CN109307839A - The circuit of contact drop is tested during ac electric apparatus electrical endurance - Google Patents
The circuit of contact drop is tested during ac electric apparatus electrical endurance Download PDFInfo
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- CN109307839A CN109307839A CN201811408429.9A CN201811408429A CN109307839A CN 109307839 A CN109307839 A CN 109307839A CN 201811408429 A CN201811408429 A CN 201811408429A CN 109307839 A CN109307839 A CN 109307839A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
- G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
- G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
- G01R19/2509—Details concerning sampling, digitizing or waveform capturing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
The circuit that contact drop is tested during ac electric apparatus electrical endurance, is related to the measurement to relay, contactor and switch contact voltage drop, measurement range can be greatly improved while taking into account measuring accuracy.Its scheme be by alternating-current voltage source in circuit-under-test at series relationship load and tested contact to motivating.Tested contact enters two-way high resistant low power voltage amplifier by low-pass filter to the small contact drop at both ends, enter the voltage amplifier of adjustable gain by amplified voltage signal, output voltage is obtained, the contact drop of amplitude and contact pair is at linear function relationship.The voltage amplifier and two-way high resistant low power voltage amplifier output voltage of adjustable gain enter multichannel AD converter and switch to digital quantity.Due to being provided with the voltage amplifier of Zero flux formula Hall current sensor group and adjustable gain in circuit, measurement range can be greatly improved while taking into account measuring accuracy, effectively overcomes the shortcoming of existing measuring instrument.
Description
Technical field
The present invention relates to the circuits that contact drop is tested during ac electric apparatus electrical endurance, for all kinds of exchanges
The measurement of contact drop during relay, contactor and alternating-current electric switch electrical endurance.
Background technique
During the electrical endurance of ac electric apparatus (such as AC relay and A.C. contactor), test its electrical parameter and
Time parameter is for determining the failure mechanism of ac electric apparatus product, and then completing failure analysis have very important Practical
Value.
The measurement of ac electric apparatus contact drop belongs to micro voltage measurement.Measurement method can be divided into analogy aerotriangulation, thermoelectricity
Converter method etc..
Analogy aerotriangulation, also known as instrument measurement method, this is a kind of method of measurement alternating voltage based on analog circuit,
Using the direct metering contact of instrument to the voltage at both ends.It usually utilizes multimeter or the voltage probe of oscillograph is taken to measure electricity
Pressure, measuring circuit structure is simple, easy to operate.But the frequent changes of electrical appliance state cause manual operation difficult, and test process is multiple
It is miscellaneous, meanwhile, to improve measurement accuracy, needs to greatly improve the resolution ratio of instrument, thus bring high cost, inconvenient for use etc. and ask
Topic.
Thermoelectric converter method heats the heating wire of thermocouple to the AC signal at both ends by amplifying contact, to produce
Raw direct current thermoelectromotive force makes the thermoelectrical potential of output be equal to the thermoelectrical potential of AC signal, carrys out metering contact voltage drop with this.This method
It can accomplish higher measuring accuracy.Shortcoming is that this method migration speed is slow, and input impedance is low, and a-c cycle is lower, is surveyed
It is poorer to try precision.
Summary of the invention
The present invention relates to the circuits that contact drop is tested during a kind of ac electric apparatus electrical endurance, belong to simulation and survey
A kind of improvement of amount method, test process is simple, and measurement range can be greatly improved while taking into account measuring accuracy, is effectively overcome
The shortcoming of existing measuring instrument.
The circuit of contact drop is tested during ac electric apparatus electrical endurance, it includes alternating-current voltage source 1, load 2
With tested contact to 3, it further includes Zero flux formula Hall current sensor group 4, current-limiting resistance 5, low-pass filter 7, two-way height
Low power voltage amplifier 8, the voltage amplifier 9 of adjustable gain, multichannel AD converter 10, single-chip microcontroller 11 and display module 12 are hindered,
One end of the electrode connection load 2 of alternating-current voltage source 1, the other end for loading 2 connect tested contact to a contact in 3
It is sensed with another electrode of a signal input part of low-pass filter 7, alternating-current voltage source 1 across Zero flux formula Hall current
Device group 4 connects tested contact to 3 another contact and one end of current-limiting resistance 5, and the other end of current-limiting resistance 5 connects low pass
The voltage signal output end connection two-way of another signal input part of filter 7, Zero flux formula Hall current sensor group 4 is high
Hinder the first via signal input terminal of low power voltage amplifier 8, the signal output end connection two-way high resistant low power electricity of low-pass filter 7
The second road signal input terminal of amplifier 8 is pressed, the second road signal output end of two-way high resistant low power voltage amplifier 8 connects gain
The signal output end of the signal input part of adjustable voltage amplifier 9, the voltage amplifier 9 of adjustable gain connects multichannel AD conversion
The first via signal output end connection multi-channel A/D of the CH0 channel signal input terminal of device 10, two-way high resistant low power voltage amplifier 8 turns
The CH1 channel signal input terminal of parallel operation 10, CH0 channel signal output end and CH1 the channel signal output of multichannel AD converter 10
End is separately connected a signal input part of single-chip microcontroller 11, the letter of the display signal output end connection display module 12 of single-chip microcontroller 11
Number input terminal, the control signal input of the voltage amplifier 9 of the first control signal output end connection adjustable gain of single-chip microcontroller 11
End, the control signal input of the second control signal output end connection Zero flux formula Hall current sensor group 4 of single-chip microcontroller 11.
It, can due to being provided with the voltage amplifier 9 of Zero flux formula Hall current sensor group 4 and adjustable gain in circuit
Measurement range is greatly improved while taking into account measuring accuracy, effectively overcomes the shortcoming of existing measuring instrument.
Detailed description of the invention
Fig. 1 is structural schematic diagram of the invention.
Specific embodiment
Specific embodiment 1: illustrating present embodiment below with reference to Fig. 1.Present embodiment includes alternating-current voltage source
1, load 2, tested contact are to 3, Zero flux formula Hall current sensor group 4, current-limiting resistance 5, low-pass filter 7, two-way high resistant
Low power voltage amplifier 8, the voltage amplifier 9 of adjustable gain, multichannel AD converter 10, single-chip microcontroller 11 and display module 12 are handed over
One end of the electrode connection load 2 of galvanic electricity potential source 1, load 2 the other end connect tested contact in 3 a contact and
Another electrode of one signal input part of low-pass filter 7, alternating-current voltage source 1 passes through Zero flux formula Hall current sensor
Group 4 connects tested contact to 3 another contact and one end of current-limiting resistance 5, and the other end of current-limiting resistance 5 connects low pass filtered
The voltage signal output end of another signal input part of wave device 7, Zero flux formula Hall current sensor group 4 connects two-way high resistant
The signal output end of the first via signal input terminal of low power voltage amplifier 8, low-pass filter 7 connects two-way high resistant low power voltage
The second road signal output end connection gain of the second road signal input terminal of amplifier 8, two-way high resistant low power voltage amplifier 8 can
The signal output end of the signal input part of the voltage amplifier 9 of tune, the voltage amplifier 9 of adjustable gain connects multichannel AD converter
The first via signal output end of 10 CH0 channel signal input terminal, two-way high resistant low power voltage amplifier 8 connects multichannel AD conversion
The CH1 channel signal input terminal of device 10, the CH0 channel signal output end and CH1 channel signal output end of multichannel AD converter 10
It is separately connected a signal input part of single-chip microcontroller 11, the signal of the display signal output end connection display module 12 of single-chip microcontroller 11
Input terminal, the control signal input of the voltage amplifier 9 of the first control signal output end connection adjustable gain of single-chip microcontroller 11,
The control signal input of the second control signal output end connection Zero flux formula Hall current sensor group 4 of single-chip microcontroller 11.
In present embodiment, driving source and by driver unit include；Alternating-current voltage source 1, load 2, tested contact are to 3；Electricity
Flow measurement component includes Zero flux formula Hall current sensor group 4；Overvoltage protection component includes current-limiting resistance 5；Signal condition
Component includes low-pass filter 7, two-way high resistant low power voltage amplifier 8, the voltage amplifier 9 of adjustable gain and multichannel AD conversion
Device 10；
1 pair of alternating-current voltage source is motivated at the load 2 and tested contact of series relationship to 3, the ac voltage of excitation,
Loadtype depends on the type and power grade of tested ac electric apparatus with load value.
Small voltage U of the tested contact to 3 both endsCi(contact drop) enters low-pass filter 7；By low-pass filter
7 enter two-way high resistant low power voltage amplifier 8, and the voltage amplifier 9 of adjustable gain is entered by amplified voltage signal, is obtained
To output voltage UCo, amplitude and tested contact to 3 contact drop UCiAt linear function relationship.
Loop current I passes through the voltage value signal that Zero flux formula Hall current sensor group 4 is extracted, low into two-way high resistant
Times voltage amplifier 8, obtains output voltage UI, amplitude and loop current I are at linear function relationship.
The 9 output voltage U of voltage amplifier of adjustable gainCoWith 8 output voltage U of two-way high resistant low power voltage amplifierIInto
Enter the channel CH0 and the channel CH1 of multichannel AD converter 10, and switchs to digital quantity.
Multichannel AD converter 10 is under the control of single-chip microcontroller 11, from I/O port by UCoAnd UIDigital quantity read in piece in.It is single
Piece machine 11 is by judging UCoVirtual value size, come the gain of the voltage amplifier 9 of feedback regulation adjustable gain, UCoIt is effective
Value is the 1/4~3/4 of 10 reference voltage value of AD converter, the range of gain factor can from 1 times to 100 times adjust；Make
Obtain the 9 output voltage U of voltage amplifier of adjustable gainCoVirtual value reach best；By judging UIVirtual value size, come anti-
Feedback adjusts the range of Zero flux formula Hall current sensor group 4, so that two-way high resistant low power voltage amplifier output voltage UI's
Virtual value reaches most preferably, i.e. UIVirtual value be 10 reference voltage value of AD converter 1/4~3/4.
It is tested from the point of view of the method for contact drop during existing ac electric apparatus electrical endurance at present, multiple types, difference
The contact drop measurement of the ac electric apparatus electrical endurance of power grade is most difficult to realization, and reason tests circuit topology knot
After structure determines, gain size is fixed, and voltage, the current amplitude range of circuit-under-test are extremely limited, if replacing other power grades
Ac electric apparatus, the voltage of circuit-under-test, current range will certainly exceed setting range, then can bring measuring accuracy not enough or nothing
The problem of method is tested.Therefore the test for needing to be adapted to multiple power grade ac electric apparatus using the combination of multiple amplifying circuits is needed
It asks, thus brings that complicated for operation, circuit is cumbersome, is difficult to the problem of safeguarding.
And the method that contact drop is tested during this ac electric apparatus electrical endurance designed by present embodiment
From the point of view of, feedback network is constituted by the voltage amplifier of adjustable gain, multichannel AD converter and single-chip microcontroller, utilizes the side of software
Formula can realize gain-adaptive, and while guaranteeing Gain Automatic adjusting, adjustable range can be improved, so that circuit-under-test
Voltage, current range are significantly increased, and the voltage of circuit-under-test can be from tens microvolts to changing 1 volt.And then it can satisfy
The ac electric apparatus electrical endurance demand of multiple types, different capacity grade, structure is simple, easy to maintain.
The feedback network being made up of Zero flux formula Hall current sensor group, multichannel AD converter and single-chip microcontroller, it is only necessary to
Single-chip microcontroller controls an analog switch, so that it may realize that loop current test scope automatically adjusts.
The contact drop U obtained by testCiWith loop current I, ac contactor resistance R is calculated using softwarec
=UCi/I(I≠0)。
Single-chip microcontroller 11 calculates tested contact to 3 contact drop U according to following three formula, by software modeCi, circuit
Electric current I and contact impedance Rc:
Single-chip microcontroller 11 by tested contact to 3 contact drop UCi, loop current I and contact impedance RcWaveform show in real time
Show and be recorded on display module 12, provides measured result to operator.
About buAnd ku, as described above, the output voltage U of the voltage amplifier 9 of adjustable gainCoAmplitude and tested touching
O'clock to 3 contact drop UCiAmplitude at linear function relationship, that is, meet Uco=ku·UCi+buTwo-way high resistant low power voltage is put
The output voltage U of big device 8IAmplitude and loop current I amplitude at linear function relationship, that is, meet UI=ki·I+bi。
Specific embodiment 2: illustrating present embodiment below with reference to Fig. 1.Present embodiment and embodiment one
Be a difference in that: it further includes combination overvoltage protector 6, and two terminals of combination overvoltage protector 6 are connected to low pass
On two signal input parts of filter 7；
Combination overvoltage protector is connected in parallel by Transient Suppression Diode and zener diode.
When two appliance contacts disconnect, contact is tested to the voltage U at 3 both endsCiEqual to 1 voltage of alternating-current voltage source, at this time
Current-limiting resistance 5 can limit the input voltage of low-pass filter 7 in safe range with overvoltage protector 6 is combined；When two
When appliance contact is closed, combination overvoltage protector 6 does not work.
From the point of view of testing the method for contact drop during current existing ac electric apparatus electrical endurance, it is tested contact pair
Contact drop UCiIt is the parameter for being most difficult to survey standard, the reason is that during electrical endurance, UCiVariation range it is too big,
Up to from exchange 50 μ V until exchange 660V magnitude.Therefore, in order to ensure that instrument need to make safely range cover entire test scope, by
The problem of this brings measuring accuracy to decline；U need to be reduced if guarantee measuring accuracyCiVariation range, it is desirable that electric appliance must be always
Closure, thus bring during electrical endurance can not on air real time test the problem of.
And the method that contact drop is tested during ac electric apparatus electrical endurance involved in present embodiment, design
The cooperation of combination voltage protector and low-pass filter combines overvoltage protector by Transient Suppression Diode and zener diode
It is composed, has both the response time (subnanosecond grade) being exceedingly fast and comparable rated current characteristic.Its benefit is in electric appliance disjunction
When can quick starting voltage protection, while current-limiting resistance can reduce rapidly loop current；Circuit is protected when electric appliance closure
It automatically disengages, current-limiting resistance becomes the passive element in low-pass filter, and high-frequency signal is filtered out, and further increases test essence
Degree, current-limiting resistance have double effects.This design overcomes above-mentioned precision not enough and can not on air real time test completely
Contradiction, and test simple for structure, measurement accuracy height.
On air real time test contact drop during electrical endurance that present embodiments provide for a kind of ac electric apparatus
Method.When there is contact off-state when electric appliance electrical endurance, the combined overvoltage protection of the alternating voltage at contact both ends
Device and current-limiting resistance, in safe range by high voltage limitation.When there is contact closure condition when electric appliance electrical endurance, touching
The point small ac voltage signal in both ends (contact drop) is amplified into after low-pass filtering by high resistant low power amplifier
The output voltage directly proportional to contact drop can be obtained in adjustable gain voltage amplifier.Further, in conjunction with Zero flux formula Hall
Loop current virtual value measured by current sensor, can be obtained the contact impedance of tested contact.Due to combining overvoltage protection
The protective effect of device can be realized ac electric apparatus contact drop on-line testing；Meanwhile high resistant low power amplifier be easy to get compared with
Small noise coefficient, and be easily achieved offset compensation, and single-chip microcontroller in conjunction with adjustable gain voltage amplifier, it can be achieved that increasing
Benefit is adaptive, and then improves measurement accuracy, expands measurement range, which, which has, meets on-line measurement, measurement accuracy height
And the feature that measurement range is wide.
Claims (10)
1. testing the circuit of contact drop during ac electric apparatus electrical endurance, it includes alternating-current voltage source (1), load
(2) and tested contact is to (3), it is characterised in that it further include Zero flux formula Hall current sensor group (4), current-limiting resistance (5),
Low-pass filter (7), two-way high resistant low power voltage amplifier (8), adjustable gain voltage amplifier (9), multichannel AD converter
(10), single-chip microcontroller (11) and display module (12), one end of the electrode connection load (2) of alternating-current voltage source (1), load
(2) the other end connects tested contact to a signal input part of a contact and low-pass filter (7) in (3), exchange
Another electrode of voltage source (1) passes through Zero flux formula Hall current sensor group (4), connects tested contact to the another of (3)
Another signal of one end of a contact and current-limiting resistance (5), other end connection low-pass filter (7) of current-limiting resistance (5) is defeated
Enter end, the voltage signal output end of Zero flux formula Hall current sensor group (4) connects two-way high resistant low power voltage amplifier (8)
First via signal input terminal, the of signal output end connection two-way high resistant low power voltage amplifier (8) of low-pass filter (7)
Two road signal input parts, the voltage of the second road signal output end connection adjustable gain of two-way high resistant low power voltage amplifier (8)
The signal output end of the signal input part of amplifier (9), the voltage amplifier (9) of adjustable gain connects multichannel AD converter (10)
CH0 channel signal input terminal, the first via signal output end of two-way high resistant low power voltage amplifier (8) connects multichannel AD conversion
The CH1 channel signal input terminal of device (10), the CH0 channel signal output end and CH1 channel signal of multichannel AD converter (10) are defeated
Outlet is separately connected a signal input part of single-chip microcontroller (11), and the display signal output end of single-chip microcontroller (11) connects display module
(12) signal input part, the voltage amplifier (9) of the first control signal output end connection adjustable gain of single-chip microcontroller (11)
The second control signal output end of control signal input, single-chip microcontroller (11) connects Zero flux formula Hall current sensor group (4)
Control signal input.
2. testing the circuit of contact drop, feature during ac electric apparatus electrical endurance according to claim 1
It is the output voltage U of the voltage amplifier (9) of adjustable gainCoAmplitude and tested contact to the contact drop U of (3)Ci's
Amplitude is at linear function relationship.
3. testing the circuit of contact drop, feature during ac electric apparatus electrical endurance according to claim 1
It is the output voltage U of two-way high resistant low power voltage amplifier (8)IAmplitude and the amplitude of loop current I closed at linear function
System.
4. testing the circuit of contact drop, feature during ac electric apparatus electrical endurance according to claim 1
It is multichannel AD converter (10) under the control of single-chip microcontroller (11), by UCoDigital quantity read in piece in；Single-chip microcontroller (11) is logical
Cross judgement UCoVirtual value size, come the gain of the voltage amplifier (9) of feedback regulation adjustable gain, UCoVirtual value be AD
The 1/4~3/4 of converter (10) reference voltage value.
5. testing the circuit of contact drop, feature during ac electric apparatus electrical endurance according to claim 1
It is multichannel AD converter (10) under the control of single-chip microcontroller (11), by UIDigital quantity read in piece in；By judging UIHave
Valid value size carrys out the range of feedback regulation Zero flux formula Hall current sensor group (4).
6. testing the circuit of contact drop, feature during ac electric apparatus electrical endurance according to claim 5
It is UIVirtual value be AD converter (10) reference voltage value 1/4~3/4.
7. testing the circuit of contact drop, feature during ac electric apparatus electrical endurance according to claim 1
It is the contact drop U obtained by testCiWith loop current I, ac contactor resistance R is calculated using softwarec=UCi/I
(I≠0)。
8. testing the circuit of contact drop, feature during ac electric apparatus electrical endurance according to claim 1
It is that single-chip microcontroller (11) according to following three formula, calculates tested contact to the contact drop U of (3) by software modeCi, circuit
Electric current I and contact impedance Rc:
The output voltage U of the voltage amplifier (9) of adjustable gainCoAmplitude and tested contact to the contact drop U of (3)Ci's
Amplitude meets U at linear function relationshipco=ku·UCi+bu；
The output voltage U of two-way high resistant low power voltage amplifier (8)IAmplitude and the amplitude of loop current I closed at linear function
System, meets UI=ki·I+bi。
9. testing the circuit of contact drop, feature during ac electric apparatus electrical endurance according to claim 1
It is that it further includes combination overvoltage protector (6), two terminals of combination overvoltage protector (6) are connected to low-pass filtering
On two signal input parts of device (7).
10. testing the circuit of contact drop, feature during ac electric apparatus electrical endurance according to claim 9
It is that combine overvoltage protector is formed in parallel by Transient Suppression Diode and zener diode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811408429.9A CN109307839B (en) | 2018-11-23 | 2018-11-23 | Circuit for testing contact voltage drop in alternating current electrical appliance electrical life experimental process |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811408429.9A CN109307839B (en) | 2018-11-23 | 2018-11-23 | Circuit for testing contact voltage drop in alternating current electrical appliance electrical life experimental process |
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| Publication Number | Publication Date |
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| CN109307839A true CN109307839A (en) | 2019-02-05 |
| CN109307839B CN109307839B (en) | 2020-08-11 |
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Cited By (3)
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| CN110412455A (en) * | 2019-07-11 | 2019-11-05 | 上海工程技术大学 | A kind of switch testing circuitry and switch testing equipment |
| CN111596194A (en) * | 2020-04-23 | 2020-08-28 | 上海机电工程研究所 | Test resource switching circuit device suitable for PCB board maintenance test equipment |
| CN113687145A (en) * | 2020-05-18 | 2021-11-23 | 贵州振华群英电器有限公司（国营第八九一厂） | Voltage drop testing device of alternating current contactor |
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|---|---|---|---|---|
| CN110412455A (en) * | 2019-07-11 | 2019-11-05 | 上海工程技术大学 | A kind of switch testing circuitry and switch testing equipment |
| CN111596194A (en) * | 2020-04-23 | 2020-08-28 | 上海机电工程研究所 | Test resource switching circuit device suitable for PCB board maintenance test equipment |
| CN113687145A (en) * | 2020-05-18 | 2021-11-23 | 贵州振华群英电器有限公司（国营第八九一厂） | Voltage drop testing device of alternating current contactor |
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| CN109307839B (en) | 2020-08-11 |
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