CN109120264A - A kind of girz analog-digital converter Auto-Test System and method - Google Patents
A kind of girz analog-digital converter Auto-Test System and method Download PDFInfo
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- CN109120264A CN109120264A CN201810847080.2A CN201810847080A CN109120264A CN 109120264 A CN109120264 A CN 109120264A CN 201810847080 A CN201810847080 A CN 201810847080A CN 109120264 A CN109120264 A CN 109120264A
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/109—Measuring or testing for dc performance, i.e. static testing
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/1095—Measuring or testing for ac performance, i.e. dynamic testing
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Abstract
A kind of girz analog-digital converter Auto-Test System and method, the test macro specifically include that DC power supply analyzer, two signal sources, signal source, clock source, switch filter group, logic analyser, SPI control module, test evaluation board, interchanger, testing service device, display, cabinet.SPI control module is connected to testing service device by USB line, is placed in cabinet after each virtual instrument, testing service device are connected to interchanger by LAN bus.Control and converter population parameter characteristic evaluation of the upper computer software completion to virtual instrument, module are write based on TestStand and LabView, test result is saved and is shown to display, the final automatic test for realizing girz analog-digital converter.The present invention can simplify testing process, and the quantity of parameter can be surveyed by increasing girz analog-digital converter, improve testing efficiency, reduce testing system software maintenance cost, meanwhile, which has good compatibility and flexibility.
Description
Technical field
The present invention relates to a kind of girz analog-digital converter Auto-Test System and methods, belong to analog-digital converter technology neck
Domain.
Background technique
Girz analog-digital converter is widely used in the fields such as guided missile, satellite, aerospace, civilian consumer electronics.With
The continuous improvement of converter product performance index proposes requirement to testing reliability and testing efficiency.For these demands, industry
Interior many companies are using automated test device (ATE) come the performance indicator of rapid evaluation converter.
However, ATE equipment testing cost is expensive and needs for different classes of girz analog-digital converter product specific aim
Exploitation testing system software, it is difficult to meet the Function Extension during actual test, the demands such as test parameter increases, influence to produce
The testing efficiency of product.It is therefore desirable to a kind of stronger girz analog-digital converter Auto-Test System of scalability.
Summary of the invention
Technology of the invention solves the problems, such as are as follows: overcome the deficiencies of the prior art and provide a kind of girz analog-digital converter from
The population parameter test of girz converter can be rapidly completed in dynamic test macro and method, and testing efficiency is high, good reliability, easily
Extension.
Technical solution of the invention are as follows:
A kind of girz analog-digital converter Auto-Test System, comprising: DC power supply analyzer, clock source, is patrolled at signal source
Collect analyzer, SPI control module, test evaluation board and testing service device；
Girz analog-digital converter chip to be measured is placed in test evaluation board, and DC power supply analyzer is test evaluation board
Power supply, clock source provide work clock for the girz analog-digital converter chip, and signal source generates analog signal, passes through switch
Input signal after the filtering of filter group as girz analog-digital converter chip to be measured；
Girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, and formation digital signal is simultaneously defeated
It is acquired out to logic analyser, is sent into testing service device and the digital signal is handled；
Testing service device controls the operating mode of girz analog-digital converter chip to be measured by SPI control module, and
The working condition of girz analog-digital converter chip to be measured is monitored.
It further include switch filter group, setting is between signal source and test assessment partitioned signal input, according to input signal
The adjustment of frequency generates feedback signal, and then adjusts the frequency point of switch filter group, filter out in signal unnecessary each time it is humorous
Wave.
It further include interchanger, DC power supply analyzer, signal source, clock source, logic analyser and testing service device are equal
Information exchange is carried out by interchanger.
DC power supply analyzer includes multiple channels, provides the analog power and digital power of different voltages value respectively, together
When complete voltage and current monitoring.
Signal source and clock source frequency are coincidence frequency.
The operating mode of the girz analog-digital converter chip to be measured includes DES mode, non-DES mode, Demux mould
Formula and non-Demux mode.
Test evaluation board includes that power unit, analog signal importation, clock signal input part, test bench, SPI connect
Oral area point, digital signal output par, c and temperature-controlled portion；
Girz analog-digital converter chip to be measured is placed in test bench, and power unit receives DC power supply analyzer
Voltage signal provides analog power and digital power for girz analog-digital converter chip to be measured；Clock portion is divided into the gigahertz (GHZ)
Hereby analog-digital converter chip provides work clock；Analog signal importation receive by switch filter group filter after as to
The input signal of the girz analog-digital converter chip of survey；
Girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, forms digital signal and passes through
Digital signal output par, c is exported to be acquired to logic analyser, be sent into testing service device to the digital signal at
Reason；
SPI control module is partially completed the reading to girz analog-digital converter chip register to be measured by SPI interface
Write operation；
Temperature-controlled portion is completed by the way that girz analog-digital converter chip temperature to be measured is adjusted to gigahertz (GHZ) to be measured
Hereby analog-digital converter chip high/low temperature controls.
The testing service device controls the Working mould of girz analog-digital converter chip to be measured by SPI control module
Formula, and the working condition of girz analog-digital converter chip to be measured is monitored, specifically:
(1) SPI control module and testing service device establish connection, select communication port；
(2) rate communicated between SPI control module and testing service device is selected；
(3) SPI control module receives the instruction of testing service device；
(4) after receiving the instruction of testing service device, SPI control module sends read-write register and instructs to girz to be measured
Analog-digital converter chip is completed by the write operation to girz analog-digital converter chip register to be measured to operating mode
Change；
(5) SPI control module is to be measured by reading girz analog-digital converter chip register value real-time monitoring to be measured
Girz analog-digital converter chip working condition and interior nuclear temperature, and be supplied to testing service device.
The collected digital signal of logic analyser is sent into testing service device and is handled, specifically:
It is dynamic that FFT transform completion girz analog-digital converter chip to be measured is carried out to the digital signal of logic analyser acquisition
State parameter testing；
Histogram analysis is carried out to the digital signal of logic analyser acquisition and completes girz analog-digital converter core to be measured
The test of piece static parameter.
The dynamic parameter include number of significant digit ENOB, signal noise distortion than SINAD, spurious-free dynamic range SFDR,
Total harmonic distortion THD and Signal to Noise Ratio (SNR), the static parameter include integral non-linear error INL and differential nonlinearity error
DNL。
A kind of girz analog-digital converter automatic test approach, steps are as follows:
(1) DC power supply analyzer, signal source, clock source, logic analyser, SPI control module are initialized；
(2) girz analog-digital converter chip to be measured is placed in test evaluation board, and DC power supply analyzer is that test is commented
Estimate plate power supply, clock source provides work clock for the girz analog-digital converter chip, and signal source generates analog signal, passes through
Input signal after the filtering of switch filter group as girz analog-digital converter chip to be measured；
(3) girz analog-digital converter chip reference source output voltage to be measured is tested, if voltage value is in preset range
It is interior, into next step；If directly exiting test not in range；
(4) the DC parameter of girz analog-digital converter chip to be measured is tested；
(5) girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, forms digital signal
And export and be acquired to logic analyser, it is sent into testing service device and the digital signal is handled；
(6) FFT transform is carried out to the digital signal of logic analyser acquisition and completes girz analog-digital converter core to be measured
Piece dynamic parametric test；
(7) histogram analysis is carried out to the digital signal of logic analyser acquisition and completes girz analog-digital converter to be measured
The test of chip static parameter；
(8) test result of girz analog-digital converter chip to be measured is recorded into testing service device and joins key
Digital display is shown in display, completes the test to girz analog-digital converter chip to be measured.
Compared with prior art, the beneficial effects of the present invention are:
1, test process automation of the present invention greatly improves production test efficiency, to meet batch production requirements；
2, the present invention increases parameter and replacement cycle tests is easier, and is suitable for the girz analog-to-digital conversion of different model
Device test reduces overlapping development work.
Detailed description of the invention
Fig. 1 is girz analog-digital converter Auto-Test System block diagram；
Fig. 2 is test method flow chart；
Fig. 3 is SPI control module flow chart；
Fig. 4 is test cabinet layout.
Specific embodiment
Further detailed description is done to the present invention with specific example with reference to the accompanying drawing:
As shown in Figure 1, the invention proposes a kind of girz analog-digital converter Auto-Test Systems, comprising: DC power supply
Analyzer, signal source, clock source, logic analyser, SPI control module, test evaluation board and testing service device；
Girz analog-digital converter chip to be measured is placed in test evaluation board, and DC power supply analyzer is test evaluation board
Power supply, clock source provide work clock for the girz analog-digital converter chip, and signal source generates analog signal, passes through switch
Input signal after the filtering of filter group as girz analog-digital converter chip to be measured；
Girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, and formation digital signal is simultaneously defeated
It is acquired out to logic analyser, is sent into testing service device and the digital signal is handled；
Testing service device controls the operating mode of girz analog-digital converter chip to be measured by SPI control module, and
The working condition of girz analog-digital converter chip to be measured is monitored.
As shown in Figure 1, analog-digital converter Auto-Test System proposed by the present invention further includes switch filter group, setting exists
Between signal source and test assessment partitioned signal input, feedback signal is generated according to the adjustment of frequency input signal, and then adjust and open
The frequency point for closing filter group, filters out unnecessary each harmonic in signal, improves the degree of purity of signal.
Further, which further includes interchanger, DC power supply analyzer, signal source, clock source, logic analyser
And testing service device passes through interchanger and carries out information exchange.Each equipment is connected to interchanger by LAN bus.
DC power supply analyzer includes multiple channels, provides the analog power and digital power of different voltages value respectively, together
When complete voltage and current monitoring, have the output voltage of the adjustable output of Sense terminals to load end；It is provided simultaneously with
High-accuracy voltage table, electric current table function.
Clock source shake is smaller, can satisfy the requirement of girz converter work clock jittering characteristic.Signal source and when
Clock source frequency is coincidence frequency.Avoid occurring spectrum leakage in sampling process；The amplitude and frequency of signal source and clock source can be with
According to the frequency adjust automatically of input signal.
The operating mode of girz analog-digital converter chip to be measured include DES mode, non-DES mode, Demux mode with
And non-Demux mode.
Test evaluation board in test macro of the present invention includes that power unit, analog signal importation, clock signal are defeated
Enter part, test bench, SPI interface part, digital signal output par, c and temperature-controlled portion；
Girz analog-digital converter chip to be measured is placed in test bench, and power unit receives DC power supply analyzer
Voltage signal provides analog power and digital power for girz analog-digital converter chip to be measured；Clock portion is divided into the gigahertz (GHZ)
Hereby analog-digital converter chip provides work clock；Analog signal importation receive by switch filter group filter after as to
The input signal of the girz analog-digital converter chip of survey；
Girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, forms digital signal and passes through
Digital signal output par, c is exported to be acquired to logic analyser, be sent into testing service device to the digital signal at
Reason；
SPI control module is partially completed the reading to girz analog-digital converter chip register to be measured by SPI interface
Write operation；Temperature-controlled portion is completed by the way that girz analog-digital converter chip temperature to be measured is adjusted to gigahertz (GHZ) to be measured
Hereby analog-digital converter chip high/low temperature controls, and facilitates and completes converter the high and low temperature test.
SPI control module of the invention can be realized in the following way, using the development board Arduino of open source
UNO connects USB interface with testing service device machine according to USB data transmission agreement and testing service device realization both-way communication,
It can be simultaneously Arduino UNO system power supply.By usb data signal via being converted to serial line interface after the conversion chip in module
Data are sent to converter.
As shown in figure 3, testing service device controls the work of girz analog-digital converter chip to be measured by SPI control module
Operation mode, and the working condition of girz analog-digital converter chip to be measured is monitored, specifically:
(1) SPI control module and testing service device establish connection, select communication port；
(2) rate communicated between SPI control module and testing service device is selected；
(3) SPI control module receives the instruction of testing service device；
(4) after receiving the instruction of testing service device, SPI control module sends read-write register and instructs to girz to be measured
Analog-digital converter chip is completed by the write operation to girz analog-digital converter chip register to be measured to operating mode
Change；
(5) SPI control module is to be measured by reading girz analog-digital converter chip register value real-time monitoring to be measured
Girz analog-digital converter chip working condition and interior nuclear temperature, and be supplied to testing service device.
The collected digital signal of logic analyser is sent into testing service device and is handled, specifically:
It is dynamic that FFT transform completion girz analog-digital converter chip to be measured is carried out to the digital signal of logic analyser acquisition
State parameter testing；
Histogram analysis is carried out to the digital signal of logic analyser acquisition and completes girz analog-digital converter core to be measured
The test of piece static parameter.Dynamic parameter includes number of significant digit ENOB, signal noise distortion than SINAD, spurious-free dynamic range
SFDR, total harmonic distortion THD and Signal to Noise Ratio (SNR), the static parameter include integral non-linear error INL and differential nonlinearity
Error DNL.
As shown in Fig. 2, being based on above-mentioned analog-to-digital conversion Auto-Test System, the present invention also proposes a kind of girz analog-to-digital conversion
Device automatic test approach, steps are as follows:
(1) DC power supply analyzer, signal source, clock source, logic analyser, SPI control module are initialized；
(2) girz analog-digital converter chip to be measured is placed in test evaluation board, and DC power supply analyzer is that test is commented
Estimate plate power supply, clock source provides work clock for the girz analog-digital converter chip, and signal source generates analog signal, passes through
Input signal after the filtering of switch filter group as girz analog-digital converter chip to be measured；
(3) girz analog-digital converter chip reference source output voltage to be measured is tested, if voltage value is in preset range
It is interior, into next step；If directly exiting test not in range；
(4) the DC parameter of girz analog-digital converter chip to be measured is tested；
(5) girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, forms digital signal
And export and be acquired to logic analyser, it is sent into testing service device and the digital signal is handled；
(6) FFT transform is carried out to the digital signal of logic analyser acquisition and completes girz analog-digital converter core to be measured
Piece dynamic parametric test；
(7) histogram analysis is carried out to the digital signal of logic analyser acquisition and completes girz analog-digital converter to be measured
The test of chip static parameter；
(8) test result of girz analog-digital converter chip to be measured is recorded into testing service device and joins key
Digital display is shown in display, completes the test to girz analog-digital converter chip to be measured.
The embodiment that the present invention provides is as shown in figure 4, all appts equipment, module, testing service device, display pass through collection
It is all orderly placed in cabinet after, guarantees that test macro longtime running is reliable and stable.
Embodiment:
12 1GSPS analog-digital converters are tested in use for laboratory system and method for the invention, test process is as follows:
Such as Fig. 1 connecting test system, 12 1GSPS analog-digital converter chip to be measured is placed in test evaluation board, 4 tunnels
The power supply of 1.9V is converter power supply by test evaluation board, when clock source provides 1GHz work for analog-digital converter chip
Clock, signal source generate analog signal, as girz analog-digital converter chip to be measured after being filtered by switch filter group
Input signal；Girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, forms digital signal simultaneously
It exports and is acquired to logic analyser, be sent into testing service device and the digital signal is handled；Testing service device passes through
SPI control module controls operating mode (the DES mode, non-DES mode, Demux mould of girz analog-digital converter chip to be measured
Formula and non-Demux mode), and the working condition of girz analog-digital converter chip to be measured is monitored.
Under different working modes change signal source generate analog signal frequency (100Mz, 248MHz, 498MHz,
998MHz), it completes to dynamic parameter (ENOB, SINAD, SFDR, THD, SNR), static parameter (INL, DNL), time parameter
Test, entire test process spends 1 point 30 seconds, and according to manual testing process, entire test process is up to a hour.Using
Auto-Test System test result and manual test system test result are suitable.
So the present invention compares the test method using manual test system, in the case where not influencing test result, greatly
Testing efficiency is improved greatly.
Disclosed above is only a specific embodiment of the invention, but the present invention is not limited to this, any this field
Technical staff can think variation, should all be within the scope of the present invention.
Claims (11)
1. a kind of girz analog-digital converter Auto-Test System, characterized by comprising: DC power supply analyzer, signal source,
Clock source, logic analyser, SPI control module, test evaluation board and testing service device；
Girz analog-digital converter chip to be measured is placed in test evaluation board, and DC power supply analyzer is that test evaluation board supplies
Electricity, clock source provide work clock for the girz analog-digital converter chip, and signal source generates analog signal, are filtered by switch
Input signal after the filtering of wave device group as girz analog-digital converter chip to be measured；
Girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, forms digital signal and exports and gives
Logic analyser is acquired, and is sent into testing service device and is handled the digital signal；
Testing service device controls the operating mode of girz analog-digital converter chip to be measured by SPI control module, and treats
The working condition of the girz analog-digital converter chip of survey is monitored.
2. a kind of girz analog-digital converter Auto-Test System according to claim 1, it is characterised in that: further include out
Filter group is closed, setting generates anti-between signal source and test assessment partitioned signal input according to the adjustment of frequency input signal
Feedback signal, and then the frequency point of switch filter group is adjusted, filter out unnecessary each harmonic in signal.
3. a kind of girz analog-digital converter Auto-Test System according to claim 1, it is characterised in that: further include handing over
It changes planes, DC power supply analyzer, signal source, clock source, logic analyser and testing service device pass through interchanger and carry out letter
Breath interaction.
4. a kind of girz analog-digital converter Auto-Test System described in any one of claim 1 to 3, feature exist
In: DC power supply analyzer includes multiple channels, provides the analog power and digital power of different voltages value respectively, is completed at the same time
The monitoring of voltage and current.
5. a kind of girz analog-digital converter Auto-Test System described in any one of claim 1 to 3, feature exist
In: signal source and clock source frequency be coincidence frequency.
6. a kind of girz analog-digital converter Auto-Test System described in any one of claim 1 to 3, feature exist
In: the operating mode of the girz analog-digital converter chip to be measured include DES mode, non-DES mode, Demux mode with
And non-Demux mode.
7. a kind of girz analog-digital converter Auto-Test System described in any one of claim 1 to 3, feature exist
In: test evaluation board includes power unit, analog signal importation, clock signal input part, test bench, SPI interface portion
Point, digital signal output par, c and temperature-controlled portion；
Girz analog-digital converter chip to be measured is placed in test bench, and power unit receives the voltage of DC power supply analyzer
Signal provides analog power and digital power for girz analog-digital converter chip to be measured；Clock portion is divided into the girz mould
Number converter chip provides work clock；Analog signal importation receives to be measured by being used as after the filtering of switch filter group
The input signal of girz analog-digital converter chip；
Girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, forms digital signal and passes through number
Segment signal output is exported to be acquired to logic analyser, is sent into testing service device and is handled the digital signal；
SPI control module is partially completed the behaviour of the read-write to girz analog-digital converter chip register to be measured by SPI interface
Make；
Temperature-controlled portion is completed by the way that girz analog-digital converter chip temperature to be measured is adjusted to girz mould to be measured
The control of number converter chip high/low temperature.
8. a kind of girz analog-digital converter Auto-Test System described in any one of claim 1 to 3, feature exist
The operating mode of girz analog-digital converter chip to be measured is controlled by SPI control module in: the testing service device, and right
The working condition of girz analog-digital converter chip to be measured is monitored, specifically:
(1) SPI control module and testing service device establish connection, select communication port；
(2) rate communicated between SPI control module and testing service device is selected；
(3) SPI control module receives the instruction of testing service device；
(4) after receiving the instruction of testing service device, SPI control module sends read-write register and instructs to girz modulus to be measured
Converter chip is completed to operating mode more by the write operation to girz analog-digital converter chip register to be measured
Change；
(5) SPI control module is by reading girz analog-digital converter chip register value real-time monitoring to be measured Ji to be measured
The working condition and interior nuclear temperature of hertz analog-digital converter chip, and it is supplied to testing service device.
9. a kind of girz analog-digital converter Auto-Test System described in any one of claim 1 to 3, feature exist
In: the collected digital signal of logic analyser is sent into testing service device and is handled, specifically:
FFT transform is carried out to the digital signal of logic analyser acquisition and completes girz analog-digital converter chip dynamic ginseng to be measured
Number test；
It is quiet that histogram analysis completion girz analog-digital converter chip to be measured is carried out to the digital signal of logic analyser acquisition
The test of state parameter.
10. a kind of girz analog-digital converter Auto-Test System according to claim 9, it is characterised in that: described dynamic
State parameter include number of significant digit ENOB, signal noise distortion than SINAD, spurious-free dynamic range SFDR, total harmonic distortion THD and
Signal to Noise Ratio (SNR), the static parameter include integral non-linear error INL and differential nonlinearity error DNL.
11. a kind of girz analog-digital converter automatic test approach realized based on test macro described in claim 1, feature
It is that steps are as follows:
(1) DC power supply analyzer, signal source, clock source, logic analyser, SPI control module are initialized；
(2) girz analog-digital converter chip to be measured is placed in test evaluation board, and DC power supply analyzer is test evaluation board
Power supply, clock source provide work clock for the girz analog-digital converter chip, and signal source generates analog signal, passes through switch
Input signal after the filtering of filter group as girz analog-digital converter chip to be measured；
(3) test girz analog-digital converter chip reference source output voltage to be measured, if voltage value in preset range, into
Enter next step；If directly exiting test not in range；
(4) the DC parameter of girz analog-digital converter chip to be measured is tested；
(5) girz analog-digital converter chip to be measured carries out analog-to-digital conversion to the input signal, and formation digital signal is simultaneously defeated
It is acquired out to logic analyser, is sent into testing service device and the digital signal is handled；
(6) FFT transform completion girz analog-digital converter chip to be measured is carried out to the digital signal of logic analyser acquisition to move
State parameter testing；
(7) histogram analysis is carried out to the digital signal of logic analyser acquisition and completes girz analog-digital converter chip to be measured
The test of static parameter；
(8) test result of girz analog-digital converter chip to be measured is recorded into testing service device and shows key parameter
It is shown in display, completes the test to girz analog-digital converter chip to be measured.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109962709A (en) * | 2019-03-27 | 2019-07-02 | 晶晨半导体(上海)股份有限公司 | The test method and system of analog-digital converter |
| CN110618373A (en) * | 2019-09-10 | 2019-12-27 | 中国科学院上海技术物理研究所 | Reconfigurable integrated circuit board level automatic test system and design method thereof |
| CN112880940A (en) * | 2021-01-08 | 2021-06-01 | 胜达克半导体科技(上海)有限公司 | Asynchronous frequency spectrum leakage suppression method for automatic test machine |
| CN114184941A (en) * | 2021-12-06 | 2022-03-15 | 中国电子科技集团公司第二十九研究所 | Test system and method for module containing ADC chip |
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