CN109433642A - A kind of general detection sorting unit of surface defect and surface defect imaging device - Google Patents
A kind of general detection sorting unit of surface defect and surface defect imaging device Download PDFInfo
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- CN109433642A CN109433642A CN201811178850.5A CN201811178850A CN109433642A CN 109433642 A CN109433642 A CN 109433642A CN 201811178850 A CN201811178850 A CN 201811178850A CN 109433642 A CN109433642 A CN 109433642A
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- Prior art keywords
- surface defect
- imaging device
- anchor ear
- gear
- light source
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/363—Sorting apparatus characterised by the means used for distribution by means of air
- B07C5/365—Sorting apparatus characterised by the means used for distribution by means of air using a single separation means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention discloses a kind of general detection sorting unit of surface defect and surface defect imaging devices, comprising disk slewing equipment, induction detection device, surface defect imaging device, light source, more set air blowing sorting unit and cover material-gathering device, which significantly improves surface defects of products detection efficiency more.The camera fields of view regulative mode of surface defect image-taking device of the invention is in such a way that the depth of field is adjusted and lens focus is adjusted, and wherein the big depth of field of camera is adjusted and lens focus is adjusted, and can adapt to the material of different size.In addition, camera lens uses anchor ear attachment in focus unit, and it is adaptable to camera lens shape, it can adapt to most camera lenses on the market, so that the adaptability and application range of surface defect imaging device are largely increased.The invention also discloses the multilayer light source arrangements being made of multilayer luminescent screen, increase the capture three-dimensional sense of curved surface material.
Description
Technical field
The present invention relates to components field of visual inspection more particularly to a kind of general focusing of surface defect to detect sorting unit
With surface defect imaging device.
Background technique
It is well known that detection is an important step in equipment or the industrialized production of component, and with quality control
System is associated.
With the development of assembling manufacturing industry, the manufacturers such as electronic component, component of machine are in terms of control of product quality
Input energy is increasing, for high-volume spare part in common use, by artificial detection quality not only low efficiency, and
And subjectivity is larger, testing result statistical difficulty, there is substandard product outflow, especially small micro- components once in a while.
Presentation quality is an important content of components detection, and Visual intelligent detection is a heat of appearance quality detection
Point.Vision-based detection is divided into single-deck detection and double plate detection, and surface defect imaging device is that one of single, double disk detection is important
Functional component.
Chinese patent literature CN206556583U discloses a kind of surface capture mechanism, cooperates with the first detection plate, has
Light source under the capture of surface, light source, surface image-pickup camera, focal length automatic fine tuning mechanism in the capture of surface comprising the miniature step of focal length
Into motor and multiplying power micro-step motor.
In implementing the present invention, it may, we recognize that: due to material specification multiplicity, surface defect imaging device is needed
Stronger material adaptability is wanted, can be improved the utilization rate of detection device in this way, asset of equipments is avoided to leave unused problem.However it should
Surface orientation camera is fixed relative to the distance of the first detection plate, using focus adjustment and multiplying power regulative mode, to material specification
Variation adaptation range it is limited.
Summary of the invention
The purpose of the present invention is to provide a kind of general detection sorting units of surface defect, to adapt to the object of different size
Material.
The object of the invention is also to provide a kind of general focusing of surface defect to detect sorting unit, to improve product surface
Defects detection efficiency.
For this purpose, one aspect of the present invention provides a kind of general detection sorting unit of surface defect, including pedestal, camera, mirror
Head, focus unit and straight line units, wherein the camera and camera lens are fixed in focus unit, and the straight line units are used
It moves up and down in driving focus unit, carry out depth of field adjusting.
Further, above-mentioned focus unit includes stepper motor, first gear driven by stepper motors and the first tooth
Second gear, first bearing, second bearing and the first anchor ear and the second anchor ear of engaged transmission are taken turns, first anchor ear is solid
It is coupled to the focusing knob of camera lens, and in company with second gear rotation, realization focus adjustment；The shell of the camera lens is fixed on described
Second anchor ear, second anchor ear are fixed on the upper mounted plate of the pedestal, the outer ring peace of the first bearing and second bearing
Two bearing mounting holes on bottom plate loaded on pedestal, the positioning step of first gear insert in the inner ring hole of second bearing,
The positioning step of the second gear inserts in the inner ring hole of first bearing.
Further, above-mentioned second anchor ear is equipped with several annular waist-shaped holes, and the second gear is equipped with several screw threads
Hole, the two are connected by screw to, and install camera lens without unbalance loading.
Further, above-mentioned first anchor ear is equipped with several annular kidney slots, and the second gear is equipped with several screw threads
Hole, the two are connected by screw to, to eliminate the nonconcentricity of camera lens and first gear.
Further, above-mentioned first anchor ear and the second anchor ear are constituted by clamping face, compression deflection and clamping connection screw thread,
Wherein, the clamping face has the groove surface coupled with lens focusing knob, so that clamping reliable transmission.
According to another aspect of the present invention, a kind of general detection sorting unit of surface defect, including disk revolution are provided
Device, induction detection device, surface defect imaging device, backlight and/or multilayer light source, more set air blowing sorting units and
More set material-gathering devices, the surface defect imaging device has upper and lower depth of field adjusting and focal length automatic regulation function, for according to power
Benefit require to any one of described in surface defect imaging device, wherein send to the material in the disk of disk slewing equipment with
It is rotated with disk, after surface defect imaging device capture detection, material is blowed by air blowing sorting unit to corresponding collection
Expect in device.
Further, the disk of above-mentioned disk slewing equipment is glass disk or non-transparent disk.
Further, above-mentioned induction detection device is to penetrating optoelectronic induction.
Further, above-mentioned backlight is put under glass plate, and multilayer light source is put on glass plate, the camera and camera lens
Connection, is placed on multilayer light source, carries out capture to material by window in the middle part of multilayer light source.
Further, above-mentioned multilayer light source is provided with multilayer light source luminescent screen, and multiple color is arranged.
The present invention is in such a way that the depth of field is adjusted and lens focus is adjusted, and wherein the big depth of field of camera is adjusted and lens focus tune
Section can adapt to the material of different size.
Other than objects, features and advantages described above, there are also other objects, features and advantages by the present invention.
Below with reference to figure, the present invention is described in further detail.
Detailed description of the invention
The accompanying drawings constituting a part of this application is used to provide further understanding of the present invention, and of the invention shows
Examples and descriptions thereof are used to explain the present invention for meaning property, does not constitute improper limitations of the present invention.In the accompanying drawings:
Fig. 1 is the structural schematic diagram according to the general detection sorting unit of surface defect of one embodiment of the invention；
Fig. 2 is the structural schematic diagram according to the surface defect imaging device of one embodiment of the invention；
Fig. 3 is the capture schematic illustration according to the general detection sorting unit of surface defect of one embodiment of the invention；
Fig. 4 a is according to the structural schematic diagram one of the focus unit of one embodiment of the invention, and Fig. 4 b is according to the present invention one
The structural schematic diagram two of the focus unit of embodiment；
Fig. 5 is the structural schematic diagram according to the camera lens of one embodiment of the invention；
Fig. 6 a is to be illustrated according to the cross-section structure of the first gear (second gear) of the focus unit of one embodiment of the invention
Figure, Fig. 6 b are the end structure illustration of first gear (second gear)；And
Fig. 7 is the structural schematic diagram according to the first anchor ear (the second anchor ear) of the focus unit of one embodiment of the invention；With
And
Fig. 8 is the structural schematic diagram three according to the focus unit of one embodiment of the invention.
Specific embodiment
It should be noted that in the absence of conflict, the features in the embodiments and the embodiments of the present application can phase
Mutually combination.The present invention will be described in detail below with reference to the accompanying drawings and embodiments.
Fig. 1 to Fig. 7 is shown according to some embodiments of the present invention.
In one embodiment, as shown in Figure 1, the general focusing detection device of surface of material defect of the invention includes: drum
Make the disk slewing equipment 1 of rotary motion, induction detection device 2, surface defect imaging device 3, light source 4 or 5, more in face center
Cover material-gathering device 6 and more set air blowing sorting units 7.
It is adjusted and focal length automatic regulation function as shown in Fig. 2, surface defect imaging device 3 has the upper and lower depth of field.It is realized
Mode are as follows: camera 303 and camera lens 304 are fixed in focus unit 305, and straight line units 302 drive about 305 focus unit to transport
It is dynamic to carry out depth of field adjusting.
Material detection process is as follows: material is sent into the disk 101 of the device through feeding interface A, rotates with disk 101, by
Incude 2 detectable substance discharge position of detection device, material passes through the lower section of multilayer light source 4, is passed through by surface defect imaging unit 3 more
Layer 4 middle part window 401 of light source carries out capture to material, and the material after capture reaches sort location, by covering air blowing sorting unit more
7 blow material at most set material-gathering device 6 in corresponding material-gathering device 6.The use of this detection device significantly improves product table
Planar defect detection efficiency.
In the present invention, material is the components in batch that the outer surfaces such as cushion rubber, gasket are curved surface/non-curved, in use
Detection efficiency can be greatly improved by stating detection device.
In the present invention, in such a way that the depth of field is adjusted and lens focus is adjusted, the wherein adjusting of the camera big depth of field and camera lens
Focus adjustment can adapt to the material of different size.
In the present invention, slewing equipment disk 101 can be glass material, or non-transparent material.Outside the material
Surface is curved surface.Induction detection device 2 is to penetrating photoelectric induction device.
In one embodiment, straight line units 302 include stepper motor 301, guideway and screw pair, and pedestal connects firmly
To guideway, and by screw pair driving, move up and down.
In one embodiment, the positional relationship of surface defect imaging device 3 and light source 4 or 5 is as follows:
Material is put in glass disk 101, and backlight 5 is put under glass plate, and multilayer light source 4 is put on glass plate, camera
303 connect with camera lens 304, are placed on multilayer light source 4, carry out capture to material by window 401 in the middle part of multilayer light source.
Preferably, multilayer light source 4 is provided with multilayer light source luminescent screen, and multiple color is arranged.It is made of multilayer luminescent screen
Multilayer light source arrangement, increase the capture three-dimensional sense of curved surface material.
In the present invention, focus unit 305 is lens focus regulating mechanism, can adapt to the coke of most camera lens on the market
Away from adjusting, so that the adaptability and application range of surface defect imaging device are greatly enhanced.
In one embodiment, in conjunction with referring to fig. 4 to fig. 6,305 structure of focus unit is as follows:
Motor 301 drives locating shaft 3059 to rotate, and first gear 3051 is rotated with locating shaft 3059, first gear 3051
Second gear 3052 is driven to rotate；First anchor ear 3053 is fixed on lens focusing knob 3042, and in company with 3052 turns of second gear
It is dynamic；Lens housing 3043 is fixed on the second anchor ear 3054, and the second anchor ear 3054 is fixed on focus unit upper mounted plate 3055.
Wherein, the outer ring of first bearing 3057 and second bearing 3058 is installed on two bearings on bottom plate 3056
Mounting hole, the positioning step 3051a of first gear insert in the inner ring hole of second bearing 3058, the positioning step of second gear
3052a inserts in the inner ring hole of first bearing 3057.
In the present embodiment, after focus unit using the above structure, lens focusing is accurate.Camera lens is fixed using anchor ear
Mode, it is adaptable to camera lens shape, it can adapt to most camera lenses on the market, so that surface defect imaging device
Adaptability and application range be largely increased.
In one embodiment, in conjunction with referring to Fig. 5 and Fig. 7, the first anchor ear 3053 is by clamping face 3053b, compressing deflection
3053a and clamping connection screw thread 3053c are constituted.It wherein include the groove coupled in lens focusing knob 3042 on clamping face
Face, so that it is more reliable to clamp transmission.Wherein, the structure of the second anchor ear is identical as the first anchor ear.
In one embodiment, in conjunction with referring to 4a to Fig. 8, the mode that the first anchor ear is connected firmly with second gear are as follows: the first anchor ear
It is provided with several annular waist-shaped hole 3053d on 3053, several threaded holes 3052c is provided in second gear 3052, to disappear
Except the nonconcentricity of camera lens 304 and second gear 3052.The mode that second anchor ear 3054 is connected firmly with upper mounted plate 3055 are as follows: the
It is provided with several threaded holes on two anchor ears 3054, several annular waist-shaped hole 3055a are provided on upper mounted plate 3055, are made
Camera lens is installed without unbalance loading.
The foregoing is only a preferred embodiment of the present invention, is not intended to restrict the invention, for the skill of this field
For art personnel, the invention may be variously modified and varied.All within the spirits and principles of the present invention, made any
Modification, equivalent replacement, improvement etc., should all be included in the protection scope of the present invention.
Claims (10)
1. a kind of surface defect imaging device, which is characterized in that including pedestal, camera (303), camera lens (304), focus unit
(305) and straight line units (302), wherein the camera (303) and camera lens (304) are fixed on focus unit (305), institute
Straight line units (302) are stated for driving focus unit (305) to move up and down, carrying out depth of field adjusting.
2. surface defect imaging device according to claim 1, which is characterized in that
The focus unit includes stepper motor (301), first gear driven by stepper motors (3051), nibbles with first gear
Close second gear (3052), first bearing (3057), second bearing (3058) and the first anchor ear (3053) and second of transmission
Anchor ear (3054),
First anchor ear (3053) is fixed on the focusing knob (3042) of camera lens, and rotates in company with second gear (3053), is real
Existing focus adjustment；The shell (3043) of the camera lens is fixed on second anchor ear (3054), and second anchor ear (3054) is solid
It is coupled to the upper mounted plate (3055) of the pedestal,
The outer ring of the first bearing (3057) and second bearing (3058) is installed on two on the bottom plate (3056) of pedestal
A bearing mounting hole, the positioning step (3051a) of first gear insert in the inner ring hole of second bearing (3058), the second gear
Positioning step (3052a) insert in the inner ring holes of first bearing (3057).
3. surface defect imaging device according to claim 2, which is characterized in that second anchor ear is equipped with several rings
Shape waist-shaped hole, the second gear are equipped with several threaded holes, and the two is connected by screw to, and install camera lens without unbalance loading.
4. surface defect imaging device according to claim 2, which is characterized in that first anchor ear is equipped with several rings
Shape kidney slot, the second gear are equipped with several threaded holes, and the two is connected by screw to, to eliminate camera lens and first gear
Nonconcentricity.
5. surface defect imaging device according to claim 2, which is characterized in that first anchor ear and the second anchor ear by
Clamping face (3053b/3054b) compresses deflection (3053a/3054a) and clamps connection screw thread (3053c/3054c) composition,
In, the clamping face has the groove surface coupled with lens focusing knob (3042), so that clamping reliable transmission.
6. a kind of general detection sorting unit of surface defect, which is characterized in that including disk slewing equipment (1), induction detection dress
Set (2), surface defect imaging device (3), backlight (4) and/or multilayer light source (5), more set air blowing sorting unit (7) and
More sets material-gathering device (6),
The surface defect imaging device has upper and lower depth of field adjusting and focal length automatic regulation function, for according to claim 1 to 5
Any one of described in surface defect imaging device,
Wherein, it send to the material on the disk of disk slewing equipment (1) (101) and is rotated in company with disk (101), lacked by the surface
After falling into imaging device (3) capture detection, material is blowed by air blowing sorting unit (6) into corresponding material-gathering device (6).
7. the general detection sorting unit of surface defect according to claim 6, which is characterized in that the disk slewing equipment
Disk (101) be glass disk or non-transparent disk.
8. the general detection sorting unit of surface defect according to claim 6, which is characterized in that the induction detection device
(2) for penetrating photoelectric induction device.
9. the general detection sorting unit of surface defect according to claim 6, which is characterized in that the backlight (5) is put
Under glass plate, multilayer light source (4) is put on glass plate, and the camera (303) connect with camera lens (304), is placed in multilayer light source
(4) on, capture is carried out to material by window (401) in the middle part of multilayer light source.
10. the general detection sorting unit of surface defect according to claim 9, which is characterized in that multilayer light source (4) setting
There is multilayer light source luminescent screen, and multiple color is set.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811178850.5A CN109433642B (en) | 2018-10-10 | 2018-10-10 | General detection sorting unit of surface defect and surface defect image device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811178850.5A CN109433642B (en) | 2018-10-10 | 2018-10-10 | General detection sorting unit of surface defect and surface defect image device |
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| Publication Number | Publication Date |
|---|---|
| CN109433642A true CN109433642A (en) | 2019-03-08 |
| CN109433642B CN109433642B (en) | 2021-08-06 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201811178850.5A Active CN109433642B (en) | 2018-10-10 | 2018-10-10 | General detection sorting unit of surface defect and surface defect image device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI808312B (en) * | 2020-03-13 | 2023-07-11 | 和通科技股份有限公司 | Assembly component inspection machine |
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| CN109433642B (en) | 2021-08-06 |
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