CN103675638A - Novel universal dynamic total dose test device and implementation method thereof - Google Patents
Novel universal dynamic total dose test device and implementation method thereof Download PDFInfo
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Abstract
The invention relates to a novel universal dynamic total dose test device. The novel universal dynamic total dose test device comprises an upper computer, a signal transmission system and a test vector generating system, wherein the upper computer and the signal transmission system are located outside an irradiation room, and the test vector generating system is located inside the irradiation room. The upper computer sends the code pattern of a random vector to the signal transmission system, controls a power source of a test circuit board, monitors a dynamic bias current of a to-be-tested circuit, and monitors the operation status of the whole device. The signal transmission system receives a random selection code sent by the upper computer, meanwhile the signal transmission system converts the random selection code into a level signal and transmits the level signal to the test vector generating system, and a feedback signal sent back by the test vector generating system is also received by the signal transmission system and used for monitoring the operation status of the test vector generating system. The test vector generating system receives the signal from the signal transmission system, generates a test vector and sends the test vector to the test circuit board. The novel universal dynamic total dose test device can achieve the fact that a to-be-irradiated circuit is in a dynamic bias state in an irradiation process, and therefore a dynamic total dose test is achieved, and total dose resistance of a component is examined comprehensively.
Description
Technical field
The invention belongs to microelectronic component resistant to total dose ability test verification technique field, relate to a kind of novel general dynamic accumulated dose test unit and its implementation.
Technical background
Along with the fast development of semiconductor technology, characteristic dimension and the operating voltage of device are more and more less, and the effect of total dose effect is also more and more obvious.Found in the last few years that total dose effect was more remarkable on the serviceability impact of device, its damage mode is increasingly complex also, if do not know the principle of microelectronic component total dose effect, just cannot correctly assess the capability of resistance to radiation of microelectronic component, when later stage development microelectronic component, just cannot effectively promote the radiation resistance of microelectronic component.
The verification experimental verification work of the total dose effect of most radioresistance microelectronic components is to carry out under quiescent biasing, especially the anti-Performance Evaluation of microelectronic component of spacecraft design according to being ground simulation test result.Ground simulation test can not be completely true to nature, and simulated conditions should reflect the essence of objective phenomenon as much as possible.Therefore, when assessment microelectronic component radiation resistance, just more need to take the method for rigorous and scientific, find out the impact of total dose effect on device, avoid misleading interpretation of result due to the impact that other factors cause, just need to examine the total dose effect of device under dynamic bias.
Summary of the invention
The object of the invention is to overcome the above-mentioned deficiency of prior art, a kind of novel general dynamic accumulated dose test unit is provided, this test unit can be used for realizing dynamic accumulated dose test, comprehensively the resistant to total dose performance of examination device, breaks the situation that can only carry out at present static accumulated dose test.
Another object of the present invention is to provide a kind of implementation method of novel general dynamic accumulated dose test unit.
Above-mentioned purpose of the present invention is mainly achieved by following technical solution:
A kind of novel general dynamic accumulated dose test unit, comprise host computer, signal transduction system and test vector generation system, wherein host computer and signal transduction system are positioned at outside radiation chamber, and test vector generation system is positioned at radiation chamber, circuit to be irradiated is also positioned at radiation chamber, wherein:
Host computer: receive the control signal of outside input, generate random option code simultaneously, described control signal and random option code are exported to signal transduction system, receive the feedback signal of signal transduction system output simultaneously;
Signal transduction system: receive described control signal and random option code from host computer, described control signal and random option code are converted to voltage signal by logic level signal, and described voltage signal is exported to test vector generation system, simultaneously from test vector generation system receiving feedback signals, and described feedback signal is sent to host computer;
Test vector generation system: the feedback identification code whether sign test vector generation system is normally moved is as feedback signal transmitted signal transmission system, receive random option code and control signal that signal transduction system sends simultaneously, the random test vector that described random option code and test vector generation system are generated carry out with, or, XOR, with or four kinds of computings in any one computing, and operation result is converted to voltage signal by logic level signal, send to circuit to be irradiated, control simultaneously that according to described control signal, test vector generation system is started or stoped.
In above-mentioned novel general dynamic accumulated dose test unit, host computer comprises random vector selection module, slave computer control module, the first High-speed Interface Card and Power Monitoring Unit, wherein:
Random vector is selected module: generate random option code, and random option code is sent to the first High-speed Interface Card;
Slave computer control module: the control signal of outside input is sent to the first High-speed Interface Card, receive the feedback signal from the first High-speed Interface Card simultaneously, judge the whether normally operation of test vector generation system;
The first High-speed Interface Card: send to the second High-speed Interface Card by the random option code of selecting module to receive from random vector with from the control signal of slave computer control module reception; Simultaneously from the second High-speed Interface Card receiving feedback signals;
Power Monitoring Unit: the supply voltage of control signal transmission system, test vector generation system and circuit to be irradiated, and monitor the working current of circuit to be irradiated.
In above-mentioned novel general dynamic accumulated dose test unit, signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller, wherein:
The second High-speed Interface Card: the described random option code and the described control signal that receive from the first High-speed Interface Card are sent to CPU, the feedback signal receiving is exported to the first High-speed Interface Card simultaneously from CPU;
CPU: receive random option code and control signal from the second High-speed Interface Card output, receive the feedback signal of the first feedback module output simultaneously, carry out signal output judgement, described random option code and control signal are exported to random code output module, described feedback signal is exported to the second High-speed Interface Card;
Random code output module: the random option code receiving from CPU and control signal are transmitted to the first level conversion Multi Channel Controller;
The first feedback module: receive the feedback signal of test vector generation system output and send to CPU;
The first level conversion Multi Channel Controller: the random option code and the control signal that receive from random code output module are converted to voltage signal by logic level signal, and described voltage signal is exported to test vector generation system.
In above-mentioned novel general dynamic accumulated dose test unit, test vector generation system comprises that second electrical level conversion Multi Channel Controller, n a 3rd level conversion Multi Channel Controller, generating random vector module, startup stopping modular, random code receive judge module, the second feedback module and test vector output module, wherein:
Second electrical level conversion Multi Channel Controller: receive the feedback identification code of the second feedback module output, feedback identification code represents with logic level signal form, and described logic level signal is converted to voltage signal exports to signal transduction system;
The second feedback module: whether normal according to the operation of test vector generation system, generate corresponding feedback identification code, and described feedback identification code is sent to second electrical level conversion Multi Channel Controller;
Generating random vector module: generate random test vector and send to test vector output module;
Random code receives judge module: receive the random option code that is converted to voltage signal that comes from signal transduction system output, and send to test vector output module;
Start stopping modular: receive the control signal that is converted to voltage signal of signal transduction system output, the control that test vector generation system is started or stoped;
Test vector output module: receive random code and receive the random option code of judge module output and the random test vector of generating random vector module output, by described random option code and described random test vector carry out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to n the 3rd level conversion Multi Channel Controller simultaneously;
The 3rd level conversion Multi Channel Controller: receive the operation result of test vector output module output, and the logic level signal of operation result is converted to voltage signal, send to circuit to be irradiated;
Wherein n is positive integer, and n >=3.
In above-mentioned novel general dynamic accumulated dose test unit, first, second, third level conversion Multi Channel Controller structure is identical, comprise level transferring chip and a plurality of two-way selector switch that are connected with level transferring chip, wherein each two-way selector switch is composed in series by relay, VCC, pull-up resistor R1 and pull down resistor R2, realizes the selection of low and high level by the folding of pilot relay; Level transferring chip is for the protection of the relay of FPGA and driving different operating voltage.
In above-mentioned novel general dynamic accumulated dose test unit, test vector generation system is positioned in radiation shield protection box, avoids the destruction of integral dose radiation to test vector generation system.
A kind of implementation method of novel general dynamic accumulated dose test unit, comprise test vector generative process and signal feedback process, wherein general dynamic accumulated dose test unit comprises host computer, signal transduction system and test vector generation system, and wherein host computer comprises random vector selection module, slave computer control module and the first High-speed Interface Card; Signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller; Test vector generation system comprises that second electrical level conversion Multi Channel Controller, n a 3rd level conversion Multi Channel Controller, generating random vector module, startup stopping modular, random code receive judge module, the second feedback module and test vector output module;
Test vector generative process comprises the steps:
(1), external control signal sends to slave computer control module, start test vector generative process, random vector selects module to generate random option code, and random option code is sent to the first High-speed Interface Card, slave computer control module sends to the first High-speed Interface Card by the control signal of outside input;
(2), the first High-speed Interface Card sends to the second High-speed Interface Card by the random option code of selecting module to receive from random vector with from the control signal of slave computer control module reception;
(3), the second High-speed Interface Card sends to CPU by the described random option code and the described control signal that receive; CPU receives random option code and the control signal from the second High-speed Interface Card output, receives the feedback signal of the first feedback module output simultaneously, carries out signal output judgement, and described random option code and control signal are exported to random code output module;
(4), random code output module is transmitted to the first level conversion Multi Channel Controller by the random option code receiving from CPU and control signal;
(5), start the control signal that is converted to voltage signal that stopping modular receives the first level conversion Multi Channel Controller output, test vector generation system is started;
(6), generating random vector module generates random test vector and sends to test vector output module; Random code receives judge module and receives the random option code that is converted to voltage signal that comes from the first level conversion Multi Channel Controller output, and sends to test vector output module;
(7), test vector output module receives random code and receives the random option code of judge module output and the random test vector of generating random vector module output, by described random option code and described random test vector carry out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to n the 3rd level conversion Multi Channel Controller simultaneously;
(8), the 3rd level conversion Multi Channel Controller receives the operation result of test vector output module output, and the logic level signal of operation result is converted to voltage signal, sends to circuit to be irradiated.
Signal feedback process comprises the steps:
(1), whether the second feedback module normal according to test vector generation system operation, generate corresponding feedback identification code, and described feedback identification code sent to second electrical level conversion Multi Channel Controller;
(2), the first feedback module receives the feedback identification code of second electrical level conversion Multi Channel Controller output and sends to CPU;
(3) CPU sends to the first High-speed Interface Card by described feedback identification code through the second High-speed Interface Card;
(4) whether normally the feedback identification code that slave computer control module receives from the first High-speed Interface Card judges the operation of test vector generation system.
The present invention compared with prior art has following beneficial effect:
(1) the present invention adopts the general dynamic accumulated dose test unit of innovative design, comprise host computer, signal transduction system and test vector generation system, host computer and signal transduction system are positioned at outside radiation chamber, test vector generation system is positioned at radiation chamber, circuit to be irradiated is also positioned at radiation chamber, this device can realize circuit to be irradiated in irradiation process in dynamic bias, thereby realize dynamic accumulated dose test, comprehensively the resistant to total dose performance of examination device, breaks the situation that can only carry out at present static accumulated dose test;
(2) the general dynamic accumulated dose test unit of the present invention is converted to level signal by logical signal by level conversion Multi Channel Controller, has overcome the problem of Chief Signal Boatswain line transmission;
(3) the general dynamic accumulated dose test unit of the present invention has good versatility, if generate static test vector, can meet static accumulated dose test, is equivalent to the test of sound state accumulated dose to combine; Change the magnitude of voltage of VCC in two-way selector switch, can meet the accumulated dose test of different operating potential circuit; The work clock applying to circuit under test is variable, can meet the test of different operating clock circuit; Can apply test vector to the circuit of two different operating voltage and frequency of operation simultaneously, therefore can effectively detect and assess the total dose effect impact of device, meet many moneys circuit and carry out dynamic accumulated dose test simultaneously, have higher test efficiency;
(4) implementation method of the general dynamic accumulated dose test unit of the present invention comprises test vector generative process and signal feedback process, test vector generative process realizes the dynamic accumulated dose test of circuit to be irradiated, signal feedback process monitoring is positioned at radiation chamber build-in test vector generation system running status, if normally, continue operation, otherwise out of service, guaranteed the normal operation of whole system.
Accompanying drawing explanation
Fig. 1 is the general dynamic accumulated dose test unit structural representation of the present invention;
Fig. 2 is level conversion Multi Channel Controller structural representation of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail:
Be illustrated in figure 1 the general dynamic accumulated dose test unit structural representation of the present invention, the general dynamic accumulated dose test unit of the present invention comprises host computer, signal transduction system and test vector generation system as seen from the figure, wherein host computer and signal transduction system are positioned at outside radiation chamber, and test vector generation system and circuit to be irradiated are positioned at radiation chamber.
Host computer is mainly to signal transduction system, to send the pattern of random vector, the power supply of Control experiment circuit board, and the dynamic bias of monitoring circuit under test, monitors the operation conditions of whole device; Signal transduction system is mainly that the information that receives host computer transmission produces one group of random vector, this group random vector is converted to voltage signal simultaneously and passes to test vector generation system, signal transduction system can also receive the information that test vector generation system is beamed back in addition, for monitoring the operation conditions of test vector generation system; Test vector generation system is placed in radiation shield protection box, avoids it to be subject to integral dose radiation and destroyed, and it is mainly responsible for reception from the signal of signal transduction system and generates test vector sending to breadboard; On the outer wall of radiation shield protection box, be connected to ring flange, signal transduction system, test vector generation system, breadboard can be coupled together, realize the transmission of signal; Circuit to be irradiated is placed on breadboard, and breadboard is placed on and in radiation chamber, carries out irradiation test.
In process of the test, the power supply of signal transduction system, test vector generation system and breadboard provides by PC control Power Monitoring Unit.Power Monitoring Unit has the function of measuring electric current, can monitor the working current of device to be irradiated in irradiation process and beam back host computer show and preserve.Therefore in the process of, implementing at device, can save multimeter or reometer.
As shown in Figure 1, host computer specifically comprises random vector selection module, slave computer control module, the first High-speed Interface Card and Power Monitoring Unit.Host computer finishing man-machine interaction function, is responsible for receiving the outside control signal of inputting, and generates random option code simultaneously, and described control signal and random option code are exported to signal transduction system, receives the feedback signal of signal transduction system output simultaneously.The concrete function of each module is as follows:
Random vector selects module to generate random option code, and random option code is sent to the first High-speed Interface Card.
Whether normally slave computer control module sends to the first High-speed Interface Card by the control signal of outside input, receives the feedback signal from the first High-speed Interface Card simultaneously, judge the operation of test vector generation system.
The first High-speed Interface Card sends to the second High-speed Interface Card by the random option code of selecting module to receive from random vector with from the control signal of slave computer control module reception; Simultaneously from the second High-speed Interface Card receiving feedback signals.
The supply voltage of Power Monitoring Unit control signal transmission system, test vector generation system and circuit to be irradiated, and monitor the working current of circuit to be irradiated.
As shown in Figure 1, signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller.Signal transduction system is mainly comprised of FPGA and bypass circuit thereof, be responsible for from host computer reception control signal and random option code, control signal and random option code are converted to voltage signal by logic level signal, and voltage signal is passed to test vector generation system via the long lead of 30 meters, simultaneously from test vector generation system receiving feedback signals, and feedback signal is sent to host computer, be convenient to testing crew in radiation chamber external monitor whole system the state in total dose irradiation process of the test.The concrete function of each module is as follows:
The second High-speed Interface Card sends to CPU by the described random option code and the described control signal that receive from the first High-speed Interface Card, the feedback signal receiving is exported to the first High-speed Interface Card from CPU simultaneously.
CPU receives random option code and the control signal from the second High-speed Interface Card output, receive the feedback signal of the first feedback module output simultaneously, carry out signal output judgement, described random option code and control signal are exported to random code output module, described feedback signal is exported to the second High-speed Interface Card.
Random code output module is transmitted to the first level conversion Multi Channel Controller by the random option code receiving from CPU and control signal.
The first feedback module receives the feedback signal of test vector generation system output and sends to CPU.
The first level conversion Multi Channel Controller is converted to voltage signal by the random option code and the control signal that receive from random code output module by logic level signal, and described voltage signal is exported to test vector generation system.
As shown in Figure 1, test vector generation system comprises that second electrical level conversion Multi Channel Controller, n a 3rd level conversion Multi Channel Controller, generating random vector module, startup stopping modular, random code receive judge module, the second feedback module and test vector output module.The feedback identification code whether test vector generation system is responsible for sign test vector generation system normally to move is as feedback signal transmitted signal transmission system, receive random option code and control signal that signal transduction system sends simultaneously, the random test vector that random option code and test vector generation system are generated carry out with, or, XOR, with or four kinds of computings in any one computing, and operation result is converted to voltage signal by logic level signal, send to circuit to be irradiated, control simultaneously that according to control signal, test vector generation system is started or stoped.The concrete function of each module is as follows:
Second electrical level conversion Multi Channel Controller receives the feedback identification code of the second feedback module output, and feedback identification code represents with logic level signal form, and described logic level signal is converted to voltage signal exports to signal transduction system.
Whether the second feedback module is normal according to the operation of test vector generation system, generates corresponding feedback identification code, and described feedback identification code is sent to second electrical level conversion Multi Channel Controller.
Generating random vector module generates random test vector and sends to test vector output module.
Random code receives judge module and receives the random option code that is converted to voltage signal that comes from signal transduction system output, and sends to test vector output module.
Start the control signal that is converted to voltage signal that stopping modular receives signal transduction system output, the control that test vector generation system is started or stoped.
Test vector output module receives random code and receives the random option code of judge module output and the random test vector of generating random vector module output, by random option code and random test vector carry out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to n the 3rd level conversion Multi Channel Controller simultaneously.
The 3rd level conversion Multi Channel Controller receives the operation result of test vector output module output, and the logic level signal of operation result is converted to voltage signal, sends to circuit to be irradiated.
Wherein n is positive integer, and n >=2.
Breadboard is used for carrying circuit to be irradiated, on breadboard, the signal pin of circuit to be irradiated is drawn, and is connected and receives random test vector by interface with test vector generation system, completes the dynamic bias of circuit to be irradiated.
Be illustrated in figure 2 level conversion Multi Channel Controller structural representation of the present invention, the present invention's first, second, third level conversion Multi Channel Controller structure is identical, comprise level transferring chip and a plurality of two-way selector switch that are connected with level transferring chip, its implementation has the following aspects:
(1) two-way selector switch: be composed in series by relay, VCC, pull-up resistor R1 and pull down resistor R2.What level VCC shown in Fig. 2 can take over, and this just makes this system can meet the test of the circuit of different operating voltage.By the folding of pilot relay, realize the selection of low and high level.
(2) level transferring chip: for the protection of the relay of FPGA and driving different operating voltage.
(3) the IO port of FPGA is nearly 160, these IO ports can be divided into 4 groups, relay is also divided into four groups (as 3.3V, 1.8V, 5V, 2.5V etc.) according to different VCC power supplys simultaneously.So just can meet the dynamic accumulated dose experimental test of 4 sections of single supplies or 2 sections of dual power supplies simultaneously.
The implementation method of the general dynamic accumulated dose test unit that the present invention is novel, comprises test vector generative process and signal feedback process, wherein:
Test vector generative process comprises the steps:
(1), external control signal sends to slave computer control module, start test vector generative process, random vector selects module to generate random option code, and random option code is sent to the first High-speed Interface Card, slave computer control module sends to the first High-speed Interface Card by the control signal of outside input;
(2), the first High-speed Interface Card sends to the second High-speed Interface Card by the random option code of selecting module to receive from random vector with from the control signal of slave computer control module reception;
(3), the second High-speed Interface Card sends to CPU by the described random option code and the described control signal that receive; CPU receives random option code and the control signal from the second High-speed Interface Card output, receives the feedback signal of the first feedback module output simultaneously, carries out signal output judgement, and described random option code and control signal are exported to random code output module;
(4), random code output module is transmitted to the first level conversion Multi Channel Controller by the random option code receiving from CPU and control signal;
(5), start the control signal that is converted to voltage signal that stopping modular receives the first level conversion Multi Channel Controller output, test vector generation system is started;
(6), generating random vector module generates random test vector and sends to test vector output module; Random code receives judge module and receives the random option code that is converted to voltage signal that comes from the first level conversion Multi Channel Controller output, and sends to test vector output module;
(7), test vector output module receives random code and receives the random option code of judge module output and the random test vector of generating random vector module output, by described random option code and described random test vector carry out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to n the 3rd level conversion Multi Channel Controller simultaneously.
For example: host computer generates option code at random, and scope is between 0～3.The vector of 0～3 corresponding one group 32 of difference, its pattern is as follows respectively:
As host computer sends 1, test vector generation system is random generate one group 32 vector and with the i.e. 1 corresponding vector of 32 of vector 01,010,101 01,010,101 01010101 01010101(that receive) carry out with or, XOR, with or four kinds of computings in any one computing, can generate one group of random code.
(8), the 3rd level conversion Multi Channel Controller receives the operation result of test vector output module output, and the logic level signal of operation result is converted to voltage signal, by ring flange, sends to the circuit to be irradiated on breadboard.
Test vector generation system generates counting assembly in the course of the work in 1S, and the scope of counting is 0～3.After generating counting, this number is uploaded to host computer via signal transduction system, if be not 0～3 to replace from the variation of this counting of host computer monitoring, illustrates that extremely, need to debug appears in the duty of test vector generation system.
Signal feedback process comprises the steps:
(1), whether the second feedback module normal according to test vector generation system operation, generate corresponding feedback identification code, and described feedback identification code sent to second electrical level conversion Multi Channel Controller;
(2), the first feedback module receives the feedback identification code of second electrical level conversion Multi Channel Controller output and sends to CPU;
(3), CPU sends to the first High-speed Interface Card by described feedback identification code through the second High-speed Interface Card;
(4) whether normally the feedback identification code that, slave computer control module receives from the first High-speed Interface Card judges the operation of test vector generation system.
In the present invention, in general accumulated dose test unit, by FPGA, produce the break-make of one group of random signal pilot relay, thereby constantly produce 0 or 1 level signal to I/O port corresponding to circuit under test, make device in dynamic bias condition; Host computer can be controlled the duty of whole test unit, and the working current of monitoring preservation device under test, for analyzing the resistant to total dose performance of device under dynamic bias condition.
The above; only be the embodiment of the best of the present invention, but protection scope of the present invention is not limited to this, is anyly familiar with in technical scope that those skilled in the art disclose in the present invention; the variation that can expect easily or replacement, within all should being encompassed in protection scope of the present invention.
The content not being described in detail in instructions of the present invention belongs to professional and technical personnel in the field's known technology.
Claims (7)
1. a novel general dynamic accumulated dose test unit, it is characterized in that: comprise host computer, signal transduction system and test vector generation system, wherein host computer and signal transduction system are positioned at outside radiation chamber, test vector generation system is positioned at radiation chamber, circuit to be irradiated is also positioned at radiation chamber, wherein:
Host computer: receive the control signal of outside input, generate random option code simultaneously, described control signal and random option code are exported to signal transduction system, receive the feedback signal of signal transduction system output simultaneously;
Signal transduction system: receive described control signal and random option code from host computer, described control signal and random option code are converted to voltage signal by logic level signal, and described voltage signal is exported to test vector generation system, simultaneously from test vector generation system receiving feedback signals, and described feedback signal is sent to host computer;
Test vector generation system: the feedback identification code whether sign test vector generation system is normally moved is as feedback signal transmitted signal transmission system, receive random option code and control signal that signal transduction system sends simultaneously, the random test vector that described random option code and test vector generation system are generated carry out with, or, XOR, with or four kinds of computings in any one computing, and operation result is converted to voltage signal by logic level signal, send to circuit to be irradiated, control simultaneously that according to described control signal, test vector generation system is started or stoped.
2. a kind of novel general dynamic accumulated dose test unit according to claim 1, is characterized in that: described host computer comprises random vector selection module, slave computer control module, the first High-speed Interface Card and Power Monitoring Unit, wherein:
Random vector is selected module: generate random option code, and random option code is sent to the first High-speed Interface Card;
Slave computer control module: the control signal of outside input is sent to the first High-speed Interface Card, receive the feedback signal from the first High-speed Interface Card simultaneously, judge the whether normally operation of test vector generation system;
The first High-speed Interface Card: send to the second High-speed Interface Card by the random option code of selecting module to receive from random vector with from the control signal of slave computer control module reception; Simultaneously from the second High-speed Interface Card receiving feedback signals;
Power Monitoring Unit: the supply voltage of control signal transmission system, test vector generation system and circuit to be irradiated, and monitor the working current of circuit to be irradiated.
3. a kind of novel general dynamic accumulated dose test unit according to claim 1, it is characterized in that: described signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller, wherein:
The second High-speed Interface Card: the described random option code and the described control signal that receive from the first High-speed Interface Card are sent to CPU, the feedback signal receiving is exported to the first High-speed Interface Card simultaneously from CPU;
CPU: receive random option code and control signal from the second High-speed Interface Card output, receive the feedback signal of the first feedback module output simultaneously, carry out signal output judgement, described random option code and control signal are exported to random code output module, described feedback signal is exported to the second High-speed Interface Card;
Random code output module: the random option code receiving from CPU and control signal are transmitted to the first level conversion Multi Channel Controller;
The first feedback module: receive the feedback signal of test vector generation system output and send to CPU;
The first level conversion Multi Channel Controller: the random option code and the control signal that receive from random code output module are converted to voltage signal by logic level signal, and described voltage signal is exported to test vector generation system.
4. a kind of novel general dynamic accumulated dose test unit according to claim 1, it is characterized in that: described test vector generation system comprises that second electrical level conversion Multi Channel Controller, n a 3rd level conversion Multi Channel Controller, generating random vector module, startup stopping modular, random code receive judge module, the second feedback module and test vector output module, wherein:
Second electrical level conversion Multi Channel Controller: receive the feedback identification code of the second feedback module output, feedback identification code represents with logic level signal form, and described logic level signal is converted to voltage signal exports to signal transduction system;
The second feedback module: whether normal according to the operation of test vector generation system, generate corresponding feedback identification code, and described feedback identification code is sent to second electrical level conversion Multi Channel Controller;
Generating random vector module: generate random test vector and send to test vector output module;
Random code receives judge module: receive the random option code that is converted to voltage signal that comes from signal transduction system output, and send to test vector output module;
Start stopping modular: receive the control signal that is converted to voltage signal of signal transduction system output, the control that test vector generation system is started or stoped;
Test vector output module: receive random code and receive the random option code of judge module output and the random test vector of generating random vector module output, by described random option code and described random test vector carry out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to n the 3rd level conversion Multi Channel Controller simultaneously;
The 3rd level conversion Multi Channel Controller: receive the operation result of test vector output module output, and the logic level signal of operation result is converted to voltage signal, send to circuit to be irradiated;
Wherein n is positive integer, and n >=3.
5. according to a kind of novel general dynamic accumulated dose test unit described in the arbitrary claim of claim 1～4, it is characterized in that: described first, second, third level conversion Multi Channel Controller structure is identical, comprise level transferring chip and a plurality of two-way selector switch that are connected with level transferring chip, wherein each two-way selector switch is composed in series by relay, VCC, pull-up resistor R1 and pull down resistor R2, realizes the selection of low and high level by the folding of pilot relay; Level transferring chip is for the protection of the relay of FPGA and driving different operating voltage.
6. according to a kind of novel general dynamic accumulated dose test unit described in the arbitrary claim of claim 1～4; it is characterized in that: described test vector generation system is positioned in radiation shield protection box, avoids the destruction of integral dose radiation to test vector generation system.
7. the implementation method of a novel general dynamic accumulated dose test unit, it is characterized in that: comprise test vector generative process and signal feedback process, wherein general dynamic accumulated dose test unit comprises host computer, signal transduction system and test vector generation system, and wherein host computer comprises random vector selection module, slave computer control module and the first High-speed Interface Card; Signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller; Test vector generation system comprises that second electrical level conversion Multi Channel Controller, n a 3rd level conversion Multi Channel Controller, generating random vector module, startup stopping modular, random code receive judge module, the second feedback module and test vector output module;
Test vector generative process comprises the steps:
(1), external control signal sends to slave computer control module, start test vector generative process, random vector selects module to generate random option code, and random option code is sent to the first High-speed Interface Card, slave computer control module sends to the first High-speed Interface Card by the control signal of outside input;
(2), the first High-speed Interface Card sends to the second High-speed Interface Card by the random option code of selecting module to receive from random vector with from the control signal of slave computer control module reception;
(3), the second High-speed Interface Card sends to CPU by the described random option code and the described control signal that receive; CPU receives random option code and the control signal from the second High-speed Interface Card output, receives the feedback signal of the first feedback module output simultaneously, carries out signal output judgement, and described random option code and control signal are exported to random code output module;
(4), random code output module is transmitted to the first level conversion Multi Channel Controller by the random option code receiving from CPU and control signal;
(5), start the control signal that is converted to voltage signal that stopping modular receives the first level conversion Multi Channel Controller output, test vector generation system is started;
(6), generating random vector module generates random test vector and sends to test vector output module; Random code receives judge module and receives the random option code that is converted to voltage signal that comes from the first level conversion Multi Channel Controller output, and sends to test vector output module;
(7), test vector output module receives random code and receives the random option code of judge module output and the random test vector of generating random vector module output, by described random option code and described random test vector carry out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to n the 3rd level conversion Multi Channel Controller simultaneously;
(8), the 3rd level conversion Multi Channel Controller receives the operation result of test vector output module output, and the logic level signal of operation result is converted to voltage signal, sends to circuit to be irradiated.
Signal feedback process comprises the steps:
(1), whether the second feedback module normal according to test vector generation system operation, generate corresponding feedback identification code, and described feedback identification code sent to second electrical level conversion Multi Channel Controller;
(2), the first feedback module receives the feedback identification code of second electrical level conversion Multi Channel Controller output and sends to CPU;
(3) CPU sends to the first High-speed Interface Card by described feedback identification code through the second High-speed Interface Card;
(4) whether normally the feedback identification code that slave computer control module receives from the first High-speed Interface Card judges the operation of test vector generation system.
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