CN108469569A - A kind of Intelligentized test system for electric coupler - Google Patents
A kind of Intelligentized test system for electric coupler Download PDFInfo
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- CN108469569A CN108469569A CN201810036994.0A CN201810036994A CN108469569A CN 108469569 A CN108469569 A CN 108469569A CN 201810036994 A CN201810036994 A CN 201810036994A CN 108469569 A CN108469569 A CN 108469569A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a kind of Intelligentized test system for electric coupler, the unit of testing and controlling being connect including computer and with computer, it further include the adapter of electric connector, the adapter includes openable adaptation module and fixed pedestal, insulation inner core is equipped in the adaptation module, gold-plated insulated hanger is housed, the pedestal is equipped with test probe on insulation inner core；It is additionally provided with monolithic processor control device and Inverse problem and drive dynamic control device between the unit of testing and controlling and computer, the monolithic processor control device respectively with the break-make and contact resistance microcontroller test cell, pressure-resistant microcontroller test cell and the connection of insulation resistance microcontroller test cell, the Inverse problem and drive dynamic control device is connect with monolithic processor control device, switched with unit of testing and controlling switching and the test in the multiple holes of electric connector, it is applicable in the precision measurement of various electric connector many kinds of parameters, with fully functional, test is accurate, efficient advantage.
Description
Technical field
The present invention relates to the intelligent test fields of electronic component products, particularly relate to a kind of electric connector intelligence survey
Test system.
Background technology
Currently, the various parameters of this electronic component products of low-frequency electric connector have stringent standard, actually answering
It is required to do it test of various classical insulations in, the electricity function index to judge tested electric connector is qualified
Whether.Such as：The on off operating mode of connector contact pair is tested, the contact resistance of each contact between is tested, the electric continuity shell
Test, the megger test that each contact is between and any contact pair is between shell and alternating current-direct current pressure resistance leakage current
(or：Dielectric strength) test etc..
At this stage, to two kinds of test methods of the test generally use of low-frequency electric connector：A kind of method is single instrument by hand
The mode of single-path testing method, the test is：Tester using various single-path testing instruments, survey item by item by electricity function index
Examination, such as：The on off operating mode of each contact pair of electric connector and Static Contact resistance, electrically continuous is measured using low resistance tester
Property (contact resistance of shell)；Using insulation tester or megger, test contact is between and each contact pair and metal one by one
Insulating resistance value between shell；Using pressure tester, test contact is between and each contact pair and metal shell one by one
Between carry out alternating current-direct current pressure resistance leak electricity current test.The side of this present situation and mode and manual test of low-frequency electric connector test
Method is embodied in the following aspects there are prodigious problem and shortage：1, test job amount is big, and 2, measurement accuracy is not easy to protect
Card, 3, measurement data record retrospect it is difficult.
Another method is integrated test facility, which is：Using the electric connector synthesis having on the market at present
Test system carries out electric connector the follow-on test of every unit for electrical property parameters.The test system has the following disadvantages：1, it needs
It replaces different adapter realizations to test the tested electric connector of different model, but needs to dismantle when more changer adapter
Adapter Cable, and the connector on Adapter Cable has certain service life, plug repeatedly easily causes contact to abrasion, to shadow
The precision for ringing measurement data, causes to being judged by accident by test specimen；2, the electric connector negligible amounts of batch test, testing efficiency
It is undesirable, it is difficult to meet large batch of test needs；3, low (the Insulation test voltage of the test voltage of the test system：1000V、
Voltage-withstand test voltage：It can not 1500V) cover the electric connector test needs of more specifications and models；4, it can only realize that single-point connects
Resistance test is touched, contact resistance can not be measured at a high speed.
Invention content
In view of this, it is an object of the invention to propose one kind can solve in background technology test result it is inaccurate and
When test fee, laborious, inefficient, test data be difficult to automatically record, adapter reliability low (short life), contact pair contact electricity
Resistance can not automatic measurement, the electric connector test of more changer adapter the technical issues of need to largely plugging Adapter Cable etc. every time
System.
Based on a kind of above-mentioned purpose Intelligentized test system for electric coupler provided by the invention, including computer and with meter
The unit of testing and controlling of calculation machine connection, further includes the adapter of electric connector, the adapter includes openable adaptation module
With fixed pedestal, the adaptation module is interior to be equipped with insulation inner core, and gold-plated insulated hanger is housed on the inner core that insulate, is set on the pedestal
There is test probe；
The unit of testing and controlling include break-make with contact resistance microcontroller test cell, pressure-resistant microcontroller test cell with
And insulation resistance microcontroller test cell；
The break-make is used to detect the break-make situation of electric connector with contact resistance microcontroller test cell and detection contacts
Resistance parameter；
The pressure resistance microcontroller test cell is used to detect the pressure-resistant parameter of electric connector；
The insulation resistance microcontroller test cell is used to detect the insulation parameter of electric connector；
It is additionally provided with monolithic processor control device and Inverse problem and driving between the unit of testing and controlling and computer
Control device, the monolithic processor control device respectively with the break-make and contact resistance microcontroller test cell, pressure-resistant monolithic
Machine test cell and the connection of insulation resistance microcontroller test cell, the Inverse problem and drive dynamic control device and microcontroller
Control device connects, and is switched with unit of testing and controlling switching and the test in the multiple holes of electric connector.
Further, the adaptation module and the pedestal are to be threadedly coupled or be clamped.
Further, the circuit of the break-make and contact resistance microcontroller test cell detection contact resistance parameter includes：
First singlechip and the first signal conditioning circuit being connect with the first singlechip and second signal conditioning electricity
Road, first signal conditioning circuit is connected with the first bus and the second bus by the first operational amplifier, described first
Detection cable is distributed between bus and second bus, the second signal modulate circuit is connect with second operational amplifier,
The second operation method device both ends are parallel with the first scale value resistance, the first scale value resistance one end ground connection, first mark
The other end of value resistance is connected with third bus, and the third bus parallel connection has the first relay group, the first relay group
Corresponding with detection cable, the other end of the detection cable corresponding with the first relay group is provided with the second relay
Group, the second relay group are provided with relay pair, and by described by the 4th bus parallel connection between adjacent detection cable
Relay with first bus and the second bus to connecting respectively.
Further, the circuit of the pressure-resistant parameter of the pressure-resistant microcontroller test cell detection electric connector includes：
First current limiting safeguard resistor, with the concatenated third relay group of first current limiting safeguard resistor, the 4th relay
Group, third operational amplifier and four-operational amplifier, the third relay group, the 4th relay group, third operation amplifier
Device and four-operational amplifier are parallel with direct current transducer, and the direct current transducer is parallel with overvoltage crowbar and overvoltage protection
Relay driving lock-in circuit, the third operational amplifier are connected with insulated measurement circuits and microcontroller, the 4th operation
Amplifier in parallel has the second scale value resistance and current foldback circuit and overcurrent protection relay driving lock-in circuit.
Further, the circuit of the insulation parameter of the insulation resistance microcontroller test cell detection electric connector includes：
Second current limiting safeguard resistor, with the concatenated 5th relay group of second current limiting safeguard resistor, the 6th relay
Group, the 5th operational amplifier and the 6th operational amplifier, the 5th relay group, the 6th relay group, the 5th operation amplifier
Device and the 6th operational amplifier are parallel with direct current transducer, and the direct current transducer is parallel with overvoltage crowbar and overvoltage protection
Relay driving lock-in circuit, the 5th operational amplifier are connected with insulated measurement circuits and microcontroller, the 6th operation
Amplifier in parallel has third scale value resistance and current foldback circuit and overcurrent protection relay driving lock-in circuit.
Further, the computer further includes database and display, the database purchase electric connector it is various
Standard parameter, and the parameter of more each test cell test and various standard parameters, the display compare for showing
Result.
Further, the computer further includes user authority management unit, and the encryption and safety for the system are grasped
Make.
Further, the computer is also associated with printer.
From the above it can be seen that Intelligentized test system for electric coupler provided by the invention, including computer and
The unit of testing and controlling being connect with computer, further includes the adapter of electric connector, and the adapter includes openable adaptation
Module and fixed pedestal, the adaptation module is interior to be equipped with insulation inner core, and gold-plated insulated hanger, the pedestal are housed on the inner core that insulate
It is equipped with test probe；It is additionally provided with monolithic processor control device and Inverse problem between the unit of testing and controlling and computer
And drive dynamic control device, the monolithic processor control device respectively with the break-make and contact resistance microcontroller test cell, resistance to
Press microcontroller test cell and the connection of insulation resistance microcontroller test cell, the Inverse problem and drive dynamic control device with
Monolithic processor control device connects, and is switched with unit of testing and controlling switching and the test in the multiple holes of electric connector.The present invention is real
The Intelligentized test system for electric coupler for applying example is applicable in the precision measurement of various electric connector many kinds of parameters, have it is fully functional,
Test accurately and efficiently advantage.
Description of the drawings
Fig. 1 is the frame diagram of the Intelligentized test system for electric coupler of the embodiment of the present invention；
Fig. 2 is the break-make and contact resistance microcontroller test list of the Intelligentized test system for electric coupler of the embodiment of the present invention
The circuit diagram of member；
Fig. 3 is the circuit of the pressure-resistant microcontroller test cell of the Intelligentized test system for electric coupler of the embodiment of the present invention
Figure；
Fig. 4 is the electricity of the insulation resistance microcontroller test cell of the Intelligentized test system for electric coupler of the embodiment of the present invention
Lu Tu；
Fig. 5 is the adapter structure schematic diagram of the Intelligentized test system for electric coupler of the embodiment of the present invention；
Fig. 6 is the adaptation module connection diagram of the Intelligentized test system for electric coupler of the embodiment of the present invention.
Specific implementation mode
To make the objectives, technical solutions, and advantages of the present invention clearer, below in conjunction with specific embodiment, and reference
Attached drawing, the present invention is described in more detail.
A kind of Intelligentized test system for electric coupler provided by the invention, including computer and the survey that is connect with computer
Control unit is tried, further includes the adapter of electric connector, the adapter includes openable adaptation module and fixed pedestal,
It is equipped with insulation inner core in the adaptation module, gold-plated insulated hanger is housed on the inner core that insulate, the pedestal is equipped with test probe；
The unit of testing and controlling include break-make with contact resistance microcontroller test cell, pressure-resistant microcontroller test cell with
And insulation resistance microcontroller test cell；
The break-make is used to detect the break-make situation of electric connector with contact resistance microcontroller test cell and detection contacts
Resistance parameter；
The pressure resistance microcontroller test cell is used to detect the pressure-resistant parameter of electric connector；
The insulation resistance microcontroller test cell is used to detect the insulation parameter of electric connector；
It is additionally provided with monolithic processor control device and Inverse problem and driving between the unit of testing and controlling and computer
Control device, the monolithic processor control device respectively with the break-make and contact resistance microcontroller test cell, pressure-resistant monolithic
Machine test cell and the connection of insulation resistance microcontroller test cell, the Inverse problem and drive dynamic control device and microcontroller
Control device connects, and is switched with unit of testing and controlling switching and the test in the multiple holes of electric connector.
The Intelligentized test system for electric coupler of the embodiment of the present invention is applicable in the accurate of various electric connector many kinds of parameters and surveys
Examination has fully functional, test accurately and efficiently advantage.
Fig. 1 is the frame diagram of the Intelligentized test system for electric coupler of the embodiment of the present invention, it can be seen from the figure that this reality
The Intelligentized test system for electric coupler for applying example includes computer and the unit of testing and controlling being connect with computer (i.e. test master
Machine), further include the adapter of electric connector, the adapter includes openable adaptation module and fixed pedestal, described suitable
With insulation inner core is equipped in module, gold-plated insulated hanger is housed on the inner core that insulate, the pedestal is equipped with test probe；
The unit of testing and controlling include break-make with contact resistance microcontroller test cell, pressure-resistant microcontroller test cell with
And insulation resistance microcontroller test cell；
The break-make is used to detect the break-make situation of electric connector with contact resistance microcontroller test cell and detection contacts
Resistance parameter；
The pressure resistance microcontroller test cell is used to detect the pressure-resistant parameter of electric connector；
The insulation resistance microcontroller test cell is used to detect the insulation parameter of electric connector；
It is additionally provided with monolithic processor control device and Inverse problem and driving between the unit of testing and controlling and computer
Control device, the monolithic processor control device respectively with the break-make and contact resistance microcontroller test cell, pressure-resistant monolithic
Machine test cell and the connection of insulation resistance microcontroller test cell, the Inverse problem and drive dynamic control device and microcontroller
Control device connects, and is switched with unit of testing and controlling switching and the test in the multiple holes of electric connector.
The Intelligentized test system for electric coupler of the embodiment of the present invention is applicable in the accurate of various electric connector many kinds of parameters and surveys
Examination has fully functional, test accurately and efficiently advantage.
Fig. 2 is the break-make and contact resistance microcontroller test list of the Intelligentized test system for electric coupler of the embodiment of the present invention
The circuit diagram of member.On off test principle is as follows：The C8051F020 microcontrollers of the unit receive main control processor STM32F107's
Instruction is analyzed and according to instruction execution continuity test, applies DC low-voltage signal in bus, which passes through channel plate
Upper any high-voltage relay is switched to different test loops, realizes the continuity test to measured piece internal wiring, C8051F020
Microcontroller judges that connection relation (break-make result) all inside measured piece is uploaded to main control processor STM32F107, then by leading
Control processor STM32F107 is uploaded to host computer, by host computer to the standard connection relation of test result and setting
It is compared, provides qualified or not conclusion.Resistance test principle is as follows：The C8051F020 microcontrollers of the unit receive master control
The instruction of processor STM32F107 is analyzed and according to instruction execution resistance test, applies DC constant current power supply signal in bus,
The DC constant current power supply signal is switched to different test loops by any high-voltage relay on channel plate, realizes in measured piece
The resistance of portion's each wire is tested, and two paths of signals is compared by C8051F020 microcontrollers, and result is reached master control
Processor, main control processor STM32F107's is uploaded to host computer by all resistance values of measurement, by host computer pair
It measures resistance value to be compared with setting resistance standard value, provides qualified or not conclusion.Circuit is using high stable, program-controlled tune
Constant-current source is saved, test electric current is up to 100mA, test resistance range：10m Ω~100K Ω.Relay channel uses double-contact
Relay realizes that four-wire system measuring resistance, one pair of which contact are used for through electric current, and another pair contact takes voltage, to reach
The purpose of voltage is taken from tested cable root, can ensure the precision of test to greatest extent in this way.Simultaneously in signal processing stage,
Using High Precision Low Temperature drift operational amplifier, 12 high-resolution AD conversion functions built in used C8051F020 microcontrollers,
Further improve the precision of circuit test resistance.
Fig. 3 is the circuit of the pressure-resistant microcontroller test cell of the Intelligentized test system for electric coupler of the embodiment of the present invention
Figure.Voltage-withstand test principle is as follows:The unit is equipped with the program controlled alternating current high-voltage power supply for being up to AC2300V, by the unit
C8051F020 microcontrollers receive the instruction of main control processor STM32F107, analyze and according to instruction execution megger test,
Apply ac high-voltage source signal in bus, which is switched to not by any high-voltage relay on channel plate
Same test loop realizes that all results of measurement are uploaded to by the megger test to measured piece, C8051F020 microcontrollers
Main control processor STM32F107, then host computer is uploaded to by main control processor STM32F107, by host computer to surveying
Magnitude is compared with established standards value, provides qualified or not conclusion.
For circuit using high stable, program-controlled high-voltage power supply, voltage regulation limits are AC50~2300V, leakage current test scope：
0.1mA~5mA is taken into account overcurrent protection, overvoltage protection in circuit, while in signal processing stage, being floated and being transported using High Precision Low Temperature
Amplifier is calculated, 12 high-resolution AD conversion functions built in used microcontroller further improve circuit test leakage current
Precision.
Fig. 4 is the electricity of the insulation resistance microcontroller test cell of the Intelligentized test system for electric coupler of the embodiment of the present invention
Lu Tu.The unit is equipped with program-controlled DC high-voltage source, and the C8051F020 microcontrollers of the unit receive main control processor
The instruction of STM32F107 is analyzed and according to instruction execution megger test, applies high direct voltage source signal in bus, should
High direct voltage source signal is switched to different test loops by any high-voltage relay on channel plate, realizes to the exhausted of measured piece
All results of measurement are uploaded to main control processor STM32F107 by edge resistance test, C8051F020 microcontrollers, then by master control
Processor STM32F107 is uploaded to host computer, is compared, is provided with established standards value to measured value by host computer
Qualified or not conclusion.For circuit using high stable, program-controlled high-voltage power supply, voltage regulation limits are DC50~1000V, insulation resistance
Test scope：0.1M Ω~10G Ω take into account overcurrent protection, overvoltage protection in circuit, while in signal processing stage, using height
Precision Low Drift Temperature operational amplifier, 12 high-resolution AD conversion functions built in used microcontroller, further improves electricity
Drive test tries the precision of insulation resistance.
Fig. 5 is the adapter structure schematic diagram of the Intelligentized test system for electric coupler of the embodiment of the present invention.Adapter packet
Openable adaptation module and fixed pedestal are included, insulation inner core is equipped in the adaptation module, equipped with gold-plated on the inner core that insulate
Insulated hanger, the pedestal are equipped with test probe.Servo electric jar, the work of the servo electric jar are provided in adapter babinet
Moved end is connect with sliding needle plate, and the test probe on the sliding needle plate can be pierced by from the pin hole on the pedestal, the adaptation
Module is removably connect with the pedestal, and when the adaptation module is connect with the pedestal, the test probe is extend into
In-core in the insulation.
Fig. 6 is the adaptation module connection diagram of the Intelligentized test system for electric coupler of the embodiment of the present invention.It is described suitable
Orchestration further includes locking device (diagram E), when the adaptation module is connected with the pedestal, by the locking device by institute
Adaptation module is stated to fix.
The Intelligentized test system for electric coupler of the embodiment of the present invention will be previous discrete by system module integrated technology
Test method has made the improvement of essence, and primary connection can test the electric parameter of all the points.In addition, computer is also associated with
Printer.
Test system can item-dividing test or automation all tests.
When work, need that test parameter is first arranged, parameter include continuity test, contact resistance test, megger test,
Pressure-resistant leakage current (dielectric strength) tests the parameter setting of four projects, and the shielding of the naming method of test point, test point is arranged,
And to display, the setting of the functions such as alarm, printing, which is used for creating, changing test parameter, and these are set
It is preserved in the database with the title that user specifies, is called in automatic test.
Backstage of the database of this system as whole system is arranged, every time for storing and managing various test parameters
The information such as test result, self-detection result, measurement error table inquiry, statistical function are integrated using unified way to manage, can
Easily to back up and restore database.
After adapter is connect with tested connector, different test parameters can be inputted to system, you can complete conducting and survey
Examination, contact resistance test, megger test and pressure-resistant leakage current (dielectric strength) are tested, and different test results is obtained,
Be transferred to database, system can compare these different test results with the test parameter being formerly arranged, and store and it is defeated
Go out, show, if desired, printer can be connected, complete printing.The system can realize continuity test, conducting resistance test,
Multiple test functions such as Insulation test and voltage-withstand test, can be completed at the same time test, substep individual event can also survey as needed
Examination.
Computer further includes user authority management unit, is used for the encryption and safety operation of the system.
The service management unit can specify a variety of user right ranks, user to use the code entry system of oneself, only
Energy an operation manager give the software section for allowing permission, for example test parameter, Backup and Restore number can be arranged in engineer's permission
According to library, self-test etc. is carried out to system, and operator cannot operate then without this permission；And the other user of supervisor level then can be into
The configuration of row total system user
Isolation power supply is used to be isolated the interference of power grid to entire test system power supply；Host computer is surveyed as entire
Control, measurement and the data processing centre of test system control test system host by upper software and switch to corresponding test
Channel is realized to tested electric connector：On/off state (with the presence or absence of states such as short circuit, open circuits), contact resistance test (electricity
Connector pin, hole contact resistance), electric continuity test (metal shell contact resistance), megger test (between core and core,
Core and shell), the unit for electrical property parameters such as dielectric strength (between core and core, core and shell) tested, it is logical by testing system host
Test data result is transferred to host computer by letter network interface, is carried out test result and standard database by testing system software
Comparison carries out interpretation to test result, display summarizes and records.Adapter interconnecting module is for installing the tested electrical connection of user
Device is, it can be achieved that more of once mounting is tested automatically by test specimen, while to more electric connectors, so as to shorten the testing time,
Improve testing efficiency, at the same the interconnecting module it is quick detachable replace, service life it is long.
It should be noted that all statements for using " first " and " second " are for differentiation two in the embodiment of the present invention
The non-equal entity of a same names or non-equal parameter, it is seen that " first " " second " only for the convenience of statement, does not answer
It is interpreted as the restriction to the embodiment of the present invention, subsequent embodiment no longer illustrates this one by one.
Those of ordinary skills in the art should understand that：The discussion of any of the above embodiment is exemplary only, not
It is intended to imply that the scope of the present disclosure (including claim) is limited to these examples；Under the thinking of the present invention, above example
Or can also be combined between the technical characteristic in different embodiments, step can be realized with random order, and be existed such as
Many other variations of the different aspect of the upper present invention, for simplicity, they are not provided in details.
In addition, to simplify explanation and discussing, and in order not to obscure the invention, it can in the attached drawing provided
To show or can not show that the well known power ground with integrated circuit (IC) chip and other components is connect.Furthermore, it is possible to
Device is shown in block diagram form, to avoid obscuring the invention, and this has also contemplated following facts, i.e., about this
The details of the embodiment of a little block diagram arrangements is the platform that height depends on to implement the present invention (that is, these details should
It is completely within the scope of the understanding of those skilled in the art).Detail (for example, circuit) is being elaborated to describe the present invention's
In the case of exemplary embodiment, it will be apparent to those skilled in the art that can be in these no details
In the case of or implement the present invention in the case that these details change.Therefore, these descriptions should be considered as explanation
Property rather than it is restrictive.
Although having been incorporated with specific embodiments of the present invention, invention has been described, according to retouching for front
It states, many replacements of these embodiments, modifications and variations will be apparent for those of ordinary skills.Example
Such as, other memory architectures (for example, dynamic ram (DRAM)) can use discussed embodiment.
The embodiment of the present invention be intended to cover fall within the broad range of appended claims it is all it is such replace,
Modifications and variations.Therefore, all within the spirits and principles of the present invention, any omission, modification, equivalent replacement, the improvement made
Deng should all be included in the protection scope of the present invention.
Claims (8)
1. a kind of Intelligentized test system for electric coupler, which is characterized in that the test being connect including computer and with computer
Control unit, further includes the adapter of electric connector, and the adapter includes openable adaptation module and fixed pedestal, institute
It states and is equipped with insulation inner core in adaptation module, gold-plated insulated hanger is housed on the inner core that insulate, the pedestal is equipped with test probe；
The unit of testing and controlling includes break-make and contact resistance microcontroller test cell, pressure-resistant microcontroller test cell and absolutely
Edge resistance microcontroller test cell；
The break-make is used to detect the break-make situation and detection contact resistance of electric connector with contact resistance microcontroller test cell
Parameter；
The pressure resistance microcontroller test cell is used to detect the pressure-resistant parameter of electric connector；
The insulation resistance microcontroller test cell is used to detect the insulation parameter of electric connector；
It is additionally provided with monolithic processor control device and Inverse problem and drive control between the unit of testing and controlling and computer
Device, the monolithic processor control device are surveyed with the break-make and contact resistance microcontroller test cell, pressure-resistant microcontroller respectively
It tries unit and the connection of insulation resistance microcontroller test cell, the Inverse problem and drive dynamic control device is controlled with microcontroller
Device connects, and is switched with unit of testing and controlling switching and the test in the multiple holes of electric connector.
2. Intelligentized test system for electric coupler according to claim 1, which is characterized in that the adaptation module and described
Pedestal is to be threadedly coupled or be clamped.
3. Intelligentized test system for electric coupler according to claim 1, which is characterized in that the break-make and contact resistance
Microcontroller test cell detection contact resistance parameter circuit include：
First singlechip and the first signal conditioning circuit being connect with the first singlechip and second signal modulate circuit, institute
State the first signal conditioning circuit and the first bus and the second bus be connected with by the first operational amplifier, in first bus and
Detection cable is distributed between second bus, the second signal modulate circuit is connect with second operational amplifier, and described
Two operation method device both ends are parallel with the first scale value resistance, the first scale value resistance one end ground connection, the first scale value resistance
The other end be connected with third bus, the third bus parallel connection has the first relay group, the first relay group and detection
Cable corresponds to, and the other end of the detection cable corresponding with the first relay group is provided with the second relay group, described
Second relay group is provided with relay pair, and pass through the relay by the 4th bus parallel connection between adjacent detection cable
To being connect respectively with first bus and the second bus.
4. Intelligentized test system for electric coupler according to claim 1, which is characterized in that the pressure resistance microcontroller test
The circuit of pressure-resistant parameter of unit detection electric connector includes：
First current limiting safeguard resistor, with the concatenated third relay group of first current limiting safeguard resistor, the 4th relay group,
Three operational amplifiers and four-operational amplifier, the third relay group, the 4th relay group, third operational amplifier and
Four-operational amplifier is parallel with direct current transducer, and the direct current transducer is parallel with overvoltage crowbar and overvoltage protection relay
Lock-in circuit, the third operational amplifier is driven to be connected with insulated measurement circuits and microcontroller, the four-operational amplifier
It is parallel with the second scale value resistance and current foldback circuit and overcurrent protection relay driving lock-in circuit.
5. Intelligentized test system for electric coupler according to claim 1, which is characterized in that the insulation resistance microcontroller
The circuit of insulation parameter of test cell detection electric connector includes：
Second current limiting safeguard resistor, with the concatenated 5th relay group of second current limiting safeguard resistor, the 6th relay group,
Five operational amplifiers and the 6th operational amplifier, the 5th relay group, the 6th relay group, the 5th operational amplifier and
Six operational amplifiers are parallel with direct current transducer, and the direct current transducer is parallel with overvoltage crowbar and overvoltage protection relay
Lock-in circuit, the 5th operational amplifier is driven to be connected with insulated measurement circuits and microcontroller, the 6th operational amplifier
It is parallel with third scale value resistance and current foldback circuit and overcurrent protection relay driving lock-in circuit.
6. according to the Intelligentized test system for electric coupler described in claim 1 to 5 any one, which is characterized in that described
Computer further includes database and display, the various standard parameters of the database purchase electric connector, and more each test
The parameter of unit testing and various standard parameters, the display is for showing result of the comparison.
7. Intelligentized test system for electric coupler according to claim 1, which is characterized in that the computer further includes
User authority management unit is used for the encryption and safety operation of the system.
8. Intelligentized test system for electric coupler according to claim 1, which is characterized in that the computer is also connected with
There is printer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810036994.0A CN108469569A (en) | 2018-01-15 | 2018-01-15 | A kind of Intelligentized test system for electric coupler |
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| CN201810036994.0A CN108469569A (en) | 2018-01-15 | 2018-01-15 | A kind of Intelligentized test system for electric coupler |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| CN110940898A (en) * | 2019-09-30 | 2020-03-31 | 航天科工防御技术研究试验中心 | Insulation and voltage resistance testing device for electric connector |
| CN113447857A (en) * | 2021-06-29 | 2021-09-28 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Method and device for evaluating reliability of electric connector |
| CN114442004A (en) * | 2022-04-08 | 2022-05-06 | 河北南皮铁路器材有限责任公司 | Automatic checking table for relay combined wiring |
| CN116184274A (en) * | 2023-04-25 | 2023-05-30 | 深圳市国威通电子技术有限公司 | High-voltage connector quality detection system and method |
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| CN109799402A (en) * | 2019-01-16 | 2019-05-24 | 南瑞集团有限公司 | A kind of intelligent checking system and method suitable for exchanging plug-in unit |
| CN110940898A (en) * | 2019-09-30 | 2020-03-31 | 航天科工防御技术研究试验中心 | Insulation and voltage resistance testing device for electric connector |
| CN113447857A (en) * | 2021-06-29 | 2021-09-28 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Method and device for evaluating reliability of electric connector |
| CN114442004A (en) * | 2022-04-08 | 2022-05-06 | 河北南皮铁路器材有限责任公司 | Automatic checking table for relay combined wiring |
| CN114442004B (en) * | 2022-04-08 | 2022-07-15 | 河北南皮铁路器材有限责任公司 | Automatic checking table for relay combined wiring |
| CN116184274A (en) * | 2023-04-25 | 2023-05-30 | 深圳市国威通电子技术有限公司 | High-voltage connector quality detection system and method |
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