CN106991026A - It is a kind of to pass through the method that network carries out server memory Rank margin test in batches - Google Patents
It is a kind of to pass through the method that network carries out server memory Rank margin test in batches Download PDFInfo
- Publication number
- CN106991026A CN106991026A CN201710294823.3A CN201710294823A CN106991026A CN 106991026 A CN106991026 A CN 106991026A CN 201710294823 A CN201710294823 A CN 201710294823A CN 106991026 A CN106991026 A CN 106991026A
- Authority
- CN
- China
- Prior art keywords
- test
- rmt
- result
- pass
- rank margin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Present invention offer is a kind of can to pass through the method that network carries out server memory Rank margin test in batches, it is related to server component hardware detection field, test in terms of internally depositing into row rank margin present invention is mainly used for test phase or production phase batch, result is printed to simultaneously and preserved on the hard disk of the machine, and be compared automatically with SPEC, output test passes through or the result of failure can be while realize that multiple servers carry out rank margin test, raising internal memory and server compatibility.
Description
Technical field
It can be serviced in batches by network the present invention relates to server component hardware detection field, more particularly to one kind
Device internal memory Rank margin test method.
Background technology
Internal memory is one of important part in computer, and it is the bridge linked up with CPU.All programs in computer
Operation carried out all in internal memory, therefore influence of the performance to computer of internal memory is very big.Internal memory (Memory) also by
Referred to as built-in storage, it is for temporarily depositing the operational data in CPU, and to exchange with the external memory storage such as hard disk that it, which is acted on,
Data.As long as computer is in operation, CPU will carry out computing needing the data of computing to be transferred in internal memory, when computing is completed
CPU again sends out result afterwards, and the operation of internal memory also determines the stable operation of computer.Internal memory is by memory chip, electricity
The part such as road plate, golden finger composition.
Internal memory is the key components of server system, and internal memory with the compatibility of mainboard is directly affecting server just
Often work, and each semiconductor producer pursues that processing procedure is advanced and product particularity increase cost of competition, causes each family in the presence of setting
There are some differences in terms of meter, so as to have risk in terms of the compatibility of internal memory and mainboard.And common Rank margin
Test is limited to test complexity, the test that dependence of Serial Port Line etc. can only be one by one, extremely inefficient, coverage not enough,
Some risk hidden danger are caused to fail discovery.
The content of the invention
In order to solve the above technical problems, the present invention, which proposes one kind, can pass through network progress server memory Rank in batches
Margin test method.It can realize that multiple servers carry out rank margin test simultaneously, improve internal memory and server
Compatibility
The technical scheme is that
It is a kind of that by network batch multiple servers can internally deposit into row rank margin test method of testing, can
Test in terms of internally depositing into row rank margin for test phase or production phase batch, while result is printed to
Preserved, and be compared automatically with SPEC on the hard disk of the machine, the result that output test passes through or failed.
Concretely comprise the following steps:
1), build several servers, (SuSE) Linux OS is installed by network PXE, and hard disk is additionally divided to a 10M point
Area, the storage for RMT result;The setting option for the RMT for opening BIOS is set simultaneously by scelnx instruments under Linux system
Open SOL;
./SCELNX_64 /i /ms MEM014 /qv 0x01
./SCELNX_64 /i /ms TER000 /qv 0x01
2), under system refresh with RMT functions BIOS;
3), refresh terminate after, restart machine.Machine is tested automatically into RMT, completes to test and print to result after a few minutes
On the subregion of local hard drive.
The reading of RMT test results is carried out by remote server, is verified with Intel RMT test comparison instruments,
Pass through no more than SPEC;Test result is achieved and reported.
The beneficial effects of the invention are as follows
It can realize that multiple servers carry out rank margin test simultaneously, and be compared with instrument with SPEC, intuitively be shown
Test result, is used in product development and producing line production process, improves the compatibility of internal memory and server.
Embodiment
More detailed illustrate is carried out to present disclosure below:
The method of testing that multiple servers internally deposit into row rank margin test of the present invention, is mainly in following
Hold:
1st, multiple servers are built, (SuSE) Linux OS are installed by network PXE, and additionally divide a 10M's or so by hard disk
Subregion, the storage for RMT result.The setting option for the RMT for opening BIOS is set under Linux system by scelnx instruments
And open SOL;
./SCELNX_64 /i /ms MEM014 /qv 0x01
./SCELNX_64 /i /ms TER000 /qv 0x01
2nd, the BIOS with RMT functions is refreshed under system.
3rd, refresh after terminating, restart machine.Machine is tested automatically into RMT, completes to test and beat result after a few minutes
Print on the subregion of local hard drive.The reading of RMT test results is carried out by remote server, with Intel RMT test comparisons
Instrument is verified, is passed through no more than SPEC.Test result is very clear, achieves and reports.
Claims (3)
1. a kind of can pass through the method that network carries out server memory Rank margin test in batches, it is characterised in that be used for
Test phase or production phase batch internally deposit into the test in terms of row rank margin, while result is printed to the machine
Hard disk on preserved, and be compared automatically with SPEC, output test passes through or failure result.
2. according to the method described in claim 1, it is characterised in that mainly include the following steps that:
1), build several servers, (SuSE) Linux OS is installed by network PXE, and hard disk is additionally divided to a 10M point
Area, the storage for RMT result;The setting option for the RMT for opening BIOS is set simultaneously by scelnx instruments under Linux system
Open SOL;
./SCELNX_64 /i /ms MEM014 /qv 0x01
./SCELNX_64 /i /ms TER000 /qv 0x01
2), under system refresh with RMT functions BIOS;
3), refresh terminate after, restart machine;Machine is tested automatically into RMT, completes to test and print to result after a few minutes
On the subregion of local hard drive.
3. according to the method described in claim 1, it is characterised in that
The reading of RMT test results is carried out by remote server, is verified, not surpassed with Intel RMT test comparison instruments
SPEC is crossed to pass through;Test result is achieved and reported.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710294823.3A CN106991026A (en) | 2017-04-28 | 2017-04-28 | It is a kind of to pass through the method that network carries out server memory Rank margin test in batches |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710294823.3A CN106991026A (en) | 2017-04-28 | 2017-04-28 | It is a kind of to pass through the method that network carries out server memory Rank margin test in batches |
Publications (1)
Publication Number | Publication Date |
---|---|
CN106991026A true CN106991026A (en) | 2017-07-28 |
Family
ID=59417366
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710294823.3A Pending CN106991026A (en) | 2017-04-28 | 2017-04-28 | It is a kind of to pass through the method that network carries out server memory Rank margin test in batches |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106991026A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108845906A (en) * | 2018-07-19 | 2018-11-20 | 郑州云海信息技术有限公司 | A kind of method and device promoting SPEC cpu test result |
CN109086180A (en) * | 2018-08-24 | 2018-12-25 | 郑州云海信息技术有限公司 | A kind of memory inspection testing method |
TWI679530B (en) * | 2018-12-18 | 2019-12-11 | 英業達股份有限公司 | Batch test system and method thereof |
CN111324502A (en) * | 2018-12-13 | 2020-06-23 | 英业达科技有限公司 | Batch test system and method thereof |
WO2023245779A1 (en) * | 2022-06-24 | 2023-12-28 | 长鑫存储技术有限公司 | Memory judgment method and apparatus, storage medium, and electronic device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103970661A (en) * | 2014-05-19 | 2014-08-06 | 浪潮电子信息产业股份有限公司 | Method for batched server memory fault detection through IPMI tool |
CN104615518A (en) * | 2015-03-04 | 2015-05-13 | 浪潮集团有限公司 | Memory rank margin test method combined with temperature and voltage variables |
CN106227616A (en) * | 2016-08-10 | 2016-12-14 | 浪潮电子信息产业股份有限公司 | A kind of batch realizes the method that RMT tests automatically |
US20170109263A1 (en) * | 2015-10-15 | 2017-04-20 | Bank Of America Corporation | System test compliance tool |
-
2017
- 2017-04-28 CN CN201710294823.3A patent/CN106991026A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103970661A (en) * | 2014-05-19 | 2014-08-06 | 浪潮电子信息产业股份有限公司 | Method for batched server memory fault detection through IPMI tool |
CN104615518A (en) * | 2015-03-04 | 2015-05-13 | 浪潮集团有限公司 | Memory rank margin test method combined with temperature and voltage variables |
US20170109263A1 (en) * | 2015-10-15 | 2017-04-20 | Bank Of America Corporation | System test compliance tool |
CN106227616A (en) * | 2016-08-10 | 2016-12-14 | 浪潮电子信息产业股份有限公司 | A kind of batch realizes the method that RMT tests automatically |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108845906A (en) * | 2018-07-19 | 2018-11-20 | 郑州云海信息技术有限公司 | A kind of method and device promoting SPEC cpu test result |
CN109086180A (en) * | 2018-08-24 | 2018-12-25 | 郑州云海信息技术有限公司 | A kind of memory inspection testing method |
CN111324502A (en) * | 2018-12-13 | 2020-06-23 | 英业达科技有限公司 | Batch test system and method thereof |
TWI679530B (en) * | 2018-12-18 | 2019-12-11 | 英業達股份有限公司 | Batch test system and method thereof |
WO2023245779A1 (en) * | 2022-06-24 | 2023-12-28 | 长鑫存储技术有限公司 | Memory judgment method and apparatus, storage medium, and electronic device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN106991026A (en) | It is a kind of to pass through the method that network carries out server memory Rank margin test in batches | |
US20190180838A1 (en) | System For Testing Memory And Method Thereof | |
CN101739283B (en) | Computer and method for virtual system to directly access computer hardware | |
CN106155883B (en) | A kind of virtual machine method for testing reliability and device | |
CN106663061B (en) | Virtualization of memory for programmable logic | |
DE102019100122A1 (en) | Method for secure and authenticated pairing of nonvolatile memory and memory controller | |
CN106126368A (en) | A kind of method of memory failure address resolution under LINUX | |
US9129061B2 (en) | Method and apparatus for on-chip debugging | |
US9442815B2 (en) | Distributed on-chip debug triggering with allocated bus lines | |
US9063827B2 (en) | Systems and methods for storing and retrieving a defect map in a DRAM component | |
US20170278583A1 (en) | Fusebox-based memory repair | |
CN105550090A (en) | LINUX platform-based automatic BMC pressure test method | |
US9595350B2 (en) | Hardware-based memory initialization | |
CN104575615A (en) | Device and method for built-in self-test memory | |
CN112420535A (en) | Chip manufacturing method and system | |
CN116306408A (en) | Verification environment determination method, device, equipment and storage medium of System On Chip (SOC) | |
CN100375196C (en) | Method for reading semiconductor die information in a parallel test and burn-in system | |
CN109783294A (en) | A kind of test method and system of server memory performance | |
US11663314B2 (en) | Method for authenticating an on-chip circuit and associated system on-chip | |
CN211603369U (en) | Server DC power-down fault positioning system | |
US7197677B1 (en) | System and method to asynchronously test RAMs | |
TW202125248A (en) | Method and device for boundary scan and function test of motherboard | |
JP2000132431A (en) | Signal processor | |
CN105652966B (en) | starting method and server device | |
CN109446014A (en) | A kind of BMC test Information Authentication method, apparatus, terminal and storage medium |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170728 |