CN107817376B - Negative half-cycle waveform blanking amplitude sampling device - Google Patents
Negative half-cycle waveform blanking amplitude sampling device Download PDFInfo
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- CN107817376B CN107817376B CN201711128231.0A CN201711128231A CN107817376B CN 107817376 B CN107817376 B CN 107817376B CN 201711128231 A CN201711128231 A CN 201711128231A CN 107817376 B CN107817376 B CN 107817376B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
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Abstract
The invention relates to a negative half-cycle waveform blanking amplitude sampling device, which comprises: the device comprises a signal conditioning circuit, a negative half-cycle blanking circuit, a filtering and port protecting circuit, a processor and a power supply circuit, wherein the power supply circuit is respectively and electrically connected with the signal conditioning circuit, the negative half-cycle blanking circuit, the filtering and port protecting circuit and the processor, the signal conditioning circuit is electrically connected with the negative half-cycle blanking circuit, the negative half-cycle blanking circuit is electrically connected with the filtering and port protecting circuit, the filtering and port protecting circuit is electrically connected with the processor, and an access end for accessing signals is led out from the signal conditioning circuit. The negative half-cycle waveform blanking amplitude sampling device realizes the negative half-cycle waveform blanking function, and still keeps higher sampling resolution under the conditions of large sampling value pressure difference and higher sampling precision requirement.
Description
Technical Field
The invention relates to the field of electrical circuit sampling, in particular to a negative half-cycle waveform blanking amplitude sampling device.
Background
At present, in the design of an electronic circuit, a processor is powered by a positive power supply, when waveforms containing positive and negative half cycles are sampled, a processing scheme generally takes the midpoint voltage of the power supply voltage of the processor as a reference to provide a direct-current bias voltage, and the maximum amplitude of the actual sampled voltage is only half of the power supply voltage of the processor. The design scheme is widely used under the conditions of small sampling value pressure difference and low sampling precision requirement. However, if the pressure difference of the sampled value is large and the sampling precision requirement is high, the hidden danger of low sampling resolution is exposed, so that the actual sampling precision cannot meet the design requirement.
Disclosure of Invention
The invention aims to provide a negative half-cycle waveform blanking amplitude sampling device aiming at the current situation.
The invention adopts the technical scheme that: the negative half-cycle waveform blanking amplitude sampling device comprises a signal conditioning circuit, a negative half-cycle blanking circuit, a filtering and port protecting circuit, a processor and a power supply circuit, wherein the power supply circuit is respectively and electrically connected with the signal conditioning circuit, the negative half-cycle blanking circuit, the filtering and port protecting circuit and the processor, the signal conditioning circuit is electrically connected with the negative half-cycle blanking circuit, the negative half-cycle blanking circuit is electrically connected with the filtering and port protecting circuit, the filtering and port protecting circuit is electrically connected with the processor, an access end for accessing signals is led out from the signal conditioning circuit, and the signal conditioning circuit processes the accessed signals and provides conditioning signals; the negative half cycle blanking circuit receives the conditioning signal and performs negative half cycle waveform elimination and amplification or attenuation treatment to finally provide a blanking signal; the filtering and port protection circuit receives the blanking signal, and provides an adjustment blanking signal after filtering and clamping; the processor receives the adjustment blanking signal and performs signal sampling on the adjustment blanking signal; the power supply circuit supplies power to the signal conditioning circuit, the negative half-cycle blanking circuit, the filtering and port protection circuit and the processor.
The invention has the following effects: the negative half-cycle waveform blanking amplitude sampling device realizes the negative half-cycle waveform blanking function, and still keeps higher sampling resolution under the conditions of large sampling value pressure difference and higher sampling precision requirement.
Drawings
FIG. 1 is a schematic diagram of a negative half-cycle waveform blanking amplitude sampling apparatus according to the present invention;
FIG. 2 is a schematic diagram of the negative half-cycle blanking circuit of FIG. 1;
FIG. 3 is a schematic diagram of the filtering and port protection circuit of FIG. 1;
in the figure: 1-signal conditioning circuit, 2-negative half-cycle blanking circuit, 3-filtering and port protection circuit, 4-processor and 5-power supply circuit.
Detailed Description
The negative half-cycle waveform blanking amplitude sampling device provided by the invention is described below with reference to the accompanying drawings:
referring to fig. 1, a negative half-cycle waveform blanking amplitude sampling apparatus provided by the present invention includes: the device comprises a signal conditioning circuit 1, a negative half-cycle blanking circuit 2, a filtering and port protection circuit 3, a processor 4 and a power supply circuit 5, wherein the power supply circuit 5 is respectively and electrically connected with the signal conditioning circuit 1, the negative half-cycle blanking circuit 2, the filtering and port protection circuit 3 and the processor 4, the signal conditioning circuit 1 is electrically connected with the negative half-cycle blanking circuit 2, the negative half-cycle blanking circuit 2 is electrically connected with the filtering and port protection circuit 3, the filtering and port protection circuit 3 is electrically connected with the processor 4, and an access end for accessing signals is led out from the signal conditioning circuit 1.
The signal conditioning circuit 1 processes the accessed signal and provides a conditioning signal, so that the output voltage of the conditioning signal and the rear-end negative half-cycle blanking circuit share a reference point. According to different design requirements, the signal conditioning circuit can perform various different processes, such as charge/voltage conversion, current/voltage conversion, frequency/voltage conversion, voltage/voltage conversion, impedance conversion, isolation conversion, and the like.
The negative half cycle blanking circuit 2 receives the conditioning signal and performs negative half cycle waveform elimination and amplification or attenuation processing, and finally provides a blanking signal, so that the positive half cycle waveform output by the negative half cycle blanking circuit meets the voltage requirement of the back-end processor.
The negative half-cycle blanking circuit 2 includes a two-way operational amplifier U1, a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a first capacitor C1, a third capacitor C3, a fourth capacitor C4, a first diode D1, and a second diode D2. One end of the first resistor R1 is used as an input end of the negative half-cycle blanking circuit 2 and is electrically connected with the signal conditioning circuit 1, the other end of the first resistor R1 is connected with a second pin of the two-way operational amplifier U1, a cathode of the first diode D1 and one end of the third resistor R3, an anode of the first diode D1 is connected with a first pin of the two-way operational amplifier U1, the other end of the third resistor R3 is connected with an anode of the second diode D2 and one end of the fourth resistor R4, a cathode of the second diode D2 is connected with a first pin of the operational amplifier U1, the other end of the fourth resistor R4 is connected with one end of the fifth resistor R5, one end of the first capacitor C1 and a sixth pin of the two-way operational amplifier U1, the other end of the fifth resistor R5 and the other end of the first capacitor C1 are connected with a seventh pin of the two-way operational amplifier U1, the other end of the second capacitor C1 is connected with the other end of the second resistor D4 and the other end of the two-way operational amplifier U1 is connected with the other end of the second resistor C1, the other end of the second resistor C1 is connected with the other end of the two-way operational amplifier U1 is connected with the other end of the second resistor C4, and the other end of the two-way operational amplifier is connected with the other end of the third resistor C1 is connected with the other end of the third resistor is connected with the other end of the three resistor is connected with the three end of the three resistor is 3.
In this embodiment, the specific model number of the two-way operational amplifier U1 is TL082.
In this embodiment, the specific model of the first diode D1 and the second diode D2 is ES1J.
In this embodiment, the resistance values of the first resistor R1 and the fourth resistor R4 are 20kΩ, and the resistance values of the second resistor R2, the third resistor R3, the fifth resistor R5, and the sixth resistor R6 are 10kΩ.
In the present embodiment, the capacitance value of the first capacitor C1 is 100pF, the capacitance value of the third capacitor C3 is 100nF, and the capacitance value of the fourth capacitor C4 is 100nF.
The working principle of the negative half-cycle blanking circuit 2 is described as follows:
when the waveform of the input signal Vi is in the positive half cycle, the first diode D1 is turned off, the second diode D2 is turned on, the two-way operational amplifier U1, the first resistor R1, the third resistor R3, and the second diode D2 form a path, and at this time, the two-way operational amplifier U1, the fourth resistor R4, and the fifth resistor R5 form a path to form a reverse proportional operational amplifier, so when the input waveform Vi is in the positive half cycle, the output voltage V of the circuit is shown in the formula:
the formula shows that when the input signal is positive half cycle, the output waveform is positive half cycle, and only the amplitude is processed by proper times, the amplification factor can be adjusted by changing the resistance values of R1, R3, R4 and R5, so that the amplification or attenuation of the waveform is realized.
When the waveform of the input signal Vi is in the negative half cycle, the first diode D1 is turned on, the second diode D2 is turned off, a path is formed among the two-way operational amplifier U1, the first resistor R1 and the first diode D1, and at this time, the two-way operational amplifier U1, the fourth resistor R4 and the fifth resistor R5 form a path to form a reverse proportional operational amplifier, and the output voltage thereof is 0V. Therefore, when the input signal Vi is negative half cycle, the output signal is always 0V.
The filtering and port protecting circuit 3 receives the blanking signal, and provides an adjusted blanking signal after filtering and clamping. The filtering and processor port protection circuit 3 mainly performs filtering and clamping functions on the output waveforms of the previous stage, and protects the AD sampling port on the processor 4 from being damaged by the output waveforms of the previous stage.
The filtering and port protecting circuit 3 includes a seventh resistor R7, a second capacitor C2, and a clamping diode D3. One end of the seventh resistor R7 is used as an input end of the filtering and port protection circuit and is connected with an output end of the negative half-cycle blanking circuit, the other end of the seventh resistor R7 is connected with one end of the second capacitor C2 and a third pin of the clamping diode D3, the other end of the second capacitor C2 is grounded, a first pin of the clamping diode D3 is grounded, and a port is led out from the third pin of the clamping diode D3 and used as an output end of the filtering and port protection circuit.
In this embodiment, the specific model of the clamping diode D3 is MMBD7000/SOT23.
In this embodiment, the resistance of the seventh resistor R7 is 1kΩ.
In this embodiment, the capacitance value of the second capacitor C2 is 1nF.
The processor 4 receives the adjusted blanking signal and signal samples the adjusted blanking signal.
The processor 4 is connected with the output end of the filtering and port protecting circuit.
The power supply circuit 5 supplies power to the signal conditioning circuit 1, the negative half-cycle blanking circuit 2, the filtering and port protection circuit 3 and the processor 4.
When the negative half-cycle waveform blanking amplitude sampling device is used, signals are input from the signal conditioning circuit 1, the signal conditioning circuit 1 processes the signals and sends the processed signals to the negative half-cycle blanking circuit 2, the negative half-cycle blanking circuit 2 carries out negative half-cycle blanking on the signals and sends the processed signals to the filtering and port protection circuit 3, the filtering and port protection circuit 3 sends the signals to the processor 4, and the processor 4 samples the signals.
The negative half-cycle waveform blanking amplitude sampling device realizes the negative half-cycle waveform blanking function, and still keeps higher sampling resolution under the conditions of large sampling value pressure difference and higher sampling precision requirement.
The foregoing description of the preferred embodiments of the invention is not intended to limit the invention to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and scope of the invention are intended to be included within the scope of the invention.
Claims (5)
1. A negative half-cycle waveform blanking amplitude sampling device, comprising: the signal conditioning circuit is electrically connected with the negative half-cycle blanking circuit, the negative half-cycle blanking circuit is electrically connected with the filtering and port protection circuit, the filtering and port protection circuit is electrically connected with the processor, an access end for accessing signals is led out from the signal conditioning circuit, and the signal conditioning circuit processes the accessed signals and provides conditioning signals; the negative half cycle blanking circuit receives the conditioning signal and performs negative half cycle waveform elimination and amplification or attenuation treatment to provide a blanking signal; the filtering and port protection circuit receives the blanking signal, and provides an adjustment blanking signal after filtering and clamping; the processor receives the adjustment blanking signal and performs signal sampling on the adjustment blanking signal; the power supply circuit supplies power to the signal conditioning circuit, the negative half-cycle blanking circuit, the filtering and port protection circuit and the processor; the negative half-cycle blanking circuit comprises a double-circuit operational amplifier, a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a first capacitor, a third capacitor, a fourth capacitor, a first diode and a second diode, wherein one end of the first resistor is used as an input end of the negative half-cycle blanking circuit and is electrically connected with the signal conditioning circuit, the other end of the first resistor is connected with a second pin of the double-circuit operational amplifier, a cathode of the first diode and one end of the third resistor, an anode of the first diode is connected with a first pin of the double-circuit operational amplifier, the other end of the third resistor is connected with an anode of the second diode and one end of the fourth resistor, a cathode of the second diode is connected with the first pin of the operational amplifier, the other end of the fourth resistor is connected with one end of the fifth resistor, one end of the first capacitor and a sixth pin of the double-path operational amplifier, the other end of the fifth resistor and the other end of the first capacitor are connected with a seventh pin of the double-path operational amplifier, a port is led out from the seventh pin of the double-path operational amplifier as an output end of a negative half-cycle blanking circuit, one end of the second resistor is connected with a third pin of the double-path operational amplifier, the other end of the second resistor is grounded, one end of the sixth resistor is connected with the fifth pin of the double-path operational amplifier, the other end of the sixth resistor is grounded, one end of the third capacitor is connected with an eighth pin of the double-path operational amplifier, the other end of the third capacitor is grounded, one end of the fourth capacitor is connected with a fourth pin of the double-path operational amplifier, the other end of the fourth capacitor is grounded, the resistance values of the first resistor R1 and the fourth resistor R4 are 20KΩ, and the resistance values of the second resistor R2, the third resistor R3, the fifth resistor R5 and the sixth resistor R6 are 10KΩ.
2. The negative half-cycle waveform blanking amplitude sampling device as set forth in claim 1, wherein the filter and port protection circuit includes a seventh resistor, a second capacitor and a clamp diode, one end of the seventh resistor is connected to the output of the negative half-cycle blanking circuit as an input of the filter and port protection circuit, the other end of the seventh resistor is connected to one end of the second capacitor and a third pin of the clamp diode, the other end of the second capacitor is grounded, a first pin of the clamp diode is grounded, and a third pin of the clamp diode leads out a port as an output of the filter and port protection circuit.
3. The negative half cycle waveform blanking amplitude sampling apparatus of claim 2, wherein the processor is coupled to an output of the filter and port protection circuit.
4. The negative half-cycle waveform blanking amplitude sampling apparatus as set forth in claim 3, wherein said two-way operational amplifier is specifically model TL082, and said first diode and said second diode are specifically model ES1J.
5. The negative half cycle waveform blanking amplitude sampling apparatus of claim 4, wherein the clamping diode is specifically model MMBD7000/SOT23.
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| CN201711128231.0A CN107817376B (en) | 2017-11-15 | 2017-11-15 | Negative half-cycle waveform blanking amplitude sampling device |
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| CN201711128231.0A CN107817376B (en) | 2017-11-15 | 2017-11-15 | Negative half-cycle waveform blanking amplitude sampling device |
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| CN107817376A CN107817376A (en) | 2018-03-20 |
| CN107817376B true CN107817376B (en) | 2023-09-05 |
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| CN205656227U (en) * | 2016-03-08 | 2016-10-19 | 武汉合康智能电气有限公司 | On -vehicle motor output current sampling circuit that fills |
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Address after: 430205 Floor 3, Multi storey Factory Building, Hekang Frequency Conversion (Wuhan) Industrial Park, No. 6, Fozuling Third Road, Donghu New Technology Development Zone, Wuhan, Hubei Province (Wuhan Area, Free Trade Zone) Applicant after: Wuhan Hezhi Digital Energy Technology Co.,Ltd. Address before: No.6, fozuling Third Road, Donghu Development Zone, Wuhan City, Hubei Province 430205 Applicant before: WUHAN HICONICS INTELLIGENT ELECTRIC CO.,LTD. |
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