CN111258896A - Method and device for automatic number-making breakpoint continuous making and computer readable storage medium - Google Patents

Method and device for automatic number-making breakpoint continuous making and computer readable storage medium Download PDF

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Publication number
CN111258896A
CN111258896A CN202010040828.5A CN202010040828A CN111258896A CN 111258896 A CN111258896 A CN 111258896A CN 202010040828 A CN202010040828 A CN 202010040828A CN 111258896 A CN111258896 A CN 111258896A
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test data
node
data generation
test
nodes
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钟慧祥
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Ping An Puhui Enterprise Management Co Ltd
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Ping An Puhui Enterprise Management Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3688Test management for test execution, e.g. scheduling of test suites

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Abstract

The invention relates to the technical field of testing, and discloses an automatic number-making breakpoint continuous making method, which comprises the following steps: sequentially selecting nodes; if one node is selected, obtaining a test data generation rule corresponding to the node according to a predetermined interface file, generating test data corresponding to the node according to the obtained test data generation rule, and storing a test data generation state corresponding to the node; after all nodes of a predetermined test path are selected, reading test data generation states corresponding to the selected nodes through a predetermined data query interface; and if the test data generation state corresponding to the selected node is the test data generation interruption, generating the test data corresponding to the selected node according to the test data generation rule corresponding to the selected node in which the test data generation interruption is performed according to the test data generation state. By using the invention, only the test data corresponding to the interrupted node needs to be generated, and the time cost caused by the number interruption is reduced.

Description

Method and device for automatic number-making breakpoint continuous making and computer readable storage medium
Technical Field
The present invention relates to the field of automated manufacturing technologies, and in particular, to an automated manufacturing breakpoint continuous manufacturing method, an automated manufacturing breakpoint continuous manufacturing device, and a computer-readable storage medium.
Background
In the testing process of internet products or other software systems, test data generally needs to be generated in advance, and the existing scheme for generating test data generally is as follows: the test data generation script is specially developed, then the test data is automatically generated through the developed script, and then the automatically generated test data is adopted to test the to-be-tested internet product or software system, so that the purpose of improving the test efficiency is achieved.
However, if a problem occurs during the automatic generation of test data by using a script, the generation of test data is usually interrupted, for example, the internet product has a high requirement for the stability of the test environment, and when many systems interact with each other, a service exception or a handover deployment may occur.
Therefore, in the conventional scheme for generating test data, if the number of the test data is interrupted in the middle of the manufacture, the generated test data needs to be invalidated, and the test data needs to be generated again, which greatly consumes the time and cost for generating the test data.
Disclosure of Invention
In view of the above, the present invention provides an automatic manufacturing breakpoint continuous creation method, an automatic manufacturing breakpoint continuous creation device and a computer readable storage medium, which mainly aims to generate test data corresponding to a broken node without generating all original target nodes again when the manufacturing is interrupted, and to reduce the time cost caused by the manufacturing interruption.
In order to achieve the above object, the present invention provides an automatic manufacturing breakpoint continuous manufacturing method, including:
s1, after receiving the test data generation instruction, the test data automatic generation program selects nodes in sequence according to the predetermined node sequence of the test path;
s2, if a node is selected, inquiring mapping relation data of a node identifier and a test data generation rule in a predetermined interface file, obtaining a test data generation rule corresponding to the node, generating test data corresponding to the node according to the obtained test data generation rule, and storing a test data generation state corresponding to the node, wherein the test data generation state comprises: the test data generation is completed or the test data generation is interrupted, and the interface file is stored in a predetermined storage unit in advance;
s3, after all nodes of the predetermined test path are selected, reading test data generation states corresponding to the selected nodes through a predetermined data query interface, and analyzing whether the test data generation states corresponding to the selected nodes are generated and interrupted for the test data;
and S4, if the test data generation state corresponding to the selected node is the test data generation interruption, generating the test data corresponding to the selected node according to the test data generation rule corresponding to the selected node in which the test data generation interruption is performed according to the test data generation state.
In addition, in order to achieve the above object, the present invention further provides an automatic manufacturing breakpoint continuous manufacturing device, which includes a memory and a processor, wherein the memory stores an automatic manufacturing breakpoint continuous manufacturing program, and the automatic manufacturing breakpoint continuous manufacturing program, when executed by the processor, can implement any steps of the automatic manufacturing breakpoint continuous manufacturing method.
In addition, in order to achieve the above object, the present invention further provides a computer-readable storage medium, wherein the computer-readable storage medium includes an automatic manufacturing breakpoint continuous creation program, and when the automatic manufacturing breakpoint continuous creation program is executed by a processor, the steps of the automatic manufacturing breakpoint continuous creation method can be implemented.
The invention provides an automatic manufacturing breakpoint continuous manufacturing method, an automatic manufacturing breakpoint continuous manufacturing device and a computer readable storage medium, wherein after receiving a test data generation instruction, a node is selected; and obtaining a test data generation rule corresponding to the node after the node is selected, generating test data corresponding to the node according to the test data generation rule, storing a test data generation state corresponding to the node, reading the test data generation state corresponding to the selected node through an inquiry interface, and generating the test data corresponding to the selected node according to the test data generation rule corresponding to the selected node in which the test data generation is interrupted when the test data generation state corresponding to the selected node is the test data generation interruption. The test data does not need to be generated again for all the originally selected nodes, and only the test data needs to be generated again for the nodes with the test data generation rule generation state interrupted for test data generation, so that the problem that the time cost for test data generation is greatly consumed due to the fact that test data needs to be generated again in the prior art is solved, and the time cost caused by the fact that the number is interrupted is reduced.
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FIG. 1 is a flow chart of a preferred embodiment of an automated manufacturing breakpoint continuous manufacturing method of the present invention;
FIG. 2 is a flowchart illustrating an automated manufacturing break point continuous manufacturing method according to another preferred embodiment of the present invention;
FIG. 3 is a diagram of an automatic manufacturing break point continuous manufacturing apparatus according to a preferred embodiment of the present invention;
FIG. 4 is a diagram illustrating a preferred embodiment of the UE in FIG. 3;
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The invention provides an automatic manufacturing breakpoint continuous manufacturing method.
Referring to fig. 1, a flow chart of a preferred embodiment of the method for automatically manufacturing break points according to the present invention is shown, wherein the method comprises the following steps:
and S1, after receiving the test data generation instruction, the test data automatic generation program selects the nodes in sequence according to the predetermined node sequence of the test path.
In an implementation manner of the present invention, the test data automatic generation program runs in the server, and specifically, the test data automatic generation program may be a jmeter script program. The jmeter script program is an existing program for automatically generating test data.
It should be noted that the test data generation instruction may be an icon on the test data automatic generation program clicked by the user to receive the test data generation instruction. And after the test data automatic generation program receives the test data generation instruction, acquiring a node for generating the test data. In the implementation mode of the invention, the nodes are sequentially selected according to the node sequence of the predetermined test path.
It can be understood that the product to be tested can be divided into a plurality of test paths, each test path corresponds to a plurality of nodes, and the nodes have a sequence relationship, so that the sequence of the nodes corresponding to the test paths can be automatically or thought to be formed. Then, the nodes of the predetermined test path may be directly selected sequentially in the order of the nodes. Therefore, the step of determining the predetermined test path provided by the embodiment of the present invention, as shown in fig. 2, includes:
s201, acquiring the to-be-tested programs of the to-be-tested products, and acquiring the logic relation among the to-be-tested programs.
Illustratively, the product to be tested includes A, B two programs to be tested, and the logical relationship between the programs to be tested is that the program to be tested a is tested first and then the program to be tested B is tested.
S202, acquiring the node corresponding to each program to be tested.
The program A to be tested comprises three nodes a1, a2 and a3, and the configuration sequence of the three nodes a1, a2 and a3 in the program A to be tested is a2, a1 and a 3; the program B to be tested comprises four nodes B1, B2, B3 and B4, and the configuration sequence of the four nodes B1, B2, B3 and B4 in the program B to be tested is B1, B2, B3 and B4.
S203, determining a test data generation sequence corresponding to each program to be tested according to a predetermined mapping relation between the program to be tested and the test data generation sequence.
In addition, since the test path is to test the program to be tested a first and then to test the program to be tested B, it may be set that the mapping relationship between the program to be tested and the test data generation sequence that can be predetermined according to the nodes and the program to be tested is that after the test data generation of all the nodes in the program to be tested a is completed, the test data generation of the nodes in the program to be tested B is performed. Therefore, according to the mapping relationship, the test data generation sequence corresponding to the program to be tested a and the program to be tested B is determined as follows: the program to be tested A is generated firstly, and the program to be tested B is generated later.
Step S202 and step S203 may be executed simultaneously, step S202 may be executed after step S203 is executed before step S203, or step S203 may be executed after step S202 is executed before step S203.
And S204, determining the test data generation sequence of the node corresponding to each program to be tested according to the test data generation sequence corresponding to each program to be tested.
And then determining that the test data generation sequence of the node corresponding to the program A to be tested is as follows: a2, a1, a 3; determining that the test data generation sequence of the node corresponding to the program B to be tested is as follows: b1, b2, b3 and b 4.
S205, determining a test path of each node corresponding to all the programs to be tested of the product to be tested according to a predetermined configuration sequence of the nodes in each program to be tested and a test data generation sequence of the node corresponding to each program to be tested.
Therefore, according to the sequence of the program a to be tested being in front, the sequence of the program B to be tested being in back, and the corresponding node test data generation sequence, the test path of each node corresponding to all the programs to be tested of the product to be tested is formed as follows: a2, a1, a3, b1, b2, b3 and b 4.
Specifically, the node may include child nodes, and the child nodes are processed according to a sequential relationship, which is the same as the processing manner of the node. For example, a2 also contains child nodes, a21, a22, a1, a3, b1, b2, b3, b 4.
In an embodiment of the present invention, in order to implement authority control on an issuer of a test data generation instruction and ensure operation security of a server, preferably, the test data generation instruction includes an identity of the issuer of the instruction. For example, the user account number, and the unique identifier of the client device that issued the instruction (e.g., the IMEI (international mobile Equipment Identity) code of the mobile device).
In a specific implementation manner, after receiving a test data generation instruction, an automatic test data generation program in the server analyzes whether an identity in the instruction is an authorized identity. For example, the authorized identifiers may be pre-stored, and if the identifier in the instruction is the pre-stored identifier, the identifier in the instruction is determined to be the authorized identifier.
And if the identity in the instruction is an authorized identity, sequentially selecting nodes according to a predetermined node sequence of the test path, or if the identity in the instruction is an unauthorized identity, refusing to respond to the instruction. Therefore, all the responded instructions are sent by the identity user with legal authorization, and the safety and reliability of the whole system are improved.
Therefore, by applying the embodiment of the invention, the test product is divided according to the test program, and then divided into the nodes, and then the test data of the nodes is generated according to the nodes, so that the problem that the test data of the financial software product and/or service with long interactive operation process cannot be easily generated when the test environment is unstable, and the application range of the generated test data is limited is solved.
S2, if a node is selected, inquiring mapping relation data of a node identifier and a test data generation rule in a predetermined interface file, obtaining a test data generation rule corresponding to the node, generating test data corresponding to the node according to the obtained test data generation rule, and storing a test data generation state corresponding to the node, wherein the test data generation state comprises: and completing the generation of the test data or interrupting the generation of the test data, wherein the interface file is stored in a predetermined storage unit in advance.
It should be noted that the interface file is a file stored in advance, and records a one-to-one correspondence relationship between the node identifier and the test data generation rule. It is understood that the unique correspondence between the node identifier and the node may be a unique name of the node, so that the node is uniquely determined by the node identifier, thereby forming a one-to-one correspondence between the node and its test data generation rule. Illustratively, the node identifiers corresponding to the target nodes of the product to be tested are respectively: b3, b4, b1, b2, a2, a1, a 3; in one implementation, the node identification may be a sequence number, e.g., 001, 002, corresponding to the node. In another implementation, the node identification may be a unique number corresponding to the node, e.g., jiedian001, jiedian 002. It should be noted that the node identifier may be formed by a combination of characters, letters, and numbers in other manners as long as the node can be uniquely identified.
Therefore, when a node and a test data generation rule corresponding to the node are obtained, test data of the node are directly generated, and in order to facilitate understanding of the test data generation condition of the node, recording of the node test data generation state is required in the node test data generation process.
For example, the test data generation state corresponding to each node may be stored in the oracle database, and if an interrupt occurs in the test data generation process corresponding to a node, the test data generation state corresponding to the node is an interrupt generated for the test data.
The predetermined storage device may be a storage unit in the server, or may be a storage unit communicatively connected to the server, for example, a database.
In a specific implementation of the present invention, a configuration file corresponding to a node may be determined according to predetermined mapping relationship data between the node and the configuration file; analyzing the mapping relation data of the node identification and the interface file in the determined configuration file, and determining the interface file corresponding to the node; and inquiring the mapping relation data of the node identification in the determined interface file and the test data generation rule to obtain the test data generation rule corresponding to the node.
It can be understood that the mapping relationship data records a one-to-one correspondence between each node and its corresponding configuration file, so that the configuration file can be uniquely determined according to the node, and specifically, the configuration file corresponding to the node can be determined according to the identifier of the node.
Illustratively, a node C corresponds to a configuration file D, the node C corresponds to an interface file L in the configuration file D, the interface file L includes mapping relationship data of a node identifier "C" and a test data generation rule K, after the node C is selected, the interface file L corresponding to the node C is determined by analyzing the configuration file D, and then the interface file L is queried to obtain the test data generation rule K corresponding to the node C.
It should be noted that the configuration file is a computer file, and can configure parameters and initial settings for some computer programs. The node and the interface file are connected by setting the configuration file, so that the corresponding configuration file can be automatically triggered when the node is selected, the interface file in the configuration file is started, and the relationship between the node and the interface can be modified by modifying the configuration file. For example, by setting a mandatory user configuration relationship between a node and an interface file according to the authority of an administrator, the corresponding relationship between the node and the interface file can be modified only if the administrator authority is provided. Through the embodiment of the invention, the one-to-one correspondence between the interface and the configuration file is further enhanced, and the manual misoperation change is avoided.
It should be noted that, after determining the test data generation rule corresponding to each node in the selected node, the test data of each node is generated according to the test data generation rule, and the test data generation state of the node is recorded during and/or after the test data generation is finished, so as to record whether the test data generation of the node is completed or interrupted.
In a specific implementation manner of the present invention, in the process of generating test data corresponding to the node according to the obtained test data generation rule, the number or storage capacity of the currently generated test data is obtained at preset time intervals; and calculating the test data generation progress of the node according to the acquired test data quantity and the total test data quantity corresponding to the node, or calculating the test data generation progress of the node according to the acquired test data storage capacity and the total test data storage capacity corresponding to the node, and sending the calculated test data generation progress of the node to the oracle database for storage, so that the oracle database records the test data generation state corresponding to the node according to the received test data generation progress.
Specifically, a time interval may be set, and the generated amount of the test data of the current node is collected after the time interval is ended, for example, the test data generation rule of the node C is to generate 100 pieces of test data, it is assumed that the amount of the test data acquired to generate the node C is 90 pieces after the first time interval, and the amount of the test data acquired to generate the node C is 100 pieces after the second time interval.
In another implementation, a time interval may be set, and after the time interval is ended, the storage capacity of the storage area where the test data generation amount of the current node is located is detected, for example, the data generation amount corresponding to the test data generation rule of the node D is 10M, the obtained storage capacity at the initial time is 10M, it is assumed that after the first time interval, the obtained storage capacity is 3M, and after the second time interval, the storage capacity corresponding to the node is 1M.
It can be understood that the generation progress of the test data is a ratio of the already generated test data and the corresponding test data amount in the test data generation rule of the node.
Illustratively, the test data generation schedule for node C is 100/100-100%; the test data generation schedule of the node D is (10-1)/10-90%.
It should be noted that, when the test data generation progress reaches one hundred percent, it indicates that the test data generation of the node is completed, otherwise, it indicates that the test data generation is interrupted.
It is to be understood that, in order to prevent that the information corresponding to the test data generation state cannot be acquired when the server fails to operate, the test data generation state is stored in another storage device, for example, in a database, so that the test data generation state can be directly read from the database after the server recovers the communication capability.
It should be noted that the test data generation rule is generated according to the requirement, for example, the test data generation rule is: gender is male or female, age is 0-100 years, mobile phone number is 11 digits and the first digit is 1. Specifically, in the embodiment of the present invention, the test data generation rule of a node may first determine the test data requirement of the node; and constructing a corresponding parameter configuration table according to the test data requirements, and determining the parameter configuration table as a test data generation rule.
It can be understood that the parameter configuration table is formulated according to the test requirements, the test requirements may be formulated by developers, and the parameter configuration table may further include, in addition to the rule corresponding to the requirement, an assembly of test data, a thread used for generating the test data, and a storage path of the generated test data.
Different testing requirements, such as business testing or customer information inquiry testing, etc. And according to the test data requirement information, establishing a requirement parameter configuration table, configuring different numbers and/or characters for different business meanings, such as bank codes and branch bank codes, and inputting the corresponding numbers and/or characters for representing the business meanings during testing.
In the embodiment of the invention, the test data generation rule corresponding to each node identification is pre-stored through the interface file, and the mapping relation data between the node identification and the test data generation rule is formed.
And S3, after all the nodes of the predetermined test path are selected, reading the test data generation state corresponding to the selected nodes through the predetermined data query interface, and analyzing whether the test data generation state corresponding to the selected nodes is generated and interrupted for the test data.
After the test data corresponding to the node is generated, the test data generation state is read, for example, the test data generation state corresponding to each node is read from the oracle database. Illustratively, the nodes with the test data generation progress being less than 100% are selected from the acquired test data generation states again, if such nodes exist, the test data generation interruption of the nodes exists, otherwise, the test data generation completion of all the selected nodes is indicated.
And S4, if the test data generation state corresponding to the selected node is the test data generation interruption, generating the test data corresponding to the selected node according to the test data generation rule corresponding to the selected node in which the test data generation interruption is performed according to the test data generation state.
And if the test data generation progress in the selected node is less than 100%, confirming the test data generation rule corresponding to the node again, and then continuing to automatically generate the test data of the node according to the test data generation rule.
Specifically, the server and the database query and read data through an interface in advance to realize reading of the test data generation state corresponding to each node in the selected nodes. The query condition is that all nodes with test data generation progress of not 100% are acquired, which indicates that the test data generation tasks of the nodes are not completed and the test data of the nodes needs to be regenerated.
Illustratively, if the number of selected nodes is 100, 98 nodes with a test data generation status of 100%, and if the test data generation progress of the node C is 80% and the test data generation progress of the node D is 90%, then the nodes C and D are determined as test data generation interruption nodes.
And then, obtaining the test data generation rule corresponding to the selected node C and the test data generation rule corresponding to the selected node D again. And generating test data corresponding to the node C according to the test data generation rule of the node C, and generating test data corresponding to the node D according to the test data generation rule of the node D.
It can be understood that, the number of the nodes whose test data generation states are the test data generation interruption may be one or multiple, and when the number of the nodes whose test data generation states are the test data generation interruption is multiple, if the test data generation state corresponding to a selected node is the test data generation interruption, according to the node sequence of the predetermined test path, it is determined whether there is a succeeding node after the selected node; if the subsequent nodes are sequentially selected, sequentially selecting the subsequent nodes according to the node sequence of the subsequent nodes; if a following node is selected, the step S2 is executed to generate the test data corresponding to the following node, and the test data generation status corresponding to the following node is stored.
For example, when the test data generation statuses of the selected node C and the selected node D are both test data generation interrupts, the order of the selected node C is the selected node D at the next node, and then the process goes to step S2 to sequentially generate the test data corresponding to the selected node C and the selected node D.
In one implementation mode of the invention, in order to facilitate a user to send a test data generation instruction, a selection instruction of the user for a node is received through a visual interactive operation interface, and the node selected by the selection instruction is obtained; or receiving a request message sent by a user through a client, wherein the request message contains a range of request parameters, acquiring target frame data of the request message, and determining a node corresponding to the request message from the acquired target frame data.
In an implementation manner of the invention, the visual interactive operation interface comprises a node selection control, and a user can select a node based on the node selection control.
In another implementation of the present invention, a frame structure of the request packet may be predefined, where the frame structure includes two data segments, and the data ranges corresponding to the two data segments are ranges of the request parameter, so that nodes can be interpreted from target frame data, for example, if the target frame data of each frame represents one node, then multiple nodes can be obtained.
It can be understood that a node includes a sequence number, the sequence number may be set according to a certain rule, a packet is a data transmission format performed by both parties of communication, a value range is set in some fields of the packet, for example, taking 3-bit binary data as an example, the value range of the packet is: 010-111, the 2 nd to 8 th nodes are represented, and therefore, the 2 nd to 8 th nodes are selected nodes.
In order to further improve the interaction efficiency and accuracy of the user and the server, a test data generation state display interface is generated and displayed, and the test data generation state display interface comprises a test data generation state display instruction button; and after receiving a test data generation state display instruction sent by a user through the test data generation state display instruction button, responding to the instruction, and acquiring a test data generation state corresponding to each node in a predetermined test path from a database. Specifically, the database may be an oracle database, and the test data generation state may obtain the test data generation state corresponding to each node from a node state storage file in the database, which is not described herein again.
And generating a state display diagram or a state display table in a preset format based on the acquired test data corresponding to each node. For example, the state display diagram in the preset format may be a node tree display diagram, the node order of the node tree display diagram is consistent with the node order in the test path, the nodes of the node tree display diagram correspond to the nodes in the test path in a one-to-one manner, and each node in the node tree display diagram displays test data generation state information of the corresponding node.
The invention also provides an automatic number-making breakpoint continuous making device. Referring to fig. 3, a schematic diagram of a preferred embodiment of an automatic manufacturing break point continuous manufacturing apparatus according to the present invention is shown.
In this embodiment, the automatic manufacturing break point continuous manufacturing apparatus 1 is suitable for the above automatic manufacturing break point continuous manufacturing method, and the automatic manufacturing break point continuous manufacturing apparatus 1 includes: the memory 11, the processor 12 and the network interface 13 transmit the test data of the node to the user terminal for testing through the automatic manufacturing breakpoint continuous manufacturing device 1.
The memory 11 includes at least one type of readable storage medium, which includes a flash memory, a hard disk, a multimedia card, a card type memory (e.g., SD or DX memory, etc.), a magnetic memory, a magnetic disk, an optical disk, and the like. The memory 11 may be an internal storage unit of the automatic manufacturing breakpoint continuous device 1 in some embodiments, for example, a hard disk of the automatic manufacturing breakpoint continuous device 1. The memory 11 may also be an external storage device of the automatic manufacturing and connecting device 1 in other embodiments, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like, which are provided on the automatic manufacturing and connecting device 1. Further, the memory 11 may also include both an internal storage unit and an external storage device of the automatic manufacturing breakpoint continuous manufacturing apparatus 1.
The memory 11 can be used for storing not only the application software and various data installed in the automatic configuration breakpoint continuous creation device 1, for example, the automatic configuration breakpoint continuous creation program 10 corresponding to the automatic configuration breakpoint continuous creation protocol supporting multi-party cross-platform transaction, but also temporarily storing data that has been output or will be output.
The processor 12 may be a Central Processing Unit (CPU), controller, microcontroller, microprocessor or other data Processing chip in some embodiments, and is used for running program codes or Processing data stored in the memory 11, such as the automatic manufacturing breakpoint resuming program 10.
The network interface 13 may optionally include a standard wired interface, a wireless interface (such as a WI-FI interface), and is generally used to establish a communication connection between the automatic manufacturing breakpoint continuous manufacturing apparatus 1 and other electronic devices, for example, a terminal installed with a product to be tested. The components 11 to 13 of the automatic manufacturing breakpoint continuous manufacturing device 1 communicate with each other via a communication bus.
While fig. 3 only shows the automated build break point continuum 1 with components 11-13, those skilled in the art will appreciate that the structure shown in fig. 4 does not constitute a limitation of the automated build break point continuum 1 and may include fewer or more components than shown, or some components in combination, or a different arrangement of components.
Referring to fig. 4, the user terminal 2 is a terminal connected to the apparatus 1 for automatic manufacturing breakpoint, and fig. 4 is a schematic diagram of a preferred embodiment of the user terminal 2.
In the present embodiment, the user terminal 2 may be a terminal device having a data processing function, such as a server, a smart phone, a tablet computer, a portable computer, or a desktop computer.
The user terminal 2 comprises a first memory 21, a second processor 22 and a first network interface 23, wherein the first memory 21 stores a first automatic manufacture breakpoint resuming program 20.
The first memory 21 includes at least one type of readable storage medium, which includes a flash memory, a hard disk, a multimedia card, a card type memory (e.g., SD or DX memory, etc.), a magnetic memory, a magnetic disk, an optical disk, and the like. The first memory 21 may in some embodiments be an internal storage unit of said user terminal 2, e.g. a hard disk of the user terminal 2. The first memory 21 may also be an external storage device of the user terminal 2 in other embodiments, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), etc. provided on the user terminal 2. Further, the first memory 21 may also include both an internal storage unit and an external storage device of the user terminal 2.
The first memory 21 may be used to store not only the application software installed in the user terminal 2 and various types of data, such as the first automatic manufacturing breakpoint resuming program 20, but also data that has been output or is to be output temporarily.
The first processor 22 may be a Central Processing Unit (CPU), a controller, a microcontroller, a microprocessor or other data Processing chip in some embodiments, and is used for running the program codes stored in the first memory 21 or Processing data, such as the first automatic manufacturing breakpoint resuming program 20.
The first network interface 23 may optionally comprise a standard wired interface, a wireless interface (e.g. WI-FI interface), typically used for establishing a communication connection between the user terminal 2 and other electronic devices, e.g. a user terminal of a second user. The components 21-23 of the user terminal 2 communicate with each other via a communication bus.
Fig. 4 only shows the user terminal 2 with components 21-23, and it will be understood by those skilled in the art that the structure shown in fig. 4 does not constitute a limitation of the user terminal 2, and may comprise fewer or more components than those shown, or some components may be combined, or a different arrangement of components.
Optionally, the user terminal 2 may further comprise a user interface, which may comprise a Display (Display), an input unit such as a Keyboard (Keyboard), and an optional user interface which may also comprise a standard wired interface, a wireless interface.
Alternatively, in some embodiments, the display may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, an Organic Light-Emitting Diode (OLED) touch screen, or the like. The display, which may also be referred to as a display screen or display unit, is used, among other things, for displaying information processed in the user terminal 2 and for displaying a visualized user interface.
Alternatively, in some embodiments, the display may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, an Organic Light-Emitting Diode (OLED) touch screen, or the like. The display, which may also be referred to as a display screen or display unit, is used, among other things, for displaying information processed in the user terminal 3 of the second user and for displaying a visualized user interface.
In addition, an embodiment of the present invention further provides a computer-readable storage medium, where the computer-readable storage medium includes an automatic configuration breakpoint continuous creation program 10 corresponding to the automatic configuration breakpoint continuous creation protocol supporting multi-party cross-platform transaction, and when executed by a processor, the automatic configuration breakpoint continuous creation program 10 corresponding to the automatic configuration breakpoint continuous creation protocol supporting multi-party cross-platform transaction implements the steps of the automatic configuration breakpoint continuous creation method.
The specific implementation of the computer readable storage medium of the present invention is substantially the same as the above-mentioned specific implementation of the automated manufacturing break point continuous manufacturing method, and will not be described herein again.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, apparatus, article, or method that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, apparatus, article, or method. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, apparatus, article, or method that includes the element.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium (e.g., ROM/RAM, magnetic disk, optical disk) as described above and includes instructions for enabling a terminal device (e.g., a mobile phone, a computer, a server, or a network device) to execute the method according to the embodiments of the present invention.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims (10)

1. An automatic manufacturing breakpoint continuous manufacturing method, the method comprising:
s1, after receiving the test data generation instruction, the test data automatic generation program selects nodes in sequence according to the predetermined node sequence of the test path;
s2, if a node is selected, inquiring mapping relation data of a node identifier and a test data generation rule in a predetermined interface file, obtaining a test data generation rule corresponding to the node, generating test data corresponding to the node according to the obtained test data generation rule, and storing a test data generation state corresponding to the node, wherein the test data generation state comprises: the test data generation is completed or the test data generation is interrupted, and the interface file is stored in a predetermined storage unit in advance;
s3, after all nodes of the predetermined test path are selected, reading test data generation states corresponding to the selected nodes through a predetermined data query interface, and analyzing whether the test data generation states corresponding to the selected nodes are generated and interrupted for the test data;
and S4, if the test data generation state corresponding to the selected node is the test data generation interruption, generating the test data corresponding to the selected node according to the test data generation rule corresponding to the selected node in which the test data generation interruption is performed according to the test data generation state.
2. The automated manufacturing breakpoint continuous manufacturing method of claim 1, wherein the step of determining the predetermined test path comprises:
acquiring a program to be tested of a product to be tested, and acquiring a logic relation between the programs to be tested;
acquiring a node corresponding to each program to be tested;
determining a test data generation sequence corresponding to each program to be tested according to a predetermined mapping relation between the program to be tested and the test data generation sequence;
determining a test data generation sequence of a node corresponding to each program to be tested according to the test data generation sequence corresponding to each program to be tested;
and determining a test path of each node corresponding to all the programs to be tested of the product to be tested according to a predetermined configuration sequence of the nodes in each program to be tested and a test data generation sequence of the node corresponding to each program to be tested.
3. The method as claimed in claim 2, wherein the step of querying the mapping relationship data between the node identifier in the predetermined interface file and the test data generation rule to obtain the test data generation rule corresponding to the node comprises:
determining a configuration file corresponding to a node according to predetermined mapping relation data of the node and the configuration file;
analyzing the mapping relation data of the node identification and the interface file in the determined configuration file, and determining the interface file corresponding to the node;
and inquiring the mapping relation data of the node identification in the determined interface file and the test data generation rule to obtain the test data generation rule corresponding to the node.
4. The method as claimed in claim 1, wherein the step of generating the test data corresponding to the node according to the obtained test data generation rule and storing the test data generation state corresponding to the node comprises:
in the process of generating test data corresponding to the node according to the acquired test data generation rule, acquiring the quantity or storage capacity of the currently generated test data at preset time intervals;
and calculating the test data generation progress of the node according to the acquired test data quantity and the total test data quantity corresponding to the node, or calculating the test data generation progress of the node according to the acquired test data storage capacity and the total test data storage capacity corresponding to the node, and sending the calculated test data generation progress of the node to the oracle database for storage, so that the oracle database records the test data generation state corresponding to the node according to the received test data generation progress.
5. The method for automatically manufacturing breakpoints according to claim 1, wherein the test data generation rule corresponding to a node is determined according to the following steps:
determining the test data requirement of the node;
and constructing a corresponding parameter configuration table according to the test data requirements, and determining the parameter configuration table as a test data generation rule.
6. The automated manufacturing breakpoint continuous manufacturing method of claim 1, further comprising:
if the test data generation state corresponding to one selected node is test data generation interruption, determining whether a subsequent node in the sequence is left behind the selected node according to the node sequence of the predetermined test path;
if the subsequent nodes are sequentially selected, sequentially selecting the subsequent nodes according to the node sequence of the subsequent nodes;
if a following node is selected, the step S2 is executed to generate the test data corresponding to the following node, and the test data generation status corresponding to the following node is stored.
7. The automated manufacturing breakpoint continuous manufacturing method according to any one of claims 1-6, further comprising:
receiving a selection instruction of a user for a node through a visual interactive operation interface, and acquiring the node selected by the selection instruction;
or receiving a request message sent by a user through a client, wherein the request message contains a range of request parameters, acquiring target frame data of the request message, and determining a node corresponding to the request message from the acquired target frame data.
8. The automated manufacturing breakpoint continuous manufacturing method of claim 7, wherein the method further comprises:
generating and displaying a test data generation state display interface, wherein the test data generation state display interface comprises a test data generation state display instruction button;
after a test data generation state display instruction sent by a user through the test data generation state display instruction button is received, responding to the instruction, and acquiring a test data generation state corresponding to each node in a predetermined test path from a database;
and generating a state display diagram or a state display table in a preset format based on the acquired test data corresponding to each node.
9. An automatic manufacturing breakpoint continuous manufacturing device is characterized in that the automatic manufacturing breakpoint continuous manufacturing device comprises a memory and a processor, wherein the memory stores an automatic manufacturing breakpoint continuous manufacturing program, and the automatic manufacturing breakpoint continuous manufacturing program can realize the following steps when being executed by the processor:
s1, after receiving the test data generation instruction, the test data automatic generation program selects nodes in sequence according to the predetermined node sequence of the test path;
s2, if a node is selected, inquiring mapping relation data of a node identifier and a test data generation rule in a predetermined interface file, obtaining a test data generation rule corresponding to the node, generating test data corresponding to the node according to the obtained test data generation rule, and storing a test data generation state corresponding to the node, wherein the test data generation state comprises: the test data generation is completed or the test data generation is interrupted, and the interface file is stored in a predetermined storage unit in advance;
s3, after all nodes of the predetermined test path are selected, reading test data generation states corresponding to the selected nodes through a predetermined data query interface, and analyzing whether the test data generation states corresponding to the selected nodes are generated and interrupted for the test data;
s4, if the test data generation state corresponding to a selected node is the test data generation interruption, generating the test data corresponding to the selected node according to the test data generation rule corresponding to the selected node in which the test data generation interruption is performed according to the test data generation state;
and any step corresponding to the automatic manufacturing breakpoint continuous manufacturing method.
10. A computer-readable storage medium, comprising an automated manufacturing breakpoint remanufacturing program, wherein the automated manufacturing breakpoint remanufacturing program, when executed by a processor, is configured to implement the steps of the automated manufacturing breakpoint remanufacturing method of any one of claims 1 to 8.
CN202010040828.5A 2020-01-15 2020-01-15 Method and device for automatic number-making breakpoint continuous making and computer readable storage medium Pending CN111258896A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113064829A (en) * 2021-04-13 2021-07-02 上海浦东发展银行股份有限公司 Test data life tree structure based on credit card core and data generation method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113064829A (en) * 2021-04-13 2021-07-02 上海浦东发展银行股份有限公司 Test data life tree structure based on credit card core and data generation method
CN113064829B (en) * 2021-04-13 2023-03-10 上海浦东发展银行股份有限公司 Test data life tree structure based on credit card core and data generation method

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