CN108709505B - Wide-range interference grating ruler and distance measurement method thereof - Google Patents

Wide-range interference grating ruler and distance measurement method thereof Download PDF

Info

Publication number
CN108709505B
CN108709505B CN201810764638.0A CN201810764638A CN108709505B CN 108709505 B CN108709505 B CN 108709505B CN 201810764638 A CN201810764638 A CN 201810764638A CN 108709505 B CN108709505 B CN 108709505B
Authority
CN
China
Prior art keywords
reading
grating
reading head
state
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201810764638.0A
Other languages
Chinese (zh)
Other versions
CN108709505A (en
Inventor
李星辉
肖翔
倪凯
周倩
袁伟涵
陆海鸥
曾理江
王晓浩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Graduate School Tsinghua University
Original Assignee
Shenzhen Graduate School Tsinghua University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Graduate School Tsinghua University filed Critical Shenzhen Graduate School Tsinghua University
Priority to CN201810764638.0A priority Critical patent/CN108709505B/en
Publication of CN108709505A publication Critical patent/CN108709505A/en
Application granted granted Critical
Publication of CN108709505B publication Critical patent/CN108709505B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention discloses a wide-range interference grating ruler and a distance measurement method thereof, wherein the wide-range interference grating ruler comprises a grating array and a double-reading-head system, the grating array is formed by splicing a plurality of grating units, and the double-reading-head system comprises a laser, a beam splitter, two reading heads and a data processing unit; the laser is used for emitting a laser beam, and the optical splitter is used for splitting the laser beam to obtain a first laser beam and a second laser beam which are projected to the grating array; the two reading heads respectively acquire real-time displacement readings corresponding to the first laser beam and the second laser beam; the data processing unit is used for carrying out data processing on the real-time displacement readings of the two reading heads to obtain actual displacement; wherein the data processing comprises: performing interval compensation and reading head state judgment according to respective real-time displacement readings of the single reading heads and the interval between the grating units; and calculating the actual displacement by utilizing the real-time displacement reading and the distance compensation result of the single reading head based on the state of the reading head.

Description

Wide-range interference grating ruler and distance measurement method thereof
Technical Field
The invention relates to the field of grating ranging, in particular to a method for realizing wide-range ranging by utilizing a spliced grating.
Background
The grating ruler is a tool for precise displacement measurement, is widely applied to the field of engineering technology scientific research, and has the advantages of high precision, strong anti-interference capability and the like because the measurement reference is the grating pitch of the grating. The grating ruler is divided into a Morel stripe grating ruler and an interference grating ruler according to the measurement principle, the cost of the Morel stripe grating ruler is low, and the precision of the interference grating ruler is high. The interference grating ruler requires good grating pitch consistency and high flatness of the grating surface, which makes the interference grating ruler with large measuring range difficult to process and high cost.
The above background disclosure is only for the purpose of assisting understanding of the inventive concept and technical solutions of the present invention, and does not necessarily belong to the prior art of the present patent application, and should not be used for evaluating the novelty and inventive step of the present application in the case that there is no clear evidence that the above content is disclosed before the filing date of the present patent application.
Disclosure of Invention
In order to solve the problems of high processing difficulty and high cost of the conventional large-range interference grating ruler, the invention provides a double-reading-head large-range interference grating ruler based on a spliced grating, and simultaneously provides a method for measuring distance by adopting the large-range interference grating ruler, so that the large-range incremental displacement measurement is realized, and the purpose of realizing high-precision large-range displacement measurement by using the low-cost spliced grating is achieved.
One of the technical solutions proposed by the present invention to achieve the above object is as follows:
a wide-range interference grating ruler comprises a grating array and a dual-reading head system, wherein the grating array is formed by splicing a plurality of grating units, and the dual-reading head system comprises a laser, a beam splitter, two reading heads and a data processing unit; the laser is used for emitting a laser beam, and the beam splitter is used for splitting the laser beam to obtain a first laser beam and a second laser beam which are used for projecting to the grating array; the two reading heads respectively obtain real-time displacement readings corresponding to the first laser beam and the second laser beam; the data processing unit is used for carrying out data processing on the real-time displacement readings of the two reading heads to obtain actual displacement; wherein the data processing comprises:
performing interval compensation and reading head state judgment according to respective real-time displacement readings of the single reading heads and the interval between the grating units; and calculating the actual displacement by utilizing the real-time displacement reading and the distance compensation result of the single reading head based on the state of the reading head.
Another embodiment of the present invention further provides a distance measuring method of the wide-range interferometric grating ruler, including the following steps:
when initializing, a first laser beam and a second laser beam corresponding to a reading head A and a reading head B are projected on the same grating unit, and the projection points are respectively marked as PA、PB(ii) a Wherein, a projection point PAAt PBLeft side;
the reading heads A and B move rightwards relative to the grating array simultaneously and keep fixed relative to the moving direction, and the reading X is read according to the real-time displacement of the reading heads A and B during the moving processA、XBJudging the state of the reading head;
recording the displacement reading difference value of the reading heads A and B in the moving process, and performing space compensation;
and calculating the actual displacement X by using the real-time displacement reading and the distance compensation result of the single reading head based on the state of the reading head.
Preferably, the reading X is read according to the real-time displacement of the reading heads A and BA、XBJudging the state of the reading head, specifically comprising:
obtaining real-time displacement readings X of reading head A and reading head BA、XBAnd calculating the difference (X) of the displacement readingsA-XB);
Separately solve for XA、XBAnd (X)A-XB) Derivative X ofA'、XB'、(XA-XB)';
When the reading head and the grating array move relatively, according to XA'、XB' and (X)A-XB) To judge the status of the reading head: first, an initial state is defined in which projection points P of the first and second laser beams respectively corresponding to the reading head A and the reading head B are projectedA、PBOn the same raster unit as the projection point PAAt PBOn the left and with readheads a and B simultaneously moving to the right relative to the grating array, readheads a and B will experience the following four states in sequence:
when X is presentA' No. 0 and XB' ≠ 0 and (X)A-XB) ' 0, and projects a point PAAnd PBWhen the grating units are positioned on the same grating unit,recording as state S1;
when X is presentA' No. 0 and XB' is 0 and (X)A-XB) When'' 0, point P is projectedBThe reading head B is interrupted in the interval area between the adjacent grating units, and the reading head A is in normal reading and is recorded as the state S2;
when X is presentA' No. 0 and XB' ≠ 0 and (X)A-XB) ' 0, and two projection points PAAnd PBWhen the two raster units are positioned on the adjacent raster units, the state is recorded as S3;
when X is presentA' 0 and XB' ≠ 0 and (X)A-XB) When' ≠ 0, point P is projectedAThe reading head A is interrupted and the reading head B is normally read and is recorded as a state S4 when the reading head A is positioned in the interval area between the adjacent grating units;
wherein, when XA' No. 0 and XB' ≠ 0 and (X)A-XB) And when the number and the direction of the two projection points passing through the interval area are counted, the two reading heads are judged to be in the state S1 or the state S3, and in the states S1 and S3, the two reading heads normally read.
Preferably, the algorithm process for performing the distance compensation includes:
during the relative movement of the grating array and the double-reading head in a constant relative movement direction, (X)A-XB) When the value is 0, namely every time the state S1 or the state S3, the difference value X of the double reading head is recorded in turnA-XB=δi1,2,3, …,2N-2, N being the number of grating elements constituting the grating array; in the state S1, δi=δ2k-1K 1,2,3, …, N-1, k indicating that read head B has passed k of said spaced regions; in the state S3, δi=δ2k
Preferably, the actual displacement X is calculated as follows:
Figure BDA0001728725820000031
wherein, S is S1, and S2 indicates that the status S of the reading head is S1 or S2; s3, S4 indicates that the status S of the readhead is either status S3 or status S4.
The wide-range interference grating ruler and the distance measuring method thereof can realize high-precision wide-range displacement measurement by using the spliced grating with low cost.
Drawings
FIG. 1 is a schematic diagram of a beam splitter of a wide-range interferometric grating scale in accordance with an embodiment of the present invention;
FIG. 2 is a schematic diagram of a dual-readhead system of a wide-range interferometric grating scale according to this invention.
Detailed Description
The invention is further described with reference to the following figures and detailed description of embodiments.
The specific implementation mode of the invention provides a wide-range interference grating ruler, which comprises a grating array and a double-reading head system, wherein the grating array is formed by splicing a plurality of grating units, and the double-reading head system comprises a laser, a beam splitter, two reading heads and a data processing unit; with reference to fig. 1 and 2, the laser is adapted to emit a laser beam L0A beam splitter BS for splitting the laser beam L0Splitting light to obtain a first laser beam L for projection onto the grating arrayAAnd a second laser beam LB(ii) a Two reading heads respectively obtain real-time displacement readings corresponding to the first laser beam and the second laser beam; the data processing unit is used for processing the real-time displacement readings read by the two reading heads to obtain actual displacement; wherein the data processing unit performs the following data processing:
performing interval compensation and reading head state judgment according to respective real-time displacement readings of the single reading heads and the interval between the grating units; and calculating the actual displacement by utilizing the real-time displacement reading and the distance compensation result of the single reading head based on the state of the reading head.
In one embodiment, the beam splitter is shown in FIG. 1 as a laser beam L0Is incident from one working surface of the spectroscope BS and then is divided into two beams of parallel laser LAAnd LBAnd (4) injecting. Preferably, the beam splitter isocanderically splits the laser beam LAAnd LBThe beam diameter is preferably 2 mm.
With continued reference to fig. 1, the beam splitter is a splitting prism, the direction of the incident light is parallel to the splitting plane and parallel to the top plane, and the incident light is incident on any side surface, and the incident point enables the first refracted light of the incident light to pass through the splitting plane before passing through other optical planes.
Referring to FIG. 2, in one particular embodiment, the two readheads of the dual readhead system are identical in principle and are symmetrical about the double mirror M, and are labeled A and B for ease of distinction. At the reading head A, a laser beam LAAfter the light is irradiated on the transmission grating G, two beams of diffracted light A1 and A2 are generated, the two beams of diffracted light are respectively reflected by the reflecting mirrors 11 and M and then are combined at the beam splitter 21, one part of the combined light generates an interference signal at the detector PA2, the other part of the combined light performs phase delay through the quarter-wave plate 31, an interference signal with 90-degree phase delay is generated at the detector PA1, and the displacement X of the reading head A can be calculated through the two interference signalsA. Similarly, at the reading head B, the laser beam LBAfter the two beams of diffracted light are irradiated on the transmission grating G, two beams of diffracted light B1 and B2 are generated, the two beams of diffracted light are respectively reflected by the reflecting mirrors 12 and M and then are combined at the beam splitter 22, one part of the combined light generates an interference signal at the detector PB2, the other part of the combined light performs phase delay through the quarter-wave plate 32, an interference signal with 90-degree phase delay is generated at the detector PB1, and the displacement X of the reading head B can be calculated through the two interference signalsB
In order to expand the measuring range, the invention adopts the grating array spliced by a plurality of grating units, because the spliced position is difficult to avoid gaps, if only one reading head is adopted to read the displacement, errors can exist certainly, the invention obtains the real-time displacement reading X of the two reading heads by the double-reading-head system shown in figure 2 based on the principleAAnd XBThen, the data processing program of the present invention is used to perform the following processing to obtain the actual displacement value, and the data processing is as follows:
1) firstly, judging the state of a reading head:
calculating a difference in readings (X)A-XB) Separately solving for XA、XBAnd (X)A-XB) Derivative X ofA'、XB'、(XA-XB) '; when the reading head and the grating array move relatively, according to XA'、XB' and (X)A-XB) To judge the status of the reading head: first, an initial state is defined in which projection points P of the first and second laser beams respectively corresponding to the reading head A and the reading head B are projectedA、PBOn the same raster unit as the projection point PAAt PBOn the left and with readheads a and B simultaneously moving to the right relative to the grating array, readheads a and B will experience the following four states in sequence:
when X is presentA' No. 0 and XB' ≠ 0 and (X)A-XB) ' 0, and points PA and P are projectedBWhen the two raster units are positioned on the same raster unit, the state is marked as S1;
when X is presentA' No. 0 and XB' is 0 and (X)A-XB) When'' 0, point P is projectedBThe reading head B is interrupted in the interval area between the adjacent grating units, and the reading head A is in normal reading and is recorded as the state S2;
when X is presentA' No. 0 and XB' ≠ 0 and (X)A-XB) ' 0, and two projection points PAAnd PB, when located on two adjacent grating elements, is recorded as state S3;
when X is presentA' 0 and XB' ≠ 0 and (X)A-XB) When' ≠ 0, the projection point PA is positioned in the interval area between the adjacent grating units, at the moment, the reading of the reading head A is interrupted, and the reading head B reads normally and is recorded as a state S4;
wherein, when XA' No. 0 and XB' ≠ 0 and (X)A-XB) And when the number and the direction of the two projection points passing through the interval area are counted, the two reading heads are judged to be in the state S1 or the state S3, and in the states S1 and S3, the two reading heads normally read.
2) Secondly, performing distance compensation:
during the relative movement of the grating array and the double-reading head in a constant relative movement direction, (X)A-XB) When the displacement difference X of the double reading head is sequentially recorded every time the state S1 or the state S3 is' 0A-XB=δi1,2,3, …,2N-2, N being the number of grating elements constituting the grating array; in the state S1, δi=δ2k-1K 1,2,3, …, N-1, k indicating that read head B has passed k of said spaced regions; in the state S3, δi=δ2k
3) Calculating the actual displacement X:
Figure BDA0001728725820000061
wherein, S is S1, and S2 indicates that the status S of the reading head is S1 or S2; s3, S4 indicates that the status S of the readhead is either status S3 or status S4.
According to the wide-range interference grating ruler provided by the preferred embodiment of the invention, the distance between adjacent grating units of the grating array is 0.1-1 mm, the length of each grating unit is 5-10 mm, the plurality of grating units are sequentially arranged in parallel along the length direction and spliced into the grating array, and the grid lines of the gratings are vertical to the arrangement direction. And the splicing of the plurality of gratings adopts photoetching splicing or mechanical splicing.
The photolithographic splicing comprises: and uniformly coating photoresist on the grating array substrate, and inlaying the photoetching latent image of the grating unit on the photoresist of the grating array substrate through multiple times of interference photoetching exposure according to the preset splicing requirement.
The mechanical splice comprises: firstly, grating units are manufactured on mutually independent grating substrates, and then the grating units are fixed on the whole grating array substrate according to the preset splicing requirement.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several equivalent substitutions or obvious modifications can be made without departing from the spirit of the invention, and all the properties or uses are considered to be within the scope of the invention.

Claims (6)

1. A wide-range interference grating scale is characterized in that: the grating array is formed by splicing a plurality of grating units, and the double-reading head system comprises a laser, a beam splitter, two reading heads and a data processing unit;
the laser is used for emitting a laser beam, and the beam splitter is used for splitting the laser beam to obtain a first laser beam and a second laser beam which are used for projecting to the grating array;
the two reading heads respectively obtain real-time displacement readings corresponding to the first laser beam and the second laser beam;
the data processing unit is used for carrying out data processing on the real-time displacement readings of the two reading heads to obtain actual displacement;
wherein the data processing comprises:
performing space compensation and state judgment of the reading head according to the real-time displacement reading of the reading head A, the real-time displacement reading of the reading head B and the space between the grating units;
calculating the actual displacement by using the real-time displacement reading and the spacing compensation result of the single reading head based on the state of the reading head;
the reading head state judgment specifically comprises the following steps:
obtaining real-time displacement readings X of reading head A and reading head BA、XBAnd calculating a difference value (X) of the readingsA-XB);
Separately solve for XA、XBAnd (X)A-XB) Derivative X ofA'、XB'、(XA-XB)';
When the reading head and the grating array move relatively, according to XA'、XB' and (X)A-XB) To judge the status of the reading head: first, an initial state is defined in which projection points P of the first and second laser beams respectively corresponding to the reading head A and the reading head B are projectedA、PBOn the same raster unit as the projection point PAAt PBOn the left and with readheads a and B simultaneously moving to the right relative to the grating array, readheads a and B will experience the following four states in sequence:
when X is presentA' No. 0 and XB' ≠ 0 and (X)A-XB) ' 0, and projects a point PAAnd PBWhen the two raster units are positioned on the same raster unit, the state is marked as S1;
when X is presentA' No. 0 and XB' is 0 and (X)A-XB) When'' 0, point P is projectedBThe reading head B is interrupted in the interval area between the adjacent grating units, and the reading head A is in normal reading and is recorded as the state S2;
when X is presentA' No. 0 and XB' ≠ 0 and (X)A-XB) ' 0, and two projection points PAAnd PBWhen the two raster units are positioned on the adjacent raster units, the state is recorded as S3;
when X is presentA' 0 and XB' ≠ 0 and (X)A-XB) When' ≠ 0, point P is projectedAThe reading head A is interrupted and the reading head B is normally read and is recorded as a state S4 when the reading head A is positioned in the interval area between the adjacent grating units;
wherein, when XA' No. 0 and XB' ≠ 0 and (X)A-XB) When the number and the direction of the two projection points passing through the interval area are counted, the two reading heads are judged to be in the state S1 or the state S3, and in the states S1 and S3, the two reading heads normally read;
the distance compensation specifically comprises:
during the relative movement of the grating array and the double-reading head in a constant relative movement direction, (X)A-XB) When the displacement difference X of the double reading head is sequentially recorded every time the state S1 or the state S3 is' 0A-XB=δiI-1, 2,3, …,2N-2, N being the light constituting the grating arrayThe number of gate cells;
in the state S1, δi=δ2k-1K is 1,2,3, …, N-1, k indicating that read head B has passed k of said spaced regions; in the state S3, δi=δ2k
Calculating the actual displacement X:
Figure FDA0002482821960000021
wherein, S is S1, and S2 indicates that the status S of the reading head is S1 or S2; s3, S4 indicates that the status S of the readhead is either status S3 or status S4.
2. The wide-range interferometric grating scale of claim 1, wherein: the distance between adjacent grating units of the grating array is 0.1-1 mm, the length of each grating unit is 5-10 mm, the grating units are sequentially arranged in parallel along the length direction and spliced into the grating array, and grid lines of the gratings are perpendicular to the arrangement direction.
3. The wide-range interferometric grating scale of claim 2, wherein: and the splicing of the plurality of gratings adopts photoetching splicing or mechanical splicing.
4. A wide-range interferometric grating scale as claimed in claim 3, characterized in that: the photolithographic splicing comprises: and uniformly coating photoresist on the grating array substrate, and inlaying the photoetching latent image of the grating unit on the photoresist of the grating array substrate through multiple times of interference photoetching exposure according to the preset splicing requirement.
5. A wide-range interferometric grating scale as claimed in claim 3, characterized in that: the mechanical splice comprises: firstly, grating units are manufactured on mutually independent grating substrates, and then the grating units are fixed on the whole grating array substrate according to the preset splicing requirement.
6. The method for measuring distance of a wide-range interferometric grating scale as claimed in claim 1, comprising the steps of:
when initializing, a first laser beam and a second laser beam corresponding to a reading head A and a reading head B are projected on the same grating unit, and the projection points are respectively marked as PA、PB(ii) a Wherein, a projection point PAAt PBLeft side;
the reading heads A and B move rightwards relative to the grating array simultaneously and keep fixed relative to the moving direction, and the reading X is read according to the real-time displacement of the reading heads A and B during the moving processA、XBJudging the state of the reading head;
recording the displacement reading difference value of the reading heads A and B in the moving process, and performing space compensation;
calculating the actual displacement X by utilizing the real-time displacement reading and the spacing compensation result of the single reading head based on the state of the reading head;
real-time displacement reading X according to reading heads A and BA、XBJudging the state of the reading head, specifically comprising:
obtaining real-time displacement readings X of reading head A and reading head BA、XBAnd calculating the difference (X) of the displacement readingsA-XB);
Separately solve for XA、XBAnd (X)A-XB) Derivative X ofA'、XB'、(XA-XB)';
When the reading head and the grating array move relatively, according to XA'、XB' and (X)A-XB) To judge the status of the reading head: first, an initial state is defined in which projection points P of the first and second laser beams respectively corresponding to the reading head A and the reading head B are projectedA、PBOn the same raster unit as the projection point PAAt PBOn the left and with readheads a and B simultaneously moving to the right relative to the grating array, readheads a and B will experience the following four states in sequence:
when X is presentA' No. 0 and XB' ≠ 0 and (X)A-XB) ' 0, and projects a point PAAnd PBWhen the two raster units are positioned on the same raster unit, the state is marked as S1;
when X is presentA' No. 0 and XB' is 0 and (X)A-XB) When'' 0, point P is projectedBThe reading head B is interrupted in the interval area between the adjacent grating units, and the reading head A is in normal reading and is recorded as the state S2;
when X is presentA' No. 0 and XB' ≠ 0 and (X)A-XB) ' 0, and two projection points PAAnd PBWhen the two raster units are positioned on the adjacent raster units, the state is recorded as S3;
when X is presentA' 0 and XB' ≠ 0 and (X)A-XB) When' ≠ 0, point P is projectedAThe reading head A is interrupted and the reading head B is normally read and is recorded as a state S4 when the reading head A is positioned in the interval area between the adjacent grating units;
wherein, when XA' No. 0 and XB' ≠ 0 and (X)A-XB) When the number and the direction of the two projection points passing through the interval area are counted, the two reading heads are judged to be in the state S1 or the state S3, and in the states S1 and S3, the two reading heads normally read;
the algorithm process for performing the distance compensation comprises the following steps:
during the relative movement of the grating array and the double-reading head in a constant relative movement direction, (X)A-XB) When the value is 0, namely every time the state S1 or the state S3, the difference value X of the double reading head is recorded in turnA-XB=δi1,2,3, …,2N-2, N being the number of grating elements constituting the grating array;
in the state S1, δi=δ2k-1K is 1,2,3, …, N-1, k indicating that read head B has passed k of said spaced regions; in the state S3, δi=δ2k
The calculation formula of the actual displacement X is as follows:
Figure FDA0002482821960000041
wherein, S is S1, and S2 indicates that the status S of the reading head is S1 or S2; s3, S4 indicates that the status S of the readhead is either status S3 or status S4.
CN201810764638.0A 2018-07-12 2018-07-12 Wide-range interference grating ruler and distance measurement method thereof Active CN108709505B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810764638.0A CN108709505B (en) 2018-07-12 2018-07-12 Wide-range interference grating ruler and distance measurement method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810764638.0A CN108709505B (en) 2018-07-12 2018-07-12 Wide-range interference grating ruler and distance measurement method thereof

Publications (2)

Publication Number Publication Date
CN108709505A CN108709505A (en) 2018-10-26
CN108709505B true CN108709505B (en) 2020-07-03

Family

ID=63874968

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810764638.0A Active CN108709505B (en) 2018-07-12 2018-07-12 Wide-range interference grating ruler and distance measurement method thereof

Country Status (1)

Country Link
CN (1) CN108709505B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112835270B (en) * 2021-01-19 2024-02-09 上海集成电路装备材料产业创新中心有限公司 Rotary measurement and control device of rotary platform

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107152904A (en) * 2016-03-02 2017-09-12 深圳市祈飞科技有限公司 A kind of magnetic railings ruler digital readout system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100371682C (en) * 2002-12-09 2008-02-27 中国科学院光电技术研究所 Elongation method for long grating sensor
JP2006153770A (en) * 2004-11-30 2006-06-15 Omron Corp Spectral measurement apparatus
CN204631441U (en) * 2015-05-21 2015-09-09 浙江大学 Synchrotron radiation large area is utilized to prepare the device of color filter fast
EP3371546A4 (en) * 2015-11-06 2019-05-08 AP Robotics, LLC Interferometric distance measurement based on compression of chirped interferogram from cross-chirped interference
CN106524921B (en) * 2016-11-05 2019-09-06 中北大学 A kind of high precision and large measuring range double-layer nanometer grating micro-displacement detection device
CN107462166B (en) * 2017-08-24 2019-10-15 中国科学院长春光学精密机械与物理研究所 Long stroke, high precision displacement measurement method based on diffraction grating

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107152904A (en) * 2016-03-02 2017-09-12 深圳市祈飞科技有限公司 A kind of magnetic railings ruler digital readout system

Also Published As

Publication number Publication date
CN108709505A (en) 2018-10-26

Similar Documents

Publication Publication Date Title
US9360347B2 (en) Two-dimensional encoder system and method
WO2020216325A1 (en) Displacement measuring apparatus, displacement measuring method and photolithography device
JP2603305B2 (en) Displacement measuring device
US8149420B2 (en) Interferometer calibration system and method
EP2284479B1 (en) Grazing incidence interferometer
CN100405003C (en) Method and apparatus for correcting conversion coefficient of stripe gauging device and stripe gauging device
CN108709505B (en) Wide-range interference grating ruler and distance measurement method thereof
Shishova et al. Mathematical modeling of signal transfer process into optical system of a linear displacement encoder
CN104142123B (en) It is applied to the Three Degree Of Freedom laser measurement system of plant equipment geometric error measurement
CN111043991A (en) Straightness measuring interferometer system without nonlinear error and measuring method
CN110837213B (en) Phase measurement device for laser interference lithography system and using method thereof
US7545507B2 (en) Displacement measurement system
US7187451B2 (en) Apparatus for measuring two-dimensional displacement
JPH03146822A (en) Encoder
US11353583B2 (en) Optical position-measurement device with varying focal length along a transverse direction
US7184149B2 (en) Methods and apparatus for reducing error in interferometric imaging measurements
CN110864640A (en) Optical system and method for measuring object strain by using photosensitive camera
JP2003194523A (en) Length measuring apparatus
KR100686923B1 (en) Phase-shifting Method Using Waveplates in Shearography and System for Measuring Deformation Using The Same
JP2015127661A (en) Displacement measuring apparatus
JPH0273118A (en) Two-dimensional displacement detector
US7924433B2 (en) Displacement measurement system and method of use
WO2022052197A1 (en) Picometer ruler
JP3124972B2 (en) Linear encoder
JPH01282422A (en) Linear scale and linear encoder

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant