CN107390014A - The horizontal measuring method of wavy load flicker emissions - Google Patents

The horizontal measuring method of wavy load flicker emissions Download PDF

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CN107390014A
CN107390014A CN201710724361.4A CN201710724361A CN107390014A CN 107390014 A CN107390014 A CN 107390014A CN 201710724361 A CN201710724361 A CN 201710724361A CN 107390014 A CN107390014 A CN 107390014A
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msub
voltage
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flicker
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CN107390014B (en
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朱明星
赵闪闪
高敏
朱安东
李令冬
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Anhui University
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    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract

The invention discloses a kind of horizontal measuring method of wavy load flicker emissions, this method can be to the horizontal progress On-line sampling system of flicker emissions of wavy load, assess division of responsibiltiy of the various wavy loads to utility grid voltage flickering, evaluate regulation effect of the power quality controlling device to voltage flicker, quality of power supply technical supervision and management more preferably are carried out to wavy load, influence of the wavy load to Network Voltage Stability is reduced, ensures the safe and stable operation of electricity supply and use equipment.

Description

The horizontal measuring method of wavy load flicker emissions
Technical field
The present invention relates to power system, new energy photovoltaic generation and technical field of wind power generation, more particularly to a kind of fluctuation Property the horizontal measuring method of load flicker emissions.
Background technology
Wavy load refers to that the change of its operating current has periodically or non-periodically, the load of suddenly change, such as electricity Arc stove, rolling mill, electrified traction load, new energy photovoltaic generation and wind-power electricity generation etc., generally wavy load Running has serious intermittence.There is the trend incrementally increased because wavy load accesses ratio in power system, Monomer capacity is also constantly increasing, and influenceing and endanger to caused by power network may be increasingly severe.Main adverse effect is fluctuation Property active power and reactive power destroy the stability of system operation voltage, cause power supply buses voltage pulsation with dodging Become, and then have impact on the safe and stable operation of all electrical equipments under bus.
It is horizontal to accurately measure the flicker emissions of monomer wavy load, is that quality of power supply technical supervision and pipe are carried out to it The premise of reason, still, power supply buses voltage fluctuation and flicker is individually caused to wavy load, and technical field, which has no, at present compares Ripe method.National standard GB12326-2008《Quality of power supply voltage fluctuation and flicker》In to introduce a kind of wavy load independent The measuring method of caused flickering value：Power supply buses prolonged flicker measurement value when screening result test fluctuation load is put into, is now surveyed The flickering value of examination includes flickering value caused by background flickering value and wavy load；Re-test is one section when wavy load exits Long-time flicker measurement value is as background flickering value in time；Finally background flickering value is removed according to certain algorithm, indirectly Obtain the flicker emissions value of wavy load.
Subject matter existing for this algorithm is that the voltage of power system is constantly in dynamic change, when tested fluctuation Background flickering value when load is out of service and when wavy load puts into operation must differ, first, the power of power system It is always time-varying that trend time-varying characteristics, which cause system voltage, second, numerous wavy load sources, quilt in power system be present Surveying when wavy load puts into operation may cause system voltage to fluctuate, and this voltage pulsation can be produced all to all wavy loads Influence, the flickering value of now power supply buses test is numerous fluctuation sources and the coefficient result of system background voltage pulsation.It is comprehensive It is upper described, it is impossible to caused by being simply considered that the only tested fluctuating load of change of power supply buses flickering value puts into operation, using state The method of border standard recommendation can not accurately measure flickering value caused by monomer fluctuating load.
It there is also an issue in practical engineering application, such as Large Copacity ac arc furnace, typically require that the quality of power supply is controlled Reason device (SVC device) puts into operation together with electric arc furnaces, and the power supply buses voltage flicker value that actual test obtains is fluctuation electric arc Flickering value of the stove load after power quality controlling, this flickering value can not truly reflect the flickering hair of monomer arc furnace load Jetting is put down, and this Large Copacity electrical equipment is not allow individually to put into operation, and therefore, is also tested caused by individually being put into operation less than it Voltage flicker emission level, how accurate measurement electric arc furnaces single devices flicker emissions level is a stubborn problem.
The content of the invention
, can be by surveying online it is an object of the invention to provide a kind of horizontal measuring method of wavy load flicker emissions The active power of examination wavy load operation and the mode of reactive power directly, accurately to calculate its flicker emissions level, gram The limitation at present on wavy load flicker measurement is taken.
The purpose of the present invention is achieved through the following technical solutions：
A kind of horizontal measuring method of wavy load flicker emissions, including：
Take the three-phase voltage of single-revolution ripple time window and the digital quantity of current signal to carry out discrete Fourier transform, obtain single-revolution The fundamental voltage of ripple and the phasor of fundamental current, so as to obtain the virtual value of system under test (SUT) three-phase fundamental voltage and fundamental current and Initial phase；And then after mobile half cycles time interval, take the three-phase voltage of single-revolution ripple time window and the digital quantity of current signal Carry out discrete Fourier transform next time；
Half cycles time interval is carried out according to the virtual value and initial phase of system under test (SUT) three-phase fundamental voltage and fundamental current Active power and reactive power calculate；
The baseline system impedance according to corresponding to calculating system under test (SUT) benchmark capacity of short circuit, then calculate half cycles time interval Active power and reactive power are separately injected into caused voltage pulsation value sequence after system under test (SUT), and voltage pulsation value sequence is done Discrete Fourier transform, obtain the magnitude of a voltage fluctuation of different frequency component；
It is according to visual sense degree coefficient corresponding to visual sense degree transmission characteristic function, the magnitude of a voltage fluctuation of different frequency component is equivalent To 8.8Hz magnitude of a voltage fluctuation, 8.8Hz sine voltages undulating value and the corresponding relation of flickering are recycled, calculates voltage flicker Value, so as to obtain Short Term Flicker and it is long when flickering statistical value, and then draw out wavy load flicker emissions level curve.
This method also includes：Using simultaneously and concurrently acquisition mode, gather system under test (SUT) power supply buses voltage and fluctuation The analog signal of load current, and by by synchronous ADC circuit conversion being data signal after corresponding filter circuit.
The formula for calculating the virtual value of system under test (SUT) three-phase fundamental voltage and fundamental current is：
Wherein, N be single-revolution ripple sampled point number, j be imaginary number unit, u (n) corresponded to respectively with i (n) three-phase voltage and The digital quantity of current signal, n therein number for sample sequence,WithThree-phase fundamental voltage and fundamental wave electricity are corresponded to respectively The virtual value of stream.
The active power for carrying out half cycles time interval and reactive power, which calculate, to be included：
M active-power PmCalculation formula it is as follows：
M reactive power QmCalculation formula it is as follows：
Qa,m(1)=Ua(1)Ia(1)sin(θa(1)-βa(1))
Qb,m(1)=Ub(1)Ib(1)sin(θb(1)-βb(1))
Qc,m(1)=Uc(1)Ic(1)sin(θc(1)-βc(1))
Qm=Qa,m(1)+Qb,m(1)+Qc,m(1)
Wherein,Ua(1),Ub(1),Uc(1) andIa(1),Ib(1),Ic(1) be respectively three-phase fundamental voltage and The virtual value of electric current；θa(1)、θb(1)、θcAnd β (1)a(1)、βb(1)、βc(1) be respectively three-phase fundamental voltage and electric current first phase Position；Subscript a, b, c are corresponding in turn to a phases, b phases, c phases；
The difference that consecutive points are done to the active power of half cycles time interval and reactive power calculated in unit interval t is transported Calculate, calculation formula is：
In formula, PmAnd QmThe respectively calculated value of m active power and reactive power；Pm+1And Qm+1Respectively m+1 times active The calculated value of power and reactive power；The time interval of the calculating of m times and m+1 times is half cycles.
The active power for calculating half cycles time interval and reactive power are separately injected into caused electricity after system under test (SUT) Pressure fluctuation value sequence includes：
The benchmark capacity of short circuit S of system under test (SUT) is determined according to wavy load access voltage class of electric power systemd, in conjunction with System under test (SUT) rated voltage UN, calculate system under test (SUT) baseline system impedance Xs：
So as to calculate the active power Δ P of half cycles time intervalmWith reactive power Δ QmDraw after being separately injected into system under test (SUT) The voltage pulsation value sequence risen：
Wherein, RSFor the resistance of system under test (SUT).
It is described that discrete Fourier transform is done to voltage pulsation value sequence, obtain the magnitude of a voltage fluctuation bag of different frequency component Include：
Discrete Fourier transform is done to the voltage pulsation value sequence d (n) of the half cycles time interval of unit interval length, when Between window value width be 6144 × 2 points, corresponding duration 122.88s, fundamental frequency f1=0.00814Hz, obtains different frequency The magnitude of a voltage fluctuation D (h) of component：
Wherein, N is the number of single-revolution ripple sampled point, and h=1 ..., 6144, harmonics frequency component corresponding to difference is hf1。
The visual sense degree coefficient according to corresponding to visual sense degree transmission characteristic function, by the magnitude of a voltage fluctuation of different frequency component The equivalent magnitude of a voltage fluctuation to 8.8Hz, 8.8Hz sine voltages undulating value and the corresponding relation of flickering are recycled, calculate voltage Flickering value, so as to obtain Short Term Flicker and it is long when flickering statistical value, and then draw out wavy load flicker emissions level Curve includes：
By the equivalent magnitude of a voltage fluctuation to 8.8Hz of the magnitude of a voltage fluctuation of different frequency component：
Wherein, K (f) is visual sense degree coefficient；
Voltage flicker value is calculated by the equivalent magnitude of a voltage fluctuation to 8.8Hz：
Pst=2.856dequ,8.8；
According to voltage flicker value PstObtain the statistical value P every 10min Short Term Flickerst,10：
When flickering statistical value PltBy the 10min short time flicker values P included in measuring sectionst,10Calculate and obtain：
Wherein, Pst,10kFor k-th of short time flicker value in time of measuring；
According to the Short Term Flicker that calculates and it is long when flickering statistical value, to draw out wavy load flicker emissions water Horizontal curve.
As seen from the above technical solution provided by the invention, the horizontal progress of flicker emissions of wavy load can be existed Line measures in real time, assesses division of responsibiltiy of the various wavy loads to utility grid voltage flickering, evaluation power quality controlling dress The regulation effect to voltage flicker is put, quality of power supply technical supervision and management more preferably are carried out to wavy load, reduces fluctuation The influence of Load on Electric Power Grid voltage stability, ensure the safe and stable operation of electricity supply and use equipment.
Brief description of the drawings
In order to illustrate the technical solution of the embodiments of the present invention more clearly, required use in being described below to embodiment Accompanying drawing be briefly described, it should be apparent that, drawings in the following description are only some embodiments of the present invention, for this For the those of ordinary skill in field, on the premise of not paying creative work, other can also be obtained according to these accompanying drawings Accompanying drawing.
Fig. 1 is a kind of flow chart of the horizontal measuring method of wavy load flicker emissions provided in an embodiment of the present invention；
Fig. 2 is the hardware configuration signal of the horizontal measuring method of wavy load flicker emissions provided in an embodiment of the present invention Figure；
Fig. 3 is input voltage circuit theory diagrams in hardware configuration provided in an embodiment of the present invention；
Fig. 4 is Anti-aliasing Filter Circuits schematic diagram in hardware configuration provided in an embodiment of the present invention；
Fig. 5 is that the test wiring of 150 tons of ac arc furnace power supply-distribution systems of certain enterprise provided in an embodiment of the present invention is illustrated Figure；
Fig. 6 is EAF stoves provided in an embodiment of the present invention, the total active power of LF stove three-phases and reactive power schematic diagram；
Fig. 7 is the change schematic diagram of EAF stoves provided in an embodiment of the present invention, LF stoves active power and reactive power；
Fig. 8 is EAF stoves provided in an embodiment of the present invention, LF stoves inlet wire individually causes 33kV buses under benchmark capacity of short circuit Voltage pulsation schematic diagram；
Fig. 9 be EAF stoves provided in an embodiment of the present invention, LF stoves inlet wire under benchmark capacity of short circuit, in certain time period 33kV busbar voltage fluctuation spectrum distribution schematic diagrames；
Figure 10 is the voltage flicker transmitting water of EAF stoves under benchmark capacity of short circuit provided in an embodiment of the present invention, LF stove inlet wires Horizontal curve.
Embodiment
With reference to the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete Ground describes, it is clear that described embodiment is only part of the embodiment of the present invention, rather than whole embodiments.Based on this The embodiment of invention, the every other implementation that those of ordinary skill in the art are obtained under the premise of creative work is not made Example, belongs to protection scope of the present invention.
Fig. 1 is a kind of flow chart of the horizontal measuring method of wavy load flicker emissions provided in an embodiment of the present invention, As shown in figure 1, it mainly comprises the following steps：
The digital quantity of step 1, the three-phase voltage for taking single-revolution ripple time window and current signal carries out discrete Fourier transform, obtains To the fundamental voltage of single-revolution ripple and the phasor of fundamental current, so as to obtain having for system under test (SUT) three-phase fundamental voltage and fundamental current Valid value and initial phase；And then after mobile half cycles time interval, take the three-phase voltage and current signal of single-revolution ripple time window Digital quantity carries out discrete Fourier transform next time.
In the embodiment of the present invention, using simultaneously and concurrently acquisition mode, gather system under test (SUT) power supply buses voltage and fluctuation Property load current analog signal, and by after corresponding filter circuit by synchronous ADC circuit conversion for numeral believe Number.Related hardware circuit as shown in Fig. 2 the computer in Fig. 2 can be used for performing step 1 of the embodiment of the present invention~step 4, Input voltage circuit theory diagrams are as shown in figure 3, Anti-aliasing Filter Circuits schematic diagram is as shown in Figure 4.
Exemplary, the hardware circuit can be 12.8kHz/s, i.e. standard for the data acquiring frequency of each passage 50Hz sine wave gathers per cycle at 256 points.By such a hardware circuit, by three-phase (a, b, c) voltage ua(t)、ub(t)、 ucAnd electric current i (t)a(t)、ib(t)、ic(t) digital quantity u is converted to by analog quantitya(n)、ub(n)、ucAnd i (n)a(n)、ib(n)、 ic(n), n numbers for sample sequence.
In the embodiment of the present invention, the three-phase voltage of single-revolution ripple time window and the digital quantity of current signal is taken to carry out direct computation of DFT Leaf transformation, the fundamental voltage of single-revolution ripple and the phasor of fundamental current are obtained, so as to obtain system under test (SUT) three-phase fundamental voltage and base The virtual value and initial phase of ripple electric current；Wherein, the formula of the virtual value of system under test (SUT) three-phase fundamental voltage and fundamental current is calculated For：
Wherein, N be single-revolution ripple sampled point number, j be imaginary number unit, u (n) corresponded to respectively with i (n) three-phase voltage and The digital quantity of current signal, n therein number for sample sequence,WithThree-phase fundamental voltage and fundamental wave electricity are corresponded to respectively The virtual value of stream.
The calculating of discrete Fourier transform terminates, then after moving half cycles time interval, takes single-revolution ripple time window The digital quantity of voltage and current signal carries out discrete Fourier transform next time.
Step 2, according to the virtual value and initial phase of system under test (SUT) three-phase fundamental voltage and fundamental current carry out half cycles when Between the active power that is spaced and reactive power calculate.
M active-power PmCalculation formula it is as follows：
M reactive power QmCalculation formula it is as follows：
Qa,m(1)=Ua(1)Ia(1)sin(θa(1)-βa(1))
Qb,m(1)=Ub(1)Ib(1)sin(θb(1)-βb(1))
Qc,m(1)=Uc(1)Ic(1)sin(θc(1)-βc(1))
Qm=Qa,m(1)+Qb,m(1)+Qc,m(1)
Wherein,Ua(1),Ub(1),Uc(1) andIa(1),Ib(1),Ic(1) be respectively three-phase fundamental voltage and The virtual value of electric current；θa(1)、θb(1)、θcAnd β (1)a(1)、βb(1)、βc(1) be respectively three-phase fundamental voltage and electric current first phase Position；Subscript a, b, c are corresponding in turn to a phases, b phases, c phases；
The difference that consecutive points are done to the active power of half cycles time interval and reactive power calculated in unit interval t is transported Calculate, calculation formula is：
In formula, PmAnd QmThe respectively calculated value of m active power and reactive power；Pm+1And Qm+1Respectively m+1 times active The calculated value of power and reactive power；The time interval of the calculating of m times and m+1 times is half cycles.
Step 3, the baseline system impedance according to corresponding to calculating system under test (SUT) benchmark capacity of short circuit, then calculate the half cycles time The active power and reactive power at interval are separately injected into caused voltage pulsation value sequence after system under test (SUT), and to magnitude of a voltage fluctuation Sequence does discrete Fourier transform, obtains the magnitude of a voltage fluctuation of different frequency component.
The benchmark capacity of short circuit of system under test (SUT), GBT are determined according to wavy load access voltage class of electric power system 14549-93《Quality of power supply utility network harmonic wave》In provide the benchmark capacity of short circuit of each voltage class：0.38kV is 10MVA； 10kV is 100MVA, 35kV 250MVA, 110kV 750MVA.
In conjunction with system under test (SUT) rated voltage UN, calculate system under test (SUT) baseline system impedance Xs：
So as to calculate the active power Δ P of half cycles time intervalmWith reactive power Δ QmDraw after being separately injected into system under test (SUT) The voltage pulsation value sequence risen：
Wherein, RSFor the resistance of system under test (SUT), generally RS=XS/ p, high-pressure system p value are 7~10.
Step 4, the visual sense degree coefficient according to corresponding to visual sense degree transmission characteristic function, by the voltage pulsation of different frequency component It is worth the equivalent magnitude of a voltage fluctuation to 8.8Hz, recycles 8.8Hz sine voltages undulating value and the corresponding relation of flickering, calculates electricity Press flickering value, so as to obtain Short Term Flicker and it is long when flickering statistical value, and then draw out wavy load flicker emissions level Curve.
Discrete Fourier transform is done to the voltage pulsation value sequence d (n) of the half cycles time interval of unit interval length, when Between window value width be 6144 × 2 points, corresponding duration 122.88s, fundamental frequency f1=0.00814Hz, obtains different frequency The magnitude of a voltage fluctuation D (h) of component：
Wherein, N be single-revolution ripple sampled point number, h=1 ..., 6144, respectively corresponding to harmonics frequency component be hf1。
Afterwards, by the equivalent magnitude of a voltage fluctuation to 8.8Hz of the magnitude of a voltage fluctuation of different frequency component：
Wherein, K (f) is visual sense degree coefficient,
The formula provided by 4.10.1 in IEC 61000-4-15 standards：
In formula：P0.1、P1、P3、P10、P50Be respectively instantaneous vermicularizing alloy more than 0.1%, 1%, 3%, 10%, 50% when Between perceive unit value.
Fluctuated for periodic sine voltage, it is contemplated that P0.1=P1=P3=P10=P50=S (t)
Voltage flicker value is then calculated by the equivalent magnitude of a voltage fluctuation to 8.8Hz：
Pst=2.856dequ,8.8；
According to voltage flicker value PstObtain the statistical value P every 10min Short Term Flickerst,10：
When flickering statistical value PltBy the 10min short time flicker values P included in measuring sectionst,10Calculate and obtain：
Wherein, Pst,10kFor k-th of short time flicker value in time of measuring；
According to the Short Term Flicker that calculates and it is long when flickering statistical value, to draw out wavy load flicker emissions water Horizontal curve, it is then possible to assess division of responsibiltiy of the various wavy loads to utility grid voltage flickering, the evaluation quality of power supply is controlled Regulation effect of the device to voltage flicker is managed, quality of power supply technical supervision and management preferably are carried out to wavy load, is reduced Influence of the wavy load to Network Voltage Stability, ensure the safe and stable operation of electricity supply and use equipment.
In order to make it easy to understand, illustrated with reference to a specific example；It should be noted that adopted in following examples Numerical value is only for example, and user can do corresponding change according to the demand of reality.
This example is 150 tons of ac arc furnaces of certain enterprise, and the distribution system has one section of 33kV bus, and this section of bus is by one 180MVA transformer-supplieds, live lotus main loads are EAF stoves, LF stoves and SVC device.150 tons of ac arc furnaces of certain enterprise supply The test wiring schematic diagram of distribution system is as shown in Figure 5.
Using such scheme provided in an embodiment of the present invention, test obtains the electric current and 33kV buses of EAF stoves, LF stove inlet wires The service data of voltage.
(1) instrument is by electric arc furnaces 33kV bus three-phase voltages ua(t)、ub(t)、ucAnd EAF stoves, LF stove inlet wire currents (t) iEAFa(t)、iEAFb(t)、iEAFc(t)、iLFa(t)、iLFb(t)、iLFc(t) digital quantity u is converted to by analog quantitya(n)、ub(n)、uc And i (n)EAFa(n)、iEAFb(n)、iEAFc(n)、iLFa(n)、iLFb(n)、iLFc(n), n numbers for sample sequence.
(2) digital quantity of the three-phase voltage to single-revolution ripple time window and current signal carries out discrete Fourier transform, obtains The fundamental voltage and electric current phasor of single-revolution ripple time interval, 33kV busbar voltages and EAF stoves, LF stoves can be calculated according to the phasor The fundamental wave virtual value and initial phase of inlet wire current.
(3) the 33kV bus three-phase fundamental voltages and EAF stoves that half cycles time interval are calculated, LF stove inlet wire currents Virtual value carries out fundamental power calculating with initial phase, obtains EAF stoves, the total active power of LF stove three-phases and reactive power, P1And Q1Such as Shown in Fig. 6, wherein, Fig. 6 a, Fig. 6 b correspond to EAF stove inlet wires active power, EAF stove inlet wire reactive powers respectively；Fig. 6 c, Fig. 6 d points LF stove inlet wires active power, LF stove inlet wire reactive powers are not corresponded to.
(4) consecutive points are done to the total active power of half cycles time interval three-phase and reactive power that are calculated in time of measuring Calculus of differences, try to achieve the changes delta P of active power and reactive powernWith Δ Qn, as shown in fig. 7, wherein, Fig. 7 a, Fig. 7 b are right respectively Answer EAF stove inlet wire active power changes deltas Pn, EAF stove inlet wire reactive power changes deltas Qn；Fig. 7 c, Fig. 7 d correspond to LF stoves and entered respectively Line active power changes delta Pn, LF stove inlet wire reactive power changes deltas Qn。
(5) system busbar is 33kV, and benchmark capacity of short circuit takes 250MVA, and calculating benchmark system impedance, resistance are：
According to formulaCalculate EAF stoves, LF stoves inlet wire places an order in benchmark capacity of short circuit Solely cause the voltage pulsation of 33kV buses, as shown in figure 8, wherein Fig. 8 a, Fig. 8 b correspond to EAF stoves, LF stove primary voltage ripples respectively It is dynamic.
(6) discrete fourier change is done to magnitude of a voltage fluctuation d (n) sequences of the half cycles time interval of unit interval length Change, the width of time window is 6144 × 2 points, corresponding duration 122.88s, corresponding fundamental frequency f1=0.00814Hz, EAF stove, LF Stove inlet wire is under benchmark capacity of short circuit, 33kV busbar voltage fluctuations spectrum distribution in certain time period, as shown in figure 9, wherein scheming 9a, Fig. 9 b correspond to EAF stoves, LF stoves primary voltage fluctuation spectrum distribution respectively.
(7) defined according to visual sense degree COEFFICIENT K (f)：
It is 6144 × 2 points by the width of time window, a length of 122.88s undulating value amplitude of each frequency component etc. when corresponding Imitate the calculating of 8.8Hz voltage pulsations：
(8) short time voltage flickering is calculated to 8.8Hz magnitude of a voltage fluctuation according to each frequency component in the 122.88s times is equivalent Value：
Pst=2.856dequ,8.8
The voltage flicker emission level curve of EAF stoves under benchmark capacity of short circuit, LF stove inlet wires is obtained, as shown in Figure 10, its Middle Figure 10 a, Figure 10 b correspond to the quasi- capacity of short circuit flickering tendency chart of EAF stoves, LF furnace foundations respectively.
(9) P calculated more thanstThe Short Term Flicker value P every 10min is obtained using following formulast,10：
By the counted P of above-mentioned formulast,10Short Term Flicker value, and then it is horizontal to draw electric arc furnaces EAF stoves, the flicker emissions of LF stoves Curve.
Find out that the method can assess various fluctuations by the flicker emissions level measurement method of electric arc furnaces EAF stoves, LF stoves Load single devices are to the division of responsibiltiy of utility grid voltage flickering, improvement of the evaluation power quality controlling device to voltage flicker Effect.The interference that Short Term Flicker value is applied to single flicker source is evaluated.For the running situation of more flicker sources, or work duty Than indefinite, and single flicker source of long-play, it is necessary to make long-time flickering.
Through the above description of the embodiments, those skilled in the art can be understood that above-described embodiment can To be realized by software, the mode of necessary general hardware platform can also be added by software to realize.Based on such understanding, The technical scheme of above-described embodiment can be embodied in the form of software product, the software product can be stored in one it is non-easily In the property lost storage medium (can be CD-ROM, USB flash disk, mobile hard disk etc.), including some instructions are causing a computer to set Standby (can be personal computer, server, or network equipment etc.) performs the method described in each embodiment of the present invention.
The foregoing is only a preferred embodiment of the present invention, but protection scope of the present invention be not limited thereto, Any one skilled in the art is in the technical scope of present disclosure, the change or replacement that can readily occur in, It should all be included within the scope of the present invention.Therefore, protection scope of the present invention should be with the protection model of claims Enclose and be defined.

Claims (7)

  1. A kind of 1. horizontal measuring method of wavy load flicker emissions, it is characterised in that including：
    Take the three-phase voltage of single-revolution ripple time window and the digital quantity of current signal to carry out discrete Fourier transform, obtain single-revolution ripple The phasor of fundamental voltage and fundamental current, so as to obtain the virtual value of system under test (SUT) three-phase fundamental voltage and fundamental current and first phase Position；And then after mobile half cycles time interval, the three-phase voltage of single-revolution ripple time window and the digital quantity of current signal is taken to carry out Discrete Fourier transform next time；
    Having for half cycles time interval is carried out according to the virtual value and initial phase of system under test (SUT) three-phase fundamental voltage and fundamental current Work(power and reactive power calculate；
    The baseline system impedance according to corresponding to calculating system under test (SUT) benchmark capacity of short circuit, then calculate the active of half cycles time interval Power and reactive power are separately injected into caused voltage pulsation value sequence after system under test (SUT), and voltage pulsation value sequence are done discrete Fourier transformation, obtain the magnitude of a voltage fluctuation of different frequency component；
    According to visual sense degree coefficient corresponding to visual sense degree transmission characteristic function, arrive the magnitude of a voltage fluctuation of different frequency component is equivalent 8.8Hz magnitude of a voltage fluctuation, 8.8Hz sine voltages undulating value and the corresponding relation of flickering are recycled, calculate voltage flicker value, So as to obtain Short Term Flicker and it is long when flickering statistical value, and then draw out wavy load flicker emissions level curve.
  2. A kind of 2. horizontal measuring method of wavy load flicker emissions according to claim 1, it is characterised in that the party Method also includes：Using simultaneously and concurrently acquisition mode, the mould by system under test (SUT) power supply buses voltage and wavy load electric current is gathered Intend signal, and by by synchronous ADC circuit conversion being data signal after corresponding filter circuit.
  3. 3. the horizontal measuring method of a kind of wavy load flicker emissions according to claim 1, it is characterised in that calculate The formula of the virtual value of system under test (SUT) three-phase fundamental voltage and fundamental current is：
    <mrow> <mfenced open = "{" close = ""> <mtable> <mtr> <mtd> <mrow> <mover> <mi>U</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>=</mo> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>n</mi> <mo>=</mo> <mn>0</mn> </mrow> <mrow> <mi>N</mi> <mo>-</mo> <mn>1</mn> </mrow> </munderover> <mi>u</mi> <mrow> <mo>(</mo> <mi>n</mi> <mo>)</mo> </mrow> <msup> <mi>e</mi> <mrow> <mo>-</mo> <mi>j</mi> <mfrac> <mrow> <mn>2</mn> <mi>&amp;pi;</mi> </mrow> <mi>N</mi> </mfrac> </mrow> </msup> <mo>=</mo> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>n</mi> <mo>=</mo> <mn>0</mn> </mrow> <mrow> <mi>N</mi> <mo>-</mo> <mn>1</mn> </mrow> </munderover> <mi>u</mi> <mrow> <mo>(</mo> <mi>n</mi> <mo>)</mo> </mrow> <mrow> <mo>(</mo> <mi>cos</mi> <mfrac> <mrow> <mn>2</mn> <mi>&amp;pi;</mi> <mi>n</mi> </mrow> <mi>N</mi> </mfrac> <mo>-</mo> <mi>j</mi> <mi> </mi> <mi>sin</mi> <mfrac> <mrow> <mn>2</mn> <mi>&amp;pi;</mi> <mi>n</mi> </mrow> <mi>N</mi> </mfrac> <mo>)</mo> </mrow> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <mover> <mi>I</mi> <mo>&amp;CenterDot;</mo> </mover> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>=</mo> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>n</mi> <mo>=</mo> <mn>0</mn> </mrow> <mrow> <mi>N</mi> <mo>-</mo> <mn>1</mn> </mrow> </munderover> <mi>i</mi> <mrow> <mo>(</mo> <mi>n</mi> <mo>)</mo> </mrow> <msup> <mi>e</mi> <mrow> <mo>-</mo> <mi>j</mi> <mfrac> <mrow> <mn>2</mn> <mi>&amp;pi;</mi> </mrow> <mi>N</mi> </mfrac> </mrow> </msup> <mo>=</mo> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>n</mi> <mo>=</mo> <mn>0</mn> </mrow> <mrow> <mi>N</mi> <mo>-</mo> <mn>1</mn> </mrow> </munderover> <mi>i</mi> <mrow> <mo>(</mo> <mi>n</mi> <mo>)</mo> </mrow> <mrow> <mo>(</mo> <mi>cos</mi> <mfrac> <mrow> <mn>2</mn> <mi>&amp;pi;</mi> <mi>n</mi> </mrow> <mi>N</mi> </mfrac> <mo>-</mo> <mi>j</mi> <mi> </mi> <mi>sin</mi> <mfrac> <mrow> <mn>2</mn> <mi>&amp;pi;</mi> <mi>n</mi> </mrow> <mi>N</mi> </mfrac> <mo>)</mo> </mrow> </mrow> </mtd> </mtr> </mtable> </mfenced> <mo>;</mo> </mrow>
    Wherein, N is the number of single-revolution ripple sampled point, and j is the unit of imaginary number, and u (n) corresponds to three-phase voltage and electric current respectively with i (n) The digital quantity of signal, n therein number for sample sequence,WithThree-phase fundamental voltage and fundamental current are corresponded to respectively Virtual value.
  4. 4. the horizontal measuring method of a kind of wavy load flicker emissions according to claim 1, it is characterised in that described The active power and reactive power calculating for carrying out half cycles time interval include：
    M active-power PmCalculation formula it is as follows：
    <mrow> <mtable> <mtr> <mtd> <mrow> <msub> <mi>P</mi> <mrow> <mi>a</mi> <mo>,</mo> <mi>m</mi> </mrow> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>=</mo> <msub> <mi>U</mi> <mi>a</mi> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <msub> <mi>I</mi> <mi>a</mi> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mi>cos</mi> <mrow> <mo>(</mo> <msub> <mi>&amp;theta;</mi> <mi>a</mi> </msub> <mo>(</mo> <mn>1</mn> <mo>)</mo> <mo>-</mo> <msub> <mi>&amp;beta;</mi> <mi>a</mi> </msub> <mo>(</mo> <mn>1</mn> <mo>)</mo> <mo>)</mo> </mrow> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msub> <mi>P</mi> <mrow> <mi>b</mi> <mo>,</mo> <mi>m</mi> </mrow> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>=</mo> <msub> <mi>U</mi> <mi>b</mi> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <msub> <mi>I</mi> <mi>b</mi> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mi>cos</mi> <mrow> <mo>(</mo> <msub> <mi>&amp;theta;</mi> <mi>b</mi> </msub> <mo>(</mo> <mn>1</mn> <mo>)</mo> <mo>-</mo> <msub> <mi>&amp;beta;</mi> <mi>b</mi> </msub> <mo>(</mo> <mn>1</mn> <mo>)</mo> <mo>)</mo> </mrow> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msub> <mi>P</mi> <mrow> <mi>c</mi> <mo>,</mo> <mi>m</mi> </mrow> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>=</mo> <msub> <mi>U</mi> <mi>c</mi> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <msub> <mi>I</mi> <mi>c</mi> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mi>cos</mi> <mrow> <mo>(</mo> <msub> <mi>&amp;theta;</mi> <mi>c</mi> </msub> <mo>(</mo> <mn>1</mn> <mo>)</mo> <mo>-</mo> <msub> <mi>&amp;beta;</mi> <mi>c</mi> </msub> <mo>(</mo> <mn>1</mn> <mo>)</mo> <mo>)</mo> </mrow> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msub> <mi>P</mi> <mi>m</mi> </msub> <mo>=</mo> <msub> <mi>P</mi> <mrow> <mi>a</mi> <mo>,</mo> <mi>m</mi> </mrow> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>+</mo> <msub> <mi>P</mi> <mrow> <mi>b</mi> <mo>,</mo> <mi>m</mi> </mrow> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> <mo>+</mo> <msub> <mi>P</mi> <mrow> <mi>c</mi> <mo>.</mo> <mi>m</mi> </mrow> </msub> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> </mrow> </mtd> </mtr> </mtable> <mo>;</mo> </mrow>
    M reactive power QmCalculation formula it is as follows：
    Qa,m(1)=Ua(1)Ia(1)sin(θa(1)-βa(1))
    Qb,m(1)=Ub(1)Ib(1)sin(θb(1)-βb(1))
    Qc,m(1)=Uc(1)Ic(1)sin(θc(1)-βc(1))
    Qm=Qa,m(1)+Qb,m(1)+Qc,m(1)
    Wherein,Ua(1),Ub(1),Uc(1) andIa(1),Ib(1),Ic(1) it is respectively three-phase fundamental voltage and electric current Virtual value；θa(1)、θb(1)、θcAnd β (1)a(1)、βb(1)、βc(1) be respectively three-phase fundamental voltage and electric current initial phase；Under Mark a, b, c are corresponding in turn to a phases, b phases, c phases；
    The calculus of differences of consecutive points is done to the active power of half cycles time interval and reactive power calculated in unit interval t, Calculation formula is：
    <mrow> <mfenced open = "{" close = ""> <mtable> <mtr> <mtd> <mrow> <msub> <mi>&amp;Delta;P</mi> <mi>m</mi> </msub> <mo>=</mo> <msub> <mi>P</mi> <mrow> <mi>m</mi> <mo>+</mo> <mn>1</mn> </mrow> </msub> <mo>-</mo> <msub> <mi>P</mi> <mi>m</mi> </msub> </mrow> </mtd> </mtr> <mtr> <mtd> <mrow> <msub> <mi>&amp;Delta;Q</mi> <mi>m</mi> </msub> <mo>=</mo> <msub> <mi>Q</mi> <mrow> <mi>m</mi> <mo>+</mo> <mn>1</mn> </mrow> </msub> <mo>-</mo> <msub> <mi>Q</mi> <mi>m</mi> </msub> </mrow> </mtd> </mtr> </mtable> </mfenced> <mo>;</mo> </mrow>
    In formula, PmAnd QmThe respectively calculated value of m active power and reactive power；Pm+1And Qm+1Respectively m+1 active power With the calculated value of reactive power；The time interval of the calculating of m times and m+1 times is half cycles.
  5. 5. the horizontal measuring method of a kind of wavy load flicker emissions according to claim 1, it is characterised in that described The active power and reactive power for calculating half cycles time interval are separately injected into caused voltage pulsation value sequence after system under test (SUT) Including：
    The benchmark capacity of short circuit S of system under test (SUT) is determined according to wavy load access voltage class of electric power systemd, in conjunction with tested System nominal voltage UN, calculate system under test (SUT) baseline system impedance Xs：
    <mrow> <msub> <mi>X</mi> <mi>s</mi> </msub> <mo>=</mo> <mfrac> <mrow> <msup> <msub> <mi>U</mi> <mi>N</mi> </msub> <mn>2</mn> </msup> </mrow> <msub> <mi>S</mi> <mi>d</mi> </msub> </mfrac> <mo>;</mo> </mrow>
    So as to calculate the active power Δ P of half cycles time intervalmWith reactive power Δ QmIt is separately injected into caused by after system under test (SUT) Voltage pulsation value sequence：
    <mrow> <mi>d</mi> <mrow> <mo>(</mo> <mi>n</mi> <mo>)</mo> </mrow> <mo>=</mo> <mfrac> <mrow> <msub> <mi>R</mi> <mi>s</mi> </msub> <msub> <mi>&amp;Delta;P</mi> <mi>m</mi> </msub> <mo>+</mo> <msub> <mi>X</mi> <mi>s</mi> </msub> <msub> <mi>&amp;Delta;Q</mi> <mi>m</mi> </msub> </mrow> <msubsup> <mi>U</mi> <mi>N</mi> <mn>2</mn> </msubsup> </mfrac> <mo>&amp;times;</mo> <mn>100</mn> <mi>%</mi> <mo>;</mo> </mrow>
    Wherein, RSFor the resistance of system under test (SUT).
  6. 6. the horizontal measuring method of a kind of wavy load flicker emissions according to claim 1, it is characterised in that described Discrete Fourier transform is done to voltage pulsation value sequence, obtaining the magnitude of a voltage fluctuation of different frequency component includes：
    Discrete Fourier transform, time window are done to the voltage pulsation value sequence d (n) of the half cycles time interval of unit interval length Value width is 6144 × 2 points, corresponding duration 122.88s, fundamental frequency f1=0.00814Hz, obtain different frequency component Magnitude of a voltage fluctuation D (h)：
    <mrow> <mi>D</mi> <mrow> <mo>(</mo> <mi>h</mi> <mo>)</mo> </mrow> <mo>=</mo> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>n</mi> <mo>=</mo> <mn>0</mn> </mrow> <mrow> <mi>N</mi> <mo>-</mo> <mn>1</mn> </mrow> </munderover> <mi>d</mi> <mrow> <mo>(</mo> <mi>n</mi> <mo>)</mo> </mrow> <msup> <mi>e</mi> <mrow> <mo>-</mo> <mi>j</mi> <mfrac> <mrow> <mn>2</mn> <mi>&amp;pi;</mi> <mi>n</mi> <mi>h</mi> </mrow> <mi>N</mi> </mfrac> </mrow> </msup> <mo>=</mo> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>n</mi> <mo>=</mo> <mn>0</mn> </mrow> <mrow> <mi>N</mi> <mo>-</mo> <mn>1</mn> </mrow> </munderover> <mi>d</mi> <mrow> <mo>(</mo> <mi>n</mi> <mo>)</mo> </mrow> <mrow> <mo>(</mo> <mi>cos</mi> <mfrac> <mrow> <mn>2</mn> <mi>&amp;pi;</mi> </mrow> <mi>N</mi> </mfrac> <mi>n</mi> <mi>h</mi> <mo>-</mo> <mi>j</mi> <mi> </mi> <mi>sin</mi> <mfrac> <mrow> <mn>2</mn> <mi>&amp;pi;</mi> </mrow> <mi>N</mi> </mfrac> <mi>n</mi> <mi>h</mi> <mo>)</mo> </mrow> </mrow>
    Wherein, N is the number of single-revolution ripple sampled point, and h=1 ..., 6144, harmonics frequency component corresponding to difference is hf1。
  7. 7. the horizontal measuring method of a kind of wavy load flicker emissions according to claim 6, it is characterised in that described According to visual sense degree coefficient corresponding to visual sense degree transmission characteristic function, 8.8Hz is arrived by the magnitude of a voltage fluctuation of different frequency component is equivalent Magnitude of a voltage fluctuation, recycle the corresponding relation of 8.8Hz sine voltages undulating value and flickering, calculate voltage flicker value, so as to Obtain Short Term Flicker and it is long when flickering statistical value, and then draw out wavy load flicker emissions level curve and include：
    By the equivalent magnitude of a voltage fluctuation to 8.8Hz of the magnitude of a voltage fluctuation of different frequency component：
    <mrow> <msub> <mi>d</mi> <mrow> <mi>e</mi> <mi>q</mi> <mi>u</mi> <mo>,</mo> <mn>8.8</mn> </mrow> </msub> <mo>=</mo> <msup> <mrow> <mo>(</mo> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>h</mi> <mo>=</mo> <mn>1</mn> </mrow> <mn>6144</mn> </munderover> <msup> <mi>K</mi> <mn>2</mn> </msup> <mo>(</mo> <mrow> <msub> <mi>hf</mi> <mn>1</mn> </msub> </mrow> <mo>)</mo> <msup> <mi>D</mi> <mn>2</mn> </msup> <mo>(</mo> <mrow> <msub> <mi>hf</mi> <mn>1</mn> </msub> </mrow> <mo>)</mo> <mo>)</mo> </mrow> <mfrac> <mn>1</mn> <mn>2</mn> </mfrac> </msup> <mo>;</mo> </mrow>
    Wherein, K (f) is visual sense degree coefficient；
    Voltage flicker value is calculated by the equivalent magnitude of a voltage fluctuation to 8.8Hz：
    Pst=2.856dequ,8.8；
    According to voltage flicker value PstObtain the statistical value P every 10min Short Term Flickerst,10：
    <mrow> <msub> <mi>P</mi> <mrow> <mi>s</mi> <mi>t</mi> <mo>,</mo> <mn>10</mn> </mrow> </msub> <mo>=</mo> <mroot> <mrow> <mfrac> <mn>1</mn> <mn>4</mn> </mfrac> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>j</mi> <mo>=</mo> <mn>1</mn> </mrow> <mn>4</mn> </munderover> <msup> <mrow> <mo>(</mo> <msub> <mi>P</mi> <mrow> <mi>s</mi> <mi>t</mi> <mi>j</mi> </mrow> </msub> <mo>)</mo> </mrow> <mn>3</mn> </msup> </mrow> <mn>3</mn> </mroot> <mo>;</mo> </mrow>
    When flickering statistical value PltBy the 10min short time flicker values P included in measuring sectionst,10Calculate and obtain：
    <mrow> <msub> <mi>P</mi> <mrow> <mi>l</mi> <mi>t</mi> </mrow> </msub> <mo>=</mo> <mroot> <mrow> <mfrac> <mn>1</mn> <mn>12</mn> </mfrac> <munderover> <mo>&amp;Sigma;</mo> <mrow> <mi>k</mi> <mo>=</mo> <mn>1</mn> </mrow> <mn>12</mn> </munderover> <msup> <mrow> <mo>(</mo> <msub> <mi>P</mi> <mrow> <mi>s</mi> <mi>t</mi> <mo>,</mo> <mn>10</mn> <mi>k</mi> </mrow> </msub> <mo>)</mo> </mrow> <mn>3</mn> </msup> </mrow> <mn>3</mn> </mroot> <mo>;</mo> </mrow>
    Wherein, Pst,10kFor k-th of short time flicker value in time of measuring；
    According to the Short Term Flicker that calculates and it is long when flickering statistical value, to draw out wavy load flicker emissions horizontal loop Line.
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