CN110835737A - 7-cavity horizontal PECVD-PVD integrated silicon wafer coating process - Google Patents
7-cavity horizontal PECVD-PVD integrated silicon wafer coating process Download PDFInfo
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- CN110835737A CN110835737A CN201810943423.5A CN201810943423A CN110835737A CN 110835737 A CN110835737 A CN 110835737A CN 201810943423 A CN201810943423 A CN 201810943423A CN 110835737 A CN110835737 A CN 110835737A
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 24
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 24
- 239000010703 silicon Substances 0.000 title claims abstract description 24
- 238000000576 coating method Methods 0.000 title claims abstract description 9
- 238000000151 deposition Methods 0.000 claims abstract description 87
- 230000008021 deposition Effects 0.000 claims abstract description 80
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 61
- 238000005240 physical vapour deposition Methods 0.000 claims abstract description 58
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 claims abstract description 48
- 238000000034 method Methods 0.000 claims abstract description 12
- 229910021419 crystalline silicon Inorganic materials 0.000 claims abstract description 11
- 238000005477 sputtering target Methods 0.000 claims abstract description 5
- 239000010408 film Substances 0.000 claims description 55
- 238000000427 thin-film deposition Methods 0.000 claims description 23
- 239000010409 thin film Substances 0.000 claims description 13
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 10
- 238000005086 pumping Methods 0.000 claims description 8
- 239000012495 reaction gas Substances 0.000 claims description 6
- 239000007888 film coating Substances 0.000 claims description 5
- 238000009501 film coating Methods 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 5
- 229910052757 nitrogen Inorganic materials 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 abstract description 13
- 238000002360 preparation method Methods 0.000 abstract description 2
- 238000007599 discharging Methods 0.000 description 4
- 239000000498 cooling water Substances 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000004050 hot filament vapor deposition Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000005543 nano-size silicon particle Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/24—Deposition of silicon only
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
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- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
- H01L31/202—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic Table
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
- H01L31/206—Particular processes or apparatus for continuous treatment of the devices, e.g. roll-to roll processes, multi-chamber deposition
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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Abstract
The invention relates to a 7-cavity horizontal PECVD-PVD integrated silicon wafer coating process, which comprises a vacuum preheating feeding cavity, an intrinsic amorphous silicon film deposition PECVD cavity, an impurity-doped amorphous silicon film deposition PECVD cavity, a first TCO film deposition PVD cavity, a second TCO film deposition PVD cavity, a third TCO film deposition PVD cavity and a blanking cavity which are sequentially connected through vacuum locks, wherein the vacuum locks are arranged at the head and the tail of the vacuum preheating feeding cavity, a moving device penetrates through the cavities and the vacuum locks from front to back, a horizontal carrier plate is arranged in the vacuum preheating feeding cavity, the horizontal carrier plate is arranged on the moving device and is in a state of being movable from front to back in the integrated equipment, a sputtering target is arranged in the second TCO film deposition PVD cavity, and the cavities are externally connected with an ultrapure gas circuit. The method can effectively avoid the process of the product preparation process from being exposed to air, improve the performance of the crystalline silicon heterojunction solar cell and reduce the production cost of the crystalline silicon heterojunction solar cell.
Description
Technical Field
The invention relates to the field of efficient crystalline silicon solar cell manufacturing, in particular to a 7-cavity horizontal PECVD-PVD integrated silicon wafer coating process for solar cell manufacturing.
Background
Currently, a class of advanced and efficient crystalline silicon solar cells is based on amorphous silicon/crystalline silicon heterojunction structures. The two very critical steps in the production technology are the deposition of an amorphous silicon-based film (comprising an intrinsic layer and a doped layer, and the material is amorphous silicon, microcrystalline silicon, nano-silicon, oxygen-doped amorphous silicon and the like) and the deposition of a transparent conductive oxide TCO layer. The deposition method of the amorphous silicon-based thin film which is commonly used is a low-temperature chemical vapor deposition method, and comprises two methods, namely Plasma Enhanced Chemical Vapor Deposition (PECVD) and hot-wire chemical vapor deposition (HECVD); the TCO layer is generally prepared by PVD (magnetron sputtering) method. In production, the corresponding devices of the two technologies are usually separated. Namely, the low-temperature CVD equipment is an independent system, and generally comprises a feeding and preheating cavity, an intrinsic layer deposition cavity, a doping deposition cavity (p-type or n-type), a blanking cavity and the like; the PVD equipment also comprises a feeding cavity, a preheating cavity, a film deposition cavity, a blanking cavity and the like. A feeding device and a discharging device of the silicon wafer, a conveying device for conveying the silicon wafer among different devices and the like are also needed between the CVD system and the PVD system. The overall system is very complex. Moreover, the product must be exposed to air during the transfer process between the CVD and PVD systems, so that the surface of the product is affected by water vapor, oxygen, dust and the like in the air to cause performance reduction; the operation cost is high in production, and the number of required workers is large.
Disclosure of Invention
The invention aims to provide a 7-cavity horizontal PECVD-PVD integrated silicon wafer coating process for manufacturing a solar cell, which can effectively prevent processes of an intrinsic silicon-based film, a doped silicon-based film and a TCO film from being exposed to air in the preparation process of a product, improve the performance of the crystalline silicon heterojunction solar cell and reduce the production cost of the crystalline silicon heterojunction solar cell.
The technical scheme adopted by the invention is as follows: a7 horizontal PECVD-PVD integrated equipment of cavity for solar cell manufacturing which characterized in that: the device comprises a vacuum preheating feeding cavity, an intrinsic amorphous silicon film deposition PECVD cavity, a doped amorphous silicon film deposition PECVD cavity, a first TCO film deposition PVD cavity, a second TCO film deposition PVD cavity, a third TCO film deposition PVD cavity and a blanking cavity, wherein the cavities are sequentially connected through vacuum locks, a feeding port of the vacuum preheating feeding cavity and a discharging port of the blanking cavity are also provided with vacuum locks, a moving device is connected with the cavities and the vacuum locks in a penetrating manner from front to back, the intrinsic amorphous silicon film deposition PECVD cavity, the doped amorphous silicon film deposition PECVD cavity, the first TCO film deposition PVD cavity, the second TCO film deposition PVD cavity and the third TCO film deposition PVD cavity are all of a horizontal structure, a horizontal carrier plate is arranged in the vacuum preheating feeding cavity, the horizontal carrier plate is arranged on the moving device and can move from front to back in the integrated device, a sputtering target is arranged in the second TCO film deposition PVD cavity, the cavities are externally connected with an ultra-pure gas path system and/or a heating system and/or a cooling water system and/or a vacuum pumping system.
The moving device is a pushing feeding track or a moving hanger.
The blanking cavity is externally connected with a nitrogen or clean air system.
A7-cavity horizontal PECVD-PVD integrated silicon wafer coating process adopts an intrinsic amorphous silicon thin film deposition PECVD cavity body with a horizontal structure, an impurity-doped amorphous silicon thin film deposition PECVD cavity body and a three-TCO thin film deposition PVD cavity body with a horizontal structure, the two thin film deposition devices are integrated, the two cavity bodies are connected through a vacuum lock or a vacuum lock structure, and products are not exposed to the atmosphere when being transferred between the cavity bodies of the device through a moving device.
When the device is used, each cavity is kept in a vacuum state by an external vacuum system before the silicon wafer enters. Fixing a silicon wafer to be plated on a horizontally placed carrier plate; breaking vacuum of a vacuum preheating feeding cavity, opening a feeding end vacuum lock, conveying a support plate into the vacuum preheating feeding cavity by a mobile device, then closing the vacuum lock, vacuumizing and preheating, wherein the preheating can be completed by a cavity or an external heating system, and after reaching a preset vacuum degree and temperature, opening a vacuum lock between the vacuum preheating feeding cavity and an intrinsic amorphous silicon film deposition PECVD cavity; the carrier plate is sent into an intrinsic amorphous silicon film deposition PECVD cavity and a vacuum lock is closed; depositing an intrinsic amorphous silicon thin film layer in an intrinsic amorphous silicon thin film deposition PECVD cavity, pumping out residual reaction gas after deposition is finished, opening a vacuum lock between intrinsic amorphous silicon thin film deposition PECVD cavity and an amorphous silicon thin film doped deposition PECVD cavity after the required vacuum degree is reached, and sending a carrier plate into the amorphous silicon thin film doped deposition PECVD cavity to close the vacuum lock; depositing a doped amorphous silicon thin film layer in a doped amorphous silicon thin film deposition PECVD cavity, pumping out residual reaction gas after deposition is finished, opening a vacuum lock behind the cavity after the required vacuum degree is reached, and sending the carrier plate into a first TCO thin film deposition PVD cavity to close the vacuum lock; in the first TCO film deposition PVD cavity, adjusting the temperature to be proper, and preparing to start TCO deposition, wherein the first TCO film deposition PVD cavity plays the roles of preheating before TCO deposition and adjusting a PECVD part and a TCO deposition part; the vacuum lock among the first, second and third TCO film deposition PVD cavities is kept in an open state under the normal working condition, the sputtering target is arranged in the second TCO film deposition PVD cavity, and the support plate sequentially passes through the three cavities at a constant speed to complete the TCO film coating process; then opening a vacuum lock after the third TCO film deposition PVD cavity, and closing the vacuum lock after the carrier plate is conveyed into the blanking cavity; breaking vacuum in the blanking cavity by using nitrogen or clean air, then opening a vacuum lock at the discharge end of the blanking cavity, and moving out the carrier plate; and closing the vacuum lock, and vacuumizing the blanking cavity. Thus, the coating work of intrinsic amorphous silicon, heavily doped amorphous silicon and TCO on one surface of the silicon wafer for the amorphous silicon/crystalline silicon heterojunction solar cell is completed.
The invention has the beneficial effects that: the intrinsic amorphous silicon, the doped amorphous silicon and the TCO film deposited on one surface of the silicon wafer in the manufacturing process of the amorphous silicon/crystalline silicon heterojunction solar cell are not exposed to air in the whole deposition process, so that the oxidation of the air to the silicon wafer film and the pollution of water vapor, dust and the like in the air to the surfaces of various structures are reduced, and the performance of the product is improved. The PECVD and the PVD are integrally designed, and are sequentially transmitted from front to back through the mobile device, so that a blanking cavity of PECVD equipment, a loading cavity of the PVD, a transfer device and a blanking and loading device between two pieces of equipment are omitted, the complexity of the equipment is greatly reduced, the working procedures and working hours are shortened, and the purchase and operation cost of production line equipment is reduced; the working procedures are reduced, so that the physical impact on the silicon wafer between the product and the loading disc is reduced, the breakage rate of the product is reduced, and the cost is further reduced.
Drawings
FIG. 1 is a front view of the present invention;
wherein: preheating the feeding cavity 1 in vacuum; an intrinsic amorphous silicon thin film deposition PECVD cavity 2; a doped amorphous silicon thin film deposition PECVD cavity 3; a PVD chamber 4 for deposition of a first TCO film; a PVD chamber 5 for deposition of a second TCO film; a PVD chamber 6 for deposition of a third TCO film; a blanking cavity 7; a carrier plate 8; a moving rail 9; a vacuum lock 10.
Detailed Description
The patent is further illustrated below with reference to specific examples. It should be understood that these examples are for illustrative purposes only and are not intended to limit the scope of the patent. Further, it will be appreciated that various changes or modifications may be made by those skilled in the art after reading the teachings herein, and such equivalents may fall within the scope of the appended claims.
FIG. 1 shows: a7-cavity horizontal PECVD-PVD integrated device for manufacturing a solar cell comprises a vacuum preheating feeding cavity 1, an intrinsic amorphous silicon thin film deposition PECVD cavity 2, an amorphous silicon-doped thin film deposition PECVD cavity 3, a first TCO thin film deposition PVD cavity 4, a second TCO thin film deposition PVD cavity 5, a third TCO thin film deposition PVD cavity 6, a discharging cavity 7, a support plate 8, a moving rail 9 and a vacuum lock 10. The PECVD and PVD cavities are horizontal, a vacuum preheating feeding cavity 1, an intrinsic amorphous silicon film deposition PECVD cavity 2, an amorphous silicon film deposition PECVD cavity 3, a PVD cavity 4 for first TCO film deposition, a PVD cavity 5 for second TCO film deposition, a PVD cavity 6 for third TCO film deposition and a blanking cavity 7 are sequentially connected from front to back, every two of the preheating feeding cavity 1 and the blanking cavity 7 are connected through a vacuum lock 10, a feeding end of the preheating feeding cavity 1 and a discharging end of the blanking cavity 7 are also provided with vacuum locks, a horizontal carrier plate 8 is arranged in the vacuum preheating feeding cavity 1, a moving track 9 for sequentially feeding the carrier plate to move in each cavity from front to back is arranged in the integrated equipment, and the blanking cavity 7 is broken in vacuum by nitrogen or clean air.
A7-cavity horizontal PECVD-PVD integrated silicon wafer coating process is characterized in that: adopting an intrinsic amorphous silicon film deposition PECVD cavity with a horizontal structure, a doped amorphous silicon film deposition PECVD cavity with a horizontal structure and three TCO film deposition PVD cavities with a horizontal structure, integrating the film deposition cavities, adopting a vacuum lock or a vacuum lock structure to connect the cavities, keeping the cavities in a vacuum state by an external vacuum system before a silicon wafer enters, and fixing the silicon wafer to be coated on a horizontally placed support plate; breaking vacuum of a vacuum preheating feeding cavity, opening a feeding end vacuum lock, conveying a support plate into the vacuum preheating feeding cavity by a mobile device, then closing the vacuum lock, vacuumizing and preheating, wherein the preheating can be completed by a cavity or an external heating system, and after reaching a preset vacuum degree and temperature, opening a vacuum lock between the vacuum preheating feeding cavity and an intrinsic amorphous silicon film deposition PECVD cavity; the carrier plate is sent into an intrinsic amorphous silicon film deposition PECVD cavity and a vacuum lock is closed; depositing an intrinsic amorphous silicon thin film layer in an intrinsic amorphous silicon thin film deposition PECVD cavity, pumping out residual reaction gas after deposition is finished, opening a vacuum lock between intrinsic amorphous silicon thin film deposition PECVD cavity and an amorphous silicon thin film doped deposition PECVD cavity after the required vacuum degree is reached, and sending a carrier plate into the amorphous silicon thin film doped deposition PECVD cavity to close the vacuum lock; depositing a doped amorphous silicon thin film layer in a doped amorphous silicon thin film deposition PECVD cavity, pumping out residual reaction gas after deposition is finished, opening a vacuum lock behind the cavity after the required vacuum degree is reached, and sending the carrier plate into a first TCO thin film deposition PVD cavity to close the vacuum lock; in the first TCO film deposition PVD cavity, adjusting the temperature to be proper, and preparing to start TCO deposition, wherein the first TCO film deposition PVD cavity plays the roles of preheating before TCO deposition and adjusting a PECVD part and a TCO deposition part; the vacuum lock among the first, second and third TCO film deposition PVD cavities is kept in an open state under the normal working condition, the sputtering target is arranged in the second TCO film deposition PVD cavity, and the support plate sequentially passes through the three cavities at a constant speed to complete the TCO film coating process; then opening a vacuum lock after the third TCO film deposition PVD cavity, and closing the vacuum lock after the carrier plate is conveyed into the blanking cavity; breaking vacuum in the blanking cavity by using nitrogen or clean air, then opening a vacuum lock at the discharge end of the blanking cavity, and moving out the carrier plate; and closing the vacuum lock, and vacuumizing the blanking cavity to finish the film coating work of intrinsic amorphous silicon, heavily doped amorphous silicon and TCO on one surface of the silicon wafer for the amorphous silicon/crystalline silicon heterojunction solar cell.
In the embodiment, the vacuum preheating feeding cavity, each PECVD cavity and each PVD cavity are externally connected with an ultra-pure gas path system and/or a heating system and/or a cooling water system and/or a vacuum pumping system, and comprehensive selection is performed according to field production.
Claims (1)
1. A7-cavity horizontal PECVD-PVD integrated silicon wafer coating process is characterized in that: adopting an intrinsic amorphous silicon film deposition PECVD cavity with a horizontal structure, a doped amorphous silicon film deposition PECVD cavity with a horizontal structure and three TCO film deposition PVD cavities with a horizontal structure, integrating the film deposition cavities, adopting a vacuum lock or a vacuum lock structure to connect the cavities, keeping the cavities in a vacuum state by an external vacuum system before a silicon wafer enters, and fixing the silicon wafer to be coated on a horizontally placed support plate; breaking vacuum of a vacuum preheating feeding cavity, opening a feeding end vacuum lock, conveying a support plate into the vacuum preheating feeding cavity by a mobile device, then closing the vacuum lock, vacuumizing and preheating, wherein the preheating can be completed by a cavity or an external heating system, and after reaching a preset vacuum degree and temperature, opening a vacuum lock between the vacuum preheating feeding cavity and an intrinsic amorphous silicon film deposition PECVD cavity; the carrier plate is sent into an intrinsic amorphous silicon film deposition PECVD cavity and a vacuum lock is closed; depositing an intrinsic amorphous silicon thin film layer in an intrinsic amorphous silicon thin film deposition PECVD cavity, pumping out residual reaction gas after deposition is finished, opening a vacuum lock between intrinsic amorphous silicon thin film deposition PECVD cavity and an amorphous silicon thin film doped deposition PECVD cavity after the required vacuum degree is reached, and sending a carrier plate into the amorphous silicon thin film doped deposition PECVD cavity to close the vacuum lock; depositing a doped amorphous silicon thin film layer in a doped amorphous silicon thin film deposition PECVD cavity, pumping out residual reaction gas after deposition is finished, opening a vacuum lock behind the cavity after the required vacuum degree is reached, and sending the carrier plate into a first TCO thin film deposition PVD cavity to close the vacuum lock; in the first TCO film deposition PVD cavity, adjusting the temperature to be proper, and preparing to start TCO deposition, wherein the first TCO film deposition PVD cavity plays the roles of preheating before TCO deposition and adjusting a PECVD part and a TCO deposition part; the vacuum lock among the first, second and third TCO film deposition PVD cavities is kept in an open state under the normal working condition, the sputtering target is arranged in the second TCO film deposition PVD cavity, and the support plate sequentially passes through the three cavities at a constant speed to complete the TCO film coating process; then opening a vacuum lock after the third TCO film deposition PVD cavity, and closing the vacuum lock after the carrier plate is conveyed into the blanking cavity; breaking vacuum in the blanking cavity by using nitrogen or clean air, then opening a vacuum lock at the discharge end of the blanking cavity, and moving out the carrier plate; and closing the vacuum lock, and vacuumizing the blanking cavity to finish the film coating work of intrinsic amorphous silicon, heavily doped amorphous silicon and TCO on one surface of the silicon wafer for the amorphous silicon/crystalline silicon heterojunction solar cell.
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