CN106708781A - Method and apparatus for measuring flicker severity of photovoltaic power station - Google Patents
Method and apparatus for measuring flicker severity of photovoltaic power station Download PDFInfo
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Abstract
The invention relates to a method and an apparatus for measuring flicker severity of a photovoltaic power station. The method comprises the steps of obtaining standard sampling data of irradiance, and performing wavelet decomposition and wavelet transform-inverse transform on the standard sampling data in sequence; determining a stable energy index and a fluctuation index of the standard sampling data by utilizing the data subjected to the wavelet transform-inverse transform; defining sampling intervals according to the stable energy index and the fluctuation index of the standard sampling data, and determining a weight value of each sampling interval; and determining a flicker value of the photovoltaic power station according to a long-time flicker value corresponding to each irradiance sampling point and the weight value of each sampling interval. According to the method provided by the invention, the influence of irradiance fluctuation on flicker testing in the photovoltaic power station is considered, and the accurate flicker value of the photovoltaic power station is obtained, so that a flicker testing condition of a photovoltaic inverter is accurately described, and a comprehensive power quality assessment system of the photovoltaic power station is established.
Description
Technical field
The present invention relates to Power System Stability Assessment field, and in particular to a kind of horizontal method for measurement of photovoltaic plant flickering and
Device.
Background technology
In the last few years, the new energy with wind energy, solar energy as representative obtained fast development in the whole world.By the end of the year 2015,
China's photovoltaic generation adds up 43,180,000 kilowatts of installed capacity, as the country that global Photovoltaic generation installed capacity is maximum.Wherein, light
37,120,000 kilowatts of overhead utility, distributed 6,060,000 kilowatts, the kilowatt hour of annual electricity generating capacity 39200000000.With the increasing of Photovoltaic generation installed capacity
Long, photovoltaic generation power quality problem is more protruded, and wherein flickering is a side of the power quality problem that photovoltaic generation causes
Face.Flickering is the deleterious consequence that voltage pulsation causes, refer to light source light according to Strength Changes when cause the mankind produce sense of discomfort.Pass
Flickering Producing reason is that the plant running of the Large Copacity impact power such as electric arc furnaces, rolling mill is caused in system power system.
Modern study shows that a large amount of m-Acetyl chlorophosphonazo electric current injection power systems can also cause flickering.Due to solar irradiation wave characteristic and
The use of electronic power switch device, grid-connected photovoltaic inverter is also sent a telegram here while using optical energy power to power system band
Can quality problems.With the development of photovoltaic generation, increasing grid-connected photovoltaic inverter accesses power network, the flickering being induced by it
Phenomenon is also further obvious.
In the measurements, if power network there are other fluctuating loads, voltage wave can be caused in photovoltaic generation unit public access point
Dynamic, the voltage pulsation of the photovoltaic generation unit so measured will depend on power network characteristic, cause the error of flicker measurement.Virtual net
The network measurement electric current that record inverter is sent first, photovoltaic DC-to-AC converter injection is then calculated by way of in analogue simulation and is supplied
The voltage pulsation of the output end of electric system.Virtual power network does not have other voltage pulsation sources in addition to inverter output pulsation, arranges
Except the influence of power network background voltage fluctuation, can the flickering that brings to bulk power grid of objective evaluation photovoltaic power generation technology influence.It is empty
Intend Short circuit ratios S in power networkk,fic/SnSuggestion is taken between 20~50, SnIt is the specified apparent energy of tested inverter, Sk,ficIt is
The capacity of short circuit of virtual power network.Use appropriate short-circuit ratio SK, fic/SnCome ensure the algorithm and instrument of flickering to PstValue meets
Within the scope of standard testing.Big voltage pulsation can be obtained by reducing short-circuit ratio, on the other hand, if the ratio of short circuit
Become too small, virtual line voltage uficT the mean effective value of () will deviate significantly from virtual voltage U0T the virtual value of (), this is caused
Changed with respect to voltage because absolute voltage change is attributed to different average values.In order that obtaining the fluctuation range of analog voltage
In flickermeter, it is proposed that use short-circuit ratio SK, fic/SnBetween 20 and 50.Obtain dodging in short-term for 10 minutes using virtual power network measurement
Variate Pst,ficSubstitute into following formula and calculate Short Term Flicker value Pst：
Flickering value P when longltCalculated by 12 Short Term Flicker values in 2 hours and tried to achieve, wherein PltjIt is that j-th in short-term in 2 hours
Flickering value：
Flickering value P when above-mentioned longltMeasuring method avoid shadow of the voltage pulsation to flicker measurement result to a certain extent
Ring, but irradiation level fluctuation can also influence flicker test result in practical application, be divided only in accordance with irradiation level size in the prior art
Operating mode is obviously not objective enough.
The content of the invention
The present invention provides a kind of parameter method for measurement of virtual synchronous generator, the purpose is to consider to be irradiated in photovoltaic plant
Influence of the degree fluctuation to flicker test, obtains accurate photovoltaic plant flickering value, so that the flickering of accurate description photovoltaic DC-to-AC converter is surveyed
Trial work condition, sets up comprehensive photovoltaic plant electricity quality evaluation system.
The purpose of the present invention is realized using following technical proposals：
A kind of parameter method for measurement of virtual synchronous generator, it is theed improvement is that, including：
Irradiation level standard sample data are obtained, and carries out wavelet decomposition and wavelet transformation inverse transformation successively to it；
Determine the steady state energy index and the index of oscillation of standard sample data respectively using data after wavelet transformation inverse transformation；
Steady state energy index and the index of oscillation according to standard sample data divide sampling interval, and determine each sampling interval
Weighted value；
According to each irradiation level sampled point when corresponding long the weighted value of flickering value and each sampling interval determine photovoltaic plant dodge
Variate.
Preferably, the acquisition irradiation level standard sample data, and wavelet decomposition is carried out to the standard sample data, wrap
Include：
According to irradiation level history samples data, the irradiation level for determining standard sample time point n using linear interpolation algorithm is adopted
Sample value；
Irradiation level sampled value to standard sample time point n carries out one-dimensinal discrete small wave transformation, wherein, wavelet basis is
Haar small echos, the wavelet decomposition number of plies is 7 layers.
Further, it is described according to irradiation level history samples data, determine the standard sample time using linear interpolation algorithm
The irradiation level sampled value of point n, including：
Irradiation level sampled value r (n) of standard sample time point n is determined as the following formula：
In above formula, T1And T2It is two adjacent history samples time points of standard sample time point n, R (T1) and R (T2) be
The irradiation level sampled value at two standard sample time point n adjacent history samples time points.
Further, the irradiation level sampled value to standard sample time point n carries out one-dimensinal discrete small wave transformation,
Including：
The wavelet decomposition number of plies is made for 7 layers, the irradiation level sampled value at standard sample time point n is carried out as the following formula one-dimensional
Wavelet transform：
In above formula, H (n) is the tap coefficient sequence of low pass filter, and G (n) is the tap coefficient sequence of high-pass filter,
RakN () is the rough approximation general picture part after kth layer one-dimensinal discrete small wave transformation, RdkN () is that kth layer one-dimensional discrete small echo becomes
High frequency detail part after changing, k be the wavelet decomposition number of plies, k ∈ [1,7], wherein, as k=1, Ra1N ()=r (n), r (n) are
The irradiation level sampled value of standard sample time point n；
Obtain the high frequency detail part R after every layer of one-dimensinal discrete small wave transformationdu(n) and the 7th layer of one-dimensinal discrete small wave transformation
Rough approximation general picture part R afterwardsa7(n), and respectively to Rdu(n) and Ra7N () carries out one-dimensional wavelet transform inverse transformation, obtain mark
The sequential record data r of the irradiation level sampled value of quasi- sampling time point ndu(n) and ra7(n), wherein, u=1,2...7；
Preferably, the steady state energy index and the index of oscillation that standard sample data are determined respectively, including：
The steady state energy index E FI in i-th time period of standard sample data is determined as the following formulai：
In above formula, rdk(nj) and ra7(nj) be to j-th irradiation level of standard sample time point n in i-th time period
The sequential record data of sampled value, Δ t is irradiation level sampling time interval, NiIt is i-th time period internal irradiation degree sampling number；
The index of oscillation ESI in i-th time period of standard sample data is determined as the following formulai：
Preferably, the division sampling interval, and determine the weighted value of each sampling interval, including：
I-th steady state energy index E FI of time period internal standard sampled data is obtained respectivelyiWith index of oscillation ESIi, its
In, i ∈ [Isosorbide-5-Nitrae 380], each time period is 2 hours, and obtains the steady state energy index of All Time section Plays sampled data
Maximum EFImaxWith index of oscillation maximum ESImax；
Then the 1st low waving interval of low irradiance is (0<EFIi≤EFImax/2,0<EFIi≤ESImax/ 2), wherein, the area
Between internal standard sampled data record points be m1；
Then the 2nd low waving interval of high irradiance is (0<EFIi≤EFImax/2,ESImax/2<EFIi≤ESImax), wherein,
The interval internal standard sampled data record points are m2；
Then the 3rd high irradiance waving interval high is (EFImax/2<EFIi≤EFImax,ESImax/2<EFIi≤ESImax),
Wherein, the interval internal standard sampled data record points are m3；
Then the 4th low irradiance waving interval high is (EFImax/2<EFIi≤EFImax,0<EFIi≤ESImax/ 2), wherein,
The interval internal standard sampled data record points are m4；
S-th weight value α of sampling interval is determined as the following formulas：
In above formula, msIt is s-th sampling interval internal standard sampled data record points.
Preferably, photovoltaic plant flickering value P is determined as the following formulalt′：
In above formula, MsIt is s-th sampling interval internal irradiation degree sampling number, Plt,s,mFor m-th in s-th sampling interval
Flickering value, α when irradiation level sampled point is corresponding longsIt is s-th weighted value of sampling interval.
A kind of photovoltaic plant flickering horizontal measuring device, it is theed improvement is that, described device includes：
Acquisition module, for obtaining irradiation level standard sample data, and carries out wavelet decomposition and wavelet transformation successively to it
Inverse transformation；
First determining module, the stable state energy for determining standard sample data respectively using data after wavelet transformation inverse transformation
Volume index and the index of oscillation；
Second determining module, for dividing sample region according to the steady state energy index and the index of oscillation of standard sample data
Between, and determine the weighted value of each sampling interval；
3rd determining module, for the weight according to each irradiation level sampled point flickering value and each sampling interval when corresponding long
Value determines photovoltaic plant flickering value.
Preferably, the acquisition module includes：
First determining unit, for according to irradiation level history samples data, standard sample being determined using linear interpolation algorithm
The irradiation level sampled value of time point n；
Wavelet decomposition unit, one-dimensional discrete small echo is carried out for the irradiation level sampled value to standard sample time point n
Conversion, wherein, wavelet basis is Haar small echos, and the wavelet decomposition number of plies is 7 layers.
Further, first determining unit includes：
First determination subelement, irradiation level sampled value r (n) for determining standard sample time point n as the following formula：
In above formula, T1And T2It is two adjacent history samples time points of standard sample time point n, R (T1) and R (T2) be
The irradiation level sampled value at two standard sample time point n adjacent history samples time points.
Further, the wavelet decomposition unit includes：
Wavelet decomposition subelement, for making the wavelet decomposition number of plies for 7 layers, as the following formula to standard sample time point n
Irradiation level sampled value carries out one-dimensinal discrete small wave transformation：
In above formula, H (n) is the tap coefficient sequence of low pass filter, and G (n) is the tap coefficient sequence of high-pass filter,
RakN () is the rough approximation general picture part after kth layer one-dimensinal discrete small wave transformation, RdkN () is that kth layer one-dimensional discrete small echo becomes
High frequency detail part after changing, k be the wavelet decomposition number of plies, k ∈ [1,7], wherein, as k=1, Ra1N ()=r (n), r (n) are
The irradiation level sampled value of standard sample time point n；
First acquisition submodule, for obtaining the high frequency detail part R after every layer of one-dimensinal discrete small wave transformationdu(n) and the 7th
Rough approximation general picture part R after layer one-dimensinal discrete small wave transformationa7(n), and respectively to Rdu(n) and Ra7N () carries out one-dimensional small echo
Conversion inverse transformation, obtains the sequential record data r of the irradiation level sampled value of standard sample time point ndu(n) and ra7(n), wherein,
U=1,2...7；
Preferably, first determining module includes：
Second determining unit, for the steady state energy index in i-th time period for determining standard sample data as the following formula
EFIi：
In above formula, rdk(nj) and ra7(nj) be to j-th irradiation level of standard sample time point n in i-th time period
The sequential record data of sampled value, Δ t is irradiation level sampling time interval, NiIt is i-th time period internal irradiation degree sampling number；
3rd determining unit, for the index of oscillation ESI in i-th time period for determining standard sample data as the following formulai：
Preferably, second determining module includes：
First acquisition unit, for obtaining i-th steady state energy index E FI of time period internal standard sampled data respectivelyi
With index of oscillation ESIi, wherein, i ∈ [Isosorbide-5-Nitrae 380], each time period is 2 hours, and obtains the sampling of All Time section Plays
The steady state energy index maximum EFI of datamaxWith index of oscillation maximum ESImax；
Then the 1st low waving interval of low irradiance is (0<EFIi≤EFImax/2,0<EFIi≤ESImax/ 2), wherein, the area
Between internal standard sampled data record points be m1；
Then the 2nd low waving interval of high irradiance is (0<EFIi≤EFImax/2,ESImax/2<EFIi≤ESImax), wherein,
The interval internal standard sampled data record points are m2；
Then the 3rd high irradiance waving interval high is (EFImax/2<EFIi≤EFImax,ESImax/2<EFIi≤ESImax),
Wherein, the interval internal standard sampled data record points are m3；
Then the 4th low irradiance waving interval high is (EFImax/2<EFIi≤EFImax,0<EFIi≤ESImax/ 2), wherein,
The interval internal standard sampled data record points are m4；
4th determining unit, for determining s-th weight value α of sampling interval as the following formulas：
In above formula, msIt is s-th sampling interval internal standard sampled data record points.
Preferably, the 3rd determining module includes：
5th determining unit, for determining photovoltaic plant flickering value P as the following formulalt′：
In above formula, MsIt is s-th sampling interval internal irradiation degree sampling number, Plt,s,mFor m-th in s-th sampling interval
Flickering value, α when irradiation level sampled point is corresponding longsIt is s-th weighted value of sampling interval.
Beneficial effects of the present invention：
In the prior art, still lack to be fluctuated on photovoltaic irradiation level and quantify evaluation process, the technical scheme that the present invention is provided,
According to irradiance data decomposition result in different vibration frequencies, set up the solar irradiance index of oscillation and steady state index evaluation refers to
Mark, four typical sampling intervals are divided into by solar irradiance condition, and respectively to sampling interval tax weighted value, it is achieved thereby that
The accurate description of irradiation level operating mode in photovoltaic plant flicker test, to reach accurate description photovoltaic DC-to-AC converter flicker test operating mode,
Set up the purpose of comprehensive photovoltaic plant electricity quality evaluation system.
Brief description of the drawings
Fig. 1 is a kind of flow chart of the parameter method for measurement of virtual synchronous generator of the invention；
Fig. 2 is the irradiation level historical data schematic diagram under cloudy in the embodiment of the present invention and two kinds of weather conditions of fine day；
Fig. 3 is different fluctuating range wave component schematic diagrames under cloudy weather in the embodiment of the present invention；
Fig. 4 is different fluctuating range wave component schematic diagrames under sunny weather in the embodiment of the present invention；
Fig. 5 be measure in the embodiment of the present invention power station affiliated area it is long when irradiation level fluctuation analysis result schematic diagram；
Fig. 6 is a kind of structural representation of the parameter measuring equipment of virtual synchronous generator of the invention.
Specific embodiment
Specific embodiment of the invention is elaborated below in conjunction with the accompanying drawings.
To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the embodiment of the present invention
In accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is
A part of embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art
The all other embodiment obtained under the premise of creative work is not made, belongs to the scope of protection of the invention.
A kind of parameter method for measurement of virtual synchronous generator that the present invention is provided, as shown in figure 1, including：
101. obtain irradiation level standard sample data, and carry out wavelet decomposition and wavelet transformation inverse transformation successively to it；
102. steady state energy index and the fluctuations for determining standard sample data respectively using data after wavelet transformation inverse transformation
Index；
103. divide sampling interval according to the steady state energy index and the index of oscillation of standard sample data, and determine each sampling
Interval weighted value；
104. according to each irradiation level sampled point when corresponding long the weighted value of flickering value and each sampling interval determine photovoltaic electric
Stand flickering value.
The technical scheme that the present invention is provided, according to irradiance data decomposition result in different vibration frequencies, sets up the sun
The irradiation level index of oscillation and steady state index evaluation index, are divided into four typical sampling intervals, and divide by solar irradiance condition
It is other to sampling interval assign weighted value, it is achieved thereby that in photovoltaic plant flicker test irradiation level operating mode accurate description, specifically,
The step 101, including：
According to irradiation level history samples data, the irradiation level for determining standard sample time point n using linear interpolation algorithm is adopted
Sample value；
Irradiation level sampled value to standard sample time point n carries out one-dimensinal discrete small wave transformation, wherein, wavelet basis is
Haar small echos, the wavelet decomposition number of plies is 7 layers.
Further, it is described according to irradiation level history samples data, determine the standard sample time using linear interpolation algorithm
The irradiation level sampled value of point n, including：
Irradiation level sampled value r (n) of standard sample time point n is determined as the following formula：
In above formula, T1And T2It is two adjacent history samples time points of standard sample time point n, R (T1) and R (T2) be
The irradiation level sampled value at two standard sample time point n adjacent history samples time points.
The irradiation level sampled value to standard sample time point n carries out one-dimensinal discrete small wave transformation, including：
The wavelet decomposition number of plies is made for 7 layers, the irradiation level sampled value at standard sample time point n is carried out as the following formula one-dimensional
Wavelet transform：
In above formula, H (n) is the tap coefficient sequence of low pass filter, and G (n) is the tap coefficient sequence of high-pass filter,
RakN () is the rough approximation general picture part after kth layer one-dimensinal discrete small wave transformation, RdkN () is that kth layer one-dimensional discrete small echo becomes
High frequency detail part after changing, k be the wavelet decomposition number of plies, k ∈ [1,7], wherein, as k=1, Ra1N ()=r (n), r (n) are
The irradiation level sampled value of standard sample time point n；
Obtain the high frequency detail part R after every layer of one-dimensinal discrete small wave transformationdu(n) and the 7th layer of one-dimensinal discrete small wave transformation
Rough approximation general picture part R afterwardsa7(n), and respectively to Rdu(n) and Ra7N () carries out one-dimensional wavelet transform inverse transformation, obtain mark
The sequential record data r of the irradiation level sampled value of quasi- sampling time point ndu(n) and ra7(n), wherein, u=1,2...7；
Obtain in i-th time period j-th sequential record data of the irradiation level sampled value of standard sample time point n it
Afterwards, one can be entered by the sequential record data of j-th irradiation level sampled value of standard sample time point n in i-th time period
The steady state energy index and the index of oscillation of step determination standard sample data, the step 102, including：
The steady state energy index E FI in i-th time period of standard sample data is determined as the following formulai：
In above formula, rdk(nj) and ra7(nj) irradiation level that is j-th standard sample time point n in i-th time period adopts
The sequential record data of sample value, Δ t is irradiation level sampling time interval, NiIt is i-th time period internal irradiation degree sampling number；
The index of oscillation ESI in i-th time period of standard sample data is determined as the following formulai：
After determining the steady state energy index and the index of oscillation of standard sample data, the stable state energy according to standard sample data
Volume index and index of oscillation division sampling interval, and determine the weighted value of each sampling interval, therefore, step 103 includes：
I-th steady state energy index E FI of time period internal standard sampled data is obtained respectivelyiWith index of oscillation ESIi, its
In, i ∈ [Isosorbide-5-Nitrae 380], each time period is 2 hours, and obtains the steady state energy index of All Time section Plays sampled data
Maximum EFImaxWith index of oscillation maximum ESImax；
Then the 1st low waving interval of low irradiance is (0<EFIi≤EFImax/2,0<EFIi≤ESImax/ 2), wherein, the area
Between internal standard sampled data record points be m1；
Then the 2nd low waving interval of high irradiance is (0<EFIi≤EFImax/2,ESImax/2<EFIi≤ESImax), wherein,
The interval internal standard sampled data record points are m2；
Then the 3rd high irradiance waving interval high is (EFImax/2<EFIi≤EFImax,ESImax/2<EFIi≤ESImax),
Wherein, the interval internal standard sampled data record points are m3；
Then the 4th low irradiance waving interval high is (EFImax/2<EFIi≤EFImax,0<EFIi≤ESImax/ 2), wherein,
The interval internal standard sampled data record points are m4；
S-th weight value α of sampling interval is determined as the following formulas：
In above formula, msIt is s-th sampling interval internal standard sampled data record points.
Obtain after sampling interval respective weights value, determine photovoltaic plant flickering value P in step 104 as the following formulalt′：
In above formula, MsIt is s-th sampling interval internal irradiation degree sampling number, Plt,s,mFor m-th in s-th sampling interval
Flickering value, α when irradiation level sampled point is corresponding longsIt is s-th weighted value of sampling interval.
By taking the photovoltaic plant flicker test result in somewhere as an example, this area's irradiance data of a year is united first
Meter, wherein the irradiation level historical data under cloudy and two kinds of weather conditions of fine day is as shown in Figure 2；
According to step 101, by historical data by after data reconstruction, number of plies j being carried out to data using one-dimensional wavelet transform
=7 decomposition, obtains the irradiation level undulate quantity under each time scale, and different fluctuating range wave components are as schemed under cloudy weather
Shown in 3, different fluctuating range wave components are as shown in Figure 4 under sunny weather；
The 1 year historical data in this area is processed, irradiation level fluctuation analysis result when measurement power station affiliated area is long
As shown in Figure 5；
By statistics, regional statistics numbers are as shown in table 1：
The illumination waviness index distribution statisticses of table 1
| Operating mode | I areas | II areas | III areas | IV areas |
| Sum | 409 | 99 | 40 | 111 |
| Weight | 62.06% | 15.02% | 6.07% | 16.84% |
Flicker measurement result and irradiation level mutation analysis result are as shown in table 2 when long during measurement：
The flicker measurement result of table 2 and correspondence irradiation level are interval
According to above statistics, the power station multi-state current glitches overall target is：
In above formula, Plt,IFor I sampling intervals it is long when flickering value；
Assessed by overall target, the long-term flickering level in the power station is 0.1441.
A kind of photovoltaic plant flickering horizontal measuring device, as shown in fig. 6, described device includes：
Acquisition module, for obtaining irradiation level standard sample data, and carries out wavelet decomposition and wavelet transformation successively to it
Inverse transformation；
First determining module, the stable state energy for determining standard sample data respectively using data after wavelet transformation inverse transformation
Volume index and the index of oscillation；
Second determining module, for dividing sample region according to the steady state energy index and the index of oscillation of standard sample data
Between, and determine the weighted value of each sampling interval；
3rd determining module, for the weight according to each irradiation level sampled point flickering value and each sampling interval when corresponding long
Value determines photovoltaic plant flickering value.
The acquisition module includes：
First determining unit, for according to irradiation level history samples data, standard sample being determined using linear interpolation algorithm
The irradiation level sampled value of time point n；
Wavelet decomposition unit, one-dimensional discrete small echo is carried out for the irradiation level sampled value to standard sample time point n
Conversion, wherein, wavelet basis is Haar small echos, and the wavelet decomposition number of plies is 7 layers.
First determining unit includes：
First determination subelement, irradiation level sampled value r (n) for determining standard sample time point n as the following formula：
In above formula, T1And T2It is two adjacent history samples time points of standard sample time point n, R (T1) and R (T2) be
The irradiation level sampled value at two standard sample time point n adjacent history samples time points.
The wavelet decomposition unit includes：
Wavelet decomposition subelement, for making the wavelet decomposition number of plies for 7 layers, as the following formula to standard sample time point n
Irradiation level sampled value carries out one-dimensinal discrete small wave transformation：
In above formula, H (n) is the tap coefficient sequence of low pass filter, and G (n) is the tap coefficient sequence of high-pass filter,
RakN () is the rough approximation general picture part after kth layer one-dimensinal discrete small wave transformation, RdkN () is that kth layer one-dimensional discrete small echo becomes
High frequency detail part after changing, k be the wavelet decomposition number of plies, k ∈ [1,7], wherein, as k=1, Ra1N ()=r (n), r (n) are
The irradiation level sampled value of standard sample time point n；
First acquisition submodule, for obtaining the high frequency detail part R after every layer of one-dimensinal discrete small wave transformationdu(n) and the 7th
Rough approximation general picture part R after layer one-dimensinal discrete small wave transformationa7(n), and respectively to Rdu(n) and Ra7N () carries out one-dimensional small echo
Conversion inverse transformation, obtains the sequential record data r of the irradiation level sampled value of standard sample time point ndu(n) and ra7(n), wherein,
U=1,2...7；
First determining module includes：
Second determining unit, for the steady state energy index in i-th time period for determining standard sample data as the following formula
EFIi：
In above formula, rdk(nj) and ra7(nj) be to j-th irradiation level of standard sample time point n in i-th time period
The sequential record data of sampled value, Δ t is irradiation level sampling time interval, NiIt is i-th time period internal irradiation degree sampling number；
3rd determining unit, for the index of oscillation ESI in i-th time period for determining standard sample data as the following formulai：
Second determining module includes：
First acquisition unit, for obtaining i-th steady state energy index E FI of time period internal standard sampled data respectivelyi
With index of oscillation ESIi, wherein, i ∈ [Isosorbide-5-Nitrae 380], each time period is 2 hours, and obtains the sampling of All Time section Plays
The steady state energy index maximum EFI of datamaxWith index of oscillation maximum ESImax；
Then the 1st low waving interval of low irradiance is (0<EFIi≤EFImax/2,0<EFIi≤ESImax/ 2), wherein, the area
Between internal standard sampled data record points be m1；
Then the 2nd low waving interval of high irradiance is (0<EFIi≤EFImax/2,ESImax/2<EFIi≤ESImax), wherein,
The interval internal standard sampled data record points are m2；
Then the 3rd high irradiance waving interval high is (EFImax/2<EFIi≤EFImax,ESImax/2<EFIi≤ESImax),
Wherein, the interval internal standard sampled data record points are m3；
Then the 4th low irradiance waving interval high is (EFImax/2<EFIi≤EFImax,0<EFIi≤ESImax/ 2), wherein,
The interval internal standard sampled data record points are m4；
4th determining unit, for determining s-th weight value α of sampling interval as the following formulas：
In above formula, msIt is s-th sampling interval internal standard sampled data record points.
3rd determining module includes：
5th determining unit, for determining photovoltaic plant flickering value P as the following formulalt′：
In above formula, MsIt is s-th sampling interval internal irradiation degree sampling number, Plt,s,mFor m-th in s-th sampling interval
Flickering value, α when irradiation level sampled point is corresponding longsIt is s-th weighted value of sampling interval.
Finally it should be noted that：The above embodiments are merely illustrative of the technical solutions of the present invention rather than its limitations, to the greatest extent
Pipe has been described in detail with reference to above-described embodiment to the present invention, and those of ordinary skill in the art should be understood：Still
Specific embodiment of the invention can be modified or equivalent, and without departing from any of spirit and scope of the invention
Modification or equivalent, it all should cover within claims of the invention.
Claims (14)
1. a kind of horizontal method for measurement of photovoltaic plant flickering, it is characterised in that methods described includes：
Irradiation level standard sample data are obtained, and carries out wavelet decomposition and wavelet transformation inverse transformation successively to it；
Determine the steady state energy index and the index of oscillation of standard sample data respectively using data after wavelet transformation inverse transformation；
Steady state energy index and the index of oscillation according to standard sample data divide sampling interval, and determine the power of each sampling interval
Weight values；
According to each irradiation level sampled point when corresponding long the weighted value of flickering value and each sampling interval determine photovoltaic plant flickering value.
2. the method for claim 1, it is characterised in that the acquisition irradiation level standard sample data, and to it successively
Wavelet decomposition and wavelet transformation inverse transformation are carried out, including：
According to irradiation level history samples data, the irradiation level sampled value of standard sample time point n is determined using linear interpolation algorithm；
Irradiation level sampled value to standard sample time point n carries out one-dimensinal discrete small wave transformation, wherein, wavelet basis is Haar
Small echo, the wavelet decomposition number of plies is 7 layers.
3. method as claimed in claim 2, it is characterised in that described according to irradiation level history samples data, is inserted using linear
Value-based algorithm determines the irradiation level sampled value of standard sample time point n, including：
Irradiation level sampled value r (n) of standard sample time point n is determined as the following formula：
In above formula, T1And T2It is two adjacent history samples time points of standard sample time point n, R (T1) and R (T2) adopt for standard
The irradiation level sampled value at two sample time point n adjacent history samples time points.
4. method as claimed in claim 2, it is characterised in that the irradiation level sampling to standard sample time point n
Value carries out one-dimensinal discrete small wave transformation, including：
Make the wavelet decomposition number of plies for 7 layers, the irradiation level sampled value to standard sample time point n carries out one-dimensional discrete as the following formula
Wavelet transformation：
In above formula, H (n) is the tap coefficient sequence of low pass filter, and G (n) is the tap coefficient sequence of high-pass filter, Rak
N () is the rough approximation general picture part after kth layer one-dimensinal discrete small wave transformation, RdkN () is for kth layer one-dimensinal discrete small wave transformation after
High frequency detail part, k be the wavelet decomposition number of plies, k ∈ [1,7], wherein, as k=1, Ra1N ()=r (n), r (n) are standard
The irradiation level sampled value of sampling time point n；
Obtain the high frequency detail part R after every layer of one-dimensinal discrete small wave transformationduAfter (n) and the 7th layer of one-dimensinal discrete small wave transformation
Rough approximation general picture part Ra7(n), and respectively to Rdu(n) and Ra7N () carries out one-dimensional wavelet transform inverse transformation, acquisition standard is adopted
The sequential record data r of the irradiation level sampled value of sample time point ndu(n) and ra7(n), wherein, u=1,2...7.
5. the method for claim 1, it is characterised in that data determine mark respectively after the utilization wavelet transformation inverse transformation
The steady state energy index and the index of oscillation of quasi- sampled data, including：
The steady state energy index E FI in i-th time period of standard sample data is determined as the following formulai：
In above formula, rdk(nj) and ra7(nj) be to j-th irradiation level sampling of standard sample time point n in i-th time period
The sequential record data of value, Δ t is irradiation level sampling time interval, NiIt is i-th time period internal irradiation degree sampling number；
The index of oscillation ESI in i-th time period of standard sample data is determined as the following formulai：
6. the method for claim 1, it is characterised in that the steady state energy index and ripple according to standard sample data
Dynamic index division sampling interval, and determine the weighted value of each sampling interval, including：
I-th steady state energy index E FI of time period internal standard sampled data is obtained respectivelyiWith index of oscillation ESIi, wherein, i ∈
[Isosorbide-5-Nitrae 380], each time period is 2 hours, and obtains the steady state energy index maximum of All Time section Plays sampled data
EFImaxWith index of oscillation maximum ESImax；
Then the 1st low waving interval of low irradiance is (0<EFIi≤EFImax/2,0<EFIi≤ESImax/ 2), wherein, in the interval
Standard sample data record points are m1；
Then the 2nd low waving interval of high irradiance is (0<EFIi≤EFImax/2,ESImax/2<EFIi≤ESImax), wherein, the area
Between internal standard sampled data record points be m2；
Then the 3rd high irradiance waving interval high is (EFImax/2<EFIi≤EFImax,ESImax/2<EFIi≤ESImax), wherein,
The interval internal standard sampled data record points are m3；
Then the 4th low irradiance waving interval high is (EFImax/2<EFIi≤EFImax,0<EFIi≤ESImax/ 2), wherein, the area
Between internal standard sampled data record points be m4；
S-th weight value α of sampling interval is determined as the following formulas：
In above formula, msIt is s-th sampling interval internal standard sampled data record points.
7. the method for claim 1, it is characterised in that determine photovoltaic plant flickering value P as the following formulalt′：
In above formula, MsIt is s-th sampling interval internal irradiation degree sampling number, Plt,s,mIt is m-th irradiation level in s-th sampling interval
Flickering value, α when sampled point is corresponding longsIt is s-th weighted value of sampling interval.
8. a kind of photovoltaic plant flickering horizontal measuring device, it is characterised in that described device includes：
Acquisition module, for obtaining irradiation level standard sample data, and carries out wavelet decomposition and wavelet transformation inversion to it successively
Change；
First determining module, for determining that the steady state energy of standard sample data refers to respectively using data after wavelet transformation inverse transformation
Number and the index of oscillation；
Second determining module, for dividing sampling interval according to the steady state energy index and the index of oscillation of standard sample data, and
Determine the weighted value of each sampling interval；
3rd determining module, it is true for the weighted value according to each irradiation level sampled point flickering value and each sampling interval when corresponding long
Determine photovoltaic plant flickering value.
9. device as claimed in claim 8, it is characterised in that the acquisition module includes：
First determining unit, for according to irradiation level history samples data, the standard sample time being determined using linear interpolation algorithm
The irradiation level sampled value of point n；
Wavelet decomposition unit, one-dimensinal discrete small wave transformation is carried out for the irradiation level sampled value to standard sample time point n,
Wherein, wavelet basis is Haar small echos, and the wavelet decomposition number of plies is 7 layers.
10. device as claimed in claim 9, it is characterised in that first determining unit includes：
First determination subelement, irradiation level sampled value r (n) for determining standard sample time point n as the following formula：
In above formula, T1And T2It is two adjacent history samples time points of standard sample time point n, R (T1) and R (T2) adopt for standard
The irradiation level sampled value at two sample time point n adjacent history samples time points.
11. devices as claimed in claim 9, it is characterised in that the wavelet decomposition unit includes：
Wavelet decomposition subelement, for making the wavelet decomposition number of plies for 7 layers, as the following formula to the irradiation at standard sample time point n
Degree sampled value carries out one-dimensinal discrete small wave transformation：
In above formula, H (n) is the tap coefficient sequence of low pass filter, and G (n) is the tap coefficient sequence of high-pass filter, Rak
N () is the rough approximation general picture part after kth layer one-dimensinal discrete small wave transformation, RdkN () is for kth layer one-dimensinal discrete small wave transformation after
High frequency detail part, k be the wavelet decomposition number of plies, k ∈ [1,7], wherein, as k=1, Ra1N ()=r (n), r (n) are standard
The irradiation level sampled value of sampling time point n；
First acquisition submodule, for obtaining the high frequency detail part R after every layer of one-dimensinal discrete small wave transformationdu(n) and the 7th layer one
Rough approximation general picture part R after dimension wavelet transforma7(n), and respectively to Rdu(n) and Ra7N () carries out one-dimensional wavelet transform
Inverse transformation, obtains the sequential record data r of the irradiation level sampled value of standard sample time point ndu(n) and ra7(n), wherein, u=
1,2...7。
12. devices as claimed in claim 8, it is characterised in that first determining module includes：
Second determining unit, for the steady state energy index E FI in i-th time period for determining standard sample data as the following formulai：
In above formula, rdk(nj) and ra7(nj) be to j-th irradiation level sampling of standard sample time point n in i-th time period
The sequential record data of value, Δ t is irradiation level sampling time interval, NiIt is i-th time period internal irradiation degree sampling number；
3rd determining unit, for the index of oscillation ESI in i-th time period for determining standard sample data as the following formulai：
13. devices as claimed in claim 8, it is characterised in that second determining module includes：
First acquisition unit, for obtaining i-th steady state energy index E FI of time period internal standard sampled data respectivelyiAnd fluctuation
Index E SIi, wherein, i ∈ [Isosorbide-5-Nitrae 380], each time period is 2 hours, and obtains All Time section Plays sampled data
Steady state energy index maximum EFImaxWith index of oscillation maximum ESImax；
Then the 1st low waving interval of low irradiance is (0<EFIi≤EFImax/2,0<EFIi≤ESImax/ 2), wherein, in the interval
Standard sample data record points are m1；
Then the 2nd low waving interval of high irradiance is (0<EFIi≤EFImax/2,ESImax/2<EFIi≤ESImax), wherein, the area
Between internal standard sampled data record points be m2；
Then the 3rd high irradiance waving interval high is (EFImax/2<EFIi≤EFImax,ESImax/2<EFIi≤ESImax), wherein,
The interval internal standard sampled data record points are m3；
Then the 4th low irradiance waving interval high is (EFImax/2<EFIi≤EFImax,0<EFIi≤ESImax/ 2), wherein, the area
Between internal standard sampled data record points be m4；
4th determining unit, for determining s-th weight value α of sampling interval as the following formulas：
In above formula, msIt is s-th sampling interval internal standard sampled data record points.
14. devices as claimed in claim 8, it is characterised in that the 3rd determining module includes：
5th determining unit, for determining photovoltaic plant flickering value P as the following formulalt′：
In above formula, MsIt is s-th sampling interval internal irradiation degree sampling number, Plt,s,mIt is m-th irradiation level in s-th sampling interval
Flickering value, α when sampled point is corresponding longsIt is s-th weighted value of sampling interval.
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| CN104504263A (en) * | 2014-12-22 | 2015-04-08 | 国家电网公司 | Photovoltaic power station harmonic level assessment method based on distribution probability |
| WO2015106502A1 (en) * | 2014-01-15 | 2015-07-23 | 国家电网公司 | Method and system for obtaining flicker transfer coefficient in grid connection of photovoltaic power station |
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| WO2015106502A1 (en) * | 2014-01-15 | 2015-07-23 | 国家电网公司 | Method and system for obtaining flicker transfer coefficient in grid connection of photovoltaic power station |
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