CN108009062A - A kind of enterprise-level SSD system power failures function test method, apparatus and system - Google Patents
A kind of enterprise-level SSD system power failures function test method, apparatus and system Download PDFInfo
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- CN108009062A CN108009062A CN201711340591.7A CN201711340591A CN108009062A CN 108009062 A CN108009062 A CN 108009062A CN 201711340591 A CN201711340591 A CN 201711340591A CN 108009062 A CN108009062 A CN 108009062A
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2284—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]
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Abstract
The invention discloses a kind of enterprise-level SSD system power failure function test methods, including：MCU receives power down functional test instruction；MCU controls the break-make of the electric-controlled switch of SSD system main electricities, to control the power-on and power-off of SSD systems, carries out power down functional test according to pre-stored test parameter；Wherein, SSD systems include MCU and electric-controlled switch.It can be seen that, this method controls the switch of main electricity by increasing the MCU of SSD internal systems, to control the break-make of main electricity by MCU, and then without using additional test equipment, realize the test of SSD system power failure functions, and since each SSD systems have each independent MCU, then can mass simultaneous carry out power down functional test, efficiency is higher, and cost is relatively low.In addition, the invention also discloses a kind of enterprise-level SSD system power failures device for testing functions, system and a kind of computer-readable recording medium, equally with above-mentioned beneficial effect.
Description
Technical field
The present invention relates to technical field of memory, more particularly to a kind of enterprise-level SSD system power failures function test method, dress
Put, system and a kind of computer-readable recording medium.
Background technology
Enterprise-level SSD is different from consumer level SSD, it is for performance, the requirement higher of the reliability of data.Therefore, enterprise
SSD is generally when carrying out system design for level, can use DRAM to carry out data cached, so that the readwrite performance of product is improved, into
And bring more preferable user experience.
However, DRAM belongs to volatile storage medium, in system exception power down, the data in DRAM will be with power down
And lose.Usually, enterprise-level SSD systems can support power-down protection, i.e. system is in powered-off fault, standby electricity circuit
SSD systems can be supported the cache flush in DRAM into NAND Flash, so that when ensureing to power on again, SSD can be just
Often start and without any data of loss.
At present, in order to verify the reliability of power-down protection in abnormal cases, it is necessary to the testing tool of external professional
To carry out SSD frequent power-on and power-off, the hot plug simulated operation of hundreds and thousands of times so that testing cost increase.
The content of the invention
The object of the present invention is to provide a kind of enterprise-level SSD system power failures function test method, device, system and a kind of meter
Calculation machine readable storage medium storing program for executing, without using additional test equipment, to realize the test of the power down function of enterprise-level SSD systems, and can
Batch testing at the same time, efficiency is higher, and cost is relatively low.
To achieve the above object, the present invention provides following technical solution：
A kind of enterprise-level SSD system power failure function test methods, including：
MCU receives power down functional test instruction；
The MCU controls the break-make of the electric-controlled switch of SSD system main electricities according to pre-stored test parameter, with
The power-on and power-off of the SSD systems are controlled, carry out power down functional test；
Wherein, the SSD systems include the MCU and the electric-controlled switch.
Alternatively, the MCU controls the electric-controlled switch of SSD system main electricities according to pre-stored test parameter
Break-make, to control the power-on and power-off of the SSD systems, carries out power down functional test, including：
The MCU is according to pre-stored single power-on and power-off time parameter and cycle-index parameter, by controlling the main confession
The enable pin of the electronic insurance of power supply, controls the break-make of the electronic insurance, to control the break-make of the main electricity,
Carry out power down functional test；
Wherein, when the electronic insurance is in the conduction state, the SSD systems normal power-up, when the electronic insurance
State is off, the SSD systems are powered by power down protection power supply.
Alternatively, before the MCU receives power down functional test instruction, further include：
MCU receives the single power-on and power-off time parameter of user setting and the cycle-index parameter, and by the list
Secondary power-on and power-off time parameter and the cycle-index parameter carry out persistent storage.
A kind of enterprise-level SSD system power failure device for testing functions, is integrated in the MCU ends of SSD systems, including：
Command reception module, for receiving power down functional test instruction；
Upper and lower electric control module, for according to pre-stored test parameter, controlling automatically controlled the opening of SSD system main electricities
The break-make of pass, to control the power-on and power-off of the SSD systems, carries out power down functional test.
Alternatively, the electric control module up and down includes：
Enable pin break-make control submodule, for according to pre-stored single power-on and power-off time parameter and cycle-index ginseng
Count, the enable pin of the electronic insurance by controlling the main electricity, the break-make of the electronic insurance is controlled, to control
The break-make of main electricity is stated, carries out power down functional test；
Wherein, when the electronic insurance is in the conduction state, the SSD systems normal power-up, when the electronic insurance
State is off, the SSD systems are powered by power down protection power supply.
Alternatively, further include：
Parameter receiving module, for the single power-on and power-off time for receiving user setting and the cycle-index, and will
The single power-on and power-off time parameter and the cycle-index parameter carry out persistent storage.
A kind of enterprise-level SSD systems, including：MCU, electric-controlled switch, DC-DC, DRAM, ASIC and power down protection power supply；
The MCU, the DRAM and the ASIC are connected by DC-DC with the first end of the electric-controlled switch, described
Second ends of the MCU directly with the electric-controlled switch is connected, and the 3rd termination main electricity of the electric-controlled switch, the power down is protected
Shield power supply is connected to second end and the 3rd end of the electric-controlled switch；
The MCU is used for the logical of the electric-controlled switch that SSD system main electricities are controlled according to pre-stored test parameter
It is disconnected, to control the power-on and power-off of the SSD systems, carry out power down functional test.
Alternatively, the electric-controlled switch is electronic insurance；
The MCU is with specific reference to pre-stored single power-on and power-off time parameter and cycle-index parameter, by described in control
The enable pin of the electronic insurance of main electricity, controls the break-make of the electronic insurance, to control the main electricity
Break-make, carries out power down functional test；
The ASIC is used for the power-on and power-off according to the SSD systems, records test log information；
Wherein, when the electronic insurance is in the conduction state, the SSD systems normal power-up, when the electronic insurance
State is off, the SSD systems are powered by power down protection power supply.
A kind of computer-readable recording medium, is stored with enterprise-level SSD systems on the computer-readable recording medium and falls
Electricity Functional test program, is realized as above when the enterprise-level SSD system power failure functional test programs are performed by the MCU of SSD systems
The step of stating any one enterprise-level SSD system power failure function test methods.
A kind of enterprise-level SSD system power failure function test methods provided by the invention, including：MCU receives power down function and surveys
Examination instruction；MCU is according to pre-stored test parameter, the break-make of the electric-controlled switch of control SSD system main electricities, with control
The power-on and power-off of SSD systems, carry out power down functional test；Wherein, SSD systems include MCU and electric-controlled switch.As it can be seen that this method is led to
The MCU for crossing increase SSD internal systems controls the switch of main electricity, to control the break-make of main electricity by MCU, into
And without using additional test equipment, realize the test of SSD system power failure functions, and since each SSD systems have respective independence
MCU, then can mass simultaneous carry out power down functional test, efficiency is higher, and cost is relatively low.A kind of in addition, enterprise provided by the invention
Industry level SSD system power failures device for testing functions, system and a kind of computer-readable recording medium equally have above-mentioned beneficial effect.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is attached drawing needed in technology description to be briefly described, it should be apparent that, drawings in the following description are only this
The embodiment of invention, for those of ordinary skill in the art, without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is a kind of specific embodiment party of enterprise-level SSD system power failure function test methods provided in an embodiment of the present invention
The flow diagram of formula；
Fig. 2 is the structural schematic block diagram of enterprise-level SSD system power failure device for testing functions provided in an embodiment of the present invention；
Fig. 3 is the brief schematic block diagram of power supply of enterprise-level SSD systems provided in an embodiment of the present invention.
Embodiment
To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, the technical solution in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is
Part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art
All other embodiments obtained without making creative work, belong to the scope of protection of the invention.
Please refer to Fig.1, Fig. 1 is a kind of enterprise-level SSD system power failure function test methods provided in an embodiment of the present invention
The flow diagram of embodiment, this method comprise the following steps：
Step 101, MCU receive power down functional test instruction.
Step 102, MCU lead to according to pre-stored test parameter, the electric-controlled switch of control SSD system main electricities
It is disconnected, to control the power-on and power-off of SSD systems, carry out power down functional test；Wherein, SSD systems include MCU and electric-controlled switch.
It is appreciated that above-mentioned test parameter can be specifically including but not limited to single power-on and power-off time parameter and cycle-index
Parameter.Above-mentioned electric-controlled switch can be specially but be not limited to electronic insurance, which is the controlling switch of main electricity,
By the break-make of the electric-controlled switch, main electricity also can corresponding break-make.
In some embodiments, step 102 can be specially：MCU is according to pre-stored single power-on and power-off time parameter
With cycle-index parameter, the enable pin of the electronic insurance by controlling main electricity, controls the break-make of electronic insurance, with control
The break-make of main electricity processed, carries out power down functional test；Wherein, when electronic insurance is in the conduction state, SSD systems are normal
It is powered, when electronic insurance is off state, SSD systems are powered by power down protection power supply.
Specifically, as defined in reaching when the enable pin of electronic insurance after voltage, for example, high level, then enable pin makes
Can, electronic insurance is in the conduction state, and at this time, the power supply of the corresponding module of SSD internal systems passes through the electricity by main electricity
Sub- insurance supply；When the enable pin of electronic insurance is pulled low, for example, when being probably reduced to 0V, electronic insurance is off state,
At this time, whole SSD system power failures, power without exterior main electricity, the modules of SSD internal systems then it is systematic fall
Electric protection power supply is powered.
The test parameter such as the time interval of MCU single power-on and power-off set in advance and power-on and power-off number, by controlling electricity
The enable pin of son insurance, with the break-make of the exterior main electricity of control, and then simulates upward and downward electric process, in this way, can be
External test facility is not utilized, does not increase extra component.The enable pin of electronic insurance is controlled by increasing MCU, i.e.,
The electrical testing up and down of enterprise-level SSD systems can be achieved.
It is that test parameter can prestore or user configures in real time, therefore in some embodiments, upper
Before stating MCU reception power down functional test instructions, it can also include：MCU receives the single power-on and power-off time parameter of user setting
With cycle-index parameter, and single power-on and power-off time parameter and cycle-index parameter are subjected to persistent storage.
Specifically, user can establish the communication between PC ends and MCU, then with Debug the interfaces external MCU of SSD systems
After setting the power-on and power-off time interval and number of SSD power supplies, MCU terminations to receive the test parameter set by user by PC ends,
These test parameters can be subjected to persistent storage.
After the completion of test, the type information of the Debug interfaces of the ASIC of SSD systems can be checked by PC ends, you can
Test data needed for obtaining, by checking test log data, you can judge that the SSD systems whether there is abnormal data,
Draw test result.
In the present embodiment, this method controls the switch of main electricity by increasing the MCU of SSD internal systems, with logical
The break-make of MCU control main electricities is crossed, and then without using additional test equipment, realizes the test of SSD system power failure functions, and
Since each SSD systems have each independent MCU, then can mass simultaneous carry out power down functional test, efficiency is higher, cost compared with
It is low.
Enterprise-level SSD system power failure device for testing functions provided in an embodiment of the present invention is introduced below, is hereafter retouched
The enterprise-level SSD system power failures device for testing functions stated can with above-described enterprise-level SSD system power failure function test methods
Correspond reference.
Please refer to Fig.2, Fig. 2 is the structure of enterprise-level SSD system power failure device for testing functions provided in an embodiment of the present invention
Schematic block diagram, the device are specifically integrated in the MCU ends of SSD systems, which includes：
Command reception module 100, for receiving power down functional test instruction；
Upper and lower electric control module 200, for according to pre-stored test parameter, the electricity of control SSD system main electricities
Control switches on-off, and to control the power-on and power-off of SSD systems, carries out power down functional test.
In some embodiments, upper and lower electric control module 200 includes：
Enable pin break-make control submodule, for according to pre-stored single power-on and power-off time parameter and cycle-index ginseng
Count, the enable pin of the electronic insurance by controlling main electricity, the break-make of electronic insurance is controlled, to control main electricity
Break-make, carry out power down functional test；
Wherein, when electronic insurance is in the conduction state, SSD system normal power-ups, when electronic insurance is off state,
SSD systems are powered by power down protection power supply.
In some embodiments, which can also include：
Parameter receiving module, for receiving single power-on and power-off time and the cycle-index of user setting, and by above and below single
Electric time parameter and cycle-index parameter carry out persistent storage.
In the present embodiment, by command reception module 100, power down functional test instruction is received, passes through upper and lower electric control mould
Block 200, according to pre-stored test parameter, the break-make of the electric-controlled switch of control SSD system main electricities, to control SSD systems
The power-on and power-off of system, carry out power down functional test.In this way, switch controls of the MCU to main electricity by increasing SSD internal systems
System, to control the break-make of main electricity by MCU, and then without using additional test equipment, realizes SSD system power failure functions
Test, and since each SSD systems have each independent MCU, then can mass simultaneous carry out power down functional test, efficiency compared with
Height, cost are relatively low.
The embodiment of the present invention provides a kind of enterprise-level SSD systems, referring to the power supply letter of the enterprise-level SSD systems shown in Fig. 3
Schematic block diagram is wanted, which can include：MCU31, electric-controlled switch 32, DC-DC33, DRAM34, ASIC35 and power down protection electricity
Source 36；
MCU, DRAM and ASIC are connected by DC-DC with the first end of electric-controlled switch, MCU directly with electric-controlled switch
Two ends are connected, and the 3rd termination main electricity of electric-controlled switch, power down protection power supply is connected to the second end and the of electric-controlled switch
Three ends；
MCU is used for the break-make that the electric-controlled switch of SSD system main electricities is controlled according to pre-stored test parameter, with
The power-on and power-off of SSD systems are controlled, carry out power down functional test.
Wherein, when electronic insurance is in the conduction state, SSD system normal power-ups, when electronic insurance is off state,
SSD systems are powered by power down protection power supply.
It is appreciated that the electric-controlled switch is electronic insurance eFuse, at this time, MCU is with specific reference to pre-stored single power-on and power-off
Time parameter and cycle-index parameter, the enable pin of the electronic insurance by controlling main electricity, control electronic insurance
Break-make, to control the break-make of main electricity, carries out power down functional test；ASIC is used for the power-on and power-off according to SSD systems, record
Test log information.In this way, the PC ends being connected with MCU ends can check the log information of ASIC, check that power down test data is
It is no to there is exception.
Specifically, inside SSD after electronic insurance eFuse, by power modules such as Switching Power Supply DC-DC, be converted to
Corresponding voltage during internal each chip operation for using.Normal power supply is in use, SW1 is off, i.e., inside whole SSD
Power supply is provided by the 12V of exterior Host, and when externally fed 12V power down, SW1 is closed, i.e., power down protection module for power supply gives SSD systems
System, so that data cached in DRAM is issued in Nand Flash, the situation for not having loss of data when being powered on so as to next time is sent out
It is raw
When exterior normal power supply, the power supply of MCU has two ways, and 12V changes supply MCU and outside by DC-DC
The direct 3.3V_AUX power supplies of Host, thus when 12V power down, 3.3V_AUX has electricity, what MCU still can be worked normally；
Therefore the EN pins of eFuse can be controlled by MCU, realize the electric control up and down to SSD systems
It is to be appreciated that the similarity of the present embodiment and above-mentioned two embodiment can be cross-referenced, details are not described herein.
The present embodiment provides a kind of computer-readable recording medium, enterprise-level is stored with the computer-readable recording medium
SSD system power failure functional test programs, enterprise-level SSD system power failure functional test programs are realized when being performed by the MCU of SSD systems
Such as the step of any of the above-described enterprise-level SSD system power failure function test methods.
It is appreciated that the computer-readable recording medium can specifically be arranged at SSD internal systems, more specifically, also may be used
To be arranged inside MCU.
It is to be appreciated that the similarity between the present embodiment and above-mentioned each embodiment can be cross-referenced, it is no longer superfluous herein
State.
Each embodiment is described by the way of progressive in specification, and what each embodiment stressed is and other realities
Apply the difference of example, between each embodiment identical similar portion mutually referring to.For device disclosed in embodiment
Speech, since it is corresponded to the methods disclosed in the examples, so description is fairly simple, related part is referring to method part illustration
.
Professional further appreciates that, with reference to each exemplary unit of the embodiments described herein description
And algorithm steps, can be realized with electronic hardware, computer software or the combination of the two, in order to clearly demonstrate hardware and
The interchangeability of software, generally describes each exemplary composition and step according to function in the above description.These
Function is performed with hardware or software mode actually, application-specific and design constraint depending on technical solution.Specialty
Technical staff can realize described function to each specific application using distinct methods, but this realization should not
Think beyond the scope of this invention.
Can directly it be held with reference to the step of method or algorithm that the embodiments described herein describes with hardware, processor
Capable software module, or the two combination are implemented.Software module can be placed in random access memory (RAM), memory, read-only deposit
Reservoir (ROM), electrically programmable ROM, electrically erasable ROM, register, hard disk, moveable magnetic disc, CD-ROM or technology
In any other form of storage medium well known in field.
Above can to enterprise-level SSD system power failures function test method, device, system and computer provided by the present invention
Storage medium is read to be described in detail.Specific case used herein explains the principle of the present invention and embodiment
State, the explanation of above example is only intended to help to understand method and its core concept of the invention.It should be pointed out that for this skill
For the those of ordinary skill in art field, without departing from the principle of the present invention, some change can also be carried out to the present invention
Into and modification, these improve and modification also fall into the protection domain of the claims in the present invention.
Claims (9)
- A kind of 1. enterprise-level SSD system power failure function test methods, it is characterised in that including：MCU receives power down functional test instruction；The MCU is according to pre-stored test parameter, the break-make of the electric-controlled switch of control SSD system main electricities, with control The power-on and power-off of the SSD systems, carry out power down functional test；Wherein, the SSD systems include the MCU and the electric-controlled switch.
- 2. enterprise-level SSD system power failure function test methods according to claim 1, it is characterised in that the MCU according to Pre-stored test parameter, controls the break-make of the electric-controlled switch of SSD system main electricities, to control the upper of the SSD systems Lower electricity, carries out power down functional test, including：The MCU is according to pre-stored single power-on and power-off time parameter and cycle-index parameter, by controlling the main power supply electricity The enable pin of the electronic insurance in source, controls the break-make of the electronic insurance, to control the break-make of the main electricity, carries out Power down functional test；Wherein, when the electronic insurance is in the conduction state, the SSD systems normal power-up, when the electronic insurance is in Off state, the SSD systems are powered by power down protection power supply.
- 3. enterprise-level SSD system power failure function test methods according to claim 1 or 2, it is characterised in that described Before MCU receives power down functional test instruction, further include：MCU receives the single power-on and power-off time parameter of user setting and the cycle-index parameter, and by the single Lower electricity time parameter and the cycle-index parameter carry out persistent storage.
- A kind of 4. enterprise-level SSD system power failure device for testing functions, it is characterised in that the MCU ends of SSD systems are integrated in, including：Command reception module, for receiving power down functional test instruction；Upper and lower electric control module, for according to pre-stored test parameter, controlling the electric-controlled switch of SSD system main electricities Break-make, to control the power-on and power-off of the SSD systems, carries out power down functional test.
- 5. enterprise-level SSD system power failure device for testing functions according to claim 4, it is characterised in that the power-on and power-off Control module includes：Enable pin break-make control submodule, the single power-on and power-off time parameter pre-stored for basis and cycle-index parameter, Enable pin by the electronic insurance for controlling the main electricity, controls the break-make of the electronic insurance, with described in control The break-make of main electricity, carries out power down functional test；Wherein, when the electronic insurance is in the conduction state, the SSD systems normal power-up, when the electronic insurance is in Off state, the SSD systems are powered by power down protection power supply.
- 6. enterprise-level SSD system power failure device for testing functions according to claim 4 or 5, it is characterised in that further include：Parameter receiving module, for the single power-on and power-off time for receiving user setting and the cycle-index, and by described in Single power-on and power-off time parameter and the cycle-index parameter carry out persistent storage.
- A kind of 7. enterprise-level SSD systems, it is characterised in that including：MCU, electric-controlled switch, DC-DC, DRAM, ASIC and power down are protected Protect power supply；The MCU, the DRAM and the ASIC are connected by DC-DC with the first end of the electric-controlled switch, and the MCU is straight Connect and be connected with the second end of the electric-controlled switch, the 3rd termination main electricity of the electric-controlled switch, the power down protection electricity Source is connected to second end and the 3rd end of the electric-controlled switch；The MCU is used for the break-make that the electric-controlled switch of SSD system main electricities is controlled according to pre-stored test parameter, with The power-on and power-off of the SSD systems are controlled, carry out power down functional test.
- 8. enterprise-level SSD systems according to claim 7, it is characterised in that the electric-controlled switch is electronic insurance；The MCU is with specific reference to pre-stored single power-on and power-off time parameter and cycle-index parameter, by controlling the main confession The enable pin of the electronic insurance of power supply, controls the break-make of the electronic insurance, to control the break-make of the main electricity, Carry out power down functional test；The ASIC is used for the power-on and power-off according to the SSD systems, records test log information；Wherein, when the electronic insurance is in the conduction state, the SSD systems normal power-up, when the electronic insurance is in Off state, the SSD systems are powered by power down protection power supply.
- 9. a kind of computer-readable recording medium, it is characterised in that be stored with enterprise-level on the computer-readable recording medium SSD system power failure functional test programs, when the enterprise-level SSD system power failure functional test programs are performed by the MCU of SSD systems Realize as described in any one of claims 1 to 3 the step of enterprise-level SSD system power failure function test methods.
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|---|---|---|---|---|
| CN109509508A (en) * | 2018-12-03 | 2019-03-22 | 浪潮电子信息产业股份有限公司 | Abnormal power failure test method, device, medium and equipment for SSD |
| CN109524049A (en) * | 2018-11-26 | 2019-03-26 | 深圳忆联信息***有限公司 | SSD powered-off fault test method, device, computer equipment and storage medium |
| CN110047557A (en) * | 2019-04-18 | 2019-07-23 | 环旭电子股份有限公司 | A kind of enterprise-level solid state hard disk device for testing functions and method |
| CN110470972A (en) * | 2019-07-29 | 2019-11-19 | 广东浪潮大数据研究有限公司 | A kind of power supply chip test circuit |
| CN110688268A (en) * | 2019-09-09 | 2020-01-14 | 苏州浪潮智能科技有限公司 | Fault positioning method, device, equipment and medium for NVME SSD |
| CN110931076A (en) * | 2019-11-24 | 2020-03-27 | 苏州浪潮智能科技有限公司 | Solid state disk abnormal power-on and power-off testing device and method |
| TWI744692B (en) * | 2019-09-11 | 2021-11-01 | 英業達股份有限公司 | Hard disk examination method and system of the same |
| CN114496058A (en) * | 2022-01-18 | 2022-05-13 | 北京得瑞领新科技有限公司 | SSD abnormal power failure test method and device, storage medium and SSD device |
| CN115083510A (en) * | 2022-07-22 | 2022-09-20 | 深圳佰维存储科技股份有限公司 | Solid state disk testing method and device, storage medium, power supply and electronic equipment |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101339492A (en) * | 2008-08-11 | 2009-01-07 | 湖南源科创新科技股份有限公司 | Native SATA solid-state hard disk controller |
| CN104658611A (en) * | 2013-11-25 | 2015-05-27 | 深圳市国微电子有限公司 | Method and system for testing abnormal power failure of solid-state hard disk |
| CN105137227A (en) * | 2015-08-03 | 2015-12-09 | 昆腾微电子股份有限公司 | Testing device and method for power-down protection of intelligent card |
| KR101586578B1 (en) * | 2014-07-31 | 2016-01-18 | 에스케이하이닉스 주식회사 | Test system for testing devices based on a various sudden power loss situations |
| CN106445845A (en) * | 2016-12-06 | 2017-02-22 | 郑州云海信息技术有限公司 | Enterprise-grade SSD (solid state drive) system and power down protection method thereof |
-
2017
- 2017-12-14 CN CN201711340591.7A patent/CN108009062A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101339492A (en) * | 2008-08-11 | 2009-01-07 | 湖南源科创新科技股份有限公司 | Native SATA solid-state hard disk controller |
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Application publication date: 20180508 |