CN110988538A - Three-level module testing method - Google Patents
Three-level module testing method Download PDFInfo
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- CN110988538A CN110988538A CN201911259067.6A CN201911259067A CN110988538A CN 110988538 A CN110988538 A CN 110988538A CN 201911259067 A CN201911259067 A CN 201911259067A CN 110988538 A CN110988538 A CN 110988538A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2637—Circuits therefor for testing other individual devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
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Abstract
The invention relates to the technical field of detection, in particular to a three-level module testing method which comprises a TI tube testing process, a T2 tube and D1 tube testing process, a T3 tube and D2 tube testing process and a T4 tube testing process. The adding devices in the test module comprise a hollow inductor, a flexible current loop, a k omega-level resistor and an adjustable direct current power supply. The invention can comprehensively and systematically test the performance of the three-level module.
Description
Technical Field
The invention relates to the technical field of detection, in particular to a three-level module testing method.
Background
At present, the power grade of an inverter in the photovoltaic industry and a rectifier in the wind power industry is larger and larger, the size of a traditional low-voltage grade converter is larger and larger, the cost is increased, and the competitive advantage is lost. In order to solve the bottleneck problem, research and development investment is increased by various companies, and the voltage level of the converter is improved, the current is reduced, and the size and the cost of the converter are reduced.
And the rated voltage grade of the power module can not meet the use requirement, so that the original two-level scheme is replaced by the three-level scheme. The three-level module is complex in structure and more in assessment parameters, and needs to be tested comprehensively in the testing process, but the traditional testing mode can face the problems of testing cost and efficiency at the moment, so that the three-level module testing method is provided.
Disclosure of Invention
The present invention is directed to a method for testing a three-level module, so as to solve the problems mentioned in the background art.
In order to achieve the purpose, the invention provides the following technical scheme:
a three-level module test method comprises a TI tube test flow, a T2 tube and D1 tube test flow, a T3 tube and D2 tube test flow and a T4 tube test flow.
Further: the adding devices in the test module comprise a hollow inductor, a flexible current loop, a k omega-level resistor and an adjustable direct current power supply.
Further: a three-level module test method comprises the following steps: the TI tube testing method at least comprises the following steps:
adding a k omega-level resistor between two ON poles, connecting two ends of an O pole and an AC pole with an air-core inductor, wherein the inductance value L of the air-core inductor is within 20-100 uH, connecting an P, O pole with the anode and the cathode of an adjustable direct-current power supply respectively, and arranging a flexible current loop between the P pole of a capacitor C1 and the C pole of a T1 tube;
secondly, a C pole and an E pole of a T1 tube are respectively connected with two ends of an isolation voltage probe and monitor Vce1 of the tube, a voltage driving signal Vge1 is added to the G pole and the E pole of a T1 tube to control the T1 tube to be switched on or off, a voltage driving signal Vge2 is added to the G pole and the E pole of a T2 tube to control the T2 tube to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge1 and Vce1 of the T1 tube;
III,The positive voltage of Vge2 of a T2 tube is +15V, the capacitor C1 is slowly charged to the rated working voltage U by an adjustable direct current power supply, the working rated current of the T1 tube is Ic1 at the moment, and the formula is utilized
The voltage driving signal +15V and the opening time T of the tube Vge1 of T1 are obtained, and the voltage signal of T2 is generated again after the interval T1 after the T signal is generated, so that the test is completed.
Further: a three-level module testing method, the T2 tube and D1 tube testing method at least comprises the following steps:
adding a k omega-level resistor between two ON poles, connecting two ends of an O pole and an AC pole with an air-core inductor, wherein the inductance value L of the air-core inductor is within 20-100 uH, connecting an P, O pole with the anode and the cathode of an adjustable direct-current power supply respectively, and arranging a flexible current loop between the C pole of a T2 tube and the E pole of a T1 tube;
secondly, a C pole and an E pole of the T2 tube are respectively connected with two ends of an isolation voltage probe and monitor Vce2 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube to control the T2 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube to control the T3 tube to be switched on or off, and currents I, Vge2 and Vce2 of the T2 tube are monitored by using an oscilloscope;
thirdly, after a T3 tube is turned on, a T2 tube is turned on, forward voltage +15V is provided for Vge3 of the T3 tube, a capacitor C2 is slowly charged with rated working voltage U by an adjustable direct current power supply, the working rated current of a T2 tube is Ic2, and a formula is utilized
The voltage driving signal +15V and the on time T of the tube Vge2 of T2 are obtained, and after the T signal is generated, the voltage signal of T2 is generated again after an interval of T1, so that the test is completed.
Further: a three-level module test method comprises the following steps: the T3 tube and D2 tube testing method at least comprises the following steps:
a k omega-level resistor is arranged between two ON poles, two ends of an O pole and an AC pole are connected with an air-core inductor, the inductance value L of the air-core inductor is within 20-100 uH, the P, O pole is respectively connected with the anode and the cathode of an adjustable direct-current power supply, and a flexible current loop is arranged between the E pole of a capacitor T2 and the C pole of a T3 tube;
secondly, a C pole and an E pole of the T3 tube are respectively connected with two ends of an isolation voltage probe and monitor Vce3 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube to control the T2 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube to control the T3 tube to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge3 and Vce3 of the T3 tube;
thirdly, after a T2 tube is turned on, a T3 tube is turned on, positive voltage +15V is applied to a Vge2 of a T2 tube, an adjustable direct-current power supply is used for slowly charging a capacitor C1 to obtain rated working voltage U, the working rated current of a T3 tube is Ic3, and a formula is utilized
The voltage driving signal +15V of the tube Vge3 of T3 and the opening time T are obtained, and the voltage signal of T2 is generated again at an interval of T1 after the T signal is generated, so that the test is completed.
Further: a three-level module testing method, the testing method of the T4 tube at least comprises the following steps:
adding a k omega-level resistor between two ON poles, connecting two ends of an O pole and an AC pole with an air-core inductor, wherein the inductance value L of the air-core inductor is within 20-100 uH, connecting an P, O pole with the anode and the cathode of an adjustable direct-current power supply respectively, and arranging a flexible current loop between the N pole of a capacitor C2 and the E pole of a T4 tube;
secondly, a C pole and an E pole of the T4 tube are respectively connected with two ends of an isolation voltage probe and monitor Vce4 of the tube, a voltage driving signal Vge4 is added to the G pole and the E pole of the T4 tube to control the T4 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube to control the T3 tube to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge4 and Vce4 of the T4 tube;
thirdly, giving positive voltage +15V to Vge3 of a T3 tube, slowly charging rated working voltage U to a capacitor C2 by using an adjustable direct current power supply, setting the working rated current of the T4 tube to be Ic4 and according to a formula
The voltage driving signal +15V and the opening time T of the tube Vge4 of T4 are obtained, and the voltage signal of T2 is generated again at an interval of T1 after the T signal is generated, so that the test is completed.
Further: i, Vge1 and Vce1 of a T1 tube can be obtained by the TI tube testing method, I, Vge2 and Vce2 of a T2 tube can be obtained by the T2 tube and D1 tube testing method, I, Vge3 and Vce3 of the T3 tube can be obtained by the T3 tube and D2 tube testing method, and I, Vge4 and Vce4 of the T4 tube can be obtained by the T4 tube testing method; the four detection methods can obtain the turn-on or turn-off di/dt, du/dt, the voltage height delta U and the loop parasitic inductance L delta of the test circuit through waveforms.
Further: the calculation formula of the loop parasitic inductance L delta is that L delta is delta U/turn-off di/dt.
Further: the time intervals T1 and T2 are both 7us, and the on-time T is 13 us.
The invention has the advantages that: the design can carry out three-level module test with high efficiency and cost, and can comprehensively test the performance of the module. The on-off of the tested tube is controlled by applying a voltage driving signal to the tested tube, the current of the tested tube is detected by the oscilloscope, scientific calculation is carried out, the voltage height of the on-off and the loop parasitic inductance of the test circuit are obtained, and the whole design test structure is simple and convenient to operate.
Drawings
FIG. 1 is a schematic diagram of a diode clamping type three-level module according to the present invention;
FIG. 2 is a schematic diagram of the T1 tube test in the present invention;
FIG. 3 is a schematic representation of the T2 and D1 tube tests of the present invention;
FIG. 4 is a schematic representation of the T3 and D2 tube tests of the present invention;
FIG. 5 is a schematic diagram of the T4 tube test in the present invention;
FIG. 6 is a schematic diagram showing the waveform and coordinate comparison of current Ic, Vce, and Vge in the present invention;
FIG. 7 is a schematic diagram illustrating the waveform sequence comparison of the currents Ic, Vce, and Vge in the present invention.
In the figure: 101. a T1 tube; 102. a T2 tube; 103. a T3 tube; 104. a T4 tube; 201. a D1 tube; 202. a D2 tube; 301. a capacitance C1; 302. a capacitance C2; 401. a loop parasitic inductance; 501. a hollow-core inductor; 601. a flexible current loop; 701. a resistance of k omega level; 801. an adjustable DC power supply.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the equipment or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
Referring to fig. 1-7, the present invention provides a technical solution:
referring to fig. 1, a three-level module targeted by the test method includes P, O and N three poles, a capacitor C1301 is arranged between two PO poles, a capacitor C2302 is arranged between two ON poles, a T1 tube 101, a T2 tube 102, a T3 tube 103 and a T4 tube 104 are sequentially connected between two PN poles, an AC pole is arranged between the T2 tube 102 and the T3 tube 103, a current node between the T1 tube 101 and the T2 tube 102 and a current node between the T3 tube 103 and the T4 tube 104 are connected through a D1 tube 201 and a D2 tube 202 which are sequentially connected, and a D1 tube 201 and a D2 tube 202 are connected with an O pole.
The test method comprises four parts of a TI tube 101 test flow, a T2 tube 102 and D1 tube 201 test flow, a T3 tube 103 and D2 tube 202 test flow and a T4 tube 104 test flow.
The additional devices in the test module comprise an air-core inductor 501, a flexible current loop 601, a k omega resistor 701 and an adjustable direct current power source 801.
Referring to fig. 2, a three-level module testing method, the TI tube 101 testing process at least includes the following steps:
adding a k omega-level resistor 701 between two ON poles, connecting two ends of an O pole and an AC pole with an air-core inductor 501, wherein the inductance value L of the air-core inductor 501 is within 20-100 uH, connecting an P, O pole with the anode and the cathode of an adjustable direct-current power source 801 respectively, and arranging a flexible current ring 601 between the P pole of a capacitor C1301 and the C pole of a T1 tube 101;
secondly, the C pole and the E pole of a T1 tube 101 are respectively connected with two ends of an isolation voltage probe and used for monitoring Vce1 of the tube, a voltage driving signal Vge1 is added to the G pole and the E pole of the T1 tube 101 to control the T1 tube to be switched on or off, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube 102 to control the T2 tube 102 to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge1 and Vce1 of the T1 tube 102;
thirdly, a positive voltage of +15V is given by Vge2 of a T2 tube 102, a capacitor C1 is slowly charged to a rated working voltage U by an adjustable direct current power source 801, the working rated current of the T1 tube 101 at the moment is Ic1, and a formula is utilized
The voltage driving signal +15V and the opening time T of the tube Vge1 of T1 are obtained, and the voltage signal of T2 is generated again after the interval T1 after the T signal is generated, so that the test is completed.
Referring to fig. 3, a three-level module testing method, a testing process of the T2 transistor 102 and the D1 transistor 201 at least includes the following steps:
adding a k omega-level resistor 701 between two ON poles, connecting two ends of an O pole and an AC pole with an air-core inductor 501, wherein the inductance value L of the air-core inductor 501 is within 20-100 uH, connecting an P, O pole with the anode and the cathode of an adjustable direct-current power source 801 respectively, and arranging a flexible current loop 601 between the C pole of a T2 tube 102 and the E pole of a T1 tube 101;
secondly, the C pole and the E pole of the T2 tube 102 are respectively connected with two ends of an isolation voltage probe and monitor Vce2 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube 102 to control the T2 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube 103 to control the T3 tube 103 to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge2 and Vce2 of the T2 tube 102;
thirdly, after the T3 tube 103 is turned on, the T2102 is turned on, the positive voltage +15V is supplied to the Vge3 of the T3 tube 103, the capacitor C2302 is slowly charged with the rated working voltage U by the adjustable direct current power source 801, the working rated current of the T2 tube 102 is Ic2, and the formula is utilized
The voltage driving signal +15V and the on time T of the T2 tube 102Vge2 are obtained, and after the T signal is generated, the voltage signal of the T2 is generated again after an interval T1, thereby completing the test.
Referring to fig. 4, a three-level module testing method, the testing process of the T3 transistor 103 and the D2 transistor 202 at least includes the following steps:
a k omega-level resistor 701 is arranged between two ON poles, two ends of an O pole and an AC pole are connected with an air-core inductor 501, the inductance value L of the air-core inductor 501 is within 20-100 uH, an P, O pole is respectively connected with the positive pole and the negative pole of an adjustable direct-current power source 801, and a flexible current ring 601 is arranged between the E pole of a capacitor T2102 and the C pole of a T3 tube 103;
secondly, the C pole and the E pole of the T3 tube 103 are respectively connected with two ends of an isolation voltage probe and monitor Vce3 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube 102 to control the T2 tube 102 to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube 103 to control the T3 tube 103 to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge3 and Vce3 of the T3 tube 103;
thirdly, after the T2 tube 102 is opened, the T3 tube 103 is opened, the positive voltage +15V is supplied to the Vge2 of the T2 tube 102, the capacitor C1301 is slowly charged with the rated working voltage U by the adjustable direct current power source 801, the working rated current of the T3 tube 103 is Ic3, and the formula is utilized
The voltage driving signal +15V of the tube 103Vge3 of T3, the opening time T are obtained, and the voltage signal of T2 is generated again at an interval of T1 after the T signal is generated, so that the test is completed.
Referring to fig. 5, a three-level module testing method, the testing process of the T4 transistor 104 at least includes the following steps:
adding a k omega-level resistor 701 between two ON poles, connecting two ends of an O pole and an AC pole with an air-core inductor 501, wherein the inductance value L of the air-core inductor 501 is within 20-100 uH, connecting an P, O pole with the anode and the cathode of an adjustable direct-current power supply 801 respectively, and arranging a flexible current loop 601 between the N pole of a capacitor C2302 and the E pole of a T4 tube 104;
secondly, the C pole and the E pole of a T4 tube 104 are respectively connected with two ends of an isolation voltage probe and monitor Vce4 of the tube, a voltage driving signal Vge4 is added to the G pole and the E pole of the T4 tube 104 to control the T4 tube 104 to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube 103 to control the T3 tube 103 to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge4 and Vce4 of the T4 tube 104;
thirdly, the positive voltage +15V is supplied to the positive voltage Vge3 of the T3 tube 103, the rated working voltage U is slowly charged to the capacitor C2301 by the adjustable direct current power source 801, the working rated current of the T4 tube 104 is Ic4, and the current is calculated according to the formula
The voltage driving signal +15V and the opening time T of the tube 104Vge4 of the T4 are obtained, and the voltage signal of the T2 is generated again at an interval of T1 after the T signal is generated, so that the test is completed.
Further, I, Vge1 and Vce1 of a T1 tube 101 can be obtained by a test method for the TI tube 101, I, Vge2 and Vce2 of the T2 tube 102 can be obtained by a test method for the T2 tube 102 and a test method for the D1 tube 201, I, Vge3 and Vce3 of the T3 tube 103 can be obtained by a test method for the T3 tube 103 and a test method for the D2 tube 202, and I, Vge4 and Vce4 of the T4 tube 104 can be obtained by a test method for the T4 tube 104; the four detection methods can obtain the turn-on or turn-off di/dt, du/dt, the voltage height delta U and the loop parasitic inductance 401L delta of the test circuit through waveforms.
Specifically, the loop parasitic inductance 401L δ is calculated as L δ ═ Δ U/turn-off di/dt. Time intervals T1 and T2 are both 7us, and the on-time T is 13 us.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (9)
1. A three-level module test method is characterized in that: the test method comprises four parts of a TI tube (101) test flow, a T2 tube (102) and D1 tube (201) test flow, a T3 tube (103) and D2 tube (202) test flow and a T4 tube (104) test flow.
2. The method of claim 1, wherein the method further comprises: the adding device in the test module comprises an air-core inductor (501), a flexible current loop (601), a k omega-level resistor (701) and an adjustable direct current power supply (801).
3. A three-level module test method according to claims 1 and 2, characterized in that: the TI tube (101) testing process at least comprises the following steps:
adding a k omega-level resistor (701) between two ON poles, connecting two ends of an O pole and an AC pole with an air-core inductor (501), wherein the inductance value L of the air-core inductor (501) is within 20-100 uH, connecting P, O poles with the anode and the cathode of an adjustable direct-current power supply (801) respectively, and arranging a flexible current loop (601) between the P pole of a capacitor C1(301) and the C pole of a T1 tube (101);
secondly, a C pole and an E pole of a T1 tube (101) are respectively connected with two ends of an isolation voltage probe and used for monitoring Vce1 of the tube, a voltage driving signal Vge1 is added to the G pole and the E pole of the T1 tube (101) to control the T1 tube to be switched on or off, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube (102) to control the T2 tube (102) to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge1 and Vce1 of the T1 tube (102);
thirdly, a positive voltage of +15V is given by Vge2 of a T2 tube (102), a capacitor C1 is slowly charged to a rated working voltage U by an adjustable direct current power supply (801), the working rated current of the T1 tube (101) at the moment is Ic1, and a formula is utilized
The voltage driving signal +15V and the opening time T of the tube Vge1 of T1 are obtained, and the voltage signal of T2 is generated again after the interval T1 after the T signal is generated, so that the test is completed.
4. A three-level module test method according to claims 1 and 2, characterized in that: the T2 tube (102) and D1 tube (201) testing procedure at least comprises the following steps:
adding a k omega-level resistor (701) between two ON poles, connecting two ends of an O pole and an AC pole with an air-core inductor (501), wherein the inductance value L of the air-core inductor (501) is within 20-100 uH, connecting P, O poles with the anode and the cathode of an adjustable direct-current power supply (801) respectively, and arranging a flexible current loop (601) between the C pole of a T2 tube (102) and the E pole of a T1 tube (101);
secondly, the C pole and the E pole of the T2 tube (102) are respectively connected with two ends of an isolation voltage probe and monitor Vce2 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube (102) to control the T2 tube to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube (103) to control the T3 tube (103) to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge2 and Vce2 of the T2 tube (102);
thirdly, after a T3 tube (103) is turned on, a T2(102) is turned on, forward voltage +15V is provided for Vge3 of the T3 tube (103), a capacitor C2(302) is slowly charged with rated working voltage U by an adjustable direct current power supply (801), the working rated current of the T2 tube (102) is Ic2, and a formula is utilized
The voltage driving signal +15V and the on time T of the tube (102) Vge2 of T2 are obtained, and after the T signal is generated, the voltage signal of T2 is generated again after an interval of T1, so that the test is completed.
5. A three-level module test method according to claims 1 and 2, characterized in that: the T3 tube (103) and D2 tube (202) test flow at least comprises the following steps:
a k omega-level resistor (701) is arranged between two ON poles, two ends of an O pole and an AC pole are connected with an air-core inductor (501), the inductance value L of the air-core inductor (501) is within 20-100 uH, the P, O poles are respectively connected with the positive pole and the negative pole of an adjustable direct-current power supply (801), and a flexible current loop (601) is arranged between the E pole of a capacitor T2(102) and the C pole of a T3 tube (103);
secondly, the C pole and the E pole of the T3 tube (103) are respectively connected with two ends of an isolation voltage probe and monitor Vce3 of the tube, a voltage driving signal Vge2 is added to the G pole and the E pole of the T2 tube (102) to control the T2 tube (102) to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube (103) to control the T3 tube (103) to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge3 and Vce3 of the T3 tube (103);
thirdly, after a T2 tube (102) is turned on, a T3 tube (103) is turned on, the positive voltage +15V is applied to the positive voltage Vge2 of the T2 tube (102), an adjustable direct-current power supply (801) is used for slowly charging a capacitor C1(301) with rated working voltage U, the working rated current of the T3 tube (103) is Ic3, and a formula is utilized
The voltage driving signal +15V and the opening time T of the tube (103) Vge3 of T3 are obtained, and the voltage signal of T2 is generated again at an interval of T1 after the T signal is generated, so that the test is completed.
6. A three-level module test method according to claims 1 and 2, characterized in that: the test flow of the T4 pipe (104) at least comprises the following steps:
adding a k omega-level resistor (701) between two ON poles, connecting two ends of an O pole and an AC pole with an air-core inductor (501), wherein the inductance value L of the air-core inductor (501) is within 20-100 uH, connecting P, O poles with the anode and the cathode of an adjustable direct-current power supply (801) respectively, and arranging a flexible current loop (601) between the N pole of a capacitor C2(302) and the E pole of a T4 tube (104);
secondly, the C pole and the E pole of the T4 tube (104) are respectively connected with two ends of an isolation voltage probe and monitor Vce4 of the tube, a voltage driving signal Vge4 is added to the G pole and the E pole of the T4 tube (104) to control the T4 tube (104) to be switched on or off, a voltage driving signal Vge3 is added to the G pole and the E pole of the T3 tube (103) to control the T3 tube (103) to be switched on or off, and an oscilloscope is used for monitoring currents I, Vge4 and Vce4 of the T4 tube (104);
thirdly, a positive voltage of +15V is given to the Vge3 of a T3 tube (103), a rated working voltage U is slowly charged to a capacitor C2(301) by an adjustable direct current power supply (801), the working rated current of a T4 tube (104) is Ic4, and the current is calculated according to a formula
The voltage driving signal +15V and the opening time T of the tube (104) Vge4 of T4 are obtained, and the voltage signal of T2 is generated again at an interval of T1 after the T signal is generated, so that the test is completed.
7. A three-level module testing method according to claim 3, characterized in that: i, Vge1 and Vce1 of a T1 pipe (101) can be obtained by the TI pipe (101) testing method, I, Vge2 and Vce2 of a T2 pipe (102) can be obtained by the T2 pipe (102) and D1 pipe (201) testing method, I, Vge3 and Vce3 of a T3 pipe (103) can be obtained by the T3 pipe (103) and D2 pipe (202) testing method, I, Vge4 and Vce4 of a T4 pipe (104) can be obtained by the T4 pipe (104) testing method; the four test passing waveforms can obtain the turn-on or turn-off di/dt, du/dt, the voltage height delta U and the loop parasitic inductance (401) L delta of the test circuit.
8. The method of claim 7, wherein: the calculation formula of the loop parasitic inductance (401) L delta is that L delta is equal to delta U/turn-off di/dt.
9. A three-level module testing method according to claim 3, characterized in that: the time intervals T1 and T2 are both 7us, and the on-time T is 13 us.
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