CN106370963B - A kind of automatic aging system and method for optical active component - Google Patents
A kind of automatic aging system and method for optical active component Download PDFInfo
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- CN106370963B CN106370963B CN201610740333.7A CN201610740333A CN106370963B CN 106370963 B CN106370963 B CN 106370963B CN 201610740333 A CN201610740333 A CN 201610740333A CN 106370963 B CN106370963 B CN 106370963B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
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Abstract
The present invention relates to a kind of automatic aging systems of optical active component, including optical device assembly unit, drive control unit, master control logic unit, conversion unit of protocol and parameter configuration display unit.It is unrestricted for TEC and LD in optical active component ageing process and the case where cause optical active component to fail, drive control unit devises overpressure protection and carrying current limitation function at the both ends TEC and the both ends LD.The assembly of detection optical device and line fault before there is master control logic unit circuit testing function, aging to start, aging monitors the abnormal conditions of entire ageing process after opening, into exception handler.Parameter configuration display unit configures aging Mu mark electricity Liu ﹑ Wen Du ﹑ monitored item parameter limit value and aging duration, completes ageing process timing, and real-time display records aging data in ageing process.Method provided by the invention can be realized the automatic aging and abnormality processing of optical active component, guarantee the stability of ageing process.
Description
Technical field
The present invention relates to a kind of production testing system and method for optic communication device, in particular to a kind of optical active component
Automatic aging system and method.
Background technique
Aging is a kind of method of inspection of optic communication device production process, is the important link of production process.As light is logical
Believe that the increase of device speed, the aging of optic communication device propose requirements at the higher level to ageing environment and drive control, and as light is logical
Letter device requirement is significantly increased, and the production process for needing to communicate optical device more automates.Existing optic communication device aging is surveyed
Method for testing is not taken generally and effectively controls driving method, in ageing process, TEC (semiconductor cooler) and LD when exception occurs
(laser) both ends occur overshooting and punch-through, optical device displacement, optical path shift, and lead to the light in the ageing process
Devices in batches failure.
Summary of the invention
It is an object of the invention to overcome the deficiencies in the prior art, the present invention provides a kind of automatic aging of optical active component
Method realizes the automation of optical device aging.
The present invention provides a kind of automatic aging system of optical active component, including optical device assembly unit, drive control list
Member, master control logic unit, conversion unit of protocol and parameter configuration display unit；
The optical device assembly unit is for assembling optical active component to be tested；
The drive control unit, which is connected to establish with optical active component to be tested with optical device assembly unit, to be electrically connected；
The master control logic unit is embedded in the drive control unit, and the drive control unit is at the control
Automatic test program is executed, the master control logic unit passes through the conversion unit of protocol and the parameter configuration display unit
It interacts, receives configuration parameter from the parameter configuration display unit, and report burn-in test data；
The parameter configuration display unit configures burn-in test parameter, including but not limited to aging target current, temperature, prison
Control the limitation of item parameter, aging duration.
In the above-mentioned technical solutions, the drive control unit includes that TEC control module, LD drive module and communication connect
Mouth mold block；The TEC control module carries out drive control to the TEC module of optical active component to be tested, and the LD drives mould
Block carries out drive control to the LD module in optical active component to be tested.
In the above-mentioned technical solutions, the master control logic unit passes through the communication of protocol interface and the drive control unit
Interface module interacts, and monitoring aging acquires item.
In the above-mentioned technical solutions, the parameter configuration display unit can be handed over multiple conversion unit of protocol simultaneously
Mutually, multiple master control logic units can share a conversion unit of protocol and interact with the parameter configuration display unit.
In the above-mentioned technical solutions, the parameter configuration display unit real-time display and saves aging number in ageing process
According to.
The present invention also provides a kind of automatic aging methods of optical active component, include the following steps:
Step 1, optical active component to be tested is fitted into corresponding optical device assembly unit, drive control unit and light
Device assembly unit is connected, and drive control unit is connected through conversion unit of protocol with parameter configuration display unit；
Step 2, it gets parms and configures the operating right of display unit, configured using parameter configuration display unit to be tested
Aging target current, temperature and the aging duration of optical active component determine that aging monitoring parameter limits according to target current and temperature
System is configured；
Step 3, circuit testing function is opened, the assembly failure of optical active component to be tested is detected, if monitoring data is aobvious
Show exception, then checks failure；
Step 4, aging and clocking capability are opened, in ageing process, master control logic unit realizes abnormality processing and will be different
Normal type reports parameter configuration display unit, parameter configuration display unit real-time display aging data, and saves aging data, remembers
Record aging Exception Type.
In the above-mentioned technical solutions, the circuit testing function specifically includes, and master control logic unit controls drive control list
Member enables the TEC module of optical active component to be tested, and adds Weak current, base to the LD module of optical active component to be tested
Every aging data of optical active component to be tested is monitored in parameter configuration display unit.
8, a kind of automatic aging method of optical active component as claimed in claim 7, it is characterised in that: the step 4
In, it is anti-that the TEC module temperature and LD blocks current of optical active component to be tested are configured according to target temperature and electric current
Only optical device overshoots, and master control logic unit judges TEC control module enables LD drive module, and master control logic list again after stablizing
Member realizes the slow power-up function of LD driving current.
The present invention achieves following technical effect: parameter configuration display unit realizes that ageing parameter can match, and real-time display
Record aging data；It is detected by line fault, investigation assembly or line fault, avoid failure that optical device is caused to damage before ageing
Wound；By ageing process exception monitoring, abnormal generation and Exception Type are monitored in ageing process, for different exception class
Type takes corresponding abnormality processing measure, avoids that optical device batch is caused to fail in ageing process extremely；Realize optical device aging
The automation of process improves aging production efficiency.
Detailed description of the invention
Fig. 1 is the schematic diagram of optical active component ageing system.
Fig. 2 is the flow chart of optical active component ageing process.
Specific embodiment
Understand for the ease of those of ordinary skill in the art and implement the present invention, with reference to the accompanying drawing and specific embodiment
The present invention is described in further detail.
Optical active component ageing system provided by the invention is as shown in Figure 1, include optical device assembly unit, drive control list
Member, master control logic unit, conversion unit of protocol and parameter configuration display unit.
Wherein, optical device assembly unit is mentioned for assembling optical active component to be tested with optical active component to be tested
For being electrically connected and providing the test interface of every index of correlation.
Drive control unit includes TEC Kong molding Kuai ﹑ LD drive module and communication interface modules；Drive control unit with
Optical device assembly unit, which is connected to establish with optical active component to be tested, to be electrically connected, so that TEC control module is active by light
The TEC pin of device, which is realized, carries out drive control to the TEC module in optical active component, and LD drive module passes through optical active component
LD pin realize in optical active component LD module carry out drive control, thus ageing process realize to optical active component
TEC Kong ﹑ LD driving and back facet current monitoring etc..Drive control unit is in (semiconductor cooler) both ends TEC and LD as a result,
(laser) both ends provide overpressure protection and carrying current limitation function, overcome optical device TEC and LD failure in ageing process
Abnormal conditions.
Master control logic unit is embedded in drive control unit, and drive control unit executes automation at the control and surveys
Program is tried, master control logic unit is interacted by conversion unit of protocol and parameter configuration display unit, shown from parameter configuration
Unit receives configuration parameter, and reports burn-in test data, and multiple master control logic units can share one or more protocol conversions
Unit is interacted with parameter configuration display unit；Master control logic unit is connect by the communication of protocol interface and drive control unit
Mouth mold block interacts, and monitoring aging acquires item；Master control logic unit also provides circuit testing function, is executing wireline inspection
When, master control logic unit control drive control unit adds normal pressurization to the TEC module of optical active component to be measured, has to light to be measured
The LD module of source device adds Weak current, monitors all data of optical active component aging to be measured, detects optical active component in light
It whether there is assembly failure in device assembly unit.In ageing process, it is pre- whether each monitored item of master control logic unit monitoring exceeds
Threshold value judges whether Exception Type that is abnormal and occurring occur, takes corresponding abnormality processing for different Exception Types
Measure, while Exception Type is reported parameter configuration display unit by master control logic unit.
Parameter configuration display unit configures aging Mu mark electricity Liu ﹑ temperature and monitored item parameter limit value, also may choose whether out
TEC is opened, above-mentioned configuration parameter is saved, until modification configuration again.Parameter configuration display unit configures aging duration, and complete
At ageing process timing.To guarantee that aging prevents from changing by mistake parameter configuration safely, parameter configuration unit can also be with parameter display unit
It is independently arranged, parameter configuration unit increases operating right, and configuration parameter can be modified by obtaining operating right.Data display unit is real
When show aging data, and record aging data and Exception Type.
Needle improvements over the prior art of the present invention specifically include that parameter configuration display unit realizes that ageing parameter can match, and
Real-time display records aging data；Drive control unit and master control logic unit realize that line fault detection and ageing process are different
Often detection excludes assembly or line fault before ageing, avoids failure that optical device is caused to damage, and monitors in ageing process abnormal
Generation and Exception Type, and carry out abnormality processing, avoid that optical device batch is caused to fail in ageing process extremely.
Optical active component aging method provided by the invention is as shown in Figure 2, the specific steps are as follows:
Step 1, as shown in Figure 1, optical active component to be tested is fitted into corresponding optical device assembly unit, driving
Control unit is connected with optical device assembly unit, and the communication interface modules on drive control unit is by master control logic unit through assisting
View converting unit is connected with parameter configuration display unit.
Step 2, it gets parms and configures the operating right of display unit, configure aging target using parameter configuration display unit
Electricity Liu ﹑ temperature and aging duration determine that the limitation of aging monitoring parameter is configured according to target current and temperature.
Step 3, circuit testing function is opened, it is active that master control logic unit control drive control unit enables light to be tested
The TEC module of device, and Weak current is added to the LD module of optical active component to be tested, it is supervised based on parameter configuration display unit
The active every aging data of light to be tested is controlled, the assembly failure of optical active component to be tested is detected, if monitoring data is aobvious
Show exception, checks failure, burn-in test can be opened by finishing to wireline inspection.
Step 4, aging and clocking capability, the TEC module temperature and LD blocks current of optical active component to be tested are opened
It is configured according to target temperature and electric current, to prevent optical device from overshooting, after master control logic unit judges TEC control module is stablized
LD drive module is enabled again, and master control logic unit realizes the slow power-up function of LD driving current.In ageing process, master control is patrolled
It collects unit realization abnormality processing and Exception Type is reported into parameter configuration display unit, parameter configuration display unit real-time display is old
Change data, and save aging data, records aging Exception Type.
Through the above steps, the present invention realizes the automation of optical device aging, and can guarantee the stability of ageing process.
It is emphasized that embodiment of the present invention be it is illustrative, without being restrictive, therefore the present invention is simultaneously
Be not limited to embodiment described in specific embodiment, it is all by those skilled in the art so according to the technique and scheme of the present invention
The other embodiments obtained, also belong to the scope of protection of the invention.
Claims (5)
1. a kind of automatic aging system of optical active component, it is characterised in that including optical device assembly unit, drive control unit,
Master control logic unit, conversion unit of protocol and parameter configuration display unit；
The optical device assembly unit is for assembling optical active component to be tested；
The drive control unit, which is connected to establish with optical active component to be tested with optical device assembly unit, to be electrically connected；
The master control logic unit is embedded in the drive control unit, and the drive control unit executes at the control
Automatic test program, the master control logic unit are carried out by the conversion unit of protocol and the parameter configuration display unit
Interaction receives configuration parameter from the parameter configuration display unit, and reports burn-in test data；
The parameter configuration display unit configures burn-in test parameter, including but not limited to aging target current, temperature, monitored item
Parameter limitation, aging duration；
The drive control unit includes TEC control module, LD drive module and communication interface modules；The TEC controls mould
Block carries out drive control to the TEC module of optical active component to be tested, and the LD drive module is to the active device of light to be tested
LD module in part carries out drive control；
The master control logic unit control drive control unit enables the TEC module of optical active component to be tested, and to be measured
The LD module of the optical active component of examination adds Weak current, and optical active component to be tested is monitored based on parameter configuration display unit
Every aging data；
The TEC module temperature and LD blocks current of optical active component to be tested are configured according to target current and temperature, are
Prevent optical device from overshooting, master control logic unit judges TEC control module enables LD drive module, and master control logic again after stablizing
The slow power-up function of unit realization LD module drive electric current；
The drive control unit provides overpressure protection and carrying current limitation function at TEC module both ends and LD module both ends,
Overcome the abnormal conditions of TEC module and LD Module Fail in ageing process.
2. a kind of automatic aging system of optical active component as described in claim 1, it is characterised in that: the master control logic list
Member is interacted by the communication interface modules of protocol interface and the drive control unit, and monitoring aging acquires item.
3. a kind of automatic aging system of optical active component as claimed in claim 2, it is characterised in that: the parameter configuration is aobvious
Show that unit can while be interacted with multiple conversion unit of protocol, multiple master control logic units can share a protocol conversion list
It is first to be interacted with the parameter configuration display unit.
4. a kind of automatic aging system of optical active component as claimed in claim 3, it is characterised in that: the parameter configuration is aobvious
Show that unit real-time display and saves aging data in ageing process.
5. a kind of automatic aging system using optical active component according to any one of claims 1-4 carries out optical active component
Automatic aging method, it is characterised in that include the following steps:
Step 1, optical active component to be tested is fitted into corresponding optical device assembly unit, drive control unit and optical device
Assembly unit is connected, and drive control unit is connected through conversion unit of protocol with parameter configuration display unit；
Step 2, it gets parms and configures the operating right of display unit, configuring light to be tested using parameter configuration display unit has
Aging target current, temperature and the aging duration of source device, according to target current and temperature determine aging monitoring parameter limit into
Row configuration；
Step 3, open circuit testing function, detect the assembly failure of optical active component to be tested, if monitoring data show it is different
Often, then failure is checked；
Step 4, aging and clocking capability are opened, in ageing process, master control logic unit realizes abnormality processing and by exception class
Type reports parameter configuration display unit, parameter configuration display unit real-time display aging data, and saves aging data, and record is old
Change Exception Type.
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| CN108646117B (en) * | 2018-06-22 | 2020-12-08 | 武汉光迅科技股份有限公司 | Aging method of optical active device |
| CN114546739B (en) * | 2022-01-23 | 2023-11-21 | 苏州浪潮智能科技有限公司 | Method, device, equipment and medium for detecting current flowing through server |
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