CN107328999A - A kind of method of parameter value needed for acquisition calculates sheet material dielectric constant - Google Patents

A kind of method of parameter value needed for acquisition calculates sheet material dielectric constant Download PDF

Info

Publication number
CN107328999A
CN107328999A CN201710641252.6A CN201710641252A CN107328999A CN 107328999 A CN107328999 A CN 107328999A CN 201710641252 A CN201710641252 A CN 201710641252A CN 107328999 A CN107328999 A CN 107328999A
Authority
CN
China
Prior art keywords
sheet material
dielectric constant
parameter value
value needed
polishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710641252.6A
Other languages
Chinese (zh)
Inventor
乐禄安
孙保玉
周文涛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Suntak Multilayer PCB Co Ltd
Original Assignee
Shenzhen Suntak Multilayer PCB Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Suntak Multilayer PCB Co Ltd filed Critical Shenzhen Suntak Multilayer PCB Co Ltd
Priority to CN201710641252.6A priority Critical patent/CN107328999A/en
Publication of CN107328999A publication Critical patent/CN107328999A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617Measuring dielectric properties, e.g. constants
    • G01R27/2623Measuring-systems or electronic circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The present invention relates to the calculating field of dielectric constant values, the method of parameter value needed for specially a kind of acquisition calculates sheet material dielectric constant, the present invention, come the top line width of the thickness of sheet material measurement dielectric layer, the thickness of impedance line, the bottom line width of impedance line and impedance line, then calculates the dielectric constant of material by the physical method of micro- section by above-mentioned parameter.Allow to assess the validity for the dielectric constant values that supplier provides, the prepreg sheet material of prepreg mixed pressure sheet material and different gel contents for some different sizes, effective dielectric constant can be calculated, accurate parameter is provided for PCB design, it is ensured that the quality of pcb board.

Description

A kind of method of parameter value needed for acquisition calculates sheet material dielectric constant
Technical field
Ginseng needed for sheet material dielectric constant is calculated the present invention relates to the calculating field of dielectric constant values, more particularly to a kind of obtain The method of numerical value.
Background technology
Dielectric constant (dielectric constant) just refers to the Dk values of material, also known as capacitivity or relative permitivity, Characterize a significant data of dielectric or insulating materials electrical property.It refers to that in same capacitor be electric Jie with same substance The ratio of electric capacity when matter and vacuum, represents that dielectric stores the relative ability of electrostatic energy in the electric field, relative dielectric constant is cured Small insulating properties is better.
Dielectric constant also illustrates that material increases the measurement of condenser capacitance ability for vacuum for another aspect. When the capacitivity of insulating materials is larger, the transmission energy in signal wire, which has much to be stored, to be held in sheet material, causes signal complete The problems such as whole property is poor, signal quality is not good and transmission rate slows down.
In the PCB using high-frequency transmission, the Dk values of material are to influence the factor of signal velocity.Dk values are smaller to letter Number propagation it is more favourable.Because Dk values influence the impedance of PCB upward wirings, join so Dk values are critically important in PCB design one Number.
At present, the Dk values of all core plates and PP pieces (prepreg) are all provided by supplier, the Dk values that supplier provides Mostly it is theoretical value, therefore the validity of the Dk values of supplier's offer has to be assessed.Proved by our long-term calculating, for What sheet material and the PP pieces of different gel contents that the PP pieces of different size are combined, the True Data of calculating and supplier provided Dk values are generally widely different, and the error of Dk values have impact on the degree of accuracy of the impedance of PCB upward wirings, and the degree of accuracy of impedance have impact on again The spread speed of signal, therefore, it is necessary to reappraise dielectric constant in PCB design, just can guarantee that the signal of pcb board is passed Speed is broadcast, can just meet the demand that market is propagated at a high speed PCB signals.
The content of the invention
The present invention is in view of the above-mentioned problems, provide a kind of physical method by micro- section come needed for survey calculation dielectric constant The method of parameter value.
To achieve the above object, the present invention uses following technical scheme:
The method of parameter value, comprises the following steps needed for a kind of acquisition calculates sheet material dielectric constant:
S1, the micro- section of section making for intercepting sheet material, wherein sheet material are provided with impedance line, cut during interception section along impedance line Face is intercepted;
S2, the thickness of sheet material measurement dielectric layer, the thickness of impedance line, the bottom line width and the top line of impedance line of impedance line Width, obtains calculating the parameter value needed for sheet material dielectric constant.
Further, in S1 steps, micro- section makes in accordance with the following steps:
S1, sheet material is intercepted by saw or shearing machine, sample is cut in acquisition;
S2, using sand paper the section for cutting sample is polished, form flat surface grinding;
S3, flat surface grinding is processed by shot blasting, forms burnishing surface, obtain micro- section.
Further, after polishing, in addition to microetch processing is carried out to burnishing surface.
Further, microetch processing is performed such:It is stained with cotton rod after micro-corrosion liquid is wiped 2~3 seconds along burnishing surface at once Dry.
Further, micro-corrosion liquid includes ammoniacal liquor, water and hydrogen peroxide, and wherein ammoniacal liquor is that 45~55cc, water are 45~55cc, dioxygen Water is 5~10 drops, and the concentration of the hydrogen peroxide is 1~8g/L, and the concentration of the ammoniacal liquor is 25%~28%.
Further, polishing is performed such:Polishing flannelet is drenched, polishing fluid polishing flannelet is poured into, repeatedly Flat surface grinding is wiped, burnishing surface is formed.
Further, polishing fluid includes polishing powder and water, and the wherein volume ratio of polishing powder and water is 1:5.
Further, the wherein maximum particle diameter of polishing powder is below 0.3 μm, and the hardness of polishing powder is in Mohs' hardness below 9.
Further, fully shaken up before using polishing fluid.
Compared with prior art, the beneficial effects of the invention are as follows:The present invention is cutd open sheet material by the physical method of micro- section Open, accurately obtain the section of micro- section, then thickness by sheet material measurement dielectric layer, the thickness of impedance line, the bottom of impedance line The top line width of line width and impedance line, accurately obtains above-mentioned data, and the dielectric constant of material is then calculated by above-mentioned parameter. It is more accurate by the dielectric constant values after calculating compared with the data that supplier provides, provide accurate number for PCB design According to, it is ensured that ensure the signal velocity of pcb board.
Brief description of the drawings
The invention will be further described below in conjunction with the accompanying drawings:
Fig. 1 is the structural representation that sample is cut described in embodiment.
Embodiment
In order to more fully understand the technology contents of the present invention, with reference to specific embodiment to technical scheme It is described further and illustrates.
Embodiment
Reference picture 1, the present invention provides a kind of method of parameter value needed for obtaining calculating sheet material dielectric constant, including following step Suddenly:
S1, by shearing machine intercept sheet material 1, wherein sheet material 1 be provided with impedance line 2, interception section when enter along the section of impedance line 2 Sample is cut in row interception, acquisition;
S2, using sand paper the section for cutting sample is polished, first roughly ground, washed by water in right amount in process of lapping with 800 sand paper, used To reduce the heat of friction generation and play a part of lubrication;Then 2500 fine grindings, and the oblique surface of the askew mill of equating mill are used instead, Form flat surface grinding;
S3, flat surface grinding is processed by shot blasting, what polishing was performed such:It is 1 by the volume ratio of polishing powder and water: 5 mixing, the wherein maximum particle diameter of polishing powder is below 0.3 μm, and the hardness of polishing powder is in Mohs' hardness below 9;Using polishing Fully shaken up before liquid;Polishing flannelet is drenched, the polishing fluid after shaking up is poured into polishing flannelet, is wiped repeatedly and polishes Face, forms burnishing surface;
After S4, polishing, in addition to microetch processing is carried out to burnishing surface.Microetch processing is performed such:Allotment is micro- Lose liquid:50cc pure water, 50cc ammoniacal liquor (concentration 26%), 8 drop hydrogen peroxide (concentration is 6g/L) are mixed, micro-corrosion liquid is obtained;Use cotton Hedysarum scoparium is stained with after micro-corrosion liquid is wiped 2~3 seconds along burnishing surface to be dried at once, obtains micro- section.
S5, the thickness H1 with the dielectric layer of impedometer sheet material measurement 1, the thickness T1 of impedance line 2, the bottom of impedance line 2 Line width W1 and impedance line 2 top line width W2, obtain calculating the parameter value needed for the dielectric constant of sheet material 1.
S6, by the thickness H1 of the dielectric layer of sheet material 1, the thickness T1 of impedance line 2, impedance line 2 bottom line width W1, impedance line 2 Top line width W2 and the dielectric layer dielectric constant ε of sheet material 1rThe software for calculation of input meter dielectric constant, calculates sheet material 1 after pressing Dielectric constant.
Comparative example:A kind of Dk values for sheet material that supplier provides are 4.5, and we are by measuring and calculating actual Dk Value is 4.8, and actual Dk values differ 0.3 with the Dk values that supplier provides, if not calculating the Dk values of design, and supplier is provided Dk values bring formula calculating simulation impedance into, then the calculating of impedance will be badly influenced, thus have influence on PCB signal pass Defeated speed.Therefore, 4.8 actual Dk values are chosen when calculating simulation impedance, as a result can be more accurate.
The present invention is by the physical method of micro- section come the thickness of the dielectric layer of sheet material measurement 1, the thickness of impedance line 2, impedance The bottom line width of line 2 and the top line width of impedance line 2, then calculate the dielectric constant of material by above-mentioned parameter.So that can With the validity for the dielectric constant values for assessing supplier's offer, prepreg mixed pressure sheet material 1 for some different sizes and not With the prepreg sheet material 1 of gel content, effective dielectric constant can be calculated, accurate parameter is provided for PCB design so that There is no the producer of Dk measuring instruments, effective Dk values can also be calculated, it is ensured that the quality of pcb board.
The technology contents described above that the present invention is only further illustrated with embodiment, in order to which reader is easier to understand, But embodiments of the present invention are not represented and are only limitted to this, and any technology done according to the present invention extends or recreated, and is sent out by this Bright protection.

Claims (9)

1. a kind of method of parameter value needed for acquisition calculates sheet material dielectric constant, it is characterised in that comprise the following steps:
S1, the micro- section of section making for intercepting sheet material, wherein the sheet material is provided with impedance line, cut during interception section along impedance line Face is intercepted;
S2, the thickness of sheet material measurement dielectric layer, the thickness of impedance line, the top line width of the bottom line width of impedance line and impedance line, Obtain calculating the parameter value needed for sheet material dielectric constant.
The method of parameter value needed for 2. acquisition according to claim 1 calculates sheet material dielectric constant, it is characterised in that in institute State in S1 steps, micro- section makes in accordance with the following steps:
S1, sheet material is intercepted by saw or shearing machine, sample is cut in acquisition;
S2, using sand paper the section for cutting sample is polished, form flat surface grinding;
S3, flat surface grinding is processed by shot blasting, forms burnishing surface, obtain micro- section.
The method of parameter value needed for 3. acquisition according to claim 2 calculates sheet material dielectric constant, it is characterised in that:Throwing After light processing, in addition to microetch processing is carried out to burnishing surface.
The method of parameter value needed for 4. acquisition according to claim 3 calculates sheet material dielectric constant, it is characterised in that:It is described Microetch processing is performed such:It is stained with after micro-corrosion liquid is wiped 2~3 seconds along burnishing surface and is dried at once with cotton rod.
The method of parameter value needed for 5. acquisition according to claim 4 calculates sheet material dielectric constant, it is characterised in that:It is described Micro-corrosion liquid includes ammoniacal liquor, water and hydrogen peroxide, and wherein ammoniacal liquor is that 45~55cc, water are that 45~55cc, hydrogen peroxide are 5~10 drops, institute The concentration for stating hydrogen peroxide is 1~8g/L, and the concentration of the ammoniacal liquor is 25%~28%.
The method of parameter value needed for 6. acquisition according to claim 2 calculates sheet material dielectric constant, it is characterised in that:It is described What polishing was performed such:Polishing flannelet is drenched, polishing fluid is poured into polishing flannelet, flat surface grinding is wiped repeatedly, is formed Burnishing surface.
The method of parameter value needed for 7. acquisition according to claim 6 calculates sheet material dielectric constant, it is characterised in that:It is described Polishing fluid includes polishing powder and water, and the wherein volume ratio of polishing powder and water is 1:5.
The method of parameter value needed for 8. acquisition according to claim 7 calculates sheet material dielectric constant, it is characterised in that:Wherein The maximum particle diameter of polishing powder is below 0.3 μm, and the hardness of polishing powder is in Mohs' hardness below 9.
The method of parameter value needed for 9. acquisition according to claim 6 calculates sheet material dielectric constant, it is characterised in that:Make Fully shaken up with before polishing fluid.
CN201710641252.6A 2017-07-31 2017-07-31 A kind of method of parameter value needed for acquisition calculates sheet material dielectric constant Pending CN107328999A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710641252.6A CN107328999A (en) 2017-07-31 2017-07-31 A kind of method of parameter value needed for acquisition calculates sheet material dielectric constant

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710641252.6A CN107328999A (en) 2017-07-31 2017-07-31 A kind of method of parameter value needed for acquisition calculates sheet material dielectric constant

Publications (1)

Publication Number Publication Date
CN107328999A true CN107328999A (en) 2017-11-07

Family

ID=60200829

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710641252.6A Pending CN107328999A (en) 2017-07-31 2017-07-31 A kind of method of parameter value needed for acquisition calculates sheet material dielectric constant

Country Status (1)

Country Link
CN (1) CN107328999A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109241692A (en) * 2018-11-14 2019-01-18 郑州云海信息技术有限公司 A kind of method and apparatus of data processing
CN109275259A (en) * 2018-09-20 2019-01-25 郑州云海信息技术有限公司 A kind of production method of pcb board and a kind of pcb board
CN109581068A (en) * 2018-11-27 2019-04-05 深圳崇达多层线路板有限公司 A kind of effective dielectric constant assessment test method and system
CN113033140A (en) * 2021-03-02 2021-06-25 深圳市一博科技股份有限公司 Simulation method for accurately obtaining difference of dielectric constants of upper layer and lower layer of PCB (printed Circuit Board) wiring
CN114076886A (en) * 2020-08-20 2022-02-22 深南电路股份有限公司 Establishing method for correcting PCB dielectric constant model, correcting method and correcting system

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0758243A (en) * 1993-08-19 1995-03-03 Murata Mfg Co Ltd Semiconductor package
CN201255633Y (en) * 2008-10-08 2009-06-10 惠州美锐电子科技有限公司 Apparatus for detecting wire width and distance of printed circuit board
CN102186308A (en) * 2011-03-11 2011-09-14 深圳市崇达电路技术股份有限公司 Fabricating method for micro-slice and vacuuming device for fabricating micro-slice
CN103792127A (en) * 2014-01-24 2014-05-14 西安空间无线电技术研究所 Preparation method of LTCC (Low Temperature Co-fired Ceramic) section sample
CN103983498A (en) * 2014-04-24 2014-08-13 江苏迈世达电子有限公司 Microetch liquid used for analyzing metallographic slice and application method thereof
CN105163483A (en) * 2015-09-10 2015-12-16 珠海城市职业技术学院 Circuit board Dk testing pattern and circuit board Dk testing method
CN105928462A (en) * 2016-07-08 2016-09-07 晶科能源有限公司 Method for measuring thickness of photovoltaic solar energy material

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0758243A (en) * 1993-08-19 1995-03-03 Murata Mfg Co Ltd Semiconductor package
CN201255633Y (en) * 2008-10-08 2009-06-10 惠州美锐电子科技有限公司 Apparatus for detecting wire width and distance of printed circuit board
CN102186308A (en) * 2011-03-11 2011-09-14 深圳市崇达电路技术股份有限公司 Fabricating method for micro-slice and vacuuming device for fabricating micro-slice
CN103792127A (en) * 2014-01-24 2014-05-14 西安空间无线电技术研究所 Preparation method of LTCC (Low Temperature Co-fired Ceramic) section sample
CN103983498A (en) * 2014-04-24 2014-08-13 江苏迈世达电子有限公司 Microetch liquid used for analyzing metallographic slice and application method thereof
CN105163483A (en) * 2015-09-10 2015-12-16 珠海城市职业技术学院 Circuit board Dk testing pattern and circuit board Dk testing method
CN105928462A (en) * 2016-07-08 2016-09-07 晶科能源有限公司 Method for measuring thickness of photovoltaic solar energy material

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
刘仁志: "《印制板电镀》", 30 September 2008 *

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109275259A (en) * 2018-09-20 2019-01-25 郑州云海信息技术有限公司 A kind of production method of pcb board and a kind of pcb board
CN109241692A (en) * 2018-11-14 2019-01-18 郑州云海信息技术有限公司 A kind of method and apparatus of data processing
CN109241692B (en) * 2018-11-14 2021-10-29 郑州云海信息技术有限公司 Data processing method and device
CN109581068A (en) * 2018-11-27 2019-04-05 深圳崇达多层线路板有限公司 A kind of effective dielectric constant assessment test method and system
CN114076886A (en) * 2020-08-20 2022-02-22 深南电路股份有限公司 Establishing method for correcting PCB dielectric constant model, correcting method and correcting system
CN113033140A (en) * 2021-03-02 2021-06-25 深圳市一博科技股份有限公司 Simulation method for accurately obtaining difference of dielectric constants of upper layer and lower layer of PCB (printed Circuit Board) wiring
CN113033140B (en) * 2021-03-02 2023-12-29 深圳市一博科技股份有限公司 Simulation method for accurately obtaining dielectric constant difference of upper and lower layers of PCB wiring

Similar Documents

Publication Publication Date Title
CN107328999A (en) A kind of method of parameter value needed for acquisition calculates sheet material dielectric constant
CN104575663B (en) Electrode slurry and preparation method thereof
CN104558688A (en) Filler composition and application thereof
CN101221100A (en) Production method for crumbly rock sample slide glass
CN106813966A (en) A kind of EBSD analysis preparation method of low-carbon (LC) steel sample
CN107000050A (en) Silver powder and preparation method thereof and conductive hydrophilic slurry
CN107353007A (en) A kind of diamond/silicon carbide composite and preparation method thereof
CN103983498A (en) Microetch liquid used for analyzing metallographic slice and application method thereof
CN110606698B (en) Microwave composite dielectric substrate with high uniformity and low thermal expansion coefficient and preparation process thereof
CN108181308A (en) The method for displaying metallographic structure of metal powder
CN105252018A (en) Method for preparing high-compaction bright sheet-shaped silver powder
CN113881287A (en) Water-based graphene conductive ink composition, water-based graphene conductive ink, and preparation method and application thereof
Ryley Analysis of a polydisperse aqueous spray from a high-speed spinning disk atomizer
CN104777061A (en) Rapid determination method for content of hot water-soluble substances in paper-making reconstituted tobacco
CN102186308A (en) Fabricating method for micro-slice and vacuuming device for fabricating micro-slice
CN103913396A (en) Method for determining fiber content in fiber reinforced concrete
CN103175494B (en) The measuring method of the coat of metal
CN105382265A (en) Method for preparing high-dispersion silver powder for photoetching touch screen silver paste
CN105784532A (en) Continuous determination method for rare earth oxide, calcium oxide and magnesium oxide in rare earth ore concentrate
TWI567756B (en) A conductive paste composition for forming conductive thin film on a flexible substrate and a method for producing the same
CN106625191A (en) Processing method of silicon nitride ceramic ball
CN106769169A (en) A kind of preparation method of printed circuit board failed areas sample
Alisha et al. Ultrasonic studies on binary liquid mixtures of triethylamine with carbitols at 308.15 K
CN109293992A (en) A kind of nitrocotton confuses technique
CN106243827B (en) A kind of thermosetting ink of the anti-chemical nickel and gold of selectivity

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20171107

RJ01 Rejection of invention patent application after publication