CN110957287A - 一种大功率散热器及其制备方法 - Google Patents
一种大功率散热器及其制备方法 Download PDFInfo
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- CN110957287A CN110957287A CN201911301282.8A CN201911301282A CN110957287A CN 110957287 A CN110957287 A CN 110957287A CN 201911301282 A CN201911301282 A CN 201911301282A CN 110957287 A CN110957287 A CN 110957287A
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- 238000002360 preparation method Methods 0.000 title claims abstract description 23
- 239000002105 nanoparticle Substances 0.000 claims abstract description 27
- 238000005516 engineering process Methods 0.000 claims description 25
- 238000000034 method Methods 0.000 claims description 24
- 229910052782 aluminium Inorganic materials 0.000 claims description 22
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 22
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 21
- 238000000151 deposition Methods 0.000 claims description 21
- 239000000758 substrate Substances 0.000 claims description 18
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 15
- 229910052799 carbon Inorganic materials 0.000 claims description 13
- 238000004140 cleaning Methods 0.000 claims description 11
- 239000010949 copper Substances 0.000 claims description 11
- 238000001914 filtration Methods 0.000 claims description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 10
- 238000000541 cathodic arc deposition Methods 0.000 claims description 10
- 229910052802 copper Inorganic materials 0.000 claims description 10
- 238000007745 plasma electrolytic oxidation reaction Methods 0.000 claims description 10
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 9
- 239000011248 coating agent Substances 0.000 claims description 9
- 238000000576 coating method Methods 0.000 claims description 9
- 150000002500 ions Chemical class 0.000 claims description 9
- 229910052757 nitrogen Inorganic materials 0.000 claims description 9
- 239000001301 oxygen Substances 0.000 claims description 9
- 229910052760 oxygen Inorganic materials 0.000 claims description 9
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 8
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 8
- 239000007789 gas Substances 0.000 claims description 7
- 238000009413 insulation Methods 0.000 claims description 7
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 230000003647 oxidation Effects 0.000 claims description 7
- 238000007254 oxidation reaction Methods 0.000 claims description 7
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 6
- 238000010884 ion-beam technique Methods 0.000 claims description 6
- 229910052751 metal Inorganic materials 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 6
- 239000000203 mixture Substances 0.000 claims description 6
- -1 carbon ion Chemical class 0.000 claims description 5
- 230000001052 transient effect Effects 0.000 claims description 5
- 230000001590 oxidative effect Effects 0.000 claims description 4
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 claims description 3
- 229910001873 dinitrogen Inorganic materials 0.000 claims description 3
- 229910001882 dioxygen Inorganic materials 0.000 claims description 3
- 230000017525 heat dissipation Effects 0.000 abstract description 15
- 238000012360 testing method Methods 0.000 description 21
- 230000008021 deposition Effects 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 3
- 239000000945 filler Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011852 carbon nanoparticle Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
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- 238000011161 development Methods 0.000 description 1
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- 230000010354 integration Effects 0.000 description 1
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- 239000002923 metal particle Substances 0.000 description 1
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- 239000002120 nanofilm Substances 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- 230000009466 transformation Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
- H01L23/3672—Foil-like cooling fins or heat sinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4803—Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4803—Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
- H01L21/4807—Ceramic parts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3731—Ceramic materials or glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3736—Metallic materials
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
测试样品 | 热极温度(℃) | 冷极温度(℃) | 热量(W) | 压力(Psi) |
1 | 79.99 | 67.55 | 78.22 | 79.95 |
2 | 80.00 | 65.80 | 73.60 | 79.95 |
测试样品 | 热阻(m<sup>2</sup>K/W) | 热阻(K/W) | 整板厚度(mm) | 整板导热系数 |
1 | 0.0000516 | 0.081 | 1.01 | 19.57 |
2 | 0.0000435 | 0.045 | 1.01 | 23.22 |
Claims (10)
Priority Applications (1)
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CN201911301282.8A CN110957287A (zh) | 2019-12-17 | 2019-12-17 | 一种大功率散热器及其制备方法 |
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CN201911301282.8A CN110957287A (zh) | 2019-12-17 | 2019-12-17 | 一种大功率散热器及其制备方法 |
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Publication Number | Publication Date |
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CN110957287A true CN110957287A (zh) | 2020-04-03 |
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CN201911301282.8A Pending CN110957287A (zh) | 2019-12-17 | 2019-12-17 | 一种大功率散热器及其制备方法 |
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CN (1) | CN110957287A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114567967A (zh) * | 2020-11-27 | 2022-05-31 | 核工业西南物理研究院 | 一种高导热绝缘导热层的制备方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101545587A (zh) * | 2009-06-08 | 2009-09-30 | 刘素霞 | 一种高效散热半导体平面光源的制备方法 |
CN101661977A (zh) * | 2008-08-27 | 2010-03-03 | 北京盘天新技术有限公司 | 一种用于大功率led封装的绝缘金属基板的制备方法 |
CN102159024A (zh) * | 2011-02-28 | 2011-08-17 | 任正义 | 铝基印制电路板及其制备方法 |
-
2019
- 2019-12-17 CN CN201911301282.8A patent/CN110957287A/zh active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101661977A (zh) * | 2008-08-27 | 2010-03-03 | 北京盘天新技术有限公司 | 一种用于大功率led封装的绝缘金属基板的制备方法 |
CN101545587A (zh) * | 2009-06-08 | 2009-09-30 | 刘素霞 | 一种高效散热半导体平面光源的制备方法 |
CN102159024A (zh) * | 2011-02-28 | 2011-08-17 | 任正义 | 铝基印制电路板及其制备方法 |
Non-Patent Citations (1)
Title |
---|
赵永久: "《中国优秀硕士学位论文全文数据库信息科技辑》", 《中国优秀硕士学位论文全文数据库信息科技辑》 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114567967A (zh) * | 2020-11-27 | 2022-05-31 | 核工业西南物理研究院 | 一种高导热绝缘导热层的制备方法 |
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CB03 | Change of inventor or designer information |
Inventor after: Liao Bin Inventor after: OuYang Xiaoping Inventor after: Luo Jun Inventor after: Chen Lin Inventor after: Zhang Xu Inventor after: Wu Xianying Inventor after: Pang Pan Inventor after: Han Ran Inventor after: Yingminju Inventor before: Liao Bin Inventor before: Han Ran Inventor before: Yingminju Inventor before: OuYang Xiaoping Inventor before: He Guangyu Inventor before: He Weifeng Inventor before: Luo Jun Inventor before: Chen Lin Inventor before: Zhang Xu Inventor before: Wu Xianying Inventor before: Pang Pan |
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Application publication date: 20200403 |
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