CN106814479B - 一种面板缺陷位置的偏移补偿方法、装置及*** - Google Patents
一种面板缺陷位置的偏移补偿方法、装置及*** Download PDFInfo
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- CN106814479B CN106814479B CN201710018485.0A CN201710018485A CN106814479B CN 106814479 B CN106814479 B CN 106814479B CN 201710018485 A CN201710018485 A CN 201710018485A CN 106814479 B CN106814479 B CN 106814479B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
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- Physics & Mathematics (AREA)
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- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
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Priority Applications (1)
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CN201710018485.0A CN106814479B (zh) | 2017-01-11 | 2017-01-11 | 一种面板缺陷位置的偏移补偿方法、装置及*** |
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CN201710018485.0A CN106814479B (zh) | 2017-01-11 | 2017-01-11 | 一种面板缺陷位置的偏移补偿方法、装置及*** |
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CN106814479A CN106814479A (zh) | 2017-06-09 |
CN106814479B true CN106814479B (zh) | 2019-07-16 |
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CN201710018485.0A Active CN106814479B (zh) | 2017-01-11 | 2017-01-11 | 一种面板缺陷位置的偏移补偿方法、装置及*** |
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Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110890043B (zh) * | 2019-11-26 | 2023-06-02 | 深圳市华星光电半导体显示技术有限公司 | 一种十字线缺陷检测方法、***、阵列基板及显示面板 |
CN111907191B (zh) * | 2020-06-19 | 2022-03-01 | 固高科技股份有限公司 | 补偿方法、装置、电雕控制***和计算机可读存储介质 |
CN111883036B (zh) * | 2020-07-28 | 2023-05-09 | 华兴源创(成都)科技有限公司 | 显示面板的补偿方法和补偿装置 |
CN113345328B (zh) * | 2021-05-28 | 2022-08-02 | Tcl华星光电技术有限公司 | 显示面板Mura修补方法 |
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CN101471272A (zh) * | 2007-12-29 | 2009-07-01 | 财团法人工业技术研究院 | 基板激光修补机自动瑕疵检测装置及方法 |
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CN102310290A (zh) * | 2011-09-06 | 2012-01-11 | 苏州优纳科技有限公司 | 一种pcb板焊点的修复方法 |
CN103292709A (zh) * | 2013-05-24 | 2013-09-11 | 深圳市华星光电技术有限公司 | 测长机日常检测与自动补正方法 |
CN103311148A (zh) * | 2013-06-04 | 2013-09-18 | 上海华力微电子有限公司 | 一种检测观察缺陷的方法 |
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CN103676284A (zh) * | 2013-12-27 | 2014-03-26 | 合肥京东方光电科技有限公司 | 一种成盒对位方法 |
CN105842885A (zh) * | 2016-03-21 | 2016-08-10 | 凌云光技术集团有限责任公司 | 一种液晶屏缺陷分层定位方法及装置 |
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2017
- 2017-01-11 CN CN201710018485.0A patent/CN106814479B/zh active Active
Patent Citations (13)
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CN1580875A (zh) * | 2003-08-08 | 2005-02-16 | 光子动力学公司 | 传送和约束大型扁平柔性介质的高精度气浮轴承分轴台 |
CN101536011A (zh) * | 2005-01-21 | 2009-09-16 | 光子动力学公司 | 自动缺陷修复*** |
KR20080047888A (ko) * | 2006-11-27 | 2008-05-30 | 엘지디스플레이 주식회사 | 평판표시장치의 표시결함 보상방법 |
CN101471272A (zh) * | 2007-12-29 | 2009-07-01 | 财团法人工业技术研究院 | 基板激光修补机自动瑕疵检测装置及方法 |
KR100905520B1 (ko) * | 2008-11-13 | 2009-07-01 | 와이즈플래닛(주) | 엘시디 목시검사시스템에서 발견한 결함좌표 획득을 위한 좌표획득장치 및 방법 |
KR20110137069A (ko) * | 2010-06-16 | 2011-12-22 | 주식회사 디네트웍스 | 평판 디스플레이 패널 검사 시스템 및 방법 |
CN102310290A (zh) * | 2011-09-06 | 2012-01-11 | 苏州优纳科技有限公司 | 一种pcb板焊点的修复方法 |
CN103630542A (zh) * | 2012-08-27 | 2014-03-12 | Ntn株式会社 | 缺陷检测装置、缺陷修正装置及缺陷检测方法 |
CN103292709A (zh) * | 2013-05-24 | 2013-09-11 | 深圳市华星光电技术有限公司 | 测长机日常检测与自动补正方法 |
CN103311148A (zh) * | 2013-06-04 | 2013-09-18 | 上海华力微电子有限公司 | 一种检测观察缺陷的方法 |
CN103499902A (zh) * | 2013-08-15 | 2014-01-08 | 京东方科技集团股份有限公司 | 一种基板的全距调控方法和装置 |
CN103676284A (zh) * | 2013-12-27 | 2014-03-26 | 合肥京东方光电科技有限公司 | 一种成盒对位方法 |
CN105842885A (zh) * | 2016-03-21 | 2016-08-10 | 凌云光技术集团有限责任公司 | 一种液晶屏缺陷分层定位方法及装置 |
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Application publication date: 20170609 Assignee: Yungu (Gu'an) Technology Co., Ltd.|Bazhou Yungu Electronic Technology Co., Ltd.|Kunshan Institute of technology new flat panel display technology center Co., Ltd Assignor: Kunshan Guo Xian Photoelectric Co., Ltd. Contract record no.: X2019990000157 Denomination of invention: Method, device and system for offset compensation of panel defect position Granted publication date: 20190716 License type: Common License Record date: 20191031 |
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Effective date of registration: 20191211 Address after: 510130 No.2 Xiangshan Avenue, Yongning Street, Zengcheng District, Guangzhou City, Guangdong Province (within the core area of Zengcheng economic and Technological Development Zone) Patentee after: Guangzhou Guoxian Technology Co., Ltd Address before: 215300, No. 1, Longteng Road, Kunshan Development Zone, Jiangsu, Suzhou, 4 Patentee before: Kunshan Guo Xian Photoelectric Co., Ltd. |