CN109841604A - 半导体装置以及电力变换装置 - Google Patents

半导体装置以及电力变换装置 Download PDF

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CN109841604A
CN109841604A CN201811397687.1A CN201811397687A CN109841604A CN 109841604 A CN109841604 A CN 109841604A CN 201811397687 A CN201811397687 A CN 201811397687A CN 109841604 A CN109841604 A CN 109841604A
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小柳诚
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Mitsubishi Electric Corp
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Abstract

本发明的目的在于提供能够提高绝缘特性的半导体装置和电力变换装置。其特征在于,具备:基座板;粘接剂,其设置于该基座板的上表面;以及壳体,其具有下表面、与该下表面相连并且与该下表面相比位于与该基座板的中央接近的位置的斜面,该壳体通过在该下表面和该斜面附着该粘接剂,从而固定于该基座板,该粘接剂中的与该斜面接触的部分比与该下表面接触的部分厚。

Description

半导体装置以及电力变换装置
技术领域
本发明涉及半导体装置以及电力变换装置。
背景技术
在专利文献1中公开了下述内容,即,在将***树脂壳体重叠在搭载有电路组装体的散热用金属基座板的周缘,将两者间通过粘接剂进行了接合的半导体装置的封装件处,沿***树脂壳体的底部内周缘而形成带台阶的槽部,在该槽部涂敷粘接剂,在这种结构中,在所述带台阶的槽部形成粘接剂的储存空间。
专利文献1:日本特开平11-307658号公报
在将基座板和壳体通过粘接剂粘接的情况下,存在下述问题,即,粘接剂的气泡膨胀,经由胶体气泡在壳体正下方进行沿面放电而产生绝缘不良。例如,在半导体装置的高温下的绝缘试验中有时在粘接剂的表面产生气泡。沿面放电在绝缘距离近的构造中特别容易发生。
发明内容
本发明就是为了解决上述课题而提出的,其目的在于提供能够提高绝缘特性的半导体装置和电力变换装置。
本发明涉及的半导体装置的特征在于,具备:基座板;粘接剂,其设置于该基座板的上表面;以及壳体,其具有下表面、与该下表面相连并且与该下表面相比位于与该基座板的中央接近的位置的斜面,该壳体通过在该下表面和该斜面附着该粘接剂,从而固定于该基座板,该粘接剂中的与该斜面接触的部分比与该下表面接触的部分厚。
以下,使得本发明的其他特征得以明确。
发明的效果
根据本发明,能够通过形成厚的粘接剂胶瘤(fillet),从而提高半导体装置和电力变换装置的绝缘特性。
附图说明
图1是实施方式1涉及的半导体装置的剖面图。
图2是图1的壳体和基座板的粘接部分的放大图。
图3是实施方式2涉及的半导体装置的局部放大图。
图4是实施方式3涉及的半导体装置的局部放大图。
图5是表示电力变换***的结构的框图。
标号的说明
10半导体装置,12基座板,20壳体,20A斜面,20B第1下表面,20C第2下表面,24粘接剂,24a粘接剂胶瘤,24b中央部,24c外侧部
具体实施方式
参照附图对实施方式涉及的半导体装置和电力变换装置进行说明。对相同或相应的结构要素标注相同的标号,有时省略重复说明。
实施方式1
图1是实施方式1涉及的半导体装置10的剖面图。半导体装置10具备基座板12。在基座板12之上利用焊料14固定有绝缘基板16。绝缘基板16具备例如散热性优异的AlN(氮化铝)等绝缘材料和形成于该绝缘材料之上的电路图案。在绝缘基板16的上表面固定有半导体元件18。半导体元件18能够是例如IGBT(Insulated-Gate Bipolar Transistor)芯片以及二极管芯片。
绝缘基板16和半导体元件18被壳体20包围。电极22埋入于壳体20。电极22的一部分露出至壳体20的内部。另外,电极22的一部分与壳体20相比位于上方,由此能够将电极22与外部连接。为了提高焊接性,电极22能够由例如实施了镀Ni的Cu形成。
壳体20通过粘接剂24固定于基座板12的上表面。作为粘接剂24,能够使用常温硬化型粘接剂,通过加热促进聚合而硬化的热硬化型粘接剂,或者通过紫外线等的照射促进聚合而硬化的能量线硬化型粘接剂等。例如,能够使用包含导电性颗粒的导电性粘接剂。
半导体元件18和电极22通过导线30连接。在壳体20的内部填充有硅凝胶等封装材料32。在该封装材料32的上方设置有盖34。盖34和壳体20的材料是例如PPS树脂等工程塑料。如上所述,半导体装置10是将基座板12和壳体20通过粘接剂24接合的类型的功率模块。
图2是图1的壳体20和基座板12的粘接部分的放大图。壳体20具备在y方向延伸得长的第1部分20a和从第1部分20a起向基座板12的中央方向凸出的第2部分20b。电极22在第2部分20b的上表面露出。第2部分20b具有斜面20A、与斜面20A相连的第1下表面20B以及与第1下表面20B相连的第2下表面20C。斜面20A是通过将第2部分20b设为锥形形状而设置的。第2下表面20C与第1下表面20B相比位于下方。即,第1下表面20B为锪孔部。斜面20A与第1下表面20B、第2下表面20C相比位于与基座板12的中央接近的位置。第2下表面20C与第1下表面20B相比位于从基座板12的中央远离的位置。
在基座板12的上表面设置的粘接剂24,与斜面20A、第1下表面20B以及第2下表面20C接触。粘接剂24具备与第2下表面20C接触的外侧部24c、与第1下表面20B接触的中央部24b以及与斜面20A接触的粘接剂胶瘤24a。粘接剂胶瘤24a是在壳体20和基座板12之间向基座板12的中央方向流动的粘接剂的一部分伸出而成的部分。与斜面20A接触的粘接剂胶瘤24a比外侧部24c和中央部24b厚。由于粘接剂胶瘤24a是在制造过程中被挤出的部分,因此朝向基座板12的中央方向呈凸形状。通过在斜面20A、第1下表面20B以及第2下表面20C和基座板12的上表面设置有粘接剂24,由此使壳体20固定于基座板12。
在半导体装置的制造工序中对粘接剂24进行加热。如果粘接剂胶瘤薄,则在加热时在粘接剂胶瘤的表面容易产生气泡。因此,在实施方式1中使粘接剂胶瘤24a的体积增大。具体地说,由于第1下表面20B与第2下表面20C相比位于上方,因此能够使中央部24b比外侧部24c厚而增加粘接剂24的涂敷量。并且,粘接剂胶瘤24a与该厚的中央部24b相连,与斜面20A接触。由此,能够使粘接剂胶瘤24a增厚。通过形成厚的粘接剂胶瘤24a,从而能够减少在加热后在表面出现的气泡。由于气泡的减少,从而能够提高半导体装置10的绝缘特性。
实施方式1涉及的半导体装置10是通过壳体20的形状而使粘接剂胶瘤24a增厚。会想到能够使粘接剂胶瘤24a增厚的各种各样的壳体20的形状。例如,虽然在壳体20设置了第1下表面20B和第2下表面20C,但也可以在此处设置大于或等于3个下表面。在该情况下,通过使多个下表面的高度随着向基座板12的中央方向行进而增高,从而能够使粘接剂胶瘤24a增厚。
由于粘接剂胶瘤24a是在制造过程中被从壳体20和基座板12之间挤出的剩余部分,因此通常朝向基座板12的中央方向呈凸形状。即,粘接剂胶瘤24a的表面成为中央***的曲面。凸形状的粘接剂胶瘤24a与凹形状或者平坦表面的粘接剂胶瘤相比容易增厚。
上述的变形例能够应用于以下的实施方式涉及的半导体装置。此外,由于以下的实施方式涉及的半导体装置与实施方式1之间的共同点多,因此以与实施方式1之间的不同点为中心进行说明。
实施方式2
图3是实施方式2涉及的半导体装置的局部放大图。基座板12的上表面具有第1上表面12A和与第1上表面12A相比位于上方的第2上表面12B。由于第1上表面12A和第2上表面12B的台阶而形成了侧壁12a。如果俯视观察,则第2上表面12B被第1上表面12A包围。粘接剂24涂敷于第1上表面12A,半导体元件18设置于第2上表面12B的正上方。在壳体20的第2部分20b设置有斜面20A和与斜面20A相连的下表面20B。
粘接剂24具备主体部24d和粘接剂胶瘤24e。主体部24d与第1上表面12A、下表面20B接触。粘接剂胶瘤24e与第1上表面12A、侧壁12a以及斜面20A接触。由于第1上表面12A与第2上表面12B相比位于下方,因此能够增加设置于第1上表面12A之上的主体部24d的体积。
粘接剂胶瘤24e通过与厚的主体部24d和侧壁12a接触,从而形成得厚。因此能够使粘接剂胶瘤24e的体积增大。由于粘接剂胶瘤24e的体积大,因此能够减少在加热后在粘接剂胶瘤表面出现的气泡数量。
通过使第2上表面12B比第1上表面12A高,从而粘接剂24的流动由侧壁12a阻止。由此,能够防止粘接剂24附着至绝缘基板16或者半导体元件18等。
实施方式1、2都构成为使粘接剂胶瘤增厚而提高粘接剂胶瘤的体积。被从壳体的下表面挤出而形成的粘接剂胶瘤通过与壳体的斜面接触,从而能够使粘接剂胶瘤增厚。
实施方式3
图4是实施方式3涉及的半导体装置的局部放大图。壳体20具有接触下表面20D、非接触下表面20E和外缘下表面20F。接触下表面20D、外缘下表面20F与非接触下表面20E相比到达更下方,从而在壳体20设置有凹部。接触下表面20D与基座板12的上表面接触。非接触下表面20E与接触下表面20D相比远离半导体元件18,与接触下表面20D相比位于上方。外缘下表面20F与接触下表面20D、非接触下表面20E相比远离半导体元件18。
粘接剂24与非接触下表面20E、基座板12接触。因此,在所述的壳体20的凹部设置有粘接剂24。粘接剂24由于接触下表面20D的存在而与壳体20的内部隔开。因此,即便在加热时在粘接剂24的表面产生气泡,也能够防止发生绝缘不良。例如即便产生气泡24f,也不会发生由气泡24f引起的放电。
实施方式4
本实施方式是将上述实施方式1至3涉及的半导体装置应用于电力变换装置。电力变换装置不限定于特定的电力变换装置,但以下作为实施方式4,对将上述半导体装置应用于三相逆变器的情况进行说明。
图5是表示电力变换***的结构的框图,在该电力变换***中应用了本实施方式所涉及的电力变换载置。
图5所示的电力变换***由电源100、电力变换装置200、负载300构成。电源100是直流电源,向电力变换装置200供给直流电力。电源100能够由各种方式构成,例如,能够由直流***、太阳能电池、蓄电池构成,也可以由与交流***连接的整流电路或者AC/DC转换器构成。另外,也可以使电源100由将从直流***输出的直流电力变换为规定的电力的DC/DC转换器构成。
电力变换装置200是连接在电源100和负载300之间的三相逆变器,将从电源100供给的直流电力变换为交流电力,向负载300供给交流电力。电力变换装置200如图5所示具备:主变换电路201,其将直流电力变换为交流电力而输出;以及控制电路203,其将对主变换电路201进行控制的控制信号向主变换电路201输出。
负载300是由从电力变换装置200供给的交流电力驱动的三相电动机。此外,负载300不限定于特定的用途,是搭载于各种电气设备的电动机,例如,用作面向混合动力汽车、电动汽车、铁路车辆、电梯或者空调设备的电动机。
以下,对电力变换装置200的详情进行说明。主变换电路201具备开关元件和续流二极管(未图示),通过使开关元件进行通断,从而将从电源100供给的直流电力变换为交流电力,向负载300供给。对于主变换电路201的具体的电路结构,存在各种结构,但本实施方式涉及的主变换电路201是2电平的三相全桥电路,能够由6个开关元件和与各个开关元件反向并联的6个续流二极管构成。将上述实施方式1至3中的任意者所涉及的半导体装置应用于主变换电路201的各开关元件和各续流二极管中的至少任意者。6个开关元件两个两个地串联连接而构成上下桥臂,各上下桥臂构成全桥电路的各相(U相、V相、W相)。并且,各上下桥臂的输出端子即主变换电路201的3个输出端子与负载300连接。
另外,主变换电路201具备对各开关元件进行驱动的驱动电路(未图示),但驱动电路也可以内置于半导体装置202,还可以是独立于半导体装置202而另外具有驱动电路的结构。驱动电路生成对主变换电路201的开关元件进行驱动的驱动信号,供给至主变换电路201的开关元件的控制电极。具体地说,按照来自后述的控制电路203的控制信号,向各开关元件的控制电极输出将开关元件设为接通状态的驱动信号和将开关元件设为断开状态的驱动信号。在将开关元件维持为接通状态的情况下,驱动信号是大于或等于开关元件的阈值电压的电压信号(接通信号),在将开关元件维持为断开状态的情况下,驱动信号成为小于或等于开关元件的阈值电压的电压信号(断开信号)。
控制电路203对主变换电路201的开关元件进行控制,以使得向负载300供给期望的电力。具体地说,基于应向负载300供给的电力,对主变换电路201的各开关元件应成为接通状态的时间(接通时间)进行计算。例如,能够利用与应输出的电压相对应地对开关元件的接通时间进行调制的PWM控制,对主变换电路201进行控制。并且,向主变换电路201所具备的驱动电路输出控制指令(控制信号),以使得在各时刻向应成为接通状态的开关元件输出接通信号,向应成为断开状态的开关元件输出断开信号。驱动电路按照该控制信号,将接通信号或者断开信号作为驱动信号向各开关元件的控制电极输出。
在本实施方式涉及的电力变换装置中,应用实施方式1至3所涉及的半导体装置作为主变换电路201的具有开关元件和续流二极管的半导体装置,,因此能够提高绝缘特性。
在本实施方式中,对向2电平的三相逆变器应用本发明的例子进行了说明,但本发明不限定于此,能够应用于各种电力变换装置。在本实施方式中,设为2电平的电力变换装置,但也可以是3电平或多电平的电力变换装置,在向单相负载供给电力的情况下,也可以向单相逆变器应用本发明。另外,在向直流负载等供给电力的情况下,也能够向DC/DC转换器或者AC/DC转换器应用本发明。
另外,应用了本发明的电力变换装置不限定于上述的负载为电动机的情况,例如,还能够用作放电加工机、激光加工机、感应加热烹调器或者非接触器供电***的电源装置,并且,也能够用作太阳能发电***或蓄电***等的功率调节器。

Claims (8)

1.一种半导体装置,其特征在于,具备:
基座板;
粘接剂,其设置于所述基座板的上表面;以及
壳体,其具有下表面、与所述下表面相连并且与所述下表面相比位于与所述基座板的中央接近的位置的斜面,所述壳体通过在所述下表面和所述斜面附着所述粘接剂,从而固定于所述基座板,
所述粘接剂中的与所述斜面接触的部分比与所述下表面接触的部分厚。
2.根据权利要求1所述的半导体装置,其特征在于,
所述下表面具有第1下表面和第2下表面,该第1下表面与所述斜面相连,该第2下表面与所述第1下表面相连并且与所述第1下表面相比位于从所述基座板的中央远离的位置,
所述第2下表面与所述第1下表面相比位于下方。
3.根据权利要求1所述的半导体装置,其特征在于,
具备固定于所述上表面的半导体元件,
所述上表面具有第1上表面、与所述第1上表面相比位于上方的第2上表面,
所述粘接剂涂敷于所述第1上表面,所述半导体元件设置于所述第2上表面的正上方。
4.根据权利要求1至3中任一项所述的半导体装置,其特征在于,
所述粘接剂朝向所述基座板的中央方向呈凸形状。
5.一种半导体装置,其特征在于,具备:
基座板;
半导体元件,其固定于所述基座板的上表面;
壳体,其具有与所述上表面接触的接触下表面、与所述接触下表面相比远离所述半导体元件并且与所述接触下表面相比位于上方的非接触下表面;以及
粘接剂,其与所述非接触下表面、所述基座板接触。
6.根据权利要求1至5中任一项所述的半导体装置,其特征在于,
具备露出至所述壳体的内部的电极。
7.根据权利要求1至6中任一项所述的半导体装置,其特征在于,
所述粘接剂包含导电性颗粒。
8.一种电力变换装置,其具备:
主变换电路,其具有权利要求1至7中任一项所述的半导体装置,所述主变换电路将被输入进来的电力进行变换而输出;以及
控制电路,其将对所述主变换电路进行控制的控制信号向所述主变换电路输出。
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