CN108241078B - 垂直探针卡 - Google Patents

垂直探针卡 Download PDF

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CN108241078B
CN108241078B CN201710352127.3A CN201710352127A CN108241078B CN 108241078 B CN108241078 B CN 108241078B CN 201710352127 A CN201710352127 A CN 201710352127A CN 108241078 B CN108241078 B CN 108241078B
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probe
hole
pcb
seat
protruding portion
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CN108241078A (zh
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殷岚勇
施元军
刘凯
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Twinsolution Technology (suzhou) Ltd
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Priority to US16/314,902 priority patent/US10884026B2/en
Priority to PCT/CN2017/109587 priority patent/WO2018209901A1/zh
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
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    • G01R1/06733Geometry aspects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06772High frequency probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889Interfaces, e.g. between probe and tester
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • H05K1/111Pads for surface mounting, e.g. lay-out
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    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/182Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755Material aspects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007Types of components
    • H05K2201/10151Sensor

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Abstract

本发明实施例提供一种垂直探针卡,包括:PCB板、盖板及探针,PCB板上设有底孔及PCB焊盘,盖板上设有盖孔,盖板设置在PCB板上,且盖孔与底孔同轴对应设置,探针容置盖孔与底孔内,其中探针包括探头,探头伸出至盖板外,用于与芯片接触,探针中部设置有一突出部,与PCB焊盘接触,探头至突出部之间的探针为导体,由于探头至突出部之间的距离小于探针体的长度,使得信号不需要通过整个探针体的长度进行传输,缩短的信号传输距离,从而减少探针传输过程中的信号损失,特别适用于高频信号传输。

Description

垂直探针卡
技术领域
本发明涉及一种垂直探针卡,特别涉及一种高频测试的垂直探针卡。
背景技术
在对合格的芯片封装前,通常要实行电特性检测(Electricaldiesorting:EDS),依据EDS检测结果,对合格芯片才可进行封装。而这种EDS检测,是由内装有各种测量软件和检测仪器的检测机(TESTER)及装载有探针卡的探针台(Proberstation)来实现的。在检测时,探针卡的每一个探针与半导体芯片PAD直接接触,实现半导体晶圆中的芯片PAD及检测机(TESTER)电连接,从而实现对半导体芯片的电特性检测目的,通常的垂直探针卡,包括测试头及PCB。其中测试头包括,测试头上盖板,测试头下盖板和探针组成.探针放在测试头上盖板和测试头下盖板中,测试时,测试针的上端和下端分别接触芯片PAD和PCB(printedcircuitboard:PCB)PAD,从而实现信号的导通,此过程中信号通过测试针传输,但是由于测试针本身的电阻或电感会造成信号的损耗,从而影响测试的精度,特别是在高频测试中信号衰减更大,测试受限。
发明内容
因此,有必要提供一种垂直探针卡以解决上述技术问题。
一种垂直探针卡,包括:PCB板、盖板及探针,所述的PCB板包括底孔及围设在底孔周边的PCB焊盘,所述的盖板包括盖孔,所述的盖板设置在PCB板上,且所述的盖孔与所述的底孔同轴对应设置,所述的底孔与盖孔形成容置空间,所述的探针容置在所述容置空间中,所述的探针包括探头,所述的探头穿过盖孔伸出至盖板外,用于与芯片接触,所述的探针中部设置有一突出部,所述的突出部与所述的PCB焊盘接触,且所述的探头至与所述的突出部之间的探针为导体,所述的探头与突出部之间的距离小于等于探针长度的1/2,所述的底孔的直径应小于突出部的外径,所述的盖孔的最小孔径应小于突出部的外径,所述的突出部的外径小于等于焊盘外径,所述的探针包括探杆及探针座,所述的探针座包括容纳空间,所述的探杆容置在容纳空间内,一弹性元件设置在探杆与探针座之间,并且预设所述探杆向远离探针座方向运动的张力,所述的探针座包括帽体及座体,所述探杆与帽体保持接触,所述的帽体与所述的座体可拆卸连接,所述的突出部设置在所述的帽体上,且所述的突出部呈环状,在突出部对应的帽体内侧设置有内螺纹,所述的座体朝向帽体的一端设置有外螺纹,所述的帽体与所述的座体螺纹连接,所述的帽体为导体,所述的弹性元件为绝缘体,所述的座体为绝缘体,所述的盖板与PCB板之间还设置有定位装置,所述的定位装置包括设置在盖板上的定位孔及设置在PCB板上的定位柱,所述的定位柱与定位孔相匹配。
有益效果:本发明实施例提供一种垂直探针卡,包括:PCB板、盖板及探针,PCB板上设有底孔及PCB焊盘,盖板上设有盖孔,盖板设置在PCB板上,且盖孔与底孔同轴对应设置,探针容置盖孔与底孔内,其中探针包括探头,探头伸出至盖板外,用于与芯片接触,探针中部设置有一突出部,与PCB焊盘接触,探头至突出部之间的探针为导体,由于探头至突出部之间的距离小于探针体的长度,使得信号不需要通过整个探针体的长度进行传输,缩短的信号传输距离,从而减少探针传输过程中的信号损失,特别适用于高频信号传输。
附图说明
图1本发明实施例提供的垂直探针卡立体结构示意图;
图2为图1的***分解图;
图3为图1中G-G截面示意图;
图4为图3中A区放大示意图;
图5为垂直探针卡PCB上底孔上视图。
主要元件符号说明:
PCB板10、底孔11、PCB焊盘12、定位柱13、连接件14,23、盖板20、盖孔21、定位孔22,51、探针30、探杆31、探头311、探针座320、帽体32、突出部321、座体33、弹性元件34、芯片40、芯片焊盘41、托板50。
如下具体实施方式将结合上述附图进一步说明本发明。
具体实施方式
请参考图1-图5,本发明提供一种垂直探针卡,用于在对合格的芯片进行封装前,对芯片进行电特性检测(Electricaldiesorting:EDS)。所述的垂直探针卡,包括:PCB板10、盖板20及探针30。
所述的PCB板10,包括基板,所述的基板上设置有底孔11及围设在底孔11周边的PCB焊盘12,可以理解的,所述的基板可以为现有技术中的各种PCB基板,通常这些基板为绝缘材料,具体的,所述的基板为电木板、玻璃纤维板,以及各式的塑胶板中的一种。在其他一些实施方式中,所述的基板也可以为多层材料的复合板,如以玻璃纤维、不织物料、以及树脂层叠成的板状材料。
可以理解的,所述的基板表面还设置有与所述的PCB焊盘12连接的导线,以及在导线上覆盖有保护膜,通常的所述的保护膜为防焊油墨层,以防止焊料等杂物导致导线之间的意外接通,所述的防焊油墨层覆盖在除PCB焊盘12以外的全部基板表面,为了便于在底孔11中安装探针30,所述的底孔11直径为0.1mm-5mm,所述的PCB焊盘12直径应大于底孔11直径,优选的,所述的PCB焊盘12直径比底孔11直径大0.1mm-2mm。可以理解的,为了使探针30能与PCB焊盘12接触良好的接触,所述的PCB焊盘12为铜箔。进一步的,对所述的PCB焊盘12还可以进行表面处理,以防止PCB焊盘12表面氧化,所述的表面处理可以为喷锡,化金,化银,化锡,有机保焊剂处理等中的至少一种,所述的底孔11有多个,所述的多个底孔11在基板上阵列排布,可以理解的,所述的PCB焊盘12也在基板上阵列排布,所述的底孔11可以为根据实际需要设置成盲孔或通孔,优选的,所述的底孔11为通孔,以适应不同长度的探针30,所述的基板表面还设置有丝印,用于在基板表面上标注各零件的名称、位置框,方便组装后维修及辨识用。
所述的PCB板10上设置有盖板20,所述的盖板20上设置有盖孔21,所述的盖孔21贯通所述的盖板20,可以理解的,所述的盖孔21与所述的底孔11对应设置,且所述的盖孔21与所述的底孔11同轴,使得所述的盖孔21与底孔11形成一个容置空间,用于在容置空间内设置探针30。可以理解的,所述的盖孔21内壁为绝缘材料,以防止探针30与探针30之间导通,优选的,所述的盖板20为绝缘材料,当所述的底孔11在基板上呈阵列排布时,所述的盖孔21在盖板20上也呈阵列排布,所述的盖板20与所述的PCB板10可拆卸连接,所述的盖板20与所述的底板通过连接件14实现可拆卸连接,在本实施例中,所述的连接件14为多个螺栓,当然其他通常的可拆卸连接件14,如卡扣、螺钉也是可行的。
为了方便盖板20与PCB板10的连接定位,所述的盖板20与PCB板10之间还设置有定位装置,所述的定位装置包括设置在盖板20上的定位孔22及设置在PCB板10上的定位柱13,所述的定位孔22与所述定位柱13相匹配,用于当定位柱13***所述的定位孔22时,实现盖板20与PCB板10的定位。
所述的探针30容置在由所述底孔11与盖孔21形成的容置空间内,具体的,所述的探针30包括探针体,所述探针体呈一长杆状,所述探针体包括探头311,所述探头311穿过所述盖孔21并伸出至盖板20外,用于与芯片40接触,可以理解的,所述的探针体的至少一部分容置在底孔11中,用于固定探针30,所述的探针30中部设置有一突出部321,当探针30设置在容置空间内时,所述的突出部321与所述的PCB焊盘12接触,用于通过探头311与突出部321之间的探针体传输信号,可以理解的,探头311至突出部321之间探针体应为导体,由于探头311至突出部321之间的距离小于探针体的长度,使得信号不需要通过整个探针体的长度进行传输,缩短的信号传输距离,从而减少探针30传输过程中的信号损失。优选的,所述的探头311与突出部321之间的距离小于等于探针体长度的1/2,更优选的,所述的探头311与突出部321之间的距离小于等于探针体长度的1/3。当然,所述的探针体为均为导体也是可行的,具体的,所述的导体为金属、非金属导体,所述的金属导体可以为铜或铜合金、金或金合金、银或银合金等,所述的非金属为石墨等。
为了进一步减少信号传输损失,所述的探头311至突出部321之间的探针体采用低电阻的导体,优选的为金、铜制材料。
可以理解的,所述的芯片40上设置有芯片焊盘41,所述探头311用于与芯片焊盘41接触。
可以理解的,所述的底孔11的直径应小于突出部321的外径,以防止探针30落入到底孔11中,所述的盖孔21的最小孔径应小于突出部321的外径,以防止探针30通过盖孔21脱出,优选的,所述的盖孔21为锥孔,所述的突出部321或所述的探针30通过盖孔21的部分具有锥角,以使得探针30更好好的保持在底孔11与盖孔21之间。
所述的突出部321的外径应小于等于PCB焊盘12外径,以使得突出部321能与PCB焊盘12保持接触。优选的,所述的突出部321呈环状,套设在探针体上。
为了使得芯片40更好的保持与探头311的接触,所述的探针30包括探杆31及探针座320,所述的探针座320呈筒状,包括容纳空间,所述的探杆31容置在容纳空间内,所述的探头311设置在探杆31的一端,可以理解的,所述的探头311穿过所述的探针座320,露出于探针座320之外,一弹性元件34设置在探杆31与探针座320之间,并且预设所述探杆31向远离探针座320方向运动的张力,当需要对芯片40进行检测时,可以对芯片40施加一向下的压力,在弹性元件34张力的作用下,使得探头311与芯片焊盘41保持紧压,从而使得探头311与芯片焊盘41之间保持紧密接触。可以理解的,所述的弹性元件34可以为弹簧、橡胶垫、弹性丝等。
所述的探针座320包括帽体32及座体33,所述的帽体32与所述的座体33可拆卸连接,所述的帽体32呈一中空的管状,所述的座体33为一中空的桶状,所述的帽体32与所述座体33轴线共线,并形成探针座320的的容纳空间。可以理解的,所述的可拆卸连接可以为螺纹连接、卡扣连接等,当然所述的帽体32与座体33也可以是固定连接,如铆接、焊接或打点连接等,优选的,所述的帽体33与座体33一体成型。
所述的突出部321设置在所述的帽体32上,且所述的突出部321呈环状,在突出部321对应的帽体32内侧设置有内螺纹,所述的座体33朝向帽体32的一端设置有外螺纹,所述的帽体32与所述的座体33通过螺纹连接在一起。
可以理解的,所述的探杆31与所述的帽体32应保持接触,以使得信号能通过探杆31及帽体32,另一方面应使得探杆31能在容纳空间内活动,所述的探杆31的直径大致等于帽体32内径。优选的,所述的探杆31与所述的帽体32为铜或铜合金,金或金合金材料,以使得信号传输过程中损失较小,且耐磨。
所述的突出部321与所述的帽体32一体成型。
所述的帽体32为导体。
为了减少信号传输过程中的干扰,所述的弹性元件34为绝缘体,所述的座体33为绝缘体。
所述的PCB板10下方还设置有托板50,所述的托板50通常使用如金属材料、玻璃材料等高强度的刚性体,以加强PCB板10的强度,防止PCB板10在使用过程中发生变形。
可以理解的,所述的托板50与PCB板10之间还设置有连接件23,用于PCB板10与托板50的可拆卸连接,所述的连接件23可以为卡卡扣、螺栓、螺钉等,当然在PCB板10与托板50之间还设置有定位装置,所述的定位装置包括设置在PCB板10上的定位柱13及托板50上的定位孔51。
另外,本领域技术人员还可以在本发明精神内做其它变化,当然,这些依据本发明精神所做的变化,都应包含在本发明所要求保护的范围之内。

Claims (1)

1.一种垂直探针卡,包括:PCB板、盖板及探针,其特征在于,所述的PCB板包括底孔及围设在底孔周边的PCB焊盘,所述的盖板包括盖孔,所述的盖板设置在PCB板上,且所述的盖孔与所述的底孔同轴对应设置,所述的底孔与盖孔形成容置空间,所述的探针容置在所述容置空间中,所述的探针包括探头,所述的探头穿过盖孔伸出至盖板外,用于与芯片接触,所述的探针中部设置有一突出部,所述的突出部与所述的PCB焊盘接触,且所述的探头至与所述的突出部之间的探针为导体,所述的探头与突出部之间的距离小于等于探针长度的1/2,所述的底孔的直径应小于突出部的外径,所述的盖孔的最小孔径应小于突出部的外径,所述的突出部的外径小于等于焊盘外径,所述的探针包括探杆及探针座,所述的探针座包括容纳空间,所述的探杆容置在容纳空间内,一弹性元件设置在探杆与探针座之间,并且预设所述探杆向远离探针座方向运动的张力,所述的探针座包括帽体及座体,所述探杆与帽体保持接触,所述的帽体与所述的座体可拆卸连接,所述的突出部设置在所述的帽体上,且所述的突出部呈环状,在突出部对应的帽体内侧设置有内螺纹,所述的座体朝向帽体的一端设置有外螺纹,所述的帽体与所述的座体螺纹连接,所述的帽体为导体,所述的弹性元件为绝缘体,所述的座体为绝缘体,所述的盖板与PCB板之间还设置有定位装置,所述的定位装置包括设置在盖板上的定位孔及设置在PCB板上的定位柱,所述的定位柱与定位孔相匹配。
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