CN106680544B - Arrester accelerated aging test clamping device - Google Patents

Arrester accelerated aging test clamping device Download PDF

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Publication number
CN106680544B
CN106680544B CN201611199489.5A CN201611199489A CN106680544B CN 106680544 B CN106680544 B CN 106680544B CN 201611199489 A CN201611199489 A CN 201611199489A CN 106680544 B CN106680544 B CN 106680544B
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CN
China
Prior art keywords
top electrode
card slot
connecting column
electrode
arrester
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CN201611199489.5A
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CN106680544A (en
Inventor
钟磊
孙泉
余龙龙
罗六寿
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Xi'an High Voltage Electrical Apparatus Research Institute Co.,Ltd.
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China XD Electric Co Ltd
Xian High Voltage Apparatus Research Institute Co Ltd
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Application filed by China XD Electric Co Ltd, Xian High Voltage Apparatus Research Institute Co Ltd filed Critical China XD Electric Co Ltd
Priority to CN201611199489.5A priority Critical patent/CN106680544B/en
Publication of CN106680544A publication Critical patent/CN106680544A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425Test clips, e.g. for IC's

Abstract

A kind of arrester accelerated aging test clamping device of the present invention ensure that well contacting between electrode and test product, and test data is accurate, and replacement electrode is convenient.It includes the top electrode and lower electrode for accommodating test product to be measured, and successively axially connecting in the fixed pedestal of top electrode upper end, seal and top electrode down-pressed pole;Top electrode connects high-voltage connection, and lower electrode connects ground lead;Fixed pedestal includes connecting column and card slot, and is set in the elastic element outside connecting column;Connecting column is arranged in up-small and down-big multi-diameter shaft, and up big and down small stepped hole is arranged inside card slot;The big end of connecting column is fixedly connected with top electrode, it is slidably connected in the aperture of small end insertion card slot, the small end axial restraint of connecting column is provided with stop screw, and the nut of stop screw is connected on the ladder of stepped hole, for limiting the shaft shoulder of connecting column and the gap length of card slot lower end surface;Elastic element one end in compressive state connects top electrode, and the other end connects card slot lower end surface.

Description

Arrester accelerated aging test clamping device
Technical field
The present invention relates to test of lightning arrester engineering device technique fields, specially arrester accelerated aging test clamping device.
Background technique
The lower electrode of existing arrester resistor disc or proportional unit accelerated aging test clamping device is by single layer round steel The rack of production is tray support test product, and top electrode is usually placed in the surface of test product to be measured by self gravity.With resistor disc For, it is influenced by test product surface smoothness, it is point contact between electrode and test product that this structure, which may cause, not can guarantee The uniform energization on test product surface, and can not accurate characterization test product characteristic.It causes experimental test data not rigorous, affects examination Test the accuracy of data.In order to solve the above technical problems, those skilled in the art is usually the quality for increasing top electrode, by certainly Right gravity increases electrode and being bonded between test product, still, it is good and measure still to have the poor contact between electrode and test product The risk of data inaccuracy.And the quality for increasing electrode merely will increase the difficulty of test product installation and replacement electrode, simultaneously The increase of electrode thickens the dynamic thermal balance that also will affect resistor disc in the environment (in baking oven).
Summary of the invention
Aiming at the problems existing in the prior art, the present invention provides a kind of arrester accelerated aging test clamping device, It ensure that well contacting between electrode and test product, test data is accurate, and replacement electrode is convenient, practical.
The present invention is to be achieved through the following technical solutions:
Arrester accelerated aging test clamping device, including for accommodating test product to be measured top electrode and lower electrode, with And it is successively axially connecting in the fixed pedestal of top electrode upper end, seal and top electrode down-pressed pole;The top electrode connects High-voltage connection is connect, lower electrode connects ground lead;The fixed pedestal includes connecting column and card slot, and is set in connecting column External elastic element;Connecting column is arranged in up-small and down-big multi-diameter shaft, and up big and down small stepped hole is arranged inside card slot;Connection The big end of column is fixedly connected with top electrode, is slidably connected in the aperture of small end insertion card slot, the small end axial restraint of connecting column is set It is equipped with stop screw, the nut of stop screw is connected on the ladder of stepped hole, under the shaft shoulder and card slot for limiting connecting column The gap length of end face;Elastic element one end in compressive state connects top electrode, and the other end connects card slot lower end surface.
Preferably, top electrode connects high-voltage connection by fixed setting connecting column or the high-voltage connection screw rod of card slot side.
Preferably, the side of lower electrode offers the mounting hole of setting temperature sensor;Lower electrode bottom end is fixedly installed Connect the ground lead screw rod of ground lead.
Preferably, the lower end of connecting column is connected through a screw thread fixes with top electrode, is connected on the outside of the upper end of card slot by screw thread It connects and is fixed with seal;Seal upper end is connect by insulated screw with top electrode down-pressed pole axial restraint.
Preferably, elastic element uses compressed spring.
It preferably, further include upper layer rack and lower layer's rack;Top electrode down-pressed pole is slidably arranged on the rack of upper layer, lower electricity Pole is fixed on lower layer's rack.
Further, the first fixed plate, lower electrode and lower layer's rack is arranged in the junction of top electrode down-pressed pole and upper layer rack Junction be arranged the second fixed plate;First fixed plate and the second fixed plate include the metal plate and insulation board being stacked, Insulation board is arranged at side of the metal plate close to experiment position.
Further, the first fixed plate and metal plate in the second fixed plate and insulation board pass through that insulated screw is fixed to be connected It connects, the first fixed plate and the second fixed plate offer heat release hole.
Further, locking device is set on the part of top electrode down-pressed pole stretching upper layer rack;The locking device packet The lock fixed with upper layer rack is included, the clamping screw of lock locking end is connected to;Top electrode down-pressed pole passes through lock locking end The locking through-hole opened up, clamping screw pass through the locking through-hole of locking end, and rotation clamping screw locks lock, fixed top electrode Down-pressed pole.
Further, limit sliding chutes are opened up on lock, gag lever post passes through limit sliding chutes and connect with clamping screw, limitation locking The motion range of bolt.
Compared with prior art, the invention has the following beneficial technical effects:
The present invention can increase the distance between top electrode and lower electrode by moving up and down top electrode down-pressed pole.Meet The test of lightning arrester device for placing different dimensional heights therebetween can test the arrester resistor disc and ratio list of plurality of specifications Member.It is arranged elastic element outside fixed pedestal, after pushing top electrode and contacting with test product surface, locks locking device, at this point, Top electrode has small gradient according to the smooth degree on test product surface and adjusts, and elastic element has been in compression shape in addition State can transmit a downward power to top electrode under the reaction force of elastic element, so that top electrode is more adjacent to test product surface, connect Touching is better, and then the accuracy of guarantee test data.
It further, is Hard link between top electrode of the invention and fixed pedestal, connection type is to be threadedly coupled, and is not required to Want any auxiliary tool that can be dismounted.Upper/lower electrode is connected by lead screw rod simultaneously, replaces top electrode and lower electrode is convenient, It is practical.
Further, the present invention includes upper layer rack and lower layer's rack, and upper layer rack and the corresponding position of lower layer's rack are divided First fixed plate and the second fixed plate are not installed, to reinforce the intensity of entire test tool, prevented on caused by transverse deformation The offset of electrode down-pressed pole central point and fixed unstable problem.In addition, upper layer rack and lower layer's rack can install it is multiple The senile experiment of multiple resistor discs, raising efficiency are realized while being carried out to arrester accelerated aging test clamping device.
Further, material used by the seal and insulation board in the present invention is polytetrafluoroethylene (PTFE), both can be resistance to High temperature, and insulating effect can be played, avoid the situation of upper and lower layer rack short circuit from occurring.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of clamping device in present example.
Fig. 2 is the enlarged diagram of fixed pedestal in Fig. 1.
Fig. 3 is the enlarged diagram that present example mesohigh lead screw rod is connect with connecting column.
In figure, 1. top electrode down-pressed poles, 2. locking devices, 201. clamping screws, 202. locks, 203. limit sliding chutes, 3. First fixed plate, 4. seals, 5. fixed pedestals, 51. connecting columns, 52. card slots, 6. top electrodes, 7. lower electrodes, 8. second is solid Fixed board, 9. elastic elements, 10. high-voltage connection screw rods, 11. ground lead screw rods.
Specific embodiment
Below with reference to specific embodiment, the present invention is described in further detail, be explanation of the invention rather than It limits.
Arrester accelerated aging test clamping device of the present invention, including top electrode 6, upper layer rack and top electrode down-pressed pole 1;The bottom end of top electrode down-pressed pole 1 is successively fixedly connected through seal 4 and fixed pedestal 5 with top electrode 6, top and upper wire Frame is flexibly connected, and the pushing direction along top electrode 6 is moved, and makes the top that testing resistance piece is pressed under top electrode 6.
It further include locking device 2;Locking device 2 is fixedly connected with upper layer rack, and top electrode down-pressed pole 1 passes through locking device 2 through-hole, the clamping screw 201 of regulation locking device 2 keep top electrode down-pressed pole 1 and locking device 2 fixed.
The upper end of fixed pedestal 5 is connect with the bottom end of top electrode down-pressed pole 1 by seal 4, the lower end of fixed pedestal 5 It is connect with top electrode 6;It is connected and fixed on the outside of 52 upper end of card slot of fixed pedestal 5 with seal 4, lower end inside and connecting column 51 It is slidably connected, high-voltage connection screw rod 10 is installed in the side of card slot 52;The up big and down small stepped hole of setting, connecting column 51 in card slot 52 Upper end is arranged in up-small and down-big multi-diameter shaft, and connecting column 51 protrudes into setting, inserting end in card slot 52 and is axially provided with stop screw, The gap between 52 lower end surface of card slot and 51 shaft shoulder of connecting column is limited, the nut area of stop screw is greater than stomidium under stepped hole Diameter, therefore limit can be clamped.Be arranged elastic element on connecting column 51, elastic element under normal conditions, table on one end and top electrode 6 Face contact, the other end and 52 lower end face contact of card slot, the gap limited between 52 lower end surface of card slot and 51 shaft shoulder of connecting column are opened; When treating test article and being tested, limitation 52 lower end surface of card slot is pressed into contact with 51 shaft shoulder of connecting column, and spring is by compression clearance Length further presses to top electrode 6.
The upper surface of seal 4 is connect with the bottom end of top electrode down-pressed pole 1, the lower surface of seal 4 and fixed base The upper end connection of seat 5.
The junction of top electrode down-pressed pole 1 and upper layer rack is the first fixed plate 3, the first fixed plate 3 include metal plate and Insulation board, metal plate are set to above insulation board, and metal plate is fixedly connected with insulation board by insulating screw.
Lower 7 lower surface of electrode is connect with ground lead screw rod 11, is grounded lower electrode by ground lead screw rod 11.Lower electricity 7 side of pole opens up receiving hole, and temperature sensor is arranged in receiving hole.
It further include lower layer's rack;Lower layer's rack includes the second fixed plate 8;Second fixed plate 8 includes metal plate and insulation board, Insulation board is set to above metal plate, and metal plate and insulation board center open up through-hole, and ground lead screw rod 11 passes through through-hole It is connect with lower electrode 7.The material of seal and insulation board is polytetrafluoroethylene (PTFE).In first fixed plate 3 and the second fixed plate 5 Open up thermal vias.
The device of the invention also can be used as the accelerated aging test clamping device of arrester resistor disc or proportional unit.Examination Product accommodate between top electrode 6 and lower electrode 7.
The present invention is illustrated for the structure of clamping device by arrester accelerated aging test.
As shown in Figure 1, in one embodiment of the invention, disclosing arrester resistor disc accelerated aging test dress It sets, including top electrode 6 and lower electrode 7, top electrode 6 is located at the surface of lower electrode 7, and top electrode 6 and the material of lower electrode 7 are 10mm thickness red copper;To adjust the position of top electrode 6 up and down, facilitate the arrester resistor disc of test different size, if Top electrode down-pressed pole 1 is set, the bottom end of top electrode down-pressed pole 1 is fixedly connected with top electrode 6, and top and the activity of upper layer rack connect It connects, the pushing direction along top electrode 6 is moved, and the upper surface that product to be tested are pressed under top electrode 6 is made.To improve test efficiency, together The test of Shi Jinhang multiple groups, is provided with upper layer rack and lower layer's rack, upper layer rack and lower layer's rack be 0.65-0.85mm thickness not Rust steel square tube, on upper layer, rack and lower layer's rack corresponding position install multiple groups the first fixed plate 3 and the second fixed plate 8 respectively, make Corresponding top electrode 6, lower electrode 7 position fix, and can guarantee that top electrode is bonded completely with test product surface to be measured and contact, from And the accuracy of guarantee test data.
In one embodiment of the invention, to fix the position of top electrode down-pressed pole 1, locking device 2, lock are set Tight device 2 includes lock 202 and clamping screw 201, and top electrode down-pressed pole 1 passes through the locking through-hole that 202 locking ends of lock open up, Clamping screw 201 passes through the locking through-hole of locking end, and rotation clamping screw 201 locks lock, so that fixed top electrode pushes Bar 1.To make clamping screw 201 in unscrewing, it will not be fallen from locking through-hole, open up limit sliding chutes 203 on lock 202, limit Position bar passes through limit sliding chutes 203 and connect with clamping screw 201, limits the motion range of clamping screw 201.
It in one embodiment of the invention, further include fixed pedestal 5 and seal 4;As shown in Fig. 2, fixed base Seat 5 includes the connecting column 51 and card slot 52 being coaxially socketed, and high-voltage connection screw rod 10 is arranged on connecting column 51;The lower end of connecting column 51 It is fixedly connected with top electrode 6, the upper end of card slot 52 is connect with seal 4, and the outside of connecting column 51 is arranged elastic element 9, bullet Property element 9 be spring, the connecting pin of elastic element 9 is connect with the upper surface of top electrode 6 and 52 lower end surface of card slot respectively.It is pushing After top electrode 6 is contacted with test product surface, lock locking device, at this point, top electrode had according to test product surfacing degree it is micro- Small gradient adjustment, elastic element 9 is in compressive state in addition, can pass to top electrode 6 under the reaction force of elastic element 9 A downward power is passed, top electrode 6 is made more to be adjacent to test product surface, is contacted better.As shown in figure 3, in order to better Guarantee that conductive contact and test accuracy, high-voltage connection screw rod 10 are set up directly on connecting column 51.
In one embodiment of the invention, short-circuit between upper layer rack and lower layer's rack to prevent, it is fixed by first Plate 3 and the second fixed plate 8 are set as the structure comprising metal plate and insulation board, and the thickness of metal plate and insulation board is 4mm- 6mm.The material of insulation board is polytetrafluoroethylene (PTFE), which can not only play insulating effect, but also high temperature resistant, be suitably applied arrester In resistor disc aging test.
In one embodiment of the invention, it is the heat condition for observing test product itself to be measured, is opened up on lower electrode 7 Temperature sensor is arranged in receiving hole in receiving hole.
In one embodiment of the invention, fixed pedestal 5 is connect with seal 4 by cutting ferrule, to make top electrode Be able to carry out micro-adjustment operation, the outer surface of cutting ferrule shell between fixed device 5 there are at a distance from 0.7-1.3mm, convenient pair Top electrode is adjusted.
When in one embodiment of the invention, to make integrated tooling bracket be put into high-temperature cabinet, reduce as far as possible to height The influence of incubator internal temperature uniformity opens up thermal vias, thermal vias in the first fixed plate 3 and the second fixed plate 8 So that heat is able to faster equilibrium.
More than, only a specific embodiment of the invention, but scope of protection of the present invention is not limited thereto, and it is any to be familiar with Those skilled in the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, and should all cover Within protection scope of the present invention.Therefore, protection scope of the present invention should be subject to the protection scope in claims.
The top electrode down-pressed pole that the present invention is arranged, can move up and down, and can not only test plurality of specifications, size, height Arrester resistor disc or proportional unit, moreover it is possible to the surface for making electrode seal fitting test product, thus guarantee test the data obtained Accuracy.Meanwhile the cooperation of insulating materials polytetrafluoroethylene (PTFE) is used in clamping device, greatly reduces device and short trouble occurs A possibility that, the safety of test is improved, ensure that the safety of test product and equipment.

Claims (8)

1. arrester accelerated aging test clamping device, which is characterized in that including the top electrode (6) for accommodating test product to be measured With lower electrode (7), and successively axially connecting in the fixed pedestal (5) of top electrode (6) upper end, seal (4) and power on Pole down-pressed pole (1);
The top electrode (6) connects high-voltage connection, and lower electrode (7) connects ground lead;
The fixed pedestal (5) includes connecting column (51) and card slot (52), and is set in the external elasticity of connecting column (51) Element (9);Connecting column (51) is arranged in up-small and down-big multi-diameter shaft, and up big and down small stepped hole is arranged inside card slot (52);Even The big end for connecing column (51) is fixedly connected with top electrode (6), is slidably connected in the aperture of small end insertion card slot (52), connecting column (51) Small end axial restraint be provided with stop screw, the nut of stop screw is connected on the ladder of stepped hole, for limiting connection The shaft shoulder of column (51) and the gap length of card slot (52) lower end surface;Elastic element (9) one end connection in compressive state powers on Pole (6), the other end connect card slot (52) lower end surface;
It further include upper layer rack and lower layer's rack;Top electrode down-pressed pole (1) is slidably arranged on the rack of upper layer, and lower electrode (7) is solid It is fixed to be arranged on lower layer's rack;
The first fixed plate (3) are arranged in the junction of top electrode down-pressed pole (1) and upper layer rack, lower electrode (7) and lower layer's rack The second fixed plate (8) are arranged in junction;First fixed plate (3) and the second fixed plate (8) include the metal plate being stacked and Insulation board, insulation board are arranged at side of the metal plate close to experiment position.
2. arrester accelerated aging test clamping device according to claim 1, which is characterized in that top electrode (6) is logical Cross high-voltage connection screw rod (10) the connection high-voltage connection of fixed setting connecting column (51) or card slot (52) side.
3. arrester accelerated aging test clamping device according to claim 1, which is characterized in that lower electrode (7) Side offers the mounting hole of setting temperature sensor;Lower electrode (7) bottom end is fixedly installed the grounding lead of connection ground lead Line screw rod (11).
4. arrester accelerated aging test clamping device according to claim 1, which is characterized in that connecting column (51) Lower end is connected through a screw thread to be fixed with top electrode (6), is connected through a screw thread on the outside of the upper end of card slot (52) solid with seal (4) It is fixed;Seal (4) upper end is connect by insulated screw with top electrode down-pressed pole (1) axial restraint.
5. arrester accelerated aging test clamping device according to claim 1, which is characterized in that elastic element (9) Using compressed spring.
6. arrester accelerated aging test clamping device according to claim 1, which is characterized in that the first fixed plate (3) it is fixedly connected by insulated screw with the metal plate in the second fixed plate (8) with insulation board, the first fixed plate (3) and Two fixed plates (8) offer heat release hole.
7. arrester accelerated aging test clamping device according to claim 1, which is characterized in that top electrode down-pressed pole (1) it stretches out on the part of upper layer rack and locking device (2) is set;The locking device (2) includes fixed with upper layer rack It latches (202), is connected to the clamping screw (201) of lock (202) locking end;Top electrode down-pressed pole (1) passes through lock (202) lock The locking through-hole opened up is tightly held, clamping screw (201) passes through the locking through-hole of locking end, and rotation clamping screw (201) makes to latch Locking, fixed top electrode down-pressed pole (1).
8. arrester accelerated aging test clamping device according to claim 7, which is characterized in that on lock (202) It opens up limit sliding chutes (203), gag lever post passes through limit sliding chutes (203) and connect with clamping screw (201), limits clamping screw (201) motion range.
CN201611199489.5A 2016-12-22 2016-12-22 Arrester accelerated aging test clamping device Active CN106680544B (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109633399A (en) * 2018-12-20 2019-04-16 北京无线电计量测试研究所 A kind of Testing device of electrical parameter of quartz wafer
CN116008687A (en) * 2022-11-30 2023-04-25 国网江苏省电力有限公司无锡供电分公司 Test method for H-MOA aging characteristics

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CN202903958U (en) * 2012-12-05 2013-04-24 哈尔滨理工大学 An apparatus for testing characteristics of breakdowns under an oil flow of paper oil insulation of a transformer
CN203084109U (en) * 2012-12-28 2013-07-24 中国西电电气股份有限公司 General testing tool for proportional units of 110kV-and-above arresters with metal housings
CN203688603U (en) * 2014-01-29 2014-07-02 西安科技大学 Sample clamping device for electronic material electrical property temperature characteristic tests
CN204422665U (en) * 2014-07-08 2015-06-24 国网山东东平县供电公司 High-tension laboratory Zinc-Oxide Arrester special test worktable
CN105092459A (en) * 2015-09-09 2015-11-25 中国计量学院 High-temperature testing clamp of piezoelectric polarization device
CN204925164U (en) * 2015-08-03 2015-12-30 中国大唐集团科学技术研究院有限公司华中分公司 Electric power wiring anchor clamps
CN205450118U (en) * 2015-12-29 2016-08-10 中国石油化工股份有限公司 Electrode assembly is used in test

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202903958U (en) * 2012-12-05 2013-04-24 哈尔滨理工大学 An apparatus for testing characteristics of breakdowns under an oil flow of paper oil insulation of a transformer
CN203084109U (en) * 2012-12-28 2013-07-24 中国西电电气股份有限公司 General testing tool for proportional units of 110kV-and-above arresters with metal housings
CN203688603U (en) * 2014-01-29 2014-07-02 西安科技大学 Sample clamping device for electronic material electrical property temperature characteristic tests
CN204422665U (en) * 2014-07-08 2015-06-24 国网山东东平县供电公司 High-tension laboratory Zinc-Oxide Arrester special test worktable
CN204925164U (en) * 2015-08-03 2015-12-30 中国大唐集团科学技术研究院有限公司华中分公司 Electric power wiring anchor clamps
CN105092459A (en) * 2015-09-09 2015-11-25 中国计量学院 High-temperature testing clamp of piezoelectric polarization device
CN205450118U (en) * 2015-12-29 2016-08-10 中国石油化工股份有限公司 Electrode assembly is used in test

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Effective date of registration: 20210817

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