CN107167079A - Height of materials and evenness measuring system, measuring method and its method for self-calibrating - Google Patents
Height of materials and evenness measuring system, measuring method and its method for self-calibrating Download PDFInfo
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- CN107167079A CN107167079A CN201710394819.4A CN201710394819A CN107167079A CN 107167079 A CN107167079 A CN 107167079A CN 201710394819 A CN201710394819 A CN 201710394819A CN 107167079 A CN107167079 A CN 107167079A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention provides a kind of height of materials and evenness measuring system, measuring method and its method for self-calibrating, including laser profile sensor, rotating mechanism, motor controller, wherein, the laser profile sensor is arranged at the lower section of the rotating mechanism, and positioned at the surface of tested material, the shaft axis of the rotating mechanism, the measurement line of laser profile sensor and the line of charging basket center line three coincidence for placing material, the motor is arranged at the top of the rotating mechanism, the controller is connected with the motor and the laser profile sensor respectively, the motor drives the rotating mechanism to rotate under the control of the controller, the controller reads the measurement result of the laser profile sensor, so as to obtain the height and flatness information of material, spin-scan formula measurement of the present invention based on line laser, realize that super large-scale height of materials and flatness are synchronously detected, with higher measurement accuracy, faster measuring speed and more preferable adaptability.
Description
Technical field
The present invention relates to material field of measuring technique, and in particular to a kind of height of materials and evenness measuring system, measurement
Method and its method for self-calibrating.
Background technology
The height and flatness detection of material, are the conventionally test demands of national economy multiple fields.For example, being made in white wine
Make in the technological process of production, loaded steamer is one of committed step therein, " loose, light, accurate, thin, even, flat " is traditional work of loaded steamer
Skill requirement, going out gas porosity that the quality of wine and the efficiency of distillation are loaded with fermented grain etc. has direct relation.Technological requirement is that side leads to
Top layer does not become flat during steam side uploading in rice steamer, successively uniform spreading, loaded steamer, and air flue distribution is even in fermented grain dissipates unobstructed (not calming the anger).
It is always that field condition is combined by experienced senior technician in traditional mode of production, judges the quantity of filler, opportunity, spreading region simultaneously
Manually operated.This mode of operation has that labor intensity is big, spreading quality is unstable, senior skilled worker's culture is difficult, labor
The drawbacks of power cost is high, hygienic conditions are poor.
The method for being presently available for height of materials and the real-time non-contact detecting of flatness, mainly has ultrasonic method, radar method, swashs
Light method etc..Ultrasonic method is to reach surface of material by sending a branch of ultrasonic beam, and reflected signal is obtained after reflection, so that
Go out the height of material.Because sound wave is in the divergence characterization in space, ultrasonic method is only capable of measuring the height of material, and can not measure material
The flatness on surface, and easily disturbed by the secondary reflection signal of side wall and cause precision and reliability not high.Radar method
It is to reach surface of material by sending a branch of radar wave, is followed by by reflection by radar signal reflected, so as to realize height of materials
Measurement.Due to radar wave in space equally with divergence characterization, radar method is also only capable of measuring the height of material, and can not measure
The flatness of surface of material, and equally easily disturbed by the secondary reflection signal of side wall and cause precision and reliability not
It is high.Laser method is to reach surface of material by sending one laser beam, reflected signal is obtained after reflection, so as to draw material
Height.Because laser beam has fabulous collimation and focus characteristics, laser method can not only measure the height of material, but also can
To measure the flatness of surface of material, and the secondary reflection signal interference of side wall will not be produced, relative to other metering systems,
All there is advantage, thus the prefered method as height of materials and roughness measurement in terms of high accuracy, speed, reliability.
The principle of laser measurement is generally divided into impulse method, phase method and laser triangulation, due to measurement range and precision
Difference, three kinds of principles are respectively suitable for different fields.Impulse method is by calculating transmitting laser pulse with receiving laser pulse
Time difference calculate target range.Impulse method is applied to more than thousands of kilometers of remote ranging scene, is not suitable for closely
Ranging.On the other hand, impulse method can only send dot laser, therefore also be not suitable for measuring the flatness of wide area.Phase
Method is sentenced by continuously modulating pulse to objective emission, and by comparing transmission signal and receiving the phase difference between signal
The distance of disconnected target, it is adaptable to which several meters to up to a hundred meters of ranging scene, precision can not meet demand during small-range.And phase method
Also dot laser can only be sent, therefore is also not suitable for measuring the flatness of wide area.Laser triangulation is to utilize laser hair
The point or line laser beam that go out, measurement, therefore, laser three realized by the triangular relationship between measured target and receiving device
Horn cupping is especially suitable for elevation carrection closely.
But, because the detection of material has relative particularity and difficulty.Firstly, since height of materials is particularly smooth
Degree belongs to three-dimensional information, and conventional laser displacement sensor and two-dimensional silhouette sensor can not directly meet detection demand;Its
Secondary, material belongs to loose type particle in itself, and surface of material shape is inevitably present various uncertain and irregular random
Property, it is also possible to shade phenomenon and measurement dead angle are produced, conventional laser test system can not typically meet requirement;And producing
Cheng Zhong, the height of material is a process for progressively accumulating formation, is inevitably present randomness and regularly blocks existing
As, thus can not directly apply existing laser test system;
In summary, the material characteristic and environmental difference at different market scenes are very big, the laser test system of single general-purpose
The Different field differentiated demand of different clients can not be met.
The content of the invention
The above mentioned problem existed for current height of materials and Road Roughness Test System, the present invention proposes a kind of height of materials
And evenness measuring system, measuring method and its method for self-calibrating, the spin-scan formula measurement based on line laser, realize super large model
The height of materials and flatness enclosed is synchronously detected, and is fitted with higher measurement accuracy, faster measuring speed and preferably
Ying Xing.
The application is achieved using following technical scheme:
A kind of height of materials and evenness measuring system, including laser profile sensor, rotating mechanism, motor and control
Device, wherein, the laser profile sensor is arranged at the lower section of the rotating mechanism, and positioned at the surface of tested material, institute
State the shaft axis of rotating mechanism, the measurement line of laser profile sensor and place the line of charging basket center line three coincidence of material, institute
State the top that motor is arranged at the rotating mechanism, the controller respectively with the motor and the laser profile sensor
It is connected, the motor drives the rotating mechanism to rotate under the control of the controller, the controller reads the laser
The measurement result of profile sensor, so as to obtain the height and flatness information of material.
Further, the laser profile sensor includes laser, transmitting microscope group, receives microscope group, CMOS faces battle array sensing
Device and processing unit, the beam of laser that the laser is sent through it is described transmitting microscope group after formed it is a branch of have certain segment angle and
The line laser of one fixed width invests the charging basket, and one is formed on the surface at the top of the charging basket, the side wall of charging basket and material
Bar contour line, the contour line after the reception microscope group on the CMOS area array sensors by being imaged, and obtaining a width includes being somebody's turn to do
Complete image data including contour line, obtains the outer of surface of material and charging basket top edge after the processing of the processing unit
Outline data, and by the outline data transfer into the controller.
In order to overcome the influence that material particles degree is scattered, the width for the line laser that the transmitting microscope group is produced is material particles
2-3 times of average diameter.
Further, in addition to for adjusting the support of the laser profile sensor height and horizontal level.
A kind of measuring method of height of materials and evenness measuring system, comprises the following steps:
S1:The beam of laser sent by the laser through it is described transmitting microscope group after formed it is a branch of have certain segment angle and
The line laser of one fixed width invests the charging basket, and one is formed on the surface at the top of the charging basket, the side wall of charging basket and material
Bar contour line, the contour line after the reception microscope group on the CMOS area array sensors by being imaged, and obtaining a width includes being somebody's turn to do
Complete image data including contour line, obtains the outer of surface of material and charging basket top edge after the processing of the processing unit
Outline data, and by the outline data transfer into the controller, the controller obtains material table by data processing
Flatness information of the face relative to the height value and material at the top of the charging basket on the contour line section in itself;
S2:The controller controls the motor to drive the rotating mechanism and the laser profile sensor rotation, institute
Line laser that laser profile sensor sends is stated centered on the center line of the charging basket, whole surface of material is scanned,
The surface of material on each angle position is obtained relative to the height value and material at the top of the charging basket in itself in the contour line section
On flatness information;
S3:After the rotating mechanism is rotated up to 360 °, the controller controls the rotating mechanism to stop operating, described
Controller obtains the 3D shape of whole surface of material by three-dimensionalreconstruction, and obtains complete height of materials and flatness letter
Breath.
A kind of method for self-calibrating of height of materials and evenness measuring system, comprises the following steps:
S1:Empty all materials in the charging basket;
S2:The line laser of the laser profile sensor invests empty charging basket, obtains the Internal periphery data of charging basket, and transmits
To the controller;
S3:The controller calculates the measured value of discharge tank bottom outline of straight line and tip height through data processing;
S4:The bottom outline of straight line of charging basket and the actual value of tip height and step S3 measured value are contrasted, institute is calculated
State the correction coefficient of laser profile sensor;
S5:The controller preserves above-mentioned correction coefficient, completes self-calibration process.
Compared with prior art, the technical scheme that the application is provided, the technique effect or advantage having be:Based on line laser
The measurement of spin-scan formula, realize that super large-scale height of materials and flatness are synchronously detected, and with higher measurement accuracy,
Faster measuring speed and more preferable adaptability.
Brief description of the drawings
Fig. 1 (a) is measuring system structural representation one of the invention;
Fig. 1 (b) is measuring system structural representation two of the invention;
Fig. 2 is line laser width design principle schematic of the invention.
Embodiment
The present invention proposes a kind of height of materials and evenness measuring system, measuring method and its method for self-calibrating, based on line
The spin-scan formula measurement of laser, realizes that super large-scale height of materials and flatness are synchronously detected, and with higher measurement
Precision, faster measuring speed and more preferable adaptability.
It is right below in conjunction with Figure of description and specific embodiment in order to be better understood from above-mentioned technical proposal
Above-mentioned technical proposal is described in detail.
Embodiment
Shown in a kind of height of materials and evenness measuring system, such as Fig. 1 (a), Fig. 1 (b), including laser profile sensor 1,
Rotating mechanism 2, motor 3 and controller 4, wherein, the laser profile sensor 1 is arranged at the lower section of the rotating mechanism 2, and
Positioned at the surface of tested material, the shaft axis of the rotating mechanism 2, the measurement line of laser profile sensor 1 and placement thing
The line of 6 center line of charging basket three of material is overlapped, and the rotating mechanism 2 is fixed on support 5, in order to adjust the laser profile sensing
The height and horizontal level of device 1, the rotating mechanism 2 are used to fix the laser profile sensor 1, and drive the laser wheel
Wide sensor 1 is rotated, and the motor 3 is arranged at the top of the rotating mechanism 2, the controller 4 respectively with the motor 3 with
And the laser profile sensor 1 is connected, the motor 3 drives 2 turns of the rotating mechanism under the control of the controller 4
It is dynamic, and the velocity of rotation of the motor 3 is adjustable, the controller 4 reads the measurement result of the laser profile sensor 1,
So as to obtain the height and flatness information of material.
The laser profile sensor 1 includes laser 101, transmitting microscope group 102, receives microscope group 103, CMOS faces battle array sensing
Device 104 and processing unit 105, the beam of laser that the laser 101 is sent is formed after the transmitting microscope group 102 a branch of to be had
Certain segment angle and the line laser of one fixed width invest the charging basket 6, in the top of the charging basket 6, the side wall and thing of charging basket 6
The surface of material forms a contour line, and the contour line is received after microscope group 103 on the CMOS area array sensors 104 by described
Imaging, obtains complete image data of the width including the contour line, material is obtained after the processing of the processing unit 105
Surface and the outline data of the top edge of charging basket 6, and by the outline data transfer into the controller 4.
Wherein, the beam of laser that the laser 101 is sent forms a branch of with certain fan after the transmitting microscope group 102
Shape angle and the line laser of one fixed width, the width of the line laser depend on the granularity of material, are used as a kind of preferred technical side
Case, the width of the line laser is 2-3 times of material particles average diameter.As illustrated in fig. 2, it is assumed that the average diameter of particles of material is
5mm, then when the width for the line laser that transmitting microscope group 102 is produced elects 10mm-15mm as, can effectively overcome material particles degree to dissipate
Projection is rung.
A kind of measuring method of height of materials and evenness measuring system, comprises the following steps:
S1:The beam of laser sent by the laser 101 forms a branch of with certain fan after the transmitting microscope group 102
The line laser of shape angle and one fixed width invests the charging basket 6, in the top of the charging basket 6, the side wall and the table of material of charging basket 6
Face forms a contour line, and the contour line receives the imaging on the CMOS area array sensors 104 after microscope group 103 by described,
Complete image data of the width including the contour line is obtained, surface of material is obtained after the processing of the processing unit 105
And the outline data of the top edge of charging basket 6, and by the outline data transfer into the controller 4, the controller 4 leads to
Cross data processing and obtain height value and material of the surface of material relative to the top of the charging basket 6 in itself on the contour line section
Flatness information;
S2:The controller 4 controls the motor 3 to drive 1 turn of the rotating mechanism 2 and the laser profile sensor
Dynamic, the line laser that the laser profile sensor 1 is sent is entered centered on the center line of the charging basket 6 to whole surface of material
Row scanning, obtains height value and material of the surface of material relative to the top of charging basket 6 on each angle position in itself in the wheel
Flatness information on profile section;
S3:After the rotating mechanism 2 is rotated up to 360 °, the controller 4 controls the rotating mechanism 2 to stop operating,
The controller 4 obtains the 3D shape of whole surface of material by three-dimensionalreconstruction, and obtain complete height of materials with it is smooth
Spend information.
A kind of method for self-calibrating of height of materials and evenness measuring system, comprises the following steps:
S1:Empty all materials in the charging basket 6;
S2:The line laser of the laser profile sensor 1 invests empty charging basket 6, obtains the Internal periphery data of charging basket 6, and
Send the controller 4 to;
S3:The controller 4 calculates the measured value H of the bottom outline of straight line of discharge tank 6 and tip height through data processing;
S4:Contrast the bottom outline of straight line of charging basket 6 and the actual value H of tip height0With step S3 measured value H, calculate
Go out the correction coefficient K=H of the laser profile sensor0/H;
S5:The controller 4 preserves above-mentioned correction coefficient, completes self-calibration process.
In above-described embodiment of the application, by provide a kind of height of materials and evenness measuring system, measuring method and
Its method for self-calibrating, including laser profile sensor, rotating mechanism, motor controller, wherein, the laser profile sensor
The lower section of the rotating mechanism is arranged at, and positioned at the surface of tested material, the shaft axis of the rotating mechanism, laser profile
The measurement line of sensor and the line of charging basket center line three coincidence for placing material, the motor are arranged at the upper of the rotating mechanism
Side, the controller is connected with the motor and the laser profile sensor respectively, and the motor is in the controller
Control is lower to drive the rotating mechanism to rotate, and the controller reads the measurement result of the laser profile sensor, so that
To the height and flatness information of material, super large-scale material is realized in spin-scan formula measurement of the present invention based on line laser
Height and flatness are synchronously detected, with higher measurement accuracy, faster measuring speed and more preferable adaptability.
It should be pointed out that described above is not limitation of the present invention, the present invention is also not limited to the example above,
What those skilled in the art were made in the essential scope of the present invention changes, is modified, adds or replaces, and also should
Belong to protection scope of the present invention.
Claims (6)
1. a kind of height of materials and evenness measuring system, it is characterised in that including laser profile sensor (1), rotating mechanism
(2), motor (3) and controller (4), wherein, the laser profile sensor (1) is arranged at the lower section of the rotating mechanism (2),
And positioned at the surface of tested material, the shaft axis of the rotating mechanism (2), the measurement line of laser profile sensor (1) and
The line of charging basket (6) center line three for placing material is overlapped, and the motor (3) is arranged at the top of the rotating mechanism (2), the control
Device (4) processed is connected with the motor (3) and the laser profile sensor (1) respectively, and the motor (3) is in the controller
(4) rotating mechanism (2) is driven to rotate under control, the controller (4) reads the survey of the laser profile sensor (1)
Result is measured, so as to obtain the height and flatness information of material.
2. height of materials according to claim 1 and evenness measuring system, it is characterised in that the laser profile sensing
Device (1) includes laser (101), transmitting microscope group (102), receives microscope group (103), CMOS area array sensors (104) and processing list
First (105), the beam of laser that the laser (101) sends forms a branch of with certain fan after the transmitting microscope group (102)
The line laser of shape angle and one fixed width invests the charging basket (6), the side wall and thing at top, charging basket (6) in the charging basket (6)
The surface of material forms a contour line, and the contour line is received after microscope group (103) in the CMOS area array sensors by described
(104) it is imaged on, obtains complete image data of the width including the contour line, the processing through the processing unit (105)
Obtain the outline data of surface of material and charging basket (6) top edge afterwards, and by the outline data transfer to the controller
(4) in.
3. height of materials according to claim 2 and evenness measuring system, it is characterised in that the transmitting microscope group
(102) width of the line laser produced is 2-3 times of material particles average diameter.
4. height of materials according to claim 1 and evenness measuring system, it is characterised in that also including for adjusting
State the support (5) of laser profile sensor (1) height and horizontal level.
5. the measuring method of height of materials according to claim 2 and evenness measuring system, it is characterised in that including such as
Lower step:
S1:The beam of laser sent by the laser (101) forms a branch of with certain fan after the transmitting microscope group (102)
The line laser of shape angle and one fixed width invests the charging basket (6), the side wall and thing at top, charging basket (6) in the charging basket (6)
The surface of material forms a contour line, and the contour line is received after microscope group (103) in the CMOS area array sensors by described
(104) it is imaged on, obtains complete image data of the width including the contour line, the processing through the processing unit (105)
Obtain the outline data of surface of material and charging basket (6) top edge afterwards, and by the outline data transfer to the controller
(4) in, the controller (4) obtains surface of material relative to the height value and thing at the top of the charging basket (6) by data processing
The flatness information of material on the contour line section in itself;
S2:The controller (4) controls the motor (3) to drive the rotating mechanism (2) and the laser profile sensor (1)
Rotate, the line laser that the laser profile sensor (1) sends is centered on the center line of the charging basket (6), to whole material
Surface is scanned, and obtains the surface of material on each angle position relative to the height value and material sheet at the top of the charging basket (6)
Flatness information on the contour line section;
S3:After the rotating mechanism (2) is rotated up to 360 °, the controller (4) controls the rotating mechanism (2) to stop turning
Dynamic, the controller (4) obtains the 3D shape of whole surface of material by three-dimensionalreconstruction, and obtain complete height of materials with
Flatness information.
6. the method for self-calibrating of height of materials according to claim 1 and evenness measuring system, it is characterised in that including
Following steps:
S1:Empty all materials in the charging basket (6);
S2:The line laser of the laser profile sensor (1) invests empty charging basket (6), obtains the Internal periphery data of charging basket (6),
And send the controller (4) to;
S3:The controller (4) calculates the measured value of discharge tank (6) bottom outline of straight line and tip height through data processing;
S4:The bottom outline of straight line of charging basket (6) and the actual value of tip height and step S3 measured value are contrasted, is calculated described
The correction coefficient of laser profile sensor;
S5:The controller (4) preserves above-mentioned correction coefficient, completes self-calibration process.
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CN108759714A (en) * | 2018-05-22 | 2018-11-06 | 华中科技大学 | A kind of multi-thread laser profile sensor coordinate system fusion and rotating axis calibration method |
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CN110634145A (en) * | 2018-06-22 | 2019-12-31 | 青岛日日顺物流有限公司 | Warehouse checking method based on image processing |
CN109540059A (en) * | 2018-11-27 | 2019-03-29 | 惠州绿保科技有限公司 | A kind of contourgraph rotary scanning mechanism |
CN109808023A (en) * | 2019-03-27 | 2019-05-28 | 南京林业大学 | Air door automatic regulating device and air door control system for Solution on Air Forming Equipment |
CN109870130A (en) * | 2019-04-09 | 2019-06-11 | 中国科学技术大学 | A kind of measurement method and device of supersonic array detection object flatness |
CN110961779A (en) * | 2019-12-24 | 2020-04-07 | 安徽省春谷3D打印智能装备产业技术研究院有限公司 | Cantilever type laser light path calibrating device |
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