CN110940898A

CN110940898A - Insulation and voltage resistance testing device for electric connector

Info

Publication number: CN110940898A
Application number: CN201910938630.6A
Authority: CN
Inventors: 刘凤; 王磊
Original assignee: CASIC Defense Technology Research and Test Center
Current assignee: CASIC Defense Technology Research and Test Center
Priority date: 2019-09-30
Filing date: 2019-09-30
Publication date: 2020-03-31

Abstract

The invention discloses an insulation and voltage resistance testing device of an electric connector, which comprises a control module, a testing channel switching module and an output end, wherein the control module is used for controlling the test module to be switched; the control module is connected with the test module; the test module is connected to the output end through the test channel switching module; the output end is connected with a pin of the electric connector to be tested; the test channel switching module is connected with the control module and can switch different pins/shells of the electric connector to be tested to be communicated with the test module under the control of the control module; the testing module comprises a first testing unit, a second testing unit and a third testing unit, wherein the first testing unit is used for testing the on-resistance of a single pin of the electric connector to be tested; the second testing unit is used for testing the two pairs of pins and the single pin of the electric connector to be tested, which are not communicated with each other, and the insulation resistance of the shell; the third test unit is used for carrying out withstand voltage test on the shell and two pairs of pins and a single pin of the electric connector to be tested, which are not communicated with each other.

Description

Insulation and voltage resistance testing device for electric connector

Technical Field

The invention relates to the technical field of electric connector testing, in particular to an electric connector insulation and voltage resistance testing device.

Background

The insulation resistance value and the alternating current/direct current withstand voltage leakage current value of the electronic component product, namely the electric connector, have strict standards, and the two electrical performance parameters need to be tested in practical application (such as delivery inspection and factory entry and retest of the electric connector) so as to judge whether the electrical performance index of the tested electric connector is qualified or not. At present, the problem of fussy contact and switching of a product to be tested exists in a testing device of an electric connector.

Disclosure of Invention

In view of the above, an objective of the present invention is to provide an electrical connector withstand voltage testing apparatus capable of quickly and accurately testing an electrical connector without manually switching a contact pair of the electrical connector to be tested.

The invention provides an insulation and voltage resistance testing device of an electric connector based on the aim, which comprises a control module, a testing channel switching module and an output end, wherein the control module is used for controlling the test module to perform the test;

the control module is connected with the test module and is used for controlling the test module to test the electric connector to be tested; the test module is connected to the output end through the test channel switching module; the output end is connected with a pin of the electric connector to be tested; the test channel switching module is connected with the control module and can switch different pins/shells of the electric connector to be tested to be communicated with the test module under the control of the control module;

the test module comprises a first test unit, a second test unit and a third test unit, wherein the first test unit is used for testing the on-resistance of a single pin of the electric connector to be tested; the second testing unit is used for testing two pairs of pins and a single pin of the electric connector to be tested, which are not communicated with each other, and the insulation resistance of the shell; and the third test unit is used for carrying out withstand voltage test on the shell and two pairs of pins and the single pin of the electric connector to be tested, which are not communicated with each other.

In one embodiment, the first testing unit comprises an on-resistance testing unit, a first relay set and a second relay set; the first relay group and the second relay group are respectively connected with two ends of a tested circuit; and the on-resistance testing unit is connected with the first relay group and the second relay group through a data communication line.

In one embodiment, the on-resistance testing unit includes a first single chip and a constant voltage source connected to the first single chip.

In one embodiment, the second test unit comprises an insulation resistance test unit, a second overvoltage protection unit, a second overcurrent protection unit, a third relay set and a fourth relay set; the third relay group and the fourth relay group are respectively connected with two ends of a tested circuit, the third relay group is connected with the second overvoltage protection unit, the second overvoltage protection unit is connected with the conduction resistance test unit, and the second overvoltage protection unit is used for performing overvoltage protection on the conduction resistance test unit; the fourth relay group is connected with the second overcurrent protection unit, the second overcurrent protection unit is connected with the conduction resistance test unit, and the first overcurrent protection unit is used for performing overcurrent protection on the conduction resistance test unit.

In one embodiment, the insulation resistance testing unit comprises a second singlechip and an insulation testing circuit connected with the second singlechip; the second overvoltage protection unit comprises a direct current sensor, an overvoltage protection circuit connected with the direct current sensor and an overvoltage protection relay drive locking circuit connected with the overvoltage protection circuit; the second overcurrent protection unit comprises an overcurrent protection relay drive locking circuit and an overcurrent protection circuit.

In one embodiment, the third testing unit comprises a voltage-withstanding leakage current testing unit, a third overvoltage protection unit, a third overcurrent protection unit, a fifth relay set and a sixth relay set; the fifth relay group and the sixth relay group are respectively connected with two ends of a tested circuit, the fifth relay group is connected with the third overvoltage protection unit, the third overvoltage protection unit is connected with the voltage-resistant leakage current, and the third overvoltage protection unit is used for performing overvoltage protection on the voltage-resistant leakage current test unit; the sixth relay set is connected with the third overcurrent protection unit, the third overcurrent protection unit is connected with the withstand voltage leakage current test unit, and the third overcurrent protection unit is used for performing overcurrent protection on the withstand voltage leakage current test unit.

In one embodiment, the voltage-withstanding leakage current testing unit comprises a third single chip microcomputer and an alternating current leakage current testing circuit connected with the third single chip microcomputer; the third overvoltage protection unit comprises a direct current sensor, an overvoltage protection circuit connected with the direct current sensor and an overvoltage protection relay drive locking circuit connected with the overvoltage protection circuit; the third overcurrent protection unit comprises an overcurrent protection relay drive locking circuit and an overcurrent protection circuit.

In one embodiment, the control module comprises:

the upper computer is used for processing the test data of the test module;

the communication control unit is used for receiving the test data of the test module, sending the test data to the upper computer, receiving the command of the upper computer and sending the command to the test module;

the relay matrix control unit is used for controlling the test channel switching module to switch;

and the system power supply unit is used for supplying electric energy to the upper computer, the communication control unit and the relay matrix control unit.

In one embodiment, the output end is a test jack and an adaptive electrical connector, the test jack is connected with the test channel module, the number of the test jacks is multiple, the adaptive electrical connector is connected with the test jack, and the adaptive electrical connector is used for connecting an electrical connector to be tested.

From the above, the insulation and voltage withstand testing device of the electrical connector provided by the invention sends the testing instruction to the testing module and the testing channel switching module through the control module; and the test channel switching module switches different pins of the electric connector to be tested to be communicated with the test module, and the test module tests different pins/shells of the electric connector to be tested, so that the quick and automatic test of the electric connector to be tested is realized. The insulation and voltage withstand test device of the electric connector can test the electric connector quickly and accurately without manually switching the contact pair of the electric connector to be tested.

Drawings

Fig. 1 is a block diagram of an electrical connector withstand voltage testing apparatus according to an embodiment of the present invention;

FIG. 2 is a block diagram of a first test unit according to an embodiment of the present invention;

FIG. 3 is a block diagram of a second test unit according to an embodiment of the present invention;

FIG. 4 is a block diagram of a third test unit according to an embodiment of the present invention;

FIG. 5 is a first schematic view of a mating electrical connector according to an embodiment of the present invention;

FIG. 6 is a second schematic view of the electrical adapter connector of the present invention;

FIG. 7 is a third schematic view of the mating electrical connector of the present invention;

fig. 8 is a schematic diagram of an apparatus for testing dielectric breakdown voltage of an electrical connector according to an embodiment of the present invention;

fig. 9 is a schematic view of a test socket of the dielectric strength tester of the electrical connector according to the embodiment of the invention;

the testing device comprises a control module 100, a testing module 200, a first testing unit 210, a first relay group 214, a second relay group 215, a second testing unit 220, an insulation resistance testing unit 221, a second overvoltage protection unit 222, a second overcurrent protection unit 223, a third relay group 224, a fourth relay group 225, a third testing unit 230, a withstand voltage leakage current testing unit 231, a third overvoltage protection unit 232, a third overcurrent protection unit 233, a fifth relay group 234, a sixth relay group 235, a testing channel switching module 300, an output end 400, a testing jack 410, a single-point testing jack 411, an adaptive electric connector 420, an electric connector to be tested 430, a single-row odd pin 421, a single-row even pin 422, a double-row odd pin 423, a double-row even pin 424, a shell 425, a single-ring odd pin 421 ', a single-ring even pin 422 ', a double-ring odd pin 423 ', a double-ring even pin 424 A case 425', a housing 500, a tablet computer 600, a USB interface 800, a power switch 900, a test on key 710, and a test off key 720.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to specific embodiments and the accompanying drawings.

At present, the test of the electric connector usually adopts a manual single-meter single-path test method. The test mode is as follows: testing the insulation resistance values between the contact pairs and between each contact pair and the metal shell one by using an insulation tester or a megger; and (4) using a withstand voltage tester to test the alternating current/direct current withstand voltage and leakage current between the contact pairs and between each contact pair and the metal shell one by one.

The inventor of the present application found that such a current situation and manner of the above-described electrical connector test and the manual test method have a great problem and disadvantage in the long-term insulation withstand voltage test of the electrical connector, and specifically, have the following problems.

The test workload is large: the connection sites of the electrical connector are in a matching connection with a different number of contact pairs (pin, hole connections), and there are many pairs of such contacts, generally from several contact pairs (pin, hole) to as many as hundreds of contact pairs (pin, hole). When manual testing is performed, each state or performance index of each contact pair needs to be tested item by item and point by point. Such as: setting test voltage by using an insulation tester or a megger, and carrying out insulation resistance test between contact pairs (such as between odd and even contacts; between rows) and between each contact pair and the metal shell one by one; similarly, a voltage tester is used for setting a test voltage (direct current or alternating current power frequency and voltage amplitude), and voltage resistance and leakage current tests are carried out between contact pairs (such as odd and even, and row-to-row) and between each contact pair and the metal shell. The testing method has the advantages of large workload of operators, time and labor waste, low efficiency and easy occurrence of hidden testing troubles caused by human factors.

The measurement precision is not easy to guarantee: because the test mode is that the tester operates the corresponding test instrument and meter, and the single-path test fixture is used for connecting the pin hole of the contact pair of the tested electric connector for testing, the measurement error caused by human factors is easy to introduce, and the test result is influenced.

The measurement data recording is difficult to trace back: the manual instrument is adopted for measurement, test data conclusion records need to be manually input into the computer again, the workload of an operator is increased, and the hidden danger of the measurement data during input errors also exists.

The potential safety hazard is big: because insulation resistance test and alternating current-direct current withstand voltage leakage current test all belong to high-voltage testing, test voltage is higher, and when personnel's operation switches test pin, in case the potential safety hazard easily appears in negligence. Aiming at the problems, the invention provides the electric connector insulation and voltage resistance testing device which can automatically and safely switch the pins of the electric connector to be tested, can accurately test and can automatically record test data.

Referring to fig. 1, the apparatus for testing withstand voltage of an electrical connector according to the present invention includes a control module 100, a test module 200, a test channel switching module 300, and an output terminal 400.

The control module 100 is connected to the test module 200, and is configured to control the test module 200 to test the electrical connector 430 to be tested; the test module 200 is connected to the output terminal 400 through the test channel switching module 300; the output end 400 is connected with a pin of the electric connector 430 to be tested; the test channel switching module 300 is connected to the control module 100, and can switch different pins/housings 425 of the electrical connector 430 to be tested to be communicated with the test module 200 under the control of the control module 100;

the test module 200 includes a first test unit 210, a second test unit 220, and a third test unit 230, where the first test unit 210 is used to test the on-resistance of a single pin of the electrical connector 430 to be tested; the second testing unit 220 is used for testing the two pairs of pins and the single pin of the electrical connector 430 to be tested, which are not communicated with each other, and the insulation resistance of the housing 425; the third testing unit 230 is used for performing a voltage withstand test on the housing 425 and two pairs of pins and a single pin of the electrical connector 430 to be tested, which are not communicated with each other.

The invention provides an insulation and voltage withstand test device of an electric connector, which sends a test instruction to a test module 200 and a test channel switching module 300 through a control module 100; the test channel switching module 300 switches different pins of the electrical connector 430 to be tested to communicate with the test module 200, and the test module 200 tests different pins/housings 425 of the electrical connector 430 to be tested, thereby implementing fast and automatic testing of the electrical connector 430 to be tested. The insulation and voltage withstand test device of the electric connector can test the electric connector quickly and accurately without manually switching the contact pair of the electric connector 430 to be tested.

The control module 100 includes: the device comprises an upper computer, an embedded microprocessor unit, a communication control unit and a relay matrix control unit. The upper computer includes but is not limited to a computer, and may be specifically the tablet pc 600, and the upper computer is used for processing the test data of the test module 200. The computer may further include a test software database for storing various standard parameters of the electrical connector 430 to be tested, and a display screen for comparing the parameters tested by each test unit with the various standard parameters. The display is used for displaying the test result. The result can visually and specifically display the test parameters in a table and graphic mode, and list set values, measured values, errors, and the conclusions of 'qualified' and 'unqualified'. Meanwhile, a 'help' information column is arranged in a title column above the test picture, the column is clicked, and a 'tester' gives a guide prompt of each step of operation and a prompt of each toolbar and a state file; the operation of the special steps is prompted to confirm; the method has the advantages that the help information is displayed, learning and mastering are easy, password management is set for key test points or test functions, misoperation is further prevented, and test safety is improved. The computer can also be provided with a voice prompt function, and can automatically broadcast the detection result and the actual use times of the output end 400. This voice prompt function need not the operator and watches the test result of display screen at every turn, only needs to hear relevant suggestion pronunciation and can master test result information, further improves efficiency of software testing, has reduced operator's working strength. Aiming at the tested data, the computer can also store the tested data in a database and export the data to a specified directory for storage in a Word or Excel form.

And the embedded microprocessor unit and the communication control unit are used for receiving the test data of the test module 200, sending the test data to the upper computer, receiving the command of the upper computer and sending the command to the test module 200. The relay matrix control unit is used for controlling the test channel switching module 300 to switch. The relay matrix control unit works as follows: STM32F107 is used as a main controller, and a serial controller is selected in a line decoding mode to control a basic point, so that the purpose of controlling an independent switch point is finally achieved. The control module 100 further comprises a system power supply unit for supplying electric energy to the upper computer, the communication control unit and the relay matrix control unit.

Preferably, the control module 100 further includes a printer, which is connected to the upper computer and directly prints the test data of the test module 200 received from the upper computer into paper, so as to facilitate checking and archiving.

Referring to fig. 2, the first testing unit 210 includes an on-resistance testing unit, a first relay set 214 and a second relay set 215; the first relay group 214 and the second relay group 215 are respectively connected with two ends of a tested line; and the on-resistance testing unit is connected with the first relay group and the second relay group through a data communication line.

Preferably, the first testing unit 210 further includes an overcurrent monitoring protection alarm unit and a data compensation measuring unit, and is configured to protect the electrical connector withstand voltage testing apparatus when the electrical connector to be tested is abnormal, protect the electrical connector to be tested 430 when the electrical connector withstand voltage testing apparatus is abnormal, and provide correction and compensation of the measured data.

The on-resistance testing unit 211 includes a first single chip microcomputer and a constant voltage source connected to the first single chip microcomputer. The first singlechip can be a C8051F020 singlechip. The singlechip is internally provided with a 16-bit high-resolution ADC (analog-to-digital converter) so as to further improve the precision of the circuit for testing the insulation resistance. The single chip microcomputer can receive instruction information sent to the communication control unit by the upper computer, analyze the instruction information and execute the conduction resistance test according to the instruction.

Specifically, during testing, the on-resistance testing unit controls the constant voltage source to output constant voltage to the testing bus according to command parameters of the upper computer, the relay matrix control unit opens switches of corresponding relay groups, the constant voltage source is enabled to output from a first testing pin in a testing range, meanwhile, voltage is collected at other testing pins (not including a current testing pin) in the testing range, if the tested pin has a conduction (short circuit) relationship, the voltage can be collected at other pins, a dichotomy is adopted for traversing subsequently to detect the pin having the conduction relationship with the testing pin, and after the first pin is tested, the electric connector insulation and voltage resistance testing device automatically and sequentially traverses pins which need to be tested subsequently.

It should be noted that when the open-circuit (pin-shrinking) pin is found during the test, the tested electrical connector can be determined to be unqualified without further test, i.e. without performing insulation resistance test and dielectric strength test. During testing, firstly conducting on-resistance testing, and then conducting insulation resistance and dielectric strength testing when all pins are qualified, so that the phenomena of arcing (surface discharge), spark discharge (air discharge) or breakdown (breakdown discharge) and the like generated by the open-circuit (pin-retracting) pins during the dielectric strength testing can be effectively avoided.

Referring to fig. 3, the second test unit 220 includes an insulation resistance test unit 221, a second overvoltage protection unit 222, a second overcurrent protection unit 223, a third relay set 224, and a fourth relay set 225; the third relay set 224 and the fourth relay set 225 are respectively connected to two ends of a tested line, the third relay set 224 is connected to the second overvoltage protection unit 222, the second overvoltage protection unit 222 is connected to the on-resistance test unit 211, and the second overvoltage protection unit 222 is configured to perform overvoltage protection on the on-resistance test unit 211; the fourth relay set 225 is connected to the second overcurrent protection unit 223, the second overcurrent protection unit 223 is connected to the on-resistance test unit 211, and the first overcurrent protection unit 213 is configured to perform overcurrent protection on the on-resistance test unit 211.

Further, the second testing unit 220 further includes a power-off protection relay, an overvoltage protection relay, an overcurrent protection relay, and a current-limiting protection resistor. The secondary power supply is connected with a current-limiting protection resistor through the power-off protection relay, the overvoltage protection relay and the overcurrent protection relay, and the current-limiting protection resistor is connected with the insulation resistance testing unit 221, the second overvoltage protection unit 222 and the second overcurrent protection unit 223 in parallel.

Preferably, the second testing unit 220 further includes an overcurrent monitoring protection alarm unit and a data compensation measuring unit, and is configured to protect the electrical connector withstand voltage testing apparatus when the electrical connector to be tested is abnormal, protect the electrical connector to be tested 430 when the electrical connector withstand voltage testing apparatus is abnormal, and provide correction and compensation of the measured data.

The insulation resistance test unit 221 comprises a second single chip microcomputer and an insulation test circuit connected with the second single chip microcomputer; the second overvoltage protection unit 222 includes a dc sensor, an overvoltage protection circuit connected to the dc sensor, and an overvoltage protection relay driving locking circuit connected to the overvoltage protection circuit; the second overcurrent protection unit 223 includes an overcurrent protection relay drive locking circuit and an overcurrent protection circuit.

The second singlechip can be a C8051F020 singlechip. The single chip microcomputer can be internally provided with a 12-bit high-resolution AD conversion function (converting an analog signal into a digital signal) so as to further improve the precision of the circuit for testing the insulation resistance. The single chip microcomputer can receive instruction information sent to the communication control unit by the upper computer, analyze the instruction information and execute insulation resistance test according to the instruction.

Specifically, during testing, a direct-current high-voltage source signal is applied to the bus. The direct-current high-voltage source signal drives the third relay set 224 and the fourth relay set 225 to switch to different test loops through the control of the test channel switching module 300, so as to realize the insulation resistance test between the pins of the electrically-connected device and between the pins and the housing 425. After the test is finished, the C8051F020 single chip microcomputer uploads all measured results to a main control processor STM32F107 in the control module 100, the results are uploaded to an upper computer by the main control processor STM32F107, and the upper computer compares the measured values with the set standard values to give a conclusion of qualification or not.

The second testing unit 220 can simultaneously test the insulation resistance between any two pairs of pins that are not connected in all the electrical connectors 430 to be tested under the condition of applying the rated direct current voltage, test the insulation resistance between any pin and the housing 425, and give a result of whether the insulation test is qualified.

The circuit for testing the insulation resistance adopts high-stability and programmable direct-current voltage, overcurrent protection and overvoltage protection are taken into consideration in the circuit, and meanwhile, in the signal processing stage, a high-precision low-temperature-drift operational amplifier is adopted, so that the precision of the insulation resistance test is further improved. Specifically, the voltage regulation range is DC 50-1000V, the test voltage precision is +/- + (rated value multiplied by 1.0% +5V), the insulation resistance test range is 0.1M omega-10G omega, the test resistance precision is +/-5%, and the test time range is (0.1-60) S.

The third testing unit 230 comprises a withstand voltage and leakage current testing unit 231, a third overvoltage protection unit 232, a third overcurrent protection unit 233, a fifth relay set 234 and a sixth relay set 235; the fifth relay group 234 and the sixth relay group 235 are respectively connected to two ends of a tested line, the fifth relay group 234 is connected to the third overvoltage protection unit 232, the third overvoltage protection unit 232 is connected to the withstand voltage and leakage current, and the third overvoltage protection unit 232 is configured to perform overvoltage protection on the withstand voltage and leakage current test unit 231; the sixth relay set 235 is connected to the third overcurrent protection unit 233, the third overcurrent protection unit 233 is connected to the voltage-withstanding leakage current test unit 231, and the third overcurrent protection unit 233 is configured to perform overcurrent protection on the voltage-withstanding leakage current test unit 231.

The voltage-withstanding leakage current testing unit 231 comprises a third single chip microcomputer and an alternating current leakage current testing circuit connected with the third single chip microcomputer; the third overvoltage protection unit 232 includes a dc sensor, an overvoltage protection circuit connected to the dc sensor, and an overvoltage protection relay driving locking circuit connected to the overvoltage protection circuit; the third overcurrent protection unit 233 includes an overcurrent protection relay driving locking circuit and an overcurrent protection circuit.

Preferably, the third testing unit 230 further includes a secondary power supply unit, a power-off protection relay, an overvoltage protection relay, an overcurrent protection relay, and a current-limiting protection resistor. The secondary power supply is connected with a current-limiting protection resistor through the power-off protection relay, the overvoltage protection relay and the overcurrent protection relay, and the current-limiting protection resistor is connected with the on-resistance testing unit 211, the first overvoltage protection unit 212 and the first overcurrent protection unit 213 in parallel. The two-pole power supply unit is used for converting external alternating current into required direct current low voltage: 12V, 5V, 3.3V, 2.5V and the like, and provides power for the control circuit.

Further, the third testing unit 230 further includes an overcurrent monitoring protection alarm unit and a data compensation measuring unit, and is configured to protect the electrical connector withstand voltage testing apparatus when the electrical connector to be tested is abnormal, protect the electrical connector to be tested 430 when the electrical connector withstand voltage testing apparatus is abnormal, and provide correction and compensation of the measured data.

The third singlechip can be a C8051F340 singlechip. The single chip microcomputer can receive instruction information sent to the communication control unit by the upper computer, analyze the instruction information and execute the electric strength test according to the instruction.

Specifically, during testing, a programmable AC/DC high-voltage source signal is applied to the bus. The single chip microcomputer C8051F340 in the third testing unit 230 receives the direct-current high-voltage source signal, and receives an instruction of a testing channel sent by the main controller STM32F107 in the control module 100, so that the programmable alternating-current high-voltage source signal is controlled to be switched to different testing loops through the fifth relay set 234 and the sixth relay set 235, and the dielectric strength test between the pins of the connected electrical connector and between the pins and the housing 425 is realized. After the test is finished, the C8051F340 singlechip uploads all measured results to a main control processor STM32F107 in the control module 100, then the results are uploaded to an upper computer by the main control processor STM32F107, and the upper computer compares the measured values with the set standard values to give a conclusion of qualification or not.

The third testing unit 230 can simultaneously perform the voltage withstand and leakage current test on any two pairs of pins which are not connected in all the electrical connectors 430 to be tested under the condition of applying the rated power frequency alternating current voltage, perform the voltage withstand and leakage current test on any pin and the housing 425, and give a result of whether the voltage withstand test is qualified.

The circuit for the electric strength test adopts a high-stability and programmable alternating-current high-voltage source, an over-current protection circuit and an over-voltage protection circuit are simultaneously arranged in the circuit, and a high-precision low-temperature-drift operational amplifier is adopted in a signal processing stage so as to further improve the precision of the circuit test leakage current. Specifically, when the voltage is direct current voltage, the voltage regulation range is DC program control regulation of 50-1500V; the precision of the test voltage is +/- (rated value multiplied by 1% + 5V); the test current range is 0.1 mA-5 mA; the precision of the test current is +/-plus or minus (rated value multiplied by 5% +20 uA); the test time ranges from 0.1s to 60 s. When the voltage is alternating current voltage, the voltage regulation range is 50-2300V of AC program control regulation; the leakage current test range is 0.1 MA-5 mA; the precision of the test current is +/-plus or minus (rated value multiplied by 5% +20 uA); the test voltage waveform is 50Hz sine wave; the testing time range is (1-255) s, and the factory setting is 1 s.

The test channel switching module 300 includes a relay set sequentially connected to the first test unit 210, the second test unit 220, and the third test unit 230, respectively. The test channel switching module 300 is capable of receiving commands of the controller STM32F107 of the relay matrix control unit in the control module 100. Specifically, the STM32F107 main controller is connected with each relay of the relay group through a data communication line, and each relay is controlled independently. The test channel switching module 300 may form a test channel capable of being combined arbitrarily to connect with a pin required to be tested by the electrical connector 430 to be tested under the control of the relay matrix control unit.

Specifically, the output terminal 400 includes a test socket 410 connected with the test channel module and an adaptive electrical connector 420 connected with the test socket 410. The number of the test jacks 410 is set to be plural, and the test jacks are used for performing single-point test on the on-resistance of the electrical connector 430 to be tested. The number of the test jacks 410 is the same as the number of the relays of the relay group, and the test jacks 410 are in one-to-one correspondence with the relays of the relay group respectively.

Referring to fig. 9, the number of the test sockets 410 may be set to 9, and two tested electrical connectors may be connected simultaneously, and the test is performed by connecting the housings 500 of all the tested electrical connectors.

The pins of the electrical adapter connector 420 are classified into a single row odd pin 421, a single row even pin 422, a double row odd pin 423, a double row even pin 424, and a housing 425. During testing, the single-row odd pins 421 and the double-row odd pins 423, the single-row even pins 422 and the double-row even pins 424, the single-row odd pins 421 and the single-row even pins 422, and all the pins and the housing 425 form a tested circuit. Referring to fig. 5-6, the mating electrical connector 420 can be a rectangular electrical connector or a circular electrical connector.

Preferably, the circular electrical connector may be separated into lines in units of rows, or separated into lines in units of rings, as shown in fig. 7. When branching is performed in units of rings, the pins may be classified into five types of pins, i.e., a single ring odd pin 421 ', a single ring even pin 422 ', a double ring odd pin 423 ', a double ring even pin 424 ', and a housing 425 '.

Through the above classification, only three tests are needed to be performed on the insulation resistance value and the voltage-withstanding leakage current value of the electrical connector 430 to be tested, that is, during the test, a single row of pins tests a double row of pins or a single ring tests an even ring, an odd number of pins tests an even number of pins, and all pins test a shell, so that the test of one electrical connector can be completed. The insulation and voltage withstand test device of the electric connector provided by the invention radically improves the prior discrete test method by matching the control module 100 with the test module 200. The insulation resistance and the alternating current-direct current withstand voltage leakage current value of all pin combinations can be tested through one-time connection, the low efficiency and the potential safety hazard of manual switching are avoided through the channel switching extension mechanism, the labor intensity is reduced, and the testing efficiency is improved. Therefore, the insulation and voltage withstand test device of the electric connector provided by the invention can test the electric connector quickly and safely when in use.

When the electric connector insulation and voltage resistance testing device provided by the invention is used, testing parameters need to be set according to the type of an electric connector to be tested. The parameters comprise parameter settings of three items of an on-resistance test, an insulation resistance test and an alternating current/direct current withstand voltage/leakage current (dielectric strength) test, and settings of functions such as display, alarm, printing and the like, and the settings are stored in a database of a computer by names designated by a user and are called during automatic test. The database of the computer is used as the background of the whole testing device and is used for storing and managing information such as various testing parameter settings, each testing result, self-checking result, measurement error table and the like, a unified management mode is adopted, the functions of inquiry and statistics are integrated, and the database can be conveniently backed up and restored.

The insulation and voltage-withstand test device of the electric connector combines the tests of three high-voltage electrical parameters of the insulation resistance and the alternating current-direct current voltage-withstand leakage current of the electric connector, and completely has the capability of quickly testing the high-voltage electrical parameters of the connected electric connector by mounting the tested electric connector once. Before use, corresponding test parameters can be set according to different electrical connectors 430 to be tested: insulation test voltage, insulation resistance threshold value, test time and the number of tested pieces; and parameters such as voltage resistance test voltage, voltage resistance leakage current threshold, test time, the number of tested pieces and the like. Self-checking can also be carried out rapidly: performing self-checking on whether the high-voltage switch circuit is normal or not; self-checking whether the insulation test function and the test precision of each gear are normal or not; and carrying out self-checking on whether the test function and the test precision of the electric strength of each file are normal or not, and generating a self-checking report. When the test device is used, the test can be carried out only by connecting the electric connector 430 to be tested with the adaptive electric connector 420, the relay matrix control unit controls the test channel switching module 300 to switch different relays, the single-row odd pins 421, the single-row even pins 422, the double-row odd pins 423, the double-row even pins 424 and the shell 425 of the electric connector 430 to be tested are automatically switched, manual intervention is not needed, the total parameter values of various combinations can be tested by carrying out 6 times of tests, and the electric connector with the fault can be quickly screened out. When used, if the test result is different (or out of tolerance) from the value in the standard database, for example: when the insulation resistance is unqualified and the withstand voltage leakage current is unqualified, sound, light and voice alarm signals are given out, and an error information table is formed so as to be convenient for searching and correcting. After the test is accomplished, show the test result on the display screen to report through voice prompt function, need not the operator and watch the test result of display screen at every turn, only need hear relevant suggestion pronunciation and can grasp test result information, further improve efficiency of software testing, reduced operator's working strength. The test data result can be printed and stored through a printer, and tracing is convenient.

Referring to fig. 8, an embodiment of the invention further provides a schematic diagram of an apparatus for testing dielectric breakdown voltage of an electrical connector. The insulation and voltage withstand test device of the electric connector is in a single instrument form. The testing device is provided with a shell 500, and the shell 500 is sequentially provided with a tablet personal computer 600, a testing jack 410, a USB interface 800, a power switch 900, a single-point testing jack 411, a testing start key 710 and a testing stop key 720 from top to bottom and from left to right.

Specifically, the tablet pc 600 is used for running a system core of a test program for collecting and processing various test data, and performing human-computer interaction. The USB interface 800 is used to connect external USB port devices. The power switch 900 is used to control the main power switch for powering up the tester. The single-point test jack 411 is used for performing a single-point test on the on-resistance. The test start key 710 and the test stop key 720 are used to control the tester to start and stop the test.

It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are used for distinguishing two entities with the same name but different names or different parameters, and it should be noted that "first" and "second" are merely for convenience of description and should not be construed as limitations of the embodiments of the present invention, and they are not described in any more detail in the following embodiments.

Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, is limited to these examples; within the idea of the invention, also features in the above embodiments or in different embodiments may be combined, steps may be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity.

In addition, well known power/ground connections to Integrated Circuit (IC) chips and other components may or may not be shown within the provided figures for simplicity of illustration and discussion, and so as not to obscure the invention. Furthermore, devices may be shown in block diagram form in order to avoid obscuring the invention, and also in view of the fact that specifics with respect to implementation of such block diagram devices are highly dependent upon the platform within which the present invention is to be implemented (i.e., specifics should be well within purview of one skilled in the art). Where specific details (e.g., circuits) are set forth in order to describe example embodiments of the invention, it should be apparent to one skilled in the art that the invention can be practiced without, or with variation of, these specific details. Accordingly, the description is to be regarded as illustrative instead of restrictive.

While the present invention has been described in conjunction with specific embodiments thereof, many alternatives, modifications, and variations of these embodiments will be apparent to those of ordinary skill in the art in light of the foregoing description. For example, other memory architectures (e.g., dynamic ram (dram)) may use the discussed embodiments.

The embodiments of the invention are intended to embrace all such alternatives, modifications and variances that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, substitutions, improvements and the like that may be made without departing from the spirit and principles of the invention are intended to be included within the scope of the invention.

Claims

1. An insulation and voltage withstand test device of an electric connector is characterized by comprising a control module, a test channel switching module and an output end;

2. The electrical connector withstand voltage testing device according to claim 1, wherein the first testing unit includes an on-resistance testing unit, a first relay group, and a second relay group; the first relay group and the second relay group are respectively connected with two ends of a tested circuit; and the on-resistance testing unit is connected with the first relay group and the second relay group through a data communication line.

3. The electrical connector withstand voltage testing device according to claim 2, wherein the on-resistance testing unit comprises a first single chip microcomputer and a constant voltage source connected to the first single chip microcomputer.

4. The electrical connector withstand voltage testing device according to claim 1, wherein the second testing unit comprises an insulation resistance testing unit, a second overvoltage protection unit, a second overcurrent protection unit, a third relay set and a fourth relay set; the third relay group and the fourth relay group are respectively connected with two ends of a tested circuit, the third relay group is connected with the second overvoltage protection unit, the second overvoltage protection unit is connected with the conduction resistance test unit, and the second overvoltage protection unit is used for performing overvoltage protection on the conduction resistance test unit; the fourth relay group is connected with the second overcurrent protection unit, the second overcurrent protection unit is connected with the conduction resistance test unit, and the first overcurrent protection unit is used for performing overcurrent protection on the conduction resistance test unit.

5. The electrical connector withstand voltage testing device according to claim 4, wherein the insulation resistance testing unit comprises a second single chip microcomputer and an insulation testing circuit connected with the second single chip microcomputer; the second overvoltage protection unit comprises a direct current sensor, an overvoltage protection circuit connected with the direct current sensor and an overvoltage protection relay drive locking circuit connected with the overvoltage protection circuit; the second overcurrent protection unit comprises an overcurrent protection relay drive locking circuit and an overcurrent protection circuit.

6. The electrical connector withstand voltage testing device of claim 1, wherein the third testing unit comprises a withstand voltage and leakage current testing unit, a third overvoltage protection unit, a third overcurrent protection unit, a fifth relay set and a sixth relay set; the fifth relay group and the sixth relay group are respectively connected with two ends of a tested circuit, the fifth relay group is connected with the third overvoltage protection unit, the third overvoltage protection unit is connected with the voltage-resistant leakage current, and the third overvoltage protection unit is used for performing overvoltage protection on the voltage-resistant leakage current test unit; the sixth relay set is connected with the third overcurrent protection unit, the third overcurrent protection unit is connected with the withstand voltage leakage current test unit, and the third overcurrent protection unit is used for performing overcurrent protection on the withstand voltage leakage current test unit.

7. The electrical connector insulation voltage withstand test device of claim 6, wherein the voltage withstand leakage current test unit comprises a third single chip microcomputer and an alternating current leakage current test circuit connected with the third single chip microcomputer; the third overvoltage protection unit comprises a direct current sensor, an overvoltage protection circuit connected with the direct current sensor and an overvoltage protection relay drive locking circuit connected with the overvoltage protection circuit; the third overcurrent protection unit comprises an overcurrent protection relay drive locking circuit and an overcurrent protection circuit.

8. The electrical connector withstand voltage testing apparatus according to any one of claims 1 to 7, wherein the control module includes:

the upper computer is used for processing the test data of the test module;

9. The electrical connector withstand voltage testing device according to any one of claims 1 to 7, wherein the output terminals are a testing jack and an adaptive electrical connector, the testing jack is connected with the testing channel module, the number of the testing jacks is multiple, the adaptive electrical connector is connected with the testing jack, and the adaptive electrical connector is used for connecting an electrical connector to be tested.