CN110988735A - Three-level module short circuit test method - Google Patents
Three-level module short circuit test method Download PDFInfo
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- CN110988735A CN110988735A CN201911259034.1A CN201911259034A CN110988735A CN 110988735 A CN110988735 A CN 110988735A CN 201911259034 A CN201911259034 A CN 201911259034A CN 110988735 A CN110988735 A CN 110988735A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R31/26—Testing of individual semiconductor devices
- G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
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Abstract
The invention relates to the technical field of detection, in particular to a three-level module short circuit testing method which comprises a TI tube testing process, a T2 tube and D1 tube testing process, a T3 tube and D2 tube testing process and four short circuit testing process parts of a T4 tube. The adding device in the test module comprises a flexible current loop, a k omega-level resistor and an adjustable direct current power supply. The invention can efficiently and quickly detect the stress of the three-level module under the limit working condition.
Description
Technical Field
The invention relates to the technical field of detection, in particular to a three-level module short circuit testing method.
Background
At present, the power grade of an inverter in the photovoltaic industry and a rectifier in the wind power industry is larger and larger, the size of a traditional low-voltage grade converter is larger and larger, the cost is increased, and the competitive advantage is lost. In order to solve the bottleneck problem, research and development investment is increased by various companies, and the voltage level of the converter is improved, the current is reduced, and the size and the cost of the converter are reduced. And the rated voltage grade of the power module can not meet the use requirement, so that the original two-level scheme is replaced by the three-level scheme. The three-level module has a complex structure and more examination parameters, and needs to be tested under the limit working condition in the test process. In order to save resources and improve the testing efficiency, a method capable of detecting the stress of the three-level module under the extreme condition needs to be designed.
Disclosure of Invention
The present invention is directed to a three-level module short circuit testing method to solve the problems set forth in the background art.
In order to achieve the purpose, the invention provides the following technical scheme:
a three-level module short circuit test method comprises a TI tube test flow, a T2 tube and D1 tube test flow, a T3 tube and D2 tube test flow and four short circuit test flow parts of a T4 tube.
Further: the adding device in the test module comprises a flexible current loop, a k omega-level resistor and an adjustable direct current power supply.
Further: a three-level module short circuit test method, the TI tube short circuit test flow in the method at least comprises the following steps:
adding a k omega-level resistor between two ON poles, connecting two ends of an O pole and an AC pole with a lead, marking the lead as a series connection of an ideal conductor and an air-core inductor with an inductance value within 100nH, respectively connecting an P, O pole with the anode and the cathode of an adjustable direct current power supply, and arranging a flexible current loop between the P pole of a capacitor C1 and the C pole of a T1 tube;
secondly, a C pole and an E pole of a T1 tube are respectively connected with two ends of an isolation voltage probe and used for monitoring Vce1 of the tube, a voltage driving signal Vge1 is added to the G pole and the E pole of a T1 tube to control the T1 tube to be switched on or off, a voltage driving signal Vge2 is added to the G pole and the E pole of a T2 tube to control the T2 tube to be switched on or off, and an oscilloscope is used for monitoring currents Icmax1, Vge1 and Vcemax1 of the T1 tube;
thirdly, giving forward voltage +15V to the Vge2 of the T2 tube, slowly charging the capacitor C1 to rated working voltage U by using an adjustable direct current power supply, obtaining a voltage driving signal +15V of the Vge1 of the T1 tube by using short-circuit protection logic in the power module in a normal state, and opening the time T to finish the test.
Further: a three-level module short circuit test method, wherein the short circuit test flow of a T2 tube and a D1 tube in the method at least comprises the following steps:
adding a k omega-level resistor between two ON poles, connecting two ends of an O pole and an AC pole with a lead, marking the lead as a series connection of an ideal conductor and an air-core inductor with an inductance value within 100nH, respectively connecting an P, O pole with the anode and the cathode of an adjustable direct current power supply, and arranging a flexible current loop between the C pole of a T2 tube and the E pole of a T1 tube;
secondly, a C pole and an E pole of the T2 tube are respectively connected with two ends of an isolation voltage probe and used for monitoring Vce2 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube to control the T2 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube to control the T3 tube to be switched on or off, and an oscilloscope is used for monitoring currents Icmax2, Vge2 and Vcemax2 of the T2 tube;
and thirdly, after the T3 tube is turned on, the T2 is turned on, forward voltage +15V is provided for the Vge3 of the T3 tube, the capacitor C2 is slowly charged with rated working voltage U by using an adjustable direct current power supply, short-circuit protection logic exists in the power module under a normal state, a voltage driving signal +15V of the Vge2 of the T2 tube is obtained, the time T is turned on, and the test is completed.
Further: a three-level module short circuit test method, wherein the short circuit test flow of a T3 tube and a D2 tube in the method at least comprises the following steps:
adding a k omega-level resistor between two ON poles, connecting two ends of an O pole and an AC pole with a lead, marking the lead as a series connection of an ideal conductor and an air-core inductor with an inductance value within 100nH, respectively connecting an P, O pole with the anode and the cathode of an adjustable direct current power supply, and arranging a flexible current loop between the E pole of a capacitor T2 and the C pole of a T3 tube;
secondly, a C pole and an E pole of the T3 tube are respectively connected with two ends of an isolation voltage probe and monitor Vce3 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube to control the T2 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube to control the T3 tube to be switched on or off, and an oscilloscope is used for monitoring currents Icmax3, Vge3 and Vcemax3 of the T3 tube;
and thirdly, after the T2 tube is turned on, the T3 tube is turned on, forward voltage +15V is applied to the Vge2 of the T2 tube, the capacitor C1 is slowly charged with rated working voltage U by using an adjustable direct-current power supply, short-circuit protection logic exists in the power module under a normal state, a voltage driving signal +15V of the Vge3 of the T3 tube is obtained, the time T is turned on, and the test is finished.
Further: a three-level module short circuit test method, wherein a short circuit test flow of a T4 tube in the method at least comprises the following steps:
adding a k omega-level resistor between two ON poles, connecting two ends of an O pole and an AC pole with a lead, marking the lead as a series connection of an ideal conductor and an air-core inductor with an inductance value within 100nH, respectively connecting an P, O pole with the anode and the cathode of an adjustable direct current power supply, and arranging a flexible current loop between the N pole of a capacitor C2 and the E pole of a T4 tube;
secondly, a C pole and an E pole of the T4 tube are respectively connected with two ends of an isolation voltage probe and monitor Vce4 of the tube, a voltage driving signal Vge4 is added to the G pole and the E pole of the T4 tube to control the T4 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube to control the T3 tube to be switched on or off, and an oscilloscope is used for monitoring currents Icmax4, Vge4 and Vcemax4 of the T4 tube;
thirdly, giving forward voltage +15V to the Vge3 of the T3 tube, slowly charging rated working voltage U to the capacitor C2 by using an adjustable direct current power supply, obtaining a voltage driving signal +15V of the Vge4 of the T4 tube by using short-circuit protection logic in the power module in a normal state, and opening time T to finish the test.
Further: the TI tube short circuit testing method can obtain Icmax1, Vge1 and Vcemax1 of a T1 tube and check whether the limit stress of the T1 tube meets the requirement, the T2 tube and D1 tube short circuit testing method can obtain Icmax2, Vge2 and Vcemax2 of a T2 tube and check whether the limit stress of the T2 tube meets the requirement, the T3 tube and D2 tube short circuit testing method can obtain Icmax3, Vge3 and Vcemax3 of the T3 tube and check whether the limit stress of the T3 tube meets the requirement, and the T4 tube short circuit testing method can obtain Icmax4, Vge4 and Vcemax4 of the T4 tube and check whether the limit stress of the T4 tube meets the requirement.
Further: the on-time T is 13 us.
The invention has the advantages that: the design can be used for testing a complex three-level module structure under the limit working condition with high efficiency and low cost. The on-off of the tested tube is controlled by applying a voltage driving signal to the tested tube, the short-circuit current of the tested tube is detected by the oscilloscope, and a conclusion is drawn.
Drawings
FIG. 1 is a schematic diagram of a diode clamping type three-level module according to the present invention;
FIG. 2 is a schematic diagram of the short circuit test of the T1 tube in the present invention;
FIG. 3 is a schematic diagram of the short circuit test of T2 and D1 tubes in the present invention;
FIG. 4 is a schematic diagram of the short circuit test of T3 and D2 tubes in the present invention;
FIG. 5 is a schematic diagram of the short circuit test of the T4 tube in the present invention;
FIG. 6 is a schematic diagram showing the waveform and coordinate comparison of the currents Ic, Vce, and Vge in the present invention.
In the figure: 101. a T1 tube; 102. a T2 tube; 103. a T3 tube; 104. a T4 tube; 201. a D1 tube; 202. a D2 tube; 301. a capacitance C1; 302. a capacitance C2; 501. a hollow-core inductor; 601. a flexible current loop; 701. a resistance of k omega level; 801. an adjustable DC power supply.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the equipment or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
Referring to fig. 1-6, the present invention provides a technical solution:
referring to fig. 1, a three-level module targeted by the test method includes P, O and N three poles, a capacitor C1301 is arranged between two PO poles, a capacitor C2302 is arranged between two ON poles, a T1 tube 101, a T2 tube 102, a T3 tube 103 and a T4 tube 104 are sequentially connected between two PN poles, an AC pole is arranged between the T2 tube 102 and the T3 tube 103, a current node between the T1 tube 101 and the T2 tube 102 and a current node between the T3 tube 103 and the T4 tube 104 are connected through a D1 tube 201 and a D2 tube 202 which are sequentially connected, and a D1 tube 201 and a D2 tube 202 are connected with an O pole.
The test method comprises a TI tube 101 test flow, a T2 tube 102 and D1 tube 201 test flow, a T3 tube 103 and D2 tube 202 test flow and four short circuit test flow parts of a T4 tube 104.
The additional devices in the test module comprise a flexible current loop 601, a k omega resistor 701 and an adjustable direct current power source 801.
Referring to fig. 2, a three-level module short circuit testing method, in which a short circuit testing process of a TI tube 101 at least includes the following steps:
firstly, a k omega-level resistor 701 is added between two poles of ON, two ends of an O pole and an AC pole are connected with a lead, the lead is marked as the series connection of an ideal conductor and an air-core inductor 501 with an inductance value within 100nH, an P, O pole is respectively connected with the anode and the cathode of an adjustable direct current power source 801, and a flexible current loop 601 is arranged between the P pole of a capacitor C1301 and the C pole of a T1 tube 101;
secondly, the C pole and the E pole of a T1 tube 101 are respectively connected with two ends of an isolation voltage probe and used for monitoring Vce1 of the tube, a voltage driving signal Vge1 is added to the G pole and the E pole of the T1 tube 101 to control the T1 tube to be switched on or off, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube 102 to control the T2 tube 102 to be switched on or off, and an oscilloscope is used for monitoring currents Icmax1, Vge1 and Vcemax1 of the T1 tube 102;
thirdly, giving forward voltage +15V to the Vge2 of the T2 tube 102, slowly charging the capacitor C1301 to rated working voltage U by using the adjustable direct current power supply 801, obtaining a voltage driving signal +15V and an opening time T of the T1 tube 101Vge1 by using short-circuit protection logic in the power module in a normal state, and finishing the test.
Referring to fig. 3, a three-level module short circuit testing method, in which a short circuit testing process of the T2 transistor 102 and the D1 transistor 201 at least includes the following steps:
firstly, a k omega-level resistor 701 is added between two poles of ON, two ends of an O pole and an AC pole are connected with a lead, the lead is marked as the series connection of an ideal conductor and an air-core inductor 501 with an inductance value within 100nH, an P, O pole is respectively connected with the anode and the cathode of an adjustable direct current power source 801, and a flexible current ring 601 is arranged between the C pole of a T2 tube 102 and the E pole of a T1 tube 101;
secondly, the C pole and the E pole of the T2 tube 102 are respectively connected with two ends of an isolation voltage probe and used for monitoring Vce2 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube 102 to control the T2 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube 103 to control the T3 tube 103 to be switched on or off, and an oscilloscope is used for monitoring currents Icmax2, Vge2 and Vcemax2 of the T2 tube 102;
and thirdly, after the T3 tube 103 is turned on, the T2102 is turned on, forward voltage +15V is supplied to the Vge3 of the T3 tube 103, the capacitor C2302 is slowly charged with rated working voltage U by the adjustable direct current power supply 801, short-circuit protection logic exists in the power module under a normal state, the voltage driving signal +15V of the T2 tube 102Vge2 is obtained, the time T is turned on, and the test is completed.
Referring to fig. 4, a three-level module short circuit testing method, in which a short circuit testing process of the T3 transistor 103 and the D2 transistor 202 at least includes the following steps:
firstly, a k omega-level resistor 701 is added between two poles of ON, two ends of an O pole and an AC pole are connected with a lead, the lead is marked as a series connection of an ideal conductor and an air-core inductor 501 with an inductance value within 100nH, an P, O pole is respectively connected with the anode and the cathode of an adjustable direct current power source 801, and a flexible current loop 601 is arranged between an E pole of a capacitor T2102 and a C pole of a T3 tube 103;
secondly, the C pole and the E pole of the T3 tube 103 are respectively connected with two ends of an isolation voltage probe and monitor Vce3 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube 102 to control the T2 tube 102 to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube 103 to control the T3 tube 103 to be switched on or off, and an oscilloscope is used for monitoring currents Icmax3, Vge3 and Vcemax3 of the T3 tube 103;
and thirdly, after the T2 tube 102 is turned on, the T3 tube 103 is turned on, forward voltage +15V is applied to the Vge2 of the T2 tube 102, the capacitor C1301 is slowly charged with rated working voltage U by the adjustable direct-current power supply 801, short-circuit protection logic exists in the power module under a normal state, the voltage driving signal +15V of the Vge3 of the T3 tube 103 is obtained, the time T is turned on, and the test is completed.
Referring to fig. 5, a three-level module short circuit testing method, in which a short circuit testing process of the T4 transistor 104 at least includes the following steps:
firstly, a k omega-level resistor 701 is added between two poles of ON, two ends of an O pole and an AC pole are connected with a lead, the lead is marked as the series connection of an ideal conductor and an air-core inductor 501 with an inductance value within 100nH, an P, O pole is respectively connected with the anode and the cathode of an adjustable direct current power source 801, and a flexible current loop 601 is arranged between the N pole of a capacitor C2302 and the E pole of a T4 tube 104;
secondly, the C pole and the E pole of a T4 tube 104 are respectively connected with two ends of an isolation voltage probe and monitor Vce4 of the tube, a voltage driving signal Vge4 is added to the G pole and the E pole of the T4 tube 104 to control the T4 tube 104 to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube 103 to control the T3 tube 103 to be switched on or off, and an oscilloscope is used for monitoring currents Icmax4, Vge4 and Vcemax4 of the T4 tube 104;
thirdly, giving positive voltage +15V to the Vge3 of the T3 tube 103, slowly charging the capacitor C2301 with rated working voltage U by using the adjustable direct current power supply 801, obtaining a voltage driving signal +15V and an opening time T of the Vge4 of the T4 tube 104 in a normal state by using short-circuit protection logic in the power module, and finishing the test.
Specifically, the TI tube 101 short circuit test method can obtain Icmax1, Vge1 and Vcemax1 of the T1 tube 101 and check whether the limit stress of the T1 tube 101 meets the requirement, the T2 tube 102 and the D1 tube 201 short circuit test method can obtain Icmax2, Vge2 and Vcemax2 of the T2 tube 102 and check whether the limit stress of the T2 tube 102 meets the requirement, the T3 tube 103 and the D2 tube 202 short circuit test method can obtain Icmax3, Vge3 and Vcemax3 of the T3 tube 103 and check whether the limit stress of the T3 tube 103 meets the requirement, and the T4 tube 104 short circuit test method can obtain Icmax4, Vge4 and Vcemax4 of the T4 tube 104 and check whether the limit stress of the T4 tube 104 meets the requirement.
Further, the on time T is 13 us.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (8)
1. A three-level module short circuit test method is characterized in that: the testing method comprises a TI tube (101) testing process, a T2 tube (102) and D1 tube (201) testing process, a T3 tube (103) and D2 tube (202) testing process and four short circuit testing process parts of a T4 tube (104).
2. The three-level module short circuit test method according to claim 1, characterized in that: the adding device in the test module comprises a flexible current loop (601), a k omega resistor (701) and an adjustable direct current power supply (801).
3. A three-level module short circuit test method according to claims 1 and 2, characterized in that: the short circuit testing process of the TI tube (101) at least comprises the following steps:
adding a k omega-level resistor (701) between two poles of ON, connecting two ends of an O pole and an AC pole with a lead, marking the lead as an ideal conductor and a series connection of an air-core inductor (501) with an inductance value of 100nH, respectively connecting the P, O poles with the anode and the cathode of an adjustable direct current power supply (801), and arranging a flexible current loop (601) between the P pole of a capacitor C1(301) and the C pole of a T1 tube (101);
secondly, a C pole and an E pole of a T1 tube (101) are respectively connected with two ends of an isolation voltage probe and used for monitoring Vce1 of the tube, a voltage driving signal Vge1 is added to the G pole and the E pole of the T1 tube (101) to control the T1 tube to be switched on or off, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube (102) to control the T2 tube (102) to be switched on or off, and an oscilloscope is used for monitoring currents Icmax1, Vge1 and Vcemax1 of the T1 tube (102);
thirdly, a positive voltage of +15V is given to the Vge2 of the T2 tube (102), the capacitor C1(301) is slowly charged to a rated working voltage U by the adjustable direct current power supply (801), and under a normal state, short-circuit protection logic exists in the power module, so that a voltage driving signal of +15V and an opening time T of the Vge1 of the T1 tube (101) are obtained, and the test is completed.
4. A three-level module short circuit test method according to claims 1 and 2, characterized in that: the short circuit test flow of the T2 tube (102) and the D1 tube (201) at least comprises the following steps:
adding a k omega-level resistor (701) between two poles of ON, connecting two ends of an O pole and an AC pole with a lead, marking the lead as an ideal conductor and a series connection of an air-core inductor (501) with an inductance value of 100nH, respectively connecting the P, O poles with the anode and the cathode of an adjustable direct current power supply (801), and arranging a flexible current loop (601) between the C pole of a T2 tube (102) and the E pole of a T1 tube (101);
secondly, the C pole and the E pole of the T2 tube (102) are respectively connected with two ends of an isolation voltage probe and used for monitoring Vce2 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube (102) to control the T2 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube (103) to control the T3 tube (103) to be switched on or off, and an oscilloscope is used for monitoring currents Icmax2, Vge2 and Vcemax2 of the T2 tube (102);
and thirdly, after the T3 tube (103) is turned on, the T2(102) is turned on, forward voltage +15V is provided for the Vge3 of the T3 tube (103), the capacitor C2(302) is slowly charged with rated working voltage U by using the adjustable direct current power supply (801), and in a normal state, short-circuit protection logic exists in the power module, so that the voltage driving signal +15V of the Vge2 of the T2 tube (102) is obtained, the turn-on time T is obtained, and the test is completed.
5. A three-level module short circuit test method according to claims 1 and 2, characterized in that: the short circuit test flow of the T3 tube (103) and the D2 tube (202) at least comprises the following steps:
adding a k omega-level resistor (701) between two poles of ON, connecting two ends of an O pole and an AC pole with a lead, marking the lead as an ideal conductor and a series connection of an air-core inductor (501) with an inductance value of 100nH, respectively connecting the P, O poles with the anode and the cathode of an adjustable direct current power supply (801), and arranging a flexible current loop (601) between the E pole of a capacitor T2(102) and the C pole of a T3 tube (103);
secondly, the C pole and the E pole of the T3 tube (103) are respectively connected with two ends of an isolation voltage probe and monitor Vce3 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube (102) to control the T2 tube (102) to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube (103) to control the T3 tube (103) to be switched on or off, and an oscilloscope is used for monitoring currents Icmax3, Vge3 and Vcemax3 of the T3 tube (103);
and thirdly, after the T2 tube (102) is turned on, the T3 tube (103) is turned on, the positive voltage +15V is applied to the Vge2 of the T2 tube (102), the capacitor C1(301) is slowly charged with the rated working voltage U by using the adjustable direct current power supply (801), the short-circuit protection logic exists in the power module under the normal state, the voltage driving signal +15V of the Vge3 of the T3 tube (103) is obtained, the turn-on time T is obtained, and the test is completed.
6. A three-level module short circuit test method according to claims 1 and 2, characterized in that: the short circuit test flow of the T4 pipe (104) at least comprises the following steps:
adding a k omega-level resistor (701) between two poles of ON, connecting two ends of an O pole and an AC pole with a lead, marking the lead as an ideal conductor and a series connection of an air-core inductor (501) with an inductance value of 100nH, respectively connecting the P, O poles with the anode and the cathode of an adjustable direct current power supply (801), and arranging a flexible current loop (601) between the N pole of a capacitor C2(302) and the E pole of a T4 tube (104);
secondly, the C pole and the E pole of the T4 tube (104) are respectively connected with two ends of an isolation voltage probe and monitor Vce4 of the tube, a voltage driving signal Vge4 is added to the G pole and the E pole of the T4 tube (104) to control the T4 tube (104) to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube (103) to control the T3 tube (103) to be switched on or off, and an oscilloscope is used for monitoring currents Icmax4, Vge4 and Vcemax4 of the T4 tube (104);
thirdly, giving a forward voltage of +15V to the Vge3 of the T3 tube (103), slowly charging a rated working voltage U to the capacitor C2(301) by using an adjustable direct current power supply (801), and obtaining a voltage driving signal of +15V and an opening time T of the Vge4 of the T4 tube (104) by using short-circuit protection logic in the power module under a normal state to finish the test.
7. The three-level module short circuit test method according to claim 3, characterized in that: the TI tube (101) short circuit test method can obtain Icmax1, Vge1 and Vcemax1 of a T1 tube (101) and check whether limit stress of the T1 tube (101) meets requirements, the T2 tube (102) and D1 tube (201) short circuit test method can obtain Icmax2, Vge2 and Vcemax2 of a T2 tube (102) and check whether limit stress of the T2 tube (102) meets requirements, the T3 tube (103) and D2 tube (202) short circuit test method can obtain Icmax3, Vge3 and Vcemax3 of the T3 tube (103) and check whether limit stress of the T3 tube (103) meets requirements, and the T4 tube (104) short circuit test method can obtain Icmax4, Vge4 and Vcemax4 of the T4 tube (104) and check whether limit stress of the T4 tube (104) meets requirements.
8. The three-level module short circuit test method according to claim 3, characterized in that: the on-time T is 13 us.
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