CN111239589A - Electronic lock circuit board testing method, device and system - Google Patents
Electronic lock circuit board testing method, device and system Download PDFInfo
- Publication number
- CN111239589A CN111239589A CN202010067732.8A CN202010067732A CN111239589A CN 111239589 A CN111239589 A CN 111239589A CN 202010067732 A CN202010067732 A CN 202010067732A CN 111239589 A CN111239589 A CN 111239589A
- Authority
- CN
- China
- Prior art keywords
- test
- circuit board
- electronic lock
- state
- lock circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Studio Devices (AREA)
Abstract
The invention provides a method, a device and a system for testing an electronic lock circuit board, wherein the method comprises the following steps: s1, defining test parameters, controlling the on-off of the relay through the single chip microcomputer according to the defined test parameters, when the relay is switched on, enabling the digital key of the tested electronic lock circuit board to enter a test mode, and enabling an indicator light correspondingly connected to the digital key to be in a state of indicating a digital key test result; s2, controlling the industrial camera to photograph the indicator lamp to obtain a test state image; s3, analyzing the test state image to obtain the state of the indicator light; and S4, comparing and judging the state of the indicator light with a preset result state to obtain a final test result. The on-off of the relay is controlled by the single chip microcomputer to replace a manual operation key, and the image recognition technology is used for replacing manual subjective judgment, so that the workload of manual testing is reduced, the testing efficiency is improved, the testing accuracy and stability are improved, and the method has great significance for improving the testing automation degree.
Description
Technical Field
The invention relates to a method, a device and a system for testing an electronic lock circuit board.
Background
The electronic lock is a coded lock product with keys, the test of a circuit board of the coded lock product needs to be carried out according to test items, corresponding digital keys are manually pressed to enter a test mode for testing, whether the product is qualified or not is judged according to the state of a lamp and the number of flickering, the test efficiency is low, the operation requirement on workers is high (the key test sequence needs to be remembered firmly and the response of each test is met), the working strength is high, the test is easy to be tired for a long time, the test result is judged due to subjective influence, the reliability is poor, no system is controlled, and the test result cannot be traced.
Chinese utility model No. CN207212012U, published at 20180410, discloses an electronic lock testing device, which includes a power supply, a controller connected to the power supply, and a first control switch connected to the electronic lock and the controller, respectively; the controller is provided with a second control switch for controlling the electronic lock to be opened and closed, and the second control switch is connected with the electronic lock; the first control switch is closed when the electronic lock is opened and transmits an electronic lock opening signal to the controller, and the first control switch is opened when the electronic lock is locked. The electronic lock testing device can automatically and circularly complete the opening and locking of the electronic lock for multiple times, does not need to manually record the opening times of the electronic lock, and has small volume and no occupation of excessive space. The device is used for testing the whole function of the electronic lock and cannot test the digital keys.
Aiming at the test defects of the scheme, the on-off of the relay is controlled by the single chip microcomputer to replace manual operation keys, and the image recognition technology replaces manual subjective judgment, so that the workload of manual test is reduced, the test efficiency is improved, the test accuracy and stability are improved, and the method has great significance for improving the automation degree of the test.
Disclosure of Invention
The technical problem to be solved by the invention is to provide a method, a device and a system for testing a circuit board of an electronic lock, wherein a single chip microcomputer is used for controlling on-off of a relay to replace manual operation keys, and an image recognition technology is used for replacing manual subjective judgment, so that the workload of manual testing is reduced, the testing efficiency is improved, the testing accuracy and stability are improved, and the method, the device and the system have great significance for improving the automation degree of testing.
In a first aspect, the present invention provides an electronic lock circuit board testing method, 1, an electronic lock circuit board testing method, including the following steps:
s1, defining test parameters, controlling the on-off of the relay through the single chip microcomputer according to the defined test parameters, when the relay is switched on, enabling the digital key of the tested electronic lock circuit board to enter a test mode, and enabling an indicator light correspondingly connected to the digital key to be in a state of indicating a digital key test result;
s2, controlling the industrial camera to photograph the indicator lamp to obtain a test state image;
s3, analyzing the test state image to obtain the state of the indicator light;
and S4, comparing and judging the state of the indicator light with a preset result state to obtain a final test result.
In a second aspect, the present invention provides a method for testing a circuit board of an electronic lock, including the following steps:
(1) the upper computer receives the definition of the test parameters;
(2) after the tested product is placed in the testing tool, the travel switch outputs a positioning signal of the tested product to the singlechip,
(3) the single chip microcomputer receives the in-place signal and controls the on-off of the relay according to the defined test parameters, when the relay is switched on, the digital key of the tested electronic lock circuit board enters a test mode, and at the moment, the indicator lamp correspondingly connected to the digital key is in a state of indicating a digital key test result;
(4) the upper computer controls the industrial camera to photograph the indicator lamp, a test state image is obtained, and the test state image is analyzed to obtain the state of the indicator lamp; and comparing and judging the obtained state of the indicator light with a preset result state to obtain a final test result.
In a third aspect, the present invention provides a testing apparatus for a circuit board of an electronic lock, including:
the definition module is used for receiving the definition of the test parameters and controlling the on-off of the relay through the single chip microcomputer according to the defined test parameters, when the relay is switched on, a digital key of the tested electronic lock circuit board enters a test mode, and at the moment, an indicator lamp correspondingly connected to the digital key is in a state of indicating a digital key test result;
the control module is used for controlling the industrial camera to photograph the indicator lamp to obtain a test state image;
the image analysis module is used for analyzing the test state image to obtain the state of the indicator light;
and the comparison and judgment module is used for comparing and judging the state of the indicator light with a preset result state to obtain a final test result.
In a fourth aspect, the invention provides a circuit board testing system of an electronic lock, which comprises an upper computer, a single chip microcomputer, an industrial camera, a relay and a travel switch, wherein the upper computer is respectively connected with the single chip microcomputer and the industrial camera, and the single chip microcomputer is also respectively connected with the relay and the travel switch;
the upper computer receives the definition of the test parameters;
after the tested product is placed in the testing tool, the travel switch outputs a positioning signal of the tested product to the single chip microcomputer,
the single chip microcomputer receives the in-place signal and controls the on-off of the relay according to the defined test parameters, when the relay is switched on, the digital key of the tested electronic lock circuit board enters a test mode, and at the moment, the indicator lamp correspondingly connected to the digital key is in a state of indicating a digital key test result;
the upper computer controls the industrial camera to photograph the indicator lamp, a test state image is obtained, and the test state image is analyzed to obtain the state of the indicator lamp; and comparing and judging the obtained state of the indicator light with a preset result state to obtain a final test result.
One or more technical solutions provided in the embodiments of the present invention have at least the following technical effects or advantages: utilize host computer, singlechip, industry camera, relay and travel switch to establish and obtain semi-automatization's test system, carry out relevant function through host computer automatic control singlechip, industry camera, accessible singlechip automatic control relay's break-make again to accomplish the electronic lock circuit board test, and the test result is that the host computer utilizes image analysis technique to obtain, not only improves efficiency of software testing, still can guarantee the accuracy and the stability of test result, improves production quality. For the testing personnel, the testing product is placed on the tool only by hand, and the testing personnel can be in place, and the later process does not need manual intervention, so that the working intensity of the personnel is greatly reduced.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
The invention will be further described with reference to the following examples with reference to the accompanying drawings.
FIG. 1 is a block diagram of the hardware portion of the test system framework of the present invention;
fig. 2 is a flowchart of a method for testing a circuit board of an electronic lock according to an embodiment of the invention.
Fig. 3 is a flowchart of a circuit board testing method of an electronic lock according to a second embodiment of the invention.
Fig. 4 is a schematic structural diagram of a circuit board testing device of an electronic lock according to a fourth embodiment of the present invention.
Detailed Description
The embodiment of the application provides the method, the device and the system for testing the electronic lock circuit board, so that the electronic lock circuit board can be automatically tested on a tested product, the testing efficiency is improved, the testing accuracy and stability are improved, and the working intensity of personnel is greatly reduced.
The technical scheme in the embodiment of the application has the following general idea: utilize host computer, singlechip, industry camera, relay and travel switch to establish and obtain semi-automatization's test system, carry out relevant function through host computer automatic control singlechip, industry camera, accessible singlechip automatic control relay's break-make again to accomplish the electronic lock circuit board test, and it utilizes image analysis technique to carry out analysis and judgement to the image that industry camera was shot to the host computer during the test, thereby obtain final test result, and carry out local save or upload to the server.
Before the specific embodiments are introduced, a system framework corresponding to the method of the embodiments of the present application is introduced, and the system framework may be divided into a hardware part and a software part:
the hardware part is shown in figure 1 and comprises a testing tool, an upper computer, a single chip microcomputer, an industrial camera, a wharf sweeping head, a relay and a travel switch; wherein the content of the first and second substances,
the testing tool (not shown) is used for placing an electronic lock circuit board to be tested;
the travel switch is used for detecting whether the tested equipment is in place or not, when the travel switch is closed, the meter-tested equipment is correctly placed on the test tool, and the closing information of the travel switch is a in-place signal and is sent to the single chip microcomputer;
the single chip microcomputer is used for receiving the in-place signal and controlling the on-off of the relay according to the test parameters defined by the upper computer;
the on-off state of the relay is used for controlling whether the tested electronic lock circuit board enters the test module or not, when the relay is switched on, the digital key of the tested electronic lock circuit board enters the test mode, and at the moment, the indicator lamp correspondingly connected to the digital key is in a state of indicating the test result of the digital key;
the industrial camera is used for photographing the indicator lamp to obtain a test state image;
the scanning head is used for collecting identity information of the tested electronic lock circuit board, so that test results can correspond to the tested electronic lock circuit board one by one, wherein the identity information can be a two-dimensional code or a one-dimensional code;
the upper computer receives the definition of the test parameters; controlling an industrial camera to photograph the indicator light, and analyzing the test state image after acquiring the test state image to obtain the state of the indicator light; and comparing and judging the obtained state of the indicator light with a preset result state to obtain a final test result.
Example one
The embodiment provides a method for testing a circuit board of an electronic lock, which is used on an upper computer, as shown in fig. 2, and comprises the following steps:
s1, defining test parameters, controlling the on-off of the relay through the single chip microcomputer according to the defined test parameters, when the relay is switched on, enabling the digital keys of the tested electronic lock circuit board to enter a test mode, and testing one by one, wherein at the moment, the indicator lamps correspondingly connected to the digital keys are in a state of indicating the test result of the digital keys, in a specific embodiment, the indicator lamps can be arranged on the upper half part of the tested circuit board, and only have two indicator lamps of red and blue;
s2, controlling the industrial camera to photograph the indicator lamp to obtain a test state image; the test items are different, the number and the frequency of the pictures are also different, the picture-taking frequency is less than the minimum flashing frequency, the shortest time from the turning-on to the turning-off of the indicating lamp is 120 milliseconds usually, and the shortest time from the turning-on to the next turning-on is 320 milliseconds;
s3, analyzing the test state image to obtain the state of the indicator light;
and S4, comparing and judging the state of the indicator light with a preset result state to obtain a final test result, and storing the final test result locally or uploading the final test result to a server.
Wherein the content of the first and second substances,
the starting conditions for the test were: and the singlechip receives the signals that the tested product is put in the testing tool and outputs the in-position signals through the travel switch.
The step S2 further includes: controlling a wharf scanning head to collect identity information of a tested electronic lock circuit board, wherein the identity information is a two-dimensional code or a one-dimensional code;
in step S5, when the final test result is stored locally or uploaded to the server, it needs to be bound with the identity information of the tested electronic lock circuit board.
The step S4 is specifically: and performing color matching analysis on the area where the circuit board indicator lamp of the image of the test state image is located, so as to determine the state of the indicator lamp, such as whether the red lamp is turned on or the blue lamp is turned on, the respective flash times and the like.
Performing color matching analysis, wherein the photographing frequency is less than the minimum flicker frequency; therefore, the state of the lighting lamp can be judged according to the continuous images, and the respective flashing times can be judged, so that the state of the indicating lamp can be obtained.
Based on the same inventive concept, the application also provides a method which is applied to the system shown in fig. 1 and corresponds to the method in the first embodiment, and the details are shown in the second embodiment.
Example two
The embodiment provides a method for testing a circuit board of an electronic lock, as shown in fig. 3, including:
(1) the upper computer receives the definition of the test parameters;
(2) after the tested product is placed in the testing tool, the travel switch outputs a positioning signal of the tested product to the singlechip,
(3) the single chip microcomputer receives the in-place signal and controls the on-off of the relay according to the defined test parameters, when the relay is switched on, the digital key of the tested electronic lock circuit board enters a test mode, and at the moment, the indicator lamp correspondingly connected to the digital key is in a state of indicating a digital key test result;
(4) the upper computer controls the industrial camera to photograph the indicator lamp, a test state image is obtained, and the test state image is analyzed to obtain the state of the indicator lamp; and comparing and judging the obtained state of the indicator light with a preset result state to obtain a final test result.
The step (4) may further specifically be:
the upper computer controls the industrial camera to photograph the indicator lamp to obtain a test state image, and simultaneously controls the scanning head to acquire identity information of the tested electronic lock circuit board, wherein the identity information is a two-dimensional code or a one-dimensional code; analyzing the test state image, namely performing color matching analysis on the area where the circuit board indicating lamp of the test state image is located, so as to determine the state of the indicating lamp; and storing the final test result locally or uploading the final test result to a server, wherein the final test result is bound with the identity information of the tested electronic lock circuit board during storage and uploading.
Based on the same inventive concept, the application also provides a device corresponding to the method in the first embodiment, which is detailed in the third embodiment.
EXAMPLE III
In this embodiment, an electronic lock circuit board testing device is provided, which is used on an upper computer, as shown in fig. 4, and includes:
the definition module is used for receiving the definition of the test parameters and controlling the on-off of the relay through the single chip microcomputer according to the defined test parameters, when the relay is switched on, a digital key of the tested electronic lock circuit board enters a test mode, and at the moment, an indicator lamp correspondingly connected to the digital key is in a state of indicating a digital key test result;
the control module is used for controlling the industrial camera to photograph the indicator lamp to obtain a test state image;
the image analysis module is used for analyzing the test state image to obtain the state of the indicator light;
and the comparison and judgment module is used for comparing and judging the state of the indicator light with a preset result state to obtain a final test result.
Wherein the content of the first and second substances,
the control module is also used for controlling the wharf scanning head to collect identity information of the tested electronic lock circuit board, and the identity information is a two-dimensional code or a one-dimensional code;
and the comparison and judgment module is also used for storing the final test result to the local or uploading the final test result to a server, and the final test result is bound with the identity information of the tested electronic lock circuit board during storage and uploading.
Since the apparatus described in the second embodiment of the present invention is an apparatus used for implementing the method of the first embodiment of the present invention, based on the method described in the first embodiment of the present invention, a person skilled in the art can understand the specific structure and the deformation of the apparatus, and thus the details are not described herein. All the devices adopted in the method of the first embodiment of the present invention belong to the protection scope of the present invention.
Example four
The embodiment provides a circuit board testing system of an electronic lock, which comprises an upper computer, a single chip microcomputer, an industrial camera, a relay and a travel switch, wherein the upper computer is respectively connected with the single chip microcomputer and the industrial camera, and the single chip microcomputer is also respectively connected with the relay and the travel switch;
the upper computer receives the definition of the test parameters;
after the tested product is placed in the testing tool, the travel switch outputs a positioning signal of the tested product to the single chip microcomputer,
the single chip microcomputer receives the in-place signal and controls the on-off of the relay according to the defined test parameters, when the relay is switched on, the digital key of the tested electronic lock circuit board enters a test mode, and at the moment, the indicator lamp correspondingly connected to the digital key is in a state of indicating a digital key test result;
the upper computer controls the industrial camera to photograph the indicator lamp, a test state image is obtained, and the test state image is analyzed to obtain the state of the indicator lamp; and comparing and judging the obtained state of the indicator light with a preset result state to obtain a final test result.
The electronic lock circuit board testing system of the embodiment further comprises a sweeping head and a server, wherein the sweeping head and the server are both connected with the upper computer;
the upper computer controls the industrial camera to photograph the indicator lamp and simultaneously acquires identity information of the tested electronic lock circuit board through control of the upper computer, wherein the identity information is a two-dimensional code or a one-dimensional code;
and the upper computer uploads the final test result to the server when obtaining the final test result.
Since the system described in the fourth embodiment of the present invention is a system used for implementing the method in the second embodiment of the present invention, a person skilled in the art can understand the specific structure and the deformation of the system based on the method described in the second embodiment of the present invention, and thus the detailed description is omitted here. All systems adopted by the method of the second embodiment of the invention belong to the protection scope of the invention.
The technical scheme provided in the embodiment of the application at least has the following technical effects or advantages: utilize host computer, singlechip, industry camera, relay and travel switch to establish and obtain semi-automatization's test system, carry out relevant function through host computer automatic control singlechip, industry camera, accessible singlechip automatic control relay's break-make again to accomplish the electronic lock circuit board test, and the test result is that the host computer utilizes image analysis technique to obtain, not only improves efficiency of software testing, still can guarantee the accuracy and the stability of test result, improves production quality. For the testing personnel, the testing product is placed on the tool only by hand, and the testing personnel can be in place, and the later process does not need manual intervention, so that the working intensity of the personnel is greatly reduced.
Although specific embodiments of the invention have been described above, it will be understood by those skilled in the art that the specific embodiments described are illustrative only and are not limiting upon the scope of the invention, and that equivalent modifications and variations can be made by those skilled in the art without departing from the spirit of the invention, which is to be limited only by the appended claims.
Claims (10)
1. A method for testing an electronic lock circuit board is characterized by comprising the following steps: the method comprises the following steps:
s1, defining test parameters, controlling the on-off of the relay through the single chip microcomputer according to the defined test parameters, when the relay is switched on, enabling the digital key of the tested electronic lock circuit board to enter a test mode, and enabling an indicator light correspondingly connected to the digital key to be in a state of indicating a digital key test result;
s2, controlling the industrial camera to photograph the indicator lamp to obtain a test state image;
s3, analyzing the test state image to obtain the state of the indicator light;
and S4, comparing and judging the state of the indicator light with a preset result state to obtain a final test result.
2. The electronic lock circuit board testing method of claim 1, wherein:
the starting conditions for the test were: and the singlechip receives the signals that the tested product is put in the testing tool and outputs the in-position signals through the travel switch.
3. The electronic lock circuit board testing method of claim 1, wherein:
the step S2 further includes: controlling a wharf scanning head to collect identity information of a tested electronic lock circuit board, wherein the identity information is a two-dimensional code or a one-dimensional code;
the step S4 further includes: and storing the final test result locally or uploading the final test result to a server, wherein the final test result is bound with the identity information of the tested electronic lock circuit board during storage and uploading.
4. The electronic lock circuit board testing method of claim 1, wherein: the step S4 is specifically: and performing color matching analysis on the area where the circuit board indicator lamp of the image of the test state image is located, thereby determining the state of the indicator lamp.
5. A method for testing an electronic lock circuit board is characterized by comprising the following steps: the method comprises the following steps:
(1) the upper computer receives the definition of the test parameters;
(2) after the tested product is placed in the testing tool, the travel switch outputs a positioning signal of the tested product to the singlechip,
(3) the single chip microcomputer receives the in-place signal and controls the on-off of the relay according to the defined test parameters, when the relay is switched on, the digital key of the tested electronic lock circuit board enters a test mode, and at the moment, the indicator lamp correspondingly connected to the digital key is in a state of indicating a digital key test result;
(4) the upper computer controls the industrial camera to photograph the indicator lamp, a test state image is obtained, and the test state image is analyzed to obtain the state of the indicator lamp; and comparing and judging the obtained state of the indicator light with a preset result state to obtain a final test result.
6. The electronic lock circuit board testing method of claim 5, wherein: the step (4) is specifically as follows: the upper computer controls the industrial camera to photograph the indicator lamp to obtain a test state image, and simultaneously controls the scanning head to acquire identity information of the tested electronic lock circuit board, wherein the identity information is a two-dimensional code or a one-dimensional code; analyzing the test state image, namely performing color matching analysis on the area where the circuit board indicator lamp of the test state image is located, so as to determine the state of the indicator lamp; and storing the final test result locally or uploading the final test result to a server, wherein the final test result is bound with the identity information of the tested electronic lock circuit board during storage and uploading.
7. The utility model provides an electronic lock circuit board testing arrangement which characterized in that: the method comprises the following steps:
the definition module is used for receiving the definition of the test parameters and controlling the on-off of the relay through the single chip microcomputer according to the defined test parameters, when the relay is switched on, a digital key of the tested electronic lock circuit board enters a test mode, and at the moment, an indicator lamp correspondingly connected to the digital key is in a state of indicating a digital key test result;
the control module is used for controlling the industrial camera to photograph the indicator lamp to obtain a test state image;
the image analysis module is used for analyzing the test state image to obtain the state of the indicator light;
and the comparison and judgment module is used for comparing and judging the state of the indicator light with a preset result state to obtain a final test result.
8. The electronic lock circuit board testing method of claim 7, wherein:
the control module is also used for controlling the wharf scanning head to collect identity information of the tested electronic lock circuit board, and the identity information is a two-dimensional code or a one-dimensional code;
and the comparison and judgment module is also used for storing the final test result to the local or uploading the final test result to a server, and the final test result is bound with the identity information of the tested electronic lock circuit board during storage and uploading.
9. The utility model provides an electronic lock circuit board test system which characterized in that: the system comprises an upper computer, a single chip microcomputer, an industrial camera, a relay and a travel switch, wherein the upper computer is respectively connected with the single chip microcomputer and the industrial camera, and the single chip microcomputer is also respectively connected with the relay and the travel switch;
the upper computer receives the definition of the test parameters;
after the tested product is placed in the testing tool, the travel switch outputs a positioning signal of the tested product to the single chip microcomputer,
the single chip microcomputer receives the in-place signal and controls the on-off of the relay according to the defined test parameters, when the relay is switched on, the digital key of the tested electronic lock circuit board enters a test mode, and at the moment, the indicator lamp correspondingly connected to the digital key is in a state of indicating a digital key test result;
the upper computer controls the industrial camera to photograph the indicator lamp, a test state image is obtained, and the test state image is analyzed to obtain the state of the indicator lamp; and comparing and judging the obtained state of the indicator light with a preset result state to obtain a final test result.
10. The electronic lock circuit board testing system of claim 8, wherein: the device also comprises a wharf sweeping head and a server, wherein the wharf sweeping head and the server are both connected with the upper computer;
the upper computer controls the industrial camera to photograph the indicator lamp and simultaneously acquires identity information of the tested electronic lock circuit board through control of the upper computer, wherein the identity information is a two-dimensional code or a one-dimensional code;
and the upper computer uploads the final test result to the server when obtaining the final test result.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010067732.8A CN111239589A (en) | 2020-01-20 | 2020-01-20 | Electronic lock circuit board testing method, device and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010067732.8A CN111239589A (en) | 2020-01-20 | 2020-01-20 | Electronic lock circuit board testing method, device and system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111239589A true CN111239589A (en) | 2020-06-05 |
Family
ID=70872910
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010067732.8A Pending CN111239589A (en) | 2020-01-20 | 2020-01-20 | Electronic lock circuit board testing method, device and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111239589A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111624474A (en) * | 2020-07-28 | 2020-09-04 | 四川金网通电子科技有限公司 | Man-machine interactive fingerprint lock board card rapid test method |
| CN111624435A (en) * | 2020-07-29 | 2020-09-04 | 四川金网通电子科技有限公司 | Method for detecting touch key by using voice on electronic lock |
| CN112511602A (en) * | 2020-11-16 | 2021-03-16 | 谢奕成 | NB-IOT equipment detection method, intelligent terminal and storage medium |
| CN113902902A (en) * | 2021-09-30 | 2022-01-07 | 东莞华贝电子科技有限公司 | Test method, device, system and storage medium |
| CN114444529A (en) * | 2020-10-19 | 2022-05-06 | 浙江宇视***技术有限公司 | Machine vision-based test method and device, electronic equipment and storage medium |
| CN115616450A (en) * | 2022-07-30 | 2023-01-17 | 荣耀终端有限公司 | Test method and test equipment |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101482445A (en) * | 2009-02-23 | 2009-07-15 | 福建星网锐捷网络有限公司 | Test method and apparatus for status indication lamp |
| CN102841103A (en) * | 2011-06-23 | 2012-12-26 | 神讯电脑(昆山)有限公司 | Keyboard appearance detection apparatus and method thereof |
| CN103308524A (en) * | 2012-03-16 | 2013-09-18 | 西安中科麦特电子技术设备有限公司 | PCB automatic optical inspection system |
| CN104897367A (en) * | 2015-04-28 | 2015-09-09 | 南车株洲电力机车研究所有限公司 | Indicating light optical state automatic test method and system |
| CN105744261A (en) * | 2014-12-10 | 2016-07-06 | 上海仪电数字技术有限公司 | System and method for testing set top box front panels |
| CN205539254U (en) * | 2016-03-14 | 2016-08-31 | 广东德豪润达电气股份有限公司 | Charactron detecting system |
| CN207212012U (en) * | 2017-08-28 | 2018-04-10 | 深圳市创维群欣安防科技股份有限公司 | A kind of electronic lock test device |
| CN108318806A (en) * | 2018-02-13 | 2018-07-24 | 中山职业技术学院 | A kind of control panel working station indicator detection device |
| CN109917276A (en) * | 2019-04-15 | 2019-06-21 | 天地（常州）自动化股份有限公司 | Multifunction circuit board automatic test equipment, test macro and test method |
| CN209086387U (en) * | 2018-09-28 | 2019-07-09 | 深圳长城开发科技股份有限公司 | The device of test fingerprint lock circuit plate function |
| CN110082620A (en) * | 2019-05-05 | 2019-08-02 | 北京云迹科技有限公司 | A kind of charging pile working state detecting method and device |
-
2020
- 2020-01-20 CN CN202010067732.8A patent/CN111239589A/en active Pending
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101482445A (en) * | 2009-02-23 | 2009-07-15 | 福建星网锐捷网络有限公司 | Test method and apparatus for status indication lamp |
| CN102841103A (en) * | 2011-06-23 | 2012-12-26 | 神讯电脑(昆山)有限公司 | Keyboard appearance detection apparatus and method thereof |
| CN103308524A (en) * | 2012-03-16 | 2013-09-18 | 西安中科麦特电子技术设备有限公司 | PCB automatic optical inspection system |
| CN105744261A (en) * | 2014-12-10 | 2016-07-06 | 上海仪电数字技术有限公司 | System and method for testing set top box front panels |
| CN104897367A (en) * | 2015-04-28 | 2015-09-09 | 南车株洲电力机车研究所有限公司 | Indicating light optical state automatic test method and system |
| CN205539254U (en) * | 2016-03-14 | 2016-08-31 | 广东德豪润达电气股份有限公司 | Charactron detecting system |
| CN207212012U (en) * | 2017-08-28 | 2018-04-10 | 深圳市创维群欣安防科技股份有限公司 | A kind of electronic lock test device |
| CN108318806A (en) * | 2018-02-13 | 2018-07-24 | 中山职业技术学院 | A kind of control panel working station indicator detection device |
| CN209086387U (en) * | 2018-09-28 | 2019-07-09 | 深圳长城开发科技股份有限公司 | The device of test fingerprint lock circuit plate function |
| CN109917276A (en) * | 2019-04-15 | 2019-06-21 | 天地（常州）自动化股份有限公司 | Multifunction circuit board automatic test equipment, test macro and test method |
| CN110082620A (en) * | 2019-05-05 | 2019-08-02 | 北京云迹科技有限公司 | A kind of charging pile working state detecting method and device |
Non-Patent Citations (1)
| Title |
|---|
| 姜化善: "《工厂实用自动控制》", 31 August 1982, 中国农业机械出版社 * |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111624474A (en) * | 2020-07-28 | 2020-09-04 | 四川金网通电子科技有限公司 | Man-machine interactive fingerprint lock board card rapid test method |
| CN111624435A (en) * | 2020-07-29 | 2020-09-04 | 四川金网通电子科技有限公司 | Method for detecting touch key by using voice on electronic lock |
| CN114444529A (en) * | 2020-10-19 | 2022-05-06 | 浙江宇视***技术有限公司 | Machine vision-based test method and device, electronic equipment and storage medium |
| CN112511602A (en) * | 2020-11-16 | 2021-03-16 | 谢奕成 | NB-IOT equipment detection method, intelligent terminal and storage medium |
| CN112511602B (en) * | 2020-11-16 | 2023-08-04 | 谢奕成 | NB-IOT equipment detection method, intelligent terminal and storage medium |
| CN113902902A (en) * | 2021-09-30 | 2022-01-07 | 东莞华贝电子科技有限公司 | Test method, device, system and storage medium |
| CN115616450A (en) * | 2022-07-30 | 2023-01-17 | 荣耀终端有限公司 | Test method and test equipment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111239589A (en) | Electronic lock circuit board testing method, device and system | |
| CN108365557B (en) | Method and system for fine routing inspection of power transmission line by unmanned aerial vehicle | |
| CN107590499B (en) | Video-based equipment LED indicator lamp state monitoring method and system | |
| CN106341682A (en) | Method, system and device for detecting aging function | |
| CN108614760B (en) | Information detection method, electronic equipment and computer readable storage medium | |
| CN110560376B (en) | Product surface defect detection method and device | |
| CN115908432B (en) | Material output quality detection system and prediction method | |
| CN109326125B (en) | Picture quality diagnosis system and method based on embedded system | |
| CN117314919B (en) | Packaging bag production analysis method, system and storage medium based on machine vision | |
| CN108614981A (en) | A kind of sample scan method and system | |
| CN110162001A (en) | Self-correction automotive department based on Internet of Things fills part production line detection system | |
| CN114518526A (en) | Automatic testing machine control system suitable for PCB board ICT | |
| CN103913150A (en) | Consistency detection method for electron components of intelligent ammeter | |
| CN104506848A (en) | An automated testing system for a set top box | |
| CN110751229A (en) | Visual inspection system and method | |
| CN110501534A (en) | A kind of PCBA test macro and its control method | |
| CN114486902B (en) | Quality detection system and method | |
| CN113709065A (en) | Automatic detection method, system, equipment and storage medium for panel light of switch | |
| CN210534004U (en) | LabVIEW-based vision detection system for automobile air conditioner controller | |
| CN111812117A (en) | Circuit board detection device, detection control interface and detection method thereof | |
| CN110907801A (en) | PCB testing method and device | |
| JP3264020B2 (en) | Inspection data creation method and mounted component inspection device | |
| CN109738158B (en) | Method and device for acquiring chrominance and luminance data based on AOI platform | |
| CN215297180U (en) | Optical detection system | |
| KR20070108594A (en) | Vision apparatus having selective irradiating function |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20200605 |