CN106841819A - A kind of capacitor and inductance measurement system - Google Patents
A kind of capacitor and inductance measurement system Download PDFInfo
- Publication number
- CN106841819A CN106841819A CN201710151476.9A CN201710151476A CN106841819A CN 106841819 A CN106841819 A CN 106841819A CN 201710151476 A CN201710151476 A CN 201710151476A CN 106841819 A CN106841819 A CN 106841819A
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- China
- Prior art keywords
- inductance
- chip microcomputer
- capacitor
- measurement system
- circuit
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2611—Measuring inductance
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a kind of capacitor and inductance measurement system, including inductance to be measured, Colpitts oscillation circuit, single-chip microcomputer and digital display circuit, the inductance to be measured is connected with Colpitts oscillation circuit；The Colpitts oscillation circuit is connected with single-chip microcomputer；The single-chip microcomputer is connected with digital display circuit.A kind of capacitor and inductance measurement system of the invention, inductance value is transformed into by bikini oscillating circuit by frequency signal, then pass to single-chip microcomputer, counted in the internal counter of single-chip microcomputer, record the square-wave pulse of generation and the program by being previously entered calculates inductance value, passed to eventually through serial port and think register, then shown by digital display circuit, finally give result.
Description
Technical field
The present invention relates to a kind of capacitor and inductance measurement system.
Background technology
Capacitor and inductor tester is deposited when the single condenser capacitance value in shnt capacitor group is measured for substation field
Problem and specially develop, it is very wide that the measurement of capacitance resistance is applied in being researched and developed in measuring technology and product research
General, we are often required to measure the size of capacitance resistance in the application.Therefore, reliable design, safety, easily resistance, electric capacity, electricity
Sensing tester has greatly reality necessity and with extensive use value and application prospect.Traditional measurement capacitor square
Method has two kinds of the resonance method and bridge method, and the former circuit is simple, and speed is fast, but precision is low, and the latter's certainty of measurement is high, but speed is slow.
In order to improve the problem of the above, the present invention proposes a kind of capacitor and inductance measurement system.
The content of the invention
It is caused above-mentioned many in the prior art to solve it is an object of the invention to provide a kind of capacitor and inductance measurement system
Item defect.
The present invention uses following technical scheme：
To reach above-mentioned purpose, the present invention provides a kind of capacitor and inductance measurement system, including the vibration of inductance to be measured, capacitance three-point type
Circuit, single-chip microcomputer and digital display circuit, the inductance to be measured are connected with Colpitts oscillation circuit；The capacitance three-point type
Oscillating circuit is connected with single-chip microcomputer；The single-chip microcomputer is connected with digital display circuit.
Beneficial effects of the present invention：
There is provided a kind of capacitor and inductance measurement system, inductance value is transformed into by bikini oscillating circuit by frequency signal, then
Single-chip microcomputer is sent to, is counted in the internal counter of single-chip microcomputer, record the square-wave pulse of generation and by being previously entered
Program calculates inductance value, is passed to eventually through serial port and thinks register, is then shown by digital display circuit, most
Result is obtained eventually.
Brief description of the drawings
Fig. 1 is structural representation of the invention.
Specific embodiment
Specific embodiment of the invention is described below.
As shown in figure 1, a kind of capacitor and inductance measurement system, including inductance to be measured 1, Colpitts oscillation circuit 2, monolithic
Machine 3 and digital display circuit 4, the inductance to be measured 1 are connected with Colpitts oscillation circuit 2；The capacitance three-point type vibration
Circuit 2 is connected with single-chip microcomputer 3；The single-chip microcomputer 3 is connected with digital display circuit 4.
Inductance value, is transformed into frequency and believed by a kind of capacitor and inductance measurement system of the invention by bikini oscillating circuit
Number, single-chip microcomputer is then passed to, counted in the internal counter of single-chip microcomputer, record the square-wave pulse of generation and by prior
The program of input calculates inductance value, is passed to eventually through serial port and thinks register, is then shown by digital display circuit
Out, result is finally given.
The above, the only present invention preferably specific embodiment, but protection scope of the present invention is not limited thereto,
Any one skilled in the art the invention discloses technical scope in, technology according to the present invention scheme and its
Inventive concept is subject to equivalent or change, should all be included within the scope of the present invention.
Claims (1)
1. a kind of capacitor and inductance measurement system, including inductance to be measured, Colpitts oscillation circuit, single-chip microcomputer and numerical monitor electricity
Road, it is characterised in that the inductance to be measured is connected with Colpitts oscillation circuit；The Colpitts oscillation circuit and list
Piece machine is connected；The single-chip microcomputer is connected with digital display circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710151476.9A CN106841819A (en) | 2017-03-14 | 2017-03-14 | A kind of capacitor and inductance measurement system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710151476.9A CN106841819A (en) | 2017-03-14 | 2017-03-14 | A kind of capacitor and inductance measurement system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106841819A true CN106841819A (en) | 2017-06-13 |
Family
ID=59144559
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710151476.9A Pending CN106841819A (en) | 2017-03-14 | 2017-03-14 | A kind of capacitor and inductance measurement system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106841819A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10571423B2 (en) | 2016-06-24 | 2020-02-25 | Stanley Black & Decker Inc. | Systems and methods for locating a stud |
| CN112284425A (en) * | 2020-10-12 | 2021-01-29 | 凯联医疗科技(上海)有限公司 | High-precision encoder based on LC oscillation circuit and implementation method |
| US10908312B2 (en) | 2016-06-24 | 2021-02-02 | Stanley Black & Decker Inc. | Systems and methods for locating a metal object |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2687684Y (en) * | 2003-11-24 | 2005-03-23 | 中国科学院物理研究所 | Digital capacitive-inductance measuring instrument |
| CN202870179U (en) * | 2012-10-17 | 2013-04-10 | 南京信息工程大学 | LCR measuring instrument |
| CN202939886U (en) * | 2012-11-28 | 2013-05-15 | 成都捷康特科技有限公司 | Simple capacitance and inductance measurement teaching instrument |
| CN204347136U (en) * | 2015-01-29 | 2015-05-20 | 合肥师范学院 | LCR multifunctional measuring handheld device |
-
2017
- 2017-03-14 CN CN201710151476.9A patent/CN106841819A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2687684Y (en) * | 2003-11-24 | 2005-03-23 | 中国科学院物理研究所 | Digital capacitive-inductance measuring instrument |
| CN202870179U (en) * | 2012-10-17 | 2013-04-10 | 南京信息工程大学 | LCR measuring instrument |
| CN202939886U (en) * | 2012-11-28 | 2013-05-15 | 成都捷康特科技有限公司 | Simple capacitance and inductance measurement teaching instrument |
| CN204347136U (en) * | 2015-01-29 | 2015-05-20 | 合肥师范学院 | LCR multifunctional measuring handheld device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10571423B2 (en) | 2016-06-24 | 2020-02-25 | Stanley Black & Decker Inc. | Systems and methods for locating a stud |
| US10908312B2 (en) | 2016-06-24 | 2021-02-02 | Stanley Black & Decker Inc. | Systems and methods for locating a metal object |
| US11067714B2 (en) | 2016-06-24 | 2021-07-20 | Stanley Black & Decker Inc. | Systems and methods for locating a metal object |
| CN112284425A (en) * | 2020-10-12 | 2021-01-29 | 凯联医疗科技(上海)有限公司 | High-precision encoder based on LC oscillation circuit and implementation method |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20170613 |
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| WD01 | Invention patent application deemed withdrawn after publication |