CN109239583A - Detect the circuit of pin floating state - Google Patents
Detect the circuit of pin floating state Download PDFInfo
- Publication number
- CN109239583A CN109239583A CN201811228316.0A CN201811228316A CN109239583A CN 109239583 A CN109239583 A CN 109239583A CN 201811228316 A CN201811228316 A CN 201811228316A CN 109239583 A CN109239583 A CN 109239583A
- Authority
- CN
- China
- Prior art keywords
- pin
- measured
- switch
- comparator
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007667 floating Methods 0.000 title claims abstract description 16
- 238000001514 detection method Methods 0.000 claims abstract description 26
- 230000005283 ground state Effects 0.000 claims abstract description 15
- 238000000034 method Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 7
- 230000008569 process Effects 0.000 description 5
- 238000003466 welding Methods 0.000 description 5
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 4
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- 230000000630 rising effect Effects 0.000 description 4
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 4
- 101000716809 Homo sapiens Secretogranin-1 Proteins 0.000 description 3
- 102100020867 Secretogranin-1 Human genes 0.000 description 3
- LFERELMXERXKKQ-NYTQINMXSA-N cpad Chemical group NC(=O)C1=CC=CC([C@H]2[C@@H]([C@@H](O)[C@H](COP([O-])(=O)O[P@@](O)(=O)OC[C@H]3[C@@H]([C@@H](O)[C@@H](O3)N3C4=NC=NC(N)=C4N=C3)O)O2)O)=[NH+]1 LFERELMXERXKKQ-NYTQINMXSA-N 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 3
- 102100038026 DNA fragmentation factor subunit alpha Human genes 0.000 description 2
- 101000950906 Homo sapiens DNA fragmentation factor subunit alpha Proteins 0.000 description 2
- 235000013399 edible fruits Nutrition 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000011056 performance test Methods 0.000 description 2
- 102100038023 DNA fragmentation factor subunit beta Human genes 0.000 description 1
- 101100277639 Homo sapiens DFFB gene Proteins 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000010923 batch production Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000037361 pathway Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The present invention provides a kind of circuit for detecting pin floating state, comprising: the detection unit being connected with pin to be measured, for detecting resistance value of the pin to be measured under access power supply and ground state；The judging unit being connected with the detection unit obtains the first comparison result for the pin to be measured in the resistance value and the first predetermined threshold of access power supply status；And resistance value and second predetermined threshold of the pin to be measured under ground state, obtain the second comparison result.Whether hanging it can detecte out pin by circuit disclosed above.
Description
Technical field
The present invention relates to technical field of integrated circuits more particularly to a kind of circuits for detecting pin floating state.
Background technique
Pin is the connection jaws drawn from integrated circuit with peripheral circuit, and all pins just constitute connecing for this block chip
Mouthful.Chip by melt tin by pin and printed circuit board, i.e. pad solder in PCB circuit board together.
In the prior art, since pad and component solderability are poor, printing parameter is incorrect, reflow welding temperature and heating speed
It spends the factors such as improper and is likely to result in rosin joint.Rosin joint will cause chip pin open circuit, so that pin is vacant state.If pin
In vacant state, then can be caused that supply voltage can be charged to by weak current but also discharge into ground voltage.If drawn
Foot is that welding is good, then having external power supply or ground or resistance etc., would not be caused be charged to by weak current
Supply voltage can discharge into ground voltage again.
Disadvantage of the prior art is that in the batch production of the electronic equipments such as mobile phone, plate, since chip is many on PCB
More and intensive, factory can not effectively monitor the welding quality situation of each pin.For the chip of rosin joint, complete machine can only be leaned on
Electric performance test screen out.And if the pin of rosin joint is not provided with pullup or pulldown resistance, it is in vacant state, then every time
The state of the pin is all uncertain after powering on, and voltage value may be 0 to an arbitrary value between supply voltage, therefore
Can work when chip is, when and cannot work, so there is the possibility in the pin missing inspection of vacant state, erroneous detection.
Summary of the invention
In view of this, the embodiment of the present invention provides a kind of circuit for detecting pin floating state, energy when solving chip
Work, when and cannot work, and there is the possibility in the pin missing inspection of vacant state, erroneous detection.
A kind of circuit detecting pin floating state, comprising:
The detection unit being connected with pin to be measured, for detecting the pin to be measured under access power supply and ground state
Resistance value；
The judging unit being connected with the detection unit, for the pin to be measured in the resistance value for accessing power supply status
With the first predetermined threshold, the first comparison result is obtained；And resistance value and second of the pin to be measured under ground state
Predetermined threshold obtains the second comparison result.
Optionally, the detection unit, comprising:
First reference resistance, the second reference resistance, first switch, second switch and power supply；
One end of first reference resistance connects the power supply, and the other end connects first switch, the first switch
The other end connects the second switch, and the other end of the second switch connects second reference resistance, second benchmark
The other end of resistance is grounded, and the first switch connects the pin to be measured and the judgement with the common end of the second switch
Unit.
Optionally, the judging unit, comprising:
First comparator and the second comparator；
The first input end of the first comparator inputs resistance value of the pin to be measured in the case where accessing power supply status, described
Second input terminal of first comparator inputs first predetermined threshold, the output end output described first of the first comparator
Comparison result；
Second input section of second comparator inputs resistance value of the pin to be measured under ground state, and described second
Threshold value is subscribed in the first input end input second of comparator, and knot is compared in the output end output described second of second comparator
Fruit.
Optionally, further includes:
First trigger and the second trigger；
The data input pin of first trigger connects the output end of the first comparator, first trigger
Clock input level signal, output end output the first triggering result of first trigger；
The data input pin of second trigger connects the output end of second comparator, second trigger
Clock input level signal, output end output the second triggering result of second trigger.
Optionally, further includes:
Control door and the controlling brancher being connect with the control door；
The control door receives the first triggering result and second triggering respectively as a result, if the first triggering knot
Fruit and the second triggering result meet pre-provisioning request, then the control door controls the controlling brancher work；
Wherein, the pre-provisioning request is for reflecting that the pin to be measured is in vacant state；
The controlling brancher is used to the pin to be measured be pulled upward to fixed voltage or power supply or by the pin to be measured
Pull down to ground.
Optionally, the controlling brancher, comprising:
Third switch and resistance；Wherein, the first end of the resistance connects the pin to be measured, the control of the third switch
End processed connects the control door, and the first end of the third switch connects the second end of the resistance, and the of the third switch
Two ends ground connection connects power supply or connects fixed voltage.
It can be seen from the above technical scheme that in the circuit of detection pin floating state provided by the invention, by sentencing
The disconnected unit pin to be measured obtains the first comparison result in the resistance value and the first predetermined threshold of access power supply status；With
And resistance value and second predetermined threshold of the pin to be measured under ground state, obtain the second comparison result.By obtaining
The first comparison result with the second comparison result it may determine that whether pin to be measured opens a way out.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of invention for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is a kind of block diagram for detecting pin floating state disclosed by the embodiments of the present invention；
Fig. 2 is a kind of circuit diagram for detecting pin floating state disclosed by the embodiments of the present invention；
Fig. 3 is the circuit diagram of another detection pin floating state disclosed by the embodiments of the present invention；
Fig. 4 is a kind of circuit diagram of the voltage of the pin of determining vacant state disclosed by the embodiments of the present invention；
Fig. 5 is the circuit diagram of the voltage of another pin for determining vacant state disclosed by the embodiments of the present invention；
Fig. 6 is electrifying timing sequence figure disclosed by the embodiments of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
In the prior art, either from patch mode or patch detection mode, also or improve welding quality, all without
Method prevents the generation of pin open, and there is also SMT patch welding quality is bad, solder joint only has faint connection, and pole has can
Stress can be encountered in transport or user's use process, the case where solder joint falls off, chip pin is caused to open a way after equipment factory.
For this purpose, many factories wish to detected this phenomenon in the system test before equipment factory, avoid outside outflow factory.
Therefore, the embodiment of the invention discloses a kind of circuits for detecting pin floating state, to solve pin open but not have
The problem of detected.Further, moreover it is possible to be set as determining state for pin, so that it is grounded or is connect power supply, facilitate factory
Subsequent detection.
The embodiment of the invention provides a kind of circuits for detecting pin floating state, as shown in Figure 1, comprising: detection unit
101 and judging unit 102.
Detection unit 101 is connected with pin to be measured, and detection unit 101 is connected with judging unit 102, for detect it is described to
Survey resistance value of the pin under access power supply and ground state.
Optionally, a kind of embodiment of detection unit 101, as shown in Figure 2, comprising: the first reference resistance 203, second
Reference resistance 204, first switch 205, second switch 206 and power supply 207.Wherein, 203 one end of the first reference resistance connection electricity
Source 207, the other end connect first switch 205, and the other end of first switch 205 connects second switch 206, second switch 206
The other end connects the second reference resistance 204, the other end ground connection of the second reference resistance 204, first switch 205 and second switch
206 common end connection judgment unit and pin to be measured.
Wherein, in conjunction with Fig. 2 and Fig. 6, the control signal of first switch 205 is CHG signal, within the t1 period, CHG signal
For high level, controls first switch 205 and be closed, first switch 205 is connected.Power supply 207 passes through the first reference resistance 203 and first
Switch 205 connects pin to be measured.If pin to be measured is in vacant state, in the state that power supply 207 connects pin to be measured, and
There is no charge and discharge electric pathway, then pin is in high-impedance state to power supply, and the resistance value that detection unit 101 detects can be infinitely great.
The control signal of second switch 206 is DISCHG signal, and within the t2 period, DISCHG signal CHG signal is height
Level, control second switch 206 are closed, and second switch 206 is connected.Pin to be measured passes through second switch 206 and the second benchmark electricity
204 ground connection of resistance.Similarly, it is in vacant state in pin to be measured, pin is also in high configuration over the ground, what detection unit 101 detected
Resistance value also can be infinitely great.
Judging unit 102, in the resistance value and the first predetermined threshold of access power supply status, is obtained for the pin to be measured
To the first comparison result；And resistance value and second predetermined threshold of the pin to be measured under ground state, obtain second
Comparison result.Whether hanging it can detecte out pin by circuit disclosed above.
Optionally, a kind of embodiment of judging unit 202, see also Fig. 2, comprising: first comparator 208 and second
Comparator 209.Wherein, the first input end of first comparator 208 inputs resistance value of the pin to be measured in the case where accessing power supply status, the
Second input terminal of one comparator 208 inputs the first predetermined threshold；The second input terminal input of second comparator 209 is described to be measured
The first input end of resistance value of the pin under ground state, the second comparator 209 inputs the second predetermined threshold.
Wherein, the first predetermined threshold is a reference voltage close to supply voltage VCC, and the second predetermined threshold is closely
One reference voltage of voltage.In addition, being closed first switch if total capacitor on pin to be measured to ground and power supply is Cpad
205 time is t1, and the time of closure second switch 206 is t2, then t1 and t2 need to meet: the first reference resistance of t1 > 3*
The second reference resistance 204*Cpad of 203*Cpad, t2 > 3*.If t1 the and t2 time is too short, the pin to be measured described in port
Charge and discharge process does not complete also, and comparator judging result is inaccurate.
It should be noted that referring to fig. 2, being closed first switch 205, connects power supply 207 and accessed by the first reference resistance 203
To pin to be measured.Due to there is resistance to access pin to be measured, the resistance value of pin to be measured can change, and voltage can also occur mutually to strain
Change.The first input end connection first switch 205 of first comparator 208 is used to connect the port of pin to be measured, then can receive
For pin to be measured because accessing the voltage that power supply generates by the first reference resistance 203, first comparator 208 connects first input end
The voltage value of receipts and received first predetermined threshold of the second input terminal are compared, and obtain the first comparison result.
It is closed second switch 206, the second reference resistance 204 of ground connection is accessed into pin to be measured.Due to there is resistance access
Pin to be measured, the resistance value of pin to be measured can change at this time, and corresponding change can also occur for voltage.The of second comparator 209
Two input terminals connection second switch 206 is used to connect the port of pin to be measured, then can receive pin to be measured because by the second base
Quasi- resistance 204 is grounded and the voltage of generation, the second comparator 209 connect the received voltage value of the second input terminal and first input end
The second predetermined threshold received is compared, and obtains the second comparison result.
It is understood that first comparator 208 is more to be measured in the pin to be measured in the state of accessing power supply
It is high to more than the first predetermined threshold whether the voltage of pin is filled, and in the pin to be measured in the state of accessing ground, second compares
Compared with device 209, whether the voltage of pin more to be measured is lowered to lower than the second predetermined threshold.
It should also be noted that, can be as shown in Fig. 2, the non-inverting input terminal input of first comparator 208 be described to be measured draws
Resistance value of the foot in the case where accessing power supply status, inverting input terminal input the first predetermined threshold；The input terminal reverse phase of second comparator 209
Resistance value of the pin to be measured under ground state is inputted, non-inverting input terminal inputs the second predetermined threshold.In the pin to be measured
When the resistance value accessed under power supply status is higher than the first predetermined threshold, the first comparison result that first comparator 208 obtains is height
Level, on the contrary it is low level；Similarly, when the resistance value in the pin to be measured under ground state is higher than the second predetermined threshold, the
The second comparison result that one comparator 208 obtains is low level, otherwise is high level.By identifying the first comparison result and second
The type of comparison result then can determine whether pin to be measured is in vacant state.
Certainly, the connection type of two input terminals of first comparator 208 and the second comparator 209 is not limited in Fig. 2
It is shown, it can be other modes, such as: the non-inverting input terminal of first comparator 208 inputs the pin to be measured in access power supply
Resistance value under state, inverting input terminal input the first predetermined threshold；The non-inverting input terminal input of second comparator 209 is described to be measured
Resistance value of the pin under ground state, inverting input terminal input the second predetermined threshold.
Optionally, in another embodiment of the application, the circuit of the detection pin floating state, as shown in figure 3, in addition to
It can also include: the first trigger 310 and the second trigger 311 except detection unit 101 and judging unit 102.Its
In, the output end of the data input pin connection first comparator 208 of the first trigger 310, the clock input of the first trigger 310
End receives level signal CHGB, output end output the first triggering result of the first trigger 310.The data of second trigger 311
The output end of input terminal the second comparator 209 of connection, the clock input level signal DISCHGB of the second trigger 311,
Output end output the second triggering result of second trigger 311.
Specifically, as shown in fig. 6, the first trigger 310 compares in the rising edge time DFF1 of level signal CHGB first
It is acquired compared with 208 output signal of device.Principle based on trigger, the next state of trigger depend on the rising of level signal CHGB
The state of data input pin before moment DFF1 arrival.So if the output of first comparator 208 is high level letter
Number, then the output of the first trigger 310 is also high level signal.Similarly, the second trigger 311 is in level signal DISCHGB
Rising edge time DFF2,209 output signal of the second comparator is acquired.Principle based on trigger, time of trigger
State of the state depending on the data input pin before the rising edge time DFF2 arrival of level signal DISCHGB.So if the
The output of two comparators 209 is high level signal, then the output of the second trigger 311 is also high level signal.
What the principle based on trigger, the first trigger 310 and the second trigger 311 made that level signal is interfered can
Energy property reduces, and can maintain the state of level signal the long period, facilitate the voltage of the pin of subsequent determining vacant state.
Another embodiment of the present invention additionally provides a kind of circuit for detecting pin floating state, as shown in figure 4, including examining
Survey unit 401, judging unit 402, the first trigger 310, the second trigger 311 and control unit.
Detection unit 101 and judging unit in detection unit 401 and judging unit 402 and corresponding diagram 1 and the embodiment of Fig. 2
102 implementation procedure and principle is identical, and which is not described herein again.
Wherein, control unit, comprising: control door 403 and the controlling brancher 404 being connect with control door 403.
Control door 403 receive it is described first triggering result and it is described second triggering as a result, if it is described first triggering result and
The second triggering result meets pre-provisioning request, then controls door 403 and control the work of controlling brancher 404；Wherein, described predetermined
It is required that for reflecting that the pin to be measured is in vacant state.
Controlling brancher 404 is used to pull down to ground for the pin to be measured.
It should be noted that the way of realization of judging unit 402 is as shown in figure 4, then control the triggering of door 403 received first
The first triggering result that device device 310 exports is high level, and controls the second touching of received second trigger 311 of door 403 output
It sends out in the case that result is high level, illustrates that pin to be measured can be filled and high connect to close to supply voltage but also be lowered to
Ground voltage, then pin to be measured is to control door 403 at this time in vacant state and manipulate controlling brancher 404 for the voltage of pin to be measured
Pull down to ground.
Optionally, also shown in FIG. 4, controlling brancher 404 may include: third switch 405 and resistance 406；Wherein:
The first end of resistance 406 connects the pin to be measured, the control terminal connection control door 403 of third switch 405, third switch 405
First end connection resistance 406 second end, the second end of third switch 405 is grounded.
When first meets pre-provisioning request than triggering result and the second triggering result, then controls door 403 and control the control and prop up
When road 404 works, third switch 405 is closed, and pin to be measured is by resistive pull-downs to ground, and pin to be measured is all determining ground connection later
State.
Another embodiment of the present invention additionally provides a kind of circuit for detecting pin floating state, as shown in figure 5, including examining
Survey unit 501, judging unit 502, the first trigger 310, the second trigger 311 and control unit.
Detection unit 101 and judging unit in detection unit 501 and judging unit 502 and corresponding diagram 1 and the embodiment of Fig. 2
102 implementation procedure and principle is identical, and which is not described herein again.
Wherein, control unit, comprising: control door 503 and the controlling brancher 504 for controlling the connection of door 503.
Control door 503 receive it is described first triggering result and it is described second triggering as a result, if it is described first triggering result and
The second triggering result meets pre-provisioning request, then controls door 503 and control the work of controlling brancher 504；Wherein, described predetermined
It is required that for reflecting that the pin to be measured is in vacant state.
Controlling brancher 504 is used to the pin to be measured being pulled upward to power supply.Optionally, controlling brancher 504 will be in addition to will be described
Pin to be measured is pulled upward to power supply, can also be pulled upward to fixed voltage.
It should be noted that the way of realization of judging unit 502 is as shown in figure 5, then control the triggering of door 503 received first
The first triggering result that device 310 exports is high level, and controls the second triggering of received second comparator 311 of door 503 output
As a result in the case where high level, to illustrate that it is high to close to supply voltage but also being lowered to close to ground connection that pin to be measured can be filled
Voltage, then pin to be measured is in vacant state, and controlling the manipulation controlling brancher 504 of door 503 at this time will be on the voltage of pin to be measured
Draw power supply.
Optionally, also shown in FIG. 5, controlling brancher 504, comprising: power supply 507, third switch 505 and resistance 506；
The first end of resistance 506 connects the pin to be measured, the control terminal connection control door 503 of third switch 505, third
The second end of the first end connection resistance 506 of switch 505, the second end of third switch 505 connect power supply 507.When the first triggering
As a result with second triggering result meet pre-provisioning request, then control door 503 control the controlling brancher 504 work when, third switch
505 closures, pin voltage to be measured is pulled to 507 voltage of power supply, for fixed pull-up state.
The pin of vacant state can be passed through electricity by a control door and controlling brancher by the above embodiment of the present invention
Resistance is pulled upward to power supply or fixed voltage, or pulls down to ground, and the pin of vacant state will be determined, if the work determined, then
Without patch again；If it is determined that do not work, factory can by electric performance test find chip not work normally, to find
The problem of chip is opened a way, to reduce the factory of pin open equipment.
It should be noted that, in this document, relational terms such as first and second and the like are used merely to a reality
Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation
In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or its any other variant are intended to
Non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those
Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or equipment
Intrinsic element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that
There is also other identical elements in process, method, article or equipment including the element.
The above is only the specific embodiment of the application, it is noted that for the ordinary skill people of the art
For member, under the premise of not departing from the application principle, several improvements and modifications can also be made, these improvements and modifications are also answered
It is considered as the protection scope of the application.
Claims (6)
1. a kind of circuit for detecting pin floating state characterized by comprising
The detection unit being connected with pin to be measured, for detecting resistance of the pin to be measured under access power supply and ground state
Value；
The judging unit being connected with the detection unit, for the pin to be measured access power supply status resistance value and the
One predetermined threshold obtains the first comparison result；And resistance value and second of the pin to be measured under ground state are predetermined
Threshold value obtains the second comparison result.
2. circuit according to claim 1, which is characterized in that the detection unit, comprising:
First reference resistance, the second reference resistance, first switch, second switch and power supply；Wherein:
One end of first reference resistance connects the power supply, and the other end connects the first switch, the first switch
The other end connects the second switch, and the other end of the second switch connects second reference resistance, second benchmark
The other end of resistance is grounded, and the first switch connects the pin to be measured and the judgement with the common end of the second switch
Unit.
3. circuit according to claim 1, which is characterized in that the judging unit, comprising:
First comparator and the second comparator；Wherein:
The first input end of the first comparator inputs resistance value of the pin to be measured in the case where accessing power supply status, and described first
Second input terminal of comparator inputs first predetermined threshold, and the output end output described first of the first comparator is compared
As a result；
Second input terminal of second comparator inputs resistance value of the pin to be measured under ground state, and described second compares
Threshold value is subscribed in the first input end input second of device, and the output end of second comparator exports second comparison result.
4. circuit according to claim 3, which is characterized in that further include:
First trigger and the second trigger；Wherein:
The data input pin of first trigger connects the output end of the first comparator, the clock of first trigger
Input terminal receives level signal, output end output the first triggering result of first trigger；
The data input pin of second trigger connects the output end of second comparator, the clock of second trigger
Input terminal receives level signal, output end output the second triggering result of second trigger.
5. circuit according to claim 4, which is characterized in that further include:
Control door and the controlling brancher being connect with the control door；
The control door receive respectively it is described first triggering result and it is described second triggering as a result, if it is described first triggering result and
The second triggering result meets pre-provisioning request, then the control door controls the controlling brancher work；
Wherein, the pre-provisioning request is for reflecting that the pin to be measured is in vacant state；
The controlling brancher is used to for the pin to be measured being pulled upward to fixed voltage or power supply or pulls down the pin to be measured
To ground.
6. circuit according to claim 5, which is characterized in that the controlling brancher, comprising:
Third switch and resistance；
Wherein, the first end of the resistance connects the pin to be measured, and the control terminal of the third switch connects the control door,
The first end of third switch connects the second end of the resistance, the second end ground connection of the third switch, connect power supply or
Connect fixed voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811228316.0A CN109239583A (en) | 2018-10-22 | 2018-10-22 | Detect the circuit of pin floating state |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811228316.0A CN109239583A (en) | 2018-10-22 | 2018-10-22 | Detect the circuit of pin floating state |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109239583A true CN109239583A (en) | 2019-01-18 |
Family
ID=65081018
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811228316.0A Pending CN109239583A (en) | 2018-10-22 | 2018-10-22 | Detect the circuit of pin floating state |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109239583A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111182514A (en) * | 2019-12-11 | 2020-05-19 | 福建魔方电子科技有限公司 | Method, device, equipment and medium for realizing time-sharing multiplexing of pins |
| CN111835049A (en) * | 2019-04-22 | 2020-10-27 | 北京小米移动软件有限公司 | Charging terminal, method and device |
| CN111983437A (en) * | 2020-08-25 | 2020-11-24 | 深圳市旗开电子有限公司 | 5G module product GPIO port test circuit and test method |
| CN112338307A (en) * | 2021-01-08 | 2021-02-09 | 四川赛狄信息技术股份公司 | High-precision circuit board packaging chip center pin difference compensating welding method and device |
| CN112485654A (en) * | 2020-11-16 | 2021-03-12 | 上海唯捷创芯电子技术有限公司 | Chip port state detection circuit, chip and communication terminal |
| CN113009313A (en) * | 2021-01-29 | 2021-06-22 | 南京英锐创电子科技有限公司 | Sensor diagnostic device and sensor detection circuit |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1632605A (en) * | 2003-12-22 | 2005-06-29 | 威宇科技测试封装有限公司 | Chip pin open circuit and short circuit tester and method therefor |
| CN2781390Y (en) * | 2005-03-14 | 2006-05-17 | 重庆汇力汽车电子仪表有限公司 | Vehicle loading short circuit, open circuit predetection circuit |
| CN2814762Y (en) * | 2005-03-17 | 2006-09-06 | 重庆汇力汽车电子仪表有限公司 | Vehicle load electric control switch with short-circuit and open-circuit predetection |
| CN101416067A (en) * | 2004-10-28 | 2009-04-22 | 英特尔公司 | Low cost test for IC's or electrical modules using standard reconfigurable logic devices |
| CN103018588A (en) * | 2012-11-23 | 2013-04-03 | 无锡中星微电子有限公司 | Low-power-consumption anti-interference three-state input detection circuit |
| CN202918191U (en) * | 2012-11-08 | 2013-05-01 | 成都芮捷科技发展有限责任公司 | Control circuit for high frequency switching power supply |
| CN104991184A (en) * | 2015-07-29 | 2015-10-21 | 英特格灵芯片(天津)有限公司 | On-chip tri-state signal detecting apparatus and detecting method thereof |
| CN105372552A (en) * | 2015-12-10 | 2016-03-02 | 南京康尼电子科技有限公司 | Load open circuit detection circuit and method for high-side switch |
| CN106226685A (en) * | 2016-09-10 | 2016-12-14 | 苏州创必成电子科技有限公司 | Multi input data mode parallel detection circuit with on-off control |
| CN208969205U (en) * | 2018-10-22 | 2019-06-11 | 上海艾为电子技术股份有限公司 | Detect the circuit of pin floating state |
-
2018
- 2018-10-22 CN CN201811228316.0A patent/CN109239583A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1632605A (en) * | 2003-12-22 | 2005-06-29 | 威宇科技测试封装有限公司 | Chip pin open circuit and short circuit tester and method therefor |
| CN101416067A (en) * | 2004-10-28 | 2009-04-22 | 英特尔公司 | Low cost test for IC's or electrical modules using standard reconfigurable logic devices |
| CN2781390Y (en) * | 2005-03-14 | 2006-05-17 | 重庆汇力汽车电子仪表有限公司 | Vehicle loading short circuit, open circuit predetection circuit |
| CN2814762Y (en) * | 2005-03-17 | 2006-09-06 | 重庆汇力汽车电子仪表有限公司 | Vehicle load electric control switch with short-circuit and open-circuit predetection |
| CN202918191U (en) * | 2012-11-08 | 2013-05-01 | 成都芮捷科技发展有限责任公司 | Control circuit for high frequency switching power supply |
| CN103018588A (en) * | 2012-11-23 | 2013-04-03 | 无锡中星微电子有限公司 | Low-power-consumption anti-interference three-state input detection circuit |
| CN104991184A (en) * | 2015-07-29 | 2015-10-21 | 英特格灵芯片(天津)有限公司 | On-chip tri-state signal detecting apparatus and detecting method thereof |
| CN105372552A (en) * | 2015-12-10 | 2016-03-02 | 南京康尼电子科技有限公司 | Load open circuit detection circuit and method for high-side switch |
| CN106226685A (en) * | 2016-09-10 | 2016-12-14 | 苏州创必成电子科技有限公司 | Multi input data mode parallel detection circuit with on-off control |
| CN208969205U (en) * | 2018-10-22 | 2019-06-11 | 上海艾为电子技术股份有限公司 | Detect the circuit of pin floating state |
Non-Patent Citations (1)
| Title |
|---|
| 张宁春 等, 《电工电子实习》, no. 1, pages 90 * |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111835049A (en) * | 2019-04-22 | 2020-10-27 | 北京小米移动软件有限公司 | Charging terminal, method and device |
| CN111182514A (en) * | 2019-12-11 | 2020-05-19 | 福建魔方电子科技有限公司 | Method, device, equipment and medium for realizing time-sharing multiplexing of pins |
| CN111182514B (en) * | 2019-12-11 | 2023-06-30 | 福建魔方电子科技有限公司 | Method, device, equipment and medium for realizing pin time-sharing multiplexing |
| CN111983437A (en) * | 2020-08-25 | 2020-11-24 | 深圳市旗开电子有限公司 | 5G module product GPIO port test circuit and test method |
| CN111983437B (en) * | 2020-08-25 | 2023-09-08 | 深圳市旗开电子有限公司 | 5G module product GPIO port test circuit and test method |
| CN112485654A (en) * | 2020-11-16 | 2021-03-12 | 上海唯捷创芯电子技术有限公司 | Chip port state detection circuit, chip and communication terminal |
| WO2022100756A1 (en) * | 2020-11-16 | 2022-05-19 | 上海唯捷创芯电子技术有限公司 | Chip port state detection circuit, chip, and communication terminal |
| CN112338307A (en) * | 2021-01-08 | 2021-02-09 | 四川赛狄信息技术股份公司 | High-precision circuit board packaging chip center pin difference compensating welding method and device |
| CN112338307B (en) * | 2021-01-08 | 2021-03-19 | 四川赛狄信息技术股份公司 | High-precision circuit board packaging chip center pin difference compensating welding method and device |
| CN113009313A (en) * | 2021-01-29 | 2021-06-22 | 南京英锐创电子科技有限公司 | Sensor diagnostic device and sensor detection circuit |
| CN113009313B (en) * | 2021-01-29 | 2022-05-27 | 南京英锐创电子科技有限公司 | Sensor diagnostic device and sensor detection circuit |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109239583A (en) | Detect the circuit of pin floating state | |
| CN208969205U (en) | Detect the circuit of pin floating state | |
| CN109239584A (en) | Detect the circuit of pin floating state | |
| US10983152B2 (en) | USB data pin impedance detection | |
| US9128691B2 (en) | Method and terminal for selecting internal circuit according to USB interface status | |
| CN102393837B (en) | USB charger recognition device and method | |
| CN205721762U (en) | The interface circuit of general-purpose serial bus USB interface and portable terminal | |
| CN207910511U (en) | Battery charge control circuit and dust catcher | |
| CN103545882A (en) | Battery in-situ test method and device and battery charge system | |
| CN101702146A (en) | Method and unit for distinguishing charger and data line of universal serial bus | |
| CN208969206U (en) | Detect the circuit of pin floating state | |
| CN106771828A (en) | Detection device and method for powered device of Ethernet power supply system | |
| CN106155969B (en) | data transmission system and transmission method thereof | |
| CN106462512B (en) | It is forward and reverse between a kind of contact USB device to be inserted into the scheme being mutually distinguishable | |
| CN108768379A (en) | Polymorphic recognition methods, system and terminal | |
| CN207281214U (en) | Type-C interface and connection detection circuit thereof | |
| CN209417102U (en) | A kind of test fixture | |
| CN204215116U (en) | Liquid crystal display module proving installation | |
| CN101738562B (en) | Electric detection system for interface card | |
| CN207410011U (en) | A kind of control circuit and charging wire | |
| CN206096382U (en) | Many buttons switch detection circuit | |
| CN111537915A (en) | Broken string detection circuitry and treasured that charges of polymorphic type charging wire | |
| CN204389654U (en) | Based on the battery electric quantity detection system that cell resistance is followed the tracks of | |
| CN205353147U (en) | IC -card targets in place and detects power control circuit | |
| CN207651150U (en) | A kind of current sensing means and system for screen detection |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Country or region after: China Address after: Room 1201, No.2, Lane 908, Xiuwen Road, Minhang District, Shanghai, 201199 Applicant after: SHANGHAI AWINIC TECHNOLOGY Co.,Ltd. Address before: Room 303-39, building 33, 680 Guiping Road, Xuhui District, Shanghai 200233 Applicant before: SHANGHAI AWINIC TECHNOLOGY Co.,Ltd. Country or region before: China |