CN110068585A - Dual-energy x-ray grating interference imaging system and method - Google Patents
Dual-energy x-ray grating interference imaging system and method Download PDFInfo
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Abstract
The present invention provides a kind of dual-energy x-ray grating interference imaging system and method, has: generating the light source of scheduled two kinds of different-energy X-rays by adjusting with certain coherence property；The dual intensity phase grating of identical phase shift can be generated to the X-ray of scheduled two kinds of different-energies, so that same position generates same periodically vertical striped after dual intensity phase grating；For resolution ratio better than the X-ray detector in the period of vertical striped, light source is directional light, configures in order sample to be tested, dual intensity phase grating and detector from the direction of light source incidence X-ray.According to the present invention, regarding to the issue above, the purpose of the present invention is to provide a kind of dual-energy x-ray grating interference imaging system and methods, the imaging of dual intensity grating interference can be achieved, so as to obtain the information such as the linear attenuation factor, phase shift factor, dispersion factor under two energy of sample, substance identification, defect diagonsis etc. can be effectively carried out.
Description
Technical field
The present invention relates to a kind of dual-energy x-ray grating interference imaging system and methods.
Background technique
As grating interference imaging technique, currently used technology is to utilize X-ray source and phase grating generation rule
Vertical stripe (i.e., Talbot striped), sample the front and back distortion of pattern, intensity into optical path are increased by detection and declined
The information such as subtract, obscure, realizing to the separation of the absorptions contrast of sample, the imaging of phase contrast and dark field contrast and information.
In plane wave and in the case of do not consider enlarge-effect, if phase grating is π to the phase-shift phase of design X-ray
When, the period of vertical striped is the 1/2 of phase grating period, if phase-shift phase is other rational fraction times π, vertical striped
Period is that the phase grating period is consistent.Then under plane wave situation, position that ideal vertical striped occurs after phase grating
dT, i.e., vertical striped should meet following formula at a distance from phase grating:
Wherein, p is the period of phase grating；λ is the wavelength of X-ray；M is vertical striped order, according to the phase shift of phase grating
Take odd number or even number；χ is a parameter relevant to phase grating phase-shift phase, and when phase grating π phase shift, χ takes 2, other situations
Take 1.
X-ray phase grating herein refers to change the transmission grating of X-ray Wave-front phase distribution.It is using X-ray not
It is different with the spread speed in medium, make by the X-ray of X-ray phase grating grid line material compared with Free propagation in grid line gap
Partial X-ray falls behind certain phase.For the X-ray of particular energy, the grating grid material of certain height can be brought
Phase difference be determining.Therefore, after X-ray phase grating completes, the phase-shift characterisitc of X-ray is determined that.
It realizes more contrast imagings due to system and separates and establish the basis for generating specific phase shift to X-ray in phase grating
On, typically, grating interference imaging system only has a system energy point, and the image-forming information of acquisition is also limited to this therewith
On capable of putting.It is different that grating interference imaging and Traditional x-ray imaging by change light source spectral distribution can be achieved with dual-energy imaging,
Although itself and x-ray imaging, it will realize dual-energy imaging, and it is so direct to can not show a candle to Traditional x-ray imaging.
Summary of the invention
Problems to be solved by the invention:
In view of the above-mentioned problems, the purpose of the present invention is to provide a kind of dual-energy x-ray grating interference imaging system and method, it can be real
Existing dual intensity grating interference imaging, so as to obtain the linear attenuation factor, phase shift factor, dispersion factor under two energy of sample etc.
Information can effectively carry out substance identification, defect diagonsis etc..
Technical means to solve problem:
The present invention provides a kind of dual-energy x-ray grating interference imaging system, has:
The light source of scheduled two kinds of different-energy X-rays is generated by adjusting with certain coherence property；
The dual intensity phase grating of identical phase shift can be generated to the X-ray of scheduled two kinds of different-energies, thus
Same position generates same periodically vertical striped after the dual intensity phase grating；
Resolution ratio is better than the X-ray detector in the period of the vertical striped,
The light source is directional light, configures in order the sample to be tested, the dual intensity phase from the direction of the light source incidence X-ray
Position grating and the detector.
It is not necessary according to the invention that grating interference imaging can strictly be met by changing grating space or replacement phase grating
Condition, only change X-ray source power spectrum can switch in two and can switch between point.Therefore, mobile light is needed compared to other
The more contrast image acquiring methods of the dual intensity of grid and/or sample to be tested, the present invention can be obtained without introducing additional complex operations
More contrast images of the sample under two kinds of different-energies are obtained, and do not need to move any optical element along optical path direction, not
Have and increases additional adjusting and requirement in technical foundation.Phase contrast, the dark field contrast image of acquisition have more traditional light
The narrower Direction response property of grid interference imaging result, can obtain more accurate sample to be tested information.In addition, can also be with CT skill
Art combines, and further obtains the information such as the decay factor, phase shift factor, dispersion factor of each volume element of accurate sample interior,
The fields such as substance identification, defect diagonsis have comparable application prospect.
In addition, the dual intensity grating interference imaging system in the present invention can obtain more contrast images under two kinds of different-energies.
The spectral distribution for only needing to change x-ray source compared to traditional dual-energy x-ray absorption-contrast imaging and does not introduce additionally
Complex operations.
Also, being also possible to the light source is synchrotron radiation light source, Microfocus X-ray x-ray source in the present invention.Thus, it is possible to make
The X-ray absorption grating of source grating is used as to which incident X-ray is separated into multiple linear light sources.
Also, being also possible to the step-scan detection in front of the detector using the analysis grating in the present invention.By
This, is equally applicable to the inadequate situation of detector resolution.
Also, if being also possible to the detector with energy resolution, that is, can be differentiated by having by two in the present invention
The resolution ratio of energy can be put, then the light source is to cover two wide range x-ray sources that can put energy, and make a reservation for without having generation
Two kinds of different-energy X-rays ability.Based on this, using the detector for having energy resolution, then using only generating one
The light source of the wide Energy distribution of kind can also do dual intensity.
The present invention also provides a kind of working methods of above-mentioned dual-energy x-ray grating interference imaging system, comprising:
1) X-ray source, dual intensity phase grating and detector are sequentially placed into optical path；
2) angles and positions of dual intensity phase grating and detector are adjusted to meet rated condition；
3) in the state of not placing sample to be tested, light source is opened, vertical stripe pattern u1 is recorded；
4) it is put into sample to be tested, light source is opened, records vertical stripe pattern u2；
5) power spectrum for changing x-ray source is allowed to separately include high and low energy point, repeat twice of step 2 to 4, to obtain u1 (EL), u2
(EL), u1 (EH), u2 (EH) calculate the integral strength variation of striped by algorithm, distort and obscure, obtain more contrast images,
Wherein EL is low energy point, and EH is high energy point.
Also, being also possible in the present invention using with the X-ray detection that can differentiate the resolution ratio that two can put energy
Device, then directly relatively height two can under sections detector record as a result, with obtain u1 (EL) and u2 (EL) and u1 (EH) with
U2 (EH) calculates the integral strength variation of striped by algorithm, distorts and obscure, obtains more contrast images.
Invention effect:
The present invention can provide a kind of dual-energy x-ray grating interference imaging system, can to sample high and low two can point respectively into
The more contrast imagings of row X-ray obtain the information such as accurate decay factor, phase shift factor, the dispersion factor under two energy of sample,
Promote identification and separating capacity of the imaging system to multi-component material.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of dual-energy x-ray grating interference imaging system according to the present invention；
Fig. 2 is the figure for showing the relationship of an example dual intensity phase grating grid line height and X-ray energy；
Fig. 3 is the figure for showing the relationship of an example energy phase grating grid line height relative deviation and X-ray energy；
Symbol description:
1 light source, 2 samples to be tested, 3 dual intensity phase gratings, 3 ' vertical stripeds, 4 detectors.
Specific embodiment
The present invention is further illustrated below in conjunction with following embodiments, it should be appreciated that following embodiments are merely to illustrate this
Invention, should not be understood as limiting the scope of the invention, and those skilled in the art's above content according to the present invention is made
Some nonessential modifications and adaptations out all belong to the scope of protection of the present invention.Following specific technological parameters of example etc. are also only
It is an example in OK range, i.e., those skilled in the art can be done in suitable range by the explanation of this paper and be selected,
And hereafter exemplary specific value is not really wanted to be defined in.Identical in the various figures or corresponding appended drawing reference indicates the same part, and
Omit repeated explanation.
It is disclosed a kind of dual-energy x-ray grating interference imaging system S, as shown in Figure 1, imaging system S has: light source
1, sample to be tested 2, dual intensity phase grating 3 and detector 4.Wherein light source 1 herein refers to the parallel X-ray with certain coherence
Source, such as synchrotron radiation light source, are also possible to other power supplys or incoherent light source, such as X-ray tube, but incoherent light source
In the case of need to increase additional grating assembly.Light source 1 is penetrated by the X that adjusting can generate two kinds of different-energies in design
Line.The X-ray of two kinds of different-energies of 3 pairs of dual intensity phase grating designs, can generate identical phase shift, thus double
It can the same periodically vertical striped 3 ' of 3 downstream same position of phase grating generation.Detector 4 is X-ray intensity detector, note
Recording playback enters the 3 ' pattern of vertical striped of 2 front and back of sample to be tested.Wherein, dual intensity phase grating 3 is a kind of special designing grid line height h
Latter made phase grating, as grating, grid line substrate is usually the semiconductor material of silicon etc, and grid line gap is usually
Other materials also can be filled in sky.In other words, designing grating major design is exactly grid line, height, period including grid line (
Away from), the distribution in empty accounting (width) and plane.Dual intensity phase grating in the present invention is exactly to be specifically designed grid line height h
It generates later, two kinds of different-energy X-rays can be generated with a kind of grating of identical phase shift effect.
If detector 4 has energy resolution, such as tellurium-zinc-cadmium detector array etc., then 1 power spectrum of light source is only needed
Can put comprising two systems can be Polaroid.If detector 4 does not have energy resolution, need light source 1 that can lead to
It overregulates and generates two X-rays that can be put respectively, be imaged respectively in two times.
Imaging system S of the invention can be realized the imaging of dual intensity grating interference.Specifically, design can be to two kinds not in advance
Co-energy X-ray can generate the phase grating of same phase shift, so that the X-ray to two kinds of different-energies can be same
The vertical striped 3 ' of one position generation rule, and the spacing between dual intensity phase grating 3 and detector 4 is therefore further designed,
And the other parameters of whole system.
In the present invention, two different energy of dual intensity meaning are not that any two kinds of energy can meet.The two energy
Need to meet two conditions.On the one hand, there are the X-ray phase grating of specific grid line height, all to the X-rays of the two energy
Same phase shift effect can be generated.Here phase shift is a series of phase gratings of (p+2n π), is considered to have same phase shift
Effect, wherein n is natural number.On the other hand, need the X-ray of two energy in the vertical striped generated after phase grating
3 ' in same position.According to vertical 3 ' range formula of striped, it is assumed that the X-ray wavelength of two energy is λLAnd λH, position is identical to be
It is required that distance dTIdentical, then taking vertical 3 ' order of striped and wavelength, it is necessary to meet following condition
By means of this, imaging system S of the invention, which haves no need to change grating space or replacement phase grating, strictly to be met
Grating interference image-forming condition, in contrast, only changing X-ray source power spectrum can switch at two between point.
X-ray energy is inversely proportional with wavelength, therefore the relationship of vertical striped 3 ' order and X-ray energy
mLEL=mHEHOrWherein, mLRepresent the vertical striped order chosen in the case of low energy point.
Also, the spacing between dual intensity phase grating 3 and detector 4 meets following formula in the present invention:
Wherein, subscript L indicates low energy point parameter, and subscript H indicates high energy point parameter.P is the period of dual intensity phase grating；λ penetrates for X
The wavelength of line；M is vertical striped order,；χ is a parameter relevant to phase grating phase-shift phase, and when phase grating π phase shift, χ is taken
2, other situations take 1.
Also, due to the design requirement of dual intensity system, it is desirable that the situation under two kinds of energy has all been constrained to only one in the present invention
Value mLAnd mH.Therefore the order of vertical striped 3 ' does not take the even number of all odd numbers further according to the phase-shift phase of phase grating.
As shown in Fig. 2, may be, for example, gold in grid line material, phase grating is for π phase-shifted grating and its with each of phase shift effect
Kind in the case of, search it can be found that work as EL=0.6EH (energy ratio meets condition two), 3 π of high-energy X-rays phase shift, low energy
When measuring 5 π of X-ray phase shift (being all π to 2 π remainders, meet condition one), corresponding phase grating grid line height has common value.For
The curve of corresponding high energy point EH grid line height, abscissa and ordinate are as shown in Fig. 2, for corresponding low energy point EL grid line height
Curve, abscissa is practical be EH multiplied by after 0.6 as a result, thus, it is possible to so that abscissa is indicated the selection of one group of high and low energy point value.
As shown in figure 3, making dual intensity phase in the case that grid line material is gold with 3 π phase-shifted grating grid line height of high energy point
When grating 3 and the relative deviation of 5 π phase-shifted grating grid line height of low energy point, it is contemplated that have enough penetrate when 20keV or more
Ability will not be fallen by grating base material blocks, and consider that the height of grating grid is too high when 100keV or more, manufacture difficulty
Greatly, therefore in the section of 20keV to 100keV and reference axis there are two intersection points, enter shown in following table respectively:
| Grid line height/um | Low energy point/keV | Low energy point phase shift | High energy point/keV | High energy point phase shift |
| 21.6 | 22.2 | 5.00pi | 37.0 | 3.00pi |
| 55.8 | 56.9 | 5.00pi | 94.7 | 3.00pi |
。
So grid line material is gold, grid line height be the X-ray transmission grating of 21.6um be exactly one piece to 22.2keV and
Two kinds of different-energies of 37.0keV can generate the ideal dual intensity phase grating 3 of π phase shift effect.Similarly, grid line material is gold,
Grid line height, which is exactly one piece for 55.8umX transmission of radiation grating, can generate π to two kinds of different-energies of 56.9keV and 94.7keV
The ideal dual intensity phase grating 3 of phase shift effect.
Although selecting the grid line relatively low gold of height as grid line material in this implementation form, but not limited to this, grid line
Material can be selected with actual demand, such as selection silicon, nickel etc. also may be used.
Illustrate the workflow of dual-energy x-ray grating interference imaging system S of the invention, below to further understand this
Invention.In the case of the cardinal principle of grating interference imaging and the separation of more contrasts is to compare and has two kinds of no specimen, by dual intensity phase
The variation for the vertical striped 3 ' that grating 3 generates.Briefly, the Strength Changes of striped entirety are to absorb contrast, the distortion of striped
That is, deviation is differential phase contrast, striped obscures as scattering (dark field) contrast.
1) X-ray source 1, dual intensity phase grating 3 and detector 4 are sequentially placed into optical path.
2) angles and positions for accurately adjusting dual intensity phase grating 3 and detector 4, make to meet the following conditions: dual intensity phase
3 place plane of grating and 4 place plane of detector are parallel to each other and perpendicular to optical paths, the center of dual intensity phase grating 3 substantially and
4 center of detector is in same straight line, and the spacing between dual intensity phase grating 3 and detector 4 meets image-forming condition, i.e., vertical item
The position of line 3 ' and detector essentially coincide.
3) in the state of not placing sample to be tested 2, light source is opened, vertical stripe pattern u1 is recorded.
4) it is put into sample to be tested 2, light source is opened, records vertical stripe pattern u2.
If 5) can directly be compared under two energy sections of height using the X-ray detector with energy resolution
Detector record as a result, u1 (EL) and u2 (EL) and u1 (EH) and u2 (EH), pass through the integral strength that algorithm calculates striped
Variation is distorted and is obscured, and obtains more contrast images.
5 ') it if using common X-ray detector, needs to change the power spectrum of x-ray source, is allowed to separately include height
Energy point, repeats twice of step 2 to 4, to obtain u1 (EL), u2 (EL), u1 (EH), u2 (EH).
In addition, each contrast all represents a kind of special information, the different information of same sample to be tested 2 in the present invention
The picture quality shown can have very big difference.Specifically, the absorption contrast image that Traditional x-ray imaging obtains is low
Atomic number, the imaging aspect of low density material are not so good, and the phase contrast image of more contrast images just has very in this respect
Big advantage, such as polymer material, biologic soft tissue etc.；In contrast, the absorption contrast image that Traditional x-ray imaging obtains
Insensitive to interface and microcosmic geometry, and they are particularly evident in scattering (dark field) contrast image in more contrast images,
Such as dusty material, lung tissue etc..
Grating interference imaging can obtain more contrast images, and current research mainly absorbs contrast image, phase contrast
Image and dark field (scattering) contrast image.It absorbs in the physical significance that contrast image is the image that Traditional x-ray imaging obtains more
Accurate saying, technological means is mature, and meaning corresponds to the imaginary part of medium refraction index.Phase contrast image corresponds to medium refraction index
Real part, macro manifestations be deviation of the X-ray after sample to be tested material.At present, phase contrast image is in low-density
It is more apparent (signal is stronger) than absorbing contrast image under the situations such as material, low atomic number material, multiple solutions sample to be tested, one
In the diagnosis of a little special materials (such as material of birefringence), it can obtain and absorb the letter that contrast image cannot show completely
Breath.Scattering (dark field) contrast image then does well in the diagnosis of porous material (such as human lung, foam etc.), certain journey
The information on scale smaller than image resolution ratio can also be reacted on degree.
The single maximum advantage that can have of dual intensity comparison is exactly the ability that there is dual intensity substance to identify.It is used in simple situation
Traditional dual-energy x-ray absorption-contrast imaging is just able to satisfy, for example differentiates the degree (mixed proportion of water and alcohol) of wine, such as
Coal ash analyzer (mixed proportion of coal and soil), such as borne densitometers.But the imaging of dual intensity grating interference has very in the case where complexity
Big advantage, such as the mixing of many kinds of substance, for example absorb the indiscriminate sample to be tested of contrast image.
In addition, the present invention due to the phase grating used phase change amount be (p+2n π), can script grating interference at
On the basis of picture, the energy spectrum for participating in the X-ray of imaging is further reduced, to improve the accuracy of the information of acquisition.
For example, the power spectrum of x-ray source is the work of 10-100keV, and the information that Traditional x-ray imaging obtains corresponds to 10-100keV, general
The information that logical grating interference imaging system obtains may correspond to 40-60keV, the information that dual intensity grating interference imaging system obtains
33-39keV and 57keV-63keV may then be corresponded to.
In conclusion according to the present invention, needing the more contrast figures of the dual intensity of moving grating and/or sample to be tested compared to other
As acquisition methods, the present invention can obtain more linings of the sample 2 under two kinds of different-energies without introducing additional complex operations
Spend image, can also with CT technology ining conjunction with, further obtain the linear attenuation factor of each volume element inside accurate sample to be tested 2,
The information such as phase shift factor, dispersion factor have comparable application prospect in fields such as substance identification, defect diagonsis.
Above specific embodiment has carried out further specifically the purpose of the present invention, technical scheme and beneficial effects
It is bright, it should be appreciated that the above is only a kind of specific embodiments of the invention, however it is not limited to protection model of the invention
It encloses, under the objective for not departing from essential characteristic of the invention, the present invention can be presented as diversified forms, therefore the implementation in the present invention
Form is to be illustrative rather than definitive thereof, and is limited since the scope of the present invention is defined by the claims rather than by specification, Er Qieluo
All changes in the full scope of equivalents of the range that claim defines or the range that it is defined are understood to be included in right
In claim.All within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. made should all wrap
Containing within protection scope of the present invention.
Claims (6)
1. a kind of dual-energy x-ray grating interference imaging system, which is characterized in that have:
The light source of scheduled two kinds of different-energy X-rays is generated by adjusting with certain coherence property；
The dual intensity phase grating of identical phase shift can be generated to the X-ray of scheduled two kinds of different-energies, thus
Same position generates same periodically vertical striped after the dual intensity phase grating；
Resolution ratio is better than the X-ray detector in the period of the vertical striped,
The light source is directional light, configures in order the sample to be tested, the dual intensity phase from the direction of the light source incidence X-ray
Position grating and the detector.
2. dual-energy x-ray grating interference imaging system according to claim 1, which is characterized in that
If the detector, which has, can differentiate two resolution ratio that can put energy, the light source is to cover two to put energy
Wide range x-ray source, and without having the ability for generating scheduled two kinds of different-energy X-rays.
3. dual-energy x-ray grating interference imaging system according to claim 1, which is characterized in that
The light source is synchrotron radiation light source or Microfocus X-ray x-ray source.
4. dual-energy x-ray grating interference imaging system according to claim 1, which is characterized in that
The step-scan detection in front of the detector using the analysis grating.
5. a kind of work side of dual-energy x-ray grating interference imaging system as claimed in any of claims 1 to 4
Method characterized by comprising
1) X-ray source, dual intensity phase grating and detector are sequentially placed into optical path；
2) angles and positions of dual intensity phase grating and detector are adjusted to meet rated condition；
3) in the state of not placing sample to be tested, light source is opened, vertical stripe pattern u1 is recorded；
4) it is put into sample to be tested, light source is opened, records vertical stripe pattern u2；
5) power spectrum for changing x-ray source, is allowed to separately include high and low energy point, repeats twice of step 2 to 4, to obtain u1(EL), u2
(EL), u1(EH), u2(EH), the integral strength variation of striped, distortion and fuzzy are calculated by algorithm, obtain more contrast images,
Wherein EL is low energy point, and EH is high energy point.
6. according to the method described in claim 5, it is characterized in that,
Using having the X-ray detector that can differentiate the resolution ratio that two can put energy, then directly relatively height two can section
Lower detector record as a result, to obtain u1(EL) and u2(EL) and u1(EH) and u2(EH), pass through algorithm and calculate striped
Integral strength variation is distorted and is obscured, and obtains more contrast images.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111325703A (en) * | 2020-01-20 | 2020-06-23 | 上海联影医疗科技有限公司 | Multi-modal imaging guided radiotherapy method, device and system |
| CN113171116A (en) * | 2021-01-18 | 2021-07-27 | 深圳市第二人民医院(深圳市转化医学研究院) | Multi-modal X-ray imaging device and method for detecting soft tissue foreign bodies |
| CN114113167A (en) * | 2021-11-26 | 2022-03-01 | 中国科学技术大学 | X-ray Talbot-Lau grating phase contrast imaging method |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104132953A (en) * | 2014-08-01 | 2014-11-05 | 中国科学技术大学 | Dual-energy X-ray phase-contrast imaging device and implementation method thereof |
| US20150243397A1 (en) * | 2013-10-31 | 2015-08-27 | Wenbing Yun | X-ray interferometric imaging system |
| CN104970815A (en) * | 2014-04-04 | 2015-10-14 | 曹红光 | X-ray imaging system and method based on grating phase contrast and photon counting |
| EP3021110A1 (en) * | 2014-11-11 | 2016-05-18 | Paul Scherrer Institut | System for obtaining quantitative x-ray images using Hilbert transform on imaged fringes |
| CN105628718A (en) * | 2014-11-04 | 2016-06-01 | 同方威视技术股份有限公司 | Multi-energy-spectrum X-ray grating imaging system and imaging method |
| EP3251598A1 (en) * | 2016-05-30 | 2017-12-06 | Konica Minolta, Inc. | Talbot imaging apparatus |
| CN107807139A (en) * | 2016-09-05 | 2018-03-16 | 天津工业大学 | The dual-energy x-ray phase contrast imaging system and its implementation of a kind of no step device |
-
2019
- 2019-03-15 CN CN201910199388.5A patent/CN110068585B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150243397A1 (en) * | 2013-10-31 | 2015-08-27 | Wenbing Yun | X-ray interferometric imaging system |
| CN104970815A (en) * | 2014-04-04 | 2015-10-14 | 曹红光 | X-ray imaging system and method based on grating phase contrast and photon counting |
| CN104132953A (en) * | 2014-08-01 | 2014-11-05 | 中国科学技术大学 | Dual-energy X-ray phase-contrast imaging device and implementation method thereof |
| CN105628718A (en) * | 2014-11-04 | 2016-06-01 | 同方威视技术股份有限公司 | Multi-energy-spectrum X-ray grating imaging system and imaging method |
| EP3021110A1 (en) * | 2014-11-11 | 2016-05-18 | Paul Scherrer Institut | System for obtaining quantitative x-ray images using Hilbert transform on imaged fringes |
| EP3251598A1 (en) * | 2016-05-30 | 2017-12-06 | Konica Minolta, Inc. | Talbot imaging apparatus |
| CN107807139A (en) * | 2016-09-05 | 2018-03-16 | 天津工业大学 | The dual-energy x-ray phase contrast imaging system and its implementation of a kind of no step device |
Non-Patent Citations (1)
| Title |
|---|
| 荣锋等: ""双能X射线光栅相衬成像的研究"", 《物理学报》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111325703A (en) * | 2020-01-20 | 2020-06-23 | 上海联影医疗科技有限公司 | Multi-modal imaging guided radiotherapy method, device and system |
| CN111325703B (en) * | 2020-01-20 | 2024-03-12 | 上海联影医疗科技股份有限公司 | Multi-mode imaging guided radiotherapy method, device and system |
| CN113171116A (en) * | 2021-01-18 | 2021-07-27 | 深圳市第二人民医院(深圳市转化医学研究院) | Multi-modal X-ray imaging device and method for detecting soft tissue foreign bodies |
| CN114113167A (en) * | 2021-11-26 | 2022-03-01 | 中国科学技术大学 | X-ray Talbot-Lau grating phase contrast imaging method |
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