CN106959074A - It is a kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement - Google Patents

It is a kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement Download PDF

Info

Publication number
CN106959074A
CN106959074A CN201710167529.6A CN201710167529A CN106959074A CN 106959074 A CN106959074 A CN 106959074A CN 201710167529 A CN201710167529 A CN 201710167529A CN 106959074 A CN106959074 A CN 106959074A
Authority
CN
China
Prior art keywords
angle
micro
nano
glasses
prism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710167529.6A
Other languages
Chinese (zh)
Inventor
张蓓
刘雨
张承乾
闫鹏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beihang University
Original Assignee
Beihang University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beihang University filed Critical Beihang University
Priority to CN201710167529.6A priority Critical patent/CN106959074A/en
Publication of CN106959074A publication Critical patent/CN106959074A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

It is used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement the invention discloses a kind of, belong to photoelectric field and micro-nano detection field, the present invention includes the right-angle prism of four plated films, the right-angle surface of four right-angle prisms is overlapped two-by-two, the right-angled edge of four right-angle prisms coincides, and four right-angle prisms constitute cube prism.The present invention can solve the problems, such as the optical path difference measurement centered with the non-rotation that centers, ensure that the optical path difference that rotation optical path difference and displacement optical path difference are measured is not coupled mutually.

Description

It is a kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement
Technical field
Move and revolve the present invention relates to the technical field of laser detection of micro-nano operating platform, more particularly to a kind of micro-nano that is used for Four prism glasses-selecting equipments of gyration measurement.
Background technology
With the development and application of micro-nano operating technology, multiple degrees of freedom especially realizes that the micro-nano operation of rotary freedom is flat Platform is increasingly paid close attention to, and the synchro measure problem of the current non-Rotation centered, angular displacement and displacement of the lines is not all obtained Solve well.
Laser interferometer because high resolution, noncontact, it is affected by environment it is small, be quick on the draw the advantages of be widely used in it is various In precision measurement system.Current multiple laser interferometer are complete in use, the symmetry of its light path cannot be guaranteed, longitudinal light path With lateral light paths it is impossible to ensure that it is mutually perpendicular to, when determinand is synchronously subjected to displacement and rotated, it is impossible to measure displacement With the independent optical path difference of rotation.
Due to the characteristic that right-angle prism has outgoing beam parallel with incident beam, so being widely used in precision In optical measurement.When micro-nano platform rotates, it laser interferometer is captured reflected light and carry out interferometry.But work as During horizontal and vertical paired placement right-angle prism, it is impossible to ensure the Relative vertical of horizontal and vertical prism square, therefore, how Design is a kind of can to differentiate the glasses-selecting equipment in optical path difference source, be those skilled in the art's urgent need to resolve.
Patent accompanying drawing
Fig. 1 is right-angle prism;
Fig. 2 is the cube that right-angle prism is constituted;
1 and 2 in wherein Fig. 1 be the coated surface of right-angle prism;1,2,3 and 4 in Fig. 2 be right-angle prism.
The content of the invention
For the straight-line displacement of current multiple degrees of freedom micro-nano operating platform and asking in the presence of swing offset measuring method Topic, present invention offer is a kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement, high with Measurement Resolution, structure Simple the advantages of.
The technical solution adopted by the present invention is:
A kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement, its structure includes:By four right-angle prisms Reflectance coating, the top surface plating of the cube prism are coated with the cube prism of composition, two right-angle surfaces of the right-angle prism There is reflectance coating.
Described cube prism, when a pair of laser interferometer launch laser from the incidence of former and later two directions, is formed Light path is on cubical central point;When a pair of laser interferometer launch laser from the incidence of left and right both direction, formed Light path on cubical central point;
Described cube prism, equidistant point and former and later two right-angle prisms of the right-angle prism of left and right both direction Equidistant point is mutually perpendicular to.
The right-angle side of four described right-angle prisms is overlapped two-by-two, and the right-angled edge of four right-angle prisms coincides.
The top surface of the cube prism and bottom surface are all square, the intersection and four right angles of two diagonal planes of cube The right-angled edge of prism coincides.
Embodiment
To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the embodiment of the present invention In accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is A part of embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art The every other embodiment obtained under the premise of creative work is not made, belongs to the scope of protection of the invention.
Embodiment one:The right-angle prism glasses-selecting equipment of the micro-nano operating platform, structure includes:Four right-angle surfaces The right-angle prism of plated film, the right-angle side of four right-angle prisms is overlapped two-by-two, and the right-angled edge of four right-angle prisms coincides, Mei Gezhi Reflective membrane is plated in the right-angle surface of angle prism, coated surface is overlapped two-by-two with coated surface;
When a pair of laser interferometer, to launch laser incident from former and later two directions, and the light path formed is in cubical Heart point symmetry;When a pair of laser interferometer are launched, laser is incident from left and right both direction, and the light path formed is on cubical Central point.
Due to the Striking symmetry of described glasses-selecting equipment, i.e., laser interferometer can be made vertical at conplane two Side is worked up, and can be very good to solve the rotation optical path difference in the displacement optical path difference and plane in decoupling vertical direction, for micro- Receive platform movement and rotation angular measurement provide a kind of good measurement apparatus.
Embodiment two:Four plated film right-angled edges in embodiment one are substituted using four plated film pyramid mirrors Mirror, the central axis of four pyramid mirrors constitutes cross.
When a pair of laser interferometer are launched, laser is incident from former and later two directions, and the light path formed is on cruciform central Point symmetry;When a pair of laser interferometer are launched, laser is incident from left and right both direction, and the light path formed is on cruciform central Point symmetry.

Claims (4)

1. a kind of be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement, its apparatus structure includes:By four right-angle prisms Reflectance coating, the top surface plating of the cube prism are coated with the cube prism of composition, two right-angle surfaces of the right-angle prism There is reflective membrane.
2. it is according to claim 1 it is a kind of for micro-nano move and rotation angle measurement glasses-selecting equipment, it is characterised in that The right-angle side of four right-angle prisms is overlapped two-by-two, and the right-angled edge of four right-angle prisms coincides, the reflective membrane plated in right-angle surface, Characterized in that, eight right-angle surfaces of four right-angle prisms are plated with reflective membrane.
3. it is according to claim 1 it is a kind of for micro-nano move and rotation angle measurement glasses-selecting equipment, it is characterised in that The top surface of cube prism and bottom surface are all square, the intersection of two diagonal planes of cube and the right-angled edge of four right-angle prisms Coincide.
4. it is according to claim 1 it is a kind of for micro-nano move and rotation angle measurement glasses-selecting equipment, it is characterised in that Described cube prism, the equidistant point of the right-angle prism of left and right both direction and the equidistant point of former and later two right-angle prisms It is mutually perpendicular to.
CN201710167529.6A 2017-03-21 2017-03-21 It is a kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement Pending CN106959074A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710167529.6A CN106959074A (en) 2017-03-21 2017-03-21 It is a kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710167529.6A CN106959074A (en) 2017-03-21 2017-03-21 It is a kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement

Publications (1)

Publication Number Publication Date
CN106959074A true CN106959074A (en) 2017-07-18

Family

ID=59471278

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710167529.6A Pending CN106959074A (en) 2017-03-21 2017-03-21 It is a kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement

Country Status (1)

Country Link
CN (1) CN106959074A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113517928A (en) * 2021-04-26 2021-10-19 长春理工大学 All-optical capturing method and device applied to space laser communication

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101101376A (en) * 2007-08-03 2008-01-09 马仁勇 Color-combination prism manufacturing method
CN101373274A (en) * 2007-08-22 2009-02-25 鸿富锦精密工业(深圳)有限公司 Light-combining prism and mounting contraposition method thereof
CN101650166A (en) * 2008-08-15 2010-02-17 上海理工大学 Laser interference system used for measuring micro roll angle
CN102042804A (en) * 2009-10-13 2011-05-04 上海微电子装备有限公司 Measuring device and method of laser interferometer
US20110102778A1 (en) * 2009-11-04 2011-05-05 National Formosa University Geometric Error Measuring Device
CN102445854A (en) * 2010-10-15 2012-05-09 上海微电子装备有限公司 Workpiece stage vertical position measuring system
CN102506764A (en) * 2011-10-14 2012-06-20 上海理工大学 Laser interference system for displacement linearity measurement
CN102736423A (en) * 2011-04-02 2012-10-17 上海微电子装备有限公司 Object holding platform, error compensated measurement apparatus and error compensated method
CN105157560A (en) * 2015-05-29 2015-12-16 山东大学 Three-DOF (degree of freedom) precision laser detection device
CN205383991U (en) * 2016-01-27 2016-07-13 广西科技大学鹿山学院 High accuracy wide range laser displacement measurement device

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101101376A (en) * 2007-08-03 2008-01-09 马仁勇 Color-combination prism manufacturing method
CN101373274A (en) * 2007-08-22 2009-02-25 鸿富锦精密工业(深圳)有限公司 Light-combining prism and mounting contraposition method thereof
CN101650166A (en) * 2008-08-15 2010-02-17 上海理工大学 Laser interference system used for measuring micro roll angle
CN102042804A (en) * 2009-10-13 2011-05-04 上海微电子装备有限公司 Measuring device and method of laser interferometer
US20110102778A1 (en) * 2009-11-04 2011-05-05 National Formosa University Geometric Error Measuring Device
CN102445854A (en) * 2010-10-15 2012-05-09 上海微电子装备有限公司 Workpiece stage vertical position measuring system
CN102736423A (en) * 2011-04-02 2012-10-17 上海微电子装备有限公司 Object holding platform, error compensated measurement apparatus and error compensated method
CN102506764A (en) * 2011-10-14 2012-06-20 上海理工大学 Laser interference system for displacement linearity measurement
CN105157560A (en) * 2015-05-29 2015-12-16 山东大学 Three-DOF (degree of freedom) precision laser detection device
CN205383991U (en) * 2016-01-27 2016-07-13 广西科技大学鹿山学院 High accuracy wide range laser displacement measurement device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113517928A (en) * 2021-04-26 2021-10-19 长春理工大学 All-optical capturing method and device applied to space laser communication
CN113517928B (en) * 2021-04-26 2022-03-25 长春理工大学 All-optical capturing method and device applied to space laser communication

Similar Documents

Publication Publication Date Title
KR101701219B1 (en) Mems scanning mirror field of view provision methods and apparatus
CN102662236B (en) Scanning device realizing unidirectional laser scanning through double-faced vibrating mirror
CN108761424A (en) Laser radar and laser radar control method
CN103604368A (en) Dynamic and real-time measuring method in airspace engine assembling process
CN103308281A (en) Detection device and detection method for wedge-shaped lens
CN101566459A (en) Dual-frequency laser interferometer
CN103925890B (en) Three-dimensional angle measuring system based on beam aberration
CN106959074A (en) It is a kind of to be used for the glasses-selecting equipment of micro-nano movement and rotation angle measurement
CN107607050A (en) Laser thickness measuring apparatus
CN216770672U (en) Measuring system for simultaneously measuring thickness and refractive index of multilayer film
CN209446875U (en) A kind of combined reflected element of high-precision
CN202195817U (en) Double-laser-beam plane positioning system based on image interpretation
CN107806856B (en) experimental detection device and method for simulating target space attitude
CN110375708A (en) A kind of three-dimensional perspective measuring system
CN108759723A (en) optical angle measurement method
CN201527335U (en) 90-degree external angle prism laser interferometer
CN209928047U (en) Coated ridge prism
CN203572450U (en) Laser interference angle measurement optical path
CN107300383B (en) Laser optical path coupling system based on transflective prism
CN103017899B (en) Convergent mirror
CN105157560A (en) Three-DOF (degree of freedom) precision laser detection device
CN2651764Y (en) Abnormal shape solid polyhedral angle reflector
CN104034423B (en) High stability tilting mirror interferometer
CN109556566A (en) Relative dimensional attitude angle system and method between three pedestals of one kind
CN117367327B (en) Pentagonal prism perpendicularity detection system and method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20170718