide the system with printed material. The replaceable components are, for example, a cartridge or drum containing printing material, and a consumable chip mounted on the cartridge or drum. The consumable chip is used for storing information data including the updated residual quantity, the attribute, the production date and the like of the printing materials and storing authentication data used for the printing system to authenticate the safety of the replaceable component. For example, the printer estimates information such as the print life of the printing material by reading the information data, and determines whether the source of the replaceable component is legitimate by reading the authentication data. For some consumable chips provided with analog devices, the analog characteristics of the analog devices are collected by detection equipment during chip production, and are converted into analog parameters to be stored in the consumable chips.
In the prior art, when a printer reads a consumable chip, analog characteristics of an analog device, such as a voltage value and an analog parameter, need to be detected. The printer judges whether the detected simulation characteristic is matched with the simulation parameter prestored in the chip, if not, the chip is illegal, and the chip is not allowed to be used.
However, in the prior art, the recycled consumable chip is detected as an illegal chip by the printer, so that the recycling reliability of the conventional consumable chip is not high.
Disclosure of Invention
The embodiment of the application provides a consumable chip repairing method and a consumable chip, and when the consumable chip is recycled, the matching reliability of the simulation characteristics of the chip is improved, and further the recycling efficiency of the consumable chip is improved.
According to a first aspect of the application, a consumable chip repairing method is provided, which includes:
collecting simulation parameter data prestored in a consumable chip, wherein the simulation parameter data indicates first simulation characteristic information of a simulation device in the consumable chip;
obtaining the first simulation characteristic information according to the simulation parameter data;
and configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip.
Optionally, the simulation parameter data is encrypted data of the first simulation characteristic information;
the obtaining the first simulation characteristic information according to the simulation parameter data includes:
and decrypting the simulation parameter data to obtain the first simulation characteristic information.
Optionally, the configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip includes:
and modifying, replacing and/or deleting the analog device according to the first analog characteristic information to obtain a consumable chip containing the repaired analog device, wherein the analog characteristic information of the repaired analog device is matched with the first analog characteristic information indicated by the analog parameter data.
Optionally, before configuring the analog device according to the first analog characteristic information to obtain a repaired consumable chip, the method further includes:
detecting and acquiring current simulation characteristic information of the simulation device;
determining that the current analog characteristic information does not match the first analog characteristic information.
Optionally, the analog device includes a memory, and the first analog characteristic information indicates a voltage signal and/or a current signal externally output when the memory is accessed.
According to a second aspect of the present application, there is provided a consumable chip comprising a storage unit including an original memory and a third memory connected to each other; wherein the original memory comprises a first memory subunit;
the first storage subunit is used for storing simulation parameter data;
the simulation characteristics of the third memory are configured according to the simulation parameter data;
the third memory responds to the request of the printer simultaneously with the original memory.
Optionally, the original memory further comprises a second storage subunit;
wherein the simulation parameter data indicates first simulation characteristic information of the second storage subunit.
Optionally, the first analog characteristic information indicates a voltage signal and/or a current signal externally output when the memory cell is accessed.
Optionally, the data stored in the third memory and the second storage subunit include data with the same meaning.
Optionally, the data with the same meaning includes ink amount data and/or data to be detected, wherein the data to be detected is used for detecting whether the simulation characteristic when the storage unit outputs the data to be detected matches with the simulation parameter data.
Optionally, the analog characteristic of the third memory is adjustable.
Optionally, the simulation parameter data corresponds to the consumable chips one to one.
According to a third aspect of the present application, there is provided a consumable chip repair device comprising:
the acquisition module is used for acquiring simulation parameter data prestored in a consumable chip, wherein the simulation parameter data indicates first simulation characteristic information of a simulation device in the consumable chip;
the analysis module is used for obtaining the first simulation characteristic information according to the simulation parameter data;
and the configuration module is used for configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip.
According to a fourth aspect of the present application, there is provided a consumable chip repair device, comprising: memory, a processor and a computer program, the computer program being stored in the memory, the processor running the computer program to perform the method of any of the first aspects of the present application.
According to a fifth aspect of the present application, there is provided a computer readable storage medium having stored thereon a computer program for implementing the method of any one of the first aspect of the present application when executed by a processor.
According to the consumable chip repairing method and the consumable chip, the simulation parameter data prestored in the consumable chip are collected, wherein the simulation parameter data indicate first simulation characteristic information of a simulation device in the consumable chip; obtaining the first simulation characteristic information according to the simulation parameter data; and then configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip, so that when the old consumable chip is recycled, the matching reliability of the analog characteristic of the chip is improved, and the recycling efficiency of the consumable chip is improved.
Drawings
FIG. 1 is a schematic diagram of a consumable chip detection scenario provided in an embodiment of the present application;
FIG. 2 is a schematic flowchart of a method for repairing a consumable chip according to an embodiment of the present disclosure;
FIG. 3 is a schematic structural diagram of a consumable chip according to an embodiment of the present disclosure;
FIG. 4 is a schematic structural diagram of another consumable chip provided in the embodiments of the present application;
FIG. 5 is a schematic structural diagram of a consumable chip repairing apparatus according to an embodiment of the present disclosure;
fig. 6 is a schematic diagram of a hardware structure of a consumable chip repair device according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The terms "first," "second," "third," and the like in the description and in the claims of the present application and in the above-described drawings are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein.
It should be understood that, in the various embodiments of the present application, the size of the serial number of each process does not mean the execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.
It should be understood that, in this application, "comprises" and "comprising," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
It should be understood that in this application, "plurality" means two or more. "and/or" is merely an association describing an associated object, meaning that three relationships may exist, for example, and/or B, may mean: a exists alone, A and B exist simultaneously, and B exists alone. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship. "comprises A, B and C" and "comprises A, B, C" means that all three of A, B, C comprise, "comprises A, B or C" means that one of A, B, C comprises, "comprises A, B and/or C" means that any 1 or any 2 or 3 of A, B, C comprises.
It should be understood that in the present application, "B corresponding to a", "a corresponds to B", or "B corresponds to a" means that B is associated with a, from which B can be determined. Determining B from a does not mean determining B from a alone, but may be determined from a and/or other information. And the matching of A and B means that the similarity of A and B is greater than or equal to a preset threshold value.
As used herein, "if" may be interpreted as "at … …" or "when … …" or "in response to a determination" or "in response to a detection", depending on the context.
The technical solution of the present application will be described in detail below with specific examples. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments.
Referring to fig. 1, a schematic view of a detection scenario of a consumable chip provided in an embodiment of the present application is shown. The consumable chip 2 is shown mounted within a printing consumable. The printing supplies may be, for example, ink cartridges, toner cartridges, or the like. In the prior art, when the printer 1 reads the consumable chip 2, it is first required to detect whether the simulation characteristics of the simulation device 21 in the consumable chip 2 are matched with the simulation parameter data pre-stored in the consumable chip 2, and accordingly, it is determined whether the consumable chip is a legal chip. The problem that the consumable chip is mistakenly judged as an illegal chip due to the fact that the simulation characteristic of the consumable chip is changed in use in the prior art exists. It can be seen that the problem that the verification reliability of the recycled consumable chip is not high enough exists at present.
Consumable chips are recyclable products, but the recyclable consumable chips may have been changed in analog characteristics in previous use. The application provides a consumable chip repairing method and a consumable chip, which can improve the matching reliability of chip simulation characteristics when the old consumable chip is recycled, and further improve the recycling efficiency of the consumable chip. The following examples and embodiments are to be considered in conjunction with the drawings and their detailed description.
Referring to fig. 2, which is a schematic flow chart of a method for repairing a consumable chip according to an embodiment of the present disclosure, an execution subject of the method shown in fig. 2 is a consumable chip repairing apparatus, which may be a software and/or hardware apparatus. The method shown in fig. 2 includes steps S101 to S103, which are specifically as follows:
s101, collecting simulation parameter data prestored in a consumable chip, wherein the simulation parameter data indicates first simulation characteristic information of a simulation device in the consumable chip.
The consumable chip can have an initial state when leaving factory settings, then some changes can be found to become old consumable chips in the use process, and when the old consumable chips are recycled, the consumable chip repairing device collects the simulation parameter data pre-stored in the consumable chips first, and the consumable chips with the simulation characteristics changed are repaired according to the simulation parameter data.
The simulation parameter data is data solidified in the consumable chip and cannot be changed along with the use of the consumable chip. The first simulation characteristic information indicated by the simulation parameter data may be simulation characteristics that are exhibited by a simulation device in the consumable chip in an initial state at the time of factory setting. The first analog characteristic information is, for example, a voltage signal and/or a current signal output by the analog device when the consumable chip is accessed by the printer.
In this embodiment, the analog device of the consumable chip may be a part of the memory, or may be an independent analog device independent from the memory.
S102, obtaining the first simulation characteristic information according to the simulation parameter data.
Specifically, the collected simulation parameter data may be analyzed to obtain first simulation characteristic information indicated by the simulation parameter data.
In some embodiments, the simulation parameter data is encrypted data of the first simulation characteristic information. Then, the consumable chip repair device may decrypt the simulation parameter data to obtain the first simulation characteristic information.
In some embodiments, the consumable chip outputs an analog voltage signal, converts the analog voltage signal into digital analog parameter data, such as a string of encoded data consisting of 0 and 1, and decodes the string of encoded data to obtain the first analog characteristic information. The first analog characteristic information is used to indicate the analog characteristic of the analog device, and is used to record that the analog device in the initial state outputs a low-level voltage signal (corresponding to digital signal 0) of 5V or less and outputs a high-level voltage signal (corresponding to digital signal 1) of 5V or more. If the analog characteristics of the analog devices in the consumable chip are changed, the analog devices need to be configured to repair the consumable chip. For example, if an analog device originally outputting an analog signal of 5V or less outputs an analog signal exceeding 5V, the analog device needs to be repaired.
S103, configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip.
Specifically, before configuring the simulator, it may be determined whether the current simulation characteristic of the simulation device matches the first simulation characteristic information indicated by the simulation parameter data. Specifically, current analog characteristic information of the analog device may be detected and obtained first; if the current simulation characteristic information is determined not to be matched with the first simulation characteristic information, repairing the consumable chip, and executing the step S103; if the current simulation characteristic information is determined to be matched with the first simulation characteristic information, the consumable chip does not need to be repaired, and subsequent operations such as chip installation to the consumable can be directly performed, and the embodiment does not limit the operation.
In some embodiments that require repair of the consumable chip, the specific way to configure the analog device may be, for example: and modifying, replacing and/or deleting the analog device according to the first analog characteristic information to obtain a consumable chip containing the repaired analog device, wherein the analog characteristic information of the repaired analog device is matched with the first analog characteristic information indicated by the analog parameter data. For example, the voltage output of the analog device before repair is higher than the voltage range indicated by the first analog characteristic information, and the voltage output of the analog device after repair conforms to the voltage range indicated by the first analog characteristic information by the modified, replaced and/or deleted configuration of the analog device in this embodiment. The modified configuration mode can be, for example, adding analog devices connected in parallel; the replacement configuration mode can be that a new analog device is used to replace the original analog device; the deleted configuration mode can be to short circuit the partial circuit module in the original analog device.
In the actual repairing process, after the first simulation characteristic information is acquired, the simulation characteristic of the consumable chip can be configured by configuring the simulation device. In particular, the consumable on-chip analog device may be deleted, for example, by short-circuiting or disconnecting a part of the circuit of the third memory. Or modifying the configuration, for example, connecting a new analog circuit in parallel or in series with the original analog device, so that the analog device and the new analog circuit output the analog signal to the printer together. The modification method can be modified in a large space, but the modification needs to test the original simulation characteristics of the simulation devices on the consumable chip, and then determine the simulation characteristics of a new simulation circuit according to the original simulation characteristics. And a simple way may be to completely replace the original analog device with a new one. The three configurations of modification, replacement and deletion can also be combined with each other, and the combination is not limited herein.
In some embodiments, the analog device may be a memory, and the first analog characteristic information indicates a voltage signal and/or a current signal externally output when the memory is accessed.
In the method for repairing a consumable chip provided by this embodiment, analog parameter data pre-stored in the consumable chip is collected, where the analog parameter data indicates first analog characteristic information of an analog device in the consumable chip; obtaining the first simulation characteristic information according to the simulation parameter data; and then configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip, so that when the old consumable chip is recycled, the matching reliability of the analog characteristic of the chip is improved, and the recycling efficiency of the consumable chip is improved.
Fig. 3 is a schematic structural diagram of a consumable chip according to an embodiment of the present disclosure. As shown in fig. 3, the consumable chip 300 includes a storage unit 310. The storage unit 310 includes an original memory 320 and a third memory 330 connected to each other, and the third memory 330 responds to a request of the printer simultaneously with the original memory 320. The original memory 320 includes a first storage subunit 321.
The first storage subunit 321 is used for storing simulation parameter data. The simulation characteristics of the third memory 330 are configured according to the simulation parameter data. Part or all of the memory cell 310 in this embodiment is an analog device in the above-described method embodiment. The printer reads the simulation parameter data, judges whether the first simulation characteristic information corresponding to the simulation parameter data is matched with the simulation characteristic output by the storage unit 310, and determines that the consumable chip is legal and the consumable is legal if the first simulation characteristic information is matched with the simulation characteristic output by the storage unit 310. According to the embodiment, the reliability of matching of the consumable chip is improved through the third memory configured according to the simulation parameter data.
In some embodiments, the analog characteristics of the third memory 330 are adjustable. For example, the device in the third memory is a device with adjustable analog characteristics, and the device configuration in the original memory is solidified in the consumable chip. For example, the third memory includes a plurality of resistors and a selection switch. Therefore, the resistance of the access circuit can be adjusted through the selective on-off of the selection switch, so that the analog characteristic of the third memory is changed. This embodiment can directly adjust the simulation characteristic of third memory when the simulation characteristic of memory cell is not matched with simulation parameter data through setting up the third memory of simulation characteristic adjustable to restore the holistic simulation characteristic of memory cell to with simulation parameter data matching, improve the prosthetic efficiency of consumptive material chip.
Referring to fig. 4, which is a schematic diagram of another consumable chip structure provided in the embodiment of the present application, in the consumable chip 300 shown in fig. 4, the original memory 320 further includes a second storage subunit 322. The second memory sub-unit 322 is an analog device in the above method embodiment. The simulation parameter data indicates first simulation characteristic information of the second storage subunit 322. The first analog characteristic information may represent analog characteristics that the second storage subunit 322 of the consumable chip 300 exhibits in an initial state at the time of factory setting.
In addition to the above embodiments, the data stored in the third memory and the data stored in the second storage subunit may include data with the same meaning. It is understood that at least a portion of the data stored in the third memory unit is synonymous with at least a portion of the data stored in the second memory subunit. In this embodiment, the data having the same meaning includes ink amount data and/or data to be detected, where the data to be detected is used to detect whether a simulation characteristic when the storage unit outputs the data to be detected matches the simulation parameter data. For example, the third memory and the second storage subunit both store data indicating the amount of ink. For another example, the third memory and the second storage subunit both store the same data to be detected, and although the output analog characteristic (e.g., output voltage) of the second storage subunit when outputting the data to be detected is lower than the range indicated by the analog parameter data, in this embodiment, the third memory storing the same data to be detected is configured, so that when the third memory and the second storage subunit respond to an external request to output the data to be detected, the analog characteristic (e.g., output voltage) of the third memory is used to adjust the overall output analog characteristic of the storage unit (e.g., pull up the voltage value), so that the analog characteristic of the storage unit when outputting the data to be detected can be matched with the analog parameter data. In some embodiments, the printer may perform verification calculation on the data to be detected, and if a result of the verification calculation matches a preset standard result, a result that the detection is passed is obtained. The data to be detected is used for detecting the data storage integrity of the consumable chip, for example.
In the various embodiments described above, the simulation parameter data may be in one-to-one correspondence with the consumable chips. It can be understood that the simulation parameter data of different consumable chips are different, and the simulation parameter data of each consumable chip has uniqueness.
Referring to fig. 5, which is a schematic structural diagram of a consumable chip repairing apparatus provided in an embodiment of the present application, a consumable chip repairing apparatus 50 shown in fig. 5 includes:
the acquisition module 51 is configured to acquire analog parameter data pre-stored in a consumable chip, where the analog parameter data indicates first analog characteristic information of an analog device in the consumable chip.
And the analysis module 52 is configured to obtain the first simulation characteristic information according to the simulation parameter data.
And the configuration module 53 is configured to configure the analog device according to the first analog characteristic information to obtain the repaired consumable chip.
The consumable chip repair device of the embodiment shown in fig. 5 can be correspondingly used to perform the steps of the method embodiment shown in fig. 2, and the implementation principle and the technical effect are similar, which are not described herein again.
In some embodiments, the simulation parameter data is encrypted data of the first simulation characteristic information.
Correspondingly, the parsing module 52 is configured to decrypt the simulation parameter data to obtain the first simulation characteristic information.
In some embodiments, the configuration module 53 is configured to modify, replace and/or delete the circuit configuration of the analog device according to the first analog characteristic information to obtain a consumable chip including a repaired analog device, where the analog characteristic information of the repaired analog device matches with the first analog characteristic information indicated by the analog parameter data.
In some embodiments, the configuration module 53 is further configured to detect and obtain current analog characteristic information of the analog device before configuring the analog device according to the first analog characteristic information to obtain a repaired consumable chip; determining that the current analog characteristic information does not match the first analog characteristic information.
In some embodiments, the analog device includes a memory, and the first analog characteristic information indicates a voltage signal and/or a current signal externally output when the memory is accessed.
Referring to fig. 6, which is a schematic diagram of a hardware structure of a consumable chip repair device provided in an embodiment of the present application, the consumable chip repair device 60 includes: a processor 61, memory 62 and computer programs; wherein
A memory 62 for storing the computer program, which may also be a flash memory (flash). The computer program is, for example, an application program, a functional module, or the like that implements the above method.
And the processor 61 is used for executing the computer program stored in the memory so as to realize each step executed by the consumable chip repairing device in the consumable chip repairing method. Reference may be made in particular to the description relating to the preceding method embodiment.
Alternatively, the memory 62 may be separate or integrated with the processor 61.
When the memory 62 is a device independent from the processor 61, the consumable chip repair apparatus 60 may further include:
a bus 63 for connecting the memory 62 and the processor 61.
The present application further provides a computer-readable storage medium, in which a computer program is stored, and the computer program is used for implementing the consumable chip repairing method provided by the above-mentioned various embodiments when being executed by a processor.
The computer-readable storage medium may be a computer storage medium or a communication medium. Communication media includes any medium that facilitates transfer of a computer program from one place to another. Computer storage media may be any available media that can be accessed by a general purpose or special purpose computer. For example, a readable storage medium is coupled to the processor such that the processor can read information from, and write information to, the readable storage medium. Of course, the readable storage medium may also be an integral part of the processor. The processor and the readable storage medium may reside in an Application Specific Integrated Circuits (ASIC). Additionally, the ASIC may reside in user equipment. Of course, the processor and the readable storage medium may also reside as discrete components in a communication device. The readable storage medium may be a read-only memory (ROM), a random-access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.
The present application also provides a program product comprising execution instructions stored in a readable storage medium. The at least one processor of the device may read the execution instructions from the readable storage medium, and the execution of the execution instructions by the at least one processor causes the device to implement the consumable chip repair method provided by the various embodiments described above.
In the above embodiment of the consumable chip repairing apparatus, it should be understood that the Processor may be a Central Processing Unit (CPU), or may be other general-purpose processors, Digital Signal Processors (DSP), Application Specific Integrated Circuits (ASIC), etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of a method disclosed in connection with the present application may be embodied directly in a hardware processor, or in a combination of the hardware and software modules in the processor.
Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.
Claims (14)
1. A consumable chip repairing method is characterized by comprising the following steps:
collecting simulation parameter data prestored in a consumable chip, wherein the simulation parameter data indicates first simulation characteristic information of a simulation device in the consumable chip;
obtaining the first simulation characteristic information according to the simulation parameter data;
and configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip.
2. The method according to claim 1, wherein the simulation parameter data is encrypted data of the first simulation characteristic information;
the obtaining the first simulation characteristic information according to the simulation parameter data includes:
and decrypting the simulation parameter data to obtain the first simulation characteristic information.
3. The method according to claim 1, wherein the configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip comprises:
and modifying, replacing and/or deleting the analog device according to the first analog characteristic information to obtain a consumable chip containing the repaired analog device, wherein the analog characteristic information of the repaired analog device is matched with the first analog characteristic information indicated by the analog parameter data.
4. The method according to any one of claims 1 to 3, wherein before configuring the analog device according to the first analog characteristic information to obtain the repaired consumable chip, the method further comprises:
detecting and acquiring current simulation characteristic information of the simulation device;
determining that the current analog characteristic information does not match the first analog characteristic information.
5. The method according to claim 1, wherein the analog device includes a memory, and the first analog characteristic information indicates a voltage signal and/or a current signal externally output when the memory is accessed.
6. A consumable chip comprises a storage unit, and is characterized in that the storage unit comprises an original memory and a third memory which are connected with each other; wherein the original memory comprises a first memory subunit;
the first storage subunit is used for storing simulation parameter data;
the simulation characteristics of the third memory are configured according to the simulation parameter data;
the third memory responds to the request of the printer simultaneously with the original memory.
7. The consumable chip of claim 6, wherein the raw memory further comprises a second memory subunit;
wherein the simulation parameter data indicates first simulation characteristic information of the second storage subunit.
8. The consumable chip of claim 7, wherein the first analog characteristic information indicates a voltage signal and/or a current signal externally output when the memory cell is accessed.
9. The consumable chip of claim 7, wherein the data stored in the third memory and the second memory subunit comprise data with the same meaning.
10. The consumable chip according to claim 9, wherein the synonymous data includes ink amount data and/or data to be detected for detecting whether a simulation characteristic when the storage unit outputs the data to be detected matches the simulation parameter data.
11. The consumable chip of claim 6, wherein the analog characteristic of the third memory is tunable.
12. The consumable chip of claim 6 or 7, wherein the simulation parameter data corresponds to the consumable chip one to one.
13. A consumable chip repair device, comprising: memory, a processor and a computer program, the computer program being stored in the memory, the processor running the computer program to perform the method of any of claims 1 to 5.
14. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, is adapted to carry out the method of any one of claims 1 to 5.
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