CN110068585B - Dual-energy X-ray grating interference imaging system and method - Google Patents
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Abstract
The invention provides a dual-energy X-ray grating interference imaging system and a method, which comprises the following steps: the light source with certain coherence property generates two preset X-rays with different energies through adjustment; the dual-energy phase grating can generate the same phase shift for the X-rays with two preset different energies, so that the same periodic vertical stripes are generated at the same positions behind the dual-energy phase grating; the resolution ratio is superior to that of the X-ray detector with the period of vertical stripes, the light source is parallel light, and the sample to be detected, the dual-energy phase grating and the detector are sequentially arranged in the direction of the X-ray incident from the light source. In view of the above problems, an object of the present invention is to provide a dual-energy X-ray grating interference imaging system and method, which can achieve dual-energy grating interference imaging, so as to obtain information such as linear attenuation factor, phase shift factor, scattering factor, etc. under two energies of a sample, and effectively perform material identification, defect diagnosis, etc.
Description
Technical Field
The invention relates to a dual-energy X-ray grating interference imaging system and a method.
Background
As a grating interference imaging technique, a commonly used technique at present generates a regular vertical stripe pattern (i.e., Talbot stripe) by using an X-ray light source and a phase grating, and realizes imaging and information separation of absorption contrast, phase contrast and dark field contrast of a sample by detecting information such as distortion, intensity attenuation, and blur of a front and rear pattern that adds the sample to an optical path.
In the case of plane waves and without considering the amplification effect, the period of the vertical stripes is 1/2 of the phase grating period if the phase grating shifts the design X-ray by an amount of pi, and the period of the vertical stripes is the same as the phase grating period if the phase shift is other rational fraction times pi. In the case of plane waves, the ideal vertical stripe is in the phase gratingPosition d of later appearanceTThat is, the distance between the vertical stripe and the phase grating should satisfy the following formula:
wherein p is the period of the phase grating; λ is the wavelength of the X-rays; m is the order of the vertical stripe, and an odd number or an even number is selected according to the phase shift of the phase grating; and x is a parameter related to the phase shift quantity of the phase grating, and when the phase grating is subjected to pi phase shift, x is 2, and other cases are 1.
An X-ray phase grating here refers to a transmission grating that can change the phase distribution of the X-ray wavefront. The X-ray phase grating makes the X-ray passing through the grating material of the X-ray phase grating lag behind the freely propagating X-ray in the grating gap by a certain phase by utilizing the different propagation speeds of the X-ray in different media. For a certain energy of X-ray, the phase difference brought by the grating line material with a certain height is determined. Therefore, after the X-ray phase grating is manufactured, the phase shift characteristic of the X-ray phase grating to the X-ray is determined.
Because the system realizes multi-contrast imaging and separation based on the specific phase shift of the phase grating to the X-ray, generally speaking, the grating interference imaging system has only one system energy point, and the obtained imaging information is limited on the energy point. The grating interference imaging and the traditional X-ray imaging can realize dual-energy imaging by changing the energy spectrum distribution of a light source, and although the dual-energy imaging is also X-ray imaging, the dual-energy imaging is realized and is far less direct than the traditional X-ray imaging.
Disclosure of Invention
The problems to be solved by the invention are as follows:
in view of the above problems, an object of the present invention is to provide a dual-energy X-ray grating interference imaging system and method, which can implement dual-energy grating interference imaging, so as to obtain information such as linear attenuation factor, phase shift factor, scattering factor, etc. under two energies of a sample, and can effectively perform substance identification, defect diagnosis, etc.
The technical means for solving the problems are as follows:
the invention provides a dual-energy X-ray grating interference imaging system, which comprises:
the light source with certain coherence property generates two preset X-rays with different energies through adjustment;
the dual-energy phase grating can generate the same phase shift for the X-rays with two preset different energies, so that the same periodic vertical stripes are generated at the same positions behind the dual-energy phase grating;
an X-ray detector with a resolution better than the period of the vertical stripes,
the light source is parallel light, and the sample to be detected, the dual-energy phase grating and the detector are sequentially arranged in the direction of X rays incident from the light source.
According to the invention, the grating interference imaging condition can be strictly met without changing the grating distance or replacing the phase grating, and the switching between two energy points can be realized by only changing the energy spectrum of the X-ray light source. Therefore, compared with other dual-energy multi-contrast image acquisition methods which need to move the grating and/or the sample to be measured, the method can acquire the multi-contrast images of the sample under two different energies without introducing additional complex operation, does not need to move any optical element along the optical path direction, and does not increase additional adjustment and use requirements on the basis of the prior art. The obtained phase contrast and dark field contrast images have narrower energy spectrum response property than the traditional grating interference imaging result, and more accurate information of the sample to be measured can be obtained. In addition, the method can be combined with the CT technology to further obtain accurate information of attenuation factors, phase shift factors, scattering factors and the like of each volume element in the sample, and has a considerable application prospect in the fields of material identification, defect diagnosis and the like.
In addition, the dual-energy grating interference imaging system can obtain multi-contrast images under two different energies. Only the energy spectrum distribution of the X-ray source needs to be changed, and no additional complex operation is introduced compared with the traditional dual-energy X-ray absorption contrast imaging.
In the present invention, the light source may be a synchrotron radiation light source or a microfocus X-ray source. Thus, an X-ray absorption grating as a source grating can be used to split incident X-rays into a plurality of line light sources.
In the present invention, the analyzer grating may be used to perform step-and-scan detection in front of the detector. This also applies to the case where the detector resolution is insufficient.
In the present invention, if the detector has an energy resolution, that is, a resolution capable of resolving two energy points, the light source may be a wide-spectrum X-ray source covering the two energy points, and the detector does not need to have a capability of generating predetermined two different energy X-rays. On this basis, dual energy is also possible using a detector with energy resolving power, using a light source which produces only one broad energy distribution.
The invention also provides a working method of the dual-energy X-ray grating interference imaging system, which comprises the following steps:
1) placing an X-ray light source, a dual-energy phase grating and a detector in a light path in sequence;
2) adjusting the angles and positions of the dual-energy phase grating and the detector to meet specified conditions;
3) turning on a light source and recording a vertical stripe image u1 under the state that a sample to be detected is not placed;
4) putting a sample to be tested, turning on a light source, and recording a vertical stripe image u 2;
5) changing the energy spectrum of the X-ray source to respectively comprise high-energy and low-energy points, repeating the steps 2 to 4 twice to obtain u1(EL), u2(EL), u1(EH) and u2(EH), and calculating the overall intensity change, distortion and blurring of the stripes by an algorithm to obtain a multi-contrast image, wherein EL is the low-energy point and EH is the high-energy point.
In the present invention, an X-ray detector having a resolution capable of resolving two energy points may be used, and the results recorded by the detector at two energy levels higher and lower are directly compared to obtain u1(EL) and u2(EL), and u1(EH) and u2(EH), and the overall intensity variation, distortion, and blur of the fringe may be calculated by an algorithm to obtain a multi-contrast image.
The invention has the following effects:
the invention can provide a dual-energy X-ray grating interference imaging system, which can respectively perform X-ray multi-contrast imaging on a sample at a high energy point and a low energy point, acquire accurate information such as attenuation factors, phase shift factors, scattering factors and the like under two energies of the sample, and improve the identification and distinguishing capability of the imaging system on multi-component materials.
Drawings
FIG. 1 is a schematic structural diagram of a dual-energy X-ray grating interference imaging system according to the present invention;
FIG. 2 is a graph illustrating an example of the relationship between the grating height of a dual-energy phase grating and the energy of X-rays;
FIG. 3 is a graph showing an example of the relationship between the relative deviation of the grating height of the phase grating and the energy of X-rays;
description of the symbols:
1 light source, 2 samples to be measured, 3 dual-energy phase grating, 3' vertical stripe and 4 detectors.
Detailed Description
The present invention is further described in conjunction with the following embodiments, it is to be understood that the following embodiments are illustrative only and are not to be construed as limiting the scope of the invention, and that certain insubstantial modifications and adaptations of the invention by those skilled in the art based on the foregoing disclosure are within the scope of the invention. The specific process parameters and the like of the following examples are also only one example of suitable ranges, i.e., those skilled in the art can select the appropriate ranges through the description herein, and are not limited to the specific values exemplified below. The same or corresponding reference numerals denote the same components in the respective drawings, and redundant description is omitted.
Disclosed herein is a dual-energy X-ray grating interference imaging system S, as shown in fig. 1, comprising: the device comprises a light source 1, a sample 2 to be detected, a dual-energy phase grating 3 and a detector 4. Wherein the light source 1 here refers to a parallel X-ray source with a certain coherence, such as a synchrotron radiation light source, but may also be other power sources or incoherent light sources, such as an X-ray tube, but in the case of an incoherent light source, an additional grating assembly needs to be added. The light source 1 is adjusted to be able to generate X-rays of two different energies in the design. The dual-energy phase grating 3 can generate the same phase shift for the designed X-rays with two different energies, so that the same periodic vertical stripes 3' are generated at the same position downstream of the dual-energy phase grating 3. The detector 4 is an X-ray intensity detector and records the pattern of vertical stripes 3' before and after the sample 2 to be measured is placed. The dual-energy phase grating 3 is a phase grating manufactured after the height h of the grid line is specially designed, and as the grating, the base of the grid line is usually made of semiconductor materials such as silicon, gaps of the grid line are usually empty, and other materials can be filled. In other words, the grating is designed mainly by the grating lines, including the height, period (pitch), space ratio (width) and distribution on the plane of the grating lines. The dual-energy phase grating is generated after the height h of the grid line is specially designed, and the dual-energy phase grating can generate the same phase shift effect on two different energy X-rays.
If the detector 4 has energy resolution capability, such as a cadmium zinc telluride detector array, the energy spectrum of the light source 1 only needs to contain two system energy points to be imaged at one time. If the detector 4 does not have energy resolving power, then it is necessary that the light source 1 can be adjusted to produce two X-rays with two energy points, respectively, for two separate imaging.
The imaging system S of the invention can realize dual-energy grating interference imaging. Specifically, the phase grating capable of generating the same phase shift for both the X-rays of two different energies is designed in advance, so that the regular vertical stripes 3' can be generated at the same position for both the X-rays of two different energies, and therefore, the spacing between the dual-energy phase grating 3 and the detector 4, and other parameters of the whole system are further designed.
In the present invention, the two different energies indicated by the dual energies are not satisfied by any two energies. These two energy requirements satisfy two conditions. On the one hand, the X-ray phase grating with a specific grating line height can generate the same phase shift effect on the X-rays with the two energies. A series of phase gratings, here phase shifted by (p +2n pi), where n is a natural number, are all considered to have the same phase shifting effect. On the other hand, the vertical stripes 3' generated by the X-ray with two energies after passing through the phase grating are at the same position. According to the verticalStripe-like 3' distance formula, assuming X-ray wavelength of two energies is λLAnd λHAt the same position, i.e. at the required distance dTThe same, the order and wavelength of the vertical stripe 3' are required to satisfy the following conditions
By means of the method, the imaging system S can strictly meet the grating interference imaging condition without changing the grating distance or replacing the phase grating, and only the energy spectrum of the X-ray light source is changed to switch between two energy points.
X-ray energy is inversely proportional to wavelength, so the vertical stripe 3' order is related to the X-ray energy
mLEL＝mHEHOr
Wherein m isLRepresenting the selected vertical stripe order in the case of low energy points.
In the present invention, the distance between the dual-energy phase grating 3 and the detector 4 satisfies the following formula:
where subscript L represents a low energy point parameter and subscript H represents a high energy point parameter. p is the period of the dual-energy phase grating; λ is the wavelength of the X-rays; m is the order of the vertical stripe; and x is a parameter related to the phase shift quantity of the phase grating, and when the phase grating is subjected to pi phase shift, x is 2, and other cases are 1.
In addition, due to the design requirement of the dual-energy system, the conditions under the two energies are constrained to be only one value mLAnd mH. The order of the vertical stripes 3' is thus no longer taken to be all odd or even depending on the amount of phase shift of the phase grating.
As shown in fig. 2, in various cases where the grating material may be gold, the phase grating is a pi phase shift grating, and the same phase shift effect thereof, the search may find that, when EL is 0.6EH (the energy ratio satisfies the condition two), the high-energy X-ray phase shift is 3 pi, and the low-energy X-ray phase shift is 5 pi (the remainder is pi for 2 pi, and the condition one is satisfied), the heights of the corresponding grating gratings have a common value. For the curve corresponding to the height of the grid line of the high-energy point EH, the abscissa and the ordinate are shown in fig. 2, and for the curve corresponding to the height of the grid line of the low-energy point EL, the abscissa is actually the result of multiplying EH by 0.6, thereby enabling the abscissa to represent the selection of a group of high-energy and low-energy point values.
As shown in fig. 3, when the grid line material is gold, when the dual-energy phase grating 3 is manufactured with the height of the high-energy point 3 pi phase shift grating grid line, the relative deviation with the height of the low-energy point 5 pi phase shift grating grid line is considered, the grid line has sufficient penetration capacity above 20keV and cannot be blocked by the grating base material, and when the grid line is above 100keV, the height of the grating grid line is considered too high, the manufacturing difficulty is large, therefore, in the interval from 20keV to 100keV, there are two intersection points with the coordinate axis, which are shown in the following table respectively:
| height/um of grid line | Low energy point/keV | Low energy point phase shift | High energy point/keV | High energy point phase shift |
| 21.6 | 22.2 | 5.00pi | 37.0 | 3.00pi |
| 55.8 | 56.9 | 5.00pi | 94.7 | 3.00pi |
。
Therefore, the grid line material is gold, and the X-ray transmission grating with the grid line height of 21.6um is an ideal dual-energy phase grating 3 which can generate pi phase shift effect for two different energies of 22.2keV and 37.0 keV. Similarly, the grid line material is gold, and the ray transmission grating with the grid line height of 55.8umX is an ideal dual-energy phase grating 3 which can generate pi phase shift effect for two different energies of 56.9keV and 94.7 keV.
Although the gold with a relatively low height of the gate line is selected as the gate line material in this embodiment, the gate line material may be selected according to actual requirements, such as silicon, nickel, etc.
The workflow of the dual energy X-ray grating interference imaging system S of the present invention is described below to further understand the present invention. The fundamental principle of grating interference imaging and multi-contrast separation is to compare the variation of the vertical fringes 3' produced by the dual-energy phase grating 3 with or without a sample. In brief, the intensity variation of the fringe as a whole is the absorption contrast, the twist, i.e., the deflection, of the fringe is the differential phase contrast, and the blur of the fringe is the scattering (dark field) contrast.
1) The X-ray light source 1, the dual-energy phase grating 3 and the detector 4 are sequentially placed in a light path.
2) The angles and the positions of the dual-energy phase grating 3 and the detector 4 are accurately adjusted, so that the following conditions are met: the plane of the dual-energy phase grating 3 and the plane of the detector 4 are parallel to each other and perpendicular to the light path, the center of the dual-energy phase grating 3 and the center of the detector 4 are basically in the same straight line, and the distance between the dual-energy phase grating 3 and the detector 4 meets the imaging condition, namely the position of the vertical stripe 3' is basically overlapped with that of the detector.
3) In a state where the sample 2 to be measured was not placed, the light source was turned on, and the vertical stripe image u1 was recorded.
4) The sample 2 to be measured was placed, the light source was turned on, and the vertical stripe image u2 was recorded.
5) If an X-ray detector with energy resolving power is used, the overall intensity variation, distortion and blurring of the fringes can be calculated algorithmically to obtain a multi-contrast image directly comparing the results recorded by the detector at the higher and lower two energy bands, u1(EL) and u2(EL), and u1(EH) and u2 (EH).
5') if a normal X-ray detector is used, the energy spectrum of the X-ray source needs to be changed to contain high and low energy points, respectively, and steps 2 to 4 are repeated twice to obtain u1(EL), u2(EL), u1(EH), u2 (EH).
In addition, in the present invention, each contrast represents a specific information, and the image quality shown by different information of the same sample 2 to be tested may be greatly different. In particular, the absorption contrast images obtained by conventional X-ray imaging are not very good in the imaging of low atomic number and low density materials, and the phase contrast images of multi-contrast images have great advantages in this respect, such as polymer materials, biological soft tissues, etc.; in contrast, absorption contrast images acquired by conventional X-ray imaging are not sensitive to interface and microscopic geometry, while they are particularly visible in scattering (dark field) contrast images in multi-contrast images, such as powder materials, lung tissue, etc.
Grating interference imaging enables multi-contrast images, and current research is mainly on absorption contrast images, phase contrast images and dark-field (scattering) contrast images. The absorption contrast image is a more accurate statement in the physical sense of an image obtained by traditional X-ray imaging, and the technical means are mature, and the meaning corresponds to the imaginary part of the medium refractive index. The phase contrast image corresponds to the real part of the refractive index of the medium, and macroscopically shows the deflection of the X-ray after the X-ray passes through the sample material to be detected. At present, the phase contrast image is clearer (stronger signal) than the absorption contrast image under the conditions of a low-density material, a low-atomic-number material, a multi-interface sample to be measured and the like, and information which cannot be shown by the absorption contrast image can be obtained in diagnosis of some special materials (such as birefringent materials). Scattering (dark field) contrast images are excellent in the diagnosis of porous materials such as human lungs, foam, etc., and to some extent reflect information on a smaller scale than the image resolution.
The biggest advantage of dual energy over single energy is that dual energy has the ability to identify substances. This can be met simply by conventional dual energy X-ray absorption contrast imaging, such as to determine the alcohol concentration (water and alcohol mix ratio), such as a coal ash instrument (coal and soil mix ratio), such as a bone densitometer. However, in complex situations, dual-energy grating interference imaging has great advantages, such as the mixing of multiple substances, for example, a sample to be measured with no difference in absorption contrast images.
In addition, the phase change amount of the phase grating is (p +2n pi), so that the energy spectrum range of X-rays participating in imaging can be further narrowed on the basis of original grating interference imaging, and the accuracy of the obtained information is improved. For example, the energy spectrum of the X-ray source is 10-100keV live, the information obtained by conventional X-ray imaging corresponds to 10-100keV, the information obtained by conventional grating interference imaging systems may correspond to 40-60keV, and the information obtained by dual energy grating interference imaging systems may correspond to 33-39keV and 57keV-63 keV.
In summary, compared with other dual-energy multi-contrast image acquisition methods requiring moving of a grating and/or a sample to be detected, the method can acquire multi-contrast images of the sample 2 under two different energies without introducing additional complex operations, and can be combined with a CT technology to further acquire accurate information such as linear attenuation factors, phase shift factors, scattering factors and the like of each volume element in the sample 2 to be detected, so that the method has a considerable application prospect in the fields of material identification, defect diagnosis and the like.
The above embodiments are intended to illustrate and not to limit the scope of the invention, which is defined by the claims, but rather by the claims, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.
Claims (6)
1. A dual-energy X-ray grating interference imaging system is characterized by comprising:
the light source with certain coherence property generates two preset X-rays with different energies through adjustment;
the dual-energy phase grating can generate the same phase shift for the X-rays with two preset different energies, so that the same periodic vertical stripes are generated at the same positions behind the dual-energy phase grating;
an X-ray detector with a resolution better than the period of the vertical stripes,
the light source is parallel light, and a sample to be detected, the dual-energy phase grating and the detector are sequentially arranged in the direction of X rays incident from the light source;
the phase shift amount of the dual-energy phase grating generated by the two X-rays with different energies is (p +2n pi), wherein the value of p is pi, and n is a positive integer;
the grid line material of the dual-energy phase grating comprises gold, silicon or nickel.
2. The dual-energy X-ray grating interferometric imaging system of claim 1,
if the detector has a resolution capable of resolving the energy of the two energy points, the light source is a wide-spectrum X-ray source covering the energy of the two energy points, and the capability of generating predetermined X-rays with two different energies is not required.
3. The dual-energy X-ray grating interferometric imaging system of claim 1,
the light source is a synchrotron radiation light source or a micro-focus X-ray source.
4. The dual-energy X-ray grating interferometric imaging system of claim 1,
step-and-scan detection is performed in front of the X-ray detector by using an analytical grating.
5. A method of operating the dual-energy X-ray grating interference imaging system of any one of claims 1 to 4, comprising:
1) the light source, the dual-energy phase grating and the X-ray detector are sequentially placed in a light path;
2) adjusting the angles and positions of the dual-energy phase grating and the X-ray detector to meet specified conditions;
3) turning on a light source and recording a vertical stripe image u1 under the state that a sample to be detected is not placed;
4) putting a sample to be tested, turning on a light source, and recording a vertical stripe image u 2;
5) changing the energy spectrum of the light source to respectively comprise high-energy and low-energy points, repeating the steps 2 to 4 twice to obtain u1(EL), u2(EL), u1(EH) and u2(EH), and calculating the overall intensity change, distortion and blurring of the stripes through an algorithm to obtain a multi-contrast image, wherein the EL is the low-energy point and the EH is the high-energy point.
6. The method of claim 5,
using an X-ray detector with a resolution capable of resolving two energy points, the results recorded by the detector are directly compared to the higher and lower two energy bands to obtain u1(EL) and u2(EL), and u1(EH) and u2(EH), and the overall intensity variation, distortion and blurring of the fringes are calculated algorithmically to obtain a multi-contrast image.
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