CN1079981C - 电势生成电路 - Google Patents

电势生成电路 Download PDF

Info

Publication number
CN1079981C
CN1079981C CN96119754A CN96119754A CN1079981C CN 1079981 C CN1079981 C CN 1079981C CN 96119754 A CN96119754 A CN 96119754A CN 96119754 A CN96119754 A CN 96119754A CN 1079981 C CN1079981 C CN 1079981C
Authority
CN
China
Prior art keywords
node
mos transistor
channel mos
output node
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN96119754A
Other languages
English (en)
Chinese (zh)
Other versions
CN1158500A (zh
Inventor
飞田洋一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of CN1158500A publication Critical patent/CN1158500A/zh
Application granted granted Critical
Publication of CN1079981C publication Critical patent/CN1079981C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/462Regulating voltage or current wherein the variable actually regulated by the final control device is dc as a function of the requirements of the load, e.g. delay, temperature, specific voltage/current characteristic
    • G05F1/465Internal voltage generators for integrated circuits, e.g. step down generators
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is dc
    • G05F3/10Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • G05F3/242Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
    • G05F3/247Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the supply voltage
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • G11C5/146Substrate bias generators
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H11/00Networks using active elements
    • H03H11/02Multiple-port networks
    • H03H11/24Frequency-independent attenuators
    • H03H11/245Frequency-independent attenuators using field-effect transistor
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/06Modifications for ensuring a fully conducting state
    • H03K17/063Modifications for ensuring a fully conducting state in field-effect transistor switches

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Electronic Switches (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Dc-Dc Converters (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)
  • Read Only Memory (AREA)
CN96119754A 1995-12-11 1996-12-11 电势生成电路 Expired - Fee Related CN1079981C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP7321760A JPH09162713A (ja) 1995-12-11 1995-12-11 半導体集積回路
JP321760/95 1995-12-11

Publications (2)

Publication Number Publication Date
CN1158500A CN1158500A (zh) 1997-09-03
CN1079981C true CN1079981C (zh) 2002-02-27

Family

ID=18136144

Family Applications (4)

Application Number Title Priority Date Filing Date
CN96119756A Expired - Fee Related CN1096118C (zh) 1995-12-11 1996-12-11 中间电位产生电路
CN96119753A Expired - Fee Related CN1091974C (zh) 1995-12-11 1996-12-11 升压脉冲产生电路
CN96119754A Expired - Fee Related CN1079981C (zh) 1995-12-11 1996-12-11 电势生成电路
CN96123112A Expired - Fee Related CN1090819C (zh) 1995-12-11 1996-12-11 半导体集成电路

Family Applications Before (2)

Application Number Title Priority Date Filing Date
CN96119756A Expired - Fee Related CN1096118C (zh) 1995-12-11 1996-12-11 中间电位产生电路
CN96119753A Expired - Fee Related CN1091974C (zh) 1995-12-11 1996-12-11 升压脉冲产生电路

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN96123112A Expired - Fee Related CN1090819C (zh) 1995-12-11 1996-12-11 半导体集成电路

Country Status (5)

Country Link
US (4) US5815446A (ko)
JP (1) JPH09162713A (ko)
KR (4) KR100270000B1 (ko)
CN (4) CN1096118C (ko)
TW (4) TW293124B (ko)

Families Citing this family (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE40552E1 (en) 1990-04-06 2008-10-28 Mosaid Technologies, Inc. Dynamic random access memory using imperfect isolating transistors
JP3378457B2 (ja) * 1997-02-26 2003-02-17 株式会社東芝 半導体装置
US6593799B2 (en) 1997-06-20 2003-07-15 Intel Corporation Circuit including forward body bias from supply voltage and ground nodes
US6300819B1 (en) * 1997-06-20 2001-10-09 Intel Corporation Circuit including forward body bias from supply voltage and ground nodes
JP3022815B2 (ja) * 1997-07-24 2000-03-21 日本電気アイシーマイコンシステム株式会社 中間電位生成回路
US5939928A (en) * 1997-08-19 1999-08-17 Advanced Micro Devices, Inc. Fast high voltage NMOS pass gate for integrated circuit with high voltage generator
US5942925A (en) * 1997-09-30 1999-08-24 Siemens Aktiengesellschaft Power-on detection and enabling circuit with very fast detection of power-off
US5959444A (en) * 1997-12-12 1999-09-28 Micron Technology, Inc. MOS transistor circuit and method for biasing a voltage generator
US6232826B1 (en) * 1998-01-12 2001-05-15 Intel Corporation Charge pump avoiding gain degradation due to the body effect
JP3385960B2 (ja) * 1998-03-16 2003-03-10 日本電気株式会社 負電圧チャージポンプ回路
JP3935266B2 (ja) * 1998-05-08 2007-06-20 松下電器産業株式会社 電圧検知回路
IT1301936B1 (it) * 1998-08-27 2000-07-07 St Microelectronics Srl Circuito a pompa di carica per dispositivi integrati di memoria
JP2000149582A (ja) * 1998-09-08 2000-05-30 Toshiba Corp 昇圧回路,電圧発生回路及び半導体メモリ
US6473852B1 (en) 1998-10-30 2002-10-29 Fairchild Semiconductor Corporation Method and circuit for performing automatic power on reset of an integrated circuit
JP3799869B2 (ja) * 1999-03-30 2006-07-19 セイコーエプソン株式会社 電源回路を搭載した半導体装置並びにそれを用いた液晶装置及び電子機器
US6191643B1 (en) * 1999-03-31 2001-02-20 Sony Corporation Voltage boost circuitry for hard drive write preamplifiers
JP4960544B2 (ja) * 2000-07-06 2012-06-27 エルピーダメモリ株式会社 半導体記憶装置及びその制御方法
US6636103B2 (en) * 2001-04-18 2003-10-21 Analog Devices, Inc. Amplifier system with on-demand power supply boost
US7049855B2 (en) * 2001-06-28 2006-05-23 Intel Corporation Area efficient waveform evaluation and DC offset cancellation circuits
JP2003168290A (ja) * 2001-11-29 2003-06-13 Fujitsu Ltd 電源回路及び半導体装置
JPWO2003071373A1 (ja) * 2002-02-22 2005-06-16 三菱電機株式会社 電圧発生回路
US6670845B1 (en) * 2002-07-16 2003-12-30 Silicon Storage Technology, Inc. High D.C. voltage to low D.C. voltage circuit converter
US6784722B2 (en) * 2002-10-09 2004-08-31 Intel Corporation Wide-range local bias generator for body bias grid
US7382176B2 (en) * 2003-01-17 2008-06-03 Tpo Hong Kong Holding Limited Charge pump circuit
CN100508322C (zh) * 2003-06-30 2009-07-01 Nxp股份有限公司 用于集成电路器件的保护电路
KR100691485B1 (ko) * 2003-07-29 2007-03-09 주식회사 하이닉스반도체 액티브 모드시에 전류소모를 줄일 수 있는 반도체 메모리장치
KR100539252B1 (ko) * 2004-03-08 2005-12-27 삼성전자주식회사 데이터 버스 및 커맨드/어드레스 버스를 통해 전송되는신호의 충실도를 향상시킬 수 있는 메모리 모듈 및 이를포함하는 메모리 시스템
ATE423436T1 (de) * 2004-09-30 2009-03-15 Huawei Tech Co Ltd Verfahren system zur realisierung von kommunikation
US7996590B2 (en) * 2004-12-30 2011-08-09 Samsung Electronics Co., Ltd. Semiconductor memory module and semiconductor memory system having termination resistor units
US8335115B2 (en) * 2004-12-30 2012-12-18 Samsung Electronics Co., Ltd. Semiconductor memory module and semiconductor memory system having termination resistor units
US7621463B2 (en) * 2005-01-12 2009-11-24 Flodesign, Inc. Fluid nozzle system using self-propelling toroidal vortices for long-range jet impact
US7362084B2 (en) * 2005-03-14 2008-04-22 Silicon Storage Technology, Inc. Fast voltage regulators for charge pumps
US7737765B2 (en) * 2005-03-14 2010-06-15 Silicon Storage Technology, Inc. Fast start charge pump for voltage regulators
JP4712519B2 (ja) * 2005-05-27 2011-06-29 フリースケール セミコンダクター インコーポレイテッド ハイサイド駆動回路用チャージポンプ回路及びドライバ駆動電圧回路
JP2007043661A (ja) * 2005-06-30 2007-02-15 Oki Electric Ind Co Ltd 遅延回路
JP4800700B2 (ja) * 2005-08-01 2011-10-26 ルネサスエレクトロニクス株式会社 半導体装置およびそれを用いた半導体集積回路
JP4940797B2 (ja) * 2005-10-03 2012-05-30 セイコーエプソン株式会社 半導体装置の製造方法
US7605618B2 (en) * 2006-01-12 2009-10-20 Qualcomm, Incorporated Digital output driver and input buffer using thin-oxide field effect transistors
EP2062110A1 (en) * 2006-06-26 2009-05-27 Nxp B.V. A constant voltage generating device
KR100928932B1 (ko) 2007-08-08 2009-11-30 엘에스산전 주식회사 무선 주파수 식별 태그 칩용 전압 증배기 및 이를 이용한무선 주파수 식별 태그
TW200919959A (en) * 2007-10-31 2009-05-01 Au Optronics Corp Charge pump system and method of operating the same
KR100902060B1 (ko) * 2008-05-08 2009-06-15 주식회사 하이닉스반도체 반도체 메모리 장치의 펌핑 전압 생성 회로 및 방법
TWI410185B (zh) * 2009-01-05 2013-09-21 Himax Tech Ltd 參考電壓/電流產生系統之佈局
CN102148614B (zh) * 2010-02-10 2015-11-11 上海华虹宏力半导体制造有限公司 脉冲产生电路及方法、基准电压产生及其推动电路及方法
US8947158B2 (en) * 2012-09-03 2015-02-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
CN103092245B (zh) * 2013-01-09 2014-08-20 卓捷创芯科技(深圳)有限公司 一种超低功耗的低压差稳压电源电路与射频识别标签
TWI663820B (zh) * 2013-08-21 2019-06-21 日商半導體能源研究所股份有限公司 電荷泵電路以及具備電荷泵電路的半導體裝置
KR102267237B1 (ko) 2014-03-07 2021-06-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 전자 기기
JP2016021638A (ja) * 2014-07-14 2016-02-04 株式会社ソシオネクスト 半導体装置
US9312280B2 (en) 2014-07-25 2016-04-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
TWI551044B (zh) * 2015-05-15 2016-09-21 華邦電子股份有限公司 電源閘電路及其電源閘開關控制方法
JP6811084B2 (ja) * 2015-12-18 2021-01-13 株式会社半導体エネルギー研究所 半導体装置
CN109427309A (zh) * 2017-08-22 2019-03-05 京东方科技集团股份有限公司 源极驱动增强电路、源极驱动增强方法、源极驱动电路和显示设备
JP7000187B2 (ja) * 2018-02-08 2022-01-19 エイブリック株式会社 基準電圧回路及び半導体装置
CN110667334B (zh) * 2019-10-11 2021-03-19 广东美的制冷设备有限公司 车载空调器及其低功耗待机方法和电路
KR102520454B1 (ko) * 2021-11-25 2023-04-11 재단법인대구경북과학기술원 차동 바이폴라 구조에 기반하는 펄스 부스트 장치

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4559548A (en) * 1981-04-07 1985-12-17 Tokyo Shibaura Denki Kabushiki Kaisha CMOS Charge pump free of parasitic injection
US5394365A (en) * 1992-04-16 1995-02-28 Mitsubishi Denki Kabushiki Kaisha Charge pump circuit having an improved charge pumping efficiency

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3823332A (en) * 1970-01-30 1974-07-09 Rca Corp Mos fet reference voltage supply
US3805095A (en) * 1972-12-29 1974-04-16 Ibm Fet threshold compensating bias circuit
JPS57157315A (en) * 1981-03-24 1982-09-28 Nec Corp Intermediate voltage generating circuit
US4422163A (en) * 1981-09-03 1983-12-20 Vend-A-Copy, Inc. Power down circuit for data protection in a microprocessor-based system
JPS60103827A (ja) * 1983-11-11 1985-06-08 Fujitsu Ltd 電圧変換回路
JPS60122416A (ja) * 1984-07-25 1985-06-29 Hitachi Ltd 基板バイアス電圧発生回路
US4698789A (en) * 1984-11-30 1987-10-06 Kabushiki Kaisha Toshiba MOS semiconductor device
JPS61221812A (ja) * 1985-03-27 1986-10-02 Mitsubishi Electric Corp 電圧発生回路
US4663584B1 (en) * 1985-06-10 1996-05-21 Toshiba Kk Intermediate potential generation circuit
US4788455A (en) * 1985-08-09 1988-11-29 Mitsubishi Denki Kabushiki Kaisha CMOS reference voltage generator employing separate reference circuits for each output transistor
JPH0612797B2 (ja) * 1985-09-09 1994-02-16 オムロン株式会社 半導体装置
JPH072005B2 (ja) * 1985-10-08 1995-01-11 ソニー株式会社 昇圧回路
JPS62188255A (ja) * 1986-02-13 1987-08-17 Toshiba Corp 基準電圧発生回路
JPH073947B2 (ja) * 1986-07-09 1995-01-18 株式会社東芝 昇圧回路
JP2509596B2 (ja) * 1987-01-14 1996-06-19 株式会社東芝 中間電位生成回路
NL8701278A (nl) * 1987-05-29 1988-12-16 Philips Nv Geintegreerde cmos-schakeling met een substraatvoorspanningsgenerator.
JPS6427094A (en) * 1987-07-23 1989-01-30 Mitsubishi Electric Corp Mos-type semiconductor memory
JPS6432715A (en) * 1987-07-29 1989-02-02 Seiko Instr & Electronics Semiconductor integrated circuit device
JPH0690655B2 (ja) * 1987-12-18 1994-11-14 株式会社東芝 中間電位発生回路
JPH0673092B2 (ja) * 1988-04-12 1994-09-14 日本電気株式会社 定電圧発生回路
JPH0355613A (ja) * 1989-07-25 1991-03-11 Toshiba Corp 中間電位生成回路
KR940003153B1 (ko) * 1991-04-12 1994-04-15 금성일렉트론 주식회사 백바이어스 발생회로
US5160860A (en) * 1991-09-16 1992-11-03 Advanced Micro Devices, Inc. Input transition responsive CMOS self-boost circuit
JP3381937B2 (ja) * 1992-05-22 2003-03-04 株式会社東芝 中間電位発生回路
KR0135735B1 (ko) * 1992-11-04 1998-05-15 기다오까 다까시 소음발생을 억제하는 개량된 출력 드라이버 회로 및 번인테스트를 위한 개량된 반도체 집적회로 장치
JPH06223568A (ja) * 1993-01-29 1994-08-12 Mitsubishi Electric Corp 中間電位発生装置
JP3307453B2 (ja) * 1993-03-18 2002-07-24 ソニー株式会社 昇圧回路
JP3311133B2 (ja) * 1994-02-16 2002-08-05 株式会社東芝 出力回路
JP3148070B2 (ja) * 1994-03-29 2001-03-19 株式会社東芝 電圧変換回路
US5644266A (en) * 1995-11-13 1997-07-01 Chen; Ming-Jer Dynamic threshold voltage scheme for low voltage CMOS inverter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4559548A (en) * 1981-04-07 1985-12-17 Tokyo Shibaura Denki Kabushiki Kaisha CMOS Charge pump free of parasitic injection
US5394365A (en) * 1992-04-16 1995-02-28 Mitsubishi Denki Kabushiki Kaisha Charge pump circuit having an improved charge pumping efficiency

Also Published As

Publication number Publication date
CN1090819C (zh) 2002-09-11
CN1091974C (zh) 2002-10-02
TW321805B (ko) 1997-12-01
US5812015A (en) 1998-09-22
KR970051294A (ko) 1997-07-29
TW409395B (en) 2000-10-21
CN1158500A (zh) 1997-09-03
KR970051145A (ko) 1997-07-29
TW381206B (en) 2000-02-01
JPH09162713A (ja) 1997-06-20
US5726941A (en) 1998-03-10
KR100270002B1 (ko) 2000-10-16
US5815446A (en) 1998-09-29
KR970051173A (ko) 1997-07-29
US5717324A (en) 1998-02-10
CN1158516A (zh) 1997-09-03
CN1158501A (zh) 1997-09-03
KR100270000B1 (ko) 2000-10-16
CN1096118C (zh) 2002-12-11
KR100231951B1 (ko) 1999-12-01
KR100270001B1 (ko) 2000-10-16
TW293124B (en) 1996-12-11
CN1159656A (zh) 1997-09-17

Similar Documents

Publication Publication Date Title
CN1079981C (zh) 电势生成电路
EP0914707B1 (en) Charge pump circuit architecture
US8599639B2 (en) Semiconductor device including internal voltage generation circuit
US6456152B1 (en) Charge pump with improved reliability
CN100490011C (zh) 用于动态随机存取内存(dram)局部字符线驱动器的电路
US5969988A (en) Voltage multiplier circuit and nonvolatile semiconductor memory device having voltage multiplier
EP0129217B1 (en) A semiconductor circuit including a memory and a pulse drive circuit
CN110134169B (zh) 位线电源供应装置
US6480057B2 (en) Charge pump circuit allowing efficient electric charge transfer
CN1677572A (zh) 非易失性半导体存储器
JP2652694B2 (ja) 昇圧回路
CN1758379A (zh) 闪存装置中的区块开关
CN1392568A (zh) 半导体存储器件的字线驱动器
CN1106550A (zh) 半导体存储器件的字线驱动电路
EP0030244A1 (en) Mos device with substrate-bias generating circuit
US6281665B1 (en) High speed internal voltage generator with reduced current draw
CN1334935A (zh) 一种使用低压电源的比例调节电荷泵
CN1829083A (zh) 电源电压递降电路、延迟电路以及具有后者的半导体装置
CN113346739A (zh) 电荷泵电路***、三维存储器及三维存储器***
US6249477B1 (en) Semiconductor memory device
CN1941168B (zh) 快速预先充电电路及提供存储器元件快速预先充电的方法
US6181611B1 (en) Techniques of isolating and enabling higher speed access of memory cells
US6614270B2 (en) Potential detecting circuit having wide operating margin and semiconductor device including the same
CN1518005A (zh) 降低老化试验时的功耗的半导体存储器
US10923173B2 (en) Voltage generating circuit, semiconductor memory device, and voltage generating method

Legal Events

Date Code Title Description
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C06 Publication
PB01 Publication
C14 Grant of patent or utility model
GR01 Patent grant
C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee