CN106646269B - High-voltage power supply fault excitation monitoring device and monitoring method thereof - Google Patents
High-voltage power supply fault excitation monitoring device and monitoring method thereof Download PDFInfo
- Publication number
- CN106646269B CN106646269B CN201610444235.9A CN201610444235A CN106646269B CN 106646269 B CN106646269 B CN 106646269B CN 201610444235 A CN201610444235 A CN 201610444235A CN 106646269 B CN106646269 B CN 106646269B
- Authority
- CN
- China
- Prior art keywords
- voltage
- node
- module
- power supply
- low
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention provides a high-voltage power supply fault excitation monitoring device, which comprises: the key nodes of the high-voltage power supply module are divided into a high-voltage node and a low-voltage node; the random vibration test bed is used for exciting a fault mode which can appear in the high-voltage power supply module under the vibration stress; the low-voltage node switching conditioning module is used for conditioning the voltage signal of the low-voltage node to be within an allowed voltage measurement range; the low-voltage node data acquisition module is used for acquiring and measuring low-voltage node signals processed by the low-voltage node switching and conditioning module; the high-voltage node switching voltage division module is used for dividing the voltage signal of the high-voltage node into an allowed voltage measurement range; the high-voltage node data acquisition module is used for acquiring and measuring high-voltage node signals subjected to voltage reduction selection by the high-voltage node switching voltage division module; and the upper computer system is used for receiving the low-voltage node signals and the high-voltage node signals and sending out control instructions so as to control and switch corresponding node voltage signals.
Description
Technical Field
The invention relates to the technical field of power supply monitoring, in particular to a high-voltage power supply fault excitation monitoring device and a testing method thereof.
Background
In the operation process of the spacecraft, the reliable operation of the high-voltage power supply for the spaceflight is an important guarantee for the normal operation of the spacecraft. However, the space environment is very harsh and complicated, and the high-voltage power supply for spaceflight is subjected to the comprehensive action of space environment stress such as power, vibration, high-temperature impact and the like for a long time in the process of lifting off and after entering the orbit to normally run, besides the harsh emission environment. This will cause the power supply to fail, causing significant losses.
Therefore, how to efficiently excite the possible failure mode of the high-voltage power supply and accurately monitor and diagnose the failure mode of the power supply becomes a technical problem to be solved by those skilled in the art.
Disclosure of Invention
The invention aims to: the method is used for monitoring a power failure mode possibly caused by vibration stress, providing high-acceleration vibration stress by using a random vibration experiment table, exciting a failure mode possibly occurring in the high-voltage power supply under the vibration stress, monitoring the change conditions of each node of the power supply and an output voltage signal in real time through a monitoring system, and helping to analyze the failure mode possibly occurring in the high-voltage power supply under the vibration environment and weak links of power supply design.
In order to achieve the above object, the present invention firstly provides a device for monitoring the excitation of a high voltage power supply fault, comprising:
the high-voltage power supply module is a high-voltage power supply for spaceflight, key nodes in a circuit of the high-voltage power supply module are divided into a high-voltage node and a low-voltage node, the high-voltage node is a node with a voltage value higher than 400V, and the low-voltage node is a node with a voltage value lower than 50V;
the random vibration test bed is connected with the high-voltage power supply module, provides vibration stress for the high-voltage power supply module, and excites a fault mode which may appear in the high-voltage power supply module under the vibration stress;
the low-voltage node switching and conditioning module is connected with the low-voltage node in the high-voltage power supply module and is used for conditioning a voltage signal of the low-voltage node to be within an allowable voltage measurement range;
the low-voltage node data acquisition module is connected with the low-voltage node switching and conditioning module and is used for acquiring and measuring low-voltage node signals processed by the low-voltage node switching and conditioning module;
the high-voltage node switching voltage division module is connected with the high-voltage node in the high-voltage power supply module and is used for dividing the voltage signal of the high-voltage node into an allowable voltage measurement range;
the high-voltage node data acquisition module is connected with the high-voltage node switching and voltage dividing module and is used for acquiring and measuring high-voltage node signals subjected to voltage reduction selection through the high-voltage node switching and voltage dividing module;
and the upper computer system is simultaneously connected with the low-voltage node data acquisition module and the high-voltage node data acquisition module, and is used for receiving the low-voltage node signals and the high-voltage node signals and sending out a control instruction so as to control the switching of corresponding node voltage signals.
According to the high-voltage power supply fault excitation monitoring device provided by the invention, the low-voltage node switching and conditioning module comprises: the device comprises a driving unit, a relay switching circuit, a voltage conditioning circuit, a main control unit and a serial port communication unit;
the driving unit comprises a decoding chip and a transistor array;
the relay switching circuit consists of a plurality of relay switching units, and each relay unit comprises a relay, a light emitting diode and a resistor;
the voltage conditioning circuit is connected with the output end of the relay switching circuit and the low-voltage node data acquisition module; the voltage conditioning circuit comprises an operational amplifier follower circuit and a voltage division circuit, the output end of the relay switching module is connected with the voltage division circuit, and a signal which is subjected to voltage reduction by the voltage division circuit is isolated by the operational amplifier follower circuit and then is input into the low-voltage node data acquisition module;
the serial port communication unit is connected between the main control unit and the upper computer system and converts an RS2303 signal of the main control unit and a USB signal.
According to the high-voltage power supply fault excitation monitoring device provided by the invention, the high-voltage node switching voltage division module comprises: the device comprises a driving unit, a voltage division circuit, a relay switching circuit, a main control unit and a serial port communication unit.
According to the high-voltage power supply fault excitation monitoring device provided by the invention, the upper computer system comprises a test node selection module, a test data display module and a failure threshold setting module;
the test node selection module comprises a node access selection button and a test node display lamp and is used for selecting the test access of the high-voltage power supply module;
the test data display module comprises a node voltage average value display part, a node waveform display part and a storage path setting part, and test data transmitted to the upper computer system by the low-voltage node data acquisition module and the high-voltage node data acquisition module are stored in the set storage path through the storage path of the test data set by the storage path setting part; the node voltage average value display part is used for displaying the voltage average value of all nodes of the high-voltage power supply module; the node waveform display part is used for selectively displaying all node waveforms of a certain passage in the high-voltage power supply module;
the failure threshold setting module comprises a failure threshold setting part and an alarm indicator lamp, and the failure threshold voltage output by the high-voltage power supply module is set through the failure threshold setting part.
The invention also provides a high-voltage power supply fault excitation monitoring method, which comprises the following steps:
s1: the high-voltage power supply module is placed in a random vibration experiment table, and node lead wires of the high-voltage power supply module are led out from a lead port of the random vibration experiment table and are respectively connected with a low-voltage node switching conditioning module and a high-voltage node switching voltage division module;
s2: selecting an output channel of a high-voltage power supply module to be tested through a test node selection module of the upper computer system;
s3: setting a storage path of test data through a data display module of the upper computer system;
s4: setting the upper and lower limits of the failure threshold values of the three outputs of the high-voltage power supply module through a failure threshold value setting module of the upper computer system;
s5: setting the vibration stress of a random vibration experiment table, running an upper computer system program after the vibration stress is stable after the random vibration experiment table is powered on, and controlling switching, measuring and transmitting voltage signal data of each node;
s6: and (3) using MATLAB to call test data, and indicating weak links of power supply design by analyzing the working state, the fault mode, the change trend of node signals and the like of the power supply under the vibration stress.
Compared with the prior art, the invention has the following beneficial effects:
the invention provides the vibration stress through the random vibration experiment table and excites the fault mode of the power supply which possibly appears under the vibration stress. Meanwhile, the voltage signal change condition of each node of the high-voltage power supply and the working state of the power supply are accurately monitored in real time through the device. And analyzing data through MATLAB processing, and discovering weak links of power supply design in a production design stage. Meanwhile, the invention is suitable for state monitoring of most switching power supplies, has high transportability, can provide a test platform for state monitoring of other power supplies, and helps to analyze failure mechanisms of the switching power supplies.
Drawings
FIG. 1 is a schematic diagram of a high voltage power failure excitation monitoring system according to an embodiment of the present invention;
FIG. 2 is a diagram of a host computer system according to the present invention;
FIG. 3 is a schematic diagram of the measurement of the low voltage node voltage signal in the present invention;
fig. 4 is a schematic diagram of the measurement of the voltage signal at the high-voltage node according to the present invention.
Detailed Description
The specific embodiment of the invention is described below with reference to fig. 1, and the high-voltage power failure excitation monitoring device in the embodiment includes a high-voltage power module (1), a random vibration experiment table (2), an upper computer system (3), a low-voltage node switching and conditioning module (4), a low-voltage node data acquisition module (5), a high-voltage node switching and voltage dividing module (6), and a high-voltage node data acquisition module (7);
the high-voltage power supply module (1) selects a certain type of high-voltage power supply for spaceflight, has three paths of outputs, and key nodes of all parts in the circuit are divided into a high-voltage node and a low-voltage node. The high-voltage node is a node with a voltage value higher than 400V, and the low-voltage node is a node with a voltage value lower than 50V.
The random vibration experiment table (2) adopts a Qualmark typhoon2.5 model high-acceleration reliability test box of Qualmark company to provide vibration stress for the high-voltage power supply module (1) and excite a possible fault mode of the high-voltage power supply module under the vibration stress.
The upper computer system (3) is connected with the low-voltage node switching conditioning module (4), the low-voltage node data acquisition module (5), the high-voltage node switching voltage division module (6) and the high-voltage node data acquisition module (7), and sends a control instruction to the low-voltage node switching conditioning module (4) and the high-voltage node switching voltage division module (6) through the upper computer system (3) to control switching of corresponding node voltage signals. The low-voltage node data acquisition module (5) and the high-voltage node data acquisition module (6) transmit the test data to the upper computer system (3).
The low-voltage node switching and conditioning module (4) is connected with a low-voltage node of the high-voltage power supply module (1), switches corresponding nodes according to a control command sent by the upper computer system, and conditions a low-voltage node voltage signal of the high-voltage power supply module (1) to a voltage measurement range allowed by the low-voltage node data acquisition module (5).
The low-voltage node data acquisition module (5) is connected with the output end of the low-voltage node switching and conditioning module (4) and the upper computer system, and is used for acquiring and measuring node voltage signals processed by the low-voltage node switching and conditioning module (4) and uploading the measured data to the upper computer system (3) through a PCI bus.
The high-voltage node switching and voltage dividing die (6) is connected with the high-voltage node of the high-voltage power supply module (1) and the upper computer system (3), voltage signals of the high-voltage node of the high-voltage power supply (1) are divided into a voltage measurement range allowed by the high-voltage node data acquisition module, and the corresponding high-voltage node is switched according to a control instruction sent by the upper computer system (3).
The high-voltage node data acquisition module (7) is connected with the high-voltage node switching voltage division module (6) and the upper computer system (3) and used for acquiring and measuring high-voltage node signals after voltage reduction selection through the high-voltage node switching voltage division module (6) and transmitting test data to the upper computer system (3) through a LAN.
With continuing reference to fig. 2, the upper computer system (3) of the present invention includes a test node selection module (3-1), a test data display module (3-2), and a failure threshold setting module (3-3).
The test node selection module (3-1) is composed of a node access selection button and a test node display lamp, the test access of the high-voltage power supply module (1) can be selected, and according to a selection result, the upper computer system (3) sends a test instruction to the low-voltage node switching conditioning module (4) and the high-voltage node switching voltage division module (6) to control the switching and the measurement of node voltage signals of all nodes in the selected test access.
The test data display module (3-2) is composed of a node voltage average value display part (3-2-1), a node waveform display part (3-2-2) and a storage path setting part (3-2-3). And test data transmitted to the upper computer by the low-voltage node data acquisition module (5) and the high-voltage node data acquisition module (6) are stored in the set storage path through the storage path of the test data set by the storage path setting part (3-2-3). The node voltage average value display section (3-2-1) displays the voltage average value of all nodes of the high-voltage power supply module (1). The node waveform display part (3-2-3) can selectively display all node waveforms of a certain path of the high-voltage power supply module (1).
The failure threshold setting module (3-3) consists of a failure threshold setting part (3-3-1) and an alarm indicator lamp (3-3-2), and the failure threshold setting part (3-3-1) is used for setting the failure threshold voltages output by the high-voltage power supply module (1) in three ways. The alarm indicator light is green when the high-voltage power supply module (1) works normally. When the output voltage of the high-voltage power supply module (1) exceeds the failure threshold range, the alarm indicator lamp (3-3-2) turns red.
Referring to fig. 3, the low-voltage node switching and conditioning module (4) of the present invention includes a driving unit (4-1), a relay switching circuit (4-2), a voltage conditioning circuit (4-3), a main control unit (4-4), and a serial communication unit (4-5), wherein:
the driving unit (4-1) is composed of a decoding chip (4-1-1) and a transistor array (4-1-2). The decoding chip (4-1-1) adopts a 74LS238 chip, the input end of the decoding chip is connected with the IO pin of the main control unit (4-4), the output end of the decoding chip (4-1-1) is connected with the input end of the transistor array (4-1-2), and the transistor array (4-1-2) adopts ULN 2003.
The relay switching circuit (4-2) is composed of a plurality of relay switching units (4-2-1), and each relay unit is composed of a relay (4-2-2), a light emitting diode (4-2-3) and a resistor (4-2-4). The +5V power supply end of the relay (4-2-2) is connected with the anode of the light-emitting diode (4-2-3). Two ends of the resistor (4-2-4) are respectively connected with the cathode of the diode (4-2-3) and the control end of the relay (4-2-2). The control port of the relay (4-2-2) is connected with the output ports of the transistor arrays (4-1-2) of the driving units (4-1), and each output port of the transistor arrays (4-1-2) is connected with the control ends of the two relay control units. The normally open contact of the relay (4-2-2) is connected with the input end of the voltage conditioning circuit (4-3), and the low-voltage node signal of the high-voltage power supply module (1) is connected to the movable contact of the relay (4-2-2).
The voltage conditioning circuit (4-3) is connected with the output end of the relay switching circuit (4-2) and the low-voltage node data acquisition module (5). The voltage conditioning circuit (4-3) is composed of an operational amplifier following circuit (4-3-1) and a voltage division circuit (4-3-2), the output end of the relay switching module (4-2) is connected with the voltage division circuit (4-3-2), and signals after voltage reduction by the voltage division circuit (4-3-2) are isolated by the operational amplifier following circuit (4-3-1) and then input to the low-voltage node data acquisition module (5).
The main control unit (4-4) is STM32, and the model is F103ZET 6.
The serial port communication unit (4-5) is connected between the main control unit (4-4) and the upper computer system (3) and converts the RS2303 signal of the main control unit (4-4) and the USB signal.
The low-voltage node data acquisition module (5) in this embodiment adopts a PCI1714UL model data acquisition board card. The input end of the data acquisition board card is connected with the output end of the low-voltage node switching and conditioning module (4), and the data acquisition board card transmits acquired and measured low-voltage node voltage signals to the upper computer system (3) through the PCI bus.
Referring to fig. 4, the high voltage node switching voltage divider module (6) of the present invention includes: drive unit (6-1), bleeder circuit (6-2), relay switching circuit (6-3), main control unit (6-4), serial communication unit (6-5), wherein:
the driving unit (6-1) is composed of a decoding chip (6-1-1) and a transistor array (6-1-2). The decoding chip (6-1-1) adopts a 74LS238 chip, the input end of the decoding chip is connected with the IO pin of the main control unit (6-4), the output end of the decoding chip (6-1-1) is connected with the input end of the transistor array (6-1-2), and the transistor array (6-1-2) adopts ULN 2003.
The voltage division circuit (6-2) is composed of a plurality of stages of voltage division resistors. The input end of the voltage division circuit (6-2) is connected with a high-voltage node of the high-voltage power supply module (1), and the output end of the voltage division circuit (6-2) is connected with the input end of the relay switching circuit (6-3).
The relay switching circuit (6-3) is composed of a plurality of relay switching units (6-3-1), and each relay unit is composed of a relay (6-3-2), a light emitting diode (6-3-3) and a resistor (6-3-4). The +5V power supply end of the relay (6-3-2) is connected with the anode of the light-emitting diode (6-3-3). Two ends of the resistor (6-3-4) are respectively connected with the cathode of the diode (6-3-3) and the control end of the relay (6-3-2). The control port of the relay (6-3-2) is connected with the output port of the transistor array (6-1-2) of the driving unit (6-1), and each output port of the transistor array (6-1-2) is connected with the control end of one relay control unit. The normally open contact of the relay (6-3-2) is connected with the corresponding oscilloscope probe in the high-voltage node acquisition module (7), and the signal after being reduced by the voltage division circuit (6-2) is connected with the moving contact of the relay (6-3-2).
The main control unit (6-4) of the high-voltage node switching voltage division module (6) and the main control unit (4-4) of the low-voltage node switching conditioning module (4) are the same main control unit.
The serial communication unit (6-5) of the high-voltage node switching voltage division module (6) and the serial communication unit (4-5) of the low-voltage node switching conditioning module (4) are the same serial communication unit.
The high-voltage node data acquisition module (7) in the embodiment adopts a dual-channel oscilloscope, and the model is DSO 5012A. The upper computer system (3) is connected with the oscilloscope through a network port, and sends a programmable instrument Standard Command (SCPI) to the oscilloscope DSO5012A by using VISA (visual sense amplifier), so that the oscilloscope is controlled to measure and transmit voltage signal data of the high-voltage node processed by the high-voltage node switching voltage division module (6).
In addition, the invention also provides a monitoring method corresponding to the high-voltage power supply fault excitation monitoring device in fig. 1, which comprises the following steps:
s1: the high-voltage power supply module (1) is placed in the random vibration experiment table (2), and node leads of the high-voltage power supply module (1) are led out from a lead port of the random vibration experiment table (2) and are respectively connected with the low-voltage node switching conditioning module (4) and the high-voltage node switching voltage division module (6).
S2: and selecting an output channel of the high-voltage power supply module (1) to be tested through a test node selection module (3-1) of the upper computer system (3).
S3: and a storage path of the test data is set through a data display module (3-2) of the upper computer system (3).
S4: the upper and lower limits of the failure threshold values output by the three paths of the high-voltage power supply module (1) are set through a failure threshold value setting module (3-3) of the upper computer system (3).
S5: and setting the vibration stress of the random vibration experiment table (2), running an upper computer system (3) program after the vibration stress is stabilized after electrification, and controlling switching, measurement and transmission of voltage signal data of each node.
S6: using MATLAB to call test data, and indicating weak links of power supply design by analyzing working state of power supply under vibration stress, change trend of node signals, failure mode and the like
The foregoing description of the invention is illustrative and not restrictive, and it will be understood by those skilled in the art that many changes, variations or equivalents may be made therein without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (2)
1. A high voltage power supply fault excitation monitoring device, comprising:
the high-voltage power supply module is a high-voltage power supply for spaceflight, key nodes in a circuit of the high-voltage power supply module are divided into a high-voltage node and a low-voltage node, the high-voltage node is a node with a voltage value higher than 400V, and the low-voltage node is a node with a voltage value lower than 50V;
the random vibration test bed is connected with the high-voltage power supply module, provides vibration stress for the high-voltage power supply module, and excites a fault mode which may appear in the high-voltage power supply module under the vibration stress;
the low-voltage node switching and conditioning module is connected with the low-voltage node in the high-voltage power supply module and is used for conditioning a voltage signal of the low-voltage node to be within an allowable voltage measurement range;
the low-voltage node data acquisition module is connected with the low-voltage node switching and conditioning module and is used for acquiring and measuring low-voltage node signals processed by the low-voltage node switching and conditioning module;
the high-voltage node switching voltage division module is connected with the high-voltage node in the high-voltage power supply module and is used for dividing the voltage signal of the high-voltage node into an allowable voltage measurement range;
the high-voltage node data acquisition module is connected with the high-voltage node switching and voltage dividing module and is used for acquiring and measuring high-voltage node signals subjected to voltage reduction selection through the high-voltage node switching and voltage dividing module;
an upper computer system which is connected with the low-voltage node data acquisition module and the high-voltage node data acquisition module at the same time and is used for receiving the low-voltage node signals and the high-voltage node signals and sending out control instructions to control the switching of corresponding node voltage signals,
wherein, the low-voltage node switching and conditioning module comprises: the device comprises a driving unit, a relay switching module, a voltage conditioning circuit, a main control unit and a serial port communication unit;
the driving unit comprises a decoding chip and a transistor array;
the relay switching module consists of a plurality of relay switching units, and each relay unit comprises a relay, a light-emitting diode and a resistor;
the voltage conditioning circuit is connected with the output end of the relay switching module and the low-voltage node data acquisition module; the voltage conditioning circuit comprises an operational amplifier follower circuit and a voltage division circuit, the output end of the relay switching module is connected with the voltage division circuit, and a signal which is subjected to voltage reduction by the voltage division circuit is isolated by the operational amplifier follower circuit and then is input into the low-voltage node data acquisition module;
the serial port communication unit is connected between the main control unit and the upper computer system and converts RS2303 signals of the main control unit and USB signals
The high-voltage node switching voltage division module comprises: a driving unit, a voltage division circuit, a relay switching module, a main control unit and a serial port communication unit,
the upper computer system comprises a test node selection module, a test data display module and a failure threshold setting module;
the test node selection module comprises a node access selection button and a test node display lamp and is used for selecting the test access of the high-voltage power supply module;
the test data display module comprises a node voltage average value display part, a node waveform display part and a storage path setting part, a storage path of test data is set through the storage path setting part, and the test data transmitted to the upper computer system by the low-voltage node data acquisition module and the high-voltage node data acquisition module is stored in a storage space corresponding to the set storage path; the node voltage average value display part is used for displaying the voltage average value of all nodes of the high-voltage power supply module; the node waveform display part is used for selectively displaying all node waveforms of a certain passage in the high-voltage power supply module;
the failure threshold setting module comprises a failure threshold setting part and an alarm indicator lamp, and the failure threshold voltage output by the high-voltage power supply module is set through the failure threshold setting part.
2. A high-voltage power failure excitation monitoring method applied to the high-voltage power failure excitation monitoring device according to claim 1, comprising the steps of:
s1: the high-voltage power supply module is placed in a random vibration test bed, and node lead wires of the high-voltage power supply module are led out from a lead port of the random vibration test bed and are respectively connected with a low-voltage node switching conditioning module and a high-voltage node switching voltage-dividing module;
s2: selecting an output channel of a high-voltage power supply module to be tested through a test node selection module of the upper computer system;
s3: setting a storage path of test data through a test data display module of the upper computer system;
s4: setting the upper and lower limits of the failure threshold values of the three outputs of the high-voltage power supply module through a failure threshold value setting module of the upper computer system;
s5: setting the vibration stress of a random vibration test bed, running an upper computer system program after the vibration stress is stabilized after the random vibration test bed is powered on, and controlling, switching, measuring and transmitting voltage signal data of each node;
s6: and (3) using MATLAB to call test data, and indicating weak links of power supply design by analyzing the working state of the power supply under the vibration stress, the change trend of node signals and the fault mode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610444235.9A CN106646269B (en) | 2016-06-20 | 2016-06-20 | High-voltage power supply fault excitation monitoring device and monitoring method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610444235.9A CN106646269B (en) | 2016-06-20 | 2016-06-20 | High-voltage power supply fault excitation monitoring device and monitoring method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106646269A CN106646269A (en) | 2017-05-10 |
| CN106646269B true CN106646269B (en) | 2020-02-11 |
Family
ID=58851700
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610444235.9A Active CN106646269B (en) | 2016-06-20 | 2016-06-20 | High-voltage power supply fault excitation monitoring device and monitoring method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106646269B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109001620A (en) * | 2017-06-06 | 2018-12-14 | 国网浙江省电力公司电力科学研究院 | The unstable open-circuit fault reproducing method of electromagnetic relay and system |
| CN108363023A (en) * | 2018-02-05 | 2018-08-03 | 哈尔滨工业大学 | A kind of Switching Power Supply on-line fault diagnosis device and method based on failure-test correlation matrix |
| CN108279388A (en) * | 2018-02-05 | 2018-07-13 | 哈尔滨工业大学 | A kind of injection of Switching Power Supply fault simulation and testability analysis device and method |
| CN108375742A (en) * | 2018-02-05 | 2018-08-07 | 哈尔滨工业大学 | A kind of flyback sourse and test method with testable parameter and fault diagnosis functions |
| CN108333532A (en) * | 2018-02-05 | 2018-07-27 | 哈尔滨工业大学 | A kind of equipment and test method for flyback sourse on-line monitoring |
| CN109557481B (en) * | 2018-11-26 | 2024-01-30 | 中国人民解放军陆军工程大学 | Power module detector special for military antitank missile |
| CN112578304A (en) * | 2020-11-26 | 2021-03-30 | 广州金升阳科技有限公司 | Automatic test system and method for high-voltage output switching power supply |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101650411A (en) * | 2009-07-31 | 2010-02-17 | 迈普通信技术股份有限公司 | Universal power-aging testing system |
| CN101788651A (en) * | 2010-01-29 | 2010-07-28 | 浪潮(北京)电子信息产业有限公司 | Power supply reliability verification method |
| CN104297698A (en) * | 2013-11-29 | 2015-01-21 | 中国航空工业集团公司洛阳电光设备研究所 | Detection device for power supply assembly |
| CN204188783U (en) * | 2014-11-14 | 2015-03-04 | 武汉华中数控股份有限公司 | A kind of proving installation of Switching Power Supply |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5790733B2 (en) * | 2013-10-22 | 2015-10-07 | 株式会社デンソー | Power supply current monitoring device |
-
2016
- 2016-06-20 CN CN201610444235.9A patent/CN106646269B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101650411A (en) * | 2009-07-31 | 2010-02-17 | 迈普通信技术股份有限公司 | Universal power-aging testing system |
| CN101788651A (en) * | 2010-01-29 | 2010-07-28 | 浪潮(北京)电子信息产业有限公司 | Power supply reliability verification method |
| CN104297698A (en) * | 2013-11-29 | 2015-01-21 | 中国航空工业集团公司洛阳电光设备研究所 | Detection device for power supply assembly |
| CN204188783U (en) * | 2014-11-14 | 2015-03-04 | 武汉华中数控股份有限公司 | A kind of proving installation of Switching Power Supply |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106646269A (en) | 2017-05-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106646269B (en) | High-voltage power supply fault excitation monitoring device and monitoring method thereof | |
| US20100306592A1 (en) | Computer system on and off test apparatus and method | |
| CN109143033B (en) | Automatic testing system for whole satellite interface | |
| CN103837824A (en) | Automatic test system for digital integrated circuit | |
| CN107797050A (en) | A kind of method of location-server mainboard electrifying timing sequence abnormal state | |
| CN101398776A (en) | Automatic powering-on/powering-off test device and method | |
| CN103267940B (en) | Multimode parallel test system | |
| CN110579701A (en) | Method for detecting pin connectivity of integrated chip | |
| US20160370428A1 (en) | Portable test apparatus for a semiconductor apparatus, and test method using the same | |
| CN108319516B (en) | Test system and test method | |
| CN103675638A (en) | Novel universal dynamic total dose test device and implementation method thereof | |
| KR100856079B1 (en) | Semiconductor tester | |
| JP2014513288A (en) | Multi-channel PWM waveform measuring instrument | |
| CN109031088A (en) | A kind of circuit board multichannel current test method and its system | |
| CN111458592A (en) | Automatic detection system for car lamp driving module | |
| JP2005191522A (en) | Voltage supply parameter measurement device in wafer burn-in system | |
| KR101928815B1 (en) | Electronic Device Reliability Measurement System | |
| JP2010156553A (en) | Method for controlling testing device | |
| CN108051767A (en) | A kind of auto-check system for integrated circuit tester | |
| CN212255518U (en) | Automatic detection system for car lamp driving module | |
| CN115078968A (en) | Chip test circuit, self-test chip and chip test system | |
| CN103884957A (en) | Cable tester | |
| CN211043581U (en) | Chip aging monitoring system | |
| KR102101317B1 (en) | Device for testing cable assembly of combat vehicle and testing method using this | |
| TWI427299B (en) | High - pressure multi - point test equipment and method with main and auxiliary steps |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |