CN111257001A - Ring probe and combined probe - Google Patents
Ring probe and combined probe Download PDFInfo
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- CN111257001A CN111257001A CN202010118008.3A CN202010118008A CN111257001A CN 111257001 A CN111257001 A CN 111257001A CN 202010118008 A CN202010118008 A CN 202010118008A CN 111257001 A CN111257001 A CN 111257001A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M15/00—Testing of engines
- G01M15/14—Testing gas-turbine engines or jet-propulsion engines
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M15/00—Testing of engines
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Abstract
The invention provides an annular probe and a combined probe, and relates to the technical field of vacuum plume parameter detection, wherein the annular probe comprises a limiting mechanism, a first collector and a conductive component, wherein the first collector and the conductive component are both used for being connected with a power supply; the conductive assembly is sleeved outside the limiting mechanism and provided with an installation channel; the first collector is positioned in the mounting channel, an insulating layer is arranged between the first collector and the conductive assembly, and the first collector is provided with a strip-shaped collecting surface used for collecting ions in a flow field. The annular probe provided by the invention can eliminate the terminal effect of the first collector and ensure the accuracy of the obtained data.
Description
Technical Field
The invention relates to the technical field of vacuum plume parameter detection, in particular to an annular probe and a combined probe.
Background
The electric thrusters such as the ion thruster and the Hall thruster are widely applied to attitude and orbit control of the spacecraft due to the advantages of high specific impulse, long service life, small system quality and the like. The accurate acquisition of the vacuum plume parameters of the electric thruster is crucial to the evaluation of the performances of the electric thruster and the spacecraft. In order to accurately evaluate the plume effect of the electric thruster, comprehensive diagnostic tests must be performed from the aspects of ion current density distribution, plasma basic parameters, ion energy distribution and the like.
Faraday probes are often applied to beam ion characteristic tests due to their unique properties to calculate parameters such as beam ion current density, beam divergence angle, and the like. The faraday probes today are divided into several forms, among which the bare faraday probes are well developed and used. As a commonly used bare probe, a planar faraday probe is a planar conductor exposed to the plasma current, and after a suitable negative potential is applied to the conductor, the probe repels electrons and collects only the ion flow that reaches its surface, and the current density is calculated as follows:
j＝I/Ap
in the formula: j-the collection current density in units of A/m 2;
I-Current, in units of A;
ap-collector area, in m 2.
Basic parameters of a plume plasma are electron temperature, electron density and plasma potential. Langmuir probes are the most commonly used plasma diagnostic methods. The probe is simple in structure, easy to realize, rich in information quantity and capable of providing basic parameter information such as electron temperature and electron number density. The shape of the Langmuir probe is cylindrical, spherical and plane, wherein the cylindrical probe obtains a lot of information and is commonly used for measuring electron density; the planar probe is easy to control the influence of plasma flow velocity, and the collection area is fixed, so the planar probe is commonly used for measuring the electron temperature.
The testing of plasma properties may also employ an emission probe. Such probes can be used to make measurements under a variety of conditions and are well suited to electrically propelled plasmas from steady state to oscillatory, from diffuse to dense, from cold to hot. Wherein the floating emission probe can directly measure the plasma potential without voltage scanning. The probe consists of a tungsten wire ring fixed on an alumina insulating tube, and the tungsten wire ring is heated to reach a thermionic emission point by applying current to the tungsten wire ring, and emits electrons to neutralize a sheath around the probe so that the probe floats on the local plasma potential, thereby measuring the basic parameters of the plasma.
However, the conventional probe having a planar shape and a curved shape has several outstanding problems.
Firstly, for the langmuir probe, the planar probe is difficult to process data due to the fact that the phenomenon of sheath distortion and sheath separation exists at the edge of the probe, and has the problems of ion sputtering, reflection and the like, so that the diagnosis of CEX (charge exchange) is difficult; the cylindrical probe is very small in size and very long in length, in order to avoid a terminal effect, the length-diameter ratio is usually more than 50, beam ions cannot rapidly penetrate through a sheath layer, ions collected by the cylindrical probe contain a large number of beam ions and CEX ions, and the beam ions interfere with CEX ion diagnosis, so that the use condition and the range of the cylindrical probe are limited.
Further, as shown in fig. 1 and 2, fig. 1 is a current-voltage characteristic curve of the langmuir probe; FIG. 2 shows the results of a second test in the plume region. As can be seen from fig. 1 and 2, since the current curve continues to increase after the langmuir probe voltage crosses the space potential, it is difficult to determine the inflection point corresponding to the space potential, so that the electron number density measurement and the space potential measurement depend on data selection, and have a large error, which needs to be solved through theoretical innovation and practical innovation.
Secondly, as for the Faraday plane-shaped probe, which belongs to a naked probe, a protective sleeve needs to be designed on the outer side of the collector, and a certain gap is formed between the protective sleeve and the collecting surface. When the probe is positioned in a region with higher beam ion current density, an uneven plasma sheath layer is formed on the current collecting surface of the collecting disc, and a recess is formed in the gap, so that the receiving area is increased, the current measurement value is increased, and the error is increased.
Thirdly, the existing plane probe and the existing cylindrical probe cannot simultaneously meet the optimal measurement precision of basic parameters such as electron temperature, electron number density and the like.
Fourth, the existing probe often directly connects a probe head with connecting parts such as a nut, a bolt and a motion motor, and electrical contact exists, so that the resistance of the probe is large, the voltage of the probe is not accurately measured due to the divided resistance, and the measurement precision is influenced.
Fifthly, the existing probe is exposed to a plasma environment except for a metal electrode, and a lead joint, a metal bolt, a nut and the like can collect electrons and ions, so that interference is generated on a measurement result.
Disclosure of Invention
In light of the above-described shortcomings and disadvantages, it is an object of the present disclosure to at least address one or more of the above-described problems in the prior art.
In a first aspect, the invention provides an annular probe, which comprises a limiting mechanism, a first collector and a conductive assembly, wherein the first collector and the conductive assembly are both used for being connected with a power supply;
the conductive assembly is sleeved outside the limiting mechanism and provided with an installation channel;
the first collector is positioned in the mounting channel, an insulating layer is arranged between the first collector and the conductive assembly, and the first collector is provided with a strip-shaped collecting surface used for collecting flow field ions.
Further, the conductive assembly comprises a first conductive sleeve and a second conductive sleeve, and the first collector is clamped between the first conductive sleeve and the second conductive sleeve;
the insulating layers are arranged between the first collector and the first conductive sleeve and between the first collector and the second conductive sleeve.
Furthermore, the limiting mechanism comprises a fixed seat and a pressing component, the first collector and the conductive component are sleeved outside the fixed seat, and the pressing component is connected with the fixed seat so as to press the first collector and the conductive component onto the fixed seat.
Furthermore, the compressing assembly comprises an insulating end cover and a fastener, the insulating end cover is sleeved outside the fixing seat, and the fastener penetrates through the insulating end cover and is connected with the fixing seat.
Further, stop gear still includes coupling assembling, coupling assembling runs through the fixing base with conductive component and first collector is connected, coupling assembling still be used for with the power is connected.
In a second aspect, the invention further provides a combined probe, which comprises a second collector connected with the power supply and the ring probe in the scheme;
at least part of the second collecting electrode and the limiting mechanism are of an integrated structure, and the second collecting electrode is provided with a collecting end face for collecting flow field ions;
or the second collector is connected with the limiting mechanism and is provided with an emission filament for collecting flow field ions.
Further, when the second collector has the collecting end face, the second collector includes a planar probe and a guard ring both for connection to the power supply;
the protection ring is sleeved outside the planar probe, and a cavity for accommodating the end part of the planar probe is formed in the protection ring;
the plane probe and the limiting mechanism are of an integrated structure, and a gap is formed between the end part of the plane probe and the protection ring along the radial direction of the protection ring;
along the axial direction of the protection ring, a first isolating piece is clamped between the protection ring and the planar probe.
Furthermore, the limiting mechanism is connected with the protection ring through a locking piece.
Further, when the second collector electrode has when the emission filament, the emission filament runs through stop gear, just the setting of buckling of emission filament, the end of buckling of emission filament is stretched out stop gear is used for collecting flow field ion, the end of emission filament is stretched out stop gear is used for being connected with the power.
Furthermore, a filling layer is arranged between the emission filament and the limiting mechanism and used for fixing the emission filament in the limiting mechanism.
The annular probe and the combined probe provided by the invention can produce the following beneficial effects:
when installed, the spacing mechanism can define the position of the first collector relative to the conductive assembly. In the test process, the electric thruster ignites and sprays plasma to form a plume; the first collector and the conductive component are connected with a power supply, the conductive component and the strip-shaped collecting surfaces on the first collector receive electrons or ions with certain energy to enter the sheath layer, the electrons and the ions are collected to form probe current, and the insulating layer plays a role in isolating the first collector and the conductive component in the process; and then, after the current and the voltages at two ends of the first collector are collected by a collecting system, a volt-ampere characteristic curve is formed, the corresponding value of the electron number density is further solved, and data support is provided for obtaining the electron temperature.
Compared with the prior art, the annular probe provided by the first aspect of the invention has the advantages that the first collector is positioned in the installation channel formed by the conductive assembly, the first collector and the conductive assembly jointly collect flow field ions, the conductive assembly can eliminate the terminal effect of the first collector, the collection area of the first collector is ensured to be unchanged, and the obtained data is ensured to be accurate.
A second aspect of the invention provides a combined probe having an annular probe and a second collector having a collecting end face or an emitting filament for collecting ions in a flow field. In use, the first collector, the second collector and the conductive element together collect ions in the flow field. The first collector can enable beam ions to rapidly pass through the sheath layer, the collected ions are mainly CEX ions, diagnosis of the CEX ions in a beam area is achieved, and the application range of the probe is expanded; the second collector provides a test value of electron beam density, and can search the voltage corresponding to the volt-ampere characteristic curve according to the test value, so that the functions of high-precision diagnosis and mutual correction of space potential are realized. Compared with the prior art, the combined probe integrates the advantages of two probes and realizes high-precision measurement.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
Figure 1 is a plot of the voltammetry of a langmuir probe;
FIG. 2 shows the results of a second test in the plume region;
FIG. 3 is a schematic structural diagram of a ring probe according to an embodiment of the present invention;
FIG. 4 is a schematic three-dimensional structure diagram of a combined probe according to an embodiment of the present invention;
FIG. 5 is a top view of a combination probe according to one embodiment of the present invention;
FIG. 6 is a cross-sectional view A-A of FIG. 5;
FIG. 7 is a front view of a combination probe according to one embodiment of the present invention;
FIG. 8 is a cross-sectional view B-B of FIG. 7;
fig. 9 is a schematic three-dimensional structure diagram of a combined probe according to a second embodiment of the present invention;
FIG. 10 is a top view of a combination probe according to a second embodiment of the present invention;
fig. 11 is a cross-sectional view C-C of fig. 10.
Icon: 1-a limiting mechanism; 11-a fixed seat; 12-a compression assembly; 121-insulating end caps; 1211-cover; 1212-an isolation layer; 122-a fastener; 13-a connecting assembly; 2-a first collector; 3-a conductive component; 31-a first conductive sleeve; 32-a second conductive sleeve; 4-an insulating layer; 5-a second collector; 51-an emitting filament; 52-a planar probe; 53-a guard ring; 54-a first spacer; 6-a locking member; 7-filling layer.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
The following detailed description of embodiments of the invention refers to the accompanying drawings. It should be understood that the detailed description and specific examples, while indicating the present invention, are given by way of illustration and explanation only, not limitation.
The embodiment of the first aspect of the present invention provides a ring probe, as shown in fig. 3, including a position-limiting mechanism 1, and a first collector 2 and a conductive component 3 both used for connecting with a power supply; the conductive component 3 is sleeved outside the limiting mechanism 1, and the conductive component 3 is provided with an installation channel; the first collector 2 is positioned in the mounting channel, an insulating layer 4 is arranged between the first collector 2 and the conductive component 3, and the first collector 2 is provided with a strip-shaped collecting surface for collecting ions in a flow field.
When mounted, the spacing mechanism 1 is able to define the position of the first collector 2 relative to the conductive assembly 3. In the test process, the electric thruster ignites and sprays plasma to form a plume; the first collector 2 and the conductive component 3 are connected with a power supply, the conductive component 3 and the strip-shaped collecting surfaces on the first collector 2 receive electrons or ions with certain energy to enter a sheath layer, the electrons and the ions are collected to form probe current, and the insulating layer plays a role in isolating the first collector 2 and the conductive component 3 in the process; and then, after the current and the voltages at two ends of the first collector 2 are collected by a collecting system, a volt-ampere characteristic curve is formed, the corresponding value of the electron number density is further solved, and data support is provided for obtaining the electron temperature.
In some embodiments, as shown in fig. 3, the conductive assembly 3 comprises a first conductive sleeve 31 and a second conductive sleeve 32, the first collector 2 being sandwiched between the first conductive sleeve 31 and the second conductive sleeve 32; insulating layers 4 are arranged between the first collector 2 and the first conductive sleeve 31 and between the first collector 2 and the second conductive sleeve 32.
When the collector is used, the first conductive sleeve 31, the second conductive sleeve 32 and the first collector 2 collect flow field ions together, the first conductive sleeve 31 and the second conductive sleeve 32 can eliminate the terminal effect of the strip-shaped collecting surface on the first collector 2, and the collecting area of the first collector 2 is ensured to be unchanged, so that the test result is more accurate. Wherein the insulating layer 4 is capable of insulating the first conductive sleeve 31, the second conductive sleeve 32 and the first collector 2 from each other.
Specifically, the material of the first conductive sleeve 31, the second conductive sleeve 32, and the first collector 2 may be tungsten; the material of the insulating layer 4 may be ceramic.
As shown in fig. 3, the insulating layer 4 between the first conductive sleeve 31 and the first collector 2 is a first insulating layer, and the insulating layer 4 between the first collector 2 and the second conductive sleeve 32 is a second insulating layer. The surfaces of the first conductive sleeve 31, the first insulating layer, the first collector 2 and the second insulating layer, which are far away from the limiting mechanism 1, are respectively provided with a first groove, a second groove, a third groove and a fourth groove.
The first recess is used for accommodating the second conductive sleeve 32, the first collector 2 and the two insulating layers 4; the second recess is used for accommodating the first collector 2, the second insulating layer and the second conductive sleeve 32; the third recess is for accommodating the second insulating layer and the second conductive sleeve 32; the fourth recess is for receiving the second conductive sleeve 32. Facing to the direction of fig. 3, the bottom ends of the first conductive sleeve 31, the first insulating layer, the first collector 2, the second insulating layer and the second conductive sleeve 32 are all abutted against the limiting mechanism 1 to form a structure that the ring is buckled, so that the structure of the annular probe is more stable, and the wire can pass through the limiting mechanism 1 to be connected with the first conductive sleeve 31, the first collector 2 and the second conductive sleeve 32, so that the connection is more convenient.
In some embodiments, as shown in fig. 3, in order to make the structure of the limiting mechanism 1 simpler, the limiting mechanism 1 includes a fixing seat 11 and a pressing component 12, the first collector 2 and the conductive component 3 are both sleeved outside the fixing seat 11, and the pressing component 12 is connected to the fixing seat 11 to press the first collector 2 and the conductive component 3 onto the fixing seat 11.
The first collector 2 and the conductive component 3 are sleeved outside the fixed seat 11, and the first collector 2 and the conductive component 3 can be positioned along the radial direction of the fixed seat 11; the compressing assembly 12 compresses the first collector 2 and the conductive assembly 3 onto the fixing seat 11, so that the first collector 2 and the conductive assembly 3 can be positioned along the axial direction of the fixing seat 11, and the first collector 2 and the conductive assembly 3 are stably mounted on the limiting mechanism 1.
On the basis of the above embodiment, as shown in fig. 3, optionally, the pressing assembly 12 includes an insulating end cover 121 and a fastening member 122, the insulating end cover 121 is sleeved outside the fixing base 11, the insulating end cover 121 is configured to cover the conductive assembly 3, and the fastening member 122 penetrates through the insulating end cover 121 and is connected with the fixing base 11, so that the insulating end cover 121 is pressed on the conductive assembly 3.
The fastening member 122 may be connected to the fixing base 11 in various manners, specifically, may be in a threaded connection, a snap connection, a pin connection, and the like.
In at least one embodiment, the fastening member 122 is screwed to the fixing base 11, so that the connection is stable and firm and is not easy to loosen.
In addition, stop gear 1 still includes coupling assembling 13, and coupling assembling 13 runs through fixing base 11 and is connected with conductive component 3 and first collector 2, and coupling assembling 13 still is used for being connected with the power. The connecting assembly 13 can not only limit the positions of the conductive assembly 3 and the first collector 2 relative to the fixing seat 11, but also realize the connection between the conductive assembly 3 and the first collector 2 and a power supply, and the structure of the annular probe is firmer, so that the rapid assembly and disassembly can be realized.
Specifically, the connection assembly 13 includes a first screw, a second screw, and a third screw, each of which is connected to a wire. The first screw penetrates through the fixed seat 11 and is connected with the first conductive sleeve 31; the second screw penetrates through the fixed seat 11 and is connected with the first collector 2; the third screw penetrates through the fixed seat 11 and is connected with the second conductive sleeve 32. The first, second and third screws are capable of transmitting power to the first conductive sleeve 31, the first collector 2 and the second conductive sleeve 32, respectively. The arrangement facilitates the wire protection and the connection of the annular probe with the circuit.
The embodiment of the second aspect of the present invention provides a combined probe, which comprises a second collector 5 for connecting with a power supply and the ring probe; at least part of the second collector 5 and the limiting mechanism 1 are of an integrated structure, and the second collector 5 is provided with a collecting end face for collecting flow field ions; or the second collector 5 is connected with the limiting mechanism 1, and the second collector 5 is provided with an emission filament 51 for collecting flow field ions.
The combined probe provided by the second aspect of the invention has a ring probe and a second collector 5, the second collector 5 having a collecting end face or an emitting filament for collecting ions in the flow field. In use, the first collector 2, the second collector 5 and the conductive member 3 together collect ions in the flow field. The first collector 2 can enable beam ions to rapidly pass through a sheath layer, ensures that the collected ions are mainly CEX ions, realizes the diagnosis of the CEX ions in a beam area, and expands the application range of the probe; the second collector 5 provides a test value of the electron beam density, and can search the voltage corresponding to the volt-ampere characteristic curve according to the test value, so that the functions of high-precision diagnosis and mutual correction of the space potential are realized. Compared with the prior art, the combined probe integrates the advantages of two probes and realizes high-precision measurement.
Depending on the type of structure of the second collector 5, the following two embodiments can be distinguished:
the first embodiment is as follows:
in the first embodiment, as shown in fig. 4 to 8, the second collector 5 has a collecting end surface. At this time, the second collector 5 includes a planar probe 52 and a guard ring 53 both for connection with a power supply; the protection ring 53 is sleeved outside the planar probe 52, and the protection ring 53 forms a cavity for accommodating the end of the planar probe 52; the plane probe 52 and the limiting mechanism 1 have an integrated structure, and a gap is formed between the end part of the plane probe 52 and the protection ring 53 along the radial direction of the protection ring 53, so that the edge effect when the plane probe 52 collects plasma is eliminated; along the axial direction of the guard ring 53, a first spacer 54 is interposed between the guard ring 53 and the planar probe 52 to prevent the guard ring 53 from contacting the planar probe 52.
When the ion collector is used, the planar probe 52 and the protection ring 53 collect flow field ions together, and a certain gap is formed between the protection ring 53 and the end of the planar probe 52, so that the protection ring 53 can reduce the edge effect of the planar probe 52, and the measured data is more accurate.
Wherein the distance between the end of the planar probe 52 and the guard ring 53 is 0.8mm to 1.2 mm. Specifically, the distance between the end of the planar probe 52 and the guard ring 53 may be 0.8mm, 1.0mm, 1.2 mm.
When the limiting mechanism 1 comprises the fixed seat 11, the insulating end cover 121 and the fastener 122, the planar probe 52 and the fastener 122 have an integrated structure. Specifically, referring to fig. 6 as an example, when the fastener 122 is screwed to the fixing base 11, the top end of the flat probe 52 has an end surface for collecting ions in the flow field, and the bottom end of the flat probe 52 extends into the fixing base 11 to be screwed to the fixing base 11.
In order to facilitate the connection between the planar probe 52 and the power supply, a through hole is formed in the fixing base 11, the bottom end of the planar probe 52 is in threaded fit with the through hole, and a wire can pass through the through hole to be connected with the planar probe 52.
In the first embodiment, as shown in fig. 6, the limiting mechanism 1 is connected to the protection ring 53 through the locking member 6, and the protection ring 53 is more stable in position relative to the limiting mechanism 1.
In particular, the locking element can be a screw that extends through the insulating end cap 121 of the spacing mechanism 1 and connects with the protective ring 53. The insulating end cap 121 may be provided with a recess for receiving a wire which is passed through the recess and connected to the retaining member 6 to provide communication between the guard ring 53 and a power source.
As shown in fig. 6, the insulating end cap 121 is a split structure, the insulating end cap 121 includes a cap 1211 and an isolating layer 1212, the isolating layer 1212 covers the conductive element 3, and the top end of the isolating layer 1212 is provided with the above-mentioned groove; the cap 1211 is interposed between the guard ring 53 and the spacer 1212, and the cap 1211 is connected to the guard ring 53 by a screw.
In order to ensure that the isolation layer 1212 does not obstruct the locking member 6 when the planar probe 52 is screwed to the fixing base 11, a distance is provided between the inner surface of the isolation layer 1212 and the fixing base 11 to provide a rotation space for the locking member 6.
In order to facilitate the assembly of the second collector 5, a nut is further disposed between the cover 1211 and the fixing base 11. After the cover 1211, the protection ring 53 and the first spacer 54 are fitted on the flat probe 52, the cover 1211, the protection ring 53 and the first spacer 54 may be pressed against the end of the flat probe 52 by nuts, so as to assemble the second collector 5.
Example two:
in the second embodiment, the second collector 5 has an emission filament 51. As shown in fig. 7 to 11, the emission filament 51 penetrates through the limiting mechanism 1, the emission filament 51 is bent, the bent end of the emission filament 51 extends out of the limiting mechanism 1 to collect ions in the flow field, and the tail end of the emission filament 51 extends out of the limiting mechanism 1 to be connected with a power supply.
The emission filament 51 may be a continuous tungsten filament, and extends into the limiting mechanism 1 from the first end of the limiting mechanism 1, and extends out from the first end of the limiting mechanism 1 after extending out and bending from the second end of the limiting mechanism 1. The bent end of the plasma collector is exposed in the plume, the plasma collector is used for collecting plasma, and the tail end of the plasma collector extending out of the first end is connected with a power supply. The arrangement enables the emission filament 51 to be directly connected with the measuring circuit, and the connection is firm and is not easy to loosen.
When the limiting mechanism 1 comprises the fixing base 11, the insulating end cap 121 and the fastener 122, the fixing base 11 has a mounting channel thereon, and the emitting filament 51 penetrates through the mounting channel on the fixing base 11.
In the second embodiment, as shown in fig. 11, the insulating end cap 121 is an integrated structure, and is covered on the conductive element 3, and the fastening member 122 penetrates through the insulating end cap 121 and is screwed with the fixing base 11, so as to press the insulating end cap 121 on the conductive element 3.
In the second embodiment, as shown in fig. 11, in order to install the emission filament 51 in the position limiting mechanism 1 more stably, the filling layer 7 is provided between the emission filament 51 and the position limiting mechanism 1, and the filling layer 7 can fill the gap between the emission filament 51 and the position limiting mechanism 1, so as to fix the emission filament 51 in the position limiting mechanism 1.
Specifically, the filling layer 7 may be ceramic paste, which has good insulating property and cohesiveness, and realizes the combination of the emission filament 51 and the limiting mechanism 1.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. The annular probe is characterized by comprising a limiting mechanism (1), a first collector (2) and a conductive component (3), wherein the first collector and the conductive component are both used for being connected with a power supply;
the conductive component (3) is sleeved outside the limiting mechanism (1), and the conductive component (3) is provided with an installation channel;
the first collector (2) is located in the installation channel, an insulating layer (4) is arranged between the first collector (2) and the conductive component (3), and the first collector (2) is provided with a strip-shaped collecting surface used for collecting flow field ions.
2. The ring probe according to claim 1, characterized in that said conductive assembly (3) comprises a first conductive sleeve (31) and a second conductive sleeve (32), said first collector (2) being interposed between said first conductive sleeve (31) and said second conductive sleeve (32);
the insulating layers (4) are arranged between the first collector (2) and the first conductive sleeve (31) and between the first collector (2) and the second conductive sleeve (32).
3. The ring probe according to claim 1, wherein the limiting mechanism (1) comprises a fixing seat (11) and a pressing component (12), the first collector (2) and the conductive component (3) are both sleeved outside the fixing seat (11), and the pressing component (12) is connected with the fixing seat (11) so as to press the first collector (2) and the conductive component (3) onto the fixing seat (11).
4. The ring probe according to claim 3, wherein the pressing assembly (12) comprises an insulating end cap (121) and a fastener (122), the insulating end cap (121) is sleeved outside the fixed seat (11), and the fastener (122) penetrates through the insulating end cap (121) and is connected with the fixed seat (11).
5. The ring probe according to claim 3, wherein the position limiting mechanism (1) further comprises a connecting assembly (13), the connecting assembly (13) is connected with the conductive assembly (3) and the first collector (2) through the fixing seat (11), and the connecting assembly (13) is further used for connecting with the power supply.
6. A combined probe comprising a second collector (5) for connection to said power supply and a ring probe according to any of claims 1-5;
the second collector (5) and the limiting mechanism (1) are at least partially of an integrated structure, and the second collector (5) is provided with a collecting end face for collecting flow field ions;
or the second collector (5) is connected with the limiting mechanism (1), and the second collector (5) is provided with an emission filament (51) for collecting flow field ions.
7. The combined probe according to claim 6, characterized in that, when the second collector (5) has the collecting end face, the second collector (5) comprises a planar probe (52) and a guard ring (53) both for connection with the power supply;
the protection ring (53) is sleeved outside the planar probe (52), and the protection ring (53) forms a cavity for accommodating the end part of the planar probe (52);
the plane probe (52) and the limiting mechanism (1) are of an integral structure, and a gap is reserved between the end part of the plane probe (52) and the protection ring (53) along the radial direction of the protection ring (53);
a first spacer (54) is interposed between the guard ring (53) and the planar probe (52) in the axial direction of the guard ring (53).
8. The combined probe according to claim 7, characterized in that the connection between the limiting mechanism (1) and the protection ring (53) is made by a locking element (6).
9. The combined probe according to claim 6, wherein when the second collector (5) has the emitting filament (51), the emitting filament (51) penetrates through the limiting mechanism (1), and the emitting filament (51) is bent, a bent end of the emitting filament (51) extends out of the limiting mechanism (1) for collecting ions in the flow field, and a distal end of the emitting filament (51) extends out of the limiting mechanism (1) for connecting with a power supply.
10. The combined probe according to claim 9, characterized in that a filling layer (7) is provided between the emitting filament (51) and the position limiting mechanism (1), the filling layer (7) is used for fixing the emitting filament (51) in the position limiting mechanism (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010118008.3A CN111257001B (en) | 2020-02-25 | 2020-02-25 | Ring probe and combined probe |
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| CN114113717A (en) * | 2021-11-24 | 2022-03-01 | 北京航空航天大学 | Plug-in type totally-enclosed Faraday probe |
| CN114136647A (en) * | 2021-10-20 | 2022-03-04 | 中国航发四川燃气涡轮研究院 | Supersonic speed high-temperature three-dimensional flow field measuring device |
| CN115808315A (en) * | 2022-11-30 | 2023-03-17 | 兰州空间技术物理研究所 | Device and method for evaluating low-frequency oscillation performance based on Hall thruster |
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