CN111258056A - Model scanning device and correction method thereof - Google Patents
Model scanning device and correction method thereof Download PDFInfo
- Publication number
- CN111258056A CN111258056A CN201811453610.1A CN201811453610A CN111258056A CN 111258056 A CN111258056 A CN 111258056A CN 201811453610 A CN201811453610 A CN 201811453610A CN 111258056 A CN111258056 A CN 111258056A
- Authority
- CN
- China
- Prior art keywords
- module
- sampling
- angle
- reference surface
- scanning device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/10—Scanning systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention provides a model scanning device and a correction method thereof. The model scanning device comprises a bearing module, a projection module and a sampling module. The bearing module is arranged on the device main body of the model scanning device. The projection module is arranged on the device main body of the model scanning device and is positioned above the bearing module. The sampling module is adjustably arranged on a positioning frame of an extension arm of the model scanning device so as to be obliquely oriented to the bearing module. The setting position of the sampling module on the positioning frame is determined according to the sampling focal length of the sampling module. Therefore, the model scanning device and the correction method thereof can provide convenient and accurate scanning effect.
Description
Technical Field
The present invention relates to a scanning technique, and more particularly, to a model scanning apparatus and a calibration method thereof.
Background
As the need for stereo modeling increases (e.g., modeling of dental models), various model scanning devices have been developed. However, the conventional scanning probe is mostly disposed in parallel and adjacent to the model object and is limited by the three-dimensional spatial position and the shielding of the peripheral devices, so that a dead angle is easily generated during the scanning process, and a complete image of the outline of the model object cannot be obtained. Moreover, the conventional model scanning device also has the disadvantage of excessively complicated machine structure, which results in high manufacturing cost. In view of the above, how to develop a model scanning device that can provide convenient and accurate scanning effect will be proposed as follows.
Disclosure of Invention
The invention provides a model scanning device and a correction method thereof, which can dynamically adjust the sampling position through a sampling module according to the specific sampling focal length corresponding to various model objects so as to provide convenient and accurate scanning effect.
The model scanning device comprises a bearing module, a projection module and a sampling module. The bearing module is arranged on the device main body of the model scanning device. The projection module is arranged on the device main body of the model scanning device and is positioned above the bearing module. The sampling module is adjustably arranged on a positioning frame of an extension arm of the model scanning device so as to be obliquely oriented to the bearing module. The setting position of the sampling module on the positioning frame is determined according to the sampling focal length of the sampling module.
In an embodiment of the invention, the sampling module positions the sampling angle through the included angle fixture. The included angle jig is arranged on the positioning frame and is positioned between the sampling module and the extension arm. The first side and the second side of the included angle jig respectively abut against the sampling module and the extension arm. The sampling path of the sampling module is aligned with the bearing module. The first side of the included angle jig is opposite to the second side. The first side of the included angle jig is not parallel to the second side.
In an embodiment of the invention, the sampling angle is an angle between a projection path from the projection module to the carrier module and a sampling path from the sampling module to the carrier module.
In an embodiment of the invention, the sampling module performs focusing through a focusing fixture. The focusing fixture is arranged on the bearing module so that the projection path is perpendicular to the first reference surface of the focusing fixture. The sampling path is perpendicular to the second reference surface of the focusing jig. The first reference surface of the focusing jig is adjacent to the second reference surface. The first reference plane is parallel to the horizontal plane.
In an embodiment of the invention, a first angle is formed between the first side and the second side of the angle-adjusting fixture. A second angle is formed between the first reference surface and the second reference surface of the focusing jig. The first angle is equal to the sampling angle. The first angle is complementary to the second angle.
In an embodiment of the invention, the model scanning apparatus further includes a processor. The processor is coupled to the carrying module, the projection module and the sampling module. The processor is used for controlling the bearing module, the projection module and the sampling module. When the model scanning device executes the correction operation, the processor projects the correction graph image to the first reference surface and the second reference surface of the focusing jig through the projection module, so that the setting position of the sampling module on the positioning frame is determined according to the correction graph image projected on the second reference surface.
In an embodiment of the invention, a projection focal length of the projection module is determined according to the corrected graphic image projected on the first reference surface.
In an embodiment of the invention, the sampling module includes a fixed focus lens.
In an embodiment of the invention, the carrier module includes a planar rotation mechanism and a vertical rotation mechanism. When the model scanning device executes the model scanning operation, the plane rotating mechanism and the vertical rotating mechanism of the bearing module are used for rotating, so that the sampling module can sample the model object arranged on the bearing module at multiple angles.
The correction method of the invention is suitable for a model scanning device. The model scanning device comprises a bearing module, a projection module and a sampling module. The projection module is arranged above the bearing module. The sampling module is arranged on a positioning frame of an extension arm of the model scanning device so as to face the bearing module in an inclined manner. The correction method comprises the following steps: arranging an included angle jig on the positioning frame and between the sampling module and the extension arm so as to position the sampling angle of the sampling module through the included angle jig; respectively abutting the first side and the second side of the included angle jig against the sampling module and the extension arm so as to align the sampling path of the sampling module to the bearing module; and determining the setting position of the sampling module on the positioning frame according to the sampling focal length of the sampling module.
In an embodiment of the invention, the first side of the angle fixture is opposite to the second side. The first side of the included angle jig is not parallel to the second side.
In an embodiment of the invention, the sampling angle is an angle between a projection path from the projection module to the carrier module and a sampling path from the sampling module to the carrier module.
In an embodiment of the invention, the calibration method further includes: the focusing jig is arranged on the bearing module to focus the sampling module, so that the projection path is perpendicular to a first reference surface of the focusing jig, and the sampling path is perpendicular to a second reference surface of the focusing jig. The first reference surface of the focusing jig is adjacent to the second reference surface. The first reference plane is parallel to the horizontal plane.
In an embodiment of the invention, a first angle is formed between the first side and the second side of the angle-adjusting fixture. A second angle is formed between the first reference surface and the second reference surface of the focusing jig. The first angle is equal to the sampling angle. The first angle is complementary to the second angle.
In an embodiment of the invention, the calibration method further includes: when the model scanning device executes the correction operation, the processor projects a correction graph image to a first reference surface and a second reference surface of the focusing jig through the projection module; and determining the setting position of the sampling module on the positioning frame according to the corrected graph image projected on the second reference surface.
In an embodiment of the invention, the calibration method further includes: determining the projection focal length of the projection module according to the corrected image projected on the first reference surface.
In an embodiment of the invention, the sampling module includes a fixed focus lens.
In an embodiment of the invention, the carrier module includes a planar rotation mechanism and a vertical rotation mechanism. When the model scanning device executes the model scanning operation, the plane rotating mechanism and the vertical rotating mechanism of the bearing module are used for rotating, so that the sampling module can sample the model object arranged on the bearing module at multiple angles.
Based on the above, the model scanning device and the calibration method thereof of the present invention can calibrate the setting position of the sampling module correctly by matching the angle fixture and the focusing fixture, so that the sampling module can be set corresponding to the correct sampling focal length, thereby providing an accurate scanning effect.
In order to make the aforementioned and other features and advantages of the invention more comprehensible, embodiments accompanied with figures are described in detail below.
Drawings
FIG. 1 is a functional circuit diagram of a model scanning apparatus according to an embodiment of the present invention;
FIG. 2 is a block diagram of a model scanning apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic view of a spacer according to an embodiment of the invention. (ii) a
FIG. 4 is a schematic illustration of a model scanning apparatus in accordance with an embodiment of the present invention in position;
FIG. 5 is a schematic diagram illustrating a model object and a focusing fixture in a ratio according to an embodiment of the invention;
FIG. 6 is a flow chart of a calibration method according to an embodiment of the invention.
The reference numbers illustrate:
100. 200, 400: model scanning device
110: processor with a memory having a plurality of memory cells
120. 220, 420: projection module
130. 230, 430: sampling module
140. 240, 440: bearing module
201. 401: device body
202. 402, a step of: extension arm
203. 403: positioning frame
203 h: slotted hole
231. 431 and 451: fixing piece
450: included angle jig
460: focusing jig
510: object model
520: fixed seat
B1: first side
B2: second side
D1, D2, D3: direction of rotation
S1: first reference surface
S2: second reference plane
S610 to S660: step (ii) of
SP: sampling path
PP: projection path
h: height
α, theta 1, theta 2
Detailed Description
In order that the present invention may be more readily understood, the following detailed description is provided as an illustration of specific embodiments of the invention. Further, wherever possible, the same reference numbers will be used throughout the drawings and the description to refer to the same or like parts.
FIG. 1 is a functional circuit diagram of a model scanning apparatus according to an embodiment of the present invention. Referring to fig. 1, the model scanning apparatus 100 includes a processor 110, a projection module 120, a sampling module 130, and a carrying module 140. The processor 110 is coupled to the projection module 120, the sampling module 130 and the carrying module 140. In the present embodiment, the model scanning apparatus 100 is used for performing a model scanning operation on a model object mounted on the carrying module 140 to perform a three-dimensional modeling. The processor 110 of the model scanning device 100 may perform the calibration operation as well as the scanning operation.
Specifically, in the calibration operation, the processor 110 is configured to output control signals to operate the projection module 120, the sampling module 130 and the carrying module 140. The processor 110 can operate the projection module 120 to project a corrected graphic image (e.g., an image with a grid graphic) to a focusing fixture mounted on the carrier module 140, and operate the sampling module 130 to sample the corrected graphic image, so as to compare the corrected graphic image projected by the projection module 120 with the sampling result of the sampling module 130 for correction. In the model scanning operation, the processor 110 may operate the carrier module 140 to perform position transformation and perform sampling through the sampling module 130 to obtain a plurality of model images with different viewing angles. The processor 110 may then analyze and model the plurality of model images from different perspectives.
In the embodiment, the Processor 110 includes, for example, a Central Processing Unit (CPU), an Image Signal Processor (ISP), a System On Chip (SOC) or other programmable general purpose or special purpose microprocessor (microprocessor), a Digital Signal Processor (DSP), a programmable controller, an Application Specific Integrated Circuit (ASIC), a Programmable Logic Device (PLD), other similar Processing devices, or a combination thereof. Also, in one embodiment, the processor 110 may be further coupled to a memory module (memory). The storage module can store data required or generated by the projection module, the sampling module, the image analysis correlation operation module, and the like, which are used for implementing the present invention, and the present invention is not limited thereto.
In the present embodiment, the projection module 120 includes a projector (projector), for example. In the present embodiment, the sampling module 130 includes an image capturing element such as a Charge Coupled Device (CCD) sensor or a Complementary Metal Oxide Semiconductor (CMOS) sensor. In the present embodiment, the carrier module 140 includes a planar rotation mechanism and a vertical rotation mechanism, for example. In other words, when the sampling module 130 is in a fixed state and the carrying module 140 is in a state capable of performing multi-angle change, the sampling module 130 can perform multi-angle sampling on the model object disposed on the carrying module 140 when the sampling module 130 performs sampling on the carrying module 140.
In addition, in an embodiment, during the sampling process of the sampling module 130, the projection module 120 may simultaneously project the structured light to the model object, so as to facilitate the processor 110 to perform subsequent model image sampling, analysis and processing, thereby effectively establishing an accurate three-dimensional object model corresponding to the physical model object, so that a user can conveniently modify and draw the three-dimensional object model through the related three-dimensional model drawing software.
FIG. 2 is a block diagram of a model scanning apparatus according to an embodiment of the present invention. FIG. 3 is a schematic view of a spacer according to an embodiment of the invention. Referring to fig. 2 and 3, the model scan apparatus 200 may have a functional circuit architecture as the model scan apparatus 100 of the embodiment of fig. 1. In the present embodiment, the carrying module 240 is disposed on the apparatus main body 201 of the model scanning apparatus 200. The projection module 220 is disposed on the apparatus main body 201 of the model scanning apparatus 200 and above the carrying module 240. The carrying surface of the carrying module 240 is, for example, parallel to a horizontal plane formed by the first direction D1 and the second direction D2, and the projection light of the projection module 220 can be vertically projected to the carrying module 240 through the projection path PP. The projected path PP is parallel to the third direction D3. The first direction D1, the second direction D2, and the third direction D3 are perpendicular to each other.
As shown in FIG. 3, the positioning frame 203 has an S-shaped slot 203h design for the sampling module 230 to selectively adjust the position of the positioning frame 203 disposed on the extension arm 202 of the model scanning apparatus 200 and to tilt toward the carrying module 240. the sampling module 230 is locked on the positioning frame 203 via a fixing member 231. in the present embodiment, the position of the sampling module 230 on the positioning frame 203 is determined according to the sampling focal length of the sampling module 230. the sampling module 230 can sample the model object image on the carrying module 240 via a sampling path SP. in the present embodiment, a sampling angle α is defined between the projection path PP and the sampling path SP. it is noted that the sampling focal length of the sampling module 230 is determined according to the model structure and the model size of the model object disposed on the carrying module 240. in other words, the model scanning apparatus 200 of the present embodiment is suitable for various model object types with different model structures and different model sizes to correspondingly adjust the position of the sampling module 230 on the positioning frame 203. therefore, the model scanning apparatus 200 of the present embodiment can provide flexible and accurate model scanning effect.
In addition, in the present embodiment, the carrying module 240 may further include a planar rotating mechanism (not shown) and a vertical rotating mechanism (not shown). When the model scanning device 200 performs the model scanning operation, the plane rotation mechanism and the vertical rotation mechanism of the carrying module 240 are used to rotate the model object, so that the sampling module 230 can sample the model object disposed on the carrying module 240 at multiple angles to obtain multiple model images with different viewing angles for three-dimensional modeling.
FIG. 4 is a schematic diagram of a model scanning apparatus for positioning, in accordance with an embodiment of the present invention. FIG. 5 is a schematic diagram illustrating a ratio of a model object to a focusing fixture according to an embodiment of the invention. Referring to fig. 4 and 5, the model scanning apparatus 400 may have a functional circuit architecture as the model scanning apparatus 400 of the embodiment of fig. 1. In the present embodiment, the carrier module 440 is disposed on the apparatus main body 401 of the model scanning apparatus 400. The projection module 420 is disposed on the apparatus body 401 of the model scanning apparatus 400 and above the carrying module 440. The carrying surface of the carrier module 440 is, for example, parallel to a horizontal plane formed by the first direction D1 and the second direction D2, and the projection light of the projection module 420 can be vertically projected to the carrier module 440 through the projection path PP. Moreover, in the present embodiment, the sampling module 430 may include a fixed focus lens. In other words, the sampling module 430 has a specific focus distance with the object model.
In the present embodiment, when the model scanning apparatus 400 performs the calibration operation, the model scanning apparatus 400 may be matched with the angle fixture 450 to position the sampling angle (e.g., the angle α of fig. 2), the sampling module 430 is fixed on the positioning frame 403 via the fixing member 431, the angle fixture 450 is disposed on the positioning frame 403 and located between the sampling module 430 and the extension arm 402, the angle fixture 450 is fixed on the positioning frame 403 via the fixing member 451, in the present embodiment, the first side B1 and the second side B2 of the angle fixture 450 respectively abut against the sampling module 430 and the extension arm 402, the sampling path SP of the sampling module 430 is aligned with the carrying module 440, the first side B1 of the angle fixture 450 is opposite to the second side B2, and the first side B1 of the angle fixture 450 is not parallel to the second side B2. in the present embodiment, the first angle θ 1 is provided between the first side B1 and the second side B2 of the angle fixture 450, and the first angle θ 1 is equal to the sampling angle.
In the present embodiment, when the model scanning device 400 performs the calibration operation, the sampling module 430 of the model scanning device 400 focuses through the focusing fixture 460. The focusing fixture 460 is disposed on the carrying module 440, so that the projection path PP is perpendicular to the first reference surface S1 of the focusing fixture 460. The sampling path SP is perpendicular to the second reference surface S2 of the focusing jig 460. The first reference surface S1 of the focusing jig 460 is adjacent to the second reference surface S2, and the first reference surface S1 is parallel to the horizontal plane. In the present embodiment, the first reference surface S1 and the second reference surface S2 of the focusing fixture 460 have a second angle θ 2 therebetween, and the first angle θ 1 is complementary to the second angle θ 2.
As shown in fig. 5, the focusing fixture 460 is correspondingly designed according to the corresponding object model 510. The object model 510 can be fixed on the fixing base 520 and placed on the carrying module 440. The object model 510 is, for example, a dental model. The object model 510 is fixed on the fixing base 520. In the present embodiment, the overall height of the focusing fixture 460, the object model 510 and the fixing base 520 is the same as the height h of the focusing fixture 460. In other words, after the model scanning device 400 is calibrated by the focusing fixture 460, the sampling module 430 can accurately focus on the arch position of the tooth model.
In the present embodiment, when the model scanning device 400 performs the calibration operation, the model scanning device 400 can project a calibration pattern image (e.g., an image with a grid pattern) to the first reference surface S1 and the second reference surface S2 of the focusing fixture 460 through the projection module 420. Then, the sampling module 430 can sample the image of the focusing fixture 460 for auto-focusing. The sampling module 430 and the focusing fixture 460 have a fixed specific focusing distance therebetween. The sampling module 430 can determine whether the obtained corrected image is clear or not to know whether the installation position is correct or not. That is, in the present embodiment, the setting position of the sampling module 430 on the positioning frame 403 can be correspondingly corrected according to the calibration pattern image projected on the second reference surface S2, and the projection focal length of the projection module 420 can be correspondingly corrected according to the calibration pattern image projected on the first reference surface S1.
However, in the embodiment, the projection focal length of the projection module 420 can be adjusted manually by a user or automatically focused according to the sampling result of the sampling module 430, and the invention is not limited thereto. In addition, in an embodiment, the corrected graphic image projected to the second reference surface S2 by the projection module 420 may further include a reference line having a scale value, for example. Therefore, after the sampling module 430 samples, the processor of the model scanning device 400 can perform image determination to determine whether the sampled image sampled by the sampling module 430 is clear and whether the sampling position is correct. Therefore, the model scanning device 400 of the present embodiment can effectively calibrate the projection module 420 and the sampling module 430 by matching the angle fixture 450 and the focusing fixture 460, so that the model scanning device 400 can provide an accurate scanning effect.
FIG. 6 is a flow chart of a calibration method according to an embodiment of the invention. Referring to fig. 4 and fig. 6, the calibration method of the present embodiment can be at least applied to the model scanning apparatus 400 of the embodiment of fig. 4, so that the model scanning apparatus 400 performs the following steps S610 to S660. In step S610, the user sets the angle fixture 450 on the positioning frame 403 and between the sampling module 430 and the extension arm 402. In step S620, the user pushes the first side B1 and the second side B2 of the angle fixture 450 against the sampling module 430 and the extension arm 402, respectively, so as to align the sampling path SP of the sampling module 430 with the carrier module 440. In step S630, the user sets the focusing fixture 460 on the carrying module 440 such that the projection path PP is perpendicular to the first reference surface S1 of the focusing fixture 460 and the sampling path SP is perpendicular to the second reference surface S2 of the focusing fixture 460. In step S640, the model scanning device 400 projects the corrected graphic image to the first reference surface S1 and the second reference surface S2 of the focusing fixture 460 through the projection module 420. In step S650, the model scanning device 400 determines the position of the sampling module 430 on the positioning frame 403 according to the calibration pattern image projected on the second reference plane S2. In step S660, the model scanning device 400 determines the projection focal length of the projection module 420 according to the corrected image projected on the first reference surface S1. Therefore, the calibration method of the present embodiment can effectively calibrate the model scanning apparatus 400, so that the model scanning apparatus 400 can provide an accurate scanning effect.
In addition, for other circuit element features, specific technical details and related implementations of the model scanning apparatus 400 of the present embodiment, reference may be made to the contents of the embodiments of fig. 1 to 5 to obtain sufficient teaching, suggestion and implementation descriptions, and thus, no further description is provided.
In summary, the model scanning apparatus and the calibration method thereof of the present invention can flexibly adjust the position of the sampling module according to the corresponding model object structure and the object size by matching the angle fixture and the focusing fixture. In addition, the model scanning device of the invention can effectively carry out respective focusing operations of the projection module and the sampling module through the focusing fixture. Therefore, the model scanning device and the correction method thereof can quickly correct the model scanning device corresponding to various model objects and can provide convenient and accurate scanning effect.
Although the present invention has been described with reference to the above embodiments, it should be understood that various changes and modifications can be made therein by those skilled in the art without departing from the spirit and scope of the invention.
Claims (18)
1. A model scanning apparatus, comprising:
the bearing module is arranged on the device main body of the model scanning device;
the projection module is arranged on the device main body of the model scanning device and is positioned above the bearing module; and
the sampling module is adjustably arranged on a positioning frame of an extension arm of the model scanning device so as to obliquely face the bearing module, and the arrangement position of the sampling module on the positioning frame is determined according to the sampling focal length of the sampling module.
2. The model scanning device of claim 1, wherein the sampling module is positioned at a sampling angle by an angle fixture, the angle fixture being disposed on the positioning frame and between the sampling module and the extension arm,
wherein the first side and the second side of the angle jig respectively lean against the sampling module and the extension arm, and the sampling path of the sampling module is aligned with the bearing module,
wherein the first side of the included angle jig is opposite to the second side, and the first side of the included angle jig is not parallel to the second side.
3. The model scanning device of claim 2, wherein the sampling angle is an angle between a projection path between the projection module to the carrier module and the sampling path between the sampling module to the carrier module.
4. The model scanning device of claim 3, wherein the sampling module is focused by a focusing fixture disposed on the carrier module such that the projection path is perpendicular to a first reference surface of the focusing fixture and the sampling path is perpendicular to a second reference surface of the focusing fixture,
wherein the first reference surface of the focusing jig is adjacent to the second reference surface.
5. The model scanning device of claim 4, wherein the angled jig has a first angle between the first side and the second side and the focusing jig has a second angle between the first reference surface and the second reference surface,
wherein the first angle is equal to the sampling angle and the first angle is complementary to the second angle.
6. The model scanning device of claim 5, further comprising:
a processor coupled to the carrying module, the projection module and the sampling module for controlling the carrying module, the projection module and the sampling module,
when the model scanning device executes the correction operation, the processor projects a correction graph image to the first reference surface and the second reference surface of the focusing jig through the projection module, so that the setting position of the sampling module on the positioning frame is determined according to the correction graph image projected on the second reference surface.
7. The model scanning device as claimed in claim 6, wherein the projection focal length of the projection module is determined according to the corrected pattern image projected on the first reference surface.
8. The model scanning device of claim 1, wherein the sampling module comprises a fixed focus lens.
9. The model scanning device as claimed in claim 1, wherein the carrying module comprises a plane rotation mechanism and a vertical rotation mechanism, the plane rotation mechanism and the vertical rotation mechanism of the carrying module are configured to rotate when the model scanning device performs a model scanning operation, so that the sampling module samples the model object disposed on the carrying module at multiple angles.
10. A correction method is suitable for a model scanning device, the model scanning device comprises a bearing module, a projection module and a sampling module, wherein the projection module is arranged above the bearing module, and the sampling module is arranged on a positioning frame of an extension arm of the model scanning device so as to obliquely face the bearing module, and the correction method comprises the following steps:
arranging an included angle jig on the positioning frame and between the sampling module and the extension arm so as to position the sampling angle of the sampling module through the included angle jig;
respectively abutting the first side and the second side of the included angle jig against the sampling module and the extension arm so as to align the sampling path of the sampling module to the bearing module; and
and determining the setting position of the sampling module on the positioning frame according to the sampling focal length of the sampling module.
11. The correction method of claim 10, wherein the first side of the angle jig is opposite to the second side, and the first side of the angle jig is not parallel to the second side.
12. The calibration method of claim 11, wherein the sampling angle is an angle between a projection path from the projection module to the carrier module and the sampling path from the sampling module to the carrier module.
13. The correction method according to claim 12, further comprising:
and arranging a focusing jig on the bearing module to focus the sampling module so that the projection path is perpendicular to a first reference surface of the focusing jig, and the sampling path is perpendicular to a second reference surface of the focusing jig, wherein the first reference surface of the focusing jig is adjacent to the second reference surface.
14. The calibration method of claim 13, wherein the first side and the second side of the angled jig have a first angle therebetween and the first reference surface and the second reference surface of the focusing jig have a second angle therebetween, wherein the first angle is equal to the sampling angle and the first angle and the second angle are complementary.
15. The correction method according to claim 14, further comprising:
when the model scanning device executes correction operation, projecting a correction graph image to the first reference surface and the second reference surface of the focusing jig through the projection module by the processor; and
and determining the setting position of the sampling module on the positioning frame according to the corrected graph image projected on the second reference surface.
16. The correction method according to claim 15, further comprising:
and determining the projection focal length of the projection module according to the corrected graph image projected on the first reference surface.
17. The calibration method of claim 10, wherein the sampling module comprises a fixed focus lens.
18. The calibration method as claimed in claim 10, wherein the carrier module comprises a plane rotation mechanism and a vertical rotation mechanism, and when the model scanning device performs a model scanning operation, the plane rotation mechanism and the vertical rotation mechanism of the carrier module are configured to rotate, so that the sampling module samples the model object disposed on the carrier module at multiple angles.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811453610.1A CN111258056B (en) | 2018-11-30 | 2018-11-30 | Model scanning device and correction method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811453610.1A CN111258056B (en) | 2018-11-30 | 2018-11-30 | Model scanning device and correction method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111258056A true CN111258056A (en) | 2020-06-09 |
| CN111258056B CN111258056B (en) | 2022-05-31 |
Family
ID=70953602
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811453610.1A Active CN111258056B (en) | 2018-11-30 | 2018-11-30 | Model scanning device and correction method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111258056B (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08152679A (en) * | 1994-11-29 | 1996-06-11 | Fuji Photo Film Co Ltd | Microfilm scanner |
| TW563335B (en) * | 2002-05-10 | 2003-11-21 | Veutron Corp | Focus searching method of image scanning device |
| TW576729B (en) * | 2003-06-12 | 2004-02-21 | Univ Nat Taipei Technology | Apparatus and technique for automatic 3-D dental data required for crown reconstruction |
| TWI239426B (en) * | 2004-08-05 | 2005-09-11 | Asia Tech Image Inc | Image sensor |
| CN104574292A (en) * | 2014-11-26 | 2015-04-29 | 沈阳东软医疗***有限公司 | CT image correcting method and device |
| CN104715219A (en) * | 2013-12-13 | 2015-06-17 | 三纬国际立体列印科技股份有限公司 | Scanning device |
| CN108478188A (en) * | 2018-02-12 | 2018-09-04 | 苏州佳世达电通有限公司 | The stereo object scanning means being scanned with structure light |
-
2018
- 2018-11-30 CN CN201811453610.1A patent/CN111258056B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08152679A (en) * | 1994-11-29 | 1996-06-11 | Fuji Photo Film Co Ltd | Microfilm scanner |
| TW563335B (en) * | 2002-05-10 | 2003-11-21 | Veutron Corp | Focus searching method of image scanning device |
| TW576729B (en) * | 2003-06-12 | 2004-02-21 | Univ Nat Taipei Technology | Apparatus and technique for automatic 3-D dental data required for crown reconstruction |
| TWI239426B (en) * | 2004-08-05 | 2005-09-11 | Asia Tech Image Inc | Image sensor |
| CN104715219A (en) * | 2013-12-13 | 2015-06-17 | 三纬国际立体列印科技股份有限公司 | Scanning device |
| CN104574292A (en) * | 2014-11-26 | 2015-04-29 | 沈阳东软医疗***有限公司 | CT image correcting method and device |
| CN108478188A (en) * | 2018-02-12 | 2018-09-04 | 苏州佳世达电通有限公司 | The stereo object scanning means being scanned with structure light |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111258056B (en) | 2022-05-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10187636B2 (en) | Active lens alignment system | |
| US8885040B2 (en) | Method and apparatus for 3-dimensional vision and inspection of ball and like protrusions of electronic components | |
| US20070165131A1 (en) | System and method for measuring tilt of a sensor die with respect to the optical axis of a lens in a camera module | |
| TW201109645A (en) | Substrate inspecting method, substrate inspecting device and storage medium | |
| TWI808265B (en) | Deep learning based adaptive regions of interest for critical dimension measurements of semiconductor substrates | |
| CN109348129A (en) | A kind of the clarity detection method and system of cameras with fixed focus | |
| JP2002310929A (en) | Defect inspecting device | |
| JP2001281049A (en) | Measuring device and method for view angle dependency and location dependency of luminance | |
| US20070133969A1 (en) | System and method for measuring and setting the focus of a camera assembly | |
| CN103247548B (en) | A kind of wafer defect checkout gear and method | |
| CN111258056B (en) | Model scanning device and correction method thereof | |
| JP2623367B2 (en) | Calibration method of three-dimensional shape measuring device | |
| JPH1027839A (en) | Wafer rotating direction detecting method | |
| JP5531883B2 (en) | Adjustment method | |
| TWI686586B (en) | Model scanning device and calibration method thereof | |
| JPH11326229A (en) | Foreign matter inspection apparatus | |
| JP2010243212A (en) | Tilt detection method and device of the same | |
| JP2008241716A (en) | Device and method for surface inspection | |
| JP3730982B2 (en) | projector | |
| KR101974541B1 (en) | Inspection apparatus for lens | |
| JP7146528B2 (en) | Substrate inspection device, substrate processing device, substrate inspection method, and substrate processing method | |
| US11875536B1 (en) | Localization of lens focus parameter estimation and subsequent camera calibration | |
| CN216599866U (en) | Lens mounting structure for image chip test and image chip test device | |
| JP2005024618A (en) | Projector having tilt angle measuring instrument | |
| WO2021114090A1 (en) | Cell image analysis device and camera installation parallelism checking method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |