CN108007584A - 基于单光子雪崩二极管探测器的快速荧光寿命成像方法 - Google Patents
基于单光子雪崩二极管探测器的快速荧光寿命成像方法 Download PDFInfo
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- CN108007584A CN108007584A CN201711090809.8A CN201711090809A CN108007584A CN 108007584 A CN108007584 A CN 108007584A CN 201711090809 A CN201711090809 A CN 201711090809A CN 108007584 A CN108007584 A CN 108007584A
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- 238000003384 imaging method Methods 0.000 title claims abstract description 21
- 238000001514 detection method Methods 0.000 claims abstract description 79
- 238000002360 preparation method Methods 0.000 claims abstract description 4
- 238000005259 measurement Methods 0.000 claims description 16
- 230000003111 delayed effect Effects 0.000 claims description 10
- 238000000691 measurement method Methods 0.000 claims description 8
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- 230000008054 signal transmission Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 10
- 230000005284 excitation Effects 0.000 abstract description 9
- 238000005070 sampling Methods 0.000 abstract description 4
- 238000001857 fluorescence decay curve Methods 0.000 abstract description 3
- 238000011896 sensitive detection Methods 0.000 abstract description 2
- 238000000342 Monte Carlo simulation Methods 0.000 abstract 1
- 238000004364 calculation method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
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Cited By (4)
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CN109297905A (zh) * | 2018-10-09 | 2019-02-01 | 中国科学院半导体研究所 | 双门控相关荧光成像装置及成像方法 |
CN109916867A (zh) * | 2019-03-08 | 2019-06-21 | 中国科学院半导体研究所 | 荧光强度相关时间分辨增强成像方法及装置 |
CN113203487A (zh) * | 2021-03-18 | 2021-08-03 | 深圳大学 | 一种荧光寿命偏差的定量化校正方法及装置 |
CN113614564A (zh) * | 2021-07-09 | 2021-11-05 | 华为技术有限公司 | 一种探测控制方法及装置 |
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JP2006201133A (ja) * | 2005-01-24 | 2006-08-03 | Olympus Corp | 蛍光寿命測定装置 |
CN103090971A (zh) * | 2013-01-24 | 2013-05-08 | 中国科学院空间科学与应用研究中心 | 一种超灵敏时间分辨成像光谱仪及其时间分辨成像方法 |
CN103728446A (zh) * | 2013-12-11 | 2014-04-16 | 天津大学 | 光子计数型多通道时间分辨荧光免疫分析***及计数方法 |
CN105823765A (zh) * | 2016-03-21 | 2016-08-03 | 天津大学 | 可扩展荧光寿命探测范围的质心算法cmm |
US20160268331A1 (en) * | 2015-03-10 | 2016-09-15 | Stmicroelectronics (Research & Development) Limited | Circuit for generating direct timing histogram data in response to photon detection |
CN107121208A (zh) * | 2017-06-08 | 2017-09-01 | 大连创锐光谱科技有限公司 | 基于频率计数卡的激发态寿命测量的数据采集装置及激发态寿命测量方法 |
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2017
- 2017-11-08 CN CN201711090809.8A patent/CN108007584B/zh active Active
Patent Citations (6)
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JP2006201133A (ja) * | 2005-01-24 | 2006-08-03 | Olympus Corp | 蛍光寿命測定装置 |
CN103090971A (zh) * | 2013-01-24 | 2013-05-08 | 中国科学院空间科学与应用研究中心 | 一种超灵敏时间分辨成像光谱仪及其时间分辨成像方法 |
CN103728446A (zh) * | 2013-12-11 | 2014-04-16 | 天津大学 | 光子计数型多通道时间分辨荧光免疫分析***及计数方法 |
US20160268331A1 (en) * | 2015-03-10 | 2016-09-15 | Stmicroelectronics (Research & Development) Limited | Circuit for generating direct timing histogram data in response to photon detection |
CN105823765A (zh) * | 2016-03-21 | 2016-08-03 | 天津大学 | 可扩展荧光寿命探测范围的质心算法cmm |
CN107121208A (zh) * | 2017-06-08 | 2017-09-01 | 大连创锐光谱科技有限公司 | 基于频率计数卡的激发态寿命测量的数据采集装置及激发态寿命测量方法 |
Non-Patent Citations (2)
Title |
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C. J. DE GRAUW等: "Multiple time-gate module for fluorescence lifetime imaging", 《APPLIED SPECTROSCOPY》 * |
DAY-UEI LI等: "On-chip fluorescence lifetime extraction using synchronous gating scheme - Theoretical error analysis and practical implementation", 《BIOSIGNALS 2008 - INTERNATIONAL CONFERENCE ON BIO-INSPIRED SYSTEMS AND SIGNAL PROCESSING》 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109297905A (zh) * | 2018-10-09 | 2019-02-01 | 中国科学院半导体研究所 | 双门控相关荧光成像装置及成像方法 |
CN109297905B (zh) * | 2018-10-09 | 2020-08-04 | 中国科学院半导体研究所 | 双门控相关荧光成像装置及成像方法 |
CN109916867A (zh) * | 2019-03-08 | 2019-06-21 | 中国科学院半导体研究所 | 荧光强度相关时间分辨增强成像方法及装置 |
CN113203487A (zh) * | 2021-03-18 | 2021-08-03 | 深圳大学 | 一种荧光寿命偏差的定量化校正方法及装置 |
CN113203487B (zh) * | 2021-03-18 | 2022-07-19 | 深圳大学 | 一种荧光寿命偏差的定量化校正方法及装置 |
CN113614564A (zh) * | 2021-07-09 | 2021-11-05 | 华为技术有限公司 | 一种探测控制方法及装置 |
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Application publication date: 20180508 Assignee: NANJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS INSTITUTE AT NANTONG Co.,Ltd. Assignor: NANJING University OF POSTS AND TELECOMMUNICATIONS Contract record no.: X2020980006914 Denomination of invention: Fast fluorescence lifetime imaging method based on single photon avalanche diode detector Granted publication date: 20191011 License type: Common License Record date: 20201021 |