CN107481764A - A kind of 3D Nand Flash scanning detection methods and system - Google Patents
A kind of 3D Nand Flash scanning detection methods and system Download PDFInfo
- Publication number
- CN107481764A CN107481764A CN201710641935.1A CN201710641935A CN107481764A CN 107481764 A CN107481764 A CN 107481764A CN 201710641935 A CN201710641935 A CN 201710641935A CN 107481764 A CN107481764 A CN 107481764A
- Authority
- CN
- China
- Prior art keywords
- block
- page
- damage
- templates
- memory block
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C29/32—Serial access; Scan testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The invention discloses a kind of 3D Nand Flash scanning detection methods and system, this method to include:Memory block is randomly selected by a certain percentage and carries out data error code test, damage page distributions and damage block distributions is obtained based on test result, it is page templates and block templates to mark it respectively;Memory block is grouped successively according to default packet parameters, based on page or/and block corresponding to page templates or/and the scanning of block templates, if there is no the page or block of damage, it is normal blocks then to mark this group of memory block, if there is the page or block of damage, then the memory block of the packet is scanned comprehensively;Scanning is all grouped and generates bad block table.The system is used to perform corresponding method.The present invention based on the memory block of bad distribution detection packet, the fine or not degree of memory block is judged according to testing result, can quickly realize the detection to memory block, be advantageous to improve formation efficiency by being tested local memory block to obtain bad distribution.
Description
Technical field
The present invention relates to a kind of 3D Nand Flash scanning detection methods and system, belong to technical field of memory.
Background technology
With computer, the high speed development of movable storage device, the movable storage device demand of Large Copacity is more and more extensive,
This requires storage device to have the stability of bigger capacity, faster speed and Geng Gao.Usual TF card, EMMC, SSD is logical
The Nand Flash using Large Copacity are crossed to meet the needs of mass-memory unit, the 3D NAND Flash solution that is announced to the world splendidly
Determine requirement of the movable storage device to capacity, but volume production sweep time oversize also turns into a very prominent contradiction simultaneously.
Scanning Detction currently for 3D Nand Flash is all scan full hard disk detection pattern, although testing result is more accurate,
The reason for detection time is oversize to cause volume production efficiency very low, can not ensure production efficiency, and memory block is damaged not is only
Vertical appearance, it is likely that can repeat to cause other memory blocks that same damage occurs.In summary, it is existing to be directed to 3D
Nand Flash Scanning Detction algorithm can not adapt to being actually needed, it is necessary to be improved of modern society.
The content of the invention
In order to solve the above problems, the present invention is by providing a kind of 3D Nand Flash scanning detection methods.
On the one hand the technical solution adopted by the present invention is a kind of 3D Nand Flash scanning detection methods, including:By certain
Ratio randomly selects memory block and carries out data error code test, and block points of damage page distributions and damage are obtained based on test result
Cloth, it is page templates and block templates to mark it respectively;Memory block is grouped successively according to default packet parameters, based on page
Page or/and block corresponding to template or/and the scanning of block templates, if there is no the page or block of damage, is then marked
This group of memory block is normal blocks, if there is the page or block of damage, then the memory block of the packet is scanned comprehensively;
Scanning is all grouped and generates bad block table.
Preferably, the data error code test includes carrying out reading and writing data, data and write-in when reading to each page
Data difference more than default error threshold then mark the page for damage page, record it in block position with life
Into damage page distributions.
Preferably, the data error code test includes carrying out reading and writing data, data and write-in when reading to each block
Data difference more than default error threshold then mark the block for damage block, record its position of memory block with
Generation damage block distributions.
Preferably, extra page distributions, block distributions are read in addition to;With reference to extra page distributions and page moulds
Plate, extra block distributions and block templates, generate new page templates and block templates.
Preferably, in addition to from page templates part page distributions are randomly choosed, is distributed and scanned based on part page
Whole memory blocks in packet, if there is no the page of damage, then it is normal blocks to mark this group of memory block, if there is damage
Page, then the memory block of the packet is scanned comprehensively.
Preferably, in addition to from packet memory block some memory blocks are randomly selected, is deposited based on block templates to what is selected
Storage block is scanned, and if there is no the block of damage, then it is normal blocks to mark this group of memory block, if there is damage
Block, then the memory block of the packet is scanned comprehensively.
On the other hand the technical solution adopted by the present invention is a kind of 3D Nand Flash scanning-detecting systems, for performing
The above method, including:Formwork module, data error code test is carried out for randomly selecting memory block by a certain percentage, based on test
As a result damage page distributions and damage block distributions are obtained, it is page templates and block templates to mark it respectively;Grouping module,
For being grouped memory block successively according to default packet parameters, based on page corresponding to page templates or/and the scanning of block templates
Or/and block, if there is no the page or block of damage, then it is normal blocks to mark this group of memory block, if there is damage
Page or block, then the memory block of the packet is scanned comprehensively;Scan module, all it is grouped and generates for scanning
Bad block table.
Beneficial effects of the present invention are by being tested local memory block to obtain bad distribution, based on bad distribution
The memory block of packet is detected, the fine or not degree of memory block is judged according to testing result, can quickly realize the detection to memory block,
Be advantageous to improve formation efficiency.
Brief description of the drawings
Fig. 1 show a kind of schematic diagram of 3D Nand Flash scanning detection methods based on the embodiment of the present invention.
Embodiment
The present invention will be described with reference to embodiments.
Embodiment based on invention, a kind of 3D Nand Flash scanning detection methods as shown in Figure 1, including:By certain ratio
Example randomly selects memory block and carries out data error code test, and damage page distributions and damage block distributions are obtained based on test result,
It is page templates and block templates to mark it respectively;Memory block is grouped successively according to default packet parameters, based on page templates
Or/and page or/and block corresponding to the scanning of block templates, if there is no the page or block of damage, then mark the group
Memory block is normal blocks, if there is the page or block of damage, then the memory block of the packet is scanned comprehensively;Scanning
All it is grouped and generates bad block table.
Due to industrial production be standardization operation, so if be damaged memory block the step of or flow if,
It is very possible also to influence whether other memory blocks, thus randomly selected in whole memory blocks 3% active block carry out it is advance
Detection;Specific detection method is read-write data, and difference occurs in the data meeting and the data of write-in read if memory block is damaged
The page or block that (i.e. error code) judges whether to belong to damage according to the degree of difference, record these page and block exists
The distribution situation of block/ memory blocks, the distribution situation are the template as subsequent detection, and it is page templates and block to mark it
Template;All memory blocks are carried out in order according to a default packet parameters (such as every 8 memory blocks are divided into one group)
Packet, is then based on page templates and block templates is scanned to memory block, if the page/block of correspondence position does not have
Damage (i.e. readwrite tests is out of question) then may determine that whole memory blocks of this packet are the good memory blocks of work, otherwise need
Whole memory blocks are scanned comprehensively.
And the generation method of page/block distributions is:Several memory blocks have some parts damaged, these parts
No matter occurrence number, as long as occur once damage, be increased by its position and determined into template or according to the number of appearance
It is fixed;
Such as a block includes page1~50, in 100 detections, the number that damaging occurs in page1 is 1, page2
The number for occurring damaging is that the number that damaging occurs in 55, page3 is 21 times, and all no damage occurred for other page4~50;
Template, which can then be generated, includes page1, page2 and page3;It can also generate that template only includes page2 and page3 (occurs
The number of damage can be ignored less than the page of certain threshold value).
The each packet of scanning successively, complete BBT (Bad Block Table) is obtained after completing all scannings.
Method based on embodiment, the data error code test includes carrying out reading and writing data to each page, when reading
The difference of data and the data of write-in then marks the page to record it in block for damage page more than default error threshold
Position with generate damage page distribution.
Several page form a block, and the page for recording damage is remembered in block position with generating page distributions
Record.
Method based on embodiment, the data error code test includes carrying out reading and writing data to each block, when reading
The difference of data and the data of write-in then marks the block to record it for damage block and storing more than default error threshold
The position of block is distributed with generating damage block.
Several block form a memory block group, record the block of damage in the position of memory block group to generate
Block distribution records.
Method based on embodiment, in addition to read extra page distributions, block distributions;With reference to extra page points
Cloth and page templates, extra block distributions and block templates, generate new page templates and block templates.
Sometimes, the page/block positions of many damage memory blocks are can confirm that according to client feedback, or at other
Detection process in find be easier produce damage page/block;
At this moment except the template detected originally, it is also necessary to increase these above-mentioned extra parts and detected, with reference to
Both simultaneously generate new template, are then detected according to the method for the above embodiments.
Method based on embodiment, in addition to page distributions in part are randomly choosed from page templates, based on the part
Whole memory blocks in page distribution scanning packets, if there is no the page of damage, then it is normal blocks to mark this group of memory block,
If there is the page of damage, then the memory block of the packet is scanned comprehensively.
There is some damages page occurrence number seldom, but be also included within template, for reasons of efficiency, can not
An only selection part is scanned using the page distributions of whole to be scanned, and can increase the efficiency of scanning.
Method based on embodiment, in addition to some memory blocks are randomly selected from packet memory block, based on block templates
The memory block selected is scanned, if there is no the block of damage, then it is normal blocks to mark this group of memory block, if deposited
In the block of damage, then the memory block of the packet is scanned comprehensively.
Some memory blocks (some quantity is less than packet parameters) are randomly selected from packet memory block, based on block moulds
Plate is scanned to the memory block selected.
Embodiment based on invention, a kind of 3D Nand Flash scanning-detecting systems, for performing the above method, including:
Formwork module, data error code test is carried out for randomly selecting memory block by a certain percentage, is obtained and damaged based on test result
Page is distributed and damage block distributions, and it is page templates and block templates to mark it respectively;Grouping module, for according to default
Packet parameters be grouped memory block successively, based on page templates or/and block templates scanning corresponding to page or/and block,
If there is no the page or block of damage, then it is normal blocks to mark this group of memory block, page if there is damage or
Block, then the memory block of the packet is scanned comprehensively;Scan module, all it is grouped for scanning and generates bad block table.
It is described above, simply presently preferred embodiments of the present invention, the invention is not limited in above-mentioned embodiment, as long as
It reaches the technique effect of the present invention with identical means, should all belong to protection scope of the present invention.In the protection model of the present invention
Its technical scheme and/or embodiment can have a variety of modifications and variations in enclosing.
Claims (7)
- A kind of 1. 3D Nand Flash scanning detection methods, it is characterised in that including:Memory block is randomly selected by a certain percentage and carries out data error code test, and damage page distributions and damage are obtained based on test result Bad block is distributed, and it is page templates and block templates to mark it respectively;Memory block is grouped successively according to default packet parameters, based on page corresponding to page templates or/and the scanning of block templates Or/and block, if there is no the page or block of damage, then it is normal blocks to mark this group of memory block, if there is damage Page or block, then the memory block of the packet is scanned comprehensively;Scanning is all grouped and generates bad block table.
- A kind of 2. 3D Nand Flash scanning detection methods according to claim 1, it is characterised in that the data error code Test includes carrying out reading and writing data to each page, when the data of reading and the difference of the data write are more than default error threshold Value then marks the page as damage page, records it in block position to generate damage page distributions.
- A kind of 3. 3D Nand Flash scanning detection methods according to claim 1, it is characterised in that the data error code Test includes carrying out reading and writing data to each block, when the data of reading and the difference of the data write are more than default error Threshold value then marks the block as damage block, records it in the position of memory block to generate damage block distributions.
- 4. a kind of 3D Nand Flash scanning detection methods according to claim 1, it is characterised in that also including reading volume Outer page is distributed, block distributions;With reference to extra page distributions and page templates, extra block distributions and block templates, new page templates are generated With block templates.
- 5. according to a kind of 3D Nand Flash scanning detection methods of claim 1 or 4, it is characterised in that also include from Page distributions in part are randomly choosed in page templates, whole memory blocks in scanning packet are distributed based on part page, if In the absence of the page of damage, then it is normal blocks to mark this group of memory block, if there is the page of damage, then to the storage of the packet Block is scanned comprehensively.
- 6. according to a kind of 3D Nand Flash scanning detection methods of claim 1 or 4, it is characterised in that also include from point Some memory blocks are randomly selected in group memory block, the memory block selected are scanned based on block templates, if there is no damage Bad block, then it is normal blocks to mark this group of memory block, if there is the block of damage, then the memory block of the packet is carried out Scanning comprehensively.
- 7. a kind of 3D Nand Flash scanning-detecting systems, the method for perform claim requirement 1, it is characterised in that including:Formwork module, data error code test is carried out for randomly selecting memory block by a certain percentage, is obtained and damaged based on test result Bad page is distributed and damage block distributions, and it is page templates and block templates to mark it respectively;Grouping module, for being grouped memory block successively according to default packet parameters, based on page templates or/and block templates Page corresponding to scanning or/and block, if there is no the page or block of damage, then it is normal to mark this group of memory block Block, if there is the page or block of damage, then the memory block of the packet is scanned comprehensively;Scan module, all it is grouped for scanning and generates bad block table.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710641935.1A CN107481764B (en) | 2017-07-31 | 2017-07-31 | 3D Nand Flash scanning detection method and system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710641935.1A CN107481764B (en) | 2017-07-31 | 2017-07-31 | 3D Nand Flash scanning detection method and system |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107481764A true CN107481764A (en) | 2017-12-15 |
CN107481764B CN107481764B (en) | 2020-06-12 |
Family
ID=60596960
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710641935.1A Active CN107481764B (en) | 2017-07-31 | 2017-07-31 | 3D Nand Flash scanning detection method and system |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN107481764B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108133732A (en) * | 2017-12-20 | 2018-06-08 | 北京京存技术有限公司 | Performance test methods, device, equipment and the storage medium of flash chip |
CN113051191A (en) * | 2021-03-05 | 2021-06-29 | 深圳三地一芯电子有限责任公司 | Method for increasing Flash chip capacity |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1577629A (en) * | 2003-07-29 | 2005-02-09 | 华为技术有限公司 | FLASH internal unit testing method |
CN1929034A (en) * | 2006-09-07 | 2007-03-14 | 华为技术有限公司 | Method and system for RAM fault testing |
CN102246241A (en) * | 2008-12-18 | 2011-11-16 | 桑迪士克股份有限公司 | Data refresh for non-volatile storage |
CN103077748A (en) * | 2011-10-25 | 2013-05-01 | 珠海扬智电子科技有限公司 | Static random access memory merged built-in self-test method |
CN103456366A (en) * | 2012-05-31 | 2013-12-18 | 爱思开海力士有限公司 | Semiconductor memory device including self-contained test unit and test method thereof |
US20150279485A1 (en) * | 2014-03-28 | 2015-10-01 | Lenovo (Singapore) Pte, Ltd. | Advanced memory test diagnostics |
CN106158047A (en) * | 2016-07-06 | 2016-11-23 | 深圳佰维存储科技股份有限公司 | A kind of NAND FLASH method of testing |
CN106205737A (en) * | 2016-07-06 | 2016-12-07 | 深圳佰维存储科技股份有限公司 | A kind of method testing Nand flash life cycle |
CN106648942A (en) * | 2016-09-06 | 2017-05-10 | 深圳忆数存储技术有限公司 | Data switching method and device based on flash storage medium |
-
2017
- 2017-07-31 CN CN201710641935.1A patent/CN107481764B/en active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1577629A (en) * | 2003-07-29 | 2005-02-09 | 华为技术有限公司 | FLASH internal unit testing method |
CN1929034A (en) * | 2006-09-07 | 2007-03-14 | 华为技术有限公司 | Method and system for RAM fault testing |
CN102246241A (en) * | 2008-12-18 | 2011-11-16 | 桑迪士克股份有限公司 | Data refresh for non-volatile storage |
CN103077748A (en) * | 2011-10-25 | 2013-05-01 | 珠海扬智电子科技有限公司 | Static random access memory merged built-in self-test method |
CN103456366A (en) * | 2012-05-31 | 2013-12-18 | 爱思开海力士有限公司 | Semiconductor memory device including self-contained test unit and test method thereof |
US20150279485A1 (en) * | 2014-03-28 | 2015-10-01 | Lenovo (Singapore) Pte, Ltd. | Advanced memory test diagnostics |
CN106158047A (en) * | 2016-07-06 | 2016-11-23 | 深圳佰维存储科技股份有限公司 | A kind of NAND FLASH method of testing |
CN106205737A (en) * | 2016-07-06 | 2016-12-07 | 深圳佰维存储科技股份有限公司 | A kind of method testing Nand flash life cycle |
CN106648942A (en) * | 2016-09-06 | 2017-05-10 | 深圳忆数存储技术有限公司 | Data switching method and device based on flash storage medium |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108133732A (en) * | 2017-12-20 | 2018-06-08 | 北京京存技术有限公司 | Performance test methods, device, equipment and the storage medium of flash chip |
CN113051191A (en) * | 2021-03-05 | 2021-06-29 | 深圳三地一芯电子有限责任公司 | Method for increasing Flash chip capacity |
Also Published As
Publication number | Publication date |
---|---|
CN107481764B (en) | 2020-06-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8418030B2 (en) | Storage system with data recovery function and method thereof | |
CN108052414B (en) | Method and system for improving working temperature range of SSD | |
US20160320451A1 (en) | Simulation verification method for fpga function modules and system thereof | |
JP4435833B2 (en) | Test equipment and selection equipment | |
CN107632778B (en) | Nand Flash scanning detection method and system | |
CN106486170A (en) | The potential bad block localization method of solid state hard disc and device | |
DE102017114078A1 (en) | ERROR WAKE-OFF FOR 3D NAND FLASH MEMORY | |
CN105097050B (en) | A kind of storage life test method | |
CN108039190A (en) | A kind of test method and device | |
CN102929740A (en) | Method and device for detecting bad block of storage equipment | |
CN107481764A (en) | A kind of 3D Nand Flash scanning detection methods and system | |
CN112579382A (en) | NVMe solid state disk bad block analysis method, device, terminal and storage medium | |
CN112216339A (en) | DRAM test method and device, readable storage medium and electronic equipment | |
CN113900903B (en) | Log storage device, log capturing method and storage medium | |
US6012157A (en) | System for verifying the effectiveness of a RAM BIST controller's ability to detect faults in a RAM memory using states indicating by fault severity information | |
CN114664369A (en) | Memory chip testing method and device | |
CN110444243A (en) | Store test method, system and the storage medium of equipment read error error correcting capability | |
CN105426314A (en) | Process mapping method for FPGA memory | |
CN102360568B (en) | Parallel asynchronous memory and data reading method thereof | |
CN106971757A (en) | A kind of method and system of inspection Nand Flash mass | |
CN103065687B (en) | The method of RAM production defect in parallel detection integrated circuit | |
CN116994631A (en) | ECC-based flash memory particle multiple screening method, controller and medium | |
CN108665941A (en) | Row restorative procedure, device and NAND memory device based on nand flash memory | |
CN115509466B (en) | Data management method and device, electronic equipment and storage medium | |
CN110444244A (en) | Store the test device of equipment read error error correcting capability |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |