CN109433642B

CN109433642B - General detection sorting unit of surface defect and surface defect image device

Info

Publication number: CN109433642B
Application number: CN201811178850.5A
Authority: CN
Inventors: 陈勇; 韦文波; 李维; 杨世举; 孔园林; 张伟; 汪君; 孙旭
Original assignee: Hefei Asorting Intelligent Technology Co ltd
Current assignee: Hefei Asorting Intelligent Technology Co ltd
Priority date: 2018-10-10
Filing date: 2018-10-10
Publication date: 2021-08-06
Anticipated expiration: 2038-10-10
Also published as: CN109433642A

Abstract

The invention discloses a universal surface defect detecting and sorting device and a surface defect imaging device. The camera vision adjusting mode of the surface defect image capturing device adopts a field depth adjusting mode and a lens focal length adjusting mode, wherein the camera large field depth adjusting mode and the lens focal length adjusting mode can adapt to materials with different specifications. In addition, the lens in the focusing unit adopts a hoop fixed connection mode, has strong adaptability to the appearance of the lens, and can adapt to most of lenses on the market, so that the adaptability and the application range of the surface defect imaging device are greatly improved. The invention also discloses a multilayer light source arrangement mode formed by the multilayer light-emitting plates, and the image taking stereoscopic impression of curved surface materials is increased.

Description

General detection sorting unit of surface defect and surface defect image device

Technical Field

The invention relates to the field of visual inspection of parts, in particular to a universal focusing, detecting and sorting device for surface defects and a surface defect imaging device.

Background

It is well known that in the industrial production of devices or components, detection is an important step and is associated with quality control.

With the development of assembly manufacturing industry, manufacturers of electronic components, mechanical parts and the like have more and more intense efforts in product quality control, and for large-batch universal parts, the quality is detected manually, so that the efficiency is low, the subjectivity is high, the detection result is difficult to count, and occasionally unqualified products are discharged, particularly small and micro parts.

Appearance quality is an important content of part detection, and visual intelligent detection is a hot point of appearance quality detection. The visual inspection is divided into single-disc inspection and double-disc inspection, and the surface defect imaging device is an important functional component for single-disc and double-disc inspection.

Chinese patent document CN206556583U discloses a surface image capturing mechanism, which is matched with a first detection tray, and has a surface image capturing lower light source, a surface image capturing upper light source, a surface image capturing camera, and an automatic focal length fine-tuning mechanism, which includes a focal length micro stepper motor and a magnification micro stepper motor.

In practicing the present invention, we recognize that: because the material specification is various, surface defect image device needs stronger material adaptability, can improve check out test set's utilization ratio like this, avoids the idle problem of equipment asset. However, the distance between the surface orientation camera and the first detection plate is fixed, and the focal length adjustment and the magnification adjustment are adopted, so that the application range of the surface orientation camera to the change of material specifications is limited.

Disclosure of Invention

The invention aims to provide a universal surface defect detecting and sorting device which is suitable for materials with different specifications.

The invention also aims to provide the general focusing detection sorting device for the surface defects, so as to improve the detection efficiency of the surface defects of the products.

Therefore, the invention provides a general surface defect detecting and sorting device which comprises a base, a camera, a lens, a focusing unit and a linear unit, wherein the camera and the lens are fixedly connected on the focusing unit, and the linear unit is used for driving the focusing unit to move up and down and adjusting the depth of field.

Furthermore, the focusing unit comprises a stepping motor, a first gear driven by the stepping motor, a second gear in meshing transmission with the first gear, a first bearing, a second bearing, a first hoop and a second hoop, wherein the first hoop is fixedly connected with a focusing knob of the lens and rotates along with the second gear to realize focus adjustment; the shell of the lens is fixedly connected with the second hoop, the second hoop is fixedly connected with the upper fixing plate of the base, the outer rings of the first bearing and the second bearing are arranged in two bearing mounting holes in the lower fixing plate of the base, the positioning step of the first gear is inserted in the inner ring hole of the second bearing, and the positioning step of the second gear is inserted in the inner ring hole of the first bearing.

Furthermore, a plurality of annular waist-shaped holes are formed in the second hoop, a plurality of threaded holes are formed in the second gear, and the second gear and the threaded holes are connected through screws, so that the lens is installed without unbalance loading.

Furthermore, a plurality of annular waist-shaped holes are formed in the first hoop, a plurality of threaded holes are formed in the second gear, and the second gear and the threaded holes are connected through screws so as to eliminate the non-concentricity of the lens and the first gear.

Furthermore, the first anchor ear and the second anchor ear are composed of a clamping surface, a pressing deformation and a clamping connection thread, wherein the clamping surface is provided with a groove surface coupled with the lens focusing knob, so that the clamping transmission is reliable.

According to another aspect of the present invention, there is provided a surface defect universal testing and sorting apparatus, comprising a tray surface rotating apparatus, an induction testing apparatus, a surface defect imaging apparatus, a backlight source and/or a multi-layer light source, a plurality of sets of blowing sorting apparatuses, and a plurality of sets of collecting apparatuses, wherein the surface defect imaging apparatus has functions of adjusting depth of field up and down and automatically adjusting focal length, and is the surface defect imaging apparatus according to any one of claims, wherein the material fed onto the tray surface of the tray surface rotating apparatus rotates along with the tray surface, and after the image capture testing by the surface defect imaging apparatus, the material is blown into the corresponding collecting apparatus by the blowing sorting apparatus.

Furthermore, the disk surface of the disk surface rotating device is a glass disk surface or a non-light-transmitting disk surface.

Further, the sensing device is configured to sense photoelectric energy.

Furthermore, the backlight source is placed below the glass disc, the multilayer light sources are placed on the glass disc, the camera is connected with the lens and placed on the multilayer light sources, and the material is captured through the middle sight hole of the multilayer light sources.

Further, the multilayer light source is provided with a multilayer light source light-emitting plate and is provided with multiple colors.

The invention adopts the mode of depth of field adjustment and lens focal length adjustment, wherein the large depth of field adjustment and the lens focal length adjustment of the camera can adapt to materials with different specifications.

In addition to the objects, features and advantages described above, other objects, features and advantages of the present invention are also provided. The present invention will be described in further detail below with reference to the drawings.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate exemplary embodiments of the invention and, together with the description, serve to explain the invention and are not intended to limit the invention. In the drawings:

FIG. 1 is a schematic structural diagram of a general surface defect inspecting and sorting apparatus according to an embodiment of the present invention;

FIG. 2 is a schematic structural diagram of a surface defect imaging apparatus according to an embodiment of the present invention;

fig. 3 is a schematic view illustrating an image capturing principle of the general surface defect detecting and sorting apparatus according to an embodiment of the present invention;

FIG. 4a is a first schematic structural diagram of a focusing unit according to an embodiment of the present invention, and FIG. 4b is a second schematic structural diagram of the focusing unit according to the embodiment of the present invention;

FIG. 5 is a schematic structural diagram of a lens barrel according to an embodiment of the invention;

fig. 6a is a schematic cross-sectional structure view of a first gear (second gear) of a focus adjusting unit according to an embodiment of the present invention, and fig. 6b is a schematic end-face structure view of the first gear (second gear); and

FIG. 7 is a schematic structural diagram of a first hoop (a second hoop) of a focus adjustment unit according to an embodiment of the invention; and

fig. 8 is a third schematic structural diagram of a focusing unit according to an embodiment of the invention.

Detailed Description

It should be noted that, in the present application, the embodiments and features of the embodiments may be combined with each other without conflict. The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.

Fig. 1-7 illustrate some embodiments according to the invention.

In one embodiment, as shown in fig. 1, the general focusing detection device for material surface defects of the present invention includes: the device comprises a disk surface rotating device 1 which rotates around the center of the disk surface, an induction detection device 2, a surface defect imaging device 3, a

light source

4 or 5, a plurality of sets of material collecting devices 6 and a plurality of sets of air blowing sorting devices 7.

As shown in fig. 2, the surface defect imaging device 3 has the functions of up-down depth-of-field adjustment and automatic focal length adjustment. The implementation mode is as follows: the camera 303 and the lens 304 are fixedly connected to the focusing unit 305, and the linear unit 302 drives the focusing unit 305 to move up and down to adjust the depth of field.

The material detection process is as follows: the material is sent into the quotation 101 of the device through pay-off interface A, rotates along with quotation 101, detects the material position by response detection device 2, and the material is through the below of multilayer light source 4, is got for instance by surface defect imaging unit 3 through multilayer light source 4 middle part sight hole 401 to the material, and the material after getting for instance reaches the sorting position, blows the material by the sorting unit 7 that blows to the corresponding device 6 that gathers materials in the set of device 6 that gathers materials of many. The detection device is used for obviously improving the detection efficiency of the surface defects of the product.

In the invention, the materials are batch-measuring parts with curved/non-curved outer surfaces, such as rubber rings, gaskets and the like, and the detection efficiency can be greatly improved by adopting the detection device.

In the invention, the modes of depth of field adjustment and lens focal length adjustment are adopted, wherein the large depth of field adjustment and the lens focal length adjustment of the camera can adapt to materials with different specifications.

In the present invention, the surface 101 of the rotating device may be made of glass or non-transparent material. The outer surface of the material is a curved surface. The sensing device 2 is a correlation photoelectric sensing device.

In one embodiment, the linear unit 302 includes a stepping motor 301, a guide rail pair and a screw nut pair, and the base is fixedly coupled to the guide rail pair and driven by the screw nut pair to move up and down.

In one embodiment, the positional relationship of the surface defect imaging device 3 and the

light source

4 or 5 is as follows:

the material is placed on the glass tray surface 101, the backlight source 5 is placed below the glass tray, the multilayer light source 4 is placed on the glass tray, the camera 303 is connected with the lens 304 and placed on the multilayer light source 4, and the material is imaged through the middle sight hole 401 of the multilayer light source.

Preferably, the multi-layer light source 4 is provided with a multi-layer light source light emitting panel, and is provided with a plurality of colors. The multilayer light source arrangement mode that comprises multilayer luminescent plate has increased the getting for instance the third dimension of curved surface material.

In the present invention, the focusing unit 305 is a lens focal length adjusting mechanism, and can adapt to the focal length adjustment of most lenses in the market, so that the adaptability and the application range of the surface defect imaging device are greatly improved.

In one embodiment, with combined reference to fig. 4-6, the focusing unit 305 is configured as follows:

the motor 301 drives the positioning shaft 3059 to rotate, the first gear 3051 rotates along with the positioning shaft 3059, and the first gear 3051 drives the second gear 3052 to rotate; the first anchor ear 3053 is fixedly connected to the lens focusing knob 3042 and rotates along with the second gear 3052; the lens housing 3043 is fixedly connected to the second anchor ear 3054, and the second anchor ear 3054 is fixedly connected to the upper fixing plate 3055 of the focusing unit.

The outer rings of the first bearing 3057 and the second bearing 3058 are mounted in two bearing mounting holes of the lower fixing plate 3056, the positioning step 3051a of the first gear is inserted into an inner ring hole of the second bearing 3058, and the positioning step 3052a of the second gear is inserted into an inner ring hole of the first bearing 3057.

In the embodiment, after the focusing unit with the structure is adopted, the lens focusing is accurate. The lens adopts a hoop fixing mode, has strong adaptability to the appearance of the lens, and can adapt to most lenses on the market, so that the adaptability and the application range of the surface defect imaging device are greatly improved.

In an embodiment, with combined reference to fig. 5 and 7, the first anchor ear 3053 is formed by a clamping surface 3053b, a compression deformation 3053a, and a clamping coupling thread 3053 c. The clamping surface includes a groove surface coupled to the lens focusing knob 3042, so that the clamping transmission is more reliable. The structure of the second hoop is the same as that of the first hoop.

In an embodiment, referring to fig. 4a to 8, the first hoop and the second gear are fixedly connected in the following manner: a plurality of annular waist-shaped holes 3053d are formed in the first hoop 3053, and a plurality of threaded holes 3052c are formed in the second gear 3052, so that the eccentricity between the lens 304 and the second gear 3052 is eliminated. The mode that the second hoop 3054 is fixedly connected with the upper fixing plate 3055 is as follows: the second anchor ear 3054 is provided with a plurality of threaded holes, and the upper fixing plate 3055 is provided with a plurality of annular waist-shaped holes 3055a, so that the lens can be installed without unbalance loading.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and it will be apparent to those skilled in the art that various modifications and variations can be made in the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. The surface defect imaging device is characterized by comprising a base, a camera (303), a lens (304), a focusing unit (305) and a linear unit (302), wherein the camera (303) and the lens (304) are fixedly connected on the focusing unit (305), the linear unit (302) is used for driving the focusing unit (305) to move up and down and adjusting the depth of field,

the focusing unit comprises a stepping motor (301), a first gear (3051) driven by the stepping motor, a second gear (3052) in meshing transmission with the first gear, a first bearing (3057), a second bearing (3058), a first hoop (3053) and a second hoop (3054),

the first anchor ear (3053) is fixedly connected with a focusing knob (3042) of the lens and rotates along with the second gear (3052) to realize focus adjustment; the shell (3043) of the lens is fixedly connected with the second hoop (3054), the second hoop (3054) is fixedly connected with the upper fixing plate (3055) of the base,

the outer rings of the first bearing (3057) and the second bearing (3058) are arranged in two bearing mounting holes on a lower fixing plate (3056) of the base, a positioning step (3051a) of the first gear is inserted in an inner ring hole of the second bearing (3058), a positioning step (3052a) of the second gear is inserted in an inner ring hole of the first bearing (3057),

the first hoop is composed of a clamping surface (3053b), a compression deformation amount (3053a) and a clamping connection thread (3053c), wherein the clamping surface is provided with a groove surface coupled with a lens focusing knob (3042) so that the clamping transmission is reliable,

wherein, be equipped with a plurality of annular waist shape holes (3053d) on first staple bolt (3053), be equipped with a plurality of screw holes (3052c) on second gear (3052), the two passes through screwed connection to eliminate the concentricity of camera lens and second gear.

2. The surface defect imaging device of claim 1, wherein the second anchor ear has a plurality of annular kidney-shaped holes, and the second gear has a plurality of threaded holes, which are connected by screws, so that the lens can be mounted without unbalance loading.

3. The surface defect imaging apparatus according to claim 1, wherein the second anchor ear is constituted by a clamping face (3054b), a compression deformation amount (3054a) and a clamping coupling thread (3054 c).

4. A universal detection and sorting device for surface defects is characterized by comprising a disk surface rotating device (1), an induction detection device (2), a surface defect imaging device (3), a backlight source (4) and/or a multilayer light source (5), a plurality of sets of blowing sorting devices (7) and a plurality of sets of collecting devices (6),

the surface defect imaging device having functions of up-down depth of field adjustment and automatic focal length adjustment is the surface defect imaging device according to any one of claims 1 to 3,

the materials sent to the disc surface (101) of the disc surface rotating device (1) rotate along with the disc surface (101), and after the surface defect imaging device (3) performs image pickup detection, the materials are blown to the corresponding material collecting device (6) through the air blowing sorting device (6).

5. The universal surface defect detecting and sorting device as claimed in claim 4, wherein the disk surface (101) of the disk surface rotating device is a glass disk surface or a non-light-transmitting disk surface.

6. The universal surface defect detecting and sorting device according to claim 4, wherein the induction detecting device (2) is a correlation photoelectric induction device.

7. The universal surface defect detecting and sorting device as claimed in claim 4, wherein the backlight source (5) is placed under a glass plate, the multi-layer light source (4) is placed on the glass plate, the camera (303) is connected with the lens (304) and placed above the multi-layer light source (4), and the material is imaged through the middle sight hole (401) of the multi-layer light source.

8. The universal surface defect detecting and sorting device as claimed in claim 7, wherein the multi-layer light source (4) is provided with a multi-layer light source light emitting plate and is provided with a plurality of colors.