CN109387777A - A kind of infrared processing adc circuit performance is than survey method - Google Patents
A kind of infrared processing adc circuit performance is than survey method Download PDFInfo
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- CN109387777A CN109387777A CN201811332187.XA CN201811332187A CN109387777A CN 109387777 A CN109387777 A CN 109387777A CN 201811332187 A CN201811332187 A CN 201811332187A CN 109387777 A CN109387777 A CN 109387777A
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- adc circuit
- adc
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- circuit
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
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- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The present invention relates to a kind of infrared processing adc circuit performances than survey method, make to be tested infrared processing adc circuit to be acquired same signal source with standard IR processing adc circuit, two tested adc circuits of comparative analysis and standard ADC circuits test result, and then objectively evaluate the difference being tested between infrared processing adc circuit performance and standard IR processing adc circuit.This method can the infrared processing adc circuit of Fast Evaluation superiority and inferiority.The method of the present invention can rapid comparison be tested adc circuit and standard ADC circuits test result, objectively evaluate the difference between tested adc circuit performance and standard ADC circuits.This method can Fast Evaluation adc circuit superiority and inferiority.
Description
Technical field
The invention belongs to infrared detector application field, it is related to a kind of infrared processing adc circuit performance than survey method.It can be fast
Speed compares tested adc circuit and standard ADC circuits test result, objectively evaluate tested adc circuit performance and standard ADC circuits it
Between difference.This method can Fast Evaluation adc circuit superiority and inferiority.
Background technique
Since infrared detector exports analog voltage, need after adc circuit digitizes convenient for subsequent processing.Adc circuit
The quality of sample effect affects image-forming assembly to small and distant object detectivity.It through the invention, can be quickly right
Than tested adc circuit and standard ADC circuits test result, objectively evaluate between tested adc circuit performance and standard ADC circuits
Difference.This method can Fast Evaluation adc circuit superiority and inferiority.With very strong practicability.
Summary of the invention
Technical problems to be solved
In order to avoid the shortcomings of the prior art, the present invention proposes a kind of infrared processing adc circuit performance than survey method
Technical solution
A kind of infrared processing adc circuit performance is than survey method, it is characterised in that steps are as follows:
Step 1: the adc circuit of requirement is met as standard ADC circuits using one piece of performance indicator；
Step 2: the performance indicator for choosing a certain adc circuit as needed is sensitive indicator；
Step 3: building the test environment of the sensitive indicator；
Step 4: the sensitive indicator of testing standard adc circuit and tested adc circuit is distinguished in one hour；
Step 5: if the sensitive indicator of tested adc circuit is not less than the sensitive indicator of standard ADC circuits, the circuit-under-test
Meet requirement.
The step 4: tested adc circuit, rear testing standard adc circuit are first tested；Or first testing standard adc circuit, after
Test tested adc circuit.Test must complete test under same time, same environment twice, and midfeather is as far as possible
It is short.To eliminate other uncontrollable factors, after testing environmental structure, it is desirable that complete the entire testing process time no more than 1 hour.
Beneficial effect
A kind of infrared processing adc circuit performance proposed by the present invention makes to be tested infrared processing adc circuit and mark than survey method
Quasi- infrared processing adc circuit is acquired same signal source, and two tested adc circuits of comparative analysis and standard ADC circuits are surveyed
Test result, and then objectively evaluate the difference being tested between infrared processing adc circuit performance and standard IR processing adc circuit.It should
Method can the infrared processing adc circuit of Fast Evaluation superiority and inferiority.
The method of the present invention can rapid comparison be tested adc circuit and standard ADC circuits test result, objectively evaluate tested ADC
Difference between circuit performance and standard ADC circuits.This method can Fast Evaluation adc circuit superiority and inferiority.Pass through comparative analysis, sieve
Select circuit-under-test of the performance indicator not less than standard IR processing adc circuit.With very strong practicability.
Detailed description of the invention
Fig. 1 is specific implementation flow schematic diagram of the invention
Specific embodiment
Now in conjunction with embodiment, attached drawing, the invention will be further described:
Than survey method, feature exists the adc circuit performance that a kind of intelligent 640 × 512 face battle array F2 detector of medium wave uses
In steps are as follows:
Step 1: randomly selecting intelligent 640 × 512 face battle array F2 detection of medium wave that one piece of performance indicator meets requirement
The adc circuit that device uses is as standard ADC circuits；
Step 2: the signal-to-noise ratio for choosing the adc circuit as needed is sensitive indicator；
Step 3: building infrared processing adc circuit signal-to-noise ratio test environment；
Step 4: the adc circuit that intelligent 640 × 512 face battle array F2 detector of tested medium wave uses first is tested, it is rear to test
Intelligent 640 × 512 face battle array F2 detector standard ADC circuits of chosen medium wave；Or first testing standard adc circuit, it is rear to test
Tested adc circuit.Test must complete test under same time, same environment twice, and midfeather is short as far as possible.For
Other uncontrollable factors are eliminated, after testing environmental structure, it is desirable that complete the entire testing process time no more than 1 hour；
Step 5: if the signal-to-noise ratio data index of tested adc circuit is not less than the signal-to-noise ratio data index of standard ADC circuits,
Then the circuit-under-test meets requirement.
Claims (1)
1. a kind of infrared processing adc circuit performance is than survey method, it is characterised in that steps are as follows:
Step 1: the adc circuit of requirement is met as standard ADC circuits using one piece of performance indicator；
Step 2: the performance indicator for choosing a certain adc circuit as needed is sensitive indicator；
Step 3: building the test environment of the sensitive indicator；
Step 4: the sensitive indicator of testing standard adc circuit and tested adc circuit is distinguished in one hour；
Step 5: if the sensitive indicator of tested adc circuit is not less than the sensitive indicator of standard ADC circuits, which meets
Requirement.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811332187.XA CN109387777A (en) | 2018-11-09 | 2018-11-09 | A kind of infrared processing adc circuit performance is than survey method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811332187.XA CN109387777A (en) | 2018-11-09 | 2018-11-09 | A kind of infrared processing adc circuit performance is than survey method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109387777A true CN109387777A (en) | 2019-02-26 |
Family
ID=65428594
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811332187.XA Pending CN109387777A (en) | 2018-11-09 | 2018-11-09 | A kind of infrared processing adc circuit performance is than survey method |
Country Status (1)
| Country | Link |
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| CN (1) | CN109387777A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102386918A (en) * | 2010-08-27 | 2012-03-21 | 英特希尔美国公司 | Calibration of impairments in a multichannel time-interleaved ADC |
| CN102739252A (en) * | 2011-04-12 | 2012-10-17 | 美信集成产品公司 | System and method for background calibration of time interleaved analog to digital converter |
| CN105811978A (en) * | 2016-02-29 | 2016-07-27 | 电子科技大学 | Design method for calibration circuits for pipeline ADCs |
| CN205901756U (en) * | 2016-06-21 | 2017-01-18 | 珠海纳睿达科技有限公司 | Two / multichannel DAAD does not have mutual calbiration system of basis of reference |
| CN106603075A (en) * | 2016-11-18 | 2017-04-26 | 中国电子科技集团公司第四十研究所 | Multi-ADC high-speed crossing sampling calibration device and method |
| CN108206696A (en) * | 2016-12-16 | 2018-06-26 | 航天科工惯性技术有限公司 | A kind of self-alignment A/D conversion circuits |
| CN108233927A (en) * | 2018-02-05 | 2018-06-29 | 电子科技大学 | A kind of high-precision pipeline ADC front-end calibration method |
| CN207937828U (en) * | 2018-03-30 | 2018-10-02 | 北京经纬恒润科技有限公司 | A kind of analog-to-digital conversion observation circuit and electronic controller |
-
2018
- 2018-11-09 CN CN201811332187.XA patent/CN109387777A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102386918A (en) * | 2010-08-27 | 2012-03-21 | 英特希尔美国公司 | Calibration of impairments in a multichannel time-interleaved ADC |
| CN102739252A (en) * | 2011-04-12 | 2012-10-17 | 美信集成产品公司 | System and method for background calibration of time interleaved analog to digital converter |
| CN105811978A (en) * | 2016-02-29 | 2016-07-27 | 电子科技大学 | Design method for calibration circuits for pipeline ADCs |
| CN205901756U (en) * | 2016-06-21 | 2017-01-18 | 珠海纳睿达科技有限公司 | Two / multichannel DAAD does not have mutual calbiration system of basis of reference |
| CN106603075A (en) * | 2016-11-18 | 2017-04-26 | 中国电子科技集团公司第四十研究所 | Multi-ADC high-speed crossing sampling calibration device and method |
| CN108206696A (en) * | 2016-12-16 | 2018-06-26 | 航天科工惯性技术有限公司 | A kind of self-alignment A/D conversion circuits |
| CN108233927A (en) * | 2018-02-05 | 2018-06-29 | 电子科技大学 | A kind of high-precision pipeline ADC front-end calibration method |
| CN207937828U (en) * | 2018-03-30 | 2018-10-02 | 北京经纬恒润科技有限公司 | A kind of analog-to-digital conversion observation circuit and electronic controller |
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Application publication date: 20190226 |
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