CN107096731B - The pressurizing device of sorting machine for testing electronic parts - Google Patents
The pressurizing device of sorting machine for testing electronic parts Download PDFInfo
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- CN107096731B CN107096731B CN201710084862.0A CN201710084862A CN107096731B CN 107096731 B CN107096731 B CN 107096731B CN 201710084862 A CN201710084862 A CN 201710084862A CN 107096731 B CN107096731 B CN 107096731B
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- Prior art keywords
- pressure plate
- test
- electronic component
- guide rail
- driving source
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C2301/00—Sorting according to destination
- B07C2301/0008—Electronic Devices, e.g. keyboard, displays
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
A kind of pressurizing device of the sorting machine for testing electronic parts.Pressurizing device includes: pressure plate, has the impeller for pressurizeing to the electronic component for being loaded into test pallet；First driving source, pressure plate is set to advance towards test machine, the electronic component for being recorded in test pallet to be pressurizeed towards test pusher side by pressure plate, to make electronic component be electrically connected to test machine, or make pressure plate retreat and release by pressure plate electronic component pressurization, to keep electronic component electrically separated from test machine；Guide rail is held, for holding the test pallet for being located at test position；Second driving source makes gripping guide rail from normal place towards the retrogressing of pressure plate side, so that the electronic component held in the test pallet that guide rail is held touches impeller, or makes the contact between contact electronic component and impeller in turn before gripping guide rail.According to the present invention, without replacement component in the case where the format change of instant electronic component, therefore has the effect of the operating rate for being able to ascend equipment.
Description
Technical field
The present invention relates to a kind of sorting machines of test for supporting to carry out for electronic component produced.The present invention especially relates to
And a kind of pressurizing device for by electronic component to the pressurization of test pusher side or support.
Background technique
Sorting machine (hreinafter referred to as " sorting machine ") for testing electronic parts is used for by scheduled manufacturing process
And the electronic component produced is tested.
Electronic component is electrically connected to test machine by sorting machine, so that electronic component can be tested test-run a machine and test, and if
The test for completing electronic component, then classify electronic component according to test result.Here, electronic component can be semiconductor element
The component of the multiplicity such as part, SSD and module RAM.Therefore, sorting machine should with the type of the electronic component that will be tested accordingly by
It is fabricated to the form of multiplicity.
In general, sorting machine is divided into following type: electronic component is directly electrically connected to test machine；Test panel will be loaded into
In the state of electronic component be electrically connected to test machine.The present invention is surveyed in the state that electronic component is loaded into test panel
The sorting machine of the latter of examination is related.
As shown in Figure 1, test pallet TT is along returning via " loaded " position LP, test position TP, unloading position UP and again
To " loaded " position LP closed circulating path C and the inside of sorting machine HD recycle.
In " loaded " position LP, electronic component is loaded onto test panel TT；In test position TP, it is loaded into the electricity of test panel TT
Subassembly is electrically connected to test machine；In unloading position UP, the electronic component for completing test is unloaded from test panel TT.
In addition, the case where test panel TT is kept horizontality in horizontal sorting machine and recycled by Fig. 1 as an example and
It shows, still, to such as being disclosed in Korean Patent Publication No. 10-2013-0047204 (hereinafter, being referred to as " prior art ")
Rectilinear sorting machine the case where for, test panel need in test position be in vertical state.Either horizontal point
Machine or rectilinear sorting machine are selected, a kind of gripping guide rail (Rail) GR is requireda、GRb(it is named as that " pallet is led in the prior art
Rail "), moving for test panel TT is guided when for being moved to test position TP in the test panel TT moved along circulating path C, together
When can hold test panel TT positioned at test position TP.
If illustrated in the prior art, guide rail GR is helda、GRbTest slot and pressure plate positioned at test machine is (existing
It is divided into " arranging plate " and " impeller (pusher) " in technology and is illustrated, " match plate is also named as in this field
(match plate) ") impeller between.Moreover, holding guide rail GR such as Fig. 2 of an example as rectilinear sorting machinea、
GRbThe metope W of sorting machine can be fixed on retreating.In structure as shown in Figure 2, if pressurizing device 100 is operated and is led
It causes pressure plate 110 mobile to the side test machine TESTER, then as shown in figure 3, impeller P touches electronic component ED, pushes simultaneously
The substrate PB of part P touches the inserts I of test panel TT, and supports the supporting guide SR of pressure plate 110a、SRbAlso it touches and holds
Hold guide rail GRa、GRb.So as to prevent the plus-pressure of impeller P to be excessively applied to electronic component ED.
In the state of Fig. 3, if pressure plate 110 is advanced further to the side test machine TESTER, gripping is flexibly supported
Guide rail GRa、GRbSpring S compressed, and hold guide rail GRa、GRbAlso mobile to the side test machine TESTER therewith, thus such as Fig. 4
Shown, the electronic component ED for being loaded into test machine TT is electrically connected to the test socket of test machine TESTER (Test Socket) TS.
Certainly, if test and the retrogressing of pressure plate 110 are completed, by the elastic reactance of spring S, supporting guide GRa、GRbAlso will
It retreats and returns to normal place.
As mentioned above, the prior art has following institutional composition: the excessive pressurization of impeller P in order to prevent
And by the substrate P of impeller PBInserts I is touched, while also by supporting guide SRa、SRbContact is holding guide rail GRa、GRb.So
And if the thickness (thickness in the direction moved along pressure plate) of electronic component ED thickens, even if impeller P touches electricity
Subassembly ED also cannot achieve the contact between the substrate PB of impeller P and inserts I, and cannot achieve supporting guide
SRa、SRbWith gripping guide rail GRa、GRbBetween contact.In the case, there is the excessive plus-pressures due to impeller P
The problem for being applied to electronic component ED and causing electronic component ED impaired.It is above-mentioned due to there is a problem that, if changing institute
The thickness for needing electronic component to be tested, then must must replace pressure plate 110 and supporting guide SRa、SRbDeng.It therefore, can be adjoint
Cumbersome and operating rate reduction brought by the replacement of weight pressure plate 110.
Summary of the invention
Nothing that the purpose of the present invention is to provide one kind the thickness of required electronic component to be tested or length change
It need to carry out the technology of the replacement of pressure plate.
The pressurizing device of the sorting machine for testing electronic parts for achieving the above object includes: pressure plate, is had
Impeller for pressurizeing to the electronic component for being loaded into test pallet；First driving source makes the pressure plate towards survey
Test-run a machine advances, to add to the electronic component for being loaded into the test pallet towards test pusher side by the pressure plate
Pressure so that electronic component be made to be electrically connected to test machine, or retreats pressure plate and releases by the pressure plate for electricity
The pressurization of subassembly, to keep electronic component electrically separated from test machine, wherein the advance indicates pressure plate towards test pusher side
Mobile, described retreat indicates pressure plate towards the direction movement separate from test machine；Guide rail is held, is located at test position for holding
The test pallet set；And second driving source, retreat the gripping guide rail from normal place towards the pressure plate side,
So as to touch the impeller by the electronic component in the test pallet of the gripping guide rail gripping, or lead the gripping
Before rail and then release the contact between electronic component and the impeller.
Second driving source by can with the pressure plate move forward and backward move forward or back in linkage in a manner of knot
Together in the pressure plate side.
Further include: setting frame is fixed on the pressure plate, and move forward and backward together with the pressure plate, Er Qiesuo
It states the second driving source and is incorporated into the setting frame.
If second driving source retreats the gripping guide rail to the pressure plate side, first driving source makes
The pressure plate advances towards test machine, so that the electrical connection between electronic component and test machine is realized, if described first drives
Dynamic source makes the pressure plate retreat and release the electrical connection between electronic component and test machine, then second driving source makes described
The spacing between test machine and pressure plate is set to become larger in turn before holding guide rail.
When the pressure plate by the operation of first driving source and to test machine advance when, the grippings guide rail with
In the state that spacing between the pressure plate is kept, the gripping guide rail also advances together.
The distance that the gripping guide rail is retreated by second driving source is by the mobile direction of the gripping guide rail
Electronic component thickness or length determined.
The distance that the gripping guide rail advances by first driving source is by the mobile direction of the gripping guide rail
Electronic component thickness or length determined.
According to present invention as described above, can use following method: it is mobile towards pressure plate side in advance to hold guide rail,
To which electronic component and impeller contact, pressure plate and gripping guide rail are protected in the spacing held between guide rail and pressure plate later
Advance in the state of holding towards test pusher side, so that electronic component is electrically connected to test machine.Therefore, even if the thickness of electronic component
Or length (thickness or length that indicate the direction to move forward and backward along pressure plate) changes, as long as setting gripping guide rail
Backway and the forward travel distance of pressure plate can be improved the behaviour of equipment to have there is no need to replace pressure plate
Make the effect of rate.
Detailed description of the invention
Fig. 1 is the schematical plan view for illustrating path that test panel recycles in horizontal sorting machine.
Fig. 2 be for illustrate in existing sorting machine setting hold the structure of guide rail with reference to figure.
Fig. 3 and Fig. 4 be for illustrate the gripping guide rail in the sorting machine of Fig. 2 move forward and backward with reference to figure.
Fig. 5 is for adding with the sorting machine for testing electronic parts constituted substantially required for the realization present invention
The schematic diagram of pressure device.
Fig. 6 and Fig. 7 is the mode of operation figure by each stage of the operation for the pressurizing device of explanatory diagram 5.
Fig. 8 be in order to realize the pressurization of different types of electronic component and the pressurizing device of application drawing 5, fill about pressurization
The schematic diagram set.
Fig. 9 be about according to using two pressure plates concrete application example pressurizing device perspective view.
Symbol description
500: the pressurizing device of the sorting machine for testing electronic parts
510: pressure plate
P: impeller
520: the first driving sources
530: holding guide rail
540: the second driving sources
560: setting frame
Specific embodiment
Hereinafter, being illustrated referring to attached drawing and to preferred embodiment in accordance with the present invention as described above, here, for reality
The terseness now illustrated reduces or compresses repeat description to the greatest extent.
<for the explanation constituted substantially>
Fig. 5 is about adding with the sorting machine for testing electronic parts constituted substantially required for the realization present invention
The schematic diagram of pressure device 500 (hreinafter referred to as " pressurizing device ").
Pressurizing device 500 includes: pressure plate 510, the first driving source 520, holds guide rail 530a and 530b, the second driving source
540, mobile framework 550, setting frame 560.
Pressure plate 510 has for adding to the electronic component ED (for example, semiconductor element) for being loaded into test panel TT
The impeller P of pressure.Certainly, as KR published patent 10-2015-0014357 etc., impeller P are equipped to following form: with
Pressure plate 510 is set to be elastically supported along the mode of the direction advance and retreat preset space length to move forward and backward.
First driving source 520 makes pressure plate 510 march forward towards the side test machine TESTER, or makes it to after opposite direction
It moves back.Accordingly, if pressure plate 510 marches forward to the side test machine TESTER, the impeller P of pressure plate 510 is by electronic component
ED pressurizes towards the side test machine TESTER, so that electronic component ED is electrically connected to the test socket (Test of test machine TESTER
Socket) TS, and if pressure plate 510 retreats, it will be released from by the pressurization of the electronic component ED of pressure plate 510,
To which electronic component ED is electrically separated from test machine TESTER.Here, advancing indicates that pressure plate 510 is moved towards test machine TESTER
Dynamic, retreating indicates pressure plate 510 towards the direction movement separate from test machine TESTER.Therefore, direction of advance and direction of retreat
It can be used upper according to the structure (horizontal or rectilinear) or direction definition for the sorting machine that will use pressurizing device 500
Lower direction, front-rear direction, any one in left and right directions.First driving source 520 as described above is preferably equipped with as servo
Motor, the distance of pressure plate 510 to move forward and backward can be adjusted.
It holds guide rail 530a, 530b and is equipped to a pair to correspond to each other, and be held on circulating path and be moved to test position
The both ends of the test panel TT set.
Second driving source 540 makes to hold guide rail 530a, 530b from normal place P1 to the retrogressing of 510 side of pressure plate, so that by
The electronic component ED for holding the test pallet TT that guide rail 530a, 530b are held touches impeller P, or makes to hold guide rail
530a, 530b advance, to release the contact between electronic component ED and impeller P.This second driving source 540 is also preferably
It is provided as servo motor, the distance to move forward and backward can be adjusted.Moreover, the second driving source 540 is incorporated into pressure plate 510
Side, with can with pressure plate 510 move forward and backward linkage and move forward or back together.
Mobile framework 550 is moved forward or back according to the operation of the second driving source 540, and is fixed by conjunction with platform JR
It is incorporated into and holds guide rail 530a, 530b.This mobile framework 550 makes the drive of the second driving source 540 together with multiple combination platform JR
Power is transferred uniformly to gripping guide rail 530a, 530b.
Setting frame 560 is equipped in order to which the second driving source 540 is arranged.That is, the second driving source 540 is fixedly installed on setting
Frame 560.Moreover, setting frame 560 is fixed on pressure plate 510 by conjunction with stick JB, therefore advance together with pressure plate 510
Or it retreats.Therefore, the second driving source 540 can be incorporated into 510 side of pressure plate by the way that frame 560 is arranged, thus and pressure plate
510 link and move forward or back.
Continue to be illustrated the operation of pressurizing device 500 as described above.
As shown in figure 5, if the test pallet TT for loading tested electronic component ED in need be held guide rail 530a,
530b is held, then the second driving source 540 is operated and makes to be located at normal place P1Gripping guide rail 530a, 530b towards pressurization
510 side of plate retreats.Accordingly, it retreats as shown in fig. 6, holding guide rail 530a, 530b to contact position P2, thus test pallet TT
Electronic component ED will be contacted by impeller P and be supported.
In the state of Fig. 6, the first driving source 520 operated and make pressure plate 510 towards test machine TESTER and it is preceding
Into.Therefore, setting frame 560, the second driving source 540, mobile framework 550 and the gripping guide rail of 510 side of pressure plate are incorporated into
530a, 530b link and advance together.Moreover it is evident that be held guide rail 530a, 530b gripping test pallet TT also will before
Into so that as shown in fig. 7, electronic component ED is electrically connected to the test socket TS of test machine TESTER.Obviously, guide rail is held
Its space D between pressure plate 510 can be kept state and the advance of Fig. 6 by 530a, 530b.
In the state of as shown in Figure 7, if completing the test for being directed to electronic component ED, the first driving source 520 makes to add
Pressing plate 510 retreats, so that the electrical connection between electronic component ED and test machine TESTER is released, so that the state of Fig. 6 is returned to,
Then, the second driving source 540 makes to hold guide rail 530a, 530b advance, thus between making between test pallet TT and pressure plate 510
Away from becoming larger.Accordingly, gripping guide rail 530a, 530b will be back to can suitably guide test pallet TT's on circulating path
Mobile normal place P1。
In addition, the thickness (indicating the thickness on the direction moved along pressure plate) of required electronic component ED to be tested becomes
Thickness then holds the forward travel distance of guide rail 530a, 530b and the forward travel distance and backway of backway and pressure plate 510
At a distance from accordingly should being adjusted to shorter with the length of electronic component to thicken.Therefore, manager can use (not shown) point
It selects the input unit of machine and inputs the thickness of electronic component ED, so as to preset the advance for holding guide rail 530a, 530b
With the distance that moves forward and backward of backway and pressure plate 510.Certainly, it according to embodiment, is also implemented as follows:
The load of second driving source 540 of the sensing based on the retrogressing for holding guide rail 530a, 530b when initial operation, to make not shown
Control device can set automatically hold guide rail 530a, 530b move forward and backward distance and pressure plate 510 advance and
Backway.Accordingly, be applied to by impeller P electronic component ED plus-pressure will with the thickness of electronic component ED without
It keeps constant with closing.
In pressurizing device 500 as described above, the setting position of the first driving source 520 or the second driving source 510, movement
Frame 550 or setting frame 560 whether outfit or structure etc. can accordingly realize multiplicity with the sorting machine of the form of multiplicity
Deformation.In addition, a kind of power transmission structure is constituted in the example of Fig. 5, drive pulley P can be utilizeda、Pb、Pc、PdAnd screw thread
Combination and the driving force from the first driving source 520 or the second driving source 540 is passed into setting frame 560 or movable frame
Frame 550, however the transferring structure of driving force can be deformed into the form of multiplicity according to embodiment.
<reference example>
Fig. 8 shows the reference example about a kind of pressurizing device 500A, and the pressurizing device 500A can be used for will be along upper
Lower direction and be loaded into the electronic component ED'(of test pallet TT in long way for example, SSD or module RAM) be electrically connected to lower section
Test machine TESTER.
The pressurizing device 500A of Fig. 8 similarly includes pressure plate 510A, the first driving source 520A, holds guide rail 530Aa、
530Ab, the second driving source 540A, mobile framework 550A and setting frame 560A, and identical as the pressurizing device of Fig. 5 500 grasp
Make.
<specific application examples>
Fig. 9 shows the practical application in being used to support the sorting machine for the test of the electronic components such as SSD or module RAM
Pressurizing device 500B.
In Fig. 9, in order to which disposable test is recorded in the electronic component of two test pallets TT1, TT2, there are two add for outfit
Pressing plate 510B1、510B2.Moreover, with the structure (making the structure to move forward and backward together with two pressure plates) and it is space-based really
Accordingly, following element can be deformed and is equipped with design condition of guarantor etc.: pressure plate 510B1、510B2；First driving source 520B；It holds
Hold guide rail 530Ba1、530Bb1、530Ba2、530Bb2；Second driving source 540B；Mobile framework 550B1、550B2；And setting frame
Frame 560B.
For to the pressurizing device 500B of Fig. 9 the case where, in addition to two pressure plate 510B1、510B2It links and goes up and down together
The case where it is different other than, operate identically as the pressurizing device 500A of the pressurizing device 500 of Fig. 5 or Fig. 8.
Unaccounted label G is to hold guide rail 530Ba for guiding1、530Bb1、530Ba2、530Bb2And mobile framework
550B1、550B2The guide device appropriate to move forward and backward.
It is provided as referring to, in Fig. 9, in order to be compared with each other, drawing reference numeral 530Ba1And 530Bb1Gripping guide rail show
It is out towards drawing reference numeral 510B1The state that retreats of pressure plate side, and drawing reference numeral 530Ba2And 530Bb2Gripping guide rail show
Out for positioned at the state of normal place.Certainly, in the actual operation process, it is embodied as all gripping guide rail 530Ba1、
530Bb1、530Ba2、530Bb2It moves forward and backward together, however according to embodiment, as shown in figure 9, can also only make two sides
Hold guide rail 530Ba1、530Bb1/530Ba2、530Bb2It independently progresses and retreats.
As described above, having been carried out according to the embodiment being described with reference to for specific description of the invention, so
And only the preferred embodiment of the present invention is illustrated as an example for above-described embodiment, therefore, the present invention should not be managed
To be confined to the above embodiments, interest field of the invention should be understood the range of claims and is equal with this solution
Concept.
Claims (7)
1. a kind of pressurizing device of the sorting machine for testing electronic parts, comprising:
Pressure plate has the impeller for pressurizeing to the electronic component for being loaded into test pallet；
First driving source makes the pressure plate advance towards test machine, by the pressure plate and to being loaded into the test
The electronic component of pallet pressurizes towards test pusher side, so that electronic component be made to be electrically connected to test machine, or makes pressure plate
It retreats and releases the pressurization for electronic component by the pressure plate, thus keep electronic component electrically separated from test machine,
In, the advance indicates that pressure plate is mobile towards test machine side, and the retrogressing indicates pressure plate towards the side separate from test machine
To movement；
Guide rail is held, for holding the test pallet for being located at test position；And
Second driving source retreats the gripping guide rail from normal place towards the pressure plate side, so as to be led by the gripping
The electronic component in test pallet that rail is held touches the impeller, or releases electronics in turn before making the gripping guide rail
Contact between component and the impeller.
2. the pressurizing device for the sorting machine of testing electronic parts as described in claim 1, wherein
Second driving source by can with the pressure plate move forward and backward move forward or back in linkage in a manner of be incorporated into
The pressure plate side.
3. the pressurizing device for the sorting machine of testing electronic parts as claimed in claim 2, further includes:
Frame is set, is fixed on the pressure plate, and move forward and backward together with the pressure plate,
Wherein, second driving source is incorporated into the setting frame.
4. the pressurizing device for the sorting machine of testing electronic parts as claimed in claim 2, wherein
If second driving source retreats the gripping guide rail to the pressure plate side, first driving source makes described
Pressure plate advances towards test machine, thus realize the electrical connection between electronic component and test machine,
If first driving source makes the pressure plate retreat and release the electrical connection between electronic component and test machine, institute
Stating the second driving source makes before the gripping guide rail and then the spacing between test machine and pressure plate is made to become larger.
5. the pressurizing device for the sorting machine of testing electronic parts as claimed in claim 4, wherein
When the pressure plate advances by the operation of first driving source to test machine, in the gripping guide rail and described
In the state that spacing between pressure plate is kept, the gripping guide rail also advances together.
6. the pressurizing device for the sorting machine of testing electronic parts as described in claim 1, wherein
The distance that the gripping guide rail is retreated by second driving source is by the electricity on the mobile direction of the gripping guide rail
The thickness or length of subassembly are determined.
7. the pressurizing device for the sorting machine of testing electronic parts as described in claim 1, wherein
The distance that the gripping guide rail advances by first driving source is by the electricity on the mobile direction of the gripping guide rail
The thickness or length of subassembly are determined.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020160019708A KR102473315B1 (en) | 2016-02-19 | 2016-02-19 | Pushing apparatus of handler for testing electronic devices |
| KR10-2016-0019708 | 2016-02-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107096731A CN107096731A (en) | 2017-08-29 |
| CN107096731B true CN107096731B (en) | 2019-07-19 |
Family
ID=59674797
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710084862.0A Active CN107096731B (en) | 2016-02-19 | 2017-02-16 | The pressurizing device of sorting machine for testing electronic parts |
Country Status (3)
| Country | Link |
|---|---|
| KR (1) | KR102473315B1 (en) |
| CN (1) | CN107096731B (en) |
| TW (1) | TWI624675B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102432981B1 (en) * | 2017-11-03 | 2022-08-18 | (주)테크윙 | Picking apparatus for handler supporting test of electronic components |
| KR20200071357A (en) * | 2018-12-11 | 2020-06-19 | (주)테크윙 | Handler for testing electronic components |
| KR20230060187A (en) * | 2021-10-27 | 2023-05-04 | (주)테크윙 | Holder for handler of electronic component |
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| CN101512357A (en) * | 2006-09-15 | 2009-08-19 | 株式会社爱德万测试 | Electronic element test device |
| CN201522544U (en) * | 2009-06-09 | 2010-07-07 | 常熟阿特斯阳光电力科技有限公司 | Detecting device used for diodes inside terminal box |
| CN105259413A (en) * | 2015-11-02 | 2016-01-20 | 天津卡锐智科技发展有限公司 | Automatic tester for mini resistor of mobile phone |
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| EP1752778A3 (en) * | 2005-08-09 | 2008-10-29 | Mirae Corporation | IC Sorter |
| US8496113B2 (en) * | 2007-04-13 | 2013-07-30 | Techwing Co., Ltd. | Insert for carrier board of test handler |
| KR100993196B1 (en) * | 2007-10-31 | 2010-11-10 | (주)테크윙 | Carrier board circulation method of test handler and test handler |
| KR101104413B1 (en) * | 2009-09-25 | 2012-01-16 | 세크론 주식회사 | Connecting apparatus for testing a semiconductor device and test handler including the same |
| JP5152379B2 (en) * | 2011-09-14 | 2013-02-27 | セイコーエプソン株式会社 | Positioning device maintenance method and IC handler positioning device |
| KR101559416B1 (en) * | 2011-10-31 | 2015-10-13 | (주)테크윙 | Pushing apparatus for test handler and test handler |
| KR102010275B1 (en) * | 2013-04-03 | 2019-08-13 | (주)테크윙 | Handler for testing semiconductor |
| KR102102830B1 (en) * | 2014-04-10 | 2020-04-23 | (주)테크윙 | Test handler, pushing device and test tray for testhandler, interface board for tester |
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2016
- 2016-02-19 KR KR1020160019708A patent/KR102473315B1/en active IP Right Grant
-
2017
- 2017-02-09 TW TW106104218A patent/TWI624675B/en active
- 2017-02-16 CN CN201710084862.0A patent/CN107096731B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101512357A (en) * | 2006-09-15 | 2009-08-19 | 株式会社爱德万测试 | Electronic element test device |
| CN201522544U (en) * | 2009-06-09 | 2010-07-07 | 常熟阿特斯阳光电力科技有限公司 | Detecting device used for diodes inside terminal box |
| CN105259413A (en) * | 2015-11-02 | 2016-01-20 | 天津卡锐智科技发展有限公司 | Automatic tester for mini resistor of mobile phone |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20170097960A (en) | 2017-08-29 |
| KR102473315B1 (en) | 2022-12-02 |
| TW201732308A (en) | 2017-09-16 |
| TWI624675B (en) | 2018-05-21 |
| CN107096731A (en) | 2017-08-29 |
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