CN106249006A - Test fixture and single back-shaped probe of tail thereof - Google Patents
Test fixture and single back-shaped probe of tail thereof Download PDFInfo
- Publication number
- CN106249006A CN106249006A CN201610875003.9A CN201610875003A CN106249006A CN 106249006 A CN106249006 A CN 106249006A CN 201610875003 A CN201610875003 A CN 201610875003A CN 106249006 A CN106249006 A CN 106249006A
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- China
- Prior art keywords
- cantilever
- tail
- shaped probe
- pcb
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 239000000523 sample Substances 0.000 title claims abstract description 75
- 238000012360 testing method Methods 0.000 title claims abstract description 38
- 239000000463 material Substances 0.000 claims abstract description 9
- 238000000034 method Methods 0.000 description 5
- 238000005299 abrasion Methods 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- 210000001138 tear Anatomy 0.000 description 3
- 230000004308 accommodation Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The open a kind of single back-shaped probe of tail of the present invention, including a base portion, one first cantilever, one second cantilever and a contact arm；First cantilever extends from one end of base portion, and it is used for contact measured trial product；Second cantilever extends from the other end of base portion, and the second cantilever, the first cantilever are positioned at the same side of base portion；Contact arm is convexly equipped in one end away from base portion of the second cantilever, and it is for the printed circuit board (PCB) of engaged test fixture, and when contact arm contacts with printed circuit board (PCB), contact arm is perpendicular to printed circuit board (PCB).This back-shaped probe of list tail and existing equal material, close price probe compared with, withstanding current capability and operating frequency is higher, impedance and distorted signals is lower, tested performance is more stable.Invention additionally discloses a kind of test fixture with this back-shaped probe of list tail.
Description
Technical field
The present invention relates to electronic devices and components field tests, particularly relate to a kind of single tail for electronic devices and components test back-shaped
Probe and there is the test fixture of this back-shaped probe of list tail.
Background technology
Electronic devices and components need it is carried out the test of structure and electric function, to ensure electronic devices and components after finalization of the manufacture
Meet the demand of system.In the device that electronic devices and components are tested, need to utilize probe to reach electronics to be tested unit
Device and the electric connection of circuit board, therefore, tested performance will be had a direct impact by the performance of probe.
Existing most typical probe is spring needle 1, as it is shown in figure 1, it has needle body 11, the spring being located in needle body 11
12 and be located at the syringe needle 13 at needle body 11 two ends, there is outside syringe needle 13 coating 14.Outside the syringe needle 13 of this spring needle 1 and syringe needle 13
Coating 14 the most easy to wear；And spring 12 is size-constrained, it is allowed to electric current little, cause spring wire overcurrent capability low, even if
Update, it is also difficult to meet requirement；And multiple unit construction, distorted signals is big.This spring needle 1 is wanted to arrive higher
Electrical performance, needs more preferable material, more preferable plating process, and these all can cause the increase of cost.
As in figure 2 it is shown, the S-shaped pin 2 of the non-spring structure of existing another kind, it has the needle body 21 of S-shaped and is located at needle body
The elastic rubbery body 22 of 21, its needle body 21 is formed in one structure, and therefore electrical performance is outstanding, but the action of needle body 21 is serious
Depending on elastic rubbery body 22, to provide contact pressure, once elastic rubbery body 22 fatigue, tested performance will be greatly reduced, because of
This is in using for a long time, poor stability, and overall use cost is the highest.
Therefore, it is necessary to provide a kind of under equal material, close price basis, withstanding current capability and operating frequency are more
High, impedance and distorted signals is lower, tested performance the is more stable back-shaped probe of single tail and test fixture, to solve above-mentioned existing skill
The deficiency of art.
Summary of the invention
It is an object of the invention to provide under a kind of equal material, close price basis, withstanding current capability and operating frequency
Higher, impedance and the back-shaped probe of single tail that distorted signals is lower, tested performance is more stable.
Another object of the present invention is to provide under a kind of equal material, close price basis, withstanding current capability and work
Frequency is higher, impedance and distorted signals is lower, tested performance is more stable test fixture.
For achieving the above object, the technical scheme is that a kind of single back-shaped probe of tail of offer, it is adaptable to electronics unit device
The test fixture of part, it includes a base portion, one first cantilever, one second cantilever and a contact arm；First cantilever is from described base portion
One end extend, its be used for contact measured trial product；Described second cantilever extends from the other end of described base portion, and described second
Cantilever, described first cantilever are positioned at the same side of described base portion；Described contact arm be convexly equipped in described second cantilever away from described
One end of base portion, its printed circuit board (PCB) being used for contacting described test fixture, and described contact arm and described printed circuit board (PCB) phase
During contact, described contact arm is perpendicular to described printed circuit board (PCB).
It is preferred that described contact arm is perpendicular to described second cantilever.
It is preferred that the end away from described second cantilever of described contact arm is formed and contacts with described printed circuit board (PCB)
Contact jaw, described contact jaw is yi word pattern, cross, crown-shaped or in planar structure.
Hang near described second it is preferred that described first cantilever has one away from the primary importance of described second cantilever and one
The second position of arm, when described first cantilever is in the described second position, the described back-shaped probe of single tail is in running order.
It is preferred that when described first cantilever is in the described second position, described first cantilever and described second cantilever phase
Parallel.
It is preferred that the curved structure of described base portion.
It is preferred that the described back-shaped probe of single tail passes through one in cylindrical silk material one brake forming.
It is preferred that described first cantilever contacts in banding between product to be tested.
Accordingly, invention additionally discloses a kind of test fixture, it includes a printed circuit board (PCB), a jig main body, a upper cover
And at least one single back-shaped probe of tail；Jig main body is located at the top of described printed circuit board (PCB), and described jig main body is provided with multiple
Several first mounting grooves；Detachable upper cover is installed on the top of described jig main body with unloading, and described on cover and offer with described
The second mounting groove that first mounting groove is corresponding；Single back-shaped probe of tail be removably installed in described first mounting groove, described the
In two mounting grooves, the described back-shaped probe of single tail is described above.
Compared with prior art, due to the back-shaped probe of single tail of the present invention, it include extending to the same side of base portion the
One cantilever, the second cantilever, and one end away from base portion of the second cantilever is convexly equipped with contact arm, wherein, the first cantilever is used for contacting
Product to be tested, contact arm is used for the printed circuit board (PCB) of engaged test fixture, and when contact arm contacts with printed circuit board (PCB), two
Perpendicular contact is formed between person.Firstly, since the entire length of single back-shaped probe of tail is less, therefore its impedance is lower, Ge Xiang electricity
Property index is the most superior；Secondly, forming banding between the first cantilever with product to be tested and contact, serious forgiveness is higher；Furthermore, connect
Right angle contact is formed between contact arm and printed circuit board (PCB), when therefore pressing this back-shaped probe of list tail under test product, single back-shaped spy of tail
Pin does not have the displacement in horizontal direction, not weares and teares the printed circuit board (PCB) of test fixture, to this back-shaped probe of list tail self
The most not wearing and tearing, therefore service life is longer；It addition, elastic force is provided by single back-shaped probe of tail self, it is not necessary to extra bullet
Property part so that it is withstanding current capability and operating frequency are higher, and tested performance is more stable.Accordingly, there is this back-shaped probe of list tail
Test fixture also has identical technique effect.
Accompanying drawing explanation
Fig. 1 is the structural representation of existing a kind of spring needle.
Fig. 2 is the structural representation of existing a kind of S-shaped pin.
Fig. 3 is the structural representation of list tail back-shaped probe one embodiment of the present invention.
Fig. 4 is the side view of Fig. 3.
Fig. 5 is the structural representation of list tail of the present invention another embodiment of back-shaped probe.
Fig. 6 is the structural representation of the list tail of the present invention another embodiment of back-shaped probe.
Fig. 7 is a working state schematic representation of single back-shaped probe of tail in Fig. 3.
Fig. 8 is another working state schematic representation of single back-shaped probe of tail in Fig. 3.
Fig. 9 is the contact vestige schematic diagram that the back-shaped probe of list tail of the present invention is formed on product to be measured.
Figure 10 is the structural representation of test fixture of the present invention.
Figure 11 is the partial sectional schematic view of Figure 10.
Detailed description of the invention
With reference now to accompanying drawing, describing embodiments of the invention, element numbers similar in accompanying drawing represents similar element.
First combining shown in Fig. 3-8, the back-shaped probe of single tail 100 provided by the present invention, it is removably installed in electronics
The test fixture 200 of components and parts, it is not necessary to be fixed in test fixture 200 by modes such as injections, therefore can freely be changed
And installation.
As shown in Fig. 3-4,7-8, this back-shaped probe of list tail 100 includes a base portion 110 and extends shape from the two ends of base portion 110
One first cantilever 120 and one second cantilever 130 become, first cantilever the 120, second cantilever 130 is positioned at the same side of base portion 110,
This first cantilever 120 is for contact measured trial product, and the second cantilever 130 is for the printed circuit board (PCB) 210 of engaged test fixture 200
(see Fig. 7-8)；And first cantilever 120 have one away from the primary importance and of the second cantilever 130 near the of the second cantilever 130
Two positions (see Fig. 4), therefore, the elastic force of this back-shaped probe of list tail 100 is provided by self, it is not necessary to use extra elasticity
Part.
In the present invention, single back-shaped probe of tail 100 also includes that one is convexly equipped in the second cantilever 130 and with the second cantilever 130 in one
The contact arm 140 at clamp angle, this contact arm 140 is convexly equipped in one end away from base portion 110 of the second cantilever 130, contact arm 140
One end away from the second cantilever 130 is used for and printed circuit board (PCB) 210 contacts, when contact arm 140 connects with printed circuit board (PCB) 210
When touching, contact arm 140 is perpendicular to printed circuit board (PCB) 210, as Figure 7-8.
Further combined with shown in Fig. 3-4,7-8, contact arm 140 is perpendicular to the second cantilever 130, and the freedom of contact arm 140
End forms the contact jaw 141 (see Fig. 4) in planar structure.When after the contact jaw 141 contact print circuit board 210 of contact arm 140,
Right angle contact is formed between contact arm 140 and printed circuit board (PCB) 210, when test process is pressed under product single tail back-shaped probe 100,
This back-shaped probe of list tail 100 does not have the displacement in horizontal direction, to printed circuit board (PCB) 210 not abrasion, to single back-shaped spy of tail
Pin 100 self does not the most wear and tear, and therefore service life is longer.
It is to be appreciated that contact jaw 141 is not limited to, in planar structure, contact jaw 141 is arranged to yi word pattern (such as Fig. 5
Shown in), cross (as shown in Figure 6), crown-shaped etc., the most do not affect the realization of technical solution of the present invention, therefore, can be as required
The shape of contact jaw 141 is set, this technology being well known to those skilled in the art.
Referring again to shown in Fig. 4, the preferred curved structure of base portion 110 of the back-shaped probe of list tail 100 of the present invention, and when first
When cantilever 120 is in the second position, the first cantilever 120 is paralleled with the second cantilever 130, and single tail back-shaped probe 100 now is in U
Shape structure.
It addition, the back-shaped probe of single tail 100 of the present invention passes through one in cylindrical silk material one brake forming, structure letter
Single, there is no excessive parts, therefore when testing, distorted signals is less.
With continued reference to shown in Fig. 4, when single back-shaped probe of tail 100 is in free state, its first cantilever 120 is in first
Position, the free height between the first cantilever 120 and the contact jaw 141 of contact arm 140 is h1；At single back-shaped probe of tail 100
When duty, pressing the first cantilever 120 to make it be moved to the second position by primary importance under product to be tested, now first hangs
Working depth between the contact jaw 141 of arm 120 and contact arm 140 is that h2, h2 are less than h1.
Referring now to shown in table 1, this table shows the back-shaped probe of list tail 100 of the present invention and existing a kind of spring needle
Main electrical parameter contrast.
Table 1
From above-mentioned table 1 it can be seen that, the back-shaped probe of single tail of the present invention 100 and equivalent specifications, material, plating process
Spring needle compare, there is higher withstanding current capability and operating frequency, there is lower impedance simultaneously.It addition, the single tail being somebody's turn to do
Back-shaped probe 100 relies on and self provides elastic force, does not relies on extra elastic component etc. and provides elastic force, therefore tested performance
More stable.
Shown in Fig. 7-9, as a example by the contact jaw 141 back-shaped probe of single tail 100 in planar structure, to its work
State is described.
As it is shown in fig. 7, after single back-shaped probe of tail 100 is installed on test fixture 200, its contact arm 140 in planar structure
The printed circuit board (PCB) 210 of contact jaw 141 engaged test fixture 200, and contact arm 140 is perpendicular with printed circuit board (PCB) 210, two
Perpendicular contact is formed between person.First cantilever 120 contacts with product 300 to be tested, and the first cantilever 120 and product to be tested
Contacting in banding between 300, the first cantilever 120 can form stable linearly connecing in the tested training 310 of product 300 to be tested
Touching vestige 320 (as shown in Figure 9), therefore serious forgiveness is higher.
Referring to Fig. 8, when the first cantilever 120 of the product single back-shaped probe of tail 100 of 300 times pressures, the first cantilever 120 is by first
Position moves to the second position, makes the first cantilever 120 parallel with the second cantilever 130；And the single back-shaped probe of tail of 300 times pressures of product
During 100, contacting due to perpendicular between contact arm 140 with printed circuit board (PCB) 210, therefore single back-shaped probe of tail 100 is not
Have the displacement in horizontal direction, the printed circuit board (PCB) 210 not abrasion to test fixture 200, to single back-shaped probe of tail 100 certainly
Body does not the most wear and tear, and therefore service life is longer.
Referring now to shown in Figure 10-11, a kind of test fixture 200 provided by the present invention, it includes printed circuit board (PCB)
210, it is located at the jig main body 220 above printed circuit board (PCB) 210 and is removably installed in the upper cover above jig main body 220
230.Single back-shaped probe of tail 100 is mounted between jig main body 220 and upper cover 230, makes single back-shaped probe of tail 100 can
Install freely and change.
As shown in figure 11, jig main body 220 is provided with a plurality of first mounting groove 221；Upper cover 230 offer a plurality of with
The second mounting groove 231 that first mounting groove 221 is corresponding；First mounting groove the 221, second mounting groove 231 matches and forms single tail
The accommodation space of back-shaped probe 100.Single back-shaped probe of tail 100 is removably installed in first mounting groove the 221, second mounting groove
In 231 accommodation spaces formed.
The structure of single back-shaped probe of tail 100 is as it has been described above, here is omitted.It addition, its of test fixture 200 of the present invention
His structure of part is well known to those of ordinary skill in the art, is no longer described in detail at this.
Test fixture 200 of the present invention is mainly used in testing electronic devices and components, but is not limited.
To sum up, due to the back-shaped probe of single tail 100 of the present invention, it includes that extend to the same side of base portion 110 first hangs
Arm the 120, second cantilever 130, and one end away from base portion 110 of the second cantilever 130 is convexly equipped with contact arm 140, wherein, first hangs
Arm 120 is for contact measured trial product 300, and contact arm 140 is for the printed circuit board (PCB) 210 of engaged test fixture 200, and contact
When arm 140 contacts with printed circuit board (PCB) 210, form perpendicular contact between the two.Firstly, since single back-shaped probe of tail 100
Entire length is less, and therefore its impedance is lower, and every Electrical Indexes is the most superior；Secondly, the first cantilever 120 and test manufacture to be measured
Forming banding contact between product 300, serious forgiveness is higher；Furthermore, between contact arm 140 and printed circuit board (PCB) 210, form heading joint
Touching, when therefore test product presses this back-shaped probe 100 of list tail for 300 times, single back-shaped probe of tail 100 does not have the position in horizontal direction
Move, the printed circuit board (PCB) 210 not abrasion to test fixture 200, this back-shaped probe of list tail 100 self is not the most worn and torn, because of
This service life is longer；It addition, elastic force is provided by single back-shaped probe of tail 100 self, it is not necessary to extra elastic component so that it is resistance to
Current capacity and operating frequency are higher, and tested performance is more stable.
Accordingly, there is the test fixture 200 of the back-shaped probe of list tail 100 of the present invention, it may have identical technique effect.
The above disclosed the preferred embodiments of the present invention that are only, can not limit the right of the present invention with this certainly
Scope, the equivalent variations therefore made according to scope of the present invention patent, still belong to the scope that the present invention is contained.
Claims (9)
1. the back-shaped probe of single tail, it is adaptable to the test fixture of electronic devices and components, it is characterised in that including:
One base portion；
One first cantilever, described first cantilever extends from one end of described base portion, and it is used for contact measured trial product；
One second cantilever, described second cantilever extends from the other end of described base portion, and described second cantilever, described first cantilever
It is positioned at the same side of described base portion；
One contact arm, described contact arm is convexly equipped in one end away from described base portion of described second cantilever, and it is used for contacting described
The printed circuit board (PCB) of test fixture, and when described contact arm contacts with described printed circuit board (PCB), described contact arm is perpendicular to institute
State printed circuit board (PCB).
2. single back-shaped probe of tail as claimed in claim 1, it is characterised in that described contact arm is perpendicular to described second cantilever.
3. the back-shaped probe of tail as claimed in claim 1 single, it is characterised in that described contact arm away from described second cantilever
End is formed and the contact jaw that contacts of described printed circuit board (PCB), and described contact jaw is yi word pattern, cross, crown-shaped or in flat
Face structure.
4. single back-shaped probe of tail as claimed in claim 1, it is characterised in that described first cantilever has away from described second
The primary importance of cantilever and one is near the second position of described second cantilever, when described first cantilever is in the described second position
Time, the described back-shaped probe of single tail is in running order.
5. single back-shaped probe of tail as claimed in claim 4, it is characterised in that when described first cantilever is in the described second position
Time, described first cantilever is paralleled with described second cantilever.
6. single back-shaped probe of tail as claimed in claim 1, it is characterised in that the curved structure of described base portion.
7. single back-shaped probe of tail as claimed in claim 1, it is characterised in that the described back-shaped probe of single tail passes through in cylinder
Silk material one brake forming.
8. the back-shaped probe of tail as claimed in claim 1 single, it is characterised in that between described first cantilever and product to be tested in
Banding contacts.
9. a test fixture, it is characterised in that including:
One printed circuit board (PCB)；
One jig main body, it is located at the top of described printed circuit board (PCB), and described jig main body is provided with a plurality of first and installs
Groove；
One upper cover, it is removably installed in the top of described jig main body, and described on cover and offer and described first peace
The second mounting groove that tankage is corresponding；
At least one single back-shaped probe of tail, it is removably installed in described first mounting groove, described second mounting groove, and described
Single back-shaped probe of tail is as described in any one of claim 1-8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610875003.9A CN106249006A (en) | 2016-09-30 | 2016-09-30 | Test fixture and single back-shaped probe of tail thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610875003.9A CN106249006A (en) | 2016-09-30 | 2016-09-30 | Test fixture and single back-shaped probe of tail thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106249006A true CN106249006A (en) | 2016-12-21 |
Family
ID=57612525
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610875003.9A Pending CN106249006A (en) | 2016-09-30 | 2016-09-30 | Test fixture and single back-shaped probe of tail thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106249006A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111537864A (en) * | 2020-05-27 | 2020-08-14 | 浪潮电子信息产业股份有限公司 | PCB impedance test fixture |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1379513A (en) * | 2001-03-29 | 2002-11-13 | 木本军生 | Contactor device |
| CN101025426A (en) * | 2006-02-19 | 2007-08-29 | 木本军生 | Probe assembly |
| CN101122616A (en) * | 2006-08-07 | 2008-02-13 | 木本军生 | Contactor assembly |
| CN101813711A (en) * | 2009-02-20 | 2010-08-25 | 京元电子股份有限公司 | Test probe and probe bed |
| CN102313827A (en) * | 2010-05-19 | 2012-01-11 | 木本军生 | Probe |
| CN204028967U (en) * | 2014-08-26 | 2014-12-17 | 广州市明森机电设备有限公司 | The tower probe control gear writing chip apparatus of a kind of smart card |
| CN206146968U (en) * | 2016-09-30 | 2017-05-03 | 乐依文半导体(东莞)有限公司 | Test fixture and single tail returns shape probe thereof |
-
2016
- 2016-09-30 CN CN201610875003.9A patent/CN106249006A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1379513A (en) * | 2001-03-29 | 2002-11-13 | 木本军生 | Contactor device |
| CN101025426A (en) * | 2006-02-19 | 2007-08-29 | 木本军生 | Probe assembly |
| CN101122616A (en) * | 2006-08-07 | 2008-02-13 | 木本军生 | Contactor assembly |
| CN101813711A (en) * | 2009-02-20 | 2010-08-25 | 京元电子股份有限公司 | Test probe and probe bed |
| CN102313827A (en) * | 2010-05-19 | 2012-01-11 | 木本军生 | Probe |
| CN204028967U (en) * | 2014-08-26 | 2014-12-17 | 广州市明森机电设备有限公司 | The tower probe control gear writing chip apparatus of a kind of smart card |
| CN206146968U (en) * | 2016-09-30 | 2017-05-03 | 乐依文半导体(东莞)有限公司 | Test fixture and single tail returns shape probe thereof |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111537864A (en) * | 2020-05-27 | 2020-08-14 | 浪潮电子信息产业股份有限公司 | PCB impedance test fixture |
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| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20161221 |